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Wang B, Zhang N, Wang Y, Chen D, Qi J, Tu J. S-induced Phase Change Forming In 2 O 3 /In 2 S 3 Heterostructure for Photoelectrochemical Glucose Sensor. Chemistry 2024; 30:e202303514. [PMID: 38081143 DOI: 10.1002/chem.202303514] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/24/2023] [Indexed: 02/03/2024]
Abstract
In the past several decades, Photoelectrochemical (PEC) sensing still remains a great challenge to design highly-efficient semiconductor photocatalysts via a facile method. It is of much importance to design and synthesize various novel nanostructured sensing materials for further improving the response performance. Herein, we present an In2 O3 /In2 S3 heterostructure obtained by combining microwave assisted hydrothermal method with S-induced phase change, whose energy band and electronic structure could be adjusted by changing the S content. Combining theoretical calculation and spectroscopic techniques, the introduction of sulfur was proved to produce multifunctional interfaces, inducing the change of phase, oxygen vacancies and band gap, which accelerates the separation of photoexcited carriers and reduces their recombination, improving the electronic injection efficiency around the interface of In2 O3 /In2 S3 . As anticipated, an enhanced glucose response performance with a photocurrent of 0.6 mA cm-2 , a linear range of 0.1-1 mM and a detection limit as low as 14.5 μM has been achieved based on the In2 O3 /In2 S3 heterostructure, which is significant superior over its pure In2 O3 and S-doped In2 O3 counterparts. This efficient interfacial strategy may open a new route to manipulate the electrical structure, and energy band structure regulation of sensing material to improve the performance of photoelectrodes for PEC.
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Affiliation(s)
- Bingrong Wang
- State Key Laboratory of Marine Resource Utilization in South China Sea, School of Materials Science and Engineering, Hainan University, Haikou, 570228, P. R. China
| | - Nan Zhang
- State Key Laboratory of Marine Resource Utilization in South China Sea, School of Materials Science and Engineering, Hainan University, Haikou, 570228, P. R. China
| | - Yifeng Wang
- State Key Laboratory of Marine Resource Utilization in South China Sea, School of Materials Science and Engineering, Hainan University, Haikou, 570228, P. R. China
| | - Delun Chen
- State Key Laboratory of Marine Resource Utilization in South China Sea, School of Materials Science and Engineering, Hainan University, Haikou, 570228, P. R. China
| | - Junlei Qi
- State Key Laboratory of Advanced Welding and, Joining Harbin Institute of Technology, Harbin, 150001, P. R. China
| | - Jinchun Tu
- State Key Laboratory of Marine Resource Utilization in South China Sea, School of Materials Science and Engineering, Hainan University, Haikou, 570228, P. R. China
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Li Y, Qing Y, Cao Y, Luo F, Wu H. Positive Charge Holes Revealed by Energy Band Theory in Multiphase Ti x O 2x-1 and Exploration of its Microscopic Electromagnetic Loss Mechanism. Small 2023; 19:e2302769. [PMID: 37292045 DOI: 10.1002/smll.202302769] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/02/2023] [Revised: 05/31/2023] [Indexed: 06/10/2023]
Abstract
Although numerous experimental investigations have been carried out on the problem of defect engineering in semiconductor absorbers, the relationship among charge carrier, defects, heterointerfaces, and electromagnetic (EM) wave absorption has not been established systematically. Herein, the new thermodynamic and kinetic control strategy is proposed to establish multiphase Tix O2 x -1 (1 ≤ x ≤ 6) through a hydrogenation calcination. The TiOC-900 composite shows the efficient EM wave absorption capability with a minimum reflection loss (RLmin ) of -69.6 dB at a thickness of 2.04 mm corresponding to an effective absorption bandwidth (EAB) of 4.0 GHz due to the holes induced conductance loss and heterointerfaces induced interfacial polarization. Benefiting from the controllable preparation of multiphase Tix O2 x -1 , a new pathway is proposed for designing high-efficiency EM wave absorbing semiconducting oxides. The validity of the method for adopting energy band theory to explore the underlying relations among charge carriers, defects, heterointerfaces, and EM properties in multiphase Tix O2 x -1 is demonstrated for the first time, which is of great importance in optimizing the EM wave absorption performance by electronic structure tailoring.
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Affiliation(s)
- Yang Li
- State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi'an, Shaanxi, 710072, P. R. China
| | - Yuchang Qing
- State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi'an, Shaanxi, 710072, P. R. China
| | - Yaru Cao
- State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi'an, Shaanxi, 710072, P. R. China
| | - Fa Luo
- State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi'an, Shaanxi, 710072, P. R. China
| | - Hongjing Wu
- MOE Key Laboratory of Material Physics and Chemistry under Extraordinary, School of Physical Science and Technology, Northwestern Polytechnical University, Xi'an, 710072, P. R. China
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Yang X, Duan B, Yang Y. Analysis of SiC/Si Heterojunction Band Energy and Interface State Characteristics for SiC/Si VDMOS. Micromachines (Basel) 2023; 14:1890. [PMID: 37893327 PMCID: PMC10609155 DOI: 10.3390/mi14101890] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/31/2023] [Revised: 09/28/2023] [Accepted: 09/29/2023] [Indexed: 10/29/2023]
Abstract
SiC/Si and GaN/Si heterojunction technology has been widely used in power semiconductor devices, and SiC/Si VDMOS and GaN/Si VDMOS were proposed in our previous paper. Based on existing research, breakdown point transfer technology (BPT) was used to optimize SiC/Si VDMOS. Simulation results showed that the BV of the SiC/Si heterojunction VDMOS was considerably increased from 259 V to 1144 V, and Ron,sp decreased from 18.2 mΩ·cm2 to 6.03 mΩ·cm2 compared with Si VDMOS. In order to analyze the characteristics of the SiC/Si heterojunction structure deeply, the influence of the interface state characteristics of the SiC/Si heterojunction on the electrical parameters of VDMOS was analyzed, including electric field characteristics, blocking characteristics, output characteristics, and transfer characteristics. In addition, the influence of the interface state of the SiC/Si heterojunction on energy band characteristics was analyzed. The results showed that with an increase in the interfacial charge (acceptor) concentration, the p-type trap layer was introduced into the interface of the SiC/Si heterojunction, energy increased slightly, and the barrier height difference at the heterojunction increased, resulting in an increase in BV. At the same time, since the barrier height became higher, electrons did not flow easily, so Ron,sp increased. On the contrary, when a charge (donor) was introduced at the interface of the SiC/Si heterojunction, the number of electrons in the channel increased, resulting in an increase in the electron current, which is conducive to the flow of electrons, resulting in a decrease in Ron,sp. The energy band and other characteristics of devices with temperature were simulated at different temperatures. Finally, the effects of SiC/Si heterojunction interface states on interface capacitances and switching performances of VDMOS devices were also discussed.
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Affiliation(s)
- Xin Yang
- Key Laboratory of the Ministry of Education for Wide Band-Gap Semiconductor Materials and Devices, School of Microelectronics, Xidian University, No. 2 South TaiBai Road, Xi’an 710071, China; (B.D.); (Y.Y.)
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Xu Y, Chen R, Jiang S, Zhou L, Jiang T, Gu C, Ang DS, Petti L, Zhang Q, Shen X, Han J, Zhou J. Insights into the Semiconductor SERS Activity: The Impact of the Defect-Induced Energy Band Offset and Electron Lifetime Change. ACS Appl Mater Interfaces 2023; 15:42026-42036. [PMID: 37612785 DOI: 10.1021/acsami.3c06363] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 08/25/2023]
Abstract
The significant boost in surface-enhanced Raman scattering (SERS) by the chemical enhancement of semiconducting oxides is a pivotal finding. It offers a prospective path toward high uniformity and low-cost SERS substrates. However, a detailed understanding of factors that influence the charge transfer process is still insufficient. Herein, we reveal the important role of defect-induced band offset and electron lifetime change in SERS evolution observed in a MoO3 oxide semiconductor. By modulating the density of oxygen vacancy defects using ultraviolet (UV) light irradiation, SERS is found to be improved with irradiation time in the first place, but such improvement later deteriorates for prolonged irradiation even if more defects are generated. Insights into the observed SERS evolution are provided by ultraviolet photoelectron spectroscopy and femtosecond time-resolved transient absorption spectroscopy measurements. Results reveal that (1) a suitable offset between the energy band of the substrate and the orbitals of molecules is facilitated by a certain defect density and (2) defect states with relatively long electron lifetime are essential to achieve optimal SERS performance.
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Affiliation(s)
- Yinghao Xu
- Institute of Photonics, Ningbo University, Ningbo, Zhejiang 315211, P. R. China
- The Research Institute of Advanced Technologies, Ningbo University, Ningbo, Zhejiang 315211, P. R. China
| | - Renli Chen
- Department of Chemical Physics, Hefei National Research Center for Physical Sciences at the Microscale, University of Science and Technology of China, Hefei, Anhui 230026, P. R. China
| | - Shenlong Jiang
- Hefei National Laboratory, University of Science and Technology of China, Hefei, Anhui 230088, P. R. China
| | - Lu Zhou
- Centre for Terahertz Waves and College of Precision Instrument and Optoelectronics Engineering, Tianjin University, Tianjin 300072, P. R. China
- Institute of Applied Sciences and Intelligent Systems-ISASI, CNR, via Campi Flegrei, 34, 80078 Pozzuoli, Napoli Italy
| | - Tao Jiang
- Institute of Photonics, Ningbo University, Ningbo, Zhejiang 315211, P. R. China
| | - Chenjie Gu
- Institute of Photonics, Ningbo University, Ningbo, Zhejiang 315211, P. R. China
- The Research Institute of Advanced Technologies, Ningbo University, Ningbo, Zhejiang 315211, P. R. China
| | - Diing Shenp Ang
- School of Electrical and Electronic Engineering, Nanyang Technological University, 50 Nanyang Avenue, 639798 Singapore
| | - Lucia Petti
- Institute of Applied Sciences and Intelligent Systems-ISASI, CNR, via Campi Flegrei, 34, 80078 Pozzuoli, Napoli Italy
| | - Qun Zhang
- Department of Chemical Physics, Hefei National Research Center for Physical Sciences at the Microscale, University of Science and Technology of China, Hefei, Anhui 230026, P. R. China
- Hefei National Laboratory, University of Science and Technology of China, Hefei, Anhui 230088, P. R. China
| | - Xiang Shen
- Institute of Photonics, Ningbo University, Ningbo, Zhejiang 315211, P. R. China
- The Research Institute of Advanced Technologies, Ningbo University, Ningbo, Zhejiang 315211, P. R. China
| | - Jiaguang Han
- Centre for Terahertz Waves and College of Precision Instrument and Optoelectronics Engineering, Tianjin University, Tianjin 300072, P. R. China
| | - Jun Zhou
- Institute of Photonics, Ningbo University, Ningbo, Zhejiang 315211, P. R. China
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Yang J, Wang J, Yang W, Zhu Y, Feng S, Su P, Fu W. Low-Temperature Processed Brookite Interfacial Modification for Perovskite Solar Cells with Improved Performance. Nanomaterials (Basel) 2022; 12:nano12203653. [PMID: 36296841 PMCID: PMC9608627 DOI: 10.3390/nano12203653] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/07/2022] [Revised: 10/14/2022] [Accepted: 10/14/2022] [Indexed: 06/12/2023]
Abstract
The scaffold layer plays an important role in transporting electrons and preventing carrier recombination in mesoporous perovskite solar cells (PSCs), so the engineering of the interface between the scaffold layer and the light absorption layer has attracted widespread concern. In this work, vertically grown TiO2 nanorods (NRs) as scaffold layers are fabricated and further treated with TiCl4 aqueous solution. It can be found that a thin brookite TiO2 nanoparticle (NP) layer is formed by the chemical bath deposition (CBD) method on the surface of every rutile NR with a low annealing temperature (150 °C), which is beneficial for the infiltration and growth of perovskite. The PSC based on the TiO2 NR/brookite NP structure shows the best power conversion of 15.2%, which is 56.37% higher than that of the PSC based on bare NRs (9.72%). This complex structure presents an improved pore filling fraction and better carrier transport capability with less trap-assisted carrier recombination. In addition, low-annealing-temperature-formed brookite NPs possess a more suitable edge potential for electrons to transport from the perovskite layer to the electron collection layer when compared with high-annealing-temperature-formed anatase NPs. The brookite phase TiO2 fabricated at a low temperature presents great potential for flexible PSCs.
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Affiliation(s)
- Jiandong Yang
- State Key Laboratory of Superhard Materials, Jilin University, Changchun 130012, China
| | - Jun Wang
- School of Physics and Optoelectronic Engineering, Shandong University of Technology, Zibo 255000, China
| | - Wenshu Yang
- State Key Laboratory of Superhard Materials, Jilin University, Changchun 130012, China
| | - Ying Zhu
- State Key Laboratory of Superhard Materials, Jilin University, Changchun 130012, China
| | - Shuang Feng
- College of Mathmatics and Physics, Inner Mongolia Minzu University, Tongliao 028000, China
| | - Pengyu Su
- School of Electronic Information Engineering, Yangtze Normal University, Chongqing 408100, China
| | - Wuyou Fu
- State Key Laboratory of Superhard Materials, Jilin University, Changchun 130012, China
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Chong C, Liu H, Wang S, Yang K. First-Principles Study on the Effect of Strain on Single-Layer Molybdenum Disulfide. Nanomaterials (Basel) 2021; 11:3127. [PMID: 34835891 DOI: 10.3390/nano11113127] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [What about the content of this article? (0)] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 10/22/2021] [Revised: 11/16/2021] [Accepted: 11/18/2021] [Indexed: 12/05/2022]
Abstract
By adopting the first-principles plane wave pseudopotential method based on density functional theory, the electronic structure properties of single-layer MoS2 (molybdenum disulfide) crystals under biaxial strain are studied. The calculation results in this paper show that when a small strain is applied to a single-layer MoS2, its band structure changes from a direct band gap to an indirect band gap. As the strain increases, the energy band still maintains the characteristics of the indirect band gap, and the band gap shows a linear downward trend. Through further analysis of the density of states, sub-orbital density of states, thermodynamic parameters and Raman spectroscopy, it revealed the variation of single-layer MoS2 with strain. This provides a theoretical basis for realizing the strain regulation of MoS2.
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Zhang B, Luo Y, Mai C, Mu L, Li M, Wang J, Xu W, Peng J. Effects of ZnMgO Electron Transport Layer on the Performance of InP-Based Inverted Quantum Dot Light-Emitting Diodes. Nanomaterials (Basel) 2021; 11:nano11051246. [PMID: 34065118 PMCID: PMC8151885 DOI: 10.3390/nano11051246] [Citation(s) in RCA: 8] [Impact Index Per Article: 2.7] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 03/30/2021] [Revised: 04/30/2021] [Accepted: 05/05/2021] [Indexed: 01/11/2023]
Abstract
An environment-friendly inverted indium phosphide red quantum dot light-emitting diode (InP QLED) was fabricated using Mg-doped zinc oxide (ZnMgO) as the electron transport layer (ETL). The effects of ZnMgO ETL on the performance of InP QLED were investigated. X-ray diffraction (XRD) analysis indicated that ZnMgO film has an amorphous structure, which is similar to zinc oxide (ZnO) film. Comparison of morphology between ZnO film and ZnMgO film demonstrated that Mg-doped ZnO film remains a high-quality surface (root mean square roughness: 0.86 nm) as smooth as ZnO film. The optical band gap and ultraviolet photoelectron spectroscopy (UPS) analysis revealed that the conduction band of ZnO shifts to a more matched position with InP quantum dot after Mg-doping, resulting in the decrease in turn-on voltage from 2.51 to 2.32 V. In addition, the ratio of irradiation recombination of QLED increases from 7% to 25% using ZnMgO ETL, which can be attributed to reduction in trap state by introducing Mg ions into ZnO lattices. As a result, ZnMgO is a promising material to enhance the performance of inverted InP QLED. This work suggests that ZnMgO has the potential to improve the performance of QLED, which consists of the ITO/ETL/InP QDs/TCTA/MoO3/Al, and Mg-doping strategy is an efficient route to directionally regulate ZnO conduction bands.
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Pan Y, Dan Y, Wang Y, Ye M, Zhang H, Quhe R, Zhang X, Li J, Guo W, Yang L, Lu J. Schottky Barriers in Bilayer Phosphorene Transistors. ACS Appl Mater Interfaces 2017; 9:12694-12705. [PMID: 28322554 DOI: 10.1021/acsami.6b16826] [Citation(s) in RCA: 29] [Impact Index Per Article: 4.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/06/2023]
Abstract
It is unreliable to evaluate the Schottky barrier height (SBH) in monolayer (ML) 2D material field effect transistors (FETs) with strongly interacted electrode from the work function approximation (WFA) because of existence of the Fermi-level pinning. Here, we report the first systematical study of bilayer (BL) phosphorene FETs in contact with a series of metals with a wide work function range (Al, Ag, Cu, Au, Cr, Ti, Ni, and Pd) by using both ab initio electronic band calculations and quantum transport simulation (QTS). Different from only one type of Schottky barrier (SB) identified in the ML phosphorene FETs, two types of SBs are identified in BL phosphorene FETs: the vertical SB between the metallized and the intact phosphorene layer, whose height is determined from the energy band analysis (EBA); the lateral SB between the metallized and the channel BL phosphorene, whose height is determined from the QTS. The vertical SBHs show a better consistency with the lateral SBHs of the ML phosphorene FETs from the QTS compared than that of the popular WFA. Therefore, we develop a better and more general method than the WFA to estimate the lateral SBHs of ML semiconductor transistors with strongly interacted electrodes based on the EBA for its BL counterpart. In terms of the QTS, n-type lateral Schottky contacts are formed between BL phosphorene and Cr, Al, and Cu electrodes with electron SBH of 0.27, 0.31, and 0.32 eV, respectively, while p-type lateral Schottky contacts are formed between BL phosphorene and Pd, Ti, Ni, Ag, and Au electrodes with hole SBH of 0.11, 0.18, 0.19, 0.20, and 0.21 eV, respectively. The theoretical polarity and SBHs are in good agreement with available experiments. Our study provides an insight into the BL phosphorene-metal interfaces that are crucial for designing the BL phosphorene device.
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Affiliation(s)
- Yuanyuan Pan
- State Key Laboratory of Mesoscopic Physics and Department of Physics, Peking University , Beijing 100871, P. R. China
| | - Yang Dan
- State Key Laboratory of Mesoscopic Physics and Department of Physics, Peking University , Beijing 100871, P. R. China
| | - Yangyang Wang
- Nanophotonics and Optoelectronics Research Center, Qian Xuesen Laboratory of Space Technology, China Academy of Space Technology , Beijing 100094, P. R. China
| | - Meng Ye
- State Key Laboratory of Mesoscopic Physics and Department of Physics, Peking University , Beijing 100871, P. R. China
| | - Han Zhang
- State Key Laboratory of Mesoscopic Physics and Department of Physics, Peking University , Beijing 100871, P. R. China
| | - Ruge Quhe
- State Key Laboratory of Information Photonics and Optical Communications & School of Science, Beijing University of Posts and Telecommunications , Beijing 100876, P. R. China
| | - Xiuying Zhang
- State Key Laboratory of Mesoscopic Physics and Department of Physics, Peking University , Beijing 100871, P. R. China
| | - Jingzhen Li
- State Key Laboratory of Mesoscopic Physics and Department of Physics, Peking University , Beijing 100871, P. R. China
| | - Wanlin Guo
- Key Laboratory for Intelligent Nano Materials and Devices of the Ministry of Education , Beijing 100876, P. R. China
| | - Li Yang
- Department of Physics, Washington University in St. Louis , St. Louis, Missouri 63130, United States
| | - Jing Lu
- State Key Laboratory of Mesoscopic Physics and Department of Physics, Peking University , Beijing 100871, P. R. China
- Collaborative Innovation Center of Quantum Matter , Beijing 100871, P. R. China
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Zhang N, Chen C, Mei Z, Liu X, Qu X, Li Y, Li S, Qi W, Zhang Y, Ye J, Roy VAL, Ma R. Monoclinic Tungsten Oxide with {100} Facet Orientation and Tuned Electronic Band Structure for Enhanced Photocatalytic Oxidations. ACS Appl Mater Interfaces 2016; 8:10367-10374. [PMID: 27045790 DOI: 10.1021/acsami.6b02275] [Citation(s) in RCA: 42] [Impact Index Per Article: 5.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/05/2023]
Abstract
Exploring surface-exposed highly active crystal facets for photocatalytic oxidations is promising in utilizing monoclinic WO3 semiconductor. However, the previously reported highly active facets for monoclinic WO3 were mainly toward enhancing photocatalytic reductions. Here we report that the WO3 with {100} facet orientation and tuned surface electronic band structure can effectively enhance photocatalytic oxidation properties. The {100} faceted WO3 single crystals are synthesized via a facile hydrothermal method. The UV-visible diffuse reflectance, X-ray photoelectron spectroscopy valence band spectra, and photoelectrochemical measurements suggest that the {100} faceted WO3 has a much higher energy level of valence band maximum compared with the normal WO3 crystals without preferred orientation of the crystal face. The density functional theory calculations reveal that the shift of O 2p and W 5d states in {100} face induce a unique band structure. In comparison with the normal WO3, the {100} faceted WO3 exhibits an O2 evolution rate about 5.1 times in water splitting, and also shows an acetone evolution rate of 4.2 times as well as CO2 evolution rate of 3.8 times in gaseous degradation of 2-propanol. This study demonstrates an efficient crystal face engineering route to tune the surface electronic band structure for enhanced photocatalytic oxidations.
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Affiliation(s)
- Ning Zhang
- School of Materials Science and Engineering, Central South University , Changsha, Hunan 410083, China
- Department of Physics and Materials Science, City University of Hong Kong , Tat Chee Avenue, Kowloon, Hong Kong SAR, China
| | - Chen Chen
- School of Materials Science and Engineering, Central South University , Changsha, Hunan 410083, China
| | - Zongwei Mei
- School of Advanced Materials, Peking University Shenzhen Graduate School , University Town, Shenzhen, Guangdong 518055, China
| | - Xiaohe Liu
- School of Materials Science and Engineering, Central South University , Changsha, Hunan 410083, China
| | - Xiaolei Qu
- School of Materials Science and Engineering, Central South University , Changsha, Hunan 410083, China
| | - Yunxiang Li
- TU-NIMS Joint Research Center, School of Materials Science and Engineering, Tianjin University , 92 Weijin Road, Nankai District, Tianjin 300072, China
| | - Siqi Li
- School of Materials Science and Engineering, Central South University , Changsha, Hunan 410083, China
| | - Weihong Qi
- School of Materials Science and Engineering, Central South University , Changsha, Hunan 410083, China
| | - Yuanjian Zhang
- School of Chemistry and Chemical Engineering, Southeast University , Nanjing 211189, China
| | - Jinhua Ye
- International Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science (NIMS) , 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan
- TU-NIMS Joint Research Center, School of Materials Science and Engineering, Tianjin University , 92 Weijin Road, Nankai District, Tianjin 300072, China
| | - Vellaisamy A L Roy
- Department of Physics and Materials Science, City University of Hong Kong , Tat Chee Avenue, Kowloon, Hong Kong SAR, China
| | - Renzhi Ma
- School of Materials Science and Engineering, Central South University , Changsha, Hunan 410083, China
- International Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science (NIMS) , 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan
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