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Kennedy N, Garvey S, Maccioni B, Eaton L, Nolan M, Duffy R, Meaney F, Kennedy M, Holmes JD, Long B. Monolayer Doping of Germanium with Arsenic: A New Chemical Route to Achieve Optimal Dopant Activation. LANGMUIR : THE ACS JOURNAL OF SURFACES AND COLLOIDS 2020; 36:9993-10002. [PMID: 32787047 DOI: 10.1021/acs.langmuir.0c00408] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
Abstract
Reported here is a new chemical route for the wet chemical functionalization of germanium (Ge), whereby arsanilic acid is covalently bound to a chlorine (Cl)-terminated surface. This new route is used to deliver high concentrations of arsenic (As) dopants to Ge, via monolayer doping (MLD). Doping, or the introduction of Group III or Group V impurity atoms into the crystal lattice of Group IV semiconductors, is essential to allow control over the electronic properties of the material to enable transistor devices to be switched on and off. MLD is a diffusion-based method for the introduction of these impurity atoms via surface-bound molecules, which offers a nondestructive alternative to ion implantation, the current industry doping standard, making it suitable for sub-10 nm structures. Ge, given its higher carrier mobilities, is a leading candidate to replace Si as the channel material in future devices. Combining the new chemical route with the existing MLD process yields active carrier concentrations of dopants (>1 × 1019 atoms/cm3) that rival those of ion implantation. It is shown that the dose of dopant delivered to Ge is also controllable by changing the size of the precursor molecule. X-ray photoelectron spectroscopy (XPS) data and density functional theory (DFT) calculations support the formation of a covalent bond between the arsanilic acid and the Cl-terminated Ge surface. Atomic force microscopy (AFM) indicates that the integrity of the surface is maintained throughout the chemical procedure, and electrochemical capacitance voltage (ECV) data shows a carrier concentration of 1.9 × 1019 atoms/cm3 corroborated by sheet resistance measurements.
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Affiliation(s)
- Noel Kennedy
- School of Chemistry & AMBER Centre, University College Cork, Cork, T12 YN60, Ireland
| | - Shane Garvey
- School of Chemistry & AMBER Centre, University College Cork, Cork, T12 YN60, Ireland
- Tyndall National Institute, Lee Maltings, University College Cork, Cork, T12 R5CP, Ireland
| | - Barbara Maccioni
- Tyndall National Institute, Lee Maltings, University College Cork, Cork, T12 R5CP, Ireland
| | - Luke Eaton
- School of Chemistry & AMBER Centre, University College Cork, Cork, T12 YN60, Ireland
- Tyndall National Institute, Lee Maltings, University College Cork, Cork, T12 R5CP, Ireland
| | - Michael Nolan
- Tyndall National Institute, Lee Maltings, University College Cork, Cork, T12 R5CP, Ireland
| | - Ray Duffy
- Tyndall National Institute, Lee Maltings, University College Cork, Cork, T12 R5CP, Ireland
| | - Fintan Meaney
- Tyndall National Institute, Lee Maltings, University College Cork, Cork, T12 R5CP, Ireland
| | - Mary Kennedy
- Scientific Process Development Services, Tarbert, Kerry V31 X640, Ireland
| | - Justin D Holmes
- School of Chemistry & AMBER Centre, University College Cork, Cork, T12 YN60, Ireland
| | - Brenda Long
- School of Chemistry & AMBER Centre, University College Cork, Cork, T12 YN60, Ireland
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Yitzchaik S, Gutierrez R, Cuniberti G, Yerushalmi R. Diversification of Device Platforms by Molecular Layers: Hybrid Sensing Platforms, Monolayer Doping, and Modeling. LANGMUIR : THE ACS JOURNAL OF SURFACES AND COLLOIDS 2018; 34:14103-14123. [PMID: 30253096 DOI: 10.1021/acs.langmuir.8b02369] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/08/2023]
Abstract
Inorganic materials such as semiconductors, oxides, and metals are ubiquitous in a wide range of device technologies owing to the outstanding robustness and mature processing technologies available for such materials. However, while the important contribution of inorganic materials to the advancement of device technologies has been well established for decades, organic-inorganic hybrid device systems, which merge molecular functionalities with inorganic platforms, represent a newer domain that is rapidly evolving at an increasing pace. Such devices benefit from the great versatility and flexibility of the organic building blocks merged with the robustness of the inorganic platforms. Given the overwhelming wealth of literature covering various approaches for modifying and using inorganic devices, this feature article selectively highlights some of the advances made in the context of the diversification of devices by surface chemistry. Particular attention is given to oxide-semiconductor systems and metallic surfaces modified with organic monolayers. The inorganic device components, such as semiconductors, metals, and oxides, are modified by organic monolayers, which may serve as either active, static, or sacrificial components. We portray research directions within the broader field of organic-inorganic hybrid device systems that can be viewed as specific examples of the potential of such hybrid device systems given their comprehensive capabilities of design and diversification. Monolayer doping techniques where sacrificial organic monolayers are introduced into semiconducting elements are reviewed as a specific case, together with associated requirements for nanosystems, devices, and sensors for controlling doping levels and doping profiles on the nanometric scale. Another series of examples of the flexibility provided by the marriage of organic functional monolayers and inorganic device components are represented by a new class of biosensors, where the organic layer functionality is exploited in a functioning device for sensing. Considerations for relying on oxide-terminated semiconductors rather than the pristine semiconductor material as a platform both for processing and sensing are discussed. Finally, we cover aspects related to the use of various theoretical and computational approaches to model organic-inorganic systems. The main objectives of the topics covered here are (i) to present the advances made in each respective domain and (ii) to provide a comprehensive view of the potential uses of organic monolayers and self-assembly processes in the rapidly evolving field of molecular-inorganic hybrid device platforms and processing methodologies. The directions highlighted here provide a perspective on a future, not yet fully realized, integrated approach where organic monolayers are combined with inorganic platforms in order to obtain versatile, robust, and flexible systems with enhanced capabilities.
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Affiliation(s)
- Shlomo Yitzchaik
- Institute of Chemistry and the Center for Nanoscience and Nanotechnology , The Hebrew University of Jerusalem , Edmond J. Safra Campus , Givat Ram Jerusalem , 91904 Israel
| | | | | | - Roie Yerushalmi
- Institute of Chemistry and the Center for Nanoscience and Nanotechnology , The Hebrew University of Jerusalem , Edmond J. Safra Campus , Givat Ram Jerusalem , 91904 Israel
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Kennedy N, Duffy R, Eaton L, O’Connell D, Monaghan S, Garvey S, Connolly J, Hatem C, Holmes JD, Long B. Phosphorus monolayer doping (MLD) of silicon on insulator (SOI) substrates. BEILSTEIN JOURNAL OF NANOTECHNOLOGY 2018; 9:2106-2113. [PMID: 30202683 PMCID: PMC6122086 DOI: 10.3762/bjnano.9.199] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 02/14/2018] [Accepted: 07/22/2018] [Indexed: 06/08/2023]
Abstract
This paper details the application of phosphorus monolayer doping of silicon on insulator substrates. There have been no previous publications dedicated to the topic of MLD on SOI, which allows for the impact of reduced substrate dimensions to be probed. The doping was done through functionalization of the substrates with chemically bound allyldiphenylphosphine dopant molecules. Following functionalization, the samples were capped and annealed to enable the diffusion of dopant atoms into the substrate and their activation. Electrical and material characterisation was carried out to determine the impact of MLD on surface quality and activation results produced by the process. MLD has proven to be highly applicable to SOI substrates producing doping levels in excess of 1 × 1019 cm-3 with minimal impact on surface quality. Hall effect data proved that reducing SOI dimensions from 66 to 13 nm lead to an increase in carrier concentration values due to the reduced volume available to the dopant for diffusion. Dopant trapping was found at both Si-SiO2 interfaces and will be problematic when attempting to reach doping levels achieved by rival techniques.
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Affiliation(s)
- Noel Kennedy
- School of Chemistry, University College Cork, Cork, Ireland
| | - Ray Duffy
- Tyndall National Institute, Lee Maltings, Cork, Ireland
| | - Luke Eaton
- School of Chemistry, University College Cork, Cork, Ireland
| | - Dan O’Connell
- Tyndall National Institute, Lee Maltings, Cork, Ireland
| | | | - Shane Garvey
- Tyndall National Institute, Lee Maltings, Cork, Ireland
| | | | - Chris Hatem
- Applied Materials, Gloucester, Massachusetts, USA
| | - Justin D Holmes
- School of Chemistry, University College Cork, Cork, Ireland
- CRANN@AMBER, Trinity College Dublin, Dublin 2, Ireland
| | - Brenda Long
- School of Chemistry, University College Cork, Cork, Ireland
- Tyndall National Institute, Lee Maltings, Cork, Ireland
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