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Weinhardt L, Wansorra C, Steininger R, Spangenberg T, Hauschild D, Heske C. High-transmission spectrometer for rapid resonant inelastic soft X-ray scattering (rRIXS) maps. JOURNAL OF SYNCHROTRON RADIATION 2024; 31:1481-1488. [PMID: 39347701 PMCID: PMC11542658 DOI: 10.1107/s160057752400804x] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/22/2024] [Accepted: 08/15/2024] [Indexed: 10/01/2024]
Abstract
The design and first results of a high-transmission soft X-ray spectrometer operated at the X-SPEC double-undulator beamline of the KIT Light Source are presented. As a unique feature, particular emphasis was placed on optimizing the spectrometer transmission by maximizing the solid angle and the efficiencies of spectrometer gratings and detector. A CMOS detector, optimized for soft X-rays, allows for quantum efficiencies of 90% or above over the full energy range of the spectrometer, while simultaneously offering short readout times. Combining an optimized control system at the X-SPEC beamline with continuous energy scans (as opposed to step scans), the high transmission of the spectrometer, and the fast readout of the CMOS camera, enable the collection of entire rapid resonant inelastic soft X-ray scattering maps in less than 1 min. Series of spectra at a fixed energy can be taken with a frequency of up to 5 Hz. Furthermore, the use of higher-order reflections allows a very wide energy range (45 to 2000 eV) to be covered with only two blazed gratings, while keeping the efficiency high and the resolving power E/ΔE above 1500 and 3000 with low- and high-energy gratings, respectively.
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Affiliation(s)
- Lothar Weinhardt
- Institute for Photon Science and Synchrotron Radiation (IPS)Karlsruhe Institute of Technology (KIT)Kaiserstr. 1276131KarlsruheGermany
- Institute for Chemical Technology and Polymer Chemistry (ITCP)Karlsruhe Institute of Technology (KIT)Kaiserstr. 1276131KarlsruheGermany
- Department of Chemistry and BiochemistryUniversity of Nevada, Las Vegas (UNLV)4505 Maryland ParkwayLas VegasNV89154-4003USA
| | - Constantin Wansorra
- Institute for Photon Science and Synchrotron Radiation (IPS)Karlsruhe Institute of Technology (KIT)Kaiserstr. 1276131KarlsruheGermany
- Department of Chemistry and BiochemistryUniversity of Nevada, Las Vegas (UNLV)4505 Maryland ParkwayLas VegasNV89154-4003USA
| | - Ralph Steininger
- Institute for Photon Science and Synchrotron Radiation (IPS)Karlsruhe Institute of Technology (KIT)Kaiserstr. 1276131KarlsruheGermany
| | - Thomas Spangenberg
- Institute for Photon Science and Synchrotron Radiation (IPS)Karlsruhe Institute of Technology (KIT)Kaiserstr. 1276131KarlsruheGermany
| | - Dirk Hauschild
- Institute for Photon Science and Synchrotron Radiation (IPS)Karlsruhe Institute of Technology (KIT)Kaiserstr. 1276131KarlsruheGermany
- Institute for Chemical Technology and Polymer Chemistry (ITCP)Karlsruhe Institute of Technology (KIT)Kaiserstr. 1276131KarlsruheGermany
- Department of Chemistry and BiochemistryUniversity of Nevada, Las Vegas (UNLV)4505 Maryland ParkwayLas VegasNV89154-4003USA
| | - Clemens Heske
- Institute for Photon Science and Synchrotron Radiation (IPS)Karlsruhe Institute of Technology (KIT)Kaiserstr. 1276131KarlsruheGermany
- Institute for Chemical Technology and Polymer Chemistry (ITCP)Karlsruhe Institute of Technology (KIT)Kaiserstr. 1276131KarlsruheGermany
- Department of Chemistry and BiochemistryUniversity of Nevada, Las Vegas (UNLV)4505 Maryland ParkwayLas VegasNV89154-4003USA
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Mostafa Y, Bouza Z, Byers J, Babenko I, Ubachs W, Versolato OO, Bayraktar M. Extreme ultraviolet broadband imaging spectrometer using dispersion-matched zone plates. OPTICS LETTERS 2023; 48:4316-4319. [PMID: 37582021 DOI: 10.1364/ol.496995] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/05/2023] [Accepted: 07/12/2023] [Indexed: 08/17/2023]
Abstract
We present simultaneous 1D imaging and broadband spectroscopy of a laser-produced plasma (LPP) source of extreme ultraviolet light, using a tapered zone plate that is matched to the dispersion of a transmission grating. We describe the design and fabrication of the zone plates in the 5-80 nm wavelength regime with designed spatial resolution of ∼10 µm and spectral resolution of ∼0.8 nm. Subsequently, we benchmark the imaging spectrometer with a solid tin target LPP. Plane wave propagation simulations qualitatively match the experimental results and confirm the device performance.
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3
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Reuss T, Nair Lalithambika SS, David C, Döring F, Jooss C, Risch M, Techert S. Advancements in Liquid Jet Technology and X-ray Spectroscopy for Understanding Energy Conversion Materials during Operation. Acc Chem Res 2023; 56:203-214. [PMID: 36636991 PMCID: PMC9910040 DOI: 10.1021/acs.accounts.2c00525] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/14/2023]
Abstract
ConspectusWater splitting is intensively studied for sustainable and effective energy storage in green/alternative energy harvesting-storage-release cycles. In this work, we present our recent developments for combining liquid jet microtechnology with different types of soft X-ray spectroscopy at high-flux X-ray sources, in particular developed for studying the oxygen evolution reaction (OER). We are particularly interested in the development of in situ photon-in/photon-out techniques, such as in situ resonant inelastic X-ray scattering (RIXS) techniques at high-repetition-frequency X-ray sources, pointing toward operando capabilities. The pilot catalytic systems we use are perovskites having the general structure ABO3 with lanthanides or group II elements at the A sites and transition metals at the B sites. Depending on the chemical substitutions of ABO3, their catalytic activity for OER can be tuned by varying the composition.In this work, we present our in situ RIXS studies of the manganese L-edge of perovskites during OER. We have developed various X-ray spectroscopy approaches like transmission zone plate-, reflection zone plate-, and grating-based emission spectroscopy techniques. Combined with tunable incident X-ray energies, we yield complementary information about changing (inverse) X-ray absorption features of the perovskites, allowing us to deduce element- and oxidation-state-specific chemical monitoring of the catalyst. Adding liquid jet technology, we monitor element- and oxidation-state-specific interactions of the catalyst with water adsorbate during OER. By comparing the different technical spectroscopy approaches combined with high-repetition-frequency experiments at synchrotrons and free-electron lasers, we conclude that the combination of liquid jet with low-resolution zone-plate-based X-ray spectroscopy is sufficient for element- and oxidation-state-specific chemical monitoring during OER and easy to handle.For an in-depth study of OER mechanisms, however, including the characterization of catalyst-water adsorbate in terms of their charge transfer properties and especially valence intermediates formed during OER, high-resolution spectroscopy tools based on a combination of liquid jets with gratings bear bigger potential since they allow resolution of otherwise-overlapping X-ray spectroscopy transitions. Common for all of these experimental approaches is the conclusion that without the versatile developments of liquid jets and liquid beam technologies, elaborate experiments such as high-repetition experiments at high-flux X-ray sources (like synchrotrons or free-electron lasers) would hardly be possible. Such experiments allow sample refreshment for every single X-ray shot for repetition frequencies of up to 5 MHz, so that it is possible (a) to study X-ray-radiation-sensitive samples and also (b) to utilize novel types of flux-hungry X-ray spectroscopy tools like photon-in/photon-out X-ray spectroscopy to study the OER.
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Affiliation(s)
- Torben Reuss
- Deutsches
Elektronen-Synchrotron DESY, Notkestr. 85, 22607 Hamburg, Germany
| | | | - Christian David
- Paul
Scherrer Institute, Forschungsstrasse 111, 5232 Villigen-PSI, Switzerland
| | - Florian Döring
- Paul
Scherrer Institute, Forschungsstrasse 111, 5232 Villigen-PSI, Switzerland
| | - Christian Jooss
- Institute
of Material Physics, Göttingen University, Friedrich Hund Platz 1, 37077 Göttingen, Germany
| | - Marcel Risch
- Institute
of Material Physics, Göttingen University, Friedrich Hund Platz 1, 37077 Göttingen, Germany
| | - Simone Techert
- Deutsches
Elektronen-Synchrotron DESY, Notkestr. 85, 22607 Hamburg, Germany,Institute
for X-ray Physics, Göttingen University, Friedrich Hund Platz 1, 37077 Göttingen, Germany,
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4
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Microstructure effects on the phase transition behavior of a prototypical quantum material. Sci Rep 2022; 12:10464. [PMID: 35729245 PMCID: PMC9213476 DOI: 10.1038/s41598-022-13872-0] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/28/2022] [Accepted: 05/30/2022] [Indexed: 11/08/2022] Open
Abstract
Materials with insulator-metal transitions promise advanced functionalities for future information technology. Patterning on the microscale is key for miniaturized functional devices, but material properties may vary spatially across microstructures. Characterization of these miniaturized devices requires electronic structure probes with sufficient spatial resolution to understand the influence of structure size and shape on functional properties. The present study demonstrates the use of imaging soft X-ray absorption spectroscopy with a spatial resolution better than 2 \documentclass[12pt]{minimal}
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\begin{document}$$\upmu$$\end{document}μm to study the insulator-metal transition in vanadium dioxide thin-film microstructures. This novel technique reveals that the transition temperature for the conversion from insulating to metallic vanadium dioxide is lowered by 1.2 K ± 0.4 K close to the structure edges compared to the center. Facilitated strain release during the phase transition is discussed as origin of the observed behavior. The experimental approach enables a detailed understanding of how the electronic properties of quantum materials depend on their patterning at the micrometer scale.
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Higley DJ, Ogasawara H, Zohar S, Dakovski GL. Using photoelectron spectroscopy to measure resonant inelastic X-ray scattering: a computational investigation. JOURNAL OF SYNCHROTRON RADIATION 2022; 29:202-213. [PMID: 34985437 PMCID: PMC8733969 DOI: 10.1107/s1600577521011917] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 02/28/2021] [Accepted: 11/10/2021] [Indexed: 06/14/2023]
Abstract
Resonant inelastic X-ray scattering (RIXS) has become an important scientific tool. Nonetheless, conventional high-resolution (few hundred meV or less) RIXS measurements, especially in the soft X-ray range, require low-throughput grating spectrometers, which limits measurement accuracy. Here, the performance of a different method for measuring RIXS, i.e. photoelectron spectrometry for analysis of X-rays (PAX), is computationally investigated. This method transforms the X-ray measurement problem of RIXS to an electron measurement problem, enabling use of high-throughput, compact electron spectrometers. X-rays to be measured are incident on a converter material and the energy distribution of the resultant photoelectrons, the PAX spectrum, is measured with an electron spectrometer. A deconvolution algorithm for analysis of such PAX data is proposed. It is shown that the deconvolution algorithm works well on data recorded with ∼0.5 eV resolution. Additional simulations show the potential of PAX for estimation of RIXS features with smaller widths. For simulations using the 3d levels of Ag as a converter material, and with 105 simulated detected electrons, it is estimated that features with a few hundred meV width can be accurately estimated in a model RIXS spectrum. For simulations using a sharp Fermi edge to encode RIXS spectra, it is estimated that one can accurately distinguish 100 meV FWHM peaks separated by 45 meV with 105 simulated detected electrons that were photoemitted from within 0.4 eV of the Fermi level.
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Affiliation(s)
- Daniel J. Higley
- SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, CA 94025, USA
| | - Hirohito Ogasawara
- SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, CA 94025, USA
| | - Sioan Zohar
- SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, CA 94025, USA
| | - Georgi L. Dakovski
- SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, CA 94025, USA
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6
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Flenner S, Kubec A, David C, Storm M, Schaber CF, Vollrath F, Müller M, Greving I, Hagemann J. Hard X-ray nano-holotomography with a Fresnel zone plate. OPTICS EXPRESS 2020; 28:37514-37525. [PMID: 33379584 DOI: 10.1364/oe.406074] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/25/2020] [Accepted: 10/21/2020] [Indexed: 06/12/2023]
Abstract
X-ray phase contrast nanotomography enables imaging of a wide range of samples with high spatial resolution in 3D. Near-field holography, as one of the major phase contrast techniques, is often implemented using X-ray optics such as Kirkpatrick-Baez mirrors, waveguides and compound refractive lenses. However, these optics are often tailor-made for a specific beamline and challenging to implement and align. Here, we present a near-field holography setup based on Fresnel zone plates which is fast and easy to align and provides a smooth illumination and flat field. The imaging quality of different types of Fresnel zone plates is compared in terms of the flat-field quality, the achievable resolution and exposure efficiency i.e. the photons arriving at the detector. Overall, this setup is capable of imaging different types of samples at high spatial resolution of below 100 nm in 3D with access to the quantitative phase information.
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7
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Lee SJ, Titus CJ, Alonso Mori R, Baker ML, Bennett DA, Cho HM, Doriese WB, Fowler JW, Gaffney KJ, Gallo A, Gard JD, Hilton GC, Jang H, Joe YI, Kenney CJ, Knight J, Kroll T, Lee JS, Li D, Lu D, Marks R, Minitti MP, Morgan KM, Ogasawara H, O'Neil GC, Reintsema CD, Schmidt DR, Sokaras D, Ullom JN, Weng TC, Williams C, Young BA, Swetz DS, Irwin KD, Nordlund D. Soft X-ray spectroscopy with transition-edge sensors at Stanford Synchrotron Radiation Lightsource beamline 10-1. THE REVIEW OF SCIENTIFIC INSTRUMENTS 2019; 90:113101. [PMID: 31779391 DOI: 10.1063/1.5119155] [Citation(s) in RCA: 18] [Impact Index Per Article: 3.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/09/2019] [Accepted: 10/17/2019] [Indexed: 06/10/2023]
Abstract
We present results obtained with a new soft X-ray spectrometer based on transition-edge sensors (TESs) composed of Mo/Cu bilayers coupled to bismuth absorbers. This spectrometer simultaneously provides excellent energy resolution, high detection efficiency, and broadband spectral coverage. The new spectrometer is optimized for incident X-ray energies below 2 keV. Each pixel serves as both a highly sensitive calorimeter and an X-ray absorber with near unity quantum efficiency. We have commissioned this 240-pixel TES spectrometer at the Stanford Synchrotron Radiation Lightsource beamline 10-1 (BL 10-1) and used it to probe the local electronic structure of sample materials with unprecedented sensitivity in the soft X-ray regime. As mounted, the TES spectrometer has a maximum detection solid angle of 2 × 10-3 sr. The energy resolution of all pixels combined is 1.5 eV full width at half maximum at 500 eV. We describe the performance of the TES spectrometer in terms of its energy resolution and count-rate capability and demonstrate its utility as a high throughput detector for synchrotron-based X-ray spectroscopy. Results from initial X-ray emission spectroscopy and resonant inelastic X-ray scattering experiments obtained with the spectrometer are presented.
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Affiliation(s)
- Sang-Jun Lee
- SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA
| | | | | | | | - Douglas A Bennett
- National Institute of Standards and Technology, Boulder, Colorado 80305, USA
| | - Hsiao-Mei Cho
- SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA
| | - William B Doriese
- National Institute of Standards and Technology, Boulder, Colorado 80305, USA
| | - Joseph W Fowler
- National Institute of Standards and Technology, Boulder, Colorado 80305, USA
| | - Kelly J Gaffney
- SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA
| | - Alessandro Gallo
- SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA
| | - Johnathon D Gard
- National Institute of Standards and Technology, Boulder, Colorado 80305, USA
| | - Gene C Hilton
- National Institute of Standards and Technology, Boulder, Colorado 80305, USA
| | - Hoyoung Jang
- SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA
| | - Young Il Joe
- National Institute of Standards and Technology, Boulder, Colorado 80305, USA
| | | | - Jason Knight
- SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA
| | - Thomas Kroll
- SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA
| | - Jun-Sik Lee
- SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA
| | - Dale Li
- SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA
| | - Donghui Lu
- SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA
| | - Ronald Marks
- SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA
| | - Michael P Minitti
- SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA
| | - Kelsey M Morgan
- National Institute of Standards and Technology, Boulder, Colorado 80305, USA
| | | | - Galen C O'Neil
- National Institute of Standards and Technology, Boulder, Colorado 80305, USA
| | - Carl D Reintsema
- National Institute of Standards and Technology, Boulder, Colorado 80305, USA
| | - Daniel R Schmidt
- National Institute of Standards and Technology, Boulder, Colorado 80305, USA
| | | | - Joel N Ullom
- National Institute of Standards and Technology, Boulder, Colorado 80305, USA
| | - Tsu-Chien Weng
- SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA
| | | | - Betty A Young
- Santa Clara University, Santa Clara, California 95053, USA
| | - Daniel S Swetz
- National Institute of Standards and Technology, Boulder, Colorado 80305, USA
| | - Kent D Irwin
- SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA
| | - Dennis Nordlund
- SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA
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8
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Miedema PS, Thielemann-Kühn N, Calafell IA, Schüßler-Langeheine C, Beye M. Strain analysis from M-edge resonant inelastic X-ray scattering of nickel oxide films. Phys Chem Chem Phys 2019; 21:21596-21602. [PMID: 31538993 DOI: 10.1039/c9cp03593a] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/21/2023]
Abstract
Electronic structure modifications due to strain are an effective method for tailoring nano-scale functional materials. Demonstrated on nickel oxide (NiO) thin films, Resonant Inelastic X-ray Scattering (RIXS) at the transition-metal M2,3-edge is shown to be a powerful tool for measuring the electronic structure modification due to strain in the near-surface region. Analyses from the M2,3-edge RIXS in comparison with dedicated crystal field multiplet calculations show distortions in 40 nm NiO grown on a magnesium oxide (MgO) substrate (NiO/MgO) similar to those caused by surface relaxation of bulk NiO. The films of 20 and 10 nm NiO/MgO show slightly larger differences from bulk NiO. Quantitatively, the NiO/MgO samples all are distorted from perfect octahedral (Oh) symmetry with a tetragonal parameter Ds of about -0.1 eV, very close to the Ds distortion from octahedral (Oh) symmetry parameter of -0.11 eV obtained for the surface-near region from a bulk NiO crystal. Comparing the spectra of a 20 nm film of NiO grown on a 20 nm magnetite (Fe3O4) film on a MgO substrate (NiO/Fe3O4/MgO) with the calculated multiplet analyses, the distortion parameter Ds appears to be closer to zero, showing that the surface-near region of this templated film is less distorted from Oh symmetry than the surface-near region in bulk NiO. Finally, the potential of M2,3-edge RIXS for other investigations of strain on electronic structure is discussed.
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Affiliation(s)
- P S Miedema
- Deutsches Elektronen Synchrotron DESY, Notkestraße 85, 22607 Hamburg, Germany.
| | - N Thielemann-Kühn
- Institute Methods and Instrumentation for Synchrotron Radiation Research (FG-ISRR), Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Albert-Einstein-Straße 15, 12489 Berlin, Germany and Institut für Physik und Astronomie, Universität Potsdam, Karl-Liebknecht-Straße 24/25, 14476 Potsdam, Germany
| | - I Alonso Calafell
- Institute Methods and Instrumentation for Synchrotron Radiation Research (FG-ISRR), Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Albert-Einstein-Straße 15, 12489 Berlin, Germany
| | - C Schüßler-Langeheine
- Institute Methods and Instrumentation for Synchrotron Radiation Research (FG-ISRR), Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Albert-Einstein-Straße 15, 12489 Berlin, Germany
| | - M Beye
- Deutsches Elektronen Synchrotron DESY, Notkestraße 85, 22607 Hamburg, Germany.
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Döring F, Risch M, Rösner B, Beye M, Busse P, Kubiček K, Glaser L, Miedema PS, Soltau J, Raiser D, Guzenko VA, Szabadics L, Kochanneck L, Baumung M, Buck J, Jooss C, Techert S, David C. A zone-plate-based two-color spectrometer for indirect X-ray absorption spectroscopy. JOURNAL OF SYNCHROTRON RADIATION 2019; 26:1266-1271. [PMID: 31274453 PMCID: PMC6613121 DOI: 10.1107/s1600577519003898] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 10/03/2018] [Accepted: 03/21/2019] [Indexed: 06/09/2023]
Abstract
X-ray absorption spectroscopy (XAS) is a powerful element-specific technique that allows the study of structural and chemical properties of matter. Often an indirect method is used to access the X-ray absorption (XA). This work demonstrates a new XAS implementation that is based on off-axis transmission Fresnel zone plates to obtain the XA spectrum of La0.6Sr0.4MnO3 by analysis of three emission lines simultaneously at the detector, namely the O 2p-1s, Mn 3s-2p and Mn 3d-2p transitions. This scheme allows the simultaneous measurement of an integrated total fluorescence yield and the partial fluorescence yields (PFY) of the Mn 3s-2p and Mn 3d-2p transitions when scanning the Mn L-edge. In addition to this, the reduction in O fluorescence provides another measure for absorption often referred to as the inverse partial fluorescence yield (IPFY). Among these different methods to measure XA, the Mn 3s PFY and IPFY deviate the least from the true XA spectra due to the negligible influence of selection rules on the decay channel. Other advantages of this new scheme are the potential to strongly increase the efficiency and throughput compared with similar measurements using conventional gratings and to increase the signal-to-noise of the XA spectra as compared with a photodiode. The ability to record undistorted bulk XA spectra at high flux is crucial for future in situ spectroscopy experiments on complex materials.
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Affiliation(s)
- Florian Döring
- Laboratory for Micro- and Nanotechnology, Paul Scherrer Institut, 5232 Villigen PSI, Switzerland
| | - Marcel Risch
- Institute of Materials Physics, Georg-August-Universität Göttingen, 37077 Göttingen, Germany
| | - Benedikt Rösner
- Laboratory for Micro- and Nanotechnology, Paul Scherrer Institut, 5232 Villigen PSI, Switzerland
| | - Martin Beye
- Photon Science, Deutsches Elektronen-Synchrotron DESY, 22607 Hamburg, Germany
| | - Philipp Busse
- Institute of Materials Physics, Georg-August-Universität Göttingen, 37077 Göttingen, Germany
- Photon Science, Deutsches Elektronen-Synchrotron DESY, 22607 Hamburg, Germany
- Max Planck Institute for Biophysical Chemistry, 37077 Göttingen, Germany
| | - Katharina Kubiček
- Photon Science, Deutsches Elektronen-Synchrotron DESY, 22607 Hamburg, Germany
| | - Leif Glaser
- Photon Science, Deutsches Elektronen-Synchrotron DESY, 22607 Hamburg, Germany
| | - Piter S. Miedema
- Photon Science, Deutsches Elektronen-Synchrotron DESY, 22607 Hamburg, Germany
| | - Jakob Soltau
- Institute of X-ray Physics, Georg-August-Universität Göttingen, 37077 Göttingen, Germany
| | - Dirk Raiser
- Max Planck Institute for Biophysical Chemistry, 37077 Göttingen, Germany
| | - Vitaliy A. Guzenko
- Laboratory for Micro- and Nanotechnology, Paul Scherrer Institut, 5232 Villigen PSI, Switzerland
| | - Lukas Szabadics
- Institute of Materials Physics, Georg-August-Universität Göttingen, 37077 Göttingen, Germany
| | - Leif Kochanneck
- Institute of Materials Physics, Georg-August-Universität Göttingen, 37077 Göttingen, Germany
| | - Max Baumung
- Institute of Materials Physics, Georg-August-Universität Göttingen, 37077 Göttingen, Germany
| | - Jens Buck
- Photon Science, Deutsches Elektronen-Synchrotron DESY, 22607 Hamburg, Germany
| | - Christian Jooss
- Institute of Materials Physics, Georg-August-Universität Göttingen, 37077 Göttingen, Germany
| | - Simone Techert
- Photon Science, Deutsches Elektronen-Synchrotron DESY, 22607 Hamburg, Germany
- Max Planck Institute for Biophysical Chemistry, 37077 Göttingen, Germany
- Institute of X-ray Physics, Georg-August-Universität Göttingen, 37077 Göttingen, Germany
| | - Christian David
- Laboratory for Micro- and Nanotechnology, Paul Scherrer Institut, 5232 Villigen PSI, Switzerland
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Beye M, Engel RY, Schunck JO, Dziarzhytski S, Brenner G, Miedema PS. Non-linear soft x-ray methods on solids with MUSIX-the multi-dimensional spectroscopy and inelastic x-ray scattering endstation. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2019; 31:014003. [PMID: 30504529 DOI: 10.1088/1361-648x/aaedf3] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/09/2023]
Abstract
With the intense and coherent x-ray pulses available from free-electron lasers, the possibility to transfer non-linear spectroscopic methods from the laser lab to the x-ray world arises. Advantages especially regarding selectivity and thus information content as well as an improvement of signal levels are expected. The use of coherences is especially fruitful and the example of coherent x-ray/optical sum-frequency generation is discussed. However, many non-linear x-ray methods still await discovery, partially due to the necessity for extremely adaptable and versatile instrumentation that can be brought to free-electron lasers for the analysis of the spectral content emitted from the sample into a continuous range of emission angles. Such an instrument (called MUSIX) is being developed and employed at FLASH, the free-electron laser in Hamburg and is described in this contribution together with first results.
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Affiliation(s)
- M Beye
- Deutsches Elektronen Synchrotron DESY, Notkestr. 85, 22607 Hamburg, Germany. Physics Department, Universität Hamburg, Luruper Chaussee 149, 22761 Hamburg, Germany
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11
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Yin Z, Löchel H, Rehanek J, Goy C, Kalinin A, Schottelius A, Trinter F, Miedema P, Jain A, Valerio J, Busse P, Lehmkühler F, Möller J, Grübel G, Madsen A, Viefhaus J, Grisenti RE, Beye M, Erko A, Techert S. X-ray spectroscopy with variable line spacing based on reflection zone plate optics. OPTICS LETTERS 2018; 43:4390-4393. [PMID: 30211872 DOI: 10.1364/ol.43.004390] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/23/2018] [Accepted: 08/09/2018] [Indexed: 06/08/2023]
Abstract
X-ray spectroscopy is a method, ideally suited for investigating the electronic structure of matter, which has been enabled by the rapid developments in light sources and instruments. The x-ray fluorescence lines of life-relevant elements such as carbon, nitrogen, and oxygen are located in the soft x-ray regime and call for suitable spectrometer devices. In this Letter, we present a high-resolution spectrum of liquid water, recorded with a soft x-ray spectrometer based on a reflection zone plate (RZP) design. The RZP-based spectrometer with meridional variation of line space density from 2953 to 3757 l/mm offers extremely high detection efficiency and, at the same time, medium energy resolution. We can reproduce the well-known splitting of liquid water in the lone pair regime with 10 s acquisition time.
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Miedema PS, Beye M. Total 3s Emission Yield as Bulk-Sensitive Probe for a True Soft X-ray Absorption Spectrum? J Phys Chem Lett 2018; 9:2579-2583. [PMID: 29715037 DOI: 10.1021/acs.jpclett.8b00720] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 05/06/2023]
Abstract
The detection of the true soft X-ray absorption typically needs specially prepared submicrometer thin samples for transmission measurements. Bulk experiments instead have to rely on yield methods, for example, electron yield with limitations for insulating samples, sensitivity to applied fields, and with limited bulk sensitivity. Fluorescence yield methods instead do not have those limitations but have been found to deviate, in general, from the absorption spectrum. We demonstrate that restricting the detection to the 3s fluorescence channel (with the detector at a special angle where all polarizations contribute equally) restores the true X-ray absorption spectrum for all 3d-metal L2,3 edges. These theoretically derived results are rationalized by the lack of 3s-3d interaction in the core-excited state. Comparing X-ray absorption versus 3s-PFY for arbitrary detection geometries for both linear and circular polarized light, deviations appear that can become as large as 15%.
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Affiliation(s)
- Piter S Miedema
- DESY Photon Science, FS-FLASH , Notkestraße 85 , 22607 Hamburg , Germany
| | - Martin Beye
- DESY Photon Science, FS-FLASH , Notkestraße 85 , 22607 Hamburg , Germany
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