1
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Kinoshita K, Moriya R, Kawasaki S, Okazaki S, Onodera M, Zhang Y, Watanabe K, Taniguchi T, Sasagawa T, Machida T. Negative Differential Resistance Device with High Peak-to-Valley Ratio Realized by Subband Resonant Tunneling of Γ-Valley Carriers in WSe 2/ h-BN/WSe 2 Junctions. ACS NANO 2024; 18:28968-28976. [PMID: 39396194 DOI: 10.1021/acsnano.4c09569] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 10/14/2024]
Abstract
Resonant tunneling diodes (RTDs) are a core technology in III-V semiconductor devices. The realization of high-performance RTD using two-dimensional (2D) materials has been long awaited, but it has yet to be accomplished. To this end, we investigate a range of WSe2/h-BN/WSe2 RTD devices by varying the number of layers of source and drain WSe2. The highest peak-to-valley ratio (PVR) is demonstrated in the three-layer (3L) WSe2/h-BN/1-layer (1L) WSe2 structure. The observed PVR values of 63.6 at 2 K and 16.2 at 300 K are the highest among the 2D material-based RTDs reported to date. Our results indicate the two key conditions to achieve high PVR: (1) resonant tunneling should occur between the Γ-point bands of the source and drain electrodes, and (2) the Γ-point bands contributing to the resonant tunneling should be energetically separated from the other bands. Our results provide an important step to outperform III-V semiconductor RTDs with 2D material-based RTDs.
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Affiliation(s)
- Kei Kinoshita
- Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro ,Tokyo153-8505, Japan
| | - Rai Moriya
- Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro ,Tokyo153-8505, Japan
| | - Seiya Kawasaki
- Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro ,Tokyo153-8505, Japan
| | - Shota Okazaki
- Laboratory for Materials and Structures, Tokyo Institute of Technology, 4259 Nagatsuta, Yokohama, Kanagawa 226-8501, Japan
| | - Momoko Onodera
- Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro ,Tokyo153-8505, Japan
| | - Yijin Zhang
- Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro ,Tokyo153-8505, Japan
| | - Kenji Watanabe
- Research Center for Electronic and Optical Materials, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan
| | - Takashi Taniguchi
- International Center for Materials Nanoarchitectonics, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan
| | - Takao Sasagawa
- Laboratory for Materials and Structures, Tokyo Institute of Technology, 4259 Nagatsuta, Yokohama, Kanagawa 226-8501, Japan
- Research Center for Autonomous Systems Materialogy, Tokyo Institute of Technology, 4259 Nagatsuta, Yokohama, Kanagawa 226-8501, Japan
| | - Tomoki Machida
- Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro ,Tokyo153-8505, Japan
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Dragoman M, Dinescu A, Aldrigo M, Dragoman D. Quantum Graphene Asymmetric Devices for Harvesting Electromagnetic Energy. NANOMATERIALS (BASEL, SWITZERLAND) 2024; 14:1114. [PMID: 38998720 PMCID: PMC11243634 DOI: 10.3390/nano14131114] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/30/2024] [Revised: 06/26/2024] [Accepted: 06/27/2024] [Indexed: 07/14/2024]
Abstract
We present here the fabrication at the wafer level and the electrical performance of two types of graphene diodes: ballistic trapezoidal-shaped graphene diodes and lateral tunneling graphene diodes. In the case of the ballistic trapezoidal-shaped graphene diode, we observe a large DC current of 200 µA at a DC bias voltage of ±2 V and a large voltage responsivity of 2000 v/w, while in the case of the lateral tunneling graphene diodes, we obtain a DC current of 1.5 mA at a DC bias voltage of ±2 V, with a voltage responsivity of 3000 v/w. An extended analysis of the defects produced during the fabrication process and their influences on the graphene diode performance is also presented.
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Affiliation(s)
- Mircea Dragoman
- National Institute for Research and Development in Microtechnologies (IMT), Strada Erou Iancu Nicolae 126A, 077190 Voluntari, Romania
| | - Adrian Dinescu
- National Institute for Research and Development in Microtechnologies (IMT), Strada Erou Iancu Nicolae 126A, 077190 Voluntari, Romania
| | - Martino Aldrigo
- National Institute for Research and Development in Microtechnologies (IMT), Strada Erou Iancu Nicolae 126A, 077190 Voluntari, Romania
| | - Daniela Dragoman
- Physics Faculty, University of Bucharest, P.O. Box MG-11, 077125 Bucharest, Romania
- Academy of Romanian Scientists, Strada Ilfov, Nr. 3, 050044 Bucharest, Romania
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3
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Zhang Z, Zhang B, Wang Y, Wang M, Zhang Y, Li H, Zhang J, Song A. Toward High-Peak-to-Valley-Ratio Graphene Resonant Tunneling Diodes. NANO LETTERS 2023; 23:8132-8139. [PMID: 37668256 PMCID: PMC10510586 DOI: 10.1021/acs.nanolett.3c02281] [Citation(s) in RCA: 4] [Impact Index Per Article: 4.0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/19/2023] [Revised: 08/27/2023] [Indexed: 09/06/2023]
Abstract
The resonant tunneling diode (RTD) is one of the very few room-temperature-operating quantum devices to date that is able to exhibit negative differential resistance. However, the reported key figure of merit, the current peak-to-valley ratio (PVR), of graphene RTDs has been up to only 3.9 at room temperature thus far. This remains very puzzling, given the atomically flat interfaces of the 2D materials. By varying the active area and perimeter of RTDs based on a graphene/hexagonal boron nitride/graphene heterostructure, we discovered that the edge doping can play a dominant role in determining the resonant tunneling, and a large area-to-perimeter ratio is necessary to obtain a high PVR. The understanding enables establishing a novel design rule and results in a PVR of 14.9, which is at least a factor of 3.8 higher than previously reported graphene RTDs. Furthermore, a theory is developed allowing extraction of the edge doping depth for the first time.
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Affiliation(s)
- Zihao Zhang
- Shandong
Technology Center of Nanodevices and Integration, School of Microelectronics, Shandong University, Jinan 250100, China
| | - Baoqing Zhang
- Shandong
Technology Center of Nanodevices and Integration, School of Microelectronics, Shandong University, Jinan 250100, China
| | - Yiming Wang
- Shandong
Technology Center of Nanodevices and Integration, School of Microelectronics, Shandong University, Jinan 250100, China
| | - Mingyang Wang
- Shandong
Technology Center of Nanodevices and Integration, School of Microelectronics, Shandong University, Jinan 250100, China
| | - Yifei Zhang
- Shandong
Technology Center of Nanodevices and Integration, School of Microelectronics, Shandong University, Jinan 250100, China
| | - Hu Li
- Shandong
Technology Center of Nanodevices and Integration, School of Microelectronics, Shandong University, Jinan 250100, China
| | - Jiawei Zhang
- Shandong
Technology Center of Nanodevices and Integration, School of Microelectronics, Shandong University, Jinan 250100, China
- Suzhou
Research Institute, Shandong University, Suzhou 215123, China
| | - Aimin Song
- Shandong
Technology Center of Nanodevices and Integration, School of Microelectronics, Shandong University, Jinan 250100, China
- Department
of Electrical and Electronic Engineering, University of Manchester, Manchester M13 9PL, United
Kingdom
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4
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Ma Z, Zhang Q, Tao L, Wang Y, Sando D, Zhou J, Guo Y, Lord M, Zhou P, Ruan Y, Wang Z, Hamilton A, Gruverman A, Tsymbal EY, Zhang T, Valanoor N. A Room-Temperature Ferroelectric Resonant Tunneling Diode. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2022; 34:e2205359. [PMID: 35801685 DOI: 10.1002/adma.202205359] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/14/2022] [Indexed: 06/15/2023]
Abstract
Resonant tunneling is a quantum-mechanical effect in which electron transport is controlled by the discrete energy levels within a quantum-well (QW) structure. A ferroelectric resonant tunneling diode (RTD) exploits the switchable electric polarization state of the QW barrier to tune the device resistance. Here, the discovery of robust room-temperature ferroelectric-modulated resonant tunneling and negative differential resistance (NDR) behaviors in all-perovskite-oxide BaTiO3 /SrRuO3 /BaTiO3 QW structures is reported. The resonant current amplitude and voltage are tunable by the switchable polarization of the BaTiO3 ferroelectric with the NDR ratio modulated by ≈3 orders of magnitude and an OFF/ON resistance ratio exceeding a factor of 2 × 104 . The observed NDR effect is explained an energy bandgap between Ru-t2g and Ru-eg orbitals driven by electron-electron correlations, as follows from density functional theory calculations. This study paves the way for ferroelectric-based quantum-tunneling devices in future oxide electronics.
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Affiliation(s)
- Zhijun Ma
- Ministry of Education Key Laboratory for the Synthesis and Application of Organic Functional Molecules, Ministry of Education Key Laboratory for the Green Preparation and Application of Functional Materials, Hubei University, Wuhan, 430062, P. R. China
- School of Materials Science and Engineering, University of New South Wales, Sydney, 2052, Australia
| | - Qi Zhang
- School of Materials Science and Engineering, University of New South Wales, Sydney, 2052, Australia
- The Australian Research Council Centre for Excellence in Future Low Energy Electronics Technologies, UNSW, Sydney, 2052, Australia
| | - Lingling Tao
- Department of Physics and Astronomy and Nebraska Center for Materials and Nanoscience, University of Nebraska, Lincoln, NE, 68588, USA
| | - Yihao Wang
- Ministry of Education Key Laboratory for the Synthesis and Application of Organic Functional Molecules, Ministry of Education Key Laboratory for the Green Preparation and Application of Functional Materials, Hubei University, Wuhan, 430062, P. R. China
| | - Daniel Sando
- School of Materials Science and Engineering, University of New South Wales, Sydney, 2052, Australia
- The Australian Research Council Centre for Excellence in Future Low Energy Electronics Technologies, UNSW, Sydney, 2052, Australia
| | - Jinling Zhou
- School of Materials Science and Engineering, University of New South Wales, Sydney, 2052, Australia
- The Australian Research Council Centre for Excellence in Future Low Energy Electronics Technologies, UNSW, Sydney, 2052, Australia
| | - Yizhong Guo
- Institute of Microstructure and Properties of Advanced Materials, Beijing University of Technology, Beijing, 100124, P. R. China
| | - Michael Lord
- School of Materials Science and Engineering, University of New South Wales, Sydney, 2052, Australia
- The Australian Research Council Centre for Excellence in Future Low Energy Electronics Technologies, UNSW, Sydney, 2052, Australia
| | - Peng Zhou
- Ministry of Education Key Laboratory for the Synthesis and Application of Organic Functional Molecules, Ministry of Education Key Laboratory for the Green Preparation and Application of Functional Materials, Hubei University, Wuhan, 430062, P. R. China
| | - Yongqi Ruan
- Ministry of Education Key Laboratory for the Synthesis and Application of Organic Functional Molecules, Ministry of Education Key Laboratory for the Green Preparation and Application of Functional Materials, Hubei University, Wuhan, 430062, P. R. China
| | - Zhiwei Wang
- Ministry of Education Key Laboratory for the Synthesis and Application of Organic Functional Molecules, Ministry of Education Key Laboratory for the Green Preparation and Application of Functional Materials, Hubei University, Wuhan, 430062, P. R. China
| | - Alex Hamilton
- The Australian Research Council Centre for Excellence in Future Low Energy Electronics Technologies, UNSW, Sydney, 2052, Australia
- School of Physics, University of New South Wales, Sydney, 2052, Australia
| | - Alexei Gruverman
- Department of Physics and Astronomy and Nebraska Center for Materials and Nanoscience, University of Nebraska, Lincoln, NE, 68588, USA
| | - Evgeny Y Tsymbal
- Department of Physics and Astronomy and Nebraska Center for Materials and Nanoscience, University of Nebraska, Lincoln, NE, 68588, USA
| | - Tianjin Zhang
- Ministry of Education Key Laboratory for the Synthesis and Application of Organic Functional Molecules, Ministry of Education Key Laboratory for the Green Preparation and Application of Functional Materials, Hubei University, Wuhan, 430062, P. R. China
| | - Nagarajan Valanoor
- School of Materials Science and Engineering, University of New South Wales, Sydney, 2052, Australia
- The Australian Research Council Centre for Excellence in Future Low Energy Electronics Technologies, UNSW, Sydney, 2052, Australia
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5
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Kinoshita K, Moriya R, Okazaki S, Zhang Y, Masubuchi S, Watanabe K, Taniguchi T, Sasagawa T, Machida T. Resonant Tunneling between Quantized Subbands in van der Waals Double Quantum Well Structure Based on Few-Layer WSe 2. NANO LETTERS 2022; 22:4640-4645. [PMID: 35658492 DOI: 10.1021/acs.nanolett.2c00396] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/15/2023]
Abstract
We demonstrate van der Waals double quantum well (vDQW) devices based on few-layer WSe2 quantum wells and a few-layer h-BN tunnel barrier. Due to the strong out-of-plane confinement, an exfoliated WSe2 exhibits quantized subband states at the Γ point in its valence band. Here, we report resonant tunneling and negative differential resistance in vDQW at room temperature owing to momentum- and energy-conserved tunneling between the quantized subbands in each well. Compared to single quantum well (QW) devices with only one QW layer possessing quantized subbands, superior current peak-to-valley ratios were obtained for the DQWs. Our findings suggest a new direction for utilizing few-layer-thick transition metal dichalcogenides in subband QW devices, bridging the gap between two-dimensional materials and state-of-the-art semiconductor QW electronics.
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Affiliation(s)
- Kei Kinoshita
- Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro, Tokyo 153-8505, Japan
| | - Rai Moriya
- Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro, Tokyo 153-8505, Japan
| | - Shota Okazaki
- Laboratory for Materials and Structures, Tokyo Institute of Technology, 4259 Nagatsuta, Yokohama, Kanagawa 226-8503, Japan
| | - Yijin Zhang
- Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro, Tokyo 153-8505, Japan
| | - Satoru Masubuchi
- Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro, Tokyo 153-8505, Japan
| | - Kenji Watanabe
- Research Center for Functional Materials, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan
| | - Takashi Taniguchi
- Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro, Tokyo 153-8505, Japan
- International Center for Materials Nanoarchitectonics, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan
| | - Takao Sasagawa
- Laboratory for Materials and Structures, Tokyo Institute of Technology, 4259 Nagatsuta, Yokohama, Kanagawa 226-8503, Japan
| | - Tomoki Machida
- Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro, Tokyo 153-8505, Japan
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6
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Francaviglia L, Zipfel J, Carlstroem J, Sridhar S, Riminucci F, Blach D, Wong E, Barnard E, Watanabe K, Taniguchi T, Weber-Bargioni A, Ogletree DF, Aloni S, Raja A. Optimizing cathodoluminescence microscopy of buried interfaces through nanoscale heterostructure design. NANOSCALE 2022; 14:7569-7578. [PMID: 35502865 DOI: 10.1039/d1nr08082b] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/14/2023]
Abstract
Mapping the optical response of buried interfaces with nanoscale spatial resolution is crucial in several systems where an active component is embedded within a buffer layer for structural or functional reasons. Here, we demonstrate that cathodoluminescence microscopy is not only an ideal tool for visualizing buried interfaces, but can be optimized through heterostructure design. We focus on the prototypical system of monolayers of semiconducting transition metal dichalcogenide sandwiched between hexagonal boron nitride layers. We leverage the encapsulating layers to tune the nanoscale spatial resolution achievable in cathodoluminescence mapping while also controlling the brightness of the emission. Thicker encapsulation layers result in a brighter emission while thinner ones enhance the spatial resolution at the expense of the signal intensity. We find that a favorable trade-off between brightness and resolution is achievable up to about ∼100 nm of total encapsulation. Beyond this value, the brightness gain is marginal, while the spatial resolution enters a regime that is achievable by diffraction-limited optical microscopy. By preparing samples of varying encapsulation thickness, we are able to determine a surprisingly isotropic exciton diffusion length of >200 nm within the hexagonal boron nitride which is the dominant factor that determines spatial resolution. We further demonstrate that we can overcome the exciton diffusion-limited spatial resolution by using spectrally distinct signals, which is the case for nanoscale inhomogeneities within monolayer transition metal dichalcogenides.
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Affiliation(s)
- Luca Francaviglia
- Molecular Foundry, Lawrence Berkeley National Laboratory, 1 Cyclotron Rd., Berkeley, CA, USA.
| | - Jonas Zipfel
- Molecular Foundry, Lawrence Berkeley National Laboratory, 1 Cyclotron Rd., Berkeley, CA, USA.
| | - Johan Carlstroem
- Molecular Foundry, Lawrence Berkeley National Laboratory, 1 Cyclotron Rd., Berkeley, CA, USA.
| | - Sriram Sridhar
- Molecular Foundry, Lawrence Berkeley National Laboratory, 1 Cyclotron Rd., Berkeley, CA, USA.
- Department of Materials Science and Engineering, University of California, Berkeley, CA 94720, USA
| | - Fabrizio Riminucci
- Molecular Foundry, Lawrence Berkeley National Laboratory, 1 Cyclotron Rd., Berkeley, CA, USA.
- Dipartimento di Fisica, Università del Salento, Strada Provinciale Lecce-Monteroni, Campus Ecotekne, Lecce, 73100, Italy
| | - Daria Blach
- Molecular Foundry, Lawrence Berkeley National Laboratory, 1 Cyclotron Rd., Berkeley, CA, USA.
- Department of Chemistry, Purdue University, West Lafayette, IN 47909, USA
| | - Ed Wong
- Molecular Foundry, Lawrence Berkeley National Laboratory, 1 Cyclotron Rd., Berkeley, CA, USA.
| | - Edward Barnard
- Molecular Foundry, Lawrence Berkeley National Laboratory, 1 Cyclotron Rd., Berkeley, CA, USA.
| | - Kenji Watanabe
- Research Center for Functional Materials, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan
| | - Takashi Taniguchi
- International Center for Materials Nanoarchitectonics, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan
| | | | - D Frank Ogletree
- Molecular Foundry, Lawrence Berkeley National Laboratory, 1 Cyclotron Rd., Berkeley, CA, USA.
| | - Shaul Aloni
- Molecular Foundry, Lawrence Berkeley National Laboratory, 1 Cyclotron Rd., Berkeley, CA, USA.
| | - Archana Raja
- Molecular Foundry, Lawrence Berkeley National Laboratory, 1 Cyclotron Rd., Berkeley, CA, USA.
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7
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Jo SB, Kang J, Cho JH. Recent Advances on Multivalued Logic Gates: A Materials Perspective. ADVANCED SCIENCE (WEINHEIM, BADEN-WURTTEMBERG, GERMANY) 2021; 8:2004216. [PMID: 33898193 PMCID: PMC8061388 DOI: 10.1002/advs.202004216] [Citation(s) in RCA: 20] [Impact Index Per Article: 6.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 11/03/2020] [Revised: 12/13/2020] [Indexed: 06/12/2023]
Abstract
The recent advancements in multivalued logic gates represent a rapid paradigm shift in semiconductor technology toward a new era of hyper Moore's law. Particularly, the significant evolution of materials is guiding multivalued logic systems toward a breakthrough gradually, whereby they are transcending the limits of conventional binary logic systems in terms of all the essential figures of merit, i.e., power dissipation, operating speed, circuit complexity, and, of course, the level of the integration. In this review, recent advances in the field of multivalued logic gates based on emerging materials to provide a comprehensive guideline for possible future research directions are reviewed. First, an overview of the design criteria and figures of merit for multivalued logic gates is presented, and then advancements in various emerging nanostructured materials-ranging from 0D quantum dots to multidimensional heterostructures-are summarized and these materials in terms of device design criteria are assessed. The current technological challenges and prospects of multivalued logic devices are also addressed and major research trends are elucidated.
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Affiliation(s)
- Sae Byeok Jo
- Department of Chemical and Biomolecular EngineeringYonsei UniversitySeoul03722South Korea
| | - Joohoon Kang
- School of Advanced Materials Science and EngineeringSungkyunkwan University (SKKU)Suwon16419Republic of Korea
| | - Jeong Ho Cho
- Department of Chemical and Biomolecular EngineeringYonsei UniversitySeoul03722South Korea
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8
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Andreev M, Choi JW, Koo J, Kim H, Jung S, Kim KH, Park JH. Negative differential transconductance device with a stepped gate dielectric for multi-valued logic circuits. NANOSCALE HORIZONS 2020; 5:1378-1385. [PMID: 32725030 DOI: 10.1039/d0nh00163e] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
Abstract
Multi-valued logic (MVL) technology is a promising approach for improving the data-handling capabilities and decreasing the power consumption of integrated circuits. This is especially attractive as conventional complementary metal-oxide-semiconductor technology is approaching its scaling and power density limits. Here, an ambipolar WSe2 field-effect transistor with two or more negative-differential-transconductance (NDT) regions in its transfer characteristic (NDTFET) is proposed for MVL applications of various radices. The operation and charge carrier transport mechanism of the NDTFET are studied first by Kelvin probe force microscopy, electrical, and capacitance-voltage measurements. Next, strategies for increasing the number of NDT regions and engineering the NDTFET transfer characteristic are discussed. Finally, the extensibility and tunability of our concept are demonstrated by adapting NDTFETs as core devices for ternary, quaternary, and quinary MVL inverters through simulations, where only WSe2 is employed as a channel material for all devices comprising the inverters. The MVL inverter operation principle and the mechanism of the multiple logic state formation are analyzed in detail. The proposed concept is practically verified by the fabrication of a ternary inverter.
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Affiliation(s)
- Maksim Andreev
- Department of Electrical and Computer Engineering, Sungkyunkwan University, Suwon 16419, Korea.
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9
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Mahajan M, Majumdar K. Gate- and Light-Tunable Negative Differential Resistance with High Peak Current Density in 1T-TaS 2/2H-MoS 2 T-Junction. ACS NANO 2020; 14:6803-6811. [PMID: 32406676 DOI: 10.1021/acsnano.0c00331] [Citation(s) in RCA: 11] [Impact Index Per Article: 2.8] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
Abstract
Metal-based electronics is attractive for fast and radiation-hard electronic circuits and remains one of the long-standing goals for researchers. The emergence of 1T-TaS2, a layered material exhibiting strong charge density wave (CDW)-driven resistivity switching that can be controlled by an external stimulus such as electric field and optical pulses, has triggered a renewed interest in metal-based electronics. Here we demonstrate a negative differential resistor (NDR) using electrically driven CDW phase transition in an asymmetrically designed T-junction made up of 1T-TaS2/2H-MoS2 van der Waals heterojunction. The principle of operation of the proposed device is governed by majority carrier transport and is distinct from usual NDR devices employing tunneling of carriers; thus it avoids the bottleneck of weak tunneling efficiency in van der Waals heterojunctions. Consequently, we achieve a peak current density in excess of 105 nA μm-2, which is about 2 orders of magnitude higher than that obtained in typical layered material based NDR implementations. The peak current density can be effectively tuned by an external gate voltage as well as photogating. The device is robust against ambiance-induced degradation, and the characteristics repeat in multiple measurements over a period of more than a month. The findings are attractive for the implementation of active metal-based functional circuits.
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Affiliation(s)
- Mehak Mahajan
- Department of Electrical Communication Engineering, Indian Institute of Science, Bangalore 560012, India
| | - Kausik Majumdar
- Department of Electrical Communication Engineering, Indian Institute of Science, Bangalore 560012, India
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10
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Simbulan KBC, Chen PC, Lin YY, Lan YW. A Standard and Reliable Method to Fabricate Two-Dimensional Nanoelectronics. J Vis Exp 2018. [PMID: 30222144 DOI: 10.3791/57885] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/31/2022] Open
Abstract
Two-dimensional (2D) materials have attracted huge attention due to their unique properties and potential applications. Since wafer scale synthesis of 2D materials is still in nascent stages, scientists cannot fully rely on traditional semiconductor techniques for related research. Delicate processes from locating the materials to electrode definition need to be well controlled. In this article, a universal fabrication protocol required in manufacturing nanoscale electronics, such as 2D quasi-heterojunction bipolar transistors (Q-HBT), and 2D back-gated transistors are demonstrated. This protocol includes the determination of material position, electron beam lithography (EBL), metal electrode definition, et al. A step by step narrative of the fabrication procedures for these devices are also presented. Furthermore, results show that each of the fabricated devices has achieved high performance with high repeatability. This work reveals a comprehensive description of process flow for preparing 2D nano-electronics, enables the research groups to access this information, and pave the way toward future electronics.
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Affiliation(s)
| | - Po-Chun Chen
- Department of Physics, National Taiwan Normal University; National Applied Research Laboratories (NARL), National Nano Device Laboratories (NDL)
| | - Yun-Yan Lin
- Department of Physics, National Taiwan Normal University; National Applied Research Laboratories (NARL), National Nano Device Laboratories (NDL)
| | - Yann-Wen Lan
- Department of Physics, National Taiwan Normal University; National Applied Research Laboratories (NARL), National Nano Device Laboratories (NDL);
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11
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Najmaei S, Neupane MR, Nichols BM, Burke RA, Mazzoni AL, Chin ML, Rhodes DA, Balicas L, Franklin AD, Dubey M. Cross-Plane Carrier Transport in Van der Waals Layered Materials. SMALL (WEINHEIM AN DER BERGSTRASSE, GERMANY) 2018; 14:e1703808. [PMID: 29659147 DOI: 10.1002/smll.201703808] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 11/01/2017] [Revised: 01/25/2018] [Indexed: 06/08/2023]
Abstract
The mechanisms of carrier transport in the cross-plane crystal orientation of transition metal dichalcogenides are examined. The study of in-plane electronic properties of these van der Waals compounds has been the main research focus in recent years. However, the distinctive physical anisotropies, short-channel physics, and tunability of cross layer interactions can make the study of their electronic properties along the out-of-plane crystal orientation valuable. Here, the out-of-plane carrier transport mechanisms in niobium diselenide and hafnium disulfide are explored as two broadly different representative materials. Temperature-dependent current-voltage measurements are preformed to examine the mechanisms involved. First principles simulations and a tunneling model are used to understand these results and quantify the barrier height and hopping distance properties. Using Raman spectroscopy, the thermal response of the chemical bonds is directly explored and the insight into the van der Waals gap properties is acquired. These results indicate that the distinct cross-plane carrier transport characteristics of the two materials are a result of material thermal properties and thermally mediated transport of carriers through the van der Waals gaps. Exploring the cross-plane electron transport, the exciting physics involved is unraveled and potential new avenues for the electronic applications of van der Waals layers are inspired.
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Affiliation(s)
- Sina Najmaei
- Sensors and Electron Devices Directorate, United States Army Research Laboratory, 2800 Powder Mill Road, Adelphi, MD, 20783, USA
| | - Mahesh R Neupane
- Sensors and Electron Devices Directorate, United States Army Research Laboratory, 2800 Powder Mill Road, Adelphi, MD, 20783, USA
| | - Barbara M Nichols
- Sensors and Electron Devices Directorate, United States Army Research Laboratory, 2800 Powder Mill Road, Adelphi, MD, 20783, USA
| | - Robert A Burke
- Sensors and Electron Devices Directorate, United States Army Research Laboratory, 2800 Powder Mill Road, Adelphi, MD, 20783, USA
- General Technical Services, LLC, 1451 Route 34 South-Suite 301, Wall Township, NJ, 07727, USA
| | - Alexander L Mazzoni
- Sensors and Electron Devices Directorate, United States Army Research Laboratory, 2800 Powder Mill Road, Adelphi, MD, 20783, USA
| | - Matthew L Chin
- Sensors and Electron Devices Directorate, United States Army Research Laboratory, 2800 Powder Mill Road, Adelphi, MD, 20783, USA
| | - Daniel A Rhodes
- National High Magnetic Field Laboratory, Florida State University, 1800 E. Paul Dirac Drive, Tallahassee, FL, 32310, USA
| | - Luis Balicas
- National High Magnetic Field Laboratory, Florida State University, 1800 E. Paul Dirac Drive, Tallahassee, FL, 32310, USA
| | - Aaron D Franklin
- Department of Electrical and Computer Engineering, Duke University, Durham, NC, 27708, USA
| | - Madan Dubey
- Sensors and Electron Devices Directorate, United States Army Research Laboratory, 2800 Powder Mill Road, Adelphi, MD, 20783, USA
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12
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Samadi M, Sarikhani N, Zirak M, Zhang H, Zhang HL, Moshfegh AZ. Group 6 transition metal dichalcogenide nanomaterials: synthesis, applications and future perspectives. NANOSCALE HORIZONS 2018; 3:90-204. [PMID: 32254071 DOI: 10.1039/c7nh00137a] [Citation(s) in RCA: 127] [Impact Index Per Article: 21.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
Abstract
Group 6 transition metal dichalcogenides (G6-TMDs), most notably MoS2, MoSe2, MoTe2, WS2 and WSe2, constitute an important class of materials with a layered crystal structure. Various types of G6-TMD nanomaterials, such as nanosheets, nanotubes and quantum dot nano-objects and flower-like nanostructures, have been synthesized. High thermodynamic stability under ambient conditions, even in atomically thin form, made nanosheets of these inorganic semiconductors a valuable asset in the existing library of two-dimensional (2D) materials, along with the well-known semimetallic graphene and insulating hexagonal boron nitride. G6-TMDs generally possess an appropriate bandgap (1-2 eV) which is tunable by size and dimensionality and changes from indirect to direct in monolayer nanosheets, intriguing for (opto)electronic, sensing, and solar energy harvesting applications. Moreover, rich intercalation chemistry and abundance of catalytically active edge sites make them promising for fabrication of novel energy storage devices and advanced catalysts. In this review, we provide an overview on all aspects of the basic science, physicochemical properties and characterization techniques as well as all existing production methods and applications of G6-TMD nanomaterials in a comprehensive yet concise treatment. Particular emphasis is placed on establishing a linkage between the features of production methods and the specific needs of rapidly growing applications of G6-TMDs to develop a production-application selection guide. Based on this selection guide, a framework is suggested for future research on how to bridge existing knowledge gaps and improve current production methods towards technological application of G6-TMD nanomaterials.
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Affiliation(s)
- Morasae Samadi
- Department of Physics, Sharif University of Technology, Tehran 11155-9161, Iran.
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13
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Nazir G, Khan MF, Aftab S, Afzal AM, Dastgeer G, Rehman MA, Seo Y, Eom J. Gate Tunable Transport in Graphene/MoS₂/(Cr/Au) Vertical Field-Effect Transistors. NANOMATERIALS 2017; 8:nano8010014. [PMID: 29283377 PMCID: PMC5791101 DOI: 10.3390/nano8010014] [Citation(s) in RCA: 14] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 11/11/2017] [Revised: 12/21/2017] [Accepted: 12/22/2017] [Indexed: 11/23/2022]
Abstract
Two-dimensional materials based vertical field-effect transistors have been widely studied due to their useful applications in industry. In the present study, we fabricate graphene/MoS2/(Cr/Au) vertical transistor based on the mechanical exfoliation and dry transfer method. Since the bottom electrode was made of monolayer graphene (Gr), the electrical transport in our Gr/MoS2/(Cr/Au) vertical transistors can be significantly modified by using back-gate voltage. Schottky barrier height at the interface between Gr and MoS2 can be modified by back-gate voltage and the current bias. Vertical resistance (Rvert) of a Gr/MoS2/(Cr/Au) transistor is compared with planar resistance (Rplanar) of a conventional lateral MoS2 field-effect transistor. We have also studied electrical properties for various thicknesses of MoS2 channels in both vertical and lateral transistors. As the thickness of MoS2 increases, Rvert increases, but Rplanar decreases. The increase of Rvert in the thicker MoS2 film is attributed to the interlayer resistance in the vertical direction. However, Rplanar shows a lower value for a thicker MoS2 film because of an excess of charge carriers available in upper layers connected directly to source/drain contacts that limits the conduction through layers closed to source/drain electrodes. Hence, interlayer resistance associated with these layers contributes to planer resistance in contrast to vertical devices in which all layers contribute interlayer resistance.
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Affiliation(s)
- Ghazanfar Nazir
- Department of Physics & Astronomy and Graphene Research Institute, Sejong University, Seoul 05006, Korea.
| | - Muhammad Farooq Khan
- Department of Physics & Astronomy and Graphene Research Institute, Sejong University, Seoul 05006, Korea.
| | - Sikandar Aftab
- Department of Physics & Astronomy and Graphene Research Institute, Sejong University, Seoul 05006, Korea.
| | - Amir Muhammad Afzal
- Department of Physics & Astronomy and Graphene Research Institute, Sejong University, Seoul 05006, Korea.
| | - Ghulam Dastgeer
- Department of Physics & Astronomy and Graphene Research Institute, Sejong University, Seoul 05006, Korea.
| | - Malik Abdul Rehman
- Department of Nanotechnology & Advanced Materials Engineering, Sejong University, Seoul 05006, Korea.
| | - Yongho Seo
- Department of Nanotechnology & Advanced Materials Engineering, Sejong University, Seoul 05006, Korea.
| | - Jonghwa Eom
- Department of Physics & Astronomy and Graphene Research Institute, Sejong University, Seoul 05006, Korea.
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14
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Schulman DS, Sebastian A, Buzzell D, Huang YT, Arnold AJ, Das S. Facile Electrochemical Synthesis of 2D Monolayers for High-Performance Thin-Film Transistors. ACS APPLIED MATERIALS & INTERFACES 2017; 9:44617-44624. [PMID: 29210272 DOI: 10.1021/acsami.7b14711] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/07/2023]
Abstract
In this paper, we report high-performance monolayer thin-film transistors (TFTs) based on a variety of two-dimensional layered semiconductors such as MoS2, WS2, and MoSe2 which were obtained from their corresponding bulk counterparts via an anomalous but high-yield and low-cost electrochemical corrosion process, also referred to as electro-ablation (EA), at room temperature. These monolayer TFTs demonstrated current ON-OFF ratios in excess of 107 along with ON currents of 120 μA/μm for MoS2, 40 μA/μm for WS2, and 40 μA/μm for MoSe2 which clearly outperform the existing TFT technologies. We found that these monolayers have larger Schottky barriers for electron injection compared to their multilayer counterparts, which is partially compensated by their superior electrostatics and ultra-thin tunnel barriers. We observed an Anderson type semiconductor-to-metal transition in these monolayers and also discussed possible scattering mechanisms that manifest in the temperature dependence of the electron mobility. Finally, our study suggests superior chemical stability and electronic integrity of monolayers even after being exposed to extreme electro-oxidation and corrosion processes which is promising for the implementation of such TFTs in harsh environment sensing. Overall, the EA process proves to be a facile synthesis route offering higher monolayer yields than mechanical exfoliation and lower cost and complexity than chemical vapor deposition methods.
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Affiliation(s)
| | | | | | - Yu-Ting Huang
- Department of Mechanical Engineering, University of Hong Kong , Pokfulam, Hong Kong
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15
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Bernardo-Gavito R, Bagci IE, Roberts J, Sexton J, Astbury B, Shokeir H, McGrath T, Noori YJ, Woodhead CS, Missous M, Roedig U, Young RJ. Extracting random numbers from quantum tunnelling through a single diode. Sci Rep 2017; 7:17879. [PMID: 29259286 PMCID: PMC5736612 DOI: 10.1038/s41598-017-18161-9] [Citation(s) in RCA: 12] [Impact Index Per Article: 1.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/12/2017] [Accepted: 12/06/2017] [Indexed: 11/09/2022] Open
Abstract
Random number generation is crucial in many aspects of everyday life, as online security and privacy depend ultimately on the quality of random numbers. Many current implementations are based on pseudo-random number generators, but information security requires true random numbers for sensitive applications like key generation in banking, defence or even social media. True random number generators are systems whose outputs cannot be determined, even if their internal structure and response history are known. Sources of quantum noise are thus ideal for this application due to their intrinsic uncertainty. In this work, we propose using resonant tunnelling diodes as practical true random number generators based on a quantum mechanical effect. The output of the proposed devices can be directly used as a random stream of bits or can be further distilled using randomness extraction algorithms, depending on the application.
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Affiliation(s)
| | - Ibrahim Ethem Bagci
- School of Computing and Communications, Lancaster University, Lancaster, LA1 4WA, UK
| | - Jonathan Roberts
- Physics Department, Lancaster University, Lancaster, LA1 4YB, UK
| | - James Sexton
- School of Electrical and Electronic Engineering, University of Manchester, Manchester, M13 9PL, UK
| | - Benjamin Astbury
- Physics Department, Lancaster University, Lancaster, LA1 4YB, UK
| | - Hamzah Shokeir
- Physics Department, Lancaster University, Lancaster, LA1 4YB, UK
| | - Thomas McGrath
- Physics Department, Lancaster University, Lancaster, LA1 4YB, UK
| | - Yasir J Noori
- Physics Department, Lancaster University, Lancaster, LA1 4YB, UK
| | | | - Mohamed Missous
- School of Electrical and Electronic Engineering, University of Manchester, Manchester, M13 9PL, UK
| | - Utz Roedig
- School of Computing and Communications, Lancaster University, Lancaster, LA1 4WA, UK
| | - Robert J Young
- Physics Department, Lancaster University, Lancaster, LA1 4YB, UK.
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16
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Gate-controlled reversible rectifying behaviour in tunnel contacted atomically-thin MoS 2 transistor. Nat Commun 2017; 8:970. [PMID: 29042545 PMCID: PMC5645421 DOI: 10.1038/s41467-017-01128-9] [Citation(s) in RCA: 54] [Impact Index Per Article: 7.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/10/2017] [Accepted: 08/21/2017] [Indexed: 11/08/2022] Open
Abstract
Atomically thin two-dimensional semiconducting materials integrated into van der Waals heterostructures have enabled architectures that hold great promise for next generation nanoelectronics. However, challenges still remain to enable their applications as compliant materials for integration in logic devices. Here, we devise a reverted stacking technique to intercalate a wrinkle-free boron nitride tunnel layer between MoS2 channel and source drain electrodes. Vertical tunnelling of electrons therefore makes it possible to suppress the Schottky barriers and Fermi level pinning, leading to homogeneous gate-control of the channel chemical potential across the bandgap edges. The observed features of ambipolar pn to np diode, which can be reversibly gate tuned, paves the way for future logic applications and high performance switches based on atomically thin semiconducting channel. Van der Waals heterostructures of atomically thin materials hold promise for nanoelectronics. Here, the authors demonstrate a reverted stacking fabrication method for heterostructures and devise a vertical tunnel-contacted MoS2 transistor, enabling gate tunable rectification and reversible pn to np diode behaviour.
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17
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Zheng S, So JK, Liu F, Liu Z, Zheludev N, Fan HJ. Giant Enhancement of Cathodoluminescence of Monolayer Transitional Metal Dichalcogenides Semiconductors. NANO LETTERS 2017; 17:6475-6480. [PMID: 28933857 DOI: 10.1021/acs.nanolett.7b03585] [Citation(s) in RCA: 26] [Impact Index Per Article: 3.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/08/2023]
Abstract
Monolayer two-dimensional transitional metal dichalcogenides, such as MoS2, WS2, and WSe2, are direct band gap semiconductors with large exciton binding energy. They attract growing attentions for optoelectronic applications including solar cells, photodetectors, light-emitting diodes and phototransistors, capacitive energy storage, photodynamic cancer therapy, and sensing on flexible platforms. While light-induced luminescence has been widely studied, luminescence induced by injection of free electrons could promise another important applications of these new materials. However, cathodoluminescence is inefficient due to the low cross-section of the electron-hole creating process in the monolayers. Here for the first time we show that cathodoluminescence of monolayer chalcogenide semiconductors can be evidently observed in a van der Waals heterostructure when the monolayer semiconductor is sandwiched between layers of hexagonal boron nitride (hBN) with higher energy gap. The emission intensity shows a strong dependence on the thicknesses of surrounding layers and the enhancement factor is more than 500-fold. Strain-induced exciton peak shift in the suspended heterostructure is also investigated by the cathodoluminescence spectroscopy. Our results demonstrate that MoS2, WS2, and WSe2 could be promising cathodoluminescent materials for applications in single-photon emitters, high-energy particle detectors, transmission electron microscope displays, surface-conduction electron-emitter, and field emission display technologies.
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Affiliation(s)
- Shoujun Zheng
- Centre for Disruptive Photonic Technologies, School of Physical and Mathematical Sciences and The Photonics Institute, Nanyang Technological University , Singapore 637371
| | - Jin-Kyu So
- Centre for Disruptive Photonic Technologies, School of Physical and Mathematical Sciences and The Photonics Institute, Nanyang Technological University , Singapore 637371
| | - Fucai Liu
- School of Materials Science and Engineering, Nanyang Technological University , 639798, Singapore
| | - Zheng Liu
- School of Materials Science and Engineering, Nanyang Technological University , 639798, Singapore
| | - Nikolay Zheludev
- Centre for Disruptive Photonic Technologies, School of Physical and Mathematical Sciences and The Photonics Institute, Nanyang Technological University , Singapore 637371
- Optoelectronics Research Centre and Centre for Photonic Metamaterials, University of Southampton , Southampton SO17 1BJ, United Kingdom
| | - Hong Jin Fan
- Centre for Disruptive Photonic Technologies, School of Physical and Mathematical Sciences and The Photonics Institute, Nanyang Technological University , Singapore 637371
- Division of Physics and Applied Physics, School of Physical and Mathematical Sciences, Nanyang Technological University , 637371, Singapore
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18
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Matis BR, Garces NY, Cleveland ER, Houston BH, Baldwin JW. Electronic Transport in Bilayer MoS 2 Encapsulated in HfO 2. ACS APPLIED MATERIALS & INTERFACES 2017; 9:27995-28001. [PMID: 28745878 DOI: 10.1021/acsami.7b04397] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/07/2023]
Abstract
The exact nature of the interface between a two-dimensional crystal and its environment can have a significant impact on the electronic transport within the crystal, and can place fundamental limitations on transistor performance and long-term functionality. Two-dimensional transition-metal dichalcogenides are a new class of transistor channel material with electronic properties that can be tailored through dielectric engineering of the material/environmental interface. Here, we report electrical transport measurements carried out in the insulating regime of bilayer molybdenum disulfide, which has been encapsulated within a high-κ hafnium oxide dielectric. Temperature- and carrier-density-dependent measurements show that for T < 130 K the transport is governed by resonant tunneling, and at T = 4.2 K the tunneling peak lineshape is well-fitted by a Lorentzian with an amplitude less than e2/h. Estimates of tunneling time give τ ∼ 1.2 ps corresponding to a frequency f ∼ 0.84 THz. The tunneling processes are observable up to T ∼ 190 K (more than a factor of 6 higher than that previously reported for MoS2 on SiO2) despite the onset of variable range hopping at T ∼ 130 K, demonstrating the coexistence of the two transport processes within the same temperature range. At constant temperature, varying the Fermi energy allows experimental access to each transport process. The results are interpreted in terms of an increase in charge carrier screening length and a decrease in electron-phonon coupling induced by the hafnium oxide. Our results represent the first demonstration of the intermediate tunneling-hopping transport regime in a two-dimensional material. The results suggest that interface engineering may be a macroscopic tool for controlling quantum transport within such materials as well as for increasing the operating temperatures for resonant-tunneling devices derived from such materials, with applications in high-frequency electronics and logic devices.
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Affiliation(s)
- Bernard R Matis
- Naval Research Laboratory , Code 7130, Washington, D.C. 20375, United States
| | - Nelson Y Garces
- Sotera Defense Solutions , Crofton, Maryland 21114, United States
| | - Erin R Cleveland
- Naval Research Laboratory , Code 6812, Washington, D.C. 20375, United States
| | - Brian H Houston
- Naval Research Laboratory , Code 7130, Washington, D.C. 20375, United States
| | - Jeffrey W Baldwin
- Naval Research Laboratory , Code 7130, Washington, D.C. 20375, United States
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19
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Shim J, Jo SH, Kim M, Song YJ, Kim J, Park JH. Light-Triggered Ternary Device and Inverter Based on Heterojunction of van der Waals Materials. ACS NANO 2017; 11:6319-6327. [PMID: 28609089 DOI: 10.1021/acsnano.7b02635] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/07/2023]
Abstract
Multivalued logic (MVL) devices/circuits have received considerable attention because the binary logic used in current Si complementary metal-oxide-semiconductor (CMOS) technology cannot handle the predicted information throughputs and energy demands of the future. To realize MVL, the conventional transistor platform needs to be redesigned to have two or more distinctive threshold voltages (VTHs). Here, we report a finding: the photoinduced drain current in graphene/WSe2 heterojunction transistors unusually decreases with increasing gate voltage under illumination, which we refer to as the light-induced negative differential transconductance (L-NDT) phenomenon. We also prove that such L-NDT phenomenon in specific bias ranges originates from a variable potential barrier at a graphene/WSe2 junction due to a gate-controllable graphene electrode. This finding allows us to conceive graphene/WSe2-based MVL logic circuits by using the ID-VG characteristics with two distinctive VTHs. Based on this finding, we further demonstrate a light-triggered ternary inverter circuit with three stable logical states (ΔVout of each state <0.05 V). Our study offers the pathway to substantialize MVL systems.
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Affiliation(s)
- Jaewoo Shim
- School of Electronic and Electrical Engineering and §SKKU Advanced Institute of Nanotechnology (SAINT), Sungkyunkwan University , Suwon 440-746, Korea
- Department of Mechanical Engineering and ∥Department of Materials Science and Engineering, Massachusetts Institute of Technology , Cambridge, Massachusetts 02139, United States
| | - Seo-Hyeon Jo
- School of Electronic and Electrical Engineering and §SKKU Advanced Institute of Nanotechnology (SAINT), Sungkyunkwan University , Suwon 440-746, Korea
- Department of Mechanical Engineering and ∥Department of Materials Science and Engineering, Massachusetts Institute of Technology , Cambridge, Massachusetts 02139, United States
| | - Minwoo Kim
- School of Electronic and Electrical Engineering and §SKKU Advanced Institute of Nanotechnology (SAINT), Sungkyunkwan University , Suwon 440-746, Korea
- Department of Mechanical Engineering and ∥Department of Materials Science and Engineering, Massachusetts Institute of Technology , Cambridge, Massachusetts 02139, United States
| | - Young Jae Song
- School of Electronic and Electrical Engineering and §SKKU Advanced Institute of Nanotechnology (SAINT), Sungkyunkwan University , Suwon 440-746, Korea
- Department of Mechanical Engineering and ∥Department of Materials Science and Engineering, Massachusetts Institute of Technology , Cambridge, Massachusetts 02139, United States
| | - Jeehwan Kim
- School of Electronic and Electrical Engineering and §SKKU Advanced Institute of Nanotechnology (SAINT), Sungkyunkwan University , Suwon 440-746, Korea
- Department of Mechanical Engineering and ∥Department of Materials Science and Engineering, Massachusetts Institute of Technology , Cambridge, Massachusetts 02139, United States
| | - Jin-Hong Park
- School of Electronic and Electrical Engineering and §SKKU Advanced Institute of Nanotechnology (SAINT), Sungkyunkwan University , Suwon 440-746, Korea
- Department of Mechanical Engineering and ∥Department of Materials Science and Engineering, Massachusetts Institute of Technology , Cambridge, Massachusetts 02139, United States
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20
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Shim J, Oh S, Kang DH, Jo SH, Ali MH, Choi WY, Heo K, Jeon J, Lee S, Kim M, Song YJ, Park JH. Phosphorene/rhenium disulfide heterojunction-based negative differential resistance device for multi-valued logic. Nat Commun 2016; 7:13413. [PMID: 27819264 PMCID: PMC5103069 DOI: 10.1038/ncomms13413] [Citation(s) in RCA: 152] [Impact Index Per Article: 19.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/26/2016] [Accepted: 09/26/2016] [Indexed: 12/12/2022] Open
Abstract
Recently, negative differential resistance devices have attracted considerable attention due to their folded current-voltage characteristic, which presents multiple threshold voltage values. Because of this remarkable property, studies associated with the negative differential resistance devices have been explored for realizing multi-valued logic applications. Here we demonstrate a negative differential resistance device based on a phosphorene/rhenium disulfide (BP/ReS2) heterojunction that is formed by type-III broken-gap band alignment, showing high peak-to-valley current ratio values of 4.2 and 6.9 at room temperature and 180 K, respectively. Also, the carrier transport mechanism of the BP/ReS2 negative differential resistance device is investigated in detail by analysing the tunnelling and diffusion currents at various temperatures with the proposed analytic negative differential resistance device model. Finally, we demonstrate a ternary inverter as a multi-valued logic application. This study of a two-dimensional material heterojunction is a step forward toward future multi-valued logic device research.
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Affiliation(s)
- Jaewoo Shim
- School of Electronic and Electrical Engineering, Sungkyunkwan University, Suwon 440-746, Korea
| | - Seyong Oh
- School of Electronic and Electrical Engineering, Sungkyunkwan University, Suwon 440-746, Korea
| | - Dong-Ho Kang
- School of Electronic and Electrical Engineering, Sungkyunkwan University, Suwon 440-746, Korea
| | - Seo-Hyeon Jo
- School of Electronic and Electrical Engineering, Sungkyunkwan University, Suwon 440-746, Korea
| | - Muhammad Hasnain Ali
- School of Electronic and Electrical Engineering, Sungkyunkwan University, Suwon 440-746, Korea
| | - Woo-Young Choi
- School of Electronic and Electrical Engineering, Sungkyunkwan University, Suwon 440-746, Korea
| | - Keun Heo
- Frontier Technology Lab, R&D Headquarters, SK Hynix Co. Ltd., Ichon 460-701, Korea
| | - Jaeho Jeon
- Sungkyunkwan University Advanced Institute of Nanotechnology, Sungkyunkwan University, Suwon 440-746, Korea
| | - Sungjoo Lee
- Sungkyunkwan University Advanced Institute of Nanotechnology, Sungkyunkwan University, Suwon 440-746, Korea
| | - Minwoo Kim
- Sungkyunkwan University Advanced Institute of Nanotechnology, Sungkyunkwan University, Suwon 440-746, Korea
| | - Young Jae Song
- Sungkyunkwan University Advanced Institute of Nanotechnology, Sungkyunkwan University, Suwon 440-746, Korea
| | - Jin-Hong Park
- School of Electronic and Electrical Engineering, Sungkyunkwan University, Suwon 440-746, Korea
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21
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Lan YW, Torres CM, Tsai SH, Zhu X, Shi Y, Li MY, Li LJ, Yeh WK, Wang KL. Atomic-Monolayer MoS 2 Band-to-Band Tunneling Field-Effect Transistor. SMALL (WEINHEIM AN DER BERGSTRASSE, GERMANY) 2016; 12:5676-5683. [PMID: 27594654 DOI: 10.1002/smll.201601310] [Citation(s) in RCA: 10] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/16/2016] [Revised: 07/20/2016] [Indexed: 06/06/2023]
Abstract
The experimental observation of band-to-band tunneling in novel tunneling field-effect transistors utilizing a monolayer of MoS2 as the conducting channel is demonstrated. Our results indicate that the strong gate-coupling efficiency enabled by two-dimensional materials, such as monolayer MoS2 , results in the direct manifestation of a band-to-band tunneling current and an ambipolar transport.
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Affiliation(s)
- Yann-Wen Lan
- National Nano Device Laboratories (NDL), National Applied Research Laboratories, Hsinchu, 30078, Taiwan.
- Department of Electrical Engineering, University of California at Los Angeles, Los Angeles, CA, 90095, USA.
| | - Carlos M Torres
- Department of Electrical Engineering, University of California at Los Angeles, Los Angeles, CA, 90095, USA.
| | - Shin-Hung Tsai
- Department of Electrical Engineering, University of California at Los Angeles, Los Angeles, CA, 90095, USA
| | - Xiaodan Zhu
- Department of Electrical Engineering, University of California at Los Angeles, Los Angeles, CA, 90095, USA
| | - Yumeng Shi
- Physical Sciences and Engineering Division, King Abdullah University of Science and Technology (KAUST), Thuwal, 23955-6900, Kingdom of Saudi Arabia
| | - Ming-Yang Li
- Physical Sciences and Engineering Division, King Abdullah University of Science and Technology (KAUST), Thuwal, 23955-6900, Kingdom of Saudi Arabia
- Research Center for Applied Sciences, Academia Sinica, Taipei, 10617, Taiwan
| | - Lain-Jong Li
- Physical Sciences and Engineering Division, King Abdullah University of Science and Technology (KAUST), Thuwal, 23955-6900, Kingdom of Saudi Arabia
| | - Wen-Kuan Yeh
- National Nano Device Laboratories (NDL), National Applied Research Laboratories, Hsinchu, 30078, Taiwan
- Department of Electrical Engineering, National University of Kaohsiung, Kaohsiung, 811, Taiwan
| | - Kang L Wang
- Department of Electrical Engineering, University of California at Los Angeles, Los Angeles, CA, 90095, USA.
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22
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Dual-mode operation of 2D material-base hot electron transistors. Sci Rep 2016; 6:32503. [PMID: 27581550 PMCID: PMC5007484 DOI: 10.1038/srep32503] [Citation(s) in RCA: 11] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/12/2016] [Accepted: 08/10/2016] [Indexed: 11/24/2022] Open
Abstract
Vertical hot electron transistors incorporating atomically-thin 2D materials, such as graphene or MoS2, in the base region have been proposed and demonstrated in the development of electronic and optoelectronic applications. To the best of our knowledge, all previous 2D material-base hot electron transistors only considered applying a positive collector-base potential (VCB > 0) as is necessary for the typical unipolar hot-electron transistor behavior. Here we demonstrate a novel functionality, specifically a dual-mode operation, in our 2D material-base hot electron transistors (e.g. with either graphene or MoS2 in the base region) with the application of a negative collector-base potential (VCB < 0). That is, our 2D material-base hot electron transistors can operate in either a hot-electron or a reverse-current dominating mode depending upon the particular polarity of VCB. Furthermore, these devices operate at room temperature and their current gains can be dynamically tuned by varying VCB. We anticipate our multi-functional dual-mode transistors will pave the way towards the realization of novel flexible 2D material-based high-density and low-energy hot-carrier electronic applications.
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23
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Torres CM, Lan YW, Zeng C, Chen JH, Kou X, Navabi A, Tang J, Montazeri M, Adleman JR, Lerner MB, Zhong YL, Li LJ, Chen CD, Wang KL. High-Current Gain Two-Dimensional MoS₂-Base Hot-Electron Transistors. NANO LETTERS 2015; 15:7905-7912. [PMID: 26524388 DOI: 10.1021/acs.nanolett.5b03768] [Citation(s) in RCA: 22] [Impact Index Per Article: 2.4] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/05/2023]
Abstract
The vertical transport of nonequilibrium charge carriers through semiconductor heterostructures has led to milestones in electronics with the development of the hot-electron transistor. Recently, significant advances have been made with atomically sharp heterostructures implementing various two-dimensional materials. Although graphene-base hot-electron transistors show great promise for electronic switching at high frequencies, they are limited by their low current gain. Here we show that, by choosing MoS2 and HfO2 for the filter barrier interface and using a noncrystalline semiconductor such as ITO for the collector, we can achieve an unprecedentedly high-current gain (α ∼ 0.95) in our hot-electron transistors operating at room temperature. Furthermore, the current gain can be tuned over 2 orders of magnitude with the collector-base voltage albeit this feature currently presents a drawback in the transistor performance metrics such as poor output resistance and poor intrinsic voltage gain. We anticipate our transistors will pave the way toward the realization of novel flexible 2D material-based high-density, low-energy, and high-frequency hot-carrier electronic applications.
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Affiliation(s)
- Carlos M Torres
- Department of Electrical Engineering, University of California at Los Angeles , Los Angeles, California 90095, United States
| | - Yann-Wen Lan
- Department of Electrical Engineering, University of California at Los Angeles , Los Angeles, California 90095, United States
- Institute of Physics, Academia Sinica , Taipei 115, Taiwan
| | - Caifu Zeng
- Department of Electrical Engineering, University of California at Los Angeles , Los Angeles, California 90095, United States
| | - Jyun-Hong Chen
- Department of Physics and Center for Nanotechnology, Chung Yuan Christian University , Chungli 32023, Taiwan
| | - Xufeng Kou
- Department of Electrical Engineering, University of California at Los Angeles , Los Angeles, California 90095, United States
| | - Aryan Navabi
- Department of Electrical Engineering, University of California at Los Angeles , Los Angeles, California 90095, United States
| | - Jianshi Tang
- Department of Electrical Engineering, University of California at Los Angeles , Los Angeles, California 90095, United States
| | - Mohammad Montazeri
- Department of Electrical Engineering, University of California at Los Angeles , Los Angeles, California 90095, United States
| | - James R Adleman
- Space and Naval Warfare (SPAWAR) Systems Center Pacific, San Diego, California 92152, United States
| | - Mitchell B Lerner
- Space and Naval Warfare (SPAWAR) Systems Center Pacific, San Diego, California 92152, United States
| | - Yuan-Liang Zhong
- Department of Physics and Center for Nanotechnology, Chung Yuan Christian University , Chungli 32023, Taiwan
| | - Lain-Jong Li
- Physical Sciences and Engineering Division, King Abdullah University of Science and Technology (KAUST) , Thuwal, 23955-6900, Kingdom of Saudi Arabia
| | - Chii-Dong Chen
- Institute of Physics, Academia Sinica , Taipei 115, Taiwan
| | - Kang L Wang
- Department of Electrical Engineering, University of California at Los Angeles , Los Angeles, California 90095, United States
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Qu D, Liu X, Ahmed F, Lee D, Yoo WJ. Self-screened high performance multi-layer MoS₂ transistor formed by using a bottom graphene electrode. NANOSCALE 2015; 7:19273-19281. [PMID: 26531884 DOI: 10.1039/c5nr06076a] [Citation(s) in RCA: 19] [Impact Index Per Article: 2.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/05/2023]
Abstract
We investigated the carrier transport in multi-layer MoS2 with consideration of the contact resistance (R(c)) and interlayer resistance (R(int)). A bottom graphene contact was suggested to overcome the degradation of I(d) modulation in a back gated multi-layer MoS2 field effect transistor (FET) due to the accumulated R(int) and increased R(c) with increasing thickness. As a result, non-degraded drain current (I(d)) modulation with increasing flake thickness was achieved due to the non-cumulative R(int). Benefiting from the low R(c) induced by the negligible Schottky barrier at the graphene/MoS2 interface, the intrinsic carrier transport properties immune to R(c) were investigated in the multi-layer MoS2 FET. ∼2 times the enhanced carrier mobility was attained from the self-screened channel in the bottom graphene contacted device, compared to those with top metal contacts.
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Affiliation(s)
- Deshun Qu
- Samsung-SKKU Graphene/2D Center (SSGC), Department of Nano Science and Technology, SKKU Advanced Institute of Nano-Technology (SAINT), Sungkyunkwan University, 2066, Seobu-ro, Jangan-gu, Suwon, Gyeonggi-do 440-746, Korea.
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25
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Wang W, Narayan A, Tang L, Dolui K, Liu Y, Yuan X, Jin Y, Wu Y, Rungger I, Sanvito S, Xiu F. Spin-Valve Effect in NiFe/MoS2/NiFe Junctions. NANO LETTERS 2015; 15:5261-5267. [PMID: 26151810 DOI: 10.1021/acs.nanolett.5b01553] [Citation(s) in RCA: 46] [Impact Index Per Article: 5.1] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/04/2023]
Abstract
Two-dimensional (2D) layered transition metal dichalcogenides (TMDs) have been recently proposed as appealing candidate materials for spintronic applications owing to their distinctive atomic crystal structure and exotic physical properties arising from the large bonding anisotropy. Here we introduce the first MoS2-based spin-valves that employ monolayer MoS2 as the nonmagnetic spacer. In contrast with what is expected from the semiconducting band-structure of MoS2, the vertically sandwiched-MoS2 layers exhibit metallic behavior. This originates from their strong hybridization with the Ni and Fe atoms of the Permalloy (Py) electrode. The spin-valve effect is observed up to 240 K, with the highest magnetoresistance (MR) up to 0.73% at low temperatures. The experimental work is accompanied by the first principle electron transport calculations, which reveal an MR of ∼9% for an ideal Py/MoS2/Py junction. Our results clearly identify TMDs as a promising spacer compound in magnetic tunnel junctions and may open a new avenue for the TMDs-based spintronic applications.
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Affiliation(s)
- Weiyi Wang
- †State Key Laboratory of Surface Physics and Department of Physics and ‡Collaborative Innovation Center of Advanced Microstructures, Fudan University, Shanghai 200433, China
| | - Awadhesh Narayan
- §School of Physics, AMBER and CRANN Institute, Trinity College, Dublin 2, Ireland
- ∥Department of Physics, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, United States
| | - Lei Tang
- †State Key Laboratory of Surface Physics and Department of Physics and ‡Collaborative Innovation Center of Advanced Microstructures, Fudan University, Shanghai 200433, China
| | - Kapildeb Dolui
- ⊥Graphene Research Center and Department of Physics, National University of Singapore, 2 Science Drive 3, 117542, Singapore
| | - Yanwen Liu
- †State Key Laboratory of Surface Physics and Department of Physics and ‡Collaborative Innovation Center of Advanced Microstructures, Fudan University, Shanghai 200433, China
| | - Xiang Yuan
- †State Key Laboratory of Surface Physics and Department of Physics and ‡Collaborative Innovation Center of Advanced Microstructures, Fudan University, Shanghai 200433, China
| | - Yibo Jin
- †State Key Laboratory of Surface Physics and Department of Physics and ‡Collaborative Innovation Center of Advanced Microstructures, Fudan University, Shanghai 200433, China
| | - Yizheng Wu
- †State Key Laboratory of Surface Physics and Department of Physics and ‡Collaborative Innovation Center of Advanced Microstructures, Fudan University, Shanghai 200433, China
| | - Ivan Rungger
- §School of Physics, AMBER and CRANN Institute, Trinity College, Dublin 2, Ireland
| | - Stefano Sanvito
- §School of Physics, AMBER and CRANN Institute, Trinity College, Dublin 2, Ireland
| | - Faxian Xiu
- †State Key Laboratory of Surface Physics and Department of Physics and ‡Collaborative Innovation Center of Advanced Microstructures, Fudan University, Shanghai 200433, China
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Piezoelectric effect in chemical vapour deposition-grown atomic-monolayer triangular molybdenum disulfide piezotronics. Nat Commun 2015; 6:7430. [PMID: 26109177 PMCID: PMC4491182 DOI: 10.1038/ncomms8430] [Citation(s) in RCA: 84] [Impact Index Per Article: 9.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/21/2014] [Accepted: 05/06/2015] [Indexed: 12/24/2022] Open
Abstract
High-performance piezoelectricity in monolayer semiconducting transition metal dichalcogenides is highly desirable for the development of nanosensors, piezotronics and photo-piezotransistors. Here we report the experimental study of the theoretically predicted piezoelectric effect in triangle monolayer MoS2 devices under isotropic mechanical deformation. The experimental observation indicates that the conductivity of MoS2 devices can be actively modulated by the piezoelectric charge polarization-induced built-in electric field under strain variation. These polarization charges alter the Schottky barrier height on both contacts, resulting in a barrier height increase with increasing compressive strain and decrease with increasing tensile strain. The underlying mechanism of strain-induced in-plane charge polarization is proposed and discussed using energy band diagrams. In addition, a new type of MoS2 strain/force sensor built using a monolayer MoS2 triangle is also demonstrated. Our results provide evidence for strain-gating monolayer MoS2 piezotronics, a promising avenue for achieving augmented functionalities in next-generation electronic and mechanical–electronic nanodevices. Two-dimensional transition-metal-dichalcogenide materials should have strong piezoelectric properties, making them useful for nanosensors and piezotronics. Here, the authors experimentally demonstrate the piezoelectric effect in monolayer molybdenum disulfide and show how this can modulate conductivity.
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