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1
Usman M, Bocquel J, Salfi J, Voisin B, Tankasala A, Rahman R, Simmons MY, Rogge S, Hollenberg LCL. Spatial metrology of dopants in silicon with exact lattice site precision. Nat Nanotechnol 2016;11:763-768. [PMID: 27271965 DOI: 10.1038/nnano.2016.83] [Citation(s) in RCA: 11] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/22/2015] [Accepted: 04/18/2016] [Indexed: 06/06/2023]
2
Voisin B, Salfi J, Bocquel J, Rahman R, Rogge S. Spatially resolved resonant tunneling on single atoms in silicon. J Phys Condens Matter 2015;27:154203. [PMID: 25782866 DOI: 10.1088/0953-8984/27/15/154203] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/27/2023]
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