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Li D, Yan J, Zhang Y, Wang J, Yu L. Lorentz Force-Actuated Bidirectional Nanoelectromechanical Switch with an Ultralow Operation Voltage. NANO LETTERS 2024; 24:11403-11410. [PMID: 39083658 DOI: 10.1021/acs.nanolett.4c01999] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 08/02/2024]
Abstract
The high operating voltage of conventional nanoelectromechanical switches, typically tens of volts, is much higher than the driving voltage of the complementary metal oxide semiconductor integrated circuit (∼1 V). Though the operating voltage can be reduced by adopting a narrow air gap, down to several nanometers, this leads to formidable manufacturing challenges and occasionally irreversible switch failures due to the surface adhesive force. Here, we demonstrate a new nanowire-morphed nanoelectromechanical (NW-NEM) switch structure with ultralow operation voltages. In contrast to conventional nanoelectromechanical switches actuated by unidirectional electrostatic attraction, the NW-NEM switch is bidirectionally driven by Lorentz force to allow the use of a large air gap for excellent electrical isolation, while achieving a record-low driving voltage of <0.2 V. Furthermore, the introduction of the Lorentz force allows the NW-NEM switch to effectively overcome the adhesion force to recover to the turn-off state.
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Affiliation(s)
- Dianlun Li
- School of Electronic Science and Engineering, National Laboratory of Solid-State Microstructures, Nanjing University, 210023 Nanjing, China
| | - Jiang Yan
- School of Electronic Science and Engineering, National Laboratory of Solid-State Microstructures, Nanjing University, 210023 Nanjing, China
| | - Ying Zhang
- School of Electronic Science and Engineering, National Laboratory of Solid-State Microstructures, Nanjing University, 210023 Nanjing, China
| | - Junzhuan Wang
- School of Electronic Science and Engineering, National Laboratory of Solid-State Microstructures, Nanjing University, 210023 Nanjing, China
| | - Linwei Yu
- School of Electronic Science and Engineering, National Laboratory of Solid-State Microstructures, Nanjing University, 210023 Nanjing, China
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Zhang B, Xue Y, Park HS, Jiang JW. Flexible nanomechanical bit based on few-layer graphene. Phys Chem Chem Phys 2024; 26:822-829. [PMID: 38095185 DOI: 10.1039/d3cp03241h] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/04/2024]
Abstract
Mechanical computers have gained intense research interest at size scales ranging from nano to macro as they may complement electronic computers operating in extreme environments. While nanoscale mechanical computers may be easier to integrate with traditional electronic components, most current nanomechanical computers are based on volatile resonator systems that require continuous energy input. In this study, we propose a non-volatile nanomechanical bit based on the quasi-stable configurations of few-layer graphene with void defects, and demonstrate its multiple quasi-stable states by deriving an analytic relationship for the void configuration based on a competition between the bending energy and the cohesive energy. Using this nanomechanical bit, typical logic gates are constructed to perform Boolean calculations, including NOT, AND, OR, NAND and NOR gates, and demonstrate reprogrammability between these logic gates. We also study the accuracy and the stability of the nanomechanical bits based on the few-layer graphene. These findings provide a novel approach to realize the nanomechanical computing process.
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Affiliation(s)
- Bin Zhang
- Shanghai Key Laboratory of Mechanics in Energy Engineering, Shanghai Institute of Applied Mathematics and Mechanics, Shanghai Frontier Science Center of Mechanoinformatics, School of Mechanics and Engineering Science, Shanghai University, Shanghai 200072, People's Republic of China.
| | - Yixuan Xue
- Shanghai Key Laboratory of Mechanics in Energy Engineering, Shanghai Institute of Applied Mathematics and Mechanics, Shanghai Frontier Science Center of Mechanoinformatics, School of Mechanics and Engineering Science, Shanghai University, Shanghai 200072, People's Republic of China.
| | - Harold S Park
- Department of Mechanical Engineering, Boston University, Boston, Massachusetts 02215, USA
| | - Jin-Wu Jiang
- Shanghai Key Laboratory of Mechanics in Energy Engineering, Shanghai Institute of Applied Mathematics and Mechanics, Shanghai Frontier Science Center of Mechanoinformatics, School of Mechanics and Engineering Science, Shanghai University, Shanghai 200072, People's Republic of China.
- Zhejiang Laboratory, Hangzhou 311100, China
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Lee YB, Kang MH, Choi PK, Kim SH, Kim TS, Lee SY, Yoon JB. Sub-10 fJ/bit radiation-hard nanoelectromechanical non-volatile memory. Nat Commun 2023; 14:460. [PMID: 36709346 PMCID: PMC9884203 DOI: 10.1038/s41467-023-36076-0] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/22/2022] [Accepted: 01/12/2023] [Indexed: 01/30/2023] Open
Abstract
With the exponential growth of the semiconductor industry, radiation-hardness has become an indispensable property of memory devices. However, implementation of radiation-hardened semiconductor memory devices inevitably requires various radiation-hardening technologies from the layout level to the system level, and such technologies incur a significant energy overhead. Thus, there is a growing demand for emerging memory devices that are energy-efficient and intrinsically radiation-hard. Here, we report a nanoelectromechanical non-volatile memory (NEM-NVM) with an ultra-low energy consumption and radiation-hardness. To achieve an ultra-low operating energy of less than 10 [Formula: see text], we introduce an out-of-plane electrode configuration and electrothermal erase operation. These approaches enable the NEM-NVM to be programmed with an ultra-low energy of 2.83 [Formula: see text]. Furthermore, due to its mechanically operating mechanisms and radiation-robust structural material, the NEM-NVM retains its superb characteristics without radiation-induced degradation such as increased leakage current, threshold voltage shift, and unintended bit-flip even after 1 Mrad irradiation.
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Affiliation(s)
- Yong-Bok Lee
- grid.37172.300000 0001 2292 0500School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu Daejeon, 34141 Republic of Korea
| | - Min-Ho Kang
- grid.496766.c0000 0004 0546 0225National NanoFab Center (NNFC), 291 Daehak-ro, Yuseong-gu Daejeon, 34141 Republic of Korea
| | - Pan-Kyu Choi
- grid.37172.300000 0001 2292 0500School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu Daejeon, 34141 Republic of Korea ,Taiwan Semiconductor Manufacturing Company (TSMC) Ltd, Fab 21 Phoenix, AZ USA
| | - Su-Hyun Kim
- grid.37172.300000 0001 2292 0500School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu Daejeon, 34141 Republic of Korea ,grid.419666.a0000 0001 1945 5898SAMSUNG ELECTRONICS Co., Ltd, 1, Samsungjeonja-ro, Hwaseong-si, Gyeonggi-do 18448 Republic of Korea
| | - Tae-Soo Kim
- grid.37172.300000 0001 2292 0500School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu Daejeon, 34141 Republic of Korea
| | - So-Young Lee
- grid.37172.300000 0001 2292 0500School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu Daejeon, 34141 Republic of Korea
| | - Jun-Bo Yoon
- grid.37172.300000 0001 2292 0500School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu Daejeon, 34141 Republic of Korea
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Pogosov AG, Shevyrin AA, Pokhabov DA, Zhdanov EY, Kumar S. Suspended semiconductor nanostructures: physics and technology. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2022; 34:263001. [PMID: 35477698 DOI: 10.1088/1361-648x/ac6308] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/27/2021] [Accepted: 03/31/2022] [Indexed: 06/14/2023]
Abstract
The current state of research on quantum and ballistic electron transport in semiconductor nanostructures with a two-dimensional electron gas separated from the substrate and nanoelectromechanical systems is reviewed. These nanostructures fabricated using the surface nanomachining technique have certain unexpected features in comparison to their non-suspended counterparts, such as additional mechanical degrees of freedom, enhanced electron-electron interaction and weak heat sink. Moreover, their mechanical functionality can be used as an additional tool for studying the electron transport, complementary to the ordinary electrical measurements. The article includes a comprehensive review of spin-dependent electron transport and multichannel effects in suspended quantum point contacts, ballistic and adiabatic transport in suspended nanostructures, as well as investigations on nanoelectromechanical systems. We aim to provide an overview of the state-of-the-art in suspended semiconductor nanostructures and their applications in nanoelectronics, spintronics and emerging quantum technologies.
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Affiliation(s)
- A G Pogosov
- Rzhanov Institute of Semiconductor Physics SB RAS, 13 Lavrentiev Ave., Novosibirsk 630090, Russia
- Department of Physics, Novosibirsk State University, 2 Pirogov Str., Novosibirsk 630090, Russia
| | - A A Shevyrin
- Rzhanov Institute of Semiconductor Physics SB RAS, 13 Lavrentiev Ave., Novosibirsk 630090, Russia
| | - D A Pokhabov
- Rzhanov Institute of Semiconductor Physics SB RAS, 13 Lavrentiev Ave., Novosibirsk 630090, Russia
- Department of Physics, Novosibirsk State University, 2 Pirogov Str., Novosibirsk 630090, Russia
| | - E Yu Zhdanov
- Rzhanov Institute of Semiconductor Physics SB RAS, 13 Lavrentiev Ave., Novosibirsk 630090, Russia
- Department of Physics, Novosibirsk State University, 2 Pirogov Str., Novosibirsk 630090, Russia
| | - S Kumar
- Department of Electronic and Electrical Engineering, University College London, Torrington Place, London WC1E 7JE, United Kingdom
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Acoustic power management by swarms of microscopic robots. JOURNAL OF MICRO-BIO ROBOTICS 2022. [DOI: 10.1007/s12213-022-00148-z] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/26/2022]
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Static and Dynamic Analysis of Electrostatically Actuated MEMS Shallow Arches for Various Air-Gap Configurations. MICROMACHINES 2021; 12:mi12080930. [PMID: 34442552 PMCID: PMC8399550 DOI: 10.3390/mi12080930] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 06/11/2021] [Revised: 07/14/2021] [Accepted: 07/17/2021] [Indexed: 11/17/2022]
Abstract
In this research, we investigate the structural behavior, including the snap-through and pull-in instabilities, of in-plane microelectromechanical COSINE-shaped and electrically actuated clamped-clamped micro-beams resonators. The work examines various electrostatic actuation patterns including uniform and non-uniform parallel-plates airgap arrangements, which offer options to actuate the arches in the opposite and same direction of their curvature. The nonlinear equation of motion of a shallow arch is discretized into a reduced-order model based on the Galerkin's expansion method, which is then numerically solved. Static responses are examined for various DC electrostatic loads starting from small values to large values near pull-in and snap-through instability ranges, if any. The eigenvalue problem of the micro-beam is solved revealing the variations of the first four natural frequencies as varying the DC load. Various simulations are carried out for several case studies of shallow arches of various geometrical parameters and airgap arrangements, which demonstrate rich and diverse static and dynamic behaviors. Results show few cases with multi-states and hysteresis behaviors where some with only the pull-in instability and others with both snap-through buckling and pull-in instabilities. It is found that the micro-arches behaviors are very sensitive to the electrode's configuration. The studied configurations reveal different possibilities to control the pull-in and snap-through instabilities, which can be used for improving arches static stroke range as actuators and for realizing wide-range tunable micro-resonators.
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