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Ge C, Liu Z, Zhu Y, Zhou Y, Jiang B, Zhu J, Yang X, Zhu Y, Yan S, Hu H, Song H, Li L, Chen C, Tang J. Insight into the High Mobility and Stability of In 2 O 3 :H Film. Small 2024; 20:e2304721. [PMID: 37670209 DOI: 10.1002/smll.202304721] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/05/2023] [Revised: 08/26/2023] [Indexed: 09/07/2023]
Abstract
Wide bandgap semiconductors, particularly In2 O3 :Sn (ITO), are widely used as transparent conductive electrodes in optoelectronic devices. Nevertheless, due to the strohave beenng scattering probability of high-concentration oxygen vacancy (VO ) defects, the mobility of ITO is always lower than 40 cm2 V-1 s-1 . Recently, hydrogen-doped In2 O3 (In2 O3 :H) films have been proven to have high mobility (>100 cm2 V-1 s-1 ), but the origin of this high mobility is still unclear. Herein, a high-resolution electron microscope and theoretical calculations are employed to investigate the atomic-scale mechanisms behind the high carrier mobility in In2 O3 :H films. It is found that VO can cause strong lattice distortion and large carrier scattering probability, resulting in low carrier mobility. Furthermore, hydrogen doping can simultaneously reduce the concentration of VO , which accounts for high carrier mobility. The thermal stability and acid-base corrosion mechanism of the In2 O3 :H film are investigated and found that hydrogen overflows from the film at high temperatures (>250 °C), while acidic or alkaline environments can cause damage to the In2 O3 grains themselves. Overall, this work provides insights into the essential reasons for high carrier mobility in In2 O3 :H and presents a new research approach to the doping and stability mechanisms of transparent conductive oxides.
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Affiliation(s)
- Ciyu Ge
- Wuhan National Laboratory for Optoelectronics (WNLO) and School of Optical and Electronic Information (SOEI), Huazhong University of Science and Technology, Wuhan, Hubei, 430074, P. R. China
| | - Zunyu Liu
- Wuhan National Laboratory for Optoelectronics (WNLO) and School of Optical and Electronic Information (SOEI), Huazhong University of Science and Technology, Wuhan, Hubei, 430074, P. R. China
| | - Yongchen Zhu
- Wuhan National Laboratory for Optoelectronics (WNLO) and School of Optical and Electronic Information (SOEI), Huazhong University of Science and Technology, Wuhan, Hubei, 430074, P. R. China
| | - Yilong Zhou
- Wuhan National Laboratory for Optoelectronics (WNLO) and School of Optical and Electronic Information (SOEI), Huazhong University of Science and Technology, Wuhan, Hubei, 430074, P. R. China
| | - Borui Jiang
- Wuhan National Laboratory for Optoelectronics (WNLO) and School of Optical and Electronic Information (SOEI), Huazhong University of Science and Technology, Wuhan, Hubei, 430074, P. R. China
| | - Jiaxing Zhu
- Wuhan National Laboratory for Optoelectronics (WNLO) and School of Optical and Electronic Information (SOEI), Huazhong University of Science and Technology, Wuhan, Hubei, 430074, P. R. China
| | - Xuke Yang
- Wuhan National Laboratory for Optoelectronics (WNLO) and School of Optical and Electronic Information (SOEI), Huazhong University of Science and Technology, Wuhan, Hubei, 430074, P. R. China
| | - Yongxin Zhu
- Wuhan National Laboratory for Optoelectronics (WNLO) and School of Optical and Electronic Information (SOEI), Huazhong University of Science and Technology, Wuhan, Hubei, 430074, P. R. China
| | - Shuyu Yan
- Wuhan National Laboratory for Optoelectronics (WNLO) and School of Optical and Electronic Information (SOEI), Huazhong University of Science and Technology, Wuhan, Hubei, 430074, P. R. China
| | - Haojun Hu
- Wuhan National Laboratory for Optoelectronics (WNLO) and School of Optical and Electronic Information (SOEI), Huazhong University of Science and Technology, Wuhan, Hubei, 430074, P. R. China
| | - Haisheng Song
- Wuhan National Laboratory for Optoelectronics (WNLO) and School of Optical and Electronic Information (SOEI), Huazhong University of Science and Technology, Wuhan, Hubei, 430074, P. R. China
| | - Luying Li
- Wuhan National Laboratory for Optoelectronics (WNLO) and School of Optical and Electronic Information (SOEI), Huazhong University of Science and Technology, Wuhan, Hubei, 430074, P. R. China
| | - Chao Chen
- Wuhan National Laboratory for Optoelectronics (WNLO) and School of Optical and Electronic Information (SOEI), Huazhong University of Science and Technology, Wuhan, Hubei, 430074, P. R. China
- Optics Valley Laboratory, Hubei, 430074, P. R. China
| | - Jiang Tang
- Wuhan National Laboratory for Optoelectronics (WNLO) and School of Optical and Electronic Information (SOEI), Huazhong University of Science and Technology, Wuhan, Hubei, 430074, P. R. China
- Optics Valley Laboratory, Hubei, 430074, P. R. China
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Mallem SPR, Puneetha P, Choi Y, Baek SM, An SJ, Im KS. Temperature-Dependent Carrier Transport in GaN Nanowire Wrap-Gate Transistor. Nanomaterials (Basel) 2023; 13:nano13101629. [PMID: 37242044 DOI: 10.3390/nano13101629] [Citation(s) in RCA: 2] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/24/2023] [Revised: 05/06/2023] [Accepted: 05/11/2023] [Indexed: 05/28/2023]
Abstract
For the creation of next-generation nanoscale devices, it is crucial to comprehend the carrier transport mechanisms in nanowires. Here, we examine how temperature affects the properties of GaN nanowire wrap-gate transistors (WGTs), which are made via a top-down technique. The predicted conductance in this transistor remains essentially unaltered up to a temperature of 240 K and then increases after that as the temperature rises. This is true for increasing temperature at gate voltages less than threshold voltage (Vgs < Vth). Sharp fluctuations happen when the temperature rises with a gate voltage of Vth < Vgs < VFB. The conductance steadily decreases with increasing temperature after increasing the gate bias to Vgs > VFB. These phenomena are possibly attributed to phonon and impurity scattering processes occurring on the surface or core of GaN nanowires.
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Affiliation(s)
- Siva Pratap Reddy Mallem
- Advanced Material Research Center, Kumoh National Institute of Technology, Gumi 39177, Republic of Korea
| | - Peddathimula Puneetha
- Department of Robotics and Intelligent Machine Engineering, College of Mechanical and IT Engineering, Yeungnam University, Gyeongsan 38541, Republic of Korea
| | - Yeojin Choi
- Department of Materials Science and Engineering, Kumoh National Institute of Technology, Gumi 39177, Republic of Korea
| | - Seung Mun Baek
- Department of Materials Science and Engineering, Kumoh National Institute of Technology, Gumi 39177, Republic of Korea
| | - Sung Jin An
- Department of Materials Science and Engineering, Kumoh National Institute of Technology, Gumi 39177, Republic of Korea
| | - Ki-Sik Im
- Department of Green Semiconductor System, Daegu Campus, Korea Polytechnics, Daegu 41765, Republic of Korea
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Edwards PJ, Wang B, Cronin SB, Bushmaker AW. Direct Measurement of Water-Assisted Ion Desorption and Solvation on Isolated Carbon Nanotubes. ACS Nano 2020; 14:16854-16863. [PMID: 33202132 DOI: 10.1021/acsnano.0c05638] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
Abstract
We have investigated the change in mean residence time of gaseous ions adsorbed on the surface of suspended carbon nanotube field-effect transistors (CNT-FETs) with and without native surface water layers that exists in atmospheric conditions. Devices were characterized electrically before and after dehydration by thermal, dry gas, and vacuum desiccation and in each scenario were found to have substantially higher mean ion residence times. It is proposed that water molecules native to the CNT surface in ambient conditions provide a reduction pathway for incoming gaseous ions, yielding hydronium ions (H3O+). This is supported by the appearance of frequent clustered readsorption events in the presence of surface water, caused by the rapid hopping of H+ between the device surface and the lowest water layer, which are not present in data collected from desiccated devices. After desiccation of the device, a thermal trial was conducted to determine the adsorption energy of N2+ ions on the CNT surface. This work has profound implications for our understanding of wetting in one-dimensional systems and the chemistry of ion chemisorption and solvation on the surfaces of materials in general.
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Affiliation(s)
- Patrick J Edwards
- Department of Physics, The University of Southern California, 825 Bloom Walk, Los Angeles, California 90089, United States
- Physical Sciences Laboratories, The Aerospace Corporation, 355 S. Douglas Street, El Segundo, California 90245, United States
| | - Bo Wang
- Department of Physics, The University of Southern California, 825 Bloom Walk, Los Angeles, California 90089, United States
| | - Stephen B Cronin
- Department of Electrical Engineering, The University of Southern California, 3601 W. Way, Los Angeles, California 90089, United States
| | - Adam W Bushmaker
- Physical Sciences Laboratories, The Aerospace Corporation, 355 S. Douglas Street, El Segundo, California 90245, United States
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Soman A, Burke RA, Li Q, Valentin MD, Li T, Mao D, Dubey M, Gu T. Hydrogen Plasma Exposure of Monolayer MoS 2 Field-Effect Transistors and Prevention of Desulfurization by Monolayer Graphene. ACS Appl Mater Interfaces 2020; 12:37305-37312. [PMID: 32702966 DOI: 10.1021/acsami.0c07818] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
Abstract
Atomic vacancies related to structural disorder and doping variation influence carrier transport in monolayer transition-metal dichalcogenide devices. Here, we investigate the effect of hydrogen plasma exposure (HPE) on monolayer MoS2 field-effect transistors (FETs). We observe that a 1% increase in sulfur vacancy after HPE results in incremental 0.06 eV of the Schottky barrier. Short-range scattering from the sulfur vacancies reduces the carrier mobility of monolayer MoS2 by 2 orders of magnitude. Despite the defects and grain boundaries formed during the chemical vapor deposition and transferring process, the surface desulfurization induced by the proton exposure and thermally accelerated oxidation can be blocked by monolayer graphene cladding with a van der Waals contact distance of 2.5 Å. The material-level study indicates a promising route for a low-cost and robust fabrication of smart sensor circuits on a monolithic MoS2 wafer, where the bare MoS2 FETs can serve as proton sensors, with their electronic readout processed by a logic circuit of graphene-protected pristine FETs with a high on/off ratio.
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Affiliation(s)
- Anishkumar Soman
- Department of Electrical and Computer Engineering, University of Delaware, Newark, Delaware 19716, United States
| | - Robert A Burke
- Sensors and Electron Devices Directorate, U.S. Army Research Laboratory, Adelphi, Maryland 20783, United States
- General Technical Services, LLC, Wall, New Jersey 07727, United States
| | - Qiu Li
- Department of Electrical and Computer Engineering, University of Delaware, Newark, Delaware 19716, United States
- Tianjin Key Laboratory of High Speed Cutting and Precision Machining, Tianjin University of Technology and Education, Tianjin 300222, China
| | - Michael D Valentin
- Sensors and Electron Devices Directorate, U.S. Army Research Laboratory, Adelphi, Maryland 20783, United States
| | - Tiantian Li
- Department of Electrical and Computer Engineering, University of Delaware, Newark, Delaware 19716, United States
| | - Dun Mao
- Department of Electrical and Computer Engineering, University of Delaware, Newark, Delaware 19716, United States
| | - Madan Dubey
- Sensors and Electron Devices Directorate, U.S. Army Research Laboratory, Adelphi, Maryland 20783, United States
| | - Tingyi Gu
- Department of Electrical and Computer Engineering, University of Delaware, Newark, Delaware 19716, United States
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Horide T, Murakami Y, Hirayama Y, Ishimaru M, Matsumoto K. Thermoelectric Property in Orthorhombic-Domained SnSe Film. ACS Appl Mater Interfaces 2019; 11:27057-27063. [PMID: 31310492 DOI: 10.1021/acsami.9b04868] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/10/2023]
Abstract
Single-crystal SnSe exhibits extremely high thermoelectric properties, and fabrication of SnSe films is promising for practical application and basic research on properties. However, the high thermoelectric properties have not yet been reported in SnSe films and their thermoelectric properties and nanostructure have not yet been analyzed in detail. In the present study, a-axis-oriented epitaxial SnSe films were prepared to discuss the thermoelectric properties of the SnSe films. While the electrical conductivity of the films was orders of magnitude smaller than that in the single crystals at room temperature, surprisingly, the thermoelectric property (power factor) of the films was slightly higher than that in the single crystals at high temperatures (∼300 °C). The SnSe films contained orthorhombic domain boundaries with a spacing of several hundred nanometers. The orthorhombic domain boundaries caused carrier scattering and degraded the mobility of the films at room temperature, but their effect decreased with increasing temperature. Thus, the carrier scattering at domain boundaries results in characteristic temperature dependence of thermoelectric properties in the SnSe films. High thermoelectric properties at high temperatures were successfully achieved in the SnSe films in spite of the existence of domain boundaries, demonstrating the possibility of high-performance of SnSe thermoelectric films.
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Affiliation(s)
- Tomoya Horide
- Department of Materials Science and Engineering , Kyushu Institute of Technology , 1-1 Sensui-cho , Tobata-ku, Kitakyushu 804-8550 , Japan
| | - Yutaro Murakami
- Department of Materials Science and Engineering , Kyushu Institute of Technology , 1-1 Sensui-cho , Tobata-ku, Kitakyushu 804-8550 , Japan
| | - Yoshiki Hirayama
- Department of Materials Science and Engineering , Kyushu Institute of Technology , 1-1 Sensui-cho , Tobata-ku, Kitakyushu 804-8550 , Japan
| | - Manabu Ishimaru
- Department of Materials Science and Engineering , Kyushu Institute of Technology , 1-1 Sensui-cho , Tobata-ku, Kitakyushu 804-8550 , Japan
| | - Kaname Matsumoto
- Department of Materials Science and Engineering , Kyushu Institute of Technology , 1-1 Sensui-cho , Tobata-ku, Kitakyushu 804-8550 , Japan
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Han Y, Fu M, Tang Z, Zheng X, Ji X, Wang X, Lin W, Yang T, Chen Q. Switching from Negative to Positive Photoconductivity toward Intrinsic Photoelectric Response in InAs Nanowire. ACS Appl Mater Interfaces 2017; 9:2867-2874. [PMID: 28049290 DOI: 10.1021/acsami.6b13775] [Citation(s) in RCA: 26] [Impact Index Per Article: 3.7] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/05/2023]
Abstract
Negative photoconductivity (NPC) and positive photoconductivity (PPC) are observed in the same individual InAs nanowires grown by metal-organic chemical vapor deposition. NPC displays under weak light illumination due to photoexcitation scattering centers charged with hot carrier in the native oxide layer. PPC is observed under high light intensity. Through removing the native oxide layer and passivating the nanowire with HfO2, we eliminate the NPC effect and realize intrinsic photoelectric response in InAs nanowire.
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Affiliation(s)
- Yuxiang Han
- Key Laboratory for the Physics and Chemistry of Nanodevices and Department of Electronics, Peking University , Beijing 100871, China
| | - Mengqi Fu
- Key Laboratory for the Physics and Chemistry of Nanodevices and Department of Electronics, Peking University , Beijing 100871, China
| | - Zhiqiang Tang
- Key Laboratory for the Physics and Chemistry of Nanodevices and Department of Electronics, Peking University , Beijing 100871, China
| | - Xiao Zheng
- Key Laboratory for the Physics and Chemistry of Nanodevices and Department of Electronics, Peking University , Beijing 100871, China
| | - Xianghai Ji
- Key Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences , Beijing 100083, China
- College of Materials Science and Optoelectronic Technology, University of Chinese Academy of Sciences , Beijing 100049, China
| | - Xiaoye Wang
- Key Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences , Beijing 100083, China
- College of Materials Science and Optoelectronic Technology, University of Chinese Academy of Sciences , Beijing 100049, China
| | - Weijian Lin
- Laboratory for Condensed Matter Physics, Chinese Academy of Sciences , Beijing 100190, China
| | - Tao Yang
- Key Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences , Beijing 100083, China
- College of Materials Science and Optoelectronic Technology, University of Chinese Academy of Sciences , Beijing 100049, China
| | - Qing Chen
- Key Laboratory for the Physics and Chemistry of Nanodevices and Department of Electronics, Peking University , Beijing 100871, China
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Zaia EW, Sahu A, Zhou P, Gordon MP, Forster JD, Aloni S, Liu YS, Guo J, Urban JJ. Carrier Scattering at Alloy Nanointerfaces Enhances Power Factor in PEDOT:PSS Hybrid Thermoelectrics. Nano Lett 2016; 16:3352-9. [PMID: 27070850 DOI: 10.1021/acs.nanolett.6b01009] [Citation(s) in RCA: 17] [Impact Index Per Article: 2.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/14/2023]
Abstract
UNLABELLED This work demonstrates the first method for controlled growth of heterostructures within hybrid organic/inorganic nanocomposite thermoelectrics. Using a facile, aqueous technique, semimetal-alloy nanointerfaces are patterned within a hybrid thermoelectric system consisting of tellurium (Te) nanowires and the conducting polymer poly(3,4-ethylenedioxythiophene):poly(styrene-sulfonate) ( PEDOT PSS). Specifically, this method is used to grow nanoscale islands of Cu1.75Te alloy subphases within hybrid PEDOT PSS-Te nanowires. This technique is shown to provide tunability of thermoelectric and electronic properties, providing up to 22% enhancement of the system's power factor in the low-doping regime, consistent with preferential scattering of low energy carriers. This work provides an exciting platform for rational design of multiphase nanocomposites and highlights the potential for engineering of carrier filtering within hybrid thermoelectrics via introduction of interfaces with controlled structural and energetic properties.
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Affiliation(s)
- Edmond W Zaia
- Department of Chemical Engineering, University of California , Berkeley, California 94720, United States
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