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Zhou Y, Ambarish CV, Gruenke R, Jaeckel FT, Kripps KL, McCammon D, Morgan KM, Wulf D, Zhang S, Adams JS, Bandler SR, Chervenak JA, Datesman AM, Eckart ME, Ewin AJ, Finkbeiner FM, Kelley RL, Kilbourne CA, Miniussi AR, Porter FS, Sadleir JE, Sakai K, Smith SJ, Wakeham NA, Wassell EJ, Yoon W. Mapping TES Temperature Sensitivity and Current Sensitivity as a Function of Temperature, Current, and Magnetic Field with IV curve and Complex Admittance Measurements. J Low Temp Phys 2018;193:321-327. [PMID: 31186584 PMCID: PMC6557576 DOI: 10.1007/s10909-018-1970-8] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 11/06/2017] [Accepted: 05/14/2018] [Indexed: 06/09/2023]
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