1
|
Gallon C, Fenouillet-Beranger C, Vandooren A, Boeuf F, Monfray S, Payet F, Orain S, Fiori V, Salvetti F, Loubet N, Charbuillet C, Toffoli A, Allain F, Romanjek K, Cayrefourcq I, Ghyselen B, Mazure C, Delille D, Judong F, Perrot C, Hopstaken M, Scheblin P, Rivallin P, Brevard L, Faynot O, Cristoloveanu S, Skotnicki T. Ultra-Thin Fully Depleted SOI Devices with Thin BOX, Ground Plane and Strained Liner Booster. ACTA ACUST UNITED AC 2006. [DOI: 10.1109/soi.2006.284410] [Citation(s) in RCA: 14] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/10/2022]
|
2
|
Skotnicki T, Monfray S, Chanemougame D, Coronel P, Harrison S, Dutartre D, Talbot A, Fenouillet-Beranger C, Borel S. SON (Silicon On Nothing) PLATFORM FOR ULSI ERA: TECHNOLOGY&DEVICES. Frontiers in Electronics 2006. [DOI: 10.1142/9789812773081_0009] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/18/2022] Open
Affiliation(s)
- T. Skotnicki
- ST Microelectronics, 850, rue J.Monnet, 38921 Crolles, France
| | - S. Monfray
- ST Microelectronics, 850, rue J.Monnet, 38921 Crolles, France
| | - D. Chanemougame
- ST Microelectronics, 850, rue J.Monnet, 38921 Crolles, France
| | - P. Coronel
- ST Microelectronics, 850, rue J.Monnet, 38921 Crolles, France
| | - S. Harrison
- ST Microelectronics, 850, rue J.Monnet, 38921 Crolles, France
| | - D. Dutartre
- ST Microelectronics, 850, rue J.Monnet, 38921 Crolles, France
| | - A. Talbot
- ST Microelectronics, 850, rue J.Monnet, 38921 Crolles, France
| | | | - S. Borel
- CEA-LETI, rue des Martyrs, 38054 Grenoble, France
| |
Collapse
|
3
|
Busseret C, Souifi A, Baron T, Monfray S, Buffet N, Gautier E, Semeria M. Electronic properties of silicon nanocrystallites obtained by SiOx (x<2) annealing. Materials Science and Engineering: C 2002. [DOI: 10.1016/s0928-4931(01)00482-9] [Citation(s) in RCA: 14] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/15/2022]
|