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Bokore FE, Knox RE, Hiebert CW, Cuthbert RD, DePauw RM, Meyer B, N’Diaye A, Pozniak CJ, McCallum BD. A Combination of Leaf Rust Resistance Genes, Including Lr34 and Lr46, Is the Key to the Durable Resistance of the Canadian Wheat Cultivar, Carberry. Front Plant Sci 2022;12:775383. [PMID: 35069630 PMCID: PMC8770329 DOI: 10.3389/fpls.2021.775383] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 09/13/2021] [Accepted: 11/17/2021] [Indexed: 06/14/2023]
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