Anthracene Single-Crystal Scintillators for Computer Tomography Scanning

X-ray imaging and computed tomography (CT) technology, as the important non-destructive measurements, can observe internal structures without destroying the detected sample, which are always used in biological diagnosis to detect tumors, pathologies, and bone damages. It is always a challenge to find materials with a low detection limit, a short exposure time, and high resolution to reduce X-ray damage and acquire high-contrast images. Here, we described a low-cost and high-efficient method to prepare centimeter-sized anthracene crystals, which exhibited intense X-ray radioluminescence with a detection limit of ∼0.108 μGy s^-1, which is only one-fifth of the dose typically used for X-ray diagnostics. Additionally, the low absorption reduced the damage in radiation and ensured superior cycle performance. X-ray detectors based on anthracene crystals also exhibited an extremely high resolution of 40 lp mm^-1. The CT scanning and reconstruction of a foam sample were then achieved, and the detailed internal structure could be clearly observed. These indicated that organic crystals are expecting to be leading candidate low-cost materials for low-dose and highly sensitive X-ray detection and CT scanning.

Organic Semiconductor Single Crystals for X-ray Imaging

Low-dose, high-resolution X-ray imaging is vital for medical diagnostics and material/device analyses. Current X-ray imagers are dominated by expensive inorganic materials via high-temperature solid processes (up to 1700 °C, e.g., CsI:Tl) with heavy metal elements. It is essential to search for new materials as X-ray imagers with low growth temperature, low cost, high sensitivity, along with high chemical and environmental stability. Here, 9,10-diphenylanthracene (9,10-DPA) single crystals are used as a representative model, which are grown via low-temperature solution processes, exhibiting intense X-ray radioluminescence with ultrahigh photon-conversion efficiency, ultrafast response and high sensitivity. The resolution of devices based on organic crystals exceeds 20.00 lp mm^-1 . Meanwhile the crystals exhibit high cycle performance under X-ray irradiation and environmental stability. This study demonstrates that organic semiconductors have potential use in low-cost, high-sensitivity and low-dose X-ray imaging systems.

A Study on an Organic Semiconductor-Based Indirect X-ray Detector with Cd-Free QDs for Sensitivity Improvement

In this paper, we studied the optimized conditions for adding inorganic quantum dots (QD) to the P3HT:PC₇₀BM organic active layer to increase the sensitivity of the indirect X-ray detector. Commonly used QDs are composed of hazardous substances with environmental problems, so indium phosphide (InP) QDs were selected as the electron acceptor in this experiment. Among the three different sizes of InP QDs (4, 8, and 12 nm in diameter), the detector with 4 nm InP QDs showed the highest sensitivity, of 2.01 mA/Gy·cm². To further improve the sensitivity, the QDs were fixed to 4 nm in diameter and then the amount of QDs added to the organic active layer was changed from 0 to 5 mg. The highest sensitivity, of 2.26 mA/Gy·cm², was obtained from the detector with a P3HT:PC₇₀BM:InP QDs (1 mg) active layer. In addition, the highest mobility, of 1.69 × 10⁻⁵ cm²/V·s, was obtained from the same detector. Compared to the detector with the pristine P3HT:PC₇₀BM active layer, the detector with a P3HT:PC₇₀BM:InP QDs (1 mg) active layer had sensitivity that was 61.87% higher. The cut-off frequency of the P3HT:PC₇₀BM detector was 21.54 kHz, and that of the P3HT:PC₇₀BM:InP QDs (1 mg) detector was 26.33 kHz, which was improved by 22.24%.