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Yu A, Shan L, Zhu W, Jie J, Hou B. A novel improved total variation algorithm for the elimination of scratch-type defects in high-voltage cable cross-sections. PLoS One 2024;19:e0300260. [PMID: 38626015 PMCID: PMC11020849 DOI: 10.1371/journal.pone.0300260] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [MESH Headings] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/17/2023] [Accepted: 02/23/2024] [Indexed: 04/18/2024]  Open
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