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For: Hujsak K, Myers BD, Roth E, Li Y, Dravid VP. Suppressing Electron Exposure Artifacts: An Electron Scanning Paradigm with Bayesian Machine Learning. Microsc Microanal 2016;22:778-788. [PMID: 27456711 DOI: 10.1017/s1431927616011417] [Citation(s) in RCA: 9] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/06/2023]
Number Cited by Other Article(s)
1
Long TJH, Holbrook W, Hufnagel TC, Mueller T. High-throughput determination of grain size distributions by EBSD with low-discrepancy sampling. J Microsc 2024;293:20-37. [PMID: 37990618 DOI: 10.1111/jmi.13247] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/02/2023] [Accepted: 11/16/2023] [Indexed: 11/23/2023]
2
Helminiak D, Hu H, Laskin J, Hye Ye D. Deep Learning Approach for Dynamic Sampling for Multichannel Mass Spectrometry Imaging. IEEE TRANSACTIONS ON COMPUTATIONAL IMAGING 2023;9:250-259. [PMID: 37251286 PMCID: PMC10210351 DOI: 10.1109/tci.2023.3248947] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/31/2023]
3
Ede JM. Adaptive partial scanning transmission electron microscopy with reinforcement learning. MACHINE LEARNING: SCIENCE AND TECHNOLOGY 2021. [DOI: 10.1088/2632-2153/abf5b6] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/11/2022]  Open
4
Evans AM, Strauss MJ, Corcos AR, Hirani Z, Ji W, Hamachi LS, Aguilar-Enriquez X, Chavez AD, Smith BJ, Dichtel WR. Two-Dimensional Polymers and Polymerizations. Chem Rev 2021;122:442-564. [PMID: 34852192 DOI: 10.1021/acs.chemrev.0c01184] [Citation(s) in RCA: 70] [Impact Index Per Article: 23.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/03/2023]
5
Helminiak D, Hu H, Laskin J, Ye DH. Deep Learning Approach for Dynamic Sparse Sampling for High-Throughput Mass Spectrometry Imaging. ACTA ACUST UNITED AC 2021;2021:2901-2907. [PMID: 34722959 DOI: 10.2352/issn.2470-1173.2021.15.coimg-290] [Citation(s) in RCA: 3] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/01/2022]
6
Ribet SM, Murthy AA, Roth EW, Dos Reis R, Dravid VP. Making the Most of your Electrons: Challenges and Opportunities in Characterizing Hybrid Interfaces with STEM. MATERIALS TODAY (KIDLINGTON, ENGLAND) 2021;50:100-115. [PMID: 35241968 PMCID: PMC8887695 DOI: 10.1016/j.mattod.2021.05.006] [Citation(s) in RCA: 6] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/04/2023]
7
Ede JM. Deep learning in electron microscopy. MACHINE LEARNING: SCIENCE AND TECHNOLOGY 2021. [DOI: 10.1088/2632-2153/abd614] [Citation(s) in RCA: 21] [Impact Index Per Article: 7.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/12/2022]  Open
8
Ede JM, Beanland R. Partial Scanning Transmission Electron Microscopy with Deep Learning. Sci Rep 2020;10:8332. [PMID: 32433582 PMCID: PMC7239858 DOI: 10.1038/s41598-020-65261-0] [Citation(s) in RCA: 24] [Impact Index Per Article: 6.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/12/2020] [Accepted: 04/28/2020] [Indexed: 11/09/2022]  Open
9
Hujsak KA, Roth EW, Kellogg W, Li Y, Dravid VP. High speed/low dose analytical electron microscopy with dynamic sampling. Micron 2018;108:31-40. [DOI: 10.1016/j.micron.2018.03.001] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/21/2017] [Revised: 03/02/2018] [Accepted: 03/02/2018] [Indexed: 10/17/2022]
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