1
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Zeng L, Olsson E. Unveiling Variations in Electronic and Atomic Structures Due to Nanoscale Wurtzite and Zinc Blende Phase Separation in GaAs Nanowires. NANO LETTERS 2024; 24:6644-6650. [PMID: 38767455 PMCID: PMC11157649 DOI: 10.1021/acs.nanolett.4c01262] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/14/2024] [Revised: 05/15/2024] [Accepted: 05/16/2024] [Indexed: 05/22/2024]
Abstract
Phase separation is an intriguing phenomenon often found in III-V nanostructures, but its effect on the atomic and electronic structures of III-V nanomaterials is still not fully understood. Here we study the variations in atomic arrangement and band structure due to the coexistence of wurtzite (WZ) and zinc blende (ZB) phases in single GaAs nanowires by using scanning transmission electron microscopy and monochromated electron energy loss spectroscopy. The WZ lattice distances are found to be larger (by ∼1%), along both the nanowire length direction and the perpendicular direction, than the ZB lattice. The band gap of the WZ phase is ∼20 meV smaller than that of the ZB phase. A shift of ∼70 meV in the conduction band edge between the two phases is also found. The direct and local measurements in single GaAs nanowires reveal important effects of phase separation on the properties of individual III-V nanostructures.
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Affiliation(s)
- Lunjie Zeng
- Department of Physics, Chalmers University of Technology, SE-41296 Gothenburg, Sweden
| | - Eva Olsson
- Department of Physics, Chalmers University of Technology, SE-41296 Gothenburg, Sweden
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2
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Stöger-Pollach M, Bukvišova K, Zenz K, Stöger L, Scales Z. Important aspects of investigating optical excitations in semiconductors using a scanning transmission electron microscope. J Microsc 2024; 293:138-145. [PMID: 37924264 DOI: 10.1111/jmi.13242] [Citation(s) in RCA: 1] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/05/2023] [Revised: 10/23/2023] [Accepted: 10/31/2023] [Indexed: 11/06/2023]
Abstract
Since semiconductor structures are becoming smaller and smaller, the examination methods must also take this development into account. Optical methods have long reached their limits here, but small dimensions are also a challenge for electron beam techniques, especially when it comes to determining optical properties. In this paper, electron microscopic methods of investigating optical properties are discussed. Special attention is given to the physical limits and how to deal with them. We will cover electron energy loss spectrometry as well as cathodoluminescence spectrometry. We pay special attention to inelastic delocalisation, radiation damage, the Čerenkov effect, interference effects of optical excitations and higher diffraction orders on a grating analyser for the cathodoluminescence signal.
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Affiliation(s)
- Michael Stöger-Pollach
- University Service Center for TEM, TU Wien, Vienna, Austria
- Institute for Solid State Physics, TU Wien, Vienna, Austria
| | | | - Keanu Zenz
- Institute for Solid State Physics, TU Wien, Vienna, Austria
| | - Leo Stöger
- Institute for Solid State Physics, TU Wien, Vienna, Austria
- Atominstitut der TU Wien, Vienna, Austria
| | - Ze Scales
- University Service Center for TEM, TU Wien, Vienna, Austria
- KAI Kompetenzzentrum Automobil- und Insdustrieelektronik GmbH, Villach, Austria
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3
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Mathai S, Veghte D, Kovarik L, Mazzoleni C, Tseng KP, Bucci S, Capek T, Cheng Z, Marinoni A, China S. Optical Properties of Individual Tar Balls in the Free Troposphere. ENVIRONMENTAL SCIENCE & TECHNOLOGY 2023; 57:16834-16842. [PMID: 37856673 DOI: 10.1021/acs.est.3c03498] [Citation(s) in RCA: 2] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 10/21/2023]
Abstract
Tar balls are brown carbonaceous particles that are highly viscous, spherical, amorphous, and light absorbing. They are believed to form in biomass burning smoke plumes during transport in the troposphere. Tar balls are also believed to have a significant impact on the Earth's radiative balance, but due to poorly characterized optical properties, this impact is highly uncertain. Here, we used two nighttime samples to investigate the chemical composition and optical properties of individual tar balls transported in the free troposphere to the Climate Observatory "Ottavio Vittori" on Mt. Cimone, Italy, using multimodal microspectroscopy. In our two samples, tar balls contributed 50% of carbonaceous particles by number. Of those tar balls, 16% were inhomogeneously mixed with other constituents. Using electron energy loss spectroscopy, we retrieved the complex refractive index (RI) for a wavelength range from 200 to 1200 nm for both inhomogeneously and homogeneously mixed tar balls. We found no significant difference in the average RI of inhomogeneously and homogeneously mixed tar balls (1.40-0.03i and 1.36-0.03i at 550 nm, respectively). Furthermore, we estimated the top of the atmosphere radiative forcing using the Santa Barbara DISORT Atmospheric Radiative Transfer model and found that a layer of only tar balls with an optical depth of 0.1 above vegetation would exert a positive radiative forcing ranging from 2.8 W m-2 (on a clear sky day) to 9.5 W m-2 (when clouds are below the aerosol layer). Understanding the optical properties of tar balls can help reduce uncertainties associated with the contribution of biomass-burning aerosol in current climate models.
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Affiliation(s)
- Susan Mathai
- Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory, Richland, Washington 99354, United States
- Physics Department and Atmospheric Sciences Program, Michigan Technological University, Houghton, Michigan 49931, United States
| | - Daniel Veghte
- Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory, Richland, Washington 99354, United States
- Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, Ohio 43212, United States
| | - Libor Kovarik
- Physical and Computational Sciences Directorate, Pacific Northwest National Laboratory, Richland, Washington 99354, United States
| | - Claudio Mazzoleni
- Physics Department and Atmospheric Sciences Program, Michigan Technological University, Houghton, Michigan 49931, United States
| | - Kuo-Pin Tseng
- Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory, Richland, Washington 99354, United States
| | - Silvia Bucci
- Institute of Atmospheric Sciences and Climate (ISAC)-National Research Council of Itlay, 40129 Bologna, Italy
- Department of Meteorology and Geophysics, University of Vienna, UZA II, Althanstraße 14, 1090 Vienna, Austria
| | - Tyler Capek
- Physics Department and Atmospheric Sciences Program, Michigan Technological University, Houghton, Michigan 49931, United States
| | - Zezhen Cheng
- Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory, Richland, Washington 99354, United States
| | - Angela Marinoni
- Institute of Atmospheric Sciences and Climate (ISAC)-National Research Council of Itlay, 40129 Bologna, Italy
| | - Swarup China
- Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory, Richland, Washington 99354, United States
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4
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Stöger-Pollach M, Zenz K, Ursin F, Schilberg J, Stöger L. A correction for higher-order refraction in cathodoluminescence spectrometry. Ultramicroscopy 2023; 251:113770. [PMID: 37267709 DOI: 10.1016/j.ultramic.2023.113770] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/07/2022] [Revised: 05/12/2023] [Accepted: 05/26/2023] [Indexed: 06/04/2023]
Abstract
Cathodoluminescence (CL) is a developing analytical method in electron microscopy, because of its excellent energy resolution. Usually a Czerny-Turner type spectrometer is employed, having a blazed grating as analyzer. Unlike a prism analyzer, where the dispersion depends on the refractive index of the prism itself leading to a non-linear spectral distribution, the grating has the advantage that the spectral distribution depends linearly on the wavelength. As a draw-back, higher-order refraction alters the measured optical spectrum at larger wavelengths. In general, blazed gratings are used in order to minimize this effect in a certain spectral range. Nevertheless, the higher-order intensities can be still significant. In the present study we present a method for correcting the acquired optical spectra with respect to higher order diffraction intensities and apply it to CaO and GaN CL-spectra.
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Affiliation(s)
- Michael Stöger-Pollach
- University Service Center for Transmission Electron Microscopy (USTEM), Technische Universität Wien, Wiedner Hauptstraße 8-10, 1040 Wien, Austria; Institute of Solid State Physics, Technische Universität Wien, Wiedner Hauptstraße 8-10, 1040 Wien, Austria.
| | - Keanu Zenz
- Institute of Solid State Physics, Technische Universität Wien, Wiedner Hauptstraße 8-10, 1040 Wien, Austria
| | - Felix Ursin
- Institute of Solid State Physics, Technische Universität Wien, Wiedner Hauptstraße 8-10, 1040 Wien, Austria
| | - Johannes Schilberg
- Institute of Solid State Physics, Technische Universität Wien, Wiedner Hauptstraße 8-10, 1040 Wien, Austria
| | - Leo Stöger
- Institute of Solid State Physics, Technische Universität Wien, Wiedner Hauptstraße 8-10, 1040 Wien, Austria
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5
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Gordeeva A, Thersleff T, Hsu YJ, Liebske C, Ulmer P, Andersson O, Häussermann U. Electronic structure characterization of TiO2-II with the α-PbO2 structure by electron-energy-loss-spectroscopy and comparison with anatase, brookite, and rutile. J SOLID STATE CHEM 2023. [DOI: 10.1016/j.jssc.2023.123952] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 03/06/2023]
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6
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Discrimination of coherent and incoherent cathodoluminescence using temporal photon correlations. Ultramicroscopy 2022; 241:113594. [DOI: 10.1016/j.ultramic.2022.113594] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/11/2021] [Revised: 07/12/2022] [Accepted: 07/21/2022] [Indexed: 11/17/2022]
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7
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Liou SC, Oleshko VP, Kuo WCH, Yang TJ, Shu GJ. Investigation of the excitations of plasmons and surface exciton polaritons in monoclinic gadolinium sesquioxide by electron energy-loss spectroscopy and plasmon spectroscopic imaging. RSC Adv 2022; 12:10345-10354. [PMID: 35425011 PMCID: PMC8977844 DOI: 10.1039/d2ra00737a] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/03/2022] [Accepted: 03/16/2022] [Indexed: 11/21/2022] Open
Abstract
The monoclinic gadolinium sesquioxide (denoted as m-Gd2O3) with its lower crystal symmetry exhibits larger dielectric permittivity (κ) than the cubic Gd2O3 (denoted as c-Gd2O3). Recently, a few nanometers thick m-Gd2O3 thin film has been successfully epitaxially grown on a GaN substrate as a promising candidate gate oxide in metal-oxide-semiconductor field-effect transistors (MOSFETs). Thus, it is important to understand the electronic excitations in m-Gd2O3 and investigate them by electron energy loss spectroscopy (EELS) performed with aloof electron beams and electron diffraction to gain the spatial and momentum resolutions. In this study, using scanning transmission electron microscopy combined with EELS (STEM-EELS) in the aloof electron beam setup, we observed low-loss spectral features at 13 eV and 14.5 eV at the specimen edge in a grazing incidence and the material interior, which can be interpreted as a surface plasmon (SP) and a volume plasmon (VP), respectively. Surface exciton polaritons (SEPs), which represents surface resonances associated with excitonic onsets above the bandgap, were also observed at about 7, 10.2, and 36 eV energy loss. Their surface excitation character was confirmed by energy-filtered transmission electron microscopy spectrum imaging (EFTEM-SI) and using relativistic energy versus-momentum (E–k) map calculations. The momentum (q)-dependent EELS indicates that the SEP features near the bandgap represented a function of q and revealed a nondispersive behavior for VP and SEP at 36 eV. The oscillator strengths for VP and SEP at 36 eV dropped at different q values along with different q directions, revealing the anisotropic electronic structures of m-Gd2O3. The electronic excitations in m-Gd2O3 were systematically studied by low-loss EELS in scanning transmission electron microscopy (STEM) mode and electron diffraction mode to gain both the spatial and momentum (q) resolutions.![]()
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Affiliation(s)
- Sz-Chian Liou
- Advanced Imaging & Microscopy Laboratory, Maryland NanoCenter, Institute for Research in Electronics and Applied Physics, University of Maryland College Park MD 20742 USA
| | - Vladimir P Oleshko
- Material Measurement Laboratory, National Institute of Standards and Technology Gaithersburg MD 20899 USA
| | - W Chun-Hsin Kuo
- Materials Characterization Facility, Texas A&M University College Station TX 77845 USA
| | - Tan-Ju Yang
- Department of Materials and Mineral Resources Engineering, National Taipei University of Technology Taipei 10608 Taiwan
| | - Guo-Jiun Shu
- Department of Materials and Mineral Resources Engineering, National Taipei University of Technology Taipei 10608 Taiwan .,Institute of Mineral Resources Engineering, National Taipei University of Technology Taipei 10608 Taiwan.,Taiwan Consortium of Emergent Crystalline Materials, Ministry of Science and Technology Taipei 10622 Taiwan
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8
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Brokkelkamp A, Ter Hoeve J, Postmes I, van Heijst SE, Maduro L, Davydov AV, Krylyuk S, Rojo J, Conesa-Boj S. Spatially Resolved Band Gap and Dielectric Function in Two-Dimensional Materials from Electron Energy Loss Spectroscopy. J Phys Chem A 2022; 126:1255-1262. [PMID: 35167301 PMCID: PMC8883475 DOI: 10.1021/acs.jpca.1c09566] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/30/2022]
Abstract
The electronic properties of two-dimensional (2D) materials depend sensitively on the underlying atomic arrangement down to the monolayer level. Here we present a novel strategy for the determination of the band gap and complex dielectric function in 2D materials achieving a spatial resolution down to a few nanometers. This approach is based on machine learning techniques developed in particle physics and makes possible the automated processing and interpretation of spectral images from electron energy loss spectroscopy (EELS). Individual spectra are classified as a function of the thickness with K-means clustering, and then used to train a deep-learning model of the zero-loss peak background. As a proof of concept we assess the band gap and dielectric function of InSe flakes and polytypic WS2 nanoflowers and correlate these electrical properties with the local thickness. Our flexible approach is generalizable to other nanostructured materials and to higher-dimensional spectroscopies and is made available as a new release of the open-source EELSfitter framework.
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Affiliation(s)
- Abel Brokkelkamp
- Kavli Institute of Nanoscience, Delft University of Technology, 2628CJ Delft, The Netherlands
| | - Jaco Ter Hoeve
- Nikhef Theory Group, Science Park 105, 1098 XG Amsterdam, The Netherlands.,Physics and Astronomy, Vrije Universiteit Amsterdam, 1081 HV Amsterdam, The Netherlands
| | - Isabel Postmes
- Kavli Institute of Nanoscience, Delft University of Technology, 2628CJ Delft, The Netherlands
| | - Sabrya E van Heijst
- Kavli Institute of Nanoscience, Delft University of Technology, 2628CJ Delft, The Netherlands
| | - Louis Maduro
- Kavli Institute of Nanoscience, Delft University of Technology, 2628CJ Delft, The Netherlands
| | - Albert V Davydov
- Materials Science and Engineering Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
| | - Sergiy Krylyuk
- Materials Science and Engineering Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
| | - Juan Rojo
- Nikhef Theory Group, Science Park 105, 1098 XG Amsterdam, The Netherlands.,Physics and Astronomy, Vrije Universiteit Amsterdam, 1081 HV Amsterdam, The Netherlands
| | - Sonia Conesa-Boj
- Kavli Institute of Nanoscience, Delft University of Technology, 2628CJ Delft, The Netherlands
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9
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Sreedhara MB, Bukvišová K, Khadiev A, Citterberg D, Cohen H, Balema V, K. Pathak A, Novikov D, Leitus G, Kaplan-Ashiri I, Kolíbal M, Enyashin AN, Houben L, Tenne R. Nanotubes from the Misfit Layered Compound (SmS) 1.19TaS 2: Atomic Structure, Charge Transfer, and Electrical Properties. CHEMISTRY OF MATERIALS : A PUBLICATION OF THE AMERICAN CHEMICAL SOCIETY 2022; 34:1838-1853. [PMID: 35237027 PMCID: PMC8874355 DOI: 10.1021/acs.chemmater.1c04106] [Citation(s) in RCA: 2] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 11/29/2021] [Revised: 01/16/2022] [Indexed: 05/08/2023]
Abstract
Misfit layered compounds (MLCs) MX-TX2, where M, T = metal atoms and X = S, Se, or Te, and their nanotubes are of significant interest due to their rich chemistry and unique quasi-1D structure. In particular, LnX-TX2 (Ln = rare-earth atom) constitute a relatively large family of MLCs, from which nanotubes have been synthesized. The properties of MLCs can be tuned by the chemical and structural interplay between LnX and TX2 sublayers and alloying of each of the Ln, T, and X elements. In order to engineer them to gain desirable performance, a detailed understanding of their complex structure is indispensable. MLC nanotubes are a relative newcomer and offer new opportunities. In particular, like WS2 nanotubes before, the confinement of the free carriers in these quasi-1D nanostructures and their chiral nature offer intriguing physical behavior. High-resolution transmission electron microscopy in conjunction with a focused ion beam are engaged to study SmS-TaS2 nanotubes and their cross-sections at the atomic scale. The atomic resolution images distinctly reveal that Ta is in trigonal prismatic coordination with S atoms in a hexagonal structure. Furthermore, the position of the sulfur atoms in both the SmS and the TaS2 sublattices is revealed. X-ray photoelectron spectroscopy, electron energy loss spectroscopy, and X-ray absorption spectroscopy are carried out. These analyses conclude that charge transfer from the Sm to the Ta atoms leads to filling of the Ta 5d z 2 level, which is confirmed by density functional theory (DFT) calculations. Transport measurements show that the nanotubes are semimetallic with resistivities in the range of 10-4 Ω·cm at room temperature, and magnetic susceptibility measurements show a superconducting transition at 4 K.
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Affiliation(s)
- M. B. Sreedhara
- Department
of Molecular Chemistry and Materials Science, Weizmann Institute of Science, Rehovot 7610001, Israel
| | - Kristýna Bukvišová
- CEITEC
− Central European Institute of Technology, Brno University of Technology, Purkyňova 123, 612 00 Brno, Czech Republic
| | - Azat Khadiev
- Deutsches
Elektronen-Synchrotron DESY, Notkestr. 85, 22607 Hamburg, Germany
| | - Daniel Citterberg
- CEITEC
− Central European Institute of Technology, Brno University of Technology, Purkyňova 123, 612 00 Brno, Czech Republic
| | - Hagai Cohen
- Department
of Chemical Research Support, Weizmann Institute, Rehovot 7610001, Israel
| | - Viktor Balema
- Ames
Laboratory, U.S. Department of Energy, Ames, Iowa 50011-3020, United States
- ProChem,
Inc., 826 Roosevelt Road, Rockford, Illinois 61109, United States
| | - Arjun K. Pathak
- Department
of Physics, SUNY Buffalo State, Buffalo, New York 14222, United States
| | - Dmitri Novikov
- Deutsches
Elektronen-Synchrotron DESY, Notkestr. 85, 22607 Hamburg, Germany
| | - Gregory Leitus
- Department
of Chemical Research Support, Weizmann Institute, Rehovot 7610001, Israel
| | - Ifat Kaplan-Ashiri
- Department
of Chemical Research Support, Weizmann Institute, Rehovot 7610001, Israel
| | - Miroslav Kolíbal
- CEITEC
− Central European Institute of Technology, Brno University of Technology, Purkyňova 123, 612 00 Brno, Czech Republic
- Institute
of Physical Engineering, Brno University
of Technology, Technická 2, 616 69 Brno, Czech Republic
| | - Andrey N. Enyashin
- Institute
of Solid State Chemistry UB RAS, 620990 Ekaterinburg, Russian Federation
- Institute
of Natural Sciences and Mathematics, Ural
Federal University, 620083 Ekaterinburg, Russian Federation
| | - Lothar Houben
- Department
of Chemical Research Support, Weizmann Institute, Rehovot 7610001, Israel
| | - Reshef Tenne
- Department
of Molecular Chemistry and Materials Science, Weizmann Institute of Science, Rehovot 7610001, Israel
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10
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Zamani RR, Hage FS, Eljarrat A, Namazi L, Ramasse QM, Dick KA. Unraveling electronic band structure of narrow-bandgap p-n nanojunctions in heterostructured nanowires. Phys Chem Chem Phys 2021; 23:25019-25023. [PMID: 34730587 DOI: 10.1039/d1cp03275e] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
Abstract
The electronic band structure of complex nanostructured semiconductors has a considerable effect on the final electronic and optical properties of the material and, ultimately, on the functionality of the devices incorporating them. Valence electron energy-loss spectroscopy (VEELS) in the transmission electron microscope (TEM) provides the possibility of measuring this property of semiconductors with high spatial resolution. However, it still represents a challenge for narrow-bandgap semiconductors, since an electron beam with low energy spread is required. Here we demonstrate that by means of monochromated VEELS we can study the electronic band structure of narrow-gap materials GaSb and InAs in the form of heterostructured nanowires, with bandgap values down to 0.5 eV, especially important for newly developed structures with unknown bandgaps. Using complex heterostructured InAs-GaSb nanowires, we determine a bandgap value of 0.54 eV for wurtzite InAs. Moreover, we directly compare the bandgaps of wurtzite and zinc blende polytypes of GaSb in a single nanostructure, measured here as 0.84 and 0.75 eV, respectively. This allows us to solve an existing controversy in the band alignment between these structures arising from theoretical predictions. The findings demonstrate the potential of monochromated VEELS to provide a better understanding of the band alignment at the heterointerfaces of narrow-bandgap complex nanostructured materials with high spatial resolution. This is especially important for semiconductor device applications where even the slightest variations of the electronic band structure at the nanoscale can play a crucial role in their functionality.
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Affiliation(s)
- Reza R Zamani
- Solid State Physics, Lund University, Box 118, Lund 22100, Sweden. .,Department of Physics, Chalmers University of Technology, Gothenburg 41296, Sweden
| | - Fredrik S Hage
- SuperSTEM Laboratory, SciTech Daresbury Campus, Daresbury WA4 4AD, UK.,Department of Materials, University of Oxford, Oxford OX1 3PH, UK.,Department of Physics/Centre for Materials Science and Nanotechnology, University of Oslo, Oslo 0318, Norway
| | - Alberto Eljarrat
- Institute of Physics, Humboldt University of Berlin, Berlin 12489, Germany
| | - Luna Namazi
- Solid State Physics, Lund University, Box 118, Lund 22100, Sweden.
| | - Quentin M Ramasse
- SuperSTEM Laboratory, SciTech Daresbury Campus, Daresbury WA4 4AD, UK.,School of Chemical and Process Engineering and School of Physics and Astronomy, University of Leeds, Leeds LS2 9JT, UK
| | - Kimberly A Dick
- Solid State Physics, Lund University, Box 118, Lund 22100, Sweden. .,Centre for Analysis and Synthesis, Lund University, Box 124, Lund 22100, Sweden
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11
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Yang LH, Gong JM, Sulyok A, Menyhárd M, Sáfrán G, Tőkési K, Da B, Ding ZJ. Optical properties of amorphous carbon determined by reflection electron energy loss spectroscopy spectra. Phys Chem Chem Phys 2021; 23:25335-25346. [PMID: 34749388 DOI: 10.1039/d1cp02447g] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
Abstract
We present the combined experimental and theoretical investigations of the optical properties of amorphous carbon. The reflection electron energy loss spectra (REELS) spectra of carbon were measured using a cylindrical mirror analyzer under ultrahigh vacuum conditions at primary electron energies of 750, 1000 and 1300 eV. The energy loss function and thereby the refractive index n and the extinction coefficient k were determined from these REELS spectra in a wide loss energy range of 2-200 eV by applying our reverse Monte Carlo method. The high accuracy of the obtained optical constants is justified with the ps- and f-sum rules. We found that our present optical constants of amorphous carbon fulfill the sum rules with the highest accuracy compared with the previously published data. Therefore, we highly recommend to replace the previous data with the present ones for practical applications. Moreover, we present the atomic scattering factors of amorphous carbon obtained from the dielectric function to predict its optical constants at a given density.
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Affiliation(s)
- L H Yang
- Hefei National Laboratory for Physical Sciences at Microscale and Department of Physics, University of Science and Technology of China, Hefei, Anhui 230026, P. R. China. .,Research and Services Division of Materials Data and Integrated System, National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan
| | - J M Gong
- Hefei National Laboratory for Physical Sciences at Microscale and Department of Physics, University of Science and Technology of China, Hefei, Anhui 230026, P. R. China. .,Research and Services Division of Materials Data and Integrated System, National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan
| | - A Sulyok
- Institute for Technical Physics and Materials Science, Centre for Energy Research, Budapest, Hungary.
| | - M Menyhárd
- Institute for Technical Physics and Materials Science, Centre for Energy Research, Budapest, Hungary.
| | - G Sáfrán
- Institute for Technical Physics and Materials Science, Centre for Energy Research, Budapest, Hungary.
| | - K Tőkési
- Institute for Nuclear Research (ATOMKI), Debrecen, Hungary.
| | - B Da
- Research and Services Division of Materials Data and Integrated System, National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan.,Research Center for Advanced Measurement and Characterization, National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047, Japan
| | - Z J Ding
- Hefei National Laboratory for Physical Sciences at Microscale and Department of Physics, University of Science and Technology of China, Hefei, Anhui 230026, P. R. China.
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12
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Sharona H, Bhat U. Nature of optical excitations and bandgap of Re xMo 1-xS 2alloy at nanoscale probed from high resolution low loss electron energy loss spectroscopy. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2021; 33:455901. [PMID: 34380118 DOI: 10.1088/1361-648x/ac1caf] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/11/2021] [Accepted: 08/11/2021] [Indexed: 06/13/2023]
Abstract
The two-dimensional (2D) transitional metal dichalcogenides (TMDS) have become an intensive research topic recently. The alloys of these TMDs have offered continuous tunability of the bandstructure and carrier concentration, providing a new opportunity for various device applications. Here the rich variations in optical excitations in RexMo1-xS2alloy at the nanoscale region are shown. The alloy bandgap and charge response are probed by low-loss high-resolution transmission electron energy loss spectroscopy (HR-EELS). Concurrent density functional theory calculations revealed many electronic structures from n-type semiconductors to metallic and p-type semiconducting nature with band bowing effect. The alloying-induced Peierls distortion leads to a change in crystal symmetry and decreased interlayer coupling. These alloys undergo indirect to direct bandgap transition with the function of Re concentration. These unique correlated structural and electronic properties of these 2D alloys can be potentially applicable for various electronic and optoelectronic devices.
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Affiliation(s)
- H Sharona
- International Centre for Materials Science, Jawaharlal Nehru Centre for Advanced Scientific Research, Bangalore 560064, India
| | - U Bhat
- International Centre for Materials Science, Jawaharlal Nehru Centre for Advanced Scientific Research, Bangalore 560064, India
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13
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Herrera-Pérez G, Ornelas-Gutiérrez C, Reyes-Montero A, Paraguay-Delgado F, Reyes-Rojas A, Fuentes-Cobas L. Complex dielectric function and opto-electronic characterization using VEELS for the lead-free BCZT electro-ceramic perovskite. Micron 2021; 149:103124. [PMID: 34314943 DOI: 10.1016/j.micron.2021.103124] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/30/2021] [Revised: 07/15/2021] [Accepted: 07/19/2021] [Indexed: 11/26/2022]
Abstract
The current work presents the complex dielectric function and the opto-electronic properties of lead-free Ba0.8Ca0.2Ti0.9Zr0.1O3 (BCZT) electro-ceramic, derived from valence electron energy loss spectroscopy, in transmission electron microscopy (VEELS-TEM). A single tetragonal perovskite phase, with P4mm space group, was determined by Rietveld refinement of the x-ray diffraction pattern. The VEELS-TEM experiment scanned the energy interval from 0-50 eV. The spectroscopic analysis started with the chemical identification of the atoms that conforms the BCZT solid-solution. Bulk and surface plasmons were located at 27.2 eV and 12.9 eV, respectively in the energy loss function. Complex dielectric function was obtained using Kramers-Kronig analysis from the Gatan Microscopy Suite software. Dielectric constant was calculated from the real part of the complex dielectric function, while the inter-band transitions were identified in the joint density of states function. The refraction index n and the extinction coefficient k, as a function of energy, were obtained from the complex dielectric function. The bandgap energy was determined using a polynomial fit in the optical absorption coefficient plot with an Eg = 3.2 eV.
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Affiliation(s)
- G Herrera-Pérez
- Catedra-CONACyT Assigned to Centro de Investigaciones en Materiales Avanzados, S. C. (CIMAV), Miguel de Cervantes 120, 31136, Chihuahua, Chih., Mexico.
| | - C Ornelas-Gutiérrez
- Laboratorio Nacional de Nanotecnología (Nanotech), Centro de Investigaciones en Materiales Avanzados S. C. (CIMAV), Miguel de Cervantes 120, 31136, Chihuahua, Chih., Mexico
| | - A Reyes-Montero
- Instituto de Investigaciones en Materiales, Universidad Nacional Autónoma de México, Ciudad Universitaria, 04510, CDMX, Mexico
| | - F Paraguay-Delgado
- Physics of Materials Department. Centro de Investigaciones en Materiales Avanzados, S. C. (CIMAV) Miguel de Cervantes 120, 31136, Chihuahua, Chih., Mexico
| | - A Reyes-Rojas
- Physics of Materials Department. Centro de Investigaciones en Materiales Avanzados, S. C. (CIMAV) Miguel de Cervantes 120, 31136, Chihuahua, Chih., Mexico
| | - L Fuentes-Cobas
- Physics of Materials Department. Centro de Investigaciones en Materiales Avanzados, S. C. (CIMAV) Miguel de Cervantes 120, 31136, Chihuahua, Chih., Mexico
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14
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Stöger-Pollach M, Pichler CF, Dan T, Zickler GA, Bukvišová K, Eibl O, Brandstätter F. Coherent light emission in cathodoluminescence when using GaAs in a scanning (transmission) electron microscope. Ultramicroscopy 2021; 224:113260. [PMID: 33774193 DOI: 10.1016/j.ultramic.2021.113260] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/05/2020] [Revised: 12/18/2020] [Accepted: 03/09/2021] [Indexed: 11/28/2022]
Abstract
For most materials science oriented applications incoherent cathodoluminescence (CL) is of main interest, for which the recombination of electron-hole pairs yields the emission of light. However, the incoherent signal is superimposed by coherently excited photons, similar to the situation for X-rays in Energy-Dispersive X-ray spectra (EDX). In EDX two very different processes superimpose in each spectrum: Bremsstrahlung and characteristic X-ray radiation. Both processes yield X-rays, however, their origin is substantially different. Therefore, in the present CL study we focus on the coherent emission of light, in particular Čerenkov radiation. We use a 200μm thick GaAs sample, not electron transparent and therefore not acting as a light guide, and investigate the radiation emitted from the top surface of the sample generated by back-scattered electrons on their way out of the specimen. The CL spectra revealed a pronounced peak corresponding to the expected interband transition. This peak was at 892 nm at room temperature and shifted to 845 nm at 80 K. The coherent light emission significantly modifies the shape of CL spectra at elevated beam energies. For the first time, by the systematic variation of current and energy of primary electrons we could distinguish the coherent and incoherent light superimposed in CL spectra. These findings are essential for the correct interpretation of CL spectra in STEM. The Čerenkov intensity as well as the total intensity in a spectrum scales linearly with the beam current. Additionally, we investigate the influence of asymmetric mirrors on the spectral shapes, collecting roughly only half of the whole solid angle. Different emission behaviour of different physical causes thus lead to changes in the overall spectral shape.
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Affiliation(s)
- Michael Stöger-Pollach
- University Service Centre for Transmission Electron Microscopy (USTEM), Technische Universität Wien, Wiedner Hauptstraße 8-10, 1040 Wien, Austria; Institute for Solid State Physics, Technische Universität Wien, Wiedner Hauptstraße 8-10, 1040 Wien, Austria.
| | - Cornelia F Pichler
- Institute for Solid State Physics, Technische Universität Wien, Wiedner Hauptstraße 8-10, 1040 Wien, Austria
| | - Topa Dan
- Naturhistorisches Museum Wien, Burgring 7, 1010 Wien, Austria
| | - Gregor A Zickler
- Department for Chemistry and Physics of Materials, Paris Lodron Universität Salzburg, Jakob-Haringer Str. 2A, 5020 Salzburg, Austria
| | - Kristýna Bukvišová
- Central European Institute of Technology (CEITEC), Brno University of Technology, Purkyňova 123, Brno 612 00, Czech Republic
| | - Oliver Eibl
- University Service Centre for Transmission Electron Microscopy (USTEM), Technische Universität Wien, Wiedner Hauptstraße 8-10, 1040 Wien, Austria; Institute for Solid State Physics, Technische Universität Wien, Wiedner Hauptstraße 8-10, 1040 Wien, Austria
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15
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Lyu F, Sun Y, Yang Q, Tang B, Li M, Li Z, Sun M, Gao P, Ye LH, Chen Q. Thickness-dependent band gap of α-In 2Se 3: from electron energy loss spectroscopy to density functional theory calculations. NANOTECHNOLOGY 2020; 31:315711. [PMID: 32294630 DOI: 10.1088/1361-6528/ab8998] [Citation(s) in RCA: 6] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
Abstract
α-In2Se3 has attracted increasing attention in recent years due to its excellent electrical and optical properties. Especially, attention has been paid to its peculiar ferroelectric and piezoelectric properties which most other two-dimensional (2D) materials do not possess. This paper presents the first measurement of the thickness-dependent band gaps of few-layer α-In2Se3 by electron energy loss spectroscopy (EELS). The band gap increases with decreasing film thickness which varies from 1.44 eV in a 48 nm thick area to 1.64 eV in an 8 nm thick area of the samples. Further, by combining the improved exchange-correlation potential and proper screening of the internal electric field in an advanced 2D electronic structure technique, we have been able to obtain the structural dependence of the band gap within density functional theory up to hundreds of atoms. This is also the first calculation of a similar type for 2D ferroelectric materials. Both experiment and theory suggest that the variation of the band gap of α-In2Se3 fits well with the quantum confinement model for 2D materials.
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Affiliation(s)
- Fengjiao Lyu
- Key Laboratory for the Physics and Chemistry of Nanodevices, Department of Electronics, Peking University, Beijing 100871, People's Republic of China
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16
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Stöger-Pollach M, Löffler S, Maurer N, Bukvišová K. Using Cˇerenkov radiation for measuring the refractive index in thick samples by interferometric cathodoluminescence. Ultramicroscopy 2020; 214:113011. [DOI: 10.1016/j.ultramic.2020.113011] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/10/2020] [Revised: 04/24/2020] [Accepted: 04/25/2020] [Indexed: 10/24/2022]
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17
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Affiliation(s)
- Dongdong Xiao
- Beijing National Laboratory for Condensed Matter PhysicsInstitute of PhysicsChinese Academy of Sciences Beijing 100190 China
| | - Lin Gu
- Beijing National Laboratory for Condensed Matter PhysicsInstitute of PhysicsChinese Academy of Sciences Beijing 100190 China
- School of physical sciencesUniversity of Chinese Academy of Sciences Beijing 100049 China
- Songshan Lake Materials Laboratory Dongguan Guangdong 523808 China
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18
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Horák M, Šikola T. Influence of experimental conditions on localized surface plasmon resonances measurement by electron energy loss spectroscopy. Ultramicroscopy 2020; 216:113044. [PMID: 32535410 DOI: 10.1016/j.ultramic.2020.113044] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/10/2020] [Revised: 05/25/2020] [Accepted: 05/27/2020] [Indexed: 10/24/2022]
Abstract
Scanning transmission electron microscopy (STEM) combined with electron energy loss spectroscopy (EELS) has become a standard technique to map localized surface plasmon resonances with a nanometer spatial and a sufficient energy resolution over the last 15 years. However, no experimental work discussing the influence of experimental conditions during the measurement has been published up to now. We present an experimental study of the influence of the primary beam energy and the collection semi-angle on the plasmon resonances measurement by STEM-EELS. To explore the influence of these two experimental parameters we study a series of gold rods and gold bow-tie and diabolo antennas. We discuss the impact on experimental characteristics which are important for successful detection of the plasmon peak in EELS, namely: the intensity of plasmonic signal, the signal to background ratio, and the signal to zero-loss peak ratio. We found that the primary beam energy should be high enough to suppress the scattering in the sample and at the same time should be low enough to avoid the appearance of relativistic effects. Consequently, the best results are obtained using a medium primary beam energy, in our case 120 keV, and an arbitrary collection semi-angle, as it is not a critical parameter at this primary beam energy. Our instructive overview will help microscopists in the field of plasmonics to arrange their experiments.
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Affiliation(s)
- Michal Horák
- CEITEC - Central European Institute of Technology, Brno University of Technology, Purkyňova 123, Brno 612 00, Czech Republic.
| | - Tomáš Šikola
- CEITEC - Central European Institute of Technology, Brno University of Technology, Purkyňova 123, Brno 612 00, Czech Republic; Institute of Physical Engineering, Brno University of Technology, Technická 2, Brno 616 69, Czech Republic
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19
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Lyon K, Mowbray DJ, Miskovic ZL. Conductivity models for electron energy loss spectroscopy of graphene in a scanning transmission electron microscope with high energy resolution. Ultramicroscopy 2020; 214:113012. [PMID: 32413682 DOI: 10.1016/j.ultramic.2020.113012] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/19/2020] [Revised: 04/20/2020] [Accepted: 04/28/2020] [Indexed: 11/26/2022]
Abstract
Recent advancements in the energy resolution and probing capabilities of monochromated electron-beam spectroscopy instruments have made this experimental technique increasingly useful for investigating and understanding the plasmonic, photonic, and electronic properties of graphene-enhanced systems. We develop herein an empirical model for the in-plane conductivity of doped monolayer graphene, comparing with ab initio data from the terahertz (THz) to the upper range of frequencies accessible with the valence electron energy loss spectroscopy (VEELS). Along with our ab initio data, this model is employed to calculate the energy loss spectra using a relativistic formulation, allowing us to analyze the effects that different electron beam parameters have on the response of graphene in a monochromated scanning transmission electron microscope setup. In particular, we explore the effects of reducing the collection angle of scattered electrons, thereby deducing a computational procedure for extracting the real and imaginary parts of the optical conductivity of graphene layers from VEELS measurements. Our modeling ultimately provides insight into how the optoelectronic properties of graphene are expected to manifest in the VEELS obtained via monochromated beams, with the effects of graphene doping, the excitation of its plasmon-polaritons, and relativistic contributions included comprehensively.
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Affiliation(s)
- Keenan Lyon
- Department of Applied Mathematics, University of Waterloo, Waterloo, Ontario, Canada
| | - Duncan J Mowbray
- Department of Applied Mathematics, University of Waterloo, Waterloo, Ontario, Canada; School of Physical Sciences and Nanotechnology, Yachay Tech University, Urcuquí, Ecuador
| | - Zoran L Miskovic
- Department of Applied Mathematics, University of Waterloo, Waterloo, Ontario, Canada; Waterloo Institute for Nanotechnology, University of Waterloo, Waterloo, Ontario, Canada.
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20
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Li Z, Xiao RJ, Xu P, Zhu C, Sun S, Zheng D, Wang H, Zhang M, Tian H, Yang HX, Li JQ. Lattice Dynamics and Contraction of Energy Bandgap in Photoexcited Semiconducting Boron Nitride Nanotubes. ACS NANO 2019; 13:11623-11631. [PMID: 31532630 DOI: 10.1021/acsnano.9b05466] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/10/2023]
Abstract
Structural dynamics and changes in electronic structures driven by photoexcited carriers are critical issues in both semiconducting and optoelectronic nanodevices. Herein, a phase diagram for the transient states and relevant dynamic processes in multiwalled boron nitride nanotubes (BNNTs) has been extensively studied for a full reversible cycle after a fs-laser excitation in ultrafast TEMs, and the significant structural features and evolution of electronic natures have been investigated using pulsed electron diffraction and femtosecond-resolved electron energy-loss spectroscopy (EELS). It is revealed that nonthermal anisotropic alterations of the lattice apparently precede the phonon-driven thermal transients along the radial and axial directions. Ab initio calculations support these findings and show that electrons excited from the π to π* orbitals in the BN nanotubes weaken the intralayer bonds while strengthening the interlayer bonds along the radial direction. Importantly, time-resolved EELS measurements show contraction of the energy bandgap after fs-laser excitation associated with nonthermal structural transients. This fact verifies that laser-induced bandgap renormalization in semiconductors can essentially be correlated with both the rapid processes of excited carriers and nonthermal lattice evolution.
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Affiliation(s)
- Zhongwen Li
- Beijing National Laboratory for Condensed Matter Physics , Institute of Physics, Chinese Academy of Sciences , Beijing 100190 China
| | - Rui-Juan Xiao
- Beijing National Laboratory for Condensed Matter Physics , Institute of Physics, Chinese Academy of Sciences , Beijing 100190 China
| | - Peng Xu
- Beijing National Laboratory for Condensed Matter Physics , Institute of Physics, Chinese Academy of Sciences , Beijing 100190 China
| | - Chunhui Zhu
- Beijing National Laboratory for Condensed Matter Physics , Institute of Physics, Chinese Academy of Sciences , Beijing 100190 China
| | - Shuaishuai Sun
- Beijing National Laboratory for Condensed Matter Physics , Institute of Physics, Chinese Academy of Sciences , Beijing 100190 China
| | - Dingguo Zheng
- Beijing National Laboratory for Condensed Matter Physics , Institute of Physics, Chinese Academy of Sciences , Beijing 100190 China
- School of Physical Sciences , University of Chinese Academy of Sciences , Beijing 100049 , China
| | - Hong Wang
- Beijing National Laboratory for Condensed Matter Physics , Institute of Physics, Chinese Academy of Sciences , Beijing 100190 China
- School of Physical Sciences , University of Chinese Academy of Sciences , Beijing 100049 , China
| | - Ming Zhang
- Beijing National Laboratory for Condensed Matter Physics , Institute of Physics, Chinese Academy of Sciences , Beijing 100190 China
| | - Huanfang Tian
- Beijing National Laboratory for Condensed Matter Physics , Institute of Physics, Chinese Academy of Sciences , Beijing 100190 China
| | - Huai-Xin Yang
- Beijing National Laboratory for Condensed Matter Physics , Institute of Physics, Chinese Academy of Sciences , Beijing 100190 China
- School of Physical Sciences , University of Chinese Academy of Sciences , Beijing 100049 , China
- Yangtze River Delta Physics Research Center Co., Ltd. , Liyang , Jiangsu 213300 , China
| | - Jian-Qi Li
- Beijing National Laboratory for Condensed Matter Physics , Institute of Physics, Chinese Academy of Sciences , Beijing 100190 China
- School of Physical Sciences , University of Chinese Academy of Sciences , Beijing 100049 , China
- Songshan Lake Materials Laboratory , Dongguan , Guangdong 523808 , China
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21
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Eljarrat A, Koch CT. Design and application of a relativistic Kramers-Kronig analysis algorithm. Ultramicroscopy 2019; 206:112825. [PMID: 31400584 DOI: 10.1016/j.ultramic.2019.112825] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/15/2019] [Revised: 07/15/2019] [Accepted: 07/26/2019] [Indexed: 10/26/2022]
Abstract
Low-loss electron energy loss spectroscopy (EELS) in the scanning transmission electron microscope probes the valence electron density and relevant optoelectronic properties such as band gap energies and other band structure transitions. The measured spectra can be formulated in a dielectric theory framework, comparable to optical spectroscopies and ab-initio simulations. Moreover, Kramers-Kronig analysis (KKA), an inverse algorithm based on the same name relations, can be employed for the retrieval of the complex dielectric function. However, spurious contributions traditionally not considered in this framework typically impact low-loss EELS modifying the spectral shapes and precluding the correct measurement and retrieval of the dielectric information. A relativistic KKA algorithm is able to account for the bulk and surface radiative-loss contributions to low-loss EELS, revealing the correct dielectric properties. Using a synthetic low-loss EELS model, we propose some modifications on the naive implementation of this algorithm that broadens its range of application. The robustness of the algorithm is improved by regularization, applying previous knowledge about the shape and smoothness of the correction term. Additionally, our efficient numerical integration methodology allows processing hyperspectral datasets in a reasonable amount of time. Harnessing these abilities, we show how simultaneous relativistic KKA processing of several spectra can share information to produce an improved result.
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Affiliation(s)
- Alberto Eljarrat
- Department of Physics, Humboldt University of Berlin, Newtonstraße 15, Berlin 12489, Germany.
| | - Christoph T Koch
- Department of Physics, Humboldt University of Berlin, Newtonstraße 15, Berlin 12489, Germany
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22
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Charging ain't all bad: Complex physics in DyScO 3. Ultramicroscopy 2019; 203:119-124. [PMID: 30554733 DOI: 10.1016/j.ultramic.2018.12.005] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/09/2018] [Accepted: 12/05/2018] [Indexed: 11/20/2022]
Abstract
Although charging is ubiquitous in electron microscopy, its effects are typically avoided or ignored. However, avoiding charging is not possible in some materials, e.g. lanthanide scandates with well-ordered surfaces positively charge immensely under electron beam illumination because of their electronic structure, and ignoring charging can leave new science undiscovered. In this work, a combination of rapidly acquired electron energy loss spectra and cross-correlation were used to understand and overcome charging effects in DyScO3. A 5.4 eV band gap was extracted from the charging-corrected loss spectrum, in good agreement with previously reported band gaps, and a 3.8 eV in-gap peak was attributed to surface states via comparison with density functional theory calculations. Additionally, ultraviolet photoelectron spectroscopy measurements indicated that under some conditions well-annealed DyScO3 surfaces charge negatively causing upward band bending associated with occupied surface states in the gap. As was previously found in the case of positive charging under electron beam illumination with in-situ flexoelectric bending observations, the magnitude of negative charging under ultraviolet illumination is Zener tunneling limited in well-annealed DyScO3.
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Chatterjee S, Ricciardi L, Deitz JI, Williams REA, McComb DW, Strangi G. Manipulating acoustic and plasmonic modes in gold nanostars. NANOSCALE ADVANCES 2019; 1:2690-2698. [PMID: 36132721 PMCID: PMC9418612 DOI: 10.1039/c9na00301k] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 05/15/2019] [Accepted: 05/27/2019] [Indexed: 06/16/2023]
Abstract
In this contribution experimental evidence of plasmonic edge modes and acoustic breathing modes in gold nanostars (AuNSs) is reported. AuNSs are synthesized by a surfactant-free, one-step wet-chemistry method. Optical extinction measurements of AuNSs confirm the presence of localized surface plasmon resonances (LSPRs), while electron energy-loss spectroscopy (EELS) using a scanning transmission electron microscope (STEM) shows the spatial distribution of LSPRs and reveals the presence of acoustic breathing modes. Plasmonic hot-spots generated at the pinnacle of the sharp spikes, due to the optically active dipolar edge mode, allow significant intensity enhancement of local fields and hot-electron injection, and are thus useful for size detection of small protein molecules. The breathing modes observed away from the apices of the nanostars are identified as stimulated dark modes - they have an acoustic nature - and likely originate from the confinement of the surface plasmon by the geometrical boundaries of a nanostructure. The presence of both types of modes is verified by numerical simulations. Both these modes offer the possibility of designing nanoplasmonic antennas based on AuNSs, which can provide information on both mass and polarizability of biomolecules using a two-step molecular detection process.
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Affiliation(s)
- Sharmistha Chatterjee
- Department of Physics, Case Western Reserve University 10600 Euclid Avenue Cleveland OH 44106 USA
- CNR-NANOTEC Istituto di Nanotecnologia, Department of Physics, University of Calabria 87036-Rende Italy
- Fondazione con Il Cuore Via Roma 170 88811 Cirò Marina Italy
| | - Loredana Ricciardi
- CNR-NANOTEC Istituto di Nanotecnologia, Department of Physics, University of Calabria 87036-Rende Italy
- Fondazione con Il Cuore Via Roma 170 88811 Cirò Marina Italy
| | - Julia I Deitz
- Center for Electron Microscopy and Analysis, The Ohio State University Columbus OH 43212 USA
- Department of Material Science and Engineering, The Ohio State University Columbus OH 43210 USA
| | - Robert E A Williams
- Center for Electron Microscopy and Analysis, The Ohio State University Columbus OH 43212 USA
| | - David W McComb
- Center for Electron Microscopy and Analysis, The Ohio State University Columbus OH 43212 USA
- Department of Material Science and Engineering, The Ohio State University Columbus OH 43210 USA
| | - Giuseppe Strangi
- Department of Physics, Case Western Reserve University 10600 Euclid Avenue Cleveland OH 44106 USA
- CNR-NANOTEC Istituto di Nanotecnologia, Department of Physics, University of Calabria 87036-Rende Italy
- Fondazione con Il Cuore Via Roma 170 88811 Cirò Marina Italy
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24
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Fundamentals of cathodoluminescence in a STEM: The impact of sample geometry and electron beam energy on light emission of semiconductors. Ultramicroscopy 2019; 200:111-124. [DOI: 10.1016/j.ultramic.2019.03.001] [Citation(s) in RCA: 6] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/06/2018] [Revised: 03/01/2019] [Accepted: 03/03/2019] [Indexed: 11/23/2022]
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Brodusch N, Demers H, Gellé A, Moores A, Gauvin R. Electron energy-loss spectroscopy (EELS) with a cold-field emission scanning electron microscope at low accelerating voltage in transmission mode. Ultramicroscopy 2018; 203:21-36. [PMID: 30595397 DOI: 10.1016/j.ultramic.2018.12.015] [Citation(s) in RCA: 12] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/12/2018] [Revised: 12/18/2018] [Accepted: 12/23/2018] [Indexed: 11/29/2022]
Abstract
A commercial electron energy-loss spectrometer (EELS) attached to a high-resolution cold-field emission scanning electron microscope in transmission mode (STEM) is evaluated and its potential for characterizing materials science thin specimens at low accelerating voltage is reviewed. Despite the increased beam radiation damage at SEM voltages on sensitive compounds, we describe some potential applications which benefit from lowering the primary electrons voltage on less-sensitive specimens. We report bandgap measurements on several dielectrics which were facilitated by the lack of Cherenkov radiation losses at 30 kV. The possibility of volume plasmon imaging to probe local composition changes in complex materials was demonstrated using energy-filtered STEM, either via spectrum imaging or elemental mapping using the "three-windows" method. As plasmonic materials are increasing used for energy, electronics or biomedical applications, the ability of reliably evaluate their properties at low accelerating voltage in a SEM is very appealing and is demonstrated. The energy resolution of the spectrometer, taken as the full width at half maximum of the zero-loss peak, was routinely measured at around 0.55 eV and it is demonstrated that t/λ ratios up to 1.5 allowed practical EEL spectroscopy at 30 kV.
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Affiliation(s)
- Nicolas Brodusch
- Department of Mining and Materials Engineering, McGill University, Montréal, Québec H3A 0C5, Canada.
| | - Hendrix Demers
- Department of Mining and Materials Engineering, McGill University, Montréal, Québec H3A 0C5, Canada
| | - Alexandra Gellé
- Department of Chemistry, McGill University, Montréal, Québec H3A 0C5, Canada
| | - Audrey Moores
- Department of Chemistry, McGill University, Montréal, Québec H3A 0C5, Canada
| | - Raynald Gauvin
- Department of Mining and Materials Engineering, McGill University, Montréal, Québec H3A 0C5, Canada.
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Chatterjee S, Ricciardi L, Deitz JI, Williams REA, McComb DW, Strangi G. Heterodimeric Plasmonic Nanogaps for Biosensing. MICROMACHINES 2018; 9:E664. [PMID: 30558364 PMCID: PMC6316515 DOI: 10.3390/mi9120664] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 11/28/2018] [Revised: 12/13/2018] [Accepted: 12/13/2018] [Indexed: 11/16/2022]
Abstract
We report the study of heterodimeric plasmonic nanogaps created between gold nanostar (AuNS) tips and gold nanospheres. The selective binding is realized by properly functionalizing the two nanostructures; in particular, the hot electrons injected at the nanostar tips trigger a regio-specific chemical link with the functionalized nanospheres. AuNSs were synthesized in a simple, one-step, surfactant-free, high-yield wet-chemistry method. The high aspect ratio of the sharp nanostar tip collects and concentrates intense electromagnetic fields in ultrasmall surfaces with small curvature radius. The extremities of these surface tips become plasmonic hot spots, allowing significant intensity enhancement of local fields and hot-electron injection. Electron energy-loss spectroscopy (EELS) was performed to spatially map local plasmonic modes of the nanostar. The presence of different kinds of modes at different position of these nanostars makes them one of the most efficient, unique, and smart plasmonic antennas. These modes are harnessed to mediate the formation of heterodimers (nanostar-nanosphere) through hot-electron-induced chemical modification of the tip. For an AuNS-nanosphere heterodimeric gap, the intensity enhancement factor in the hot-spot region was determined to be 10⁶, which is an order of magnitude greater than the single nanostar tip. The intense local electric field within the nanogap results in ultra-high sensitivity for the presence of bioanalytes captured in that region. In case of a single BSA molecule (66.5 KDa), the sensitivity was evaluated to be about 1940 nm/RIU for a single AuNS, but was 5800 nm/RIU for the AuNS-nanosphere heterodimer. This indicates that this heterodimeric nanostructure can be used as an ultrasensitive plasmonic biosensor to detect single protein molecules or nucleic acid fragments of lower molecular weight with high specificity.
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Affiliation(s)
- Sharmistha Chatterjee
- Department of Physics, Case Western Reserve University, 10600 Euclid Avenue, Cleveland, OH 44106, USA.
- CNR-NANOTEC Istituto di Nanotecnologia and Department of Physics, University of Calabria, 87036 Rende, Italy.
- Fondazione con Il Cuore, via Roma 170, 88811 Ciro' Marina, Italy.
| | - Loredana Ricciardi
- CNR-NANOTEC Istituto di Nanotecnologia and Department of Physics, University of Calabria, 87036 Rende, Italy.
- Fondazione con Il Cuore, via Roma 170, 88811 Ciro' Marina, Italy.
| | - Julia I Deitz
- Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH 43212, USA.
- Department of Material Science and Engineering, The Ohio State University, Columbus, OH 43210, USA.
| | - Robert E A Williams
- Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH 43212, USA.
| | - David W McComb
- Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH 43212, USA.
- Department of Material Science and Engineering, The Ohio State University, Columbus, OH 43210, USA.
| | - Giuseppe Strangi
- Department of Physics, Case Western Reserve University, 10600 Euclid Avenue, Cleveland, OH 44106, USA.
- CNR-NANOTEC Istituto di Nanotecnologia and Department of Physics, University of Calabria, 87036 Rende, Italy.
- Fondazione con Il Cuore, via Roma 170, 88811 Ciro' Marina, Italy.
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Meng Q, Wu L, Xin HL, Zhu Y. Retrieving the energy-loss function from valence electron energy-loss spectrum: Separation of bulk-, surface-losses and Cherenkov radiation. Ultramicroscopy 2018; 194:175-181. [PMID: 30149218 DOI: 10.1016/j.ultramic.2018.08.014] [Citation(s) in RCA: 6] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/27/2018] [Revised: 08/09/2018] [Accepted: 08/19/2018] [Indexed: 11/16/2022]
Abstract
With recent rapid advancement in electron microscopy instrumentation, in particular, bright electron sources and monochromators, valence electron energy-loss spectroscopy (VEELS) has become attractive for retrieving band structures, optical properties, dielectric functions and phonon information of materials. However, Cherenkov radiation and surface-loss contribution significantly alter fine structures of VEELS, even in simple semiconductors and insulators. This leads to the problem that dielectric function or bandgap structure of these materials cannot be determined correctly if these effects are not removed. In this work we present a solution to this dilemma. We demonstrate that energy-loss function and real part of inverse complex dielectric function can be retrieved from raw data of VEELS. Based on the calculated example of Si, the limitation of our approach is discussed. We believe that our approach represents an improvement over previous procedures and has a broad prospect for applications.
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Affiliation(s)
- Qingping Meng
- Department of Condensed Matter Physics and Materials Science, Brookhaven National Laboratory, Upton NY 11973, USA.
| | - Lijun Wu
- Department of Condensed Matter Physics and Materials Science, Brookhaven National Laboratory, Upton NY 11973, USA
| | - Huolin L Xin
- Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton NY 11973, USA
| | - Yimei Zhu
- Department of Condensed Matter Physics and Materials Science, Brookhaven National Laboratory, Upton NY 11973, USA.
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Zhan W, Granerød CS, Venkatachalapathy V, Johansen KMH, Jensen IJT, Kuznetsov AY, Prytz Ø. Reply to Comment on 'Nanoscale mapping of optical band gaps using monochromated electron energy loss spectroscopy'. NANOTECHNOLOGY 2018; 29:318002. [PMID: 29749345 DOI: 10.1088/1361-6528/aac3ed] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/08/2023]
Abstract
We respond to the comment by Thomas Walther and reaffirm the findings of our original article.
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Affiliation(s)
- W Zhan
- Department of Physics, Centre for Materials Science and Nanotechnology, University of Oslo, PO Box 1048-Blindern, NO-0316 Oslo, Norway
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29
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Guzzinati G, Altantzis T, Batuk M, De Backer A, Lumbeeck G, Samaee V, Batuk D, Idrissi H, Hadermann J, Van Aert S, Schryvers D, Verbeeck J, Bals S. Recent Advances in Transmission Electron Microscopy for Materials Science at the EMAT Lab of the University of Antwerp. MATERIALS (BASEL, SWITZERLAND) 2018; 11:E1304. [PMID: 30060556 PMCID: PMC6117696 DOI: 10.3390/ma11081304] [Citation(s) in RCA: 14] [Impact Index Per Article: 2.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 06/29/2018] [Revised: 07/25/2018] [Accepted: 07/26/2018] [Indexed: 01/13/2023]
Abstract
The rapid progress in materials science that enables the design of materials down to the nanoscale also demands characterization techniques able to analyze the materials down to the same scale, such as transmission electron microscopy. As Belgium's foremost electron microscopy group, among the largest in the world, EMAT is continuously contributing to the development of TEM techniques, such as high-resolution imaging, diffraction, electron tomography, and spectroscopies, with an emphasis on quantification and reproducibility, as well as employing TEM methodology at the highest level to solve real-world materials science problems. The lab's recent contributions are presented here together with specific case studies in order to highlight the usefulness of TEM to the advancement of materials science.
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Affiliation(s)
- Giulio Guzzinati
- EMAT, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, Belgium.
| | - Thomas Altantzis
- EMAT, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, Belgium.
| | - Maria Batuk
- EMAT, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, Belgium.
| | - Annick De Backer
- EMAT, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, Belgium.
| | - Gunnar Lumbeeck
- EMAT, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, Belgium.
| | - Vahid Samaee
- EMAT, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, Belgium.
| | - Dmitry Batuk
- EMAT, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, Belgium.
| | - Hosni Idrissi
- EMAT, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, Belgium.
- Institute of Mechanics, Materials and Civil Engineering, Université catholique de Louvain, Louvain-la-Neuve 1348, Belgium.
| | - Joke Hadermann
- EMAT, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, Belgium.
| | - Sandra Van Aert
- EMAT, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, Belgium.
| | | | - Johan Verbeeck
- EMAT, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, Belgium.
| | - Sara Bals
- EMAT, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, Belgium.
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30
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Castro FC, Dravid VP. Characterization of Lithium Ion Battery Materials with Valence Electron Energy-Loss Spectroscopy. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2018; 24:214-220. [PMID: 29877170 DOI: 10.1017/s1431927618000302] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/08/2023]
Abstract
Cutting-edge research on materials for lithium ion batteries regularly focuses on nanoscale and atomic-scale phenomena. Electron energy-loss spectroscopy (EELS) is one of the most powerful ways of characterizing composition and aspects of the electronic structure of battery materials, particularly lithium and the transition metal mixed oxides found in the electrodes. However, the characteristic EELS signal from battery materials is challenging to analyze when there is strong overlap of spectral features, poor signal-to-background ratios, or thicker and uneven sample areas. A potential alternative or complementary approach comes from utilizing the valence EELS features (<20 eV loss) of battery materials. For example, the valence EELS features in LiCoO2 maintain higher jump ratios than the Li-K edge, most notably when spectra are collected with minimal acquisition times or from thick sample regions. EELS maps of these valence features give comparable results to the Li-K edge EELS maps of LiCoO2. With some spectral processing, the valence EELS maps more accurately highlight the morphology and distribution of LiCoO2 than the Li-K edge maps, especially in thicker sample regions. This approach is beneficial for cases where sample thickness or beam sensitivity limit EELS analysis, and could be used to minimize electron dosage and sample damage or contamination.
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Affiliation(s)
- Fernando C Castro
- 1Department of Materials Science and Engineering,Northwestern University,2220 Campus Drive, Cook Hall, Room 1137, Evanston,IL 60208,USA
| | - Vinayak P Dravid
- 1Department of Materials Science and Engineering,Northwestern University,2220 Campus Drive, Cook Hall, Room 1137, Evanston,IL 60208,USA
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31
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Korneychuk S, Partoens B, Guzzinati G, Ramaneti R, Derluyn J, Haenen K, Verbeeck J. Exploring possibilities of band gap measurement with off-axis EELS in TEM. Ultramicroscopy 2018; 189:76-84. [PMID: 29626835 DOI: 10.1016/j.ultramic.2018.03.021] [Citation(s) in RCA: 6] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/10/2017] [Revised: 03/16/2018] [Accepted: 03/28/2018] [Indexed: 11/16/2022]
Abstract
A technique to measure the band gap of dielectric materials with high refractive index by means of energy electron loss spectroscopy (EELS) is presented. The technique relies on the use of a circular (Bessel) aperture and suppresses Cherenkov losses and surface-guided light modes by enforcing a momentum transfer selection. The technique also strongly suppresses the elastic zero loss peak, making the acquisition, interpretation and signal to noise ratio of low loss spectra considerably better, especially for excitations in the first few eV of the EELS spectrum. Simulations of the low loss inelastic electron scattering probabilities demonstrate the beneficial influence of the Bessel aperture in this setup even for high accelerating voltages. The importance of selecting the optimal experimental convergence and collection angles is highlighted. The effect of the created off-axis acquisition conditions on the selection of the transitions from valence to conduction bands is discussed in detail on a simplified isotropic two band model. This opens the opportunity for deliberately selecting certain transitions by carefully tuning the microscope parameters. The suggested approach is experimentally demonstrated and provides good signal to noise ratio and interpretable band gap signals on reference samples of diamond, GaN and AlN while offering spatial resolution in the nm range.
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Affiliation(s)
- Svetlana Korneychuk
- Electron Microscopy for Material Science (EMAT), University of Antwerp, Antwerp 2020, Belgium.
| | - Bart Partoens
- Condensed Matter Theory (CMT), University of Antwerp, Antwerp 2020, Belgium
| | - Giulio Guzzinati
- Electron Microscopy for Material Science (EMAT), University of Antwerp, Antwerp 2020, Belgium
| | - Rajesh Ramaneti
- Institute for Materials Research (IMO), Hasselt University, Diepenbeek 3590, Belgium; IMOMEC, IMEC vzw, Diepenbeek 3590, Belgium
| | | | - Ken Haenen
- Institute for Materials Research (IMO), Hasselt University, Diepenbeek 3590, Belgium; IMOMEC, IMEC vzw, Diepenbeek 3590, Belgium
| | - Jo Verbeeck
- Electron Microscopy for Material Science (EMAT), University of Antwerp, Antwerp 2020, Belgium
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32
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Zhan W, Venkatachalapathy V, Aarholt T, Kuznetsov AY, Prytz Ø. Band gap maps beyond the delocalization limit: correlation between optical band gaps and plasmon energies at the nanoscale. Sci Rep 2018; 8:848. [PMID: 29339788 PMCID: PMC5770386 DOI: 10.1038/s41598-017-18949-9] [Citation(s) in RCA: 14] [Impact Index Per Article: 2.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/23/2017] [Accepted: 12/20/2017] [Indexed: 11/16/2022] Open
Abstract
Recent progresses in nanoscale semiconductor technology have heightened the need for measurements of band gaps with high spatial resolution. Band gap mapping can be performed through a combination of probe-corrected scanning transmission electron microscopy (STEM) and monochromated electron energy-loss spectroscopy (EELS), but are rare owing to the complexity of the experiments and the data analysis. Furthermore, although this method is far superior in terms of spatial resolution to any other techniques, it is still fundamentally resolution-limited due to inelastic delocalization of the EELS signal. In this work we have established a quantitative correlation between optical band gaps and plasmon energies using the Zn1−xCdxO/ZnO system as an example, thereby side-stepping the fundamental resolution limits of band gap measurements, and providing a simple and convenient approach to achieve band gap maps with unprecedented spatial resolution.
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Affiliation(s)
- Wei Zhan
- Department of Physics, Centre for Materials Science and Nanotechnology, University of Oslo, P.O. Box 1048 Blindern, N-0316, Oslo, Norway
| | - Vishnukanthan Venkatachalapathy
- Department of Physics, Centre for Materials Science and Nanotechnology, University of Oslo, P.O. Box 1048 Blindern, N-0316, Oslo, Norway
| | - Thomas Aarholt
- Department of Physics, Centre for Materials Science and Nanotechnology, University of Oslo, P.O. Box 1048 Blindern, N-0316, Oslo, Norway
| | - Andrej Yu Kuznetsov
- Department of Physics, Centre for Materials Science and Nanotechnology, University of Oslo, P.O. Box 1048 Blindern, N-0316, Oslo, Norway
| | - Øystein Prytz
- Department of Physics, Centre for Materials Science and Nanotechnology, University of Oslo, P.O. Box 1048 Blindern, N-0316, Oslo, Norway.
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33
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Granerød CS, Zhan W, Prytz Ø. Automated approaches for band gap mapping in STEM-EELS. Ultramicroscopy 2018; 184:39-45. [DOI: 10.1016/j.ultramic.2017.08.006] [Citation(s) in RCA: 16] [Impact Index Per Article: 2.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/26/2017] [Revised: 07/06/2017] [Accepted: 08/15/2017] [Indexed: 11/24/2022]
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34
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Crozier PA. Vibrational and valence aloof beam EELS: A potential tool for nondestructive characterization of nanoparticle surfaces. Ultramicroscopy 2017; 180:104-114. [DOI: 10.1016/j.ultramic.2017.03.011] [Citation(s) in RCA: 54] [Impact Index Per Article: 7.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/08/2016] [Revised: 03/10/2017] [Accepted: 03/11/2017] [Indexed: 11/25/2022]
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Vatanparast M, Egoavil R, Reenaas TW, Verbeeck J, Holmestad R, Vullum PE. Bandgap measurement of high refractive index materials by off-axis EELS. Ultramicroscopy 2017; 182:92-98. [PMID: 28666140 DOI: 10.1016/j.ultramic.2017.06.019] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/30/2016] [Revised: 06/18/2017] [Accepted: 06/19/2017] [Indexed: 10/19/2022]
Abstract
In the present work Cs aberration corrected and monochromated scanning transmission electron microscopy electron energy loss spectroscopy (STEM-EELS) has been used to explore experimental set-ups that allow bandgaps of high refractive index materials to be determined. Semi-convergence and -collection angles in the µrad range were combined with off-axis or dark field EELS to avoid relativistic losses and guided light modes in the low loss range to contribute to the acquired EEL spectra. Off-axis EELS further supressed the zero loss peak and the tail of the zero loss peak. The bandgap of several GaAs-based materials were successfully determined by simple regression analyses of the background subtracted EEL spectra. The presented set-up does not require that the acceleration voltage is set to below the Čerenkov limit and can be applied over the entire acceleration voltage range of modern TEMs and for a wide range of specimen thicknesses.
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Affiliation(s)
- Maryam Vatanparast
- Department of Physics, NTNU (Norwegian University of Science and Technology), 7491 Trondheim, Norway.
| | - Ricardo Egoavil
- EMAT, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium
| | - Turid W Reenaas
- Department of Physics, NTNU (Norwegian University of Science and Technology), 7491 Trondheim, Norway
| | - Johan Verbeeck
- EMAT, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium
| | - Randi Holmestad
- Department of Physics, NTNU (Norwegian University of Science and Technology), 7491 Trondheim, Norway
| | - Per Erik Vullum
- Department of Physics, NTNU (Norwegian University of Science and Technology), 7491 Trondheim, Norway; SINTEF Materials and Chemistry, 7065 Trondheim, Norway
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36
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Wallisch W, Stöger-Pollach M, Navickas E. Consequences of the CMR effect on EELS in TEM. Ultramicroscopy 2017; 179:84-89. [PMID: 28448829 DOI: 10.1016/j.ultramic.2017.04.011] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/21/2016] [Revised: 04/11/2017] [Accepted: 04/14/2017] [Indexed: 11/25/2022]
Abstract
Double perovskite oxides have gained in importance and exhibit negative magnetoresistance, which is known as colossal magnetoresistance (CMR) effect. Using a La2CoMnO6 (LCM) thin film layer, we proved that the physical consequences of the CMR effect do also influence the electron energy loss spectrometry (EELS) signal. We observed a change of the band gap at low energy losses and were able to study the magnetisation with chemical sensitivity by employing energy loss magnetic chiral dichroism (EMCD) below the Curie temperature TC, where the CMR effect becomes significant.
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Affiliation(s)
- Wolfgang Wallisch
- University Service Centre for Transmission Electron Microscopy, Technische Universitát Wien, Wiedner Hauptstraße 8-10, A-1040 Wien, Austria.
| | - Michael Stöger-Pollach
- University Service Centre for Transmission Electron Microscopy, Technische Universitát Wien, Wiedner Hauptstraße 8-10, A-1040 Wien, Austria
| | - Edvinas Navickas
- Institute of Chemical Technologies and Analytics, Technische Universität Wien, Getreidemarkt 9, A-1040 Wien, Austria
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37
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Zhan W, Granerød CS, Venkatachalapathy V, Johansen KMH, Jensen IJT, Kuznetsov AY, Prytz Ø. Nanoscale mapping of optical band gaps using monochromated electron energy loss spectroscopy. NANOTECHNOLOGY 2017; 28:105703. [PMID: 28085004 DOI: 10.1088/1361-6528/aa5962] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/06/2023]
Abstract
Using monochromated electron energy loss spectroscopy in a probe-corrected scanning transmission electron microscope we demonstrate band gap mapping in ZnO/ZnCdO thin films with a spatial resolution below 10 nm and spectral precision of 20 meV.
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Affiliation(s)
- W Zhan
- Department of Physics, Centre for Materials Science and Nanotechnology, University of Oslo, PO Box 1048-Blindern, NO-0316 Oslo, Norway
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38
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Jeem M, Zhang L, Ishioka J, Shibayama T, Iwasaki T, Kato T, Watanabe S. Tuning Optoelectrical Properties of ZnO Nanorods with Excitonic Defects via Submerged Illumination. NANO LETTERS 2017; 17:2088-2093. [PMID: 28157326 DOI: 10.1021/acs.nanolett.7b00324] [Citation(s) in RCA: 10] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/11/2023]
Abstract
When applied in optoelectronic devices, a ZnO semiconductor dominantly absorbs or emits ultraviolet light because of its direct electron transition through a wide energy bandgap. On the contrary, crystal defects and nanostructure morphology are the chief key factors for indirect, interband transitions of ZnO optoelectronic devices in the visible light range. By ultraviolet illumination in ultrapure water, we demonstrate here a conceptually unique approach to tune the shape of ZnO nanorods from tapered to capped-end via apical surface morphology control. We show that oxygen vacancy point defects activated by excitonic effects near the tip-edge of a nanorod serve as an optoelectrical hotspot for the light-driven formation and tunability of the optoelectrical properties. A double increase of electron energy absorption on near band edge energy of ZnO was observed near the tip-edge of the tapered nanorod. The optoelectrical hotspot explanation rivals that of conventional electrostatics, impurity control, and alkaline pH control-associated mechanisms. Thus, it highlights a new perspective to understanding light-driven nanorod formation in pure neutral water.
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Affiliation(s)
| | | | | | | | - Tomio Iwasaki
- Research & Development Group, Hitachi, Ltd. , 7-1-1 Omika, Hitachi, Ibaraki 3191292, Japan
| | - Takahiko Kato
- Research & Development Group, Hitachi, Ltd. , 7-1-1 Omika, Hitachi, Ibaraki 3191292, Japan
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Stöger-Pollach M, Kachtík L, Miesenberger B, Retzl P. Transition radiation in EELS and cathodoluminescence. Ultramicroscopy 2017; 173:31-35. [DOI: 10.1016/j.ultramic.2016.11.020] [Citation(s) in RCA: 10] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/07/2016] [Revised: 11/16/2016] [Accepted: 11/20/2016] [Indexed: 11/16/2022]
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40
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Stöger-Pollach M, Schachinger T, Biedermann K, Beyer V. Valence EELS below the limit of inelastic delocalization using conical dark field EFTEM or Bessel beams. Ultramicroscopy 2017; 173:24-30. [DOI: 10.1016/j.ultramic.2016.11.022] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/08/2016] [Revised: 11/17/2016] [Accepted: 11/20/2016] [Indexed: 10/20/2022]
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41
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Anjum DH, Memon NK, Ismail M, Hedhili MN, Sharif U, Chung SH. Transmission electron microscopy of carbon-coated and iron-doped titania nanoparticles. NANOTECHNOLOGY 2016; 27:365709. [PMID: 27483338 DOI: 10.1088/0957-4484/27/36/365709] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/06/2023]
Abstract
We present a study on the properties of iron (Fe)-doped and carbon (C)-coated titania (TiO2) nanoparticles (NPs) which has been compiled by using x-ray diffraction (XRD), transmission electron microscopy (TEM), and x-ray photoelectron spectroscopy (XPS). These TiO2 NPs were prepared by using the flame synthesis method. This method allows the simultaneous C coating and Fe doping of TiO2 NPs. XRD investigations revealed that the phase of the prepared NPs was anatase TiO2. Conventional TEM analysis showed that the average size of the TiO2 NPs was about 65 nm and that the NPs were uniformly coated with the element C. Furthermore, from the x-ray energy dispersive spectrometry analysis, it was found that about 8 at.% Fe was present in the synthesized samples. High-resolution TEM (HRTEM) revealed the graphitized carbon structure of the layer surrounding the prepared TiO2 NPs. HRTEM analysis further revealed that the NPs possessed the crystalline structure of anatase titania. Energy-filtered TEM (EFTEM) analysis showed the C coating and Fe doping of the NPs. The ratio of L3 and L2 peaks for the Ti-L23 and Fe-L23 edges present in the core loss electron energy loss spectroscopy (EELS) revealed a +4 oxidation state for the Ti and a +3 oxidation state for the Fe. These EELS results were further confirmed with XPS analysis. The electronic properties of the samples were investigated by applying Kramers-Kronig analysis to the low-loss EELS spectra acquired from the prepared NPs. The presented results showed that the band gap energy of the TiO2 NPs decreased from an original value of 3.2 eV to about 2.2 eV, which is quite close to the ideal band gap energy of 1.65 eV for photocatalysis semiconductors. The observed decrease in band gap energy of the TiO2 NPs was attributed to the presence of Fe atoms at the lattice sites of the anatase TiO2 lattice. In short, C-coated and Fe-doped TiO2 NPs were synthesized with a rather cost-effective and comparatively easily scalable method. The presented analysis enables us to predict the excellent efficiency of these NPs for solar-cell and photo-catalysis applications.
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Affiliation(s)
- Dalaver H Anjum
- Imaging and Characterization (IAC) Lab, King Abdullah University of Science and Technology (KAUST), Thuwal, Kingdom of Saudi Arabia
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42
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Hauschild D, Handick E, Göhl-Gusenleitner S, Meyer F, Schwab H, Benkert A, Pohlner S, Palm J, Tougaard S, Heske C, Weinhardt L, Reinert F. Band-Gap Widening at the Cu(In,Ga)(S,Se)2 Surface: A Novel Determination Approach Using Reflection Electron Energy Loss Spectroscopy. ACS APPLIED MATERIALS & INTERFACES 2016; 8:21101-21105. [PMID: 27463021 DOI: 10.1021/acsami.6b06358] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/06/2023]
Abstract
Using reflection electron energy loss spectroscopy (REELS), we have investigated the optical properties at the surface of a chalcopyrite-based Cu(In,Ga)(S,Se)2 (CIGSSe) thin-film solar cell absorber, as well as an indium sulfide (InxSy) buffer layer before and after annealing. By fitting the characteristic inelastic scattering cross-section λK(E) to cross sections evaluated by the QUEELS-ε(k,ω)-REELS software package, we determine the surface dielectric function and optical properties of these samples. A comparison of the optical values at the surface of the InxSy film with bulk ellipsometry measurements indicates a good agreement between bulk- and surface-related optical properties. In contrast, the properties of the CIGSSe surface differ significantly from the bulk. In particular, a larger (surface) band gap than for bulk-sensitive measurements is observed, providing a complementary and independent confirmation of earlier photoelectron spectroscopy results. Finally, we derive the inelastic mean free path λ for electrons in InxSy, annealed InxSy, and CIGSSe at a kinetic energy of 1000 eV.
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Affiliation(s)
- Dirk Hauschild
- Experimental Physics VII, University of Würzburg , Am Hubland, 97074 Würzburg, Germany
| | - Evelyn Handick
- Experimental Physics VII, University of Würzburg , Am Hubland, 97074 Würzburg, Germany
| | | | - Frank Meyer
- Experimental Physics VII, University of Würzburg , Am Hubland, 97074 Würzburg, Germany
| | - Holger Schwab
- Experimental Physics VII, University of Würzburg , Am Hubland, 97074 Würzburg, Germany
| | - Andreas Benkert
- Experimental Physics VII, University of Würzburg , Am Hubland, 97074 Würzburg, Germany
- Institute for Photon Science and Synchrotron Radiation (IPS), Karlsruhe Institute of Technology (KIT) , Hermann-v.-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Germany
| | | | - Jörg Palm
- AVANCIS GmbH , Otto-Hahn-Ring 6, 81739 Munich, Germany
| | - Sven Tougaard
- Department of Physics, Chemistry and Pharmacy, University of Southern Denmark , DK-5230 Odense M, Denmark
| | - Clemens Heske
- Institute for Photon Science and Synchrotron Radiation (IPS), Karlsruhe Institute of Technology (KIT) , Hermann-v.-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Germany
- Department of Chemistry and Biochemistry, University of Nevada , Las Vegas (UNLV), 4505 Maryland Parkway, Las Vegas, Nevada 89154-4003, United States
- Institute for Chemical Technology and Polymer Chemistry (ITCP), Karlsruhe Institute of Technology (KIT) , Engesserstrasse 18/20, 76128 Karlsruhe, Germany
| | - Lothar Weinhardt
- Institute for Photon Science and Synchrotron Radiation (IPS), Karlsruhe Institute of Technology (KIT) , Hermann-v.-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Germany
- Department of Chemistry and Biochemistry, University of Nevada , Las Vegas (UNLV), 4505 Maryland Parkway, Las Vegas, Nevada 89154-4003, United States
- Institute for Chemical Technology and Polymer Chemistry (ITCP), Karlsruhe Institute of Technology (KIT) , Engesserstrasse 18/20, 76128 Karlsruhe, Germany
| | - Friedrich Reinert
- Experimental Physics VII, University of Würzburg , Am Hubland, 97074 Würzburg, Germany
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43
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Sakaguchi N, Tanda L, Kunisada Y. Measurement of the dielectric function of α-Al2O3 by transmission electron microscopy - Electron energy-loss spectroscopy without Cerenkov radiation effects. Ultramicroscopy 2016; 169:37-43. [PMID: 27448199 DOI: 10.1016/j.ultramic.2016.07.003] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/23/2016] [Revised: 06/30/2016] [Accepted: 07/03/2016] [Indexed: 11/24/2022]
Abstract
The dielectric function of α-Al2O3 was measured by electron energy-loss spectroscopy (EELS) coupled with the difference method. The influence of Cerenkov radiation was significant in measurements using a 200kV transmission electron microscope (TEM) and the correct dielectric function could not be obtained using the conventional EELS procedure. However, a good agreement between the optical data and EELS for the dielectric functions was obtained via a 60kV TEM. Combining EELS and the difference method, however, provided an accurate measurement of the dielectric function for α-Al2O3 even at an accelerating voltage of 200kV. The combination of EELS and the difference method in the nano-beam diffraction mode could derive an accurate dielectric function with superior spatial resolution regardless of the occurrence of Cerenkov radiation.
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Affiliation(s)
- Norihito Sakaguchi
- Laboratory of Integrated Function Materials, Center for Advanced Research of Energy and Materials, Faculty of Engineering, Hokkaido University, Kita-13, Nishi-8, Kita-ku, Sapporo, Hokkaido 060-8628, Japan.
| | - Luka Tanda
- Laboratory of Integrated Function Materials, Center for Advanced Research of Energy and Materials, Faculty of Engineering, Hokkaido University, Kita-13, Nishi-8, Kita-ku, Sapporo, Hokkaido 060-8628, Japan
| | - Yuji Kunisada
- Laboratory of Integrated Function Materials, Center for Advanced Research of Energy and Materials, Faculty of Engineering, Hokkaido University, Kita-13, Nishi-8, Kita-ku, Sapporo, Hokkaido 060-8628, Japan
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Sakaguchi N, Tanda L, Kunisada Y. Improving the measurement of dielectric function by TEM-EELS: avoiding the retardation effect. Microscopy (Oxf) 2016; 65:415-421. [DOI: 10.1093/jmicro/dfw023] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/11/2016] [Accepted: 05/30/2016] [Indexed: 11/12/2022] Open
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Eljarrat A, Sastre X, Peiró F, Estradé S. Density Functional Theory Modeling of Low-Loss Electron Energy-Loss Spectroscopy in Wurtzite III-Nitride Ternary Alloys. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2016; 22:706-716. [PMID: 26868876 DOI: 10.1017/s1431927616000106] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/05/2023]
Abstract
In the present work, the dielectric response of III-nitride semiconductors is studied using density functional theory (DFT) band structure calculations. The aim of this study is to improve our understanding of the features in the low-loss electron energy-loss spectra of ternary alloys, but the results are also relevant to optical and UV spectroscopy results. In addition, the dependence of the most remarkable features with composition is tested, i.e. applying Vegard's law to band gap and plasmon energy. For this purpose, three wurtzite ternary alloys, from the combination of binaries AlN, GaN, and InN, were simulated through a wide compositional range (i.e., Al x Ga1-x N, In x Al1-x N, and In x Ga1-x N, with x=[0,1]). For this DFT calculations, the standard tools found in Wien2k software were used. In order to improve the band structure description of these semiconductor compounds, the modified Becke-Johnson exchange-correlation potential was also used. Results from these calculations are presented, including band structure, density of states, and complex dielectric function for the whole compositional range. Larger, closer to experimental values, band gap energies are predicted using the novel potential, when compared with standard generalized gradient approximation. Moreover, a detailed analysis of the collective excitation features in the dielectric response reveals their compositional dependence, which sometimes departs from a linear behavior (bowing). Finally, an advantageous method for measuring the plasmon energy dependence from these calculations is explained.
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Affiliation(s)
- Alberto Eljarrat
- Laboratory of Electron NanoScopies,LENS-MIND-IN2UB,Departament d'Electrόnica,Universitat de Barcelona,Marti i Franqués 1,08028 Barcelona,Spain
| | - Xavier Sastre
- Laboratory of Electron NanoScopies,LENS-MIND-IN2UB,Departament d'Electrόnica,Universitat de Barcelona,Marti i Franqués 1,08028 Barcelona,Spain
| | - Francesca Peiró
- Laboratory of Electron NanoScopies,LENS-MIND-IN2UB,Departament d'Electrόnica,Universitat de Barcelona,Marti i Franqués 1,08028 Barcelona,Spain
| | - Sónia Estradé
- Laboratory of Electron NanoScopies,LENS-MIND-IN2UB,Departament d'Electrόnica,Universitat de Barcelona,Marti i Franqués 1,08028 Barcelona,Spain
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Liberti E, Menzel R, Shaffer MSP, McComb DW. Probing the size dependence on the optical modes of anatase nanoplatelets using STEM-EELS. NANOSCALE 2016; 8:9727-9735. [PMID: 27113455 DOI: 10.1039/c5nr09264g] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/05/2023]
Abstract
Anatase titania nanoplatelets with predominantly exposed {001} facets have been reported to have enhanced catalytic properties in comparison with bulk anatase. To understand their unusual behaviour, it is essential to fully characterize their electronic and optical properties at the nanometer scale. One way of assessing these fundamental properties is to study the dielectric function. Valence electron energy-loss spectroscopy (EELS) performed using a scanning transmission electron microscope (STEM) is the only analytical method that can probe the complex dielectric function with both high energy (<100 meV) and high spatial (<1 nm) resolution. By correlating experimental STEM-EELS data with simulations based on semi-classical dielectric theory, the dielectric response of thin (<5 nm) anatase nanoplatelets was found to be largely dominated by characteristic (optical) surface modes, which are linked to surface plasmon modes of anatase. For platelets less than 10 nm thick, the frequency of these optical modes varies according to their thickness. This unique optical behaviour prompts the enhancement of light absorption in the ultraviolet regime. Finally, the effect of finite size on the dielectric signal is gradually lost by stacking consistently two or more platelets in a specific crystal orientation, and eventually suppressed for large stacks of platelets.
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Affiliation(s)
- Emanuela Liberti
- Imperial College London, Department of Materials, London SW7 2AZ, UK.
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Mendis BG, Howkins A, Stowe D, Major JD, Durose K. The role of transition radiation in cathodoluminescence imaging and spectroscopy of thin-foils. Ultramicroscopy 2016; 167:31-42. [PMID: 27163963 DOI: 10.1016/j.ultramic.2016.05.002] [Citation(s) in RCA: 10] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/07/2015] [Revised: 03/10/2016] [Accepted: 05/02/2016] [Indexed: 11/15/2022]
Abstract
There is renewed interest in cathodoluminescence (CL) in the transmission electron microscope, since it can be combined with low energy loss spectroscopy measurements and can also be used to probe defects, such as grain boundaries and dislocations, at high spatial resolution. Transition radiation (TR), which is emitted when the incident electron crosses the vacuum-specimen interface, is however an important artefact that has received very little attention. The importance of TR is demonstrated on a wedge shaped CdTe specimen of varying thickness. For small specimen thicknesses (<250nm) grain boundaries are not visible in the panchromatic CL image. Grain boundary contrast is produced by electron-hole recombination within the foil, and a large fraction of that light is lost to multiple-beam interference, so that thicker specimens are required before the grain boundary signal is above the TR background. This is undesirable for high spatial resolution. Furthermore, the CL spectrum contains additional features due to TR which are not part of the 'bulk' specimen. Strategies to minimise the effects of TR are also discussed.
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Affiliation(s)
- B G Mendis
- Department of Physics, Durham University, South Road, Durham DH1 3LE, UK
| | - A Howkins
- Experimental Techniques Centre, Brunel University, Uxbridge UB8 3PH, UK
| | - D Stowe
- Gatan UK, 25 Nuffield Way, Abingdon, Oxfordshire OX14 1RL, UK
| | - J D Major
- Stephenson Institute for Renewable Energy, University of Liverpool, Liverpool L69 7ZF, UK
| | - K Durose
- Stephenson Institute for Renewable Energy, University of Liverpool, Liverpool L69 7ZF, UK
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The Čerenkov limit of Si, GaAs and GaP in electron energy loss spectrometry. Ultramicroscopy 2015; 157:73-8. [DOI: 10.1016/j.ultramic.2015.06.005] [Citation(s) in RCA: 14] [Impact Index Per Article: 1.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/11/2014] [Revised: 05/29/2015] [Accepted: 06/04/2015] [Indexed: 11/21/2022]
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49
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A short note on how to convert a conventional analytical TEM into an analytical Low Voltage TEM. Ultramicroscopy 2014; 145:94-7. [DOI: 10.1016/j.ultramic.2014.01.008] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/20/2013] [Revised: 11/29/2013] [Accepted: 01/10/2014] [Indexed: 11/19/2022]
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50
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Egerton R. Choice of operating voltage for a transmission electron microscope. Ultramicroscopy 2014; 145:85-93. [DOI: 10.1016/j.ultramic.2013.10.019] [Citation(s) in RCA: 77] [Impact Index Per Article: 7.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/27/2013] [Revised: 10/14/2013] [Accepted: 10/24/2013] [Indexed: 10/25/2022]
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