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Ulvestad A, Hruszkewycz SO, Holt MV, Hill MO, Calvo-Almazán I, Maddali S, Huang X, Yan H, Nazaretski E, Chu YS, Lauhon LJ, Rodkey N, Bertoni MI, Stuckelberger ME. Multimodal X-ray imaging of grain-level properties and performance in a polycrystalline solar cell. J Synchrotron Radiat 2019; 26:1316-1321. [PMID: 31274460 PMCID: PMC6613129 DOI: 10.1107/s1600577519003606] [Citation(s) in RCA: 6] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 01/07/2019] [Accepted: 02/14/2019] [Indexed: 06/09/2023]
Abstract
The factors limiting the performance of alternative polycrystalline solar cells as compared with their single-crystal counterparts are not fully understood, but are thought to originate from structural and chemical heterogeneities at various length scales. Here, it is demonstrated that multimodal focused nanobeam X-ray microscopy can be used to reveal multiple aspects of the problem in a single measurement by mapping chemical makeup, lattice structure and charge collection efficiency simultaneously in a working solar cell. This approach was applied to micrometre-sized individual grains in a Cu(In,Ga)Se2 polycrystalline film packaged in a working device. It was found that, near grain boundaries, collection efficiency is increased, and that in these regions the lattice parameter of the material is expanded. These observations are discussed in terms of possible physical models and future experiments.
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Affiliation(s)
- A. Ulvestad
- Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA
| | - S. O. Hruszkewycz
- Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA
| | - M. V. Holt
- Center for Nanoscale Materials, Argonne National Laboratory, Argonne, Illinois 60439, USA
| | - M. O. Hill
- Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208, USA
| | - I. Calvo-Almazán
- Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA
| | - S. Maddali
- Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA
| | - X. Huang
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, New York 11973, USA
| | - H. Yan
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, New York 11973, USA
| | - E. Nazaretski
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, New York 11973, USA
| | - Y. S. Chu
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, New York 11973, USA
| | - L. J. Lauhon
- Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208, USA
| | - N. Rodkey
- Electrical, Computer, and Energy Engineering, Arizona State University, Tempe, Arizona 85287, USA
| | - M. I. Bertoni
- Electrical, Computer, and Energy Engineering, Arizona State University, Tempe, Arizona 85287, USA
| | - M. E. Stuckelberger
- Electrical, Computer, and Energy Engineering, Arizona State University, Tempe, Arizona 85287, USA
- Photon Science, Deutsches Elektronen-Synchrotron, 22607 Hamburg, Germany
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Hruszkewycz SO, Allain M, Holt MV, Murray CE, Holt JR, Fuoss PH, Chamard V. High-resolution three-dimensional structural microscopy by single-angle Bragg ptychography. Nat Mater 2017; 16:244-251. [PMID: 27869823 DOI: 10.1038/nmat4798] [Citation(s) in RCA: 14] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/17/2015] [Accepted: 10/12/2016] [Indexed: 05/10/2023]
Abstract
Coherent X-ray microscopy by phase retrieval of Bragg diffraction intensities enables lattice distortions within a crystal to be imaged at nanometre-scale spatial resolutions in three dimensions. While this capability can be used to resolve structure-property relationships at the nanoscale under working conditions, strict data measurement requirements can limit the application of current approaches. Here, we introduce an efficient method of imaging three-dimensional (3D) nanoscale lattice behaviour and strain fields in crystalline materials with a methodology that we call 3D Bragg projection ptychography (3DBPP). This method enables 3D image reconstruction of a crystal volume from a series of two-dimensional X-ray Bragg coherent intensity diffraction patterns measured at a single incident beam angle. Structural information about the sample is encoded along two reciprocal-space directions normal to the Bragg diffracted exit beam, and along the third dimension in real space by the scanning beam. We present our approach with an analytical derivation, a numerical demonstration, and an experimental reconstruction of lattice distortions in a component of a nanoelectronic prototype device.
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Affiliation(s)
- S O Hruszkewycz
- Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA
| | - M Allain
- Aix-Marseille University, CNRS, Centrale Marseille, Institut Fresnel, 13013 Marseille, France
| | - M V Holt
- Center for Nanoscale Materials, Argonne National Laboratory, Argonne, Illinois 60439, USA
| | - C E Murray
- IBM T.J. Watson Research Center, Yorktown Heights, New York 10598, USA
| | - J R Holt
- IBM Semiconductor Research and Development Center, Hopewell Junction, New York 12533, USA
| | - P H Fuoss
- Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA
| | - V Chamard
- Aix-Marseille University, CNRS, Centrale Marseille, Institut Fresnel, 13013 Marseille, France
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Hruszkewycz SO, Holt MV, Allain M, Chamard V, Polvino SM, Murray CE, Fuoss PH. Efficient modeling of Bragg coherent x-ray nanobeam diffraction. Opt Lett 2015; 40:3241-3244. [PMID: 26176439 DOI: 10.1364/ol.40.003241] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/04/2023]
Abstract
X-ray Bragg diffraction experiments that utilize tightly focused coherent beams produce complicated Bragg diffraction patterns that depend on scattering geometry, characteristics of the sample, and properties of the x-ray focusing optic. Here, we use a Fourier-transform-based method of modeling the 2D intensity distribution of a Bragg peak and apply it to the case of thin films illuminated with a Fresnel zone plate in three different Bragg scattering geometries. The calculations agree well with experimental coherent diffraction patterns, demonstrating that nanodiffraction patterns can be modeled at nonsymmetric Bragg conditions with this approach--a capability critical for advancing nanofocused x-ray diffraction microscopy.
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Hruszkewycz SO, Holt MV, Maser J, Murray CE, Highland MJ, Folkman CM, Fuoss PH. Coherent Bragg nanodiffraction at the hard X-ray Nanoprobe beamline. Philos Trans A Math Phys Eng Sci 2014; 372:20130118. [PMID: 24470418 PMCID: PMC3900036 DOI: 10.1098/rsta.2013.0118] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/25/2023]
Abstract
Bragg coherent diffraction with nanofocused hard X-ray beams provides unique opportunities for quantitative in situ studies of crystalline structure in nanoscale regions of complex materials and devices by a variety of diffraction-based techniques. In the case of coherent diffraction imaging, a major experimental challenge in using nanoscale coherent beams is maintaining a constant scattering volume such that coherent fringe visibility is maximized and maintained over the course of an exposure lasting several seconds. Here, we present coherent Bragg diffraction patterns measured from different nanostructured thin films at the Sector 26 Nanoprobe beamline at the Advanced Photon Source and demonstrate that with nanoscale positional control, coherent diffraction patterns can be measured with source-limited fringe visibilities more than 50% suitable for imaging by coherent Bragg ptychography techniques.
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Affiliation(s)
- S. O. Hruszkewycz
- Materials Science Division, Argonne National Laboratory, Argonne, IL 60439, USA
| | - M. V. Holt
- Center for Nanoscale Materials, Argonne National Laboratory, Argonne, IL 60439, USA
| | - J. Maser
- The Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439, USA
| | - C. E. Murray
- IBM Corporation, TJ Watson Research Center, Yorktown Heights, NY 10598, USA
| | - M. J. Highland
- Materials Science Division, Argonne National Laboratory, Argonne, IL 60439, USA
| | - C. M. Folkman
- Materials Science Division, Argonne National Laboratory, Argonne, IL 60439, USA
| | - P. H. Fuoss
- Materials Science Division, Argonne National Laboratory, Argonne, IL 60439, USA
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Hruszkewycz SO, Highland MJ, Holt MV, Kim D, Folkman CM, Thompson C, Tripathi A, Stephenson GB, Hong S, Fuoss PH. Imaging local polarization in ferroelectric thin films by coherent x-ray Bragg projection ptychography. Phys Rev Lett 2013; 110:177601. [PMID: 23679778 DOI: 10.1103/physrevlett.110.177601] [Citation(s) in RCA: 19] [Impact Index Per Article: 1.7] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/25/2013] [Indexed: 06/02/2023]
Abstract
We used x-ray Bragg projection ptychography (BPP) to map spatial variations of ferroelectric polarization in thin film PbTiO3, which exhibited a striped nanoscale domain pattern on a high-miscut (001) SrTiO3 substrate. By converting the reconstructed BPP phase image to picometer-scale ionic displacements in the polar unit cell, a quantitative polarization map was made that was consistent with other characterization. The spatial resolution of 5.7 nm demonstrated here establishes BPP as an important tool for nanoscale ferroelectric domain imaging, especially in complex environments accessible with hard x rays.
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Affiliation(s)
- S O Hruszkewycz
- Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA.
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Hruszkewycz SO, Holt MV, Murray CE, Bruley J, Holt J, Tripathi A, Shpyrko OG, McNulty I, Highland MJ, Fuoss PH. Quantitative nanoscale imaging of lattice distortions in epitaxial semiconductor heterostructures using nanofocused X-ray Bragg projection ptychography. Nano Lett 2012; 12:5148-5154. [PMID: 22998744 DOI: 10.1021/nl303201w] [Citation(s) in RCA: 24] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/01/2023]
Abstract
We imaged nanoscale lattice strain in a multilayer semiconductor device prototype with a new X-ray technique, nanofocused Bragg projection ptychography. Applying this technique to the epitaxial stressor layer of a SiGe-on-SOI structure, we measured the internal lattice behavior in a targeted region of a single device and demonstrated that its internal strain profile consisted of two competing lattice distortions. These results provide the strongest nondestructive test to date of continuum modeling predictions of nanoscale strain distributions.
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Affiliation(s)
- S O Hruszkewycz
- Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA.
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