|
1
|
Durkin M, Adams JS, Bandler SR, Chervenak JA, Chaudhuri S, Dawson CS, Denison EV, Doriese WB, Duff SM, Finkbeiner FM, FitzGerald CT, Fowler JW, Gard JD, Hilton GC, Irwin KD, Joe YI, Kelley RL, Kilbourne CA, Miniussi AR, Morgan KM, O'Neil GC, Pappas CG, Porter FS, Reintsema CD, Rudman DA, SaKai K, Smith SJ, Stevens RW, Swetz DS, Szypryt P, Ullom JN, Vale LR, Wakeham N, Weber JC, Young BA. Demonstration of Athena X-IFU Compatible 40-Row Time-Division-Multiplexed Readout. IEEE Trans Appl Supercond 2019; 29:2101005. [PMID: 31160861 PMCID: PMC6544157 DOI: 10.1109/tasc.2019.2904472] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/09/2023]
Abstract
Time-division multiplexing (TDM) is the backup readout technology for the X-ray Integral Field Unit (X-IFU), a 3,168-pixel X-ray transition-edge sensor (TES) array that will provide imaging spectroscopy for ESA's Athena satellite mission. X-0IFU design studies are considering readout with a multiplexing factor of up to 40. We present data showing 40-row TDM readout (32 TES rows + 8 repeats of the last row) of TESs that are of the same type as those being planned for X-IFU, using measurement and analysis parameters within the ranges specified for X-IFU. Singlecolumn TDM measurements have best-fit energy resolution of (1.91 ± 0.01) eV for the Al Kα complex (1.5 keV), (2.10 ± 0.02) eV for Ti Kα (4.5 keV), (2.23 ± 0.02) eV for Mn Kα (5.9 keV), (2.40 ± 0.02) eV for Co Kα (6.9 keV), and (3.44 ± 0.04) eV for Br Kα (11.9 keV). Three-column measurements have best-fit resolution of (2.03 ± 0.01) eV for Ti Kα and (2.40 ± 0.01) eV for Co Kα. The degradation due to the multiplexed readout ranges from 0.1 eV at the lower end of the energy range to 0.5 eV at the higher end. The demonstrated performance meets X-IFU's energy-resolution and energy-range requirements. True 40-row TDM readout, without repeated rows, of kilopixel scale arrays of X-IFU-like TESs is now under development.
Collapse
Affiliation(s)
- M Durkin
- National Institute of Standards and Technology, Boulder, CO 80305, USA
| | - J S Adams
- National Aeronautics and Space Administration, Greenbelt, MD 20771 USA
| | - S R Bandler
- National Aeronautics and Space Administration, Greenbelt, MD 20771 USA
| | - J A Chervenak
- National Aeronautics and Space Administration, Greenbelt, MD 20771 USA
| | - S Chaudhuri
- Stanford University Dept. of Physics, Stanford, CA 94305 USA
| | - C S Dawson
- Stanford University Dept. of Physics, Stanford, CA 94305 USA
| | - E V Denison
- National Institute of Standards and Technology, Boulder, CO 80305, USA
| | - W B Doriese
- National Institute of Standards and Technology, Boulder, CO 80305, USA
| | - S M Duff
- National Institute of Standards and Technology, Boulder, CO 80305, USA
| | - F M Finkbeiner
- National Aeronautics and Space Administration, Greenbelt, MD 20771 USA
| | - C T FitzGerald
- Santa Clara University Dept. of Physics, Santa Clara, CA 95053 USA
| | - J W Fowler
- National Institute of Standards and Technology, Boulder, CO 80305, USA
| | - J D Gard
- National Institute of Standards and Technology, Boulder, CO 80305, USA
| | - G C Hilton
- National Institute of Standards and Technology, Boulder, CO 80305, USA
| | - K D Irwin
- Stanford University Dept. of Physics, Stanford, CA 94305 USA
| | - Y I Joe
- National Institute of Standards and Technology, Boulder, CO 80305, USA
| | - R L Kelley
- National Aeronautics and Space Administration, Greenbelt, MD 20771 USA
| | - C A Kilbourne
- National Aeronautics and Space Administration, Greenbelt, MD 20771 USA
| | - A R Miniussi
- National Aeronautics and Space Administration, Greenbelt, MD 20771 USA
| | - K M Morgan
- National Institute of Standards and Technology, Boulder, CO 80305, USA
| | - G C O'Neil
- National Institute of Standards and Technology, Boulder, CO 80305, USA
| | - C G Pappas
- National Institute of Standards and Technology, Boulder, CO 80305, USA
| | - F S Porter
- National Aeronautics and Space Administration, Greenbelt, MD 20771 USA
| | - C D Reintsema
- National Institute of Standards and Technology, Boulder, CO 80305, USA
| | - D A Rudman
- National Institute of Standards and Technology, Boulder, CO 80305, USA
| | - K SaKai
- National Aeronautics and Space Administration, Greenbelt, MD 20771 USA
| | - S J Smith
- National Aeronautics and Space Administration, Greenbelt, MD 20771 USA
| | - R W Stevens
- National Institute of Standards and Technology, Boulder, CO 80305, USA
| | - D S Swetz
- National Institute of Standards and Technology, Boulder, CO 80305, USA
| | - P Szypryt
- National Institute of Standards and Technology, Boulder, CO 80305, USA
| | - J N Ullom
- National Institute of Standards and Technology, Boulder, CO 80305, USA
| | - L R Vale
- National Institute of Standards and Technology, Boulder, CO 80305, USA
| | - N Wakeham
- National Aeronautics and Space Administration, Greenbelt, MD 20771 USA
| | - J C Weber
- National Institute of Standards and Technology, Boulder, CO 80305, USA
| | - B A Young
- Santa Clara University Dept. of Physics, Santa Clara, CA 95053 USA
| |
Collapse
|
|
2
|
Doriese WB, Bandler SR, Chaudhuri S, Dawson CS, Denison EV, Duff SM, Durkin M, FitzGerald CT, Fowler JW, Gard JD, Hilton GC, Irwin KD, Joe YI, Morgan KM, O'Neil GC, Pappas CG, Reintsema CD, Rudman DA, Smith SJ, Stevens RW, Swetz DS, Szypryt P, Ullom JN, Vale LR, Weber JC, Young BA. Optimization of Time- and Code-Division-Multiplexed Readout for Athena X-IFU. IEEE Trans Appl Supercond 2019; 29:10.1109/TASC.2019.2905577. [PMID: 31360051 PMCID: PMC6662226 DOI: 10.1109/tasc.2019.2905577] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/09/2023]
Abstract
Readout of a large, spacecraft-based array of superconducting transition-edge sensors (TESs) requires careful management of the layout area and power dissipation of the cryogenic-circuit components. We present three optimizations of our time- (TDM) and code-division-multiplexing (CDM) systems for the X-ray Integral Field Unit (X-IFU), a several-thousand-pixel-TES array for the planned Athena-satellite mission. The first optimization is a new readout scheme that is a hybrid of CDM and TDM. This C/TDM architecture balances CDM's noise advantage with TDM's layout compactness. The second is a redesign of a component: the shunt resistor that provides a dc-voltage bias to the TESs. A new layout and a thicker Pd-Au resistive layer combine to reduce this resistor's area by more than a factor of 5. Third, we have studied the power dissipated by the first-stage SQUIDs (superconducting quantum-interference devices) and the readout noise versus the critical current of the first-stage SqUIDs. As a result, the X-IFU TDM and C/TDM SQUIDs will have a specified junction critical current of 5 μA. Based on these design optimizations and TDM experiments described by Durkin, et al. (these proceedings), TDM meets all requirements to be X-IFU's backup-readout option. Hybrid C/TDM is another viable option that could save spacecraft resources.
Collapse
Affiliation(s)
- W B Doriese
- National Institute of Standards and Technology, Boulder, CO 80305, USA
| | - S R Bandler
- National Aeronautics and Space Administration, Greenbelt, MD 20771 USA
| | - S Chaudhuri
- Stanford University Dept. of Physics, Stanford, CA 94305 USA
| | - C S Dawson
- Stanford University Dept. of Physics, Stanford, CA 94305 USA
| | - E V Denison
- National Institute of Standards and Technology, Boulder, CO 80305, USA
| | - S M Duff
- National Institute of Standards and Technology, Boulder, CO 80305, USA
| | - M Durkin
- National Institute of Standards and Technology, Boulder, CO 80305, USA
| | - C T FitzGerald
- Santa Clara University Dept. of Physics, Santa Clara, CA 95053 USA
| | - J W Fowler
- National Institute of Standards and Technology, Boulder, CO 80305, USA
| | - J D Gard
- National Institute of Standards and Technology, Boulder, CO 80305, USA
| | - G C Hilton
- National Institute of Standards and Technology, Boulder, CO 80305, USA
| | - K D Irwin
- Stanford University Dept. of Physics, Stanford, CA 94305 USA
| | - Y I Joe
- National Institute of Standards and Technology, Boulder, CO 80305, USA
| | - K M Morgan
- National Institute of Standards and Technology, Boulder, CO 80305, USA
| | - G C O'Neil
- National Institute of Standards and Technology, Boulder, CO 80305, USA
| | - C G Pappas
- National Institute of Standards and Technology, Boulder, CO 80305, USA
| | - C D Reintsema
- National Institute of Standards and Technology, Boulder, CO 80305, USA
| | - D A Rudman
- National Institute of Standards and Technology, Boulder, CO 80305, USA
| | - S J Smith
- National Aeronautics and Space Administration, Greenbelt, MD 20771 USA
| | - R W Stevens
- National Institute of Standards and Technology, Boulder, CO 80305, USA
| | - D S Swetz
- National Institute of Standards and Technology, Boulder, CO 80305, USA
| | - P Szypryt
- National Institute of Standards and Technology, Boulder, CO 80305, USA
| | - J N Ullom
- National Institute of Standards and Technology, Boulder, CO 80305, USA
| | - L R Vale
- National Institute of Standards and Technology, Boulder, CO 80305, USA
| | - J C Weber
- National Institute of Standards and Technology, Boulder, CO 80305, USA
| | - B A Young
- Stanford University Dept. of Physics, Stanford, CA 94305 USA
| |
Collapse
|
|
3
|
Doriese WB, Abbamonte P, Alpert BK, Bennett DA, Denison EV, Fang Y, Fischer DA, Fitzgerald CP, Fowler JW, Gard JD, Hays-Wehle JP, Hilton GC, Jaye C, McChesney JL, Miaja-Avila L, Morgan KM, Joe YI, O'Neil GC, Reintsema CD, Rodolakis F, Schmidt DR, Tatsuno H, Uhlig J, Vale LR, Ullom JN, Swetz DS. A practical superconducting-microcalorimeter X-ray spectrometer for beamline and laboratory science. Rev Sci Instrum 2017; 88:053108. [PMID: 28571411 DOI: 10.1063/1.4983316] [Citation(s) in RCA: 17] [Impact Index Per Article: 2.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/20/2023]
Abstract
We describe a series of microcalorimeter X-ray spectrometers designed for a broad suite of measurement applications. The chief advantage of this type of spectrometer is that it can be orders of magnitude more efficient at collecting X-rays than more traditional high-resolution spectrometers that rely on wavelength-dispersive techniques. This advantage is most useful in applications that are traditionally photon-starved and/or involve radiation-sensitive samples. Each energy-dispersive spectrometer is built around an array of several hundred transition-edge sensors (TESs). TESs are superconducting thin films that are biased into their superconducting-to-normal-metal transitions. The spectrometers share a common readout architecture and many design elements, such as a compact, 65 mK detector package, 8-column time-division-multiplexed superconducting quantum-interference device readout, and a liquid-cryogen-free cryogenic system that is a two-stage adiabatic-demagnetization refrigerator backed by a pulse-tube cryocooler. We have adapted this flexible architecture to mate to a variety of sample chambers and measurement systems that encompass a range of observing geometries. There are two different types of TES pixels employed. The first, designed for X-ray energies below 10 keV, has a best demonstrated energy resolution of 2.1 eV (full-width-at-half-maximum or FWHM) at 5.9 keV. The second, designed for X-ray energies below 2 keV, has a best demonstrated resolution of 1.0 eV (FWHM) at 500 eV. Our team has now deployed seven of these X-ray spectrometers to a variety of light sources, accelerator facilities, and laboratory-scale experiments; these seven spectrometers have already performed measurements related to their applications. Another five of these spectrometers will come online in the near future. We have applied our TES spectrometers to the following measurement applications: synchrotron-based absorption and emission spectroscopy and energy-resolved scattering; accelerator-based spectroscopy of hadronic atoms and particle-induced-emission spectroscopy; laboratory-based time-resolved absorption and emission spectroscopy with a tabletop, broadband source; and laboratory-based metrology of X-ray-emission lines. Here, we discuss the design, construction, and operation of our TES spectrometers and show first-light measurements from the various systems. Finally, because X-ray-TES technology continues to mature, we discuss improvements to array size, energy resolution, and counting speed that we anticipate in our next generation of TES-X-ray spectrometers and beyond.
Collapse
Affiliation(s)
- W B Doriese
- National Institute of Standards and Technology, Boulder, Colorado 80305, USA
| | - P Abbamonte
- Department of Physics, University of Illinois, Urbana, Illinois 61801, USA
| | - B K Alpert
- National Institute of Standards and Technology, Boulder, Colorado 80305, USA
| | - D A Bennett
- National Institute of Standards and Technology, Boulder, Colorado 80305, USA
| | - E V Denison
- National Institute of Standards and Technology, Boulder, Colorado 80305, USA
| | - Y Fang
- Department of Physics, University of Illinois, Urbana, Illinois 61801, USA
| | - D A Fischer
- National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA
| | - C P Fitzgerald
- National Institute of Standards and Technology, Boulder, Colorado 80305, USA
| | - J W Fowler
- National Institute of Standards and Technology, Boulder, Colorado 80305, USA
| | - J D Gard
- National Institute of Standards and Technology, Boulder, Colorado 80305, USA
| | - J P Hays-Wehle
- National Institute of Standards and Technology, Boulder, Colorado 80305, USA
| | - G C Hilton
- National Institute of Standards and Technology, Boulder, Colorado 80305, USA
| | - C Jaye
- National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA
| | - J L McChesney
- Argonne National Laboratory, Advanced Photon Source, Argonne, Illinois 60439, USA
| | - L Miaja-Avila
- National Institute of Standards and Technology, Boulder, Colorado 80305, USA
| | - K M Morgan
- National Institute of Standards and Technology, Boulder, Colorado 80305, USA
| | - Y I Joe
- National Institute of Standards and Technology, Boulder, Colorado 80305, USA
| | - G C O'Neil
- National Institute of Standards and Technology, Boulder, Colorado 80305, USA
| | - C D Reintsema
- National Institute of Standards and Technology, Boulder, Colorado 80305, USA
| | - F Rodolakis
- Argonne National Laboratory, Advanced Photon Source, Argonne, Illinois 60439, USA
| | - D R Schmidt
- National Institute of Standards and Technology, Boulder, Colorado 80305, USA
| | - H Tatsuno
- Department of Chemical Physics, Lund University, Lund, Sweden
| | - J Uhlig
- Department of Chemical Physics, Lund University, Lund, Sweden
| | - L R Vale
- National Institute of Standards and Technology, Boulder, Colorado 80305, USA
| | - J N Ullom
- National Institute of Standards and Technology, Boulder, Colorado 80305, USA
| | - D S Swetz
- National Institute of Standards and Technology, Boulder, Colorado 80305, USA
| |
Collapse
|
|
4
|
Fowler JW, Alpert BK, Doriese WB, Fischer DA, Jaye C, Joe YI, O’Neil GC, Swetz DS, Ullom JN. MICROCALORIMETER SPECTROSCOPY AT HIGH PULSE RATES: A MULTI-PULSE FITTING TECHNIQUE. ACTA ACUST UNITED AC 2015. [DOI: 10.1088/0067-0049/219/2/35] [Citation(s) in RCA: 27] [Impact Index Per Article: 3.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/12/2022]
|
|
5
|
Uhlig J, Doriese WB, Fowler JW, Swetz DS, Jaye C, Fischer DA, Reintsema CD, Bennett DA, Vale LR, Mandal U, O'Neil GC, Miaja-Avila L, Joe YI, El Nahhas A, Fullagar W, Gustafsson FP, Sundström V, Kurunthu D, Hilton GC, Schmidt DR, Ullom JN. High-resolution X-ray emission spectroscopy with transition-edge sensors: present performance and future potential. J Synchrotron Radiat 2015; 22:766-75. [PMID: 25931095 DOI: 10.1107/s1600577515004312] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 11/14/2014] [Accepted: 03/02/2015] [Indexed: 05/20/2023]
Abstract
X-ray emission spectroscopy (XES) is a powerful element-selective tool to analyze the oxidation states of atoms in complex compounds, determine their electronic configuration, and identify unknown compounds in challenging environments. Until now the low efficiency of wavelength-dispersive X-ray spectrometer technology has limited the use of XES, especially in combination with weaker laboratory X-ray sources. More efficient energy-dispersive detectors have either insufficient energy resolution because of the statistical limits described by Fano or too low counting rates to be of practical use. This paper updates an approach to high-resolution X-ray emission spectroscopy that uses a microcalorimeter detector array of superconducting transition-edge sensors (TESs). TES arrays are discussed and compared with conventional methods, and shown under which circumstances they are superior. It is also shown that a TES array can be integrated into a table-top time-resolved X-ray source and a soft X-ray synchrotron beamline to perform emission spectroscopy with good chemical sensitivity over a very wide range of energies.
Collapse
Affiliation(s)
- J Uhlig
- Department of Chemical Physics, Lund University, Lund, Sweden
| | - W B Doriese
- National Institute of Standards and Technology, 325 Broadway, MS 817.03, Boulder, CO 80305, USA
| | - J W Fowler
- National Institute of Standards and Technology, 325 Broadway, MS 817.03, Boulder, CO 80305, USA
| | - D S Swetz
- National Institute of Standards and Technology, 325 Broadway, MS 817.03, Boulder, CO 80305, USA
| | - C Jaye
- Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA
| | - D A Fischer
- Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA
| | - C D Reintsema
- National Institute of Standards and Technology, 325 Broadway, MS 817.03, Boulder, CO 80305, USA
| | - D A Bennett
- National Institute of Standards and Technology, 325 Broadway, MS 817.03, Boulder, CO 80305, USA
| | - L R Vale
- National Institute of Standards and Technology, 325 Broadway, MS 817.03, Boulder, CO 80305, USA
| | - U Mandal
- Department of Chemical Physics, Lund University, Lund, Sweden
| | - G C O'Neil
- National Institute of Standards and Technology, 325 Broadway, MS 817.03, Boulder, CO 80305, USA
| | - L Miaja-Avila
- National Institute of Standards and Technology, 325 Broadway, MS 817.03, Boulder, CO 80305, USA
| | - Y I Joe
- National Institute of Standards and Technology, 325 Broadway, MS 817.03, Boulder, CO 80305, USA
| | - A El Nahhas
- Department of Chemical Physics, Lund University, Lund, Sweden
| | - W Fullagar
- Department of Chemical Physics, Lund University, Lund, Sweden
| | | | - V Sundström
- Department of Chemical Physics, Lund University, Lund, Sweden
| | - D Kurunthu
- Department of Chemical Physics, Lund University, Lund, Sweden
| | - G C Hilton
- National Institute of Standards and Technology, 325 Broadway, MS 817.03, Boulder, CO 80305, USA
| | - D R Schmidt
- National Institute of Standards and Technology, 325 Broadway, MS 817.03, Boulder, CO 80305, USA
| | - J N Ullom
- National Institute of Standards and Technology, 325 Broadway, MS 817.03, Boulder, CO 80305, USA
| |
Collapse
|
|
6
|
Reed JP, Uchoa B, Joe YI, Gan Y, Casa D, Fradkin E, Abbamonte P. The Effective Fine-Structure Constant of Freestanding Graphene Measured in Graphite. Science 2010; 330:805-8. [DOI: 10.1126/science.1190920] [Citation(s) in RCA: 103] [Impact Index Per Article: 7.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/02/2022]
|
|
7
|
Kim M, Chen XM, Joe YI, Fradkin E, Abbamonte P, Cooper SL. Mapping the magnetostructural quantum phases of Mn3O4. Phys Rev Lett 2010; 104:136402. [PMID: 20481898 DOI: 10.1103/physrevlett.104.136402] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/09/2009] [Indexed: 05/29/2023]
Abstract
We present temperature-dependent x-ray diffraction and temperature- and field-dependent Raman scattering studies of single-crystal Mn3O4, which reveal the magnetostructural phases that evolve in the spinels due to the interplay between strong spin-orbital coupling, geometric frustration, and applied magnetic field. We present evidence that the magnetoelastic and magnetodielectric behavior in this material is governed by magnetic-field-controlled tetragonal-to-monoclinic phase changes. Most interestingly, for an applied field transverse to the ferrimagnetic ordering direction, H parallel [110], we find evidence for a field-tuned quantum phase transition to a tetragonal spin-disordered phase, indicating that a structurally symmetric, spin frustrated phase can be recovered at T approximately 0 for intermediate transverse fields in Mn3O4.
Collapse
Affiliation(s)
- M Kim
- Department of Physics and Frederick Seitz Materials Research Laboratory, University of Illinois, Urbana, Illinois 61801, USA
| | | | | | | | | | | |
Collapse
|