Atomic force microscopy imaging using a tip-on-chip: opening the door to integrated near field nanotools

We describe in detail how atomic force microscopy (AFM) images can be routinely achieved with macroscopic silicon-based chips integrating mesoscopic tips, paving the way for the development of new near field devices combining AFM imaging with any kind of functionality integrated on a chip. The chips have been glued at the end of the free prong of 100 kHz quartz tuning forks mounted in Qplus configuration. Numerical simulations by modal analysis have been carried out to clarify the nature of the vibration modes observed in the experimental spectra. It is shown that two low frequency modes can be used to drive the system and scan the surface with a great stability in amplitude modulation as well as in frequency modulation AFM under ultrahigh vacuum. The AFM capabilities are demonstrated through a series of examples including phase and dissipation contrast imaging, force spectroscopy measurements, and investigations of soft samples in weak interaction with the substrate. The lateral resolution with the tips grown by focused ion beam deposition already matches the one achieved in standard amplitude modulation mode AFM experiments.

Experimental three-dimensional description of the liquid hexadecane/graphite interface

By using an atomic force microscope based on a quartz tuning fork sensor, a 3-dimensional description of the interface between liquid hexadecane and a highly oriented pyrolytic graphite surface can be achieved at room temperature. The C16H34 monolayer in contact with the substrate surface exhibits a lamellar structure whereas no observation at the liquid/graphite interface by scanning tunnelling microscopy was reported for this alkane. The second layer shows very weak corrugations corresponding to lamella boundaries. Force/distance curves show at least four oscillations separated by 0.4 nm except for the first period with a 0.38 nm distance that corresponds to the layer closer the substrate. Such a description agrees well with molecular dynamics results obtained on alkane/solid interfaces.

Mapping van der Waals forces with frequency modulation dynamic force microscopy

Nanometre-size gold clusters supported on MoS(2)(0001) are investigated by means of ultrahigh-vacuum frequency modulation dynamic force microscopy. Topography and frequency shift images are simultaneously obtained using the average tunnelling current to regulate the tip-substrate distance. Two families of clusters are observed, giving different frequency shift images. While the topographic and frequency shift profiles have similar shapes on small clusters (size [Formula: see text] nm), they are quite different near the top of large clusters (size [Formula: see text] nm): the topographic profile is rounded, but the frequency shift profile exhibits rather steep edges and a depression near the centre of the island. It is demonstrated that these differences result from the finite range of van der Waals forces. On small islands, the frequency shift is dominated by the interaction of the tip with the substrate. On large islands, it is dominated by the interaction with the island. The particular observed shape results from the geometry of the island. These interpretations are comforted by analytical and numerical calculations. In particular, the characteristic shape of the frequency shift profiles on large islands can be reproduced by introducing realistic parameters and considering only the contribution of van der Waals forces.