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Purushottam Raj Purohit RRP, Fowan D, Arnaud S, Blanc N, Micha JS, Guinebretière R, Castelnau O. Laue microdiffraction on polycrystalline samples above 1500 K achieved with the QMAX-µLaue furnace. J Appl Crystallogr 2024; 57:470-480. [PMID: 38596726 PMCID: PMC11001408 DOI: 10.1107/s1600576724001821] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/26/2023] [Accepted: 02/25/2024] [Indexed: 04/11/2024] Open
Abstract
X-ray Laue microdiffraction aims to characterize microstructural and mechanical fields in polycrystalline specimens at the sub-micrometre scale with a strain resolution of ∼10-4. Here, a new and unique Laue microdiffraction setup and alignment procedure is presented, allowing measurements at temperatures as high as 1500 K, with the objective to extend the technique for the study of crystalline phase transitions and associated strain-field evolution that occur at high temperatures. A method is provided to measure the real temperature encountered by the specimen, which can be critical for precise phase-transition studies, as well as a strategy to calibrate the setup geometry to account for the sample and furnace dilation using a standard α-alumina single crystal. A first application to phase transitions in a polycrystalline specimen of pure zirconia is provided as an illustrative example.
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Affiliation(s)
| | - Daniel Fowan
- IRCER (UMR CNRS 7315), Université de Limoges, 12 Rue Atlantis, Limoges 87068, France
| | - Stephan Arnaud
- Institut Néel (UPR CNRS 2940), Université Grenoble Alpes, 25 Avenue des Martyrs, Grenoble 38042, France
| | - Nils Blanc
- Institut Néel (UPR CNRS 2940), Université Grenoble Alpes, 25 Avenue des Martyrs, Grenoble 38042, France
| | - Jean-Sébastien Micha
- SYMMES (UMR CNRS 5819), Université Grenoble Alpes, CEA, 17 Avenue des Martyrs, Grenoble 38054, France
| | - René Guinebretière
- IRCER (UMR CNRS 7315), Université de Limoges, 12 Rue Atlantis, Limoges 87068, France
| | - Olivier Castelnau
- PIMM (UMR CNRS 8006), CNRS, ENSAM, Cnam, HESAM, 155 Boulevard de l’Hopital, Paris 75013, France
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Kirstein T, Petrich L, Purushottam Raj Purohit RRP, Micha JS, Schmidt V. CNN-Based Laue Spot Morphology Predictor for Reliable Crystallographic Descriptor Estimation. Materials (Basel) 2023; 16:ma16093397. [PMID: 37176279 PMCID: PMC10180338 DOI: 10.3390/ma16093397] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/07/2023] [Revised: 04/21/2023] [Accepted: 04/24/2023] [Indexed: 05/15/2023]
Abstract
Laue microdiffraction is an X-ray diffraction technique that allows for the non-destructive acquisition of spatial maps of crystallographic orientation and the strain state of (poly)crystalline specimens. To do so, diffraction patterns, consisting of thousands of Laue spots, are collected and analyzed at each location of the spatial maps. Each spot of these so-called Laue patterns has to be accurately characterized with respect to its position, size and shape for subsequent analyses including indexing and strain analysis. In the present paper, several approaches for estimating these descriptors that have been proposed in the literature, such as methods based on image moments or function fitting, are reviewed. However, with the increasing size and quantity of Laue image data measured at synchrotron sources, some datasets become unfeasible in terms of computational requirements. Moreover, for irregular Laue spots resulting, e.g., from overlaps and extended crystal defects, the exact shape and, more importantly, the position are ill-defined. To tackle these shortcomings, a procedure using convolutional neural networks is presented, allowing for a significant acceleration of the characterization of Laue spots, while simultaneously estimating the quality of a Laue spot for further analyses. When tested on unseen Laue spots, this approach led to an acceleration of 77 times using a GPU while maintaining high levels of accuracy.
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Affiliation(s)
- Tom Kirstein
- Institute of Stochastics, Ulm University, 89096 Ulm, Germany
| | - Lukas Petrich
- Institute of Stochastics, Ulm University, 89096 Ulm, Germany
| | | | | | - Volker Schmidt
- Institute of Stochastics, Ulm University, 89096 Ulm, Germany
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Purushottam Raj Purohit RRP, Tardif S, Castelnau O, Eymery J, Guinebretière R, Robach O, Ors T, Micha JS. LaueNN: neural-network-based hkl recognition of Laue spots and its application to polycrystalline materials. J Appl Crystallogr 2022; 55:737-750. [PMID: 35974740 PMCID: PMC9348891 DOI: 10.1107/s1600576722004198] [Citation(s) in RCA: 3] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/25/2022] [Accepted: 04/19/2022] [Indexed: 11/10/2022] Open
Abstract
A feed-forward neural-network-based model is presented to index, in real time, the diffraction spots recorded during synchrotron X-ray Laue microdiffraction experiments. Data dimensionality reduction is applied to extract physical 1D features from the 2D X-ray diffraction Laue images, thereby making it possible to train a neural network on the fly for any crystal system. The capabilities of the LaueNN model are illustrated through three examples: a two-phase nano-structure, a textured high-symmetry specimen deformed in situ and a polycrystalline low-symmetry material. This work provides a novel way to efficiently index Laue spots in simple and complex recorded images in <1 s, thereby opening up avenues for the realization of real-time analysis of synchrotron Laue diffraction data.
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Affiliation(s)
| | - Samuel Tardif
- Univ. Grenoble Alpes, CEA, IRIG, MEM, NRS, 17 rue des Martyrs, Grenoble 38000, France
| | - Olivier Castelnau
- PIMM, Arts et Metiers Institute of Technology, CNRS, ENSAM, 151 boulevard de l’hopital, Paris 75013, France
| | - Joel Eymery
- Univ. Grenoble Alpes, CEA, IRIG, MEM, NRS, 17 rue des Martyrs, Grenoble 38000, France
| | - René Guinebretière
- Université de Limoges, IRCER, UMR 7315, CNRS, Centre Européen de la Céramique, Limoges 87068, France
| | - Odile Robach
- Univ. Grenoble Alpes, CEA, IRIG, MEM, NRS, 17 rue des Martyrs, Grenoble 38000, France
| | - Taylan Ors
- Université de Haute-Alsace, IS2M, CNRS, UMR 7361, 3bis rue Alfred Werner, Mulhouse 68093, France
| | - Jean-Sébastien Micha
- Univ. Grenoble Alpes, UMR SYMMES CNRS-CEA, 17 avenue des Martyrs, Grenoble 38000, France
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Purushottam Raj Purohit RRP, Arya A, Bojjawar G, Pelerin M, Van Petegem S, Proudhon H, Mukherjee S, Gerard C, Signor L, Mocuta C, Casati N, Suwas S, Chokshi AH, Thilly L. Revealing the role of microstructure architecture on strength and ductility of Ni microwires by in-situ synchrotron X-ray diffraction. Sci Rep 2019; 9:79. [PMID: 30635618 PMCID: PMC6329826 DOI: 10.1038/s41598-018-36472-3] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/13/2018] [Accepted: 11/12/2018] [Indexed: 11/09/2022] Open
Abstract
Deformation mechanisms of cold drawn and electropolished nickel microwires are studied by performing in-situ monotonous and cyclic tensile tests under synchrotron radiation. X-ray diffraction tests allow probing elastic strains in the different grain families and establishing a link with the deformation mechanisms taking place within the microwires. The measurements were carried out on several microwires with diameters ranging from as-drawn 100 µm down to 40 µm thinned down by electropolishing. The as-drawn wires exhibit a core-shell microstructure with <111> fiber texture dominant in core and heterogeneous dual fiber texture <111> and <100> in the shell. Reduction of specimen size by electropolishing results in a higher yield stress and tensile strength along with reduced ductility. In-situ XRD analysis revealed that these differences are linked to the global variation in microstructure induced by shell removal with electropolishing, which in turn affects the load sharing abilities of grain families. This study thus proposes a new way to increase ductility and retain strength in nickel microwires across different diameters by tuning the microstructure architecture.
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Affiliation(s)
| | - Abhinav Arya
- Department of Materials Engineering, Indian Institute of Science, Bangalore, 560 012, India
| | - Girish Bojjawar
- Department of Materials Engineering, Indian Institute of Science, Bangalore, 560 012, India
| | - Maxime Pelerin
- MINES Paris Tech, Centre des Matériaux, CNRS UMR 7633, BP 87 91003, Evry Cedex, France
| | - Steven Van Petegem
- Photons for Engineering and Manufacturing, Swiss Light Source, Paul Scherrer Institute, Villigen, Switzerland
| | - Henry Proudhon
- MINES Paris Tech, Centre des Matériaux, CNRS UMR 7633, BP 87 91003, Evry Cedex, France
| | - Soham Mukherjee
- Institut Pprime, CNRS - ENSMA - Université de Poitiers, Département Physique et Mécanique des Matériaux, 86961, Futuroscope, France
| | - Céline Gerard
- Institut Pprime, CNRS - ENSMA - Université de Poitiers, Département Physique et Mécanique des Matériaux, 86961, Futuroscope, France
| | - Loïc Signor
- Institut Pprime, CNRS - ENSMA - Université de Poitiers, Département Physique et Mécanique des Matériaux, 86961, Futuroscope, France
| | - Cristian Mocuta
- Synchrotron SOLEIL, L'orme des Merisiers, Saint Aubin - BP 48, Gif-sur-Yvette, 91192, France
| | - Nicola Casati
- Laboratory for Synchrotron Radiation - Condensed Matter (LSC), Swiss Light Source, Paul Scherrer Institute, Villigen, Switzerland
| | - Satyam Suwas
- Department of Materials Engineering, Indian Institute of Science, Bangalore, 560 012, India
| | - Atul H Chokshi
- Department of Materials Engineering, Indian Institute of Science, Bangalore, 560 012, India
| | - Ludovic Thilly
- Institut Pprime, CNRS - ENSMA - Université de Poitiers, Département Physique et Mécanique des Matériaux, 86961, Futuroscope, France.
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