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Pletincx S, Marcoen K, Trotochaud L, Fockaert LL, Mol JMC, Head AR, Karslioğlu O, Bluhm H, Terryn H, Hauffman T. Unravelling the Chemical Influence of Water on the PMMA/Aluminum Oxide Hybrid Interface In Situ. Sci Rep 2017; 7:13341. [PMID: 29042657 PMCID: PMC5645382 DOI: 10.1038/s41598-017-13549-z] [Citation(s) in RCA: 25] [Impact Index Per Article: 3.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/06/2017] [Accepted: 09/25/2017] [Indexed: 01/05/2023] Open
Abstract
Understanding the stability of chemical interactions at the polymer/metal oxide interface under humid conditions is vital to understand the long-term durability of hybrid systems. Therefore, the interface of ultrathin PMMA films on native aluminum oxide, deposited by reactive adsorption, was studied. The characterization of the interface of the coated substrates was performed using ambient pressure X-ray photoelectron spectroscopy (APXPS), Fourier transform infrared spectroscopy in the Kretschmann geometry (ATR-FTIR Kretschmann) and time-of-flight secondary ion mass spectrometry (ToF-SIMS). The formation of hydrogen bonds and carboxylate ionic bonds at the interface are observed. The formed ionic bond is stable up to 5 Torr water vapour pressure as shown by APXPS. However, when the coated samples are exposed to an excess of aqueous electrolyte, an increase in the amount of carboxylate bonds at the interface, as a result of hydrolysis of the methoxy group, is observed by ATR-FTIR Kretschmann. These observations, supported by ToF-SIMS spectra, lead to the proposal of an adsorption mechanism of PMMA on aluminum oxide, which shows the formation of methanol at the interface and the effect of water molecules on the different interfacial interactions.
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Affiliation(s)
- Sven Pletincx
- Department of Electrochemical and Surface Engineering (SURF), Vrije Universiteit Brussel, Pleinlaan 2, 1050, Brussels, Belgium. .,Chemical Sciences Division, Lawrence Berkeley National Laboratory, One Cyclotron Road, Berkeley, CA 94720, United States of America.
| | - Kristof Marcoen
- Department of Electrochemical and Surface Engineering (SURF), Vrije Universiteit Brussel, Pleinlaan 2, 1050, Brussels, Belgium
| | - Lena Trotochaud
- Chemical Sciences Division, Lawrence Berkeley National Laboratory, One Cyclotron Road, Berkeley, CA 94720, United States of America
| | - Laura-Lynn Fockaert
- Department of Materials Science and Engineering, Delft University of Technology, Mekelweg 2, 2628 CD, Delft, The Netherlands
| | - Johannes M C Mol
- Department of Materials Science and Engineering, Delft University of Technology, Mekelweg 2, 2628 CD, Delft, The Netherlands
| | - Ashley R Head
- Chemical Sciences Division, Lawrence Berkeley National Laboratory, One Cyclotron Road, Berkeley, CA 94720, United States of America
| | - Osman Karslioğlu
- Chemical Sciences Division, Lawrence Berkeley National Laboratory, One Cyclotron Road, Berkeley, CA 94720, United States of America
| | - Hendrik Bluhm
- Chemical Sciences Division, Lawrence Berkeley National Laboratory, One Cyclotron Road, Berkeley, CA 94720, United States of America
| | - Herman Terryn
- Department of Electrochemical and Surface Engineering (SURF), Vrije Universiteit Brussel, Pleinlaan 2, 1050, Brussels, Belgium
| | - Tom Hauffman
- Department of Electrochemical and Surface Engineering (SURF), Vrije Universiteit Brussel, Pleinlaan 2, 1050, Brussels, Belgium
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Becker N, Wirtz T. Reduction of Matrix Effects in Polystyrene/Poly(methylene methacrylate) Blends by Metal-Assisted Secondary Ion Mass Spectrometry. Anal Chem 2012; 84:5920-4. [DOI: 10.1021/ac300433n] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022]
Affiliation(s)
- Nora Becker
- Department of Science and Analysis of Materials, Centre de Recherche Public−Gabriel Lippmann,
41 rue du Brill, L-4422 Belvaux, Luxembourg
| | - Tom Wirtz
- Department of Science and Analysis of Materials, Centre de Recherche Public−Gabriel Lippmann,
41 rue du Brill, L-4422 Belvaux, Luxembourg
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3
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The Storing Matter technique applied to polystyrene: a study of different methods to enhance Ag-cationization. SURF INTERFACE ANAL 2012. [DOI: 10.1002/sia.5088] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/07/2022]
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Nittler L, Delcorte A, Bertrand P, Migeon HN. Morphology study of small amounts of evaporated gold on polymers. SURF INTERFACE ANAL 2012. [DOI: 10.1002/sia.4866] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/06/2022]
Affiliation(s)
- L. Nittler
- Institute of Condensed Matter and Nanosciences; Université catholique de Louvain; 1 Croix du Sud B-1348 Louvain-la-Neuve Belgium
- Science et Analyse des Matériaux; CRP-Gabriel Lippmann; 41 Rue du Brill L-4422 Belvaux Luxembourg
| | - A. Delcorte
- Institute of Condensed Matter and Nanosciences; Université catholique de Louvain; 1 Croix du Sud B-1348 Louvain-la-Neuve Belgium
| | - P. Bertrand
- Institute of Condensed Matter and Nanosciences; Université catholique de Louvain; 1 Croix du Sud B-1348 Louvain-la-Neuve Belgium
| | - H.-N. Migeon
- Science et Analyse des Matériaux; CRP-Gabriel Lippmann; 41 Rue du Brill L-4422 Belvaux Luxembourg
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Heile A, Muhmann C, Lipinsky D, Arlinghaus HF. Investigations of secondary ion yield-enhancing methods in combination. SURF INTERFACE ANAL 2010. [DOI: 10.1002/sia.3556] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/12/2022]
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6
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Nittler L, Delcorte A, Bertrand P, Migeon HN. Investigating the relation between the secondary yield enhancement and the structure of the metallic overlayer in metal-assisted SIMS. SURF INTERFACE ANAL 2010. [DOI: 10.1002/sia.3425] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/10/2022]
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Brewer TM, Szakal C, Gillen G. Method for improved secondary ion yields in cluster secondary ion mass spectrometry. RAPID COMMUNICATIONS IN MASS SPECTROMETRY : RCM 2010; 24:593-598. [PMID: 20155758 DOI: 10.1002/rcm.4423] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/28/2023]
Abstract
A method to increase useful yields of organic molecules is investigated by cluster secondary ion mass spectrometry (SIMS). Glycerol drops were deposited onto various inkjet-printed arrays and the organic molecules in the film were rapidly incorporated into the drop. The resulting glycerol/analyte drops were then probed with fullerene primary ions under dynamic SIMS conditions. High primary ion beam currents were shown to aid in the mixing of the glycerol drop, thus replenishing the probed area and sustaining high secondary ion yields. Integrated secondary ion signals for tetrabutylammonium iodide and cocaine in the glycerol drops were enhanced by more than a factor of 100 compared with an analogous area on the surface, and a factor of 1000 over the lifetime of the glycerol drop. Once the analyte of interest is incorporated into the glycerol microdrop, the solution chemistry can be tailored for enhanced secondary ion yields, with examples shown for cyclotrimethylenetrinitramine (RDX) chloride adduct formation. In addition, depositing localized glycerol drops may enhance analyte secondary ion count rates to high enough levels to allow for site-specific chemical maps of molecules in complex matrices such as biological tissues.
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Affiliation(s)
- Tim M Brewer
- Surface and Microanalysis Science Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
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Téllez H, Vadillo JM, Laserna JJ. Energy-resolved depth profiling of metal-polymer interfaces using dynamic quadrupole secondary ion mass spectrometry. RAPID COMMUNICATIONS IN MASS SPECTROMETRY : RCM 2009; 23:2357-2362. [PMID: 19575403 DOI: 10.1002/rcm.4151] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/28/2023]
Abstract
Quadrupole secondary ion mass spectrometry (qSIMS) characterization of a metallized polypropylene film used in the manufacturing of capacitors has been performed. Ar(+) primary ions were used to preserve the oxidation state of the surface. The sample exhibits an incomplete metallization that made it difficult to determine the exact location of the metal-polymer interface due to the simultaneous contribution of ions with identical m/z values from the metallic and the polymer layers. Energy filtering by means of a 45 degrees electrostatic analyzer allowed resolution of the metal-polymer interface by selecting a suitable kinetic energy corresponding to the ions generated in the metallized layer but not from the polymer. Under these conditions, selective analyses of isobaric interferences such as (27)Al(+) and (27)C(2)H(3) (+) or (43)AlO(+) and (43)C(3)H(7) (+) have been successfully performed.
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Affiliation(s)
- Helena Téllez
- Department of Analytical Chemistry, University of Málaga, Malaga 29071, Spain
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Heile A, Lipinsky D, Wehbe N, Delcorte A, Bertrand P, Felten A, Houssiau L, Pireaux JJ, De Mondt R, Van Royen P, Van Vaeck L, Arlinghaus HF. Investigation of methods to enhance the secondary ion yields in TOF-SIMS of organic samples. SURF INTERFACE ANAL 2008. [DOI: 10.1002/sia.2810] [Citation(s) in RCA: 16] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/11/2022]
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Delcorte A, Yunus S, Wehbe N, Nieuwjaer N, Poleunis C, Felten A, Houssiau L, Pireaux JJ, Bertrand P. Metal-assisted secondary ion mass spectrometry using atomic (Ga+, In+) and fullerene projectiles. Anal Chem 2007; 79:3673-89. [PMID: 17417819 DOI: 10.1021/ac062406l] [Citation(s) in RCA: 58] [Impact Index Per Article: 3.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/28/2022]
Abstract
The advantages and drawbacks of using either monatomic or buckminsterfullerene primary ions for metal-assisted secondary ion mass spectrometry (MetA-SIMS) are investigated using a series of organic samples including additive molecules, polyolefins, and small peptides. Gold deposition is mostly performed by sputter-coating, and in some cases, the results are compared to those of thermal evaporation (already used in a previous article: Delcorte, A.; Médard, N.; Bertrand, P. Anal. Chem. 2002, 74, 4955). The microstructure of the gold-covered sample surfaces is assessed by scanning and transmission electron microscopies. The merits of the different sets of experimental conditions are established via the analysis of fragment and parent-like ion yields. For most of the analyzed samples, the highest yields of fragment and parent-like ions are already reached with the sole use of C60+ projectiles. Metallization of the sample does not lead to a significant additional enhancement. For polyethylene and polypropylene, however, gold metallization associated with Ga+/In+ projectiles appears to be the only way to observe large cationized, sample-specific chain segments (m/z approximately 1000-2000). A detailed study of the polypropylene mass spectra as a function of gold coverage shows that the dynamics of yield enhancement by metal nanoparticles is strongly dependent on the choice of the projectile, e.g., a pronounced increase with Ga+ and a slow decay with C60+. The cases of Irganox 1010, a polymer antioxidant, and leucine enkephalin, a small peptide, allow us to investigate the specific influence of the experimental conditions on the emission of parent(like) ions such as M+, (M + Na)+, and (M + Au)+. The results show a dependence on both the type of sample and the considered secondary ion. Using theoretical and experimental arguments, the discussion identifies some of the mechanisms underlying the general trends observed in the results. Guidelines concerning the choice of the experimental conditions for MetA-SIMS are provided.
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Affiliation(s)
- A Delcorte
- PCPM, Université Catholique de Louvain, Croix du Sud 1, B-1348 Louvain-la-Neuve, Belgium.
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Delcorte A, Bour J, Aubriet F, Muller JF, Bertrand P. Sample Metallization for Performance Improvement in Desorption/Ionization of Kilodalton Molecules: Quantitative Evaluation, Imaging Secondary Ion MS, and Laser Ablation. Anal Chem 2003; 75:6875-85. [PMID: 14670048 DOI: 10.1021/ac0302105] [Citation(s) in RCA: 90] [Impact Index Per Article: 4.3] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/30/2022]
Abstract
The metallization procedure, proposed recently for signal improvement in organic secondary ion mass spectrometry (SIMS) (Delcorte, A.; Médard, N.; Bertrand, P. Anal.Chem. 2002, 74, 4955)., has been thoroughly tested for a set of kilodalton molecules bearing various functional groups: Irganox 1010, polystyrene, polyalanine, and copper phthalocyanine. In addition to gold, we evaluate the effect of silver evaporation as a sample treatment prior to static SIMS analysis. Ion yields, damage cross sections, and emission efficiencies are compared for Ag- and Au-metallized molecular films, pristine coatings on silicon, and submonolayers of the same molecules adsorbed on silver and gold. The results are sample-dependent but as an example, the yield enhancement calculated for metallized Irganox films with respect to untreated coatings is larger than 2 orders of magnitude for the quasimolecular ion and a factor of 1-10 for characteristic fragments. Insights into the emission processes of quasimolecular ions from metallized surfaces are deduced from kinetic energy distribution measurements. The advantage of the method for imaging SIMS applications is illustrated by the study of a nonuniform coating of polystyrene oligomers on a 100-microm polypropylene film. The evaporated metal eliminates sample charging and allows us to obtain enhanced quality images of characteristic fragment ions as well as reasonably contrasted chemical mappings for cationized PS oligomers and large PP chain segments. Finally, we report on the benefit of using metal evaporation as a sample preparation procedure for laser ablation mass spectrometry. Our results show that the fingerprint spectra of Au-covered polystyrene, polypropylene, and Irganox films can be readily obtained under 337-nm irradiation, a wavelength for which the absorption of polyolefins is low. This is probably because the gold clusters embedded in the sample surface absorb and transfer the photon energy to the surrounding organic medium.
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Affiliation(s)
- A Delcorte
- Unité de Physico-Chimie et de Physique des Matériaux, Université catholique de Louvain, 1 Croix du Sud, B-1348, Louvain-la-Neuve, Belgium.
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Delcorte A, Médard N, Bertrand P. Organic secondary ion mass spectrometry: sensitivity enhancement by gold deposition. Anal Chem 2002; 74:4955-68. [PMID: 12380818 DOI: 10.1021/ac020125h] [Citation(s) in RCA: 134] [Impact Index Per Article: 6.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/28/2022]
Abstract
Hydrocarbon oligomers, high-molecular-weight polymers, and polymer additives have been covered with 2-60 nmol of gold/cm2 in order to enhance the ionization efficiency for static secondary ion mass spectrometry (s-SIMS) measurements. Au-cationized molecules (up to -3,000 Da) and fragments (up to the trimer) are observed in the positive mass spectra of metallized polystyrene (PS) oligomer films. Beyond 3,000 Da, the entanglement of polymer chains prevents the ejection of intact molecules from a "thick" organic film. This mass limit can be overcome by embedding the polymer chains in a low-molecular-weight matix. The diffusion of organic molecules over the metal surfaces is also demonstrated for short PS oligomers. In the case of high-molecular-weight polymers (polyethylene, polypropylene, PS) and polymer additives (Irganox 1010, Irgafos 168), the metallization procedure induces a dramatic increase of the fingerprint fragment ion yields as well as the formation of new Aucationized species that can be used for chemical diagnostics. In comparison with the deposition of submonolayers of organic molecules on metallic surfaces, metal evaporation onto organic samples provides a comparable sensitivity enhancement. The distinct advantage of the metal evaporation procedure is that it can be used for any kind of organic sample, irrespective of thickness, opening new perspectives for "real world" sample analysis and chemical imaging by s-SIMS.
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Affiliation(s)
- A Delcorte
- PCPM, Université catholique de Louvain, Louvain-la-Neuve, Belgium.
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13
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Affiliation(s)
- Xia Dong
- Department of Chemistry, Vanderbilt University, Box 1822 Station B, Nashville, Tennessee 37235
| | - David M. Hercules
- Department of Chemistry, Vanderbilt University, Box 1822 Station B, Nashville, Tennessee 37235
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14
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Affiliation(s)
- S D Hanton
- Air Products and Chemicals, Incorporated, Allentown, Pennsylvania 18195, USA
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15
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Affiliation(s)
- M L Pacholski
- Department of Chemistry, Penn State University, 184 Materials Research Institute Building, University Park, Pennsylvania 16802
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Groenewold G, Gianotto A, Olson J, Appelhans A, Ingram J, Delmore J, Shaw A. Static SIMS investigation of tetraethylammonium bromide on soil particles using ReO4− and Ga+ projectiles. ACTA ACUST UNITED AC 1998. [DOI: 10.1016/s0168-1176(97)00296-6] [Citation(s) in RCA: 24] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/25/2022]
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