Liu HF, Jin YJ, Li CG, Dolmanan SB, Guo S, Tripathy S, Tan CC. High-resolution X-ray diffraction and micro-Raman scattering studies of Ge(:Ga) thin films grown on GaAs (001) substrates by MOCVD.
RSC Adv 2016. [DOI:
10.1039/c6ra10348k]
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Abstract
Ga-doped Ge thin films grown on GaAs (001) substrates have been studied and compared with unintentionally doped Ge film by using HRXRD and Raman scattering in both surface and cross-section configurations.
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