1
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Farr NTH, Klosterhalfen B, Noé GK. Characterization in respect to degradation of titanium-coated polypropylene surgical mesh explanted from humans. J Biomed Mater Res B Appl Biomater 2023; 111:1142-1152. [PMID: 36610021 PMCID: PMC10952695 DOI: 10.1002/jbm.b.35221] [Citation(s) in RCA: 5] [Impact Index Per Article: 5.0] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/03/2022] [Revised: 11/21/2022] [Accepted: 12/23/2022] [Indexed: 01/08/2023]
Abstract
Titanium-coated polypropylene (Ti-PP) mesh was introduced in 2002 as a surgical mesh for the treatment of hernias and shortly after for pelvic floor surgery, with the aim of improving biocompatibility when compared to non-titanised/regular PP mesh implants. The application of a titanium coating could also be beneficial to address concerns regarding the exposure of PP in an in vivo environment. Many studies have shown that PP, although it is widely accepted as a stable polymer, is subject to oxidation and degradation, such degradation affects the mechanical behavior, that is, the stiffness and tensile strength of PP mesh. Despite the wide clinical use of Ti-PP surgical meshes, no study has yet investigated the residual material properties post clinical deployment and subsequent explantation. In this study, two explanted Ti-PP mesh samples each having different incorporation durations from two patients were examined. Material analysis conducted within this study includes the following techniques: attenuated total reflectance-Fourier transform infrared spectroscopy (ATR-FTIR), Raman spectroscopy, low voltage - scanning electron microscopy (LV-SEM), backscattered electron (BSE) imaging, energy dispersive X-ray spectroscopy (EDS) and secondary election hyperspectral imaging (SEHI). The hypothesis of this study is that the Ti coating successfully shields the PP mesh from oxidative stress in vivo and thus protects it from degradation. The results of this analysis show for the first time evidence of bulk oxidation, surface degradation, and environmental stress cracking on explanted Ti-PP meshes.
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Affiliation(s)
- Nicholas T. H. Farr
- Department of Materials Science and EngineeringUniversity of SheffieldSheffieldUK
- Insigneo Institute for in silico MedicineSheffieldUK
| | | | - Günter K. Noé
- Department of Obstetrics and Gynecology Rheinlandclinics DormagenUniversity of Witten HerdeckeDormagenGermany
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2
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Farr NT. Revealing Localised Mechanochemistry of Biomaterials Using In Situ Multiscale Chemical Analysis. MATERIALS (BASEL, SWITZERLAND) 2022; 15:3462. [PMID: 35629492 PMCID: PMC9144768 DOI: 10.3390/ma15103462] [Citation(s) in RCA: 3] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 04/20/2022] [Revised: 05/06/2022] [Accepted: 05/09/2022] [Indexed: 11/24/2022]
Abstract
The study of mechanical and chemical phenomena arising within a material that is being subjected to external stress is termed mechanochemistry (MC). Recent advances in MC have revealed the prospect not only to enable a greener route to chemical transformations but also to offer previously unobtainable opportunities in the production and screening of biomaterials. To date, the field of MC has been constrained by the inability of current characterisation techniques to provide essential localised multiscale chemically mapping information. A potential method to overcome this is secondary electron hyperspectral imaging (SEHI). SEHI is a multiscale material characterisation technique applied within a scanning electron microscope (SEM). Based on the collection of secondary electron (SE) emission spectra at low primary beam energies, SEHI is applicable to the chemical assessment of uncoated polymer surfaces. Here, we demonstrate that SEHI can provide in situ MC information using poly(glycerol sebacate)-methacrylate (PGS-M) as an example biomaterial of interest. This study brings the use of a bespoke in situ SEM holder together with the application of SEHI to provide, for the first time, enhanced biomaterial mechanochemical characterisation.
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Affiliation(s)
- Nicholas T.H. Farr
- Department of Materials Science and Engineering, Sir Robert Hadfield Building, Mappin Street, University of Sheffield, Sheffield S1 3JD, UK;
- Insigneo Institute for In Silico Medicine, The Pam Liversidge Building, Sir Robert Hadfeld Building, Mappin Street, Sheffield S1 3JD, UK
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3
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Nohl JF, Farr NT, Sun Y, Hughes GM, Cussen SA, Rodenburg C. Low-voltage SEM of air-sensitive powders: from sample preparation to micro/nano analysis with Secondary Electron Hyperspectral Imaging. Micron 2022; 156:103234. [DOI: 10.1016/j.micron.2022.103234] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/07/2021] [Revised: 03/02/2022] [Accepted: 03/02/2022] [Indexed: 12/17/2022]
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4
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Li Y, Čalkovský M, Müller E, Sprau C, Colsmann A, Gerthsen D. Highly Selective Cu Staining of Sulfur-Containing Polymers Facilitates 3D Nanomorphology Reconstruction of Polymer:Fullerene Blends in Organic Solar Cells by FIB-SEM Tomography. ACS APPLIED MATERIALS & INTERFACES 2021; 13:53252-53261. [PMID: 34705411 DOI: 10.1021/acsami.1c16728] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/13/2023]
Abstract
The distinction of different organic materials in phase mixtures is hampered in electron microscopy because electron scattering does not strongly differ in carbon-based materials that mainly consist of light elements. A successful strategy for contrast enhancement is selective staining where one phase of a material mixture is labeled by heavier elements, but suitable staining agents are not available for all organic materials. This is also the case for bulk-heterojunction (BHJ) absorber layers of organic solar cells, which consist of interpenetrating networks of donor and acceptor domains. The domain structure strongly influences the power conversion efficiency, and nanomorphology optimization often requires real-space information on the sizes and interconnectivity of domains with nanometer resolution. In this work, we have developed an efficient approach to selectively stain sulfur-containing polymers by homogeneous Cu infiltration, which generates strong material contrast in scanning (transmission) electron microscopy (S(T)EM) images of polymer:fullerene BHJ layers. Cross-section lamellae of BHJ layers are prepared for STEM by focused-ion-beam milling and are attached to a Cu lift-out grid as a copper source. After thermal treatment at 200 °C for 3 h in air, sulfur-containing polymers are homogeneously infiltrated by Cu, while the fullerenes are not affected. Selective Cu staining is applied to map the phase distribution in PTB7:PC71BM BHJ layers fabricated with different processing additives to tailor the nanomorphology. The strong contrast between polymer and fullerene domains is the prerequisite for the three-dimensional reconstruction of the domain structure by focused-ion-beam/scanning-electron-microscopy tomography.
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Affiliation(s)
- Yonghe Li
- Laboratory for Electron Microscopy, Karlsruhe Institute of Technology (KIT), Karlsruhe 76131, Germany
- Material Research Center for Energy Systems (MZE), Karlsruhe Institute of Technology (KIT), Karlsruhe 76131, Germany
| | - Martin Čalkovský
- Laboratory for Electron Microscopy, Karlsruhe Institute of Technology (KIT), Karlsruhe 76131, Germany
- 3DMM2O-Cluster of Excellence (EXC-2082/1-390761711), Karlsruhe Institute of Technology (KIT), Karlsruhe 76131, Germany
- Material Research Center for Energy Systems (MZE), Karlsruhe Institute of Technology (KIT), Karlsruhe 76131, Germany
| | - Erich Müller
- Laboratory for Electron Microscopy, Karlsruhe Institute of Technology (KIT), Karlsruhe 76131, Germany
- Material Research Center for Energy Systems (MZE), Karlsruhe Institute of Technology (KIT), Karlsruhe 76131, Germany
| | - Christian Sprau
- Light Technology Institute, Karlsruhe Institute of Technology (KIT), Karlsruhe 76131, Germany
- Material Research Center for Energy Systems (MZE), Karlsruhe Institute of Technology (KIT), Karlsruhe 76131, Germany
| | - Alexander Colsmann
- Light Technology Institute, Karlsruhe Institute of Technology (KIT), Karlsruhe 76131, Germany
- Material Research Center for Energy Systems (MZE), Karlsruhe Institute of Technology (KIT), Karlsruhe 76131, Germany
| | - Dagmar Gerthsen
- Laboratory for Electron Microscopy, Karlsruhe Institute of Technology (KIT), Karlsruhe 76131, Germany
- 3DMM2O-Cluster of Excellence (EXC-2082/1-390761711), Karlsruhe Institute of Technology (KIT), Karlsruhe 76131, Germany
- Material Research Center for Energy Systems (MZE), Karlsruhe Institute of Technology (KIT), Karlsruhe 76131, Germany
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5
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Audinot JN, Philipp P, De Castro O, Biesemeier A, Hoang QH, Wirtz T. Highest resolution chemical imaging based on secondary ion mass spectrometry performed on the helium ion microscope. REPORTS ON PROGRESS IN PHYSICS. PHYSICAL SOCIETY (GREAT BRITAIN) 2021; 84:105901. [PMID: 34404033 DOI: 10.1088/1361-6633/ac1e32] [Citation(s) in RCA: 8] [Impact Index Per Article: 2.7] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/08/2020] [Accepted: 08/17/2021] [Indexed: 06/13/2023]
Abstract
This paper is a review on the combination between Helium Ion Microscopy (HIM) and Secondary Ion Mass Spectrometry (SIMS), which is a recently developed technique that is of particular relevance in the context of the quest for high-resolution high-sensitivity nano-analytical solutions. We start by giving an overview on the HIM-SIMS concept and the underlying fundamental principles of both HIM and SIMS. We then present and discuss instrumental aspects of the HIM and SIMS techniques, highlighting the advantage of the integrated HIM-SIMS instrument. We give an overview on the performance characteristics of the HIM-SIMS technique, which is capable of producing elemental SIMS maps with lateral resolution below 20 nm, approaching the physical resolution limits, while maintaining a sub-nanometric resolution in the secondary electron microscopy mode. In addition, we showcase different strategies and methods allowing to take profit of both capabilities of the HIM-SIMS instrument (high-resolution imaging using secondary electrons and mass filtered secondary sons) in a correlative approach. Since its development HIM-SIMS has been successfully applied to a large variety of scientific and technological topics. Here, we will present and summarise recent applications of nanoscale imaging in materials research, life sciences and geology.
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Affiliation(s)
- Jean-Nicolas Audinot
- Advanced Instrumentation for Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), 41 rue du Brill, L-4422 Belvaux, Luxembourg
| | - Patrick Philipp
- Advanced Instrumentation for Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), 41 rue du Brill, L-4422 Belvaux, Luxembourg
| | - Olivier De Castro
- Advanced Instrumentation for Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), 41 rue du Brill, L-4422 Belvaux, Luxembourg
| | - Antje Biesemeier
- Advanced Instrumentation for Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), 41 rue du Brill, L-4422 Belvaux, Luxembourg
| | - Quang Hung Hoang
- Advanced Instrumentation for Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), 41 rue du Brill, L-4422 Belvaux, Luxembourg
| | - Tom Wirtz
- Advanced Instrumentation for Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), 41 rue du Brill, L-4422 Belvaux, Luxembourg
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6
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Farr NTH, Hamad SF, Gray E, Magazzeni CM, Longman F, Armstrong DEJ, Foreman JP, Claeyssens F, Green NH, Rodenburg C. Identifying and mapping chemical bonding within phenolic resin using secondary electron hyperspectral imaging. Polym Chem 2021. [DOI: 10.1039/d0py01220c] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
Abstract
“Secondary electron hyperspectral imaging (SEHI) is an innovative SEM-based analysis tool allowing spatially-resolved chemical analysis beyond elemental composition”.
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Affiliation(s)
- Nicholas T. H. Farr
- Department of Materials Science and Engineering
- Sir Robert Hadfield Building
- Mappin Street
- University of Sheffield
- UK
| | - Sameer F. Hamad
- Department of Materials Science and Engineering
- Sir Robert Hadfield Building
- Mappin Street
- University of Sheffield
- UK
| | - Euan Gray
- Department of Materials Science and Engineering
- Sir Robert Hadfield Building
- Mappin Street
- University of Sheffield
- UK
| | | | - Fodio Longman
- Department of Materials Science and Engineering
- Sir Robert Hadfield Building
- Mappin Street
- University of Sheffield
- UK
| | | | - Joel P. Foreman
- Department of Materials Science and Engineering
- Sir Robert Hadfield Building
- Mappin Street
- University of Sheffield
- UK
| | - Frederik Claeyssens
- Department of Materials Science and Engineering
- Sir Robert Hadfield Building
- Mappin Street
- University of Sheffield
- UK
| | - Nicola H. Green
- Department of Materials Science and Engineering
- Sir Robert Hadfield Building
- Mappin Street
- University of Sheffield
- UK
| | - Cornelia Rodenburg
- Department of Materials Science and Engineering
- Sir Robert Hadfield Building
- Mappin Street
- University of Sheffield
- UK
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7
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Han W, Zheng M, Banerjee A, Luo YZ, Shen L, Khursheed A. Quantitative material analysis using secondary electron energy spectromicroscopy. Sci Rep 2020; 10:22144. [PMID: 33335154 PMCID: PMC7746715 DOI: 10.1038/s41598-020-78973-0] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/29/2020] [Accepted: 12/02/2020] [Indexed: 11/09/2022] Open
Abstract
This paper demonstrates how secondary electron energy spectroscopy (SEES) performed inside a scanning electron microscope (SEM) can be used to map sample atomic number and acquire bulk valence band density of states (DOS) information at low primary beam voltages. The technique uses an electron energy analyser attachment to detect small changes in the shape of the scattered secondary electron (SE) spectrum and extract out fine structure features from it. Close agreement between experimental and theoretical bulk valance band DOS distributions was obtained for six different test samples, where the normalised root mean square deviation ranged from 2.7 to 6.7%. High accuracy levels of this kind do not appear to have been reported before. The results presented in this paper point towards SEES becoming a quantitative material analysis companion tool for low voltage scanning electron microscopy (LVSEM) and providing new applications for Scanning Auger Microscopy (SAM) instruments.
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Affiliation(s)
- W Han
- Department of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore, 117583, Singapore
| | - M Zheng
- Department of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore, 117583, Singapore
| | - A Banerjee
- Physics Department, Bidhan Chandra College, Kazi Nazrul University, Asansol, West Bengal, 713303, India
| | - Y Z Luo
- Department of Mechanical Engineering, National University of Singapore, 9 Engineering Drive 1, Singapore, 117575, Singapore
| | - L Shen
- Department of Mechanical Engineering, National University of Singapore, 9 Engineering Drive 1, Singapore, 117575, Singapore
| | - A Khursheed
- Department of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore, 117583, Singapore.
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8
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Je HI, Shin EY, Lee KJ, Ahn H, Park S, Im SH, Kim YH, Son HJ, Kwon SK. Understanding the Performance of Organic Photovoltaics under Indoor and Outdoor Conditions: Effects of Chlorination of Donor Polymers. ACS APPLIED MATERIALS & INTERFACES 2020; 12:23181-23189. [PMID: 32323523 DOI: 10.1021/acsami.0c02712] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
Abstract
Understanding the effects of the chemical structures of donor polymers on the photovoltaic properties of their corresponding organic photovoltaic (OPV) devices under various light-intensity conditions is important for improving the performance of these devices. We synthesized a series of copolymers based on poly[(2,6-(4,8-bis(5-(2-thioethylhexyl)thiophen-2-yl)benzo[1,2-b:4,5-b']dithiophene))-alt-(5,5-(1',3'-di-2-thienyl-5',7'-bis(2-ethylhexyl)benzo[1',2'-c:4',5'-c']dithiophene-4,8-dione))] (PBDB-TS) and studied the effects of chlorine substitution of its thiophene-substituted benzodithiophene (BDT-Th) unit on its photovoltaic properties. Chlorination of the polymer resulted in a bulk heterojunction (BHJ) morphology optimized for efficient charge transport with suppressed leakage current and an increased open-circuit voltage of the OPV device; this optimization led to a remarkable enhancement of the OPV device's power conversion efficiency (PCE) not only under the condition of 1 sun illumination but also under a low light intensity mimicking indoor light; the PCE increased from 8.7% for PBDB-TS to ∼13% for the chlorinated polymers, PBDB-TS-3Cl, and PBDB-TS-4Cl under the 1 sun illumination condition and from 5.3% for PBDB-TS to 21.7% for PBDB-TS-4Cl under 500 lx fluorescence illuminance. Interestingly, although the OPV PCEs under 1 sun illumination were independent of the position of chlorine substitution onto the polymer, PBDB-TS-4Cl exhibited better performance under simulated indoor light than its derivative PBDB-TS-3Cl. Our results demonstrate that efficient light absorption and charge-carrier generation play key roles in achieving high OPV efficiency under low-light-intensity conditions.
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Affiliation(s)
- Hwan-Il Je
- Department of Materials Engineering and Convergence Technology and ERI, Gyeongsang National University, Jinju 660-701, Republic of Korea
| | - Eul-Yong Shin
- Photo-Electronic Hybrids Research Center, Korea Institute of Science and Technology, Seoul 02792, Republic of Korea
| | - Keun Jun Lee
- Photo-Electronic Hybrids Research Center, Korea Institute of Science and Technology, Seoul 02792, Republic of Korea
- Department of Chemical and Biological Engineering, Korea University, Seoul 02792, Republic of Korea
| | - Hyungju Ahn
- Pohang Accelerator Laboratory, Kyungbuk, Pohang 37673, Republic of Korea
| | - Sungmin Park
- Photo-Electronic Hybrids Research Center, Korea Institute of Science and Technology, Seoul 02792, Republic of Korea
| | - Sang Hyuk Im
- Department of Chemical and Biological Engineering, Korea University, Seoul 02792, Republic of Korea
| | - Yun-Hi Kim
- Department of Chemistry, Gyeongsang National University and RIGET, 900, Gajwa-dong, Jinju 660-701, Republic of Korea
| | - Hae Jung Son
- Photo-Electronic Hybrids Research Center, Korea Institute of Science and Technology, Seoul 02792, Republic of Korea
- KU-KIST Graduate School of Energy and Environment, Korea University, Seongbuk-gu, Seoul 02841, Republic of Korea
| | - Soon-Ki Kwon
- Department of Materials Engineering and Convergence Technology and ERI, Gyeongsang National University, Jinju 660-701, Republic of Korea
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SURI A, PRATT A, TEAR S, WALKER C, EL‐GOMATI M. Next generation secondary electron detector with energy analysis capability for SEM. J Microsc 2020; 279:207-211. [PMID: 31985065 PMCID: PMC8597398 DOI: 10.1111/jmi.12867] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/01/2019] [Revised: 01/10/2020] [Accepted: 01/23/2020] [Indexed: 12/21/2022]
Abstract
We report the working of a novel detector design based on a Bessel Box (BB) electron energy analyser in a scanning electron microscope (SEM). We demonstrate the application of our detector for elemental identification through Auger electron detection in an SEM environment and its potential as a complementary technique to energy dispersive X‐ray (EDX) spectroscopy. We also demonstrate energy‐filtered secondary electron imaging of a copper‐on‐silicon sample using an electron pass energy of 12 eV.
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Affiliation(s)
- A. SURI
- Department of Electronic EngineeringUniversity of York York U.K
- Department of PhysicsUniversity of York York U.K
| | - A. PRATT
- Department of PhysicsUniversity of York York U.K
| | - S. TEAR
- Department of PhysicsUniversity of York York U.K
| | - C. WALKER
- Department of PhysicsUniversity of York York U.K
| | - M. EL‐GOMATI
- Department of Electronic EngineeringUniversity of York York U.K
- York Probe Sources Ltd Harwood road York U.K
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10
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Farr N, Pashneh‐Tala S, Stehling N, Claeyssens F, Green N, Rodenburg C. Characterizing Cross‐Linking Within Polymeric Biomaterials in the SEM by Secondary Electron Hyperspectral Imaging. Macromol Rapid Commun 2019; 41:e1900484. [DOI: 10.1002/marc.201900484] [Citation(s) in RCA: 6] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/06/2019] [Revised: 10/29/2019] [Indexed: 01/23/2023]
Affiliation(s)
- Nicholas Farr
- Department of Materials Science and EngineeringSir Robert Hadfield Building Mappin Street Sheffield S1 3JD UK
| | - Samand Pashneh‐Tala
- Department of Materials Science and EngineeringSir Robert Hadfield Building Mappin Street Sheffield S1 3JD UK
| | - Nicola Stehling
- Department of Materials Science and EngineeringSir Robert Hadfield Building Mappin Street Sheffield S1 3JD UK
| | - Frederik Claeyssens
- Department of Materials Science and EngineeringSir Robert Hadfield Building Mappin Street Sheffield S1 3JD UK
| | - Nicola Green
- Department of Materials Science and EngineeringSir Robert Hadfield Building Mappin Street Sheffield S1 3JD UK
- INSIGNEO Institute for In Silico MedicineThe Pam Liversidge BuildingSir Robert Hadfield Building Mappin Street Sheffield S1 3JD UK
| | - Cornelia Rodenburg
- Department of Materials Science and EngineeringSir Robert Hadfield Building Mappin Street Sheffield S1 3JD UK
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11
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Abrams KJ, Dapor M, Stehling N, Azzolini M, Kyle SJ, Schäfer J, Quade A, Mika F, Kratky S, Pokorna Z, Konvalina I, Mehta D, Black K, Rodenburg C. Making Sense of Complex Carbon and Metal/Carbon Systems by Secondary Electron Hyperspectral Imaging. ADVANCED SCIENCE (WEINHEIM, BADEN-WURTTEMBERG, GERMANY) 2019; 6:1900719. [PMID: 31592411 PMCID: PMC6774015 DOI: 10.1002/advs.201900719] [Citation(s) in RCA: 10] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/28/2019] [Revised: 07/15/2019] [Indexed: 05/03/2023]
Abstract
Carbon and carbon/metal systems with a multitude of functionalities are ubiquitous in new technologies but understanding on the nanoscale remains elusive due to their affinity for interaction with their environment and limitations in available characterization techniques. This paper introduces a spectroscopic technique and demonstrates its capacity to reveal chemical variations of carbon. The effectiveness of this approach is validated experimentally through spatially averaging spectroscopic techniques and using Monte Carlo modeling. Characteristic spectra shapes and peak positions for varying contributions of sp2-like or sp3-like bond types and amorphous hydrogenated carbon are reported under circumstances which might be observed on highly oriented pyrolytic graphite (HOPG) surfaces as a result of air or electron beam exposure. The spectral features identified above are then used to identify the different forms of carbon present within the metallic films deposited from reactive organometallic inks. While spectra for metals is obtained in dedicated surface science instrumentation, the complex relations between carbon and metal species is only revealed by secondary electron (SE) spectroscopy and SE hyperspectral imaging obtained in a state-of-the-art scanning electron microscope (SEM). This work reveals the inhomogeneous incorporation of carbon on the nanoscale but also uncovers a link between local orientation of metallic components and carbon form.
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Affiliation(s)
- Kerry J. Abrams
- Department of Materials Science and EngineeringSir Robert Hadfield BuildingThe University of SheffieldMappin StreetSheffieldS1 3JDUK
| | - Maurizio Dapor
- European Centre for Theoretical Studies in Nuclear Physics and Related Areas (ECT*‐FBK)Trento38123Italy
- Trento Institute for Fundamental Physics and Applications (TIFPA‐INFN)PovoTrento38123Italy
| | - Nicola Stehling
- Department of Materials Science and EngineeringSir Robert Hadfield BuildingThe University of SheffieldMappin StreetSheffieldS1 3JDUK
| | - Martina Azzolini
- European Centre for Theoretical Studies in Nuclear Physics and Related Areas (ECT*‐FBK)Trento38123Italy
- Trento Institute for Fundamental Physics and Applications (TIFPA‐INFN)PovoTrento38123Italy
| | - Stephan J. Kyle
- Department of Materials Science and EngineeringSir Robert Hadfield BuildingThe University of SheffieldMappin StreetSheffieldS1 3JDUK
| | - Jan Schäfer
- Leibniz Institute for Plasma Science and Technology (INP Greifswald e.V.)Felix‐Hausdorff‐Str. 217489GreifswaldGermany
| | - Antje Quade
- Leibniz Institute for Plasma Science and Technology (INP Greifswald e.V.)Felix‐Hausdorff‐Str. 217489GreifswaldGermany
| | - Filip Mika
- Institute of Scientific Instruments of the CASKrálovopolská 147612 64BrnoCzech Republic
| | - Stanislav Kratky
- Institute of Scientific Instruments of the CASKrálovopolská 147612 64BrnoCzech Republic
| | - Zuzana Pokorna
- Institute of Scientific Instruments of the CASKrálovopolská 147612 64BrnoCzech Republic
| | - Ivo Konvalina
- Institute of Scientific Instruments of the CASKrálovopolská 147612 64BrnoCzech Republic
| | - Danielle Mehta
- School of EngineeringUniversity of LiverpoolHarrison Hughes BuildingLiverpoolL69 3GHUK
| | - Kate Black
- School of EngineeringUniversity of LiverpoolHarrison Hughes BuildingLiverpoolL69 3GHUK
| | - Cornelia Rodenburg
- Department of Materials Science and EngineeringSir Robert Hadfield BuildingThe University of SheffieldMappin StreetSheffieldS1 3JDUK
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12
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Konvalina I, Mika F, Krátký S, Materna Mikmeková E, Müllerová I. In-Lens Band-Pass Filter for Secondary Electrons in Ultrahigh Resolution SEM. MATERIALS (BASEL, SWITZERLAND) 2019; 12:E2307. [PMID: 31330942 PMCID: PMC6679021 DOI: 10.3390/ma12142307] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 06/20/2019] [Revised: 07/11/2019] [Accepted: 07/17/2019] [Indexed: 11/16/2022]
Abstract
Scanning electron microscopes come equipped with different types of detectors for the collection of signal electrons emitted from samples. In-lens detection systems mostly consist of several auxiliary electrodes that help electrons to travel in a direction towards the detector. This paper aims to show that a through-the-lens detector in a commercial electron microscope Magellan 400 FEG can, under specific conditions, work as an energy band-pass filter of secondary electrons that are excited by the primary beam electrons. The band-pass filter properties verify extensive simulations of secondary and backscattered electrons in a precision 3D model of a microscope. A unique test sample demonstrates the effects of the band-pass filter on final image and contrast with chromium and silver stripes on a silicon substrate, manufactured by a combination of e-beam lithography, wet etching, and lift-off technique. The ray tracing of signal electrons in a detector model predicate that the through-the-lens detector works as a band-pass filter of the secondary electrons with an energy window of about 3 eV. By moving the energy window along the secondary electron energy spectrum curve of the analyzed material, we select the energy of the secondary electrons to be detected. Energy filtration brings a change in contrast in the image as well as displaying details that are not otherwise visible.
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Affiliation(s)
- Ivo Konvalina
- Institute of Scientific Instruments of the CAS, v. v. i., Královopolská 147, 612 64 Brno, Czech Republic.
| | - Filip Mika
- Institute of Scientific Instruments of the CAS, v. v. i., Královopolská 147, 612 64 Brno, Czech Republic
| | - Stanislav Krátký
- Institute of Scientific Instruments of the CAS, v. v. i., Královopolská 147, 612 64 Brno, Czech Republic
| | - Eliška Materna Mikmeková
- Institute of Scientific Instruments of the CAS, v. v. i., Královopolská 147, 612 64 Brno, Czech Republic
| | - Ilona Müllerová
- Institute of Scientific Instruments of the CAS, v. v. i., Královopolská 147, 612 64 Brno, Czech Republic
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13
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Wirtz T, De Castro O, Audinot JN, Philipp P. Imaging and Analytics on the Helium Ion Microscope. ANNUAL REVIEW OF ANALYTICAL CHEMISTRY (PALO ALTO, CALIF.) 2019; 12:523-543. [PMID: 30699036 DOI: 10.1146/annurev-anchem-061318-115457] [Citation(s) in RCA: 34] [Impact Index Per Article: 6.8] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/09/2023]
Abstract
The helium ion microscope (HIM) has emerged as an instrument of choice for patterning, imaging and, more recently, analytics at the nanoscale. Here, we review secondary electron imaging on the HIM and the various methodologies and hardware components that have been developed to confer analytical capabilities to the HIM. Secondary electron-based imaging can be performed at resolutions down to 0.5 nm with high contrast, with high depth of field, and directly on insulating samples. Analytical methods include secondary electron hyperspectral imaging (SEHI), scanning transmission ion microscopy (STIM), backscattering spectrometry and, in particular, secondary ion mass spectrometry (SIMS). The SIMS system that was specifically designed for the HIM allows the detection of all elements, the differentiation between isotopes, and the detection of trace elements. It provides mass spectra, depth profiles, and 2D or 3D images with lateral resolutions down to 10 nm.
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Affiliation(s)
- Tom Wirtz
- Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), L-4422 Belvaux, Luxembourg;
| | - Olivier De Castro
- Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), L-4422 Belvaux, Luxembourg;
| | - Jean-Nicolas Audinot
- Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), L-4422 Belvaux, Luxembourg;
| | - Patrick Philipp
- Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), L-4422 Belvaux, Luxembourg;
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14
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Fan X, Markram H. A Brief History of Simulation Neuroscience. Front Neuroinform 2019; 13:32. [PMID: 31133838 PMCID: PMC6513977 DOI: 10.3389/fninf.2019.00032] [Citation(s) in RCA: 36] [Impact Index Per Article: 7.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/12/2019] [Accepted: 04/12/2019] [Indexed: 12/19/2022] Open
Abstract
Our knowledge of the brain has evolved over millennia in philosophical, experimental and theoretical phases. We suggest that the next phase is simulation neuroscience. The main drivers of simulation neuroscience are big data generated at multiple levels of brain organization and the need to integrate these data to trace the causal chain of interactions within and across all these levels. Simulation neuroscience is currently the only methodology for systematically approaching the multiscale brain. In this review, we attempt to reconstruct the deep historical paths leading to simulation neuroscience, from the first observations of the nerve cell to modern efforts to digitally reconstruct and simulate the brain. Neuroscience began with the identification of the neuron as the fundamental unit of brain structure and function and has evolved towards understanding the role of each cell type in the brain, how brain cells are connected to each other, and how the seemingly infinite networks they form give rise to the vast diversity of brain functions. Neuronal mapping is evolving from subjective descriptions of cell types towards objective classes, subclasses and types. Connectivity mapping is evolving from loose topographic maps between brain regions towards dense anatomical and physiological maps of connections between individual genetically distinct neurons. Functional mapping is evolving from psychological and behavioral stereotypes towards a map of behaviors emerging from structural and functional connectomes. We show how industrialization of neuroscience and the resulting large disconnected datasets are generating demand for integrative neuroscience, how the scale of neuronal and connectivity maps is driving digital atlasing and digital reconstruction to piece together the multiple levels of brain organization, and how the complexity of the interactions between molecules, neurons, microcircuits and brain regions is driving brain simulation to understand the interactions in the multiscale brain.
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Affiliation(s)
- Xue Fan
- Blue Brain Project, École Polytechnique Fédérale de Lausanne (EPFL), Geneva, Switzerland
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15
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Masters RC, Stehling N, Abrams KJ, Kumar V, Azzolini M, Pugno NM, Dapor M, Huber A, Schäfer P, Lidzey DG, Rodenburg C. Mapping Polymer Molecular Order in the SEM with Secondary Electron Hyperspectral Imaging. ADVANCED SCIENCE (WEINHEIM, BADEN-WURTTEMBERG, GERMANY) 2019; 6:1801752. [PMID: 30886802 PMCID: PMC6402282 DOI: 10.1002/advs.201801752] [Citation(s) in RCA: 10] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/19/2018] [Revised: 12/08/2018] [Indexed: 05/03/2023]
Abstract
Understanding nanoscale molecular order within organic electronic materials is a crucial factor in building better organic electronic devices. At present, techniques capable of imaging molecular order within a polymer are limited in resolution, accuracy, and accessibility. In this work, presented are secondary electron (SE) spectroscopy and secondary electron hyperspectral imaging, which make an exciting alternative approach to probing molecular ordering in poly(3-hexylthiophene) (P3HT) with scanning electron microscope-enabled resolution. It is demonstrated that the crystalline content of a P3HT film is reflected by its SE energy spectrum, both empirically and through correlation with nano-Fourier-transform infrared spectroscopy, an innovative technique for exploring nanoscale chemistry. The origin of SE spectral features is investigated using both experimental and modeling approaches, and it is found that the different electronic properties of amorphous and crystalline P3HT result in SE emission with different energy distributions. This effect is exploited by acquiring hyperspectral SE images of different P3HT films to explore localized molecular orientation. Machine learning techniques are used to accurately identify and map the crystalline content of the film, demonstrating the power of an exciting characterization technique.
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Affiliation(s)
- Robert C. Masters
- Department of Materials Science and EngineeringUniversity of SheffieldSheffieldS1 3JDUK
| | - Nicola Stehling
- Department of Materials Science and EngineeringUniversity of SheffieldSheffieldS1 3JDUK
| | - Kerry J. Abrams
- Department of Materials Science and EngineeringUniversity of SheffieldSheffieldS1 3JDUK
| | - Vikas Kumar
- Department of Materials Science and EngineeringUniversity of SheffieldSheffieldS1 3JDUK
| | - Martina Azzolini
- European Centre for Theoretical Studies in Nuclear Physics and Related Areas (ECT*‐FBK) and Trento Institute for Fundamental Physics and Applications (TIFPA‐INFN)Trento38123Italy
- Laboratory of Bio‐Inspired and Graphene NanomechanicsDepartment of CivilEnvironmental and Mechanical EngineeringUniversity of TrentoTrento38123Italy
| | - Nicola M. Pugno
- Laboratory of Bio‐Inspired and Graphene NanomechanicsDepartment of CivilEnvironmental and Mechanical EngineeringUniversity of TrentoTrento38123Italy
- Ket‐LabEdoardo Amaldi FoundationRome00133Italy
- School of Engineering and Materials ScienceQueen Mary University of LondonLondonE1 4NSUK
| | - Maurizio Dapor
- European Centre for Theoretical Studies in Nuclear Physics and Related Areas (ECT*‐FBK) and Trento Institute for Fundamental Physics and Applications (TIFPA‐INFN)Trento38123Italy
| | | | | | - David G. Lidzey
- Department of Physics and AstronomyUniversity of SheffieldSheffieldS3 7RHUK
| | - Cornelia Rodenburg
- Department of Materials Science and EngineeringUniversity of SheffieldSheffieldS1 3JDUK
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16
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Vardeny SR, Baniya S, Cromey B, Kieu K, Peyghambarian N, Vardeny ZV. Multiphoton Microscopy of π-Conjugated Copolymers and Copolymer/Fullerene Blends for Organic Photovoltaic Applications. ACS APPLIED MATERIALS & INTERFACES 2018; 10:31813-31823. [PMID: 30192500 DOI: 10.1021/acsami.8b11378] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/08/2023]
Abstract
Organic photovoltaic (OPV) cells based on π-conjugated copolymer/fullerene blends are devices with the highest power conversion efficiencies within the class of organic semiconductors. Although a number of image microscopies have been applied to films of π-conjugated copolymers and their fullerene blends, seldom have they been able to detect microscopic defects in the blend films. We have applied multiphoton microscopy (MPM) using a 65 fs laser at 1.56 μm for spectroscopy and mapping of films of various π-conjugated copolymers and their fullerene blends. All pristine copolymer films have shown third harmonic generation (THG) and two-photon or three-photon photoluminescence that could be used for mapping the films with micrometer spatial resolution. Since the fullerenes have much weaker THG efficiency than those of the copolymers, we could readily map the copolymer/fullerene blend films that showed interpenetrating micron-sized grains of the two constituents. In addition, we also found second harmonic generation from various micron-sized defects in the films that are formed during film deposition or light illumination at ambient conditions, which do not possess inversion symmetry. The MPM method is therefore beneficial for organic films and devices for investigating the properties and growth of copolymer/fullerene blends for OPV applications.
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Affiliation(s)
- Shai R Vardeny
- College of Optical Sciences , University of Arizona , Tucson , Arizona 85721 , United States
| | - Sangita Baniya
- Department of Physics & Astronomy , University of Utah , Salt Lake City , Utah 84112 , United States
| | - Benjamin Cromey
- College of Optical Sciences , University of Arizona , Tucson , Arizona 85721 , United States
| | - Khanh Kieu
- College of Optical Sciences , University of Arizona , Tucson , Arizona 85721 , United States
| | - Nasser Peyghambarian
- College of Optical Sciences , University of Arizona , Tucson , Arizona 85721 , United States
| | - Z Valy Vardeny
- Department of Physics & Astronomy , University of Utah , Salt Lake City , Utah 84112 , United States
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17
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Polarized electron beams elastically scattered by atoms as a tool for testing fundamental predictions of quantum mechanics. Sci Rep 2018; 8:5370. [PMID: 29599498 PMCID: PMC5876396 DOI: 10.1038/s41598-018-23660-4] [Citation(s) in RCA: 8] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/04/2017] [Accepted: 03/19/2018] [Indexed: 11/11/2022] Open
Abstract
Quantum information theory deals with quantum noise in order to protect physical quantum bits (qubits) from its effects. A single electron is an emblematic example of a qubit, and today it is possible to experimentally produce polarized ensembles of electrons. In this paper, the theory of the polarization of electron beams elastically scattered by atoms is briefly summarized. Then the POLARe program suite, a set of computer programs aimed at the calculation of the spin-polarization parameters of electron beams elastically interacting with atomic targets, is described. Selected results of the program concerning Ar, Kr, and Xe atoms are presented together with the comparison with experimental data about the Sherman function for low kinetic energy of the incident electrons (1.5eV–350eV). It is demonstrated that the quantum-relativistic theory of the polarization of electron beams elastically scattered by atoms is in good agreement with experimental data down to energies smaller than a few eV.
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18
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Shimazaki T, Tashiro M, Nakajima T. Theoretical study on mesoscopic-size impurity effects in the charge separation process of organic photocells. Phys Chem Chem Phys 2018; 20:14846-14854. [DOI: 10.1039/c7cp08125a] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
Abstract
A bulk-heterojunction structure is often employed to develop high-performance organic photocells, in which the donor and acceptor regions are complexly intertwined.
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Affiliation(s)
- Tomomi Shimazaki
- Kobe University
- Graduate School of System Informatics
- Kobe 657-8501
- Japan
- RIKEN
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19
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Wan Q, Abrams KJ, Masters RC, Talari ACS, Rehman IU, Claeyssens F, Holland C, Rodenburg C. Mapping Nanostructural Variations in Silk by Secondary Electron Hyperspectral Imaging. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2017; 29:1703510. [PMID: 29116662 DOI: 10.1002/adma.201703510] [Citation(s) in RCA: 10] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/23/2017] [Revised: 08/29/2017] [Indexed: 06/07/2023]
Abstract
Nanostructures underpin the excellent properties of silk. Although the bulk nanocomposition of silks is well studied, direct evidence of the spatial variation of nanocrystalline (ordered) and amorphous (disordered) structures remains elusive. Here, secondary electron hyperspectral imaging can be exploited for direct imaging of hierarchical structures in carbon-based materials, which cannot be revealed by any other standard characterization methods. Through applying this technique to silks from domesticated (Bombyx mori) and wild (Antheraea mylitta) silkworms, a variety of previously unseen features are reported, highlighting the local interplay between ordered and disordered structures. This technique is able to differentiate composition on the nanoscale and enables in-depth studies into the relationship between morphology and performance of these complex biopolymer systems.
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Affiliation(s)
- Quan Wan
- Department of Materials Science and Engineering, University of Sheffield, Sir Robert Hadfield Building, Mappin Street, Sheffield, S1 3JD, UK
| | - Kerry J Abrams
- Department of Materials Science and Engineering, University of Sheffield, Sir Robert Hadfield Building, Mappin Street, Sheffield, S1 3JD, UK
| | - Robert C Masters
- Department of Materials Science and Engineering, University of Sheffield, Sir Robert Hadfield Building, Mappin Street, Sheffield, S1 3JD, UK
| | - Abdullah C S Talari
- Department of Materials Science and Engineering, University of Sheffield, Sir Robert Hadfield Building, Mappin Street, Sheffield, S1 3JD, UK
| | - Ihtesham U Rehman
- Department of Materials Science and Engineering, University of Sheffield, Sir Robert Hadfield Building, Mappin Street, Sheffield, S1 3JD, UK
| | - Frederik Claeyssens
- Department of Materials Science and Engineering, University of Sheffield, Sir Robert Hadfield Building, Mappin Street, Sheffield, S1 3JD, UK
| | - Chris Holland
- Department of Materials Science and Engineering, University of Sheffield, Sir Robert Hadfield Building, Mappin Street, Sheffield, S1 3JD, UK
| | - Cornelia Rodenburg
- Department of Materials Science and Engineering, University of Sheffield, Sir Robert Hadfield Building, Mappin Street, Sheffield, S1 3JD, UK
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20
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Kumar V, Schmidt WL, Schileo G, Masters RC, Wong-Stringer M, Sinclair DC, Reaney IM, Lidzey D, Rodenburg C. Nanoscale Mapping of Bromide Segregation on the Cross Sections of Complex Hybrid Perovskite Photovoltaic Films Using Secondary Electron Hyperspectral Imaging in a Scanning Electron Microscope. ACS OMEGA 2017; 2:2126-2133. [PMID: 31457566 PMCID: PMC6640921 DOI: 10.1021/acsomega.7b00265] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/07/2017] [Accepted: 05/05/2017] [Indexed: 05/19/2023]
Abstract
Mixed halide (I/Br) complex organic/inorganic hybrid perovskite materials have attracted much attention recently because of their excellent photovoltaic properties. Although it has been proposed that their stability is linked to the chemical inhomogeneity of I/Br, no direct proof has been offered to date. Here, we report a new method, secondary electron hyperspectral imaging (SEHI), which allows direct imaging of the local variation in Br concentration in mixed halide (I/Br) organic/inorganic hybrid perovskites on a nanometric scale. We confirm the presence of a nonuniform Br distribution with variation in concentration within the grain interiors and boundaries and demonstrate how SEHI in conjunction with low-voltage scanning electron microscopy can enhance the understanding of the fundamental physics and materials science of organic/inorganic hybrid photovoltaics, illustrating its potential for research and development in "real-world" applications.
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Affiliation(s)
- Vikas Kumar
- Department
of Materials Science and Engineering, University of Sheffield, Mappin Street, Sheffield S1 3JD, U.K.
- E-mail: (V.K.)
| | - Whitney L. Schmidt
- Department
of Materials Science and Engineering, University of Sheffield, Mappin Street, Sheffield S1 3JD, U.K.
| | - Giorgio Schileo
- Department
of Materials Science and Engineering, University of Sheffield, Mappin Street, Sheffield S1 3JD, U.K.
| | - Robert C. Masters
- Department
of Materials Science and Engineering, University of Sheffield, Mappin Street, Sheffield S1 3JD, U.K.
| | - Michael Wong-Stringer
- Department
of Physics and Astronomy, University of
Sheffield, Hounsfield Road, Sheffield S3 7RH, U.K.
| | - Derek C. Sinclair
- Department
of Materials Science and Engineering, University of Sheffield, Mappin Street, Sheffield S1 3JD, U.K.
| | - Ian M. Reaney
- Department
of Materials Science and Engineering, University of Sheffield, Mappin Street, Sheffield S1 3JD, U.K.
| | - David Lidzey
- Department
of Physics and Astronomy, University of
Sheffield, Hounsfield Road, Sheffield S3 7RH, U.K.
| | - Cornelia Rodenburg
- Department
of Materials Science and Engineering, University of Sheffield, Mappin Street, Sheffield S1 3JD, U.K.
- E-mail: (C.R.)
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21
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Virtual substrate method for nanomaterials characterization. Nat Commun 2017; 8:15629. [PMID: 28548114 PMCID: PMC5458549 DOI: 10.1038/ncomms15629] [Citation(s) in RCA: 19] [Impact Index Per Article: 2.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/05/2016] [Accepted: 04/14/2017] [Indexed: 11/29/2022] Open
Abstract
Characterization techniques available for bulk or thin-film solid-state materials have been extended to substrate-supported nanomaterials, but generally non-quantitatively. This is because the nanomaterial signals are inevitably buried in the signals from the underlying substrate in common reflection-configuration techniques. Here, we propose a virtual substrate method, inspired by the four-point probe technique for resistance measurement as well as the chop-nod method in infrared astronomy, to characterize nanomaterials without the influence of underlying substrate signals from four interrelated measurements. By implementing this method in secondary electron (SE) microscopy, a SE spectrum (white electrons) associated with the reflectivity difference between two different substrates can be tracked and controlled. The SE spectrum is used to quantitatively investigate the covering nanomaterial based on subtle changes in the transmission of the nanomaterial with high efficiency rivalling that of conventional core-level electrons. The virtual substrate method represents a benchmark for surface analysis to provide ‘free-standing' information about supported nanomaterials. Quantitative characterization of supported nanomaterials is challenging, because the nanomaterial signals cannot easily be deconvoluted from those of the substrate. Here, the authors introduce an inventive approach to overcome this problem for electron-based surface analysis techniques.
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22
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Alessandri R, Uusitalo JJ, de Vries AH, Havenith RWA, Marrink SJ. Bulk Heterojunction Morphologies with Atomistic Resolution from Coarse-Grain Solvent Evaporation Simulations. J Am Chem Soc 2017; 139:3697-3705. [PMID: 28209056 PMCID: PMC5355903 DOI: 10.1021/jacs.6b11717] [Citation(s) in RCA: 92] [Impact Index Per Article: 13.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/22/2022]
Abstract
![]()
Control
over the morphology of the active layer of bulk heterojunction
(BHJ) organic solar cells is paramount to achieve high-efficiency
devices. However, no method currently available can predict morphologies
for a novel donor–acceptor blend. An approach which allows
reaching relevant length scales, retaining chemical specificity, and
mimicking experimental fabrication conditions, and which is suited
for high-throughput schemes has been proven challenging to find. Here,
we propose a method to generate atom-resolved morphologies of BHJs
which conforms to these requirements. Coarse-grain (CG) molecular
dynamics simulations are employed to simulate the large-scale morphological
organization during solution-processing. The use of CG models which
retain chemical specificity translates into a direct path to the rational
design of donor and acceptor compounds which differ only slightly
in chemical nature. Finally, the direct retrieval of fully atomistic
detail is possible through backmapping, opening the way for improved
quantum mechanical calculations addressing the charge separation mechanism.
The method is illustrated for the poly(3-hexyl-thiophene) (P3HT)–phenyl-C61-butyric
acid methyl ester (PCBM) mixture, and found to predict morphologies
in agreement with experimental data. The effect of drying rate, P3HT
molecular weight, and thermal annealing are investigated extensively,
resulting in trends mimicking experimental findings. The proposed
methodology can help reduce the parameter space which has to be explored
before obtaining optimal morphologies not only for BHJ solar cells
but also for any other solution-processed soft matter device.
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Affiliation(s)
| | | | | | - Remco W A Havenith
- Ghent Quantum Chemistry Group, Department of Inorganic and Physical Chemistry, Ghent University , Krijgslaan 281 (S3), B-9000 Gent, Belgium
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23
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Abstract
![]()
The field of organic
photovoltaics has developed rapidly over the
last 2 decades, and small solar cells with power conversion efficiencies
of 13% have been demonstrated. Light absorbed in the organic layers
forms tightly bound excitons that are split into free electrons and
holes using heterojunctions of electron donor and acceptor materials,
which are then extracted at electrodes to give useful electrical power.
This review gives a concise description of the fundamental processes
in photovoltaic devices, with the main emphasis on the characterization
of energy transfer and its role in dictating device architecture,
including multilayer planar heterojunctions, and on the factors that
impact free carrier generation from dissociated excitons. We briefly
discuss harvesting of triplet excitons, which now attracts substantial
interest when used in conjunction with singlet fission. Finally, we
introduce the techniques used by researchers for characterization
and engineering of bulk heterojunctions to realize large photocurrents,
and examine the formed morphology in three prototypical blends.
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Affiliation(s)
- Gordon J Hedley
- Organic Semiconductor Centre, SUPA, School of Physics and Astronomy, University of St Andrews , North Haugh, St Andrews, Fife KY16 9SS, U.K
| | - Arvydas Ruseckas
- Organic Semiconductor Centre, SUPA, School of Physics and Astronomy, University of St Andrews , North Haugh, St Andrews, Fife KY16 9SS, U.K
| | - Ifor D W Samuel
- Organic Semiconductor Centre, SUPA, School of Physics and Astronomy, University of St Andrews , North Haugh, St Andrews, Fife KY16 9SS, U.K
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24
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Angle selective backscattered electron contrast in the low-voltage scanning electron microscope: Simulation and experiment for polymers. Ultramicroscopy 2016; 171:126-138. [DOI: 10.1016/j.ultramic.2016.09.006] [Citation(s) in RCA: 10] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/17/2016] [Revised: 09/02/2016] [Accepted: 09/11/2016] [Indexed: 11/19/2022]
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25
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Serbenta A, Kozlov OV, Portale G, van Loosdrecht PHM, Pshenichnikov MS. Bulk heterojunction morphology of polymer:fullerene blends revealed by ultrafast spectroscopy. Sci Rep 2016; 6:36236. [PMID: 27824085 PMCID: PMC5099942 DOI: 10.1038/srep36236] [Citation(s) in RCA: 18] [Impact Index Per Article: 2.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/28/2016] [Accepted: 10/13/2016] [Indexed: 01/23/2023] Open
Abstract
Morphology of organic photovoltaic bulk heterojunctions (BHJs) - a nanoscale texture of the donor and acceptor phases - is one of the key factors influencing efficiency of organic solar cells. Detailed knowledge of the morphology is hampered by the fact that it is notoriously difficult to investigate by microscopic methods. Here we all-optically track the exciton harvesting dynamics in the fullerene acceptor phase from which subdivision of the fullerene domain sizes into the mixed phase (2-15 nm) and large (>50 nm) domains is readily obtained via the Monte-Carlo simulations. These results were independently confirmed by a combination of X-ray scattering, electron and atomic-force microscopies, and time-resolved photoluminescence spectroscopy. In the large domains, the excitons are lost due to the high energy disorder while in the ordered materials the excitons are harvested with high efficiency even from the domains as large as 100 nm due to the absence of low-energy traps. Therefore, optimizing of blend nanomorphology together with increasing the material order are deemed as winning strategies in the exciton harvesting optimization.
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Affiliation(s)
- Almis Serbenta
- Zernike Institute for Advanced Materials, University of Groningen, Groningen, the Netherlands
| | - Oleg V. Kozlov
- Zernike Institute for Advanced Materials, University of Groningen, Groningen, the Netherlands
- International Laser Center and Faculty of Physics, Moscow State University, Russian Federation
| | - Giuseppe Portale
- Zernike Institute for Advanced Materials, University of Groningen, Groningen, the Netherlands
| | | | - Maxim S. Pshenichnikov
- Zernike Institute for Advanced Materials, University of Groningen, Groningen, the Netherlands
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26
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Wang H, Rahaq Y, Kumar V. A composite light-harvesting layer from photoactive polymer and halide perovskite for planar heterojunction solar cells. Sci Rep 2016; 6:29567. [PMID: 27411487 PMCID: PMC4944171 DOI: 10.1038/srep29567] [Citation(s) in RCA: 19] [Impact Index Per Article: 2.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/19/2016] [Accepted: 06/17/2016] [Indexed: 11/28/2022] Open
Abstract
A new route for fabrication of photoactive materials in organic-inorganic hybrid solar cells is presented in this report. Photoactive materials by blending a semiconductive conjugated polymer with an organolead halide perovskite were fabricated for the first time. The composite active layer was then used to make planar heterojunction solar cells with the PCBM film as the electron-acceptor. Photovoltaic performance of solar cells was investigated by J-V curves and external quantum efficiency spectra. We demonstrated that the incorporation of the conjugated photoactive polymer into organolead halide perovskites did not only contribute to the generation of charges, but also enhance stability of solar cells by providing a barrier protection to halide perovskites. It is expected that versatile of conjugated semi-conductive polymers and halide perovskites in photoactive properties enables to create various combinations, forming composites with advantages offered by both types of photoactive materials.
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Affiliation(s)
- Heming Wang
- Materials & Engineering Research Institute, Sheffield Hallam University, City Campus, Howard Street, Sheffield, S1 1WB, UK
| | - Yaqub Rahaq
- Materials & Engineering Research Institute, Sheffield Hallam University, City Campus, Howard Street, Sheffield, S1 1WB, UK
| | - Vikas Kumar
- Materials & Engineering Research Institute, Sheffield Hallam University, City Campus, Howard Street, Sheffield, S1 1WB, UK
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27
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Zhou Y, Fox DS, Maguire P, O'Connell R, Masters R, Rodenburg C, Wu H, Dapor M, Chen Y, Zhang H. Quantitative secondary electron imaging for work function extraction at atomic level and layer identification of graphene. Sci Rep 2016; 6:21045. [PMID: 26878907 PMCID: PMC4754635 DOI: 10.1038/srep21045] [Citation(s) in RCA: 9] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/29/2015] [Accepted: 11/25/2015] [Indexed: 12/18/2022] Open
Abstract
Two-dimensional (2D) materials usually have a layer-dependent work function, which require fast and accurate detection for the evaluation of their device performance. A detection technique with high throughput and high spatial resolution has not yet been explored. Using a scanning electron microscope, we have developed and implemented a quantitative analytical technique which allows effective extraction of the work function of graphene. This technique uses the secondary electron contrast and has nanometre-resolved layer information. The measurement of few-layer graphene flakes shows the variation of work function between graphene layers with a precision of less than 10 meV. It is expected that this technique will prove extremely useful for researchers in a broad range of fields due to its revolutionary throughput and accuracy.
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Affiliation(s)
- Yangbo Zhou
- School of Physics and CRANN, Trinity College Dublin, Dublin 2, Ireland
| | - Daniel S Fox
- School of Physics and CRANN, Trinity College Dublin, Dublin 2, Ireland
| | - Pierce Maguire
- School of Physics and CRANN, Trinity College Dublin, Dublin 2, Ireland
| | - Robert O'Connell
- School of Physics and CRANN, Trinity College Dublin, Dublin 2, Ireland
| | - Robert Masters
- Department of Materials Science and Engineering, the University of Sheffield, Sir Robert Hadfield Building, Mappin Street, Sheffield S1 3JD,United Kingdom
| | - Cornelia Rodenburg
- Department of Materials Science and Engineering, the University of Sheffield, Sir Robert Hadfield Building, Mappin Street, Sheffield S1 3JD,United Kingdom
| | - Hanchun Wu
- Key Laboratory of Cluster Science of Ministry of Education, School of Physics, Beijing Institute of Technology, Beijing, 100081, People's Republic of China
| | - Maurizio Dapor
- European Centre for Theoretical Studies in Nuclear Physics and Related Areas (ECT*-FBK) and Trento Institute for Fundamental Physics and Applications (TIFPA-INFN), via Sommarive 18, Trento I-38123, Italy
| | - Ying Chen
- Institute for Frontier Materials, Deakin University, Waurn Ponds, Victoria 3216, Australia
| | - Hongzhou Zhang
- School of Physics and CRANN, Trinity College Dublin, Dublin 2, Ireland
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