Establishing Ohmic contacts for in situ current-voltage characteristic measurements on a carbon nanotube inside the scanning electron microscope

Establishing Ohmic Contact of a Radial Compressed CNT Bundle with High Work Function Metal

Establishing low-resistance ohmic contact is critical for developing electronic devices based on traditional silicon and new low-dimensional materials. Due to unprecedented electronic and mechanical properties, the one-dimensional carbon nanotubes (CNTs) have been used as source/drain, gate, or tunnel to fabricate transistors. However, the mechanism causing low-resistance ohmic contact is not clear yet. Here, the hybrid atomic force microscopy-scanning electron microscopy (AFM-SEM) instrument was developed to establish lower-resistance ohmic contact between a radial compressed deformed multiwalled CNT bundle and high work function metal (platinum and gold). The radial compression structure under strong van der Waals attraction was in situ characterized through the SEM image to obtain the diameter and width and through AFM to get height and to perform nanoindentation, indicating that Pt has the smaller radial compression deformation. Molecular dynamics simulations exhibit that compared to Pt, a wider ribbon-like graphene layer formed when the radial compressed CNTs contacted with Au. The bond forming and electron orbital overlapping between C atoms of deformed CNTs and the high work function metal atom is beneficial for good electrical contact.

New Insights into the Metallization of Graphene-Supported Composite Materials-from 3D Cu-Grown Structures to Free-Standing Electrodeposited Porous Ni Foils

The conductivity and the state of the surface of supports are of vital importance for metallization via electrodeposition. In this study, we show that the metallization of a carbon fiber-reinforced polymer (CFRP) can be carried out directly if the intermediate graphene oxide (GO) layer is chemically reduced on the CFRP surface. Notably, this approach utilizing only the chemically reduced GO as a conductive support allows us to obtain insights into the interaction of rGO and the electrodeposited metal. Our study reveals that under the same contact current experimental conditions, the electrodeposition of Cu and Ni on rGO follows significantly different deposition modes, resulting in the formation of three-dimensional (3D) and free-standing metallic foils, respectively. Considering that Ni adsorption energy is larger than Ni cohesive energy, it is expected that the adhesion of Ni on rGO@CFRP is enhanced compared to Cu. In contrast, the adhesion of deposited Ni is reduced, suggesting diffusion of H⁺ between rGO and CFRP, which promotes the hydrogen evolution reaction (HER) and results in the formation of free-standing Ni foils. We ascribe this phenomenon to the unique properties of rGO and the nature of Cu and Ni deposition from electrolytic baths. In the latter, the high adsorption energy of Ni on defective rGO along with HER is the key factor for the formation of the porous layer and free-standing foils.

Recent Advances on SEM-Based In Situ Multiphysical Characterization of Nanomaterials

Functional nanomaterials possess exceptional mechanical, electrical, and optical properties which have significantly benefited their diverse applications to a variety of scientific and engineering problems. In order to fully understand their characteristics and further guide their synthesis and device application, the multiphysical properties of these nanomaterials need to be characterized accurately and efficiently. Among various experimental tools for nanomaterial characterization, scanning electron microscopy- (SEM-) based platforms provide merits of high imaging resolution, accuracy and stability, well-controlled testing conditions, and the compatibility with other high-resolution material characterization techniques (e.g., atomic force microscopy), thus, various SEM-enabled techniques have been well developed for characterizing the multiphysical properties of nanomaterials. In this review, we summarize existing SEM-based platforms for nanomaterial multiphysical (mechanical, electrical, and electromechanical) in situ characterization, outline critical experimental challenges for nanomaterial optical characterization in SEM, and discuss potential demands of the SEM-based platforms to characterizing multiphysical properties of the nanomaterials.

Electrical Conductivity of Multiwall Carbon Nanotube Bundles Contacting with Metal Electrodes by Nano Manipulators inside SEM

Determining the metallicity and semiconductivity of a multi-walled carbon nanotube (MWCNT) bundle plays a particularly vital role in its interconnection with the metal electrode of an integrated circuit. In this paper, an effective method is proposed to determine the electrical transport properties of an MWCNT bundle using a current-voltage characteristic curve during its electrical breakdown. We established the reliable electrical nanoscale contact between the MWCNT bundle and metal electrode using a robotic manipulation system under scanning electron microscope (SEM) vacuum conditions. The experimental results show that the current-voltage curve appears as saw-tooth-like current changes including up and down steps, which signify the conductance and breakdown of carbon shells in the MWCNT bundle, respectively. Additionally, the power law nonlinear behavior of the current-voltage curve indicates that the MWCNT bundle is semiconducting. The molecular dynamics simulation explains that the electron transport between the inner carbon shells, between the outermost carbon shells and gold metal electrode and between the outermost carbons shells of two adjacent individual three-walled carbon nanotubes (TWCNTs) is through their radial deformation. Density functional theory (DFT) calculations elucidate the electron transport mechanism between the gold surface and double-wall carbon nanotube (DWCNT) and between the inner and outermost carbon shells of DWCNT using the charge density difference, electrostatic potential and partial density of states.

A Universal Method to Weld Individual One-Dimensional Nanostructures with a Tungsten Needle Based on Synergy of the Electron Beam and Electrical Current

One-dimensional (1D) nanostructures are extensively used in the design of novel electronic devices, sensors, and energy devices. One of the major challenges faced by the electronics industry is the problem of contact between the 1D nanostructure and electrode, which can limit or even jeopardize device operations. Herein, a universal method that can realize good Ohmic and mechanical contact between an individual 1D nanostructure and a tungsten needle at sub-micron or micron scale is investigated and presented in a scanning electron microscope (SEM) chamber with the synergy of an electron beam and electrical current flowing through the welded joint. The linear I‒V curves of five types of individual 1D nanostructures, characterized by in-situ electrical measurements, demonstrate that most of them demonstrate good Ohmic contact with the tungsten needle, and the results of in-situ tensile measurements demonstrate that the welded joints possess excellent mechanical performance. By simulation analysis using the finite element method, it is proved that the local heating effect, which is mainly produced by the electrical current flowing through the welded joints during the welding process, is the key factor in achieving good Ohmic contact.

Environmentally and Mechanically Stable Selenium 1D/2D Hybrid Structures for Broad-Range Photoresponse from Ultraviolet to Infrared Wavelengths

Selenium (Se) is one of the potential candidates as photodetector because of its outstanding properties such as high photoconductivity (∼8 × 10⁴ S cm^-1), piezoelectricity, thermoelectricity, and nonlinear optical responses. Solution phase synthesis becomes an efficient way to produce Se, but a contamination issue that could deteriorate the electric characteristic of Se should be taken into account. In this work, a facile, controllable approach of synthesizing Se nanowires (NWs)/films via a plasma-assisted growth process was demonstrated at the low substrate temperature of 100 °C. The detailed formation mechanisms of nanowires arrays to thin films at different plasma powers were investigated. Moreover, indium (In) layer was used to enhance the adhesive strength with 50% improvement on a SiO₂/Si substrate by mechanical interlocking and surface alloying between Se and In layers, indicating great tolerance for mechanical stress for future wearable devices applications. Furthermore, the direct growth of Se NWs/films on a poly(ethylene terephthalate) substrate was demonstrated, exhibiting a visible to broad infrared detection ranges from 405 to 1555 nm with a high on/off ratio of ∼700 as well as the fast response time less than 25 ms. In addition, the devices exhibited fascinating stability in the atmosphere over one month.

Investigating the impact of SEM chamber conditions and imaging parameters on contact resistance of in situ nanoprobing

In this paper, we investigate the impact of vacuum chamber conditions (cleanliness level and vacuum pressure) and imaging parameters (magnification and acceleration voltage) of scanning electron microscopy (SEM) on the contact resistance of two-point in situ nanoprobing of nanomaterials. Using two typical types of conductive nanoprobe, two-point nanoprobing is performed on silicon nanowires, during which changing trends of the nanoprobing contact resistance with the SEM chamber conditions and imaging parameters are quantified. The mechanisms underlying the experimental observations are also explained. Through systematically adjusting the experimental parameters, the probe-sample contact resistance is significantly reduced from the mega-ohm level to the kilo-ohm level. The experimental results can serve as a guideline to evaluate electrical contacts of nanoprobing and instruct how to reduce the contact resistance in SEM-based, two-point nanoprobing.

Epitaxial growth of multiwall carbon nanotube from stainless steel substrate and effect on electrical conduction and field emission

The epitaxial growth of carbon nanotubes (CNTs) is an important subject of research. Recent attention has been paid to finding new strategies for the controlled growth of single-wall CNTs with a defined chirality. In addition, many potential applications require multiwall CNTs (MWCNTs) to grow vertically from the substrate and the interface property is crucial. Here, we report for the first time that MWCNTs can grow directly from the surface of a substrate by epitaxy, based on the experimental study of individual multiwall carbon nanotubes on a large-area stainless steel substrate, which is a very useful system for electrical and mechanical applications. In particular, evidence is given of the lattice matching between the MWCNT and the lattice of a hexagonal Cr₂O₃: (Fe, Mn) film formed on the surface of the substrate. Furthermore, a method is developed to increase the density of the MWCNTs; a mechanism of simultaneous top and bottom growth is proposed. The resultant significantly improved electrical transport and field emission properties are also presented, showing the Ohmic contact for electrical conduction and high performance in resisting the catastrophic cold-cathode vacuum breakdown of the CNTs.

Recent advances in nanorobotic manipulation inside scanning electron microscopes

A scanning electron microscope (SEM) provides real-time imaging with nanometer resolution and a large scanning area, which enables the development and integration of robotic nanomanipulation systems inside a vacuum chamber to realize simultaneous imaging and direct interactions with nanoscaled samples. Emerging techniques for nanorobotic manipulation during SEM imaging enable the characterization of nanomaterials and nanostructures and the prototyping/assembly of nanodevices. This paper presents a comprehensive survey of recent advances in nanorobotic manipulation, including the development of nanomanipulation platforms, tools, changeable toolboxes, sensing units, control strategies, electron beam-induced deposition approaches, automation techniques, and nanomanipulation-enabled applications and discoveries. The limitations of the existing technologies and prospects for new technologies are also discussed.

Growth and composition of nanostructured and nanoporous cerium oxide thin films on a graphite foil

The morphology and composition of CeOx films prepared by r.f. magnetron sputtering on a graphite foil have been investigated mainly by using microscopy methods. This study presents the formation of nanocrystalline layers with porous structure due to the modification of a carbon support and the formation of cerium carbide crystallites as a result of the deposition process. Chemical analyses of the layers with different thicknesses performed by energy dispersive X-ray spectroscopy, electron energy loss spectroscopy and X-ray photoelectron spectroscopy have pointed to the reduction of the cerium oxide layers. In the deposited layers, cerium was present in mixed Ce(3+) and Ce(4+) valence. Ce(3+) species were located mainly at the graphite foil-CeOx interface and the chemical state of cerium was gradually changing to Ce(4+) going to the layer surface. It became more stoichiometric in the case of thicker layers except for the surface region, where the presence of Ce(3+) was associated with oxygen vacancies on the surface of cerium oxide grains. The degree of cerium oxide reduction is discussed in the context of particle size.

A platform for in-situ multi-probe electronic measurements and modification of nanodevices inside a transmission electron microscope

We developed a new platform that enables in-situ four-probe electronic measurements, in-situ three-probe field-effect measurements, nanomanipulation, and in-situ modification of nanodevices inside a transmission electron microscope (TEM). The platform includes a specially designed chip-holder and a silicon (Si) chip with suspended metal electrodes. The chip-holder can hold one Si chip with a size up to 3 mm × 3 mm and provides four electrical connections that can be connected to the micrometer-sized electrodes on the Si chip by wire-bonding. The other side of the electrical connections on the chip-holder is connected to the electronic instruments outside the TEM through a commercial Nanofactory SPM-TEM holder. The Si chip with suspended metal electrodes on one of its edges was fabricated by lithography and wet etching. Carbon nanotubes (CNTs), InAs nanowires, and tungsten disulfide nanowires were placed to stride over and connect to the suspended electrodes on the Si chip by nanomanipulations inside a scanning electron microscope (SEM). By using the platform, I-V curves of an individual single-walled CNT connecting to four electrodes were in-situ measured between any two of the four suspended electrodes, and a high-resolution TEM image of the same CNT was obtained. Furthermore, four-terminal I-V measurement on an InAs nanowire was achieved on this platform, and with a movable probe used as a gate electrode, field-effect measurement on the same InAs nanowire device was accomplished in SEM. In addition, by using the movable probe on the SPM-TEM holder, we could further in-situ modify nanomaterial and nanodevices. The present work demonstrates a method that allows a direct correlation between the atomic-level structure and the electronic property of nanomaterials or nanodevices whose structure can be further modified in-situ.

Development and application of multiple-probe scanning probe microscopes

In the research of advanced materials based on nanoscience and nanotechnology, it is often desirable to measure nanoscale local electrical conductivity at a designated position of a given sample. For this purpose, multiple-probe scanning probe microscopes (MP-SPMs), in which two, three or four scanning tunneling microscope (STM) or atomic force microscope (AFM) probes are operated independently, have been developed. Each probe in an MP-SPM is used not only for observing high-resolution STM or AFM images but also for forming an electrical contact enabling nanoscale local electrical conductivity measurement. The world's first double-probe STM (DP-STM) developed by the authors, which was subsequently modified to a triple-probe STM (TP-STM), has been used to measure the conductivities of one-dimensional metal nanowires and carbon nanotubes and also two-dimensional molecular films. A quadruple-probe STM (QP-STM) has also been developed and used to measure the conductivity of two-dimensional molecular films without the ambiguity of contact resistance between the probe and sample. Moreover, a quadruple-probe AFM (QP-AFM) with four conductive tuning-fork-type self-detection force sensing probes has been developed to measure the conductivity of a nanostructure on an insulating substrate. A general-purpose computer software to control four probes at the same time has also been developed and used in the operation of the QP-AFM. These developments and applications of MP-SPMs are reviewed in this paper.

Field-effect transistors based on thermally treated electron beam-induced carbonaceous patterns

Electron beam-induced carbonaceous deposition (EBICD) derived from residual hydrocarbons in the vacuum chamber has many fascinating properties. It is known to be chemically complex but robust, structurally amorphous, and electrically insulating. The present study is an attempt to gain more insight into its chemical and electrical nature based on detailed measurements such as Raman, XPS, TEM, and electrical. Interestingly, EBIC patterns are found to be blue fluorescent when excited with UV radiation, a property which owes much to sp(2) carbon clusters amidst sp(3) matrix. Temperature-dependent Raman and electrical measurements have confirmed the graphitization of the EBICD through the decomposition of functional groups above 300 °C. Finally, graphitized EBIC patterns have been employed as active p-type channel material in the field-effect transistors to obtain mobilities in the range of 0.2-4 cm(2)/V s.

ELECTRON BEAM INDUCED CARBONACEOUS DEPOSITION AS A LOCAL DIELECTRIC FOR CNT CIRCUITS

Evaluating the electrical nature of carbon nanotubes (CNTs) from a collection requires establishing electrical contacts across individual CNTs lying on a dielectric layer. In this work, it is shown how a dielectric layer may be inserted underneath a chosen CNT. This has been accomplished by the electron beam induced carbonaceous deposition process in the presence of moisture and residual hydrocarbons present in the SEM chamber. When performed at a CNT location on a Si substrate, the CNT instead of getting buried underneath is found to be lifted on top of the carbonaceous platform, as if due to nonwetting nature of CNT surface. By fixing one end of the CNT on the Ag/Si substrate using a Pt deposit and lifting rest of the length to lie on a carbonaceous platform, the I–V data from nanotubes of varying resistances have been collected using conducting AFM. The chosen nanotubes have also been examined by Raman measurements. The method is particularly useful while working with a random collection of nanotubes resulting from a chemical process.

A quadruple-scanning-probe force microscope for electrical property measurements of microscopic materials

Four-terminal electrical measurement is realized on a microscopic structure in air, without a lithographic process, using a home-built quadruple-scanning-probe force microscope (QSPFM). The QSPFM has four probes whose positions are individually controlled by obtaining images of a sample in the manner of atomic force microscopy (AFM), and uses the probes as contacting electrodes for electrical measurements. A specially arranged tuning fork probe (TFP) is used as a self-detection force sensor to operate each probe in a frequency modulation AFM mode, resulting in simultaneous imaging of the same microscopic feature on an insulator using the four TFPs. Four-terminal electrical measurement is then demonstrated in air by placing each probe electrode in contact with a graphene flake exfoliated on a silicon dioxide film, and the sheet resistance of the flake is measured by the van der Pauw method. The present work shows that the QSPFM has the potential to measure the intrinsic electrical properties of a wide range of microscopic materials in situ without electrode fabrication.

The effect of amorphous carbon layer on the field emission characteristics of carbon nanotube film

Carbon nanotube (CNT) has excellent field emission characteristics and could play as a good cold cathode in the application of vacuum electronic devices. However, the practical application faces a big obstacle regarding current fluctuation and deterioration of the CNT cathode. In this research, the formation of amorphous carbon (ac) layer between the CNT film and the substrate, and the effect of the existence of this layer on field emission stability of the CNT film are studied. The formation of the ac layer could be controlled by adjustment of growth temperature and hydrocarbon flow rate. The field emission character and current stability of the CNT film without ac layer are better than those of the CNT film with ac layer. The results attribute to the ac layer a thermal disequilibrium state under high current level. Moreover, adhesion capacity of the CNT film without ac layer is also better than that with the ac layer. It is concluded that the ac layer between the CNT film and substrate is a key factor in the stability of field emission characteristics and should be eliminated before applications.

Low energy electron point source microscopy: beyond imaging

Low energy electron point source (LEEPS) microscopy has the capability to record in-line holograms at very high magnifications with a fairly simple set-up. After the holograms are numerically reconstructed, structural features with the size of about 2 nm can be resolved. The achievement of an even higher resolution has been predicted. However, a number of obstacles are known to impede the realization of this goal, for example the presence of electric fields around the imaged object, electrostatic charging or radiation induced processes. This topical review gives an overview of the achievements as well as the difficulties in the efforts to shift the resolution limit of LEEPS microscopy towards the atomic level. A special emphasis is laid on the high sensitivity of low energy electrons to electrical fields, which limits the structural determination of the imaged objects. On the other hand, the investigation of the electrical field around objects of known structure is very useful for other tasks and LEEPS microscopy can be extended beyond the task of imaging. The determination of the electrical resistance of individual nanowires can be achieved by a proper analysis of the corresponding LEEPS micrographs. This conductivity imaging may be a very useful application for LEEPS microscopes.

Selective tuning and optimization of the contacts to metallic and semiconducting single-walled carbon nanotubes

Conductance imaging atomic force microscopy was used to probe the electrical interface between single-walled carbon nanotubes and metal electrodes. The contact resistance was optimized by applying a local voltage pulse (approximately 2 s) using a conductive probe with controlled loading force to the region of the metal electrode contacting the nanotube. Using this technique, we show that Pd forms superior contacts, resulting in contact resistance values that are among the lowest ever reported.

Fabrication of nanochannels with water-dissolvable nanowires

We report here a template method for the fabrication of nanochannels with water-dissolvable NaNH(4)Mo(3)O(10).H(2)O nanowires as the sacrificial material. By using these nanowires, which have diameters ranging from 20 to 150 nm and lengths up to a hundred microns, we have demonstrated that it is possible to obtain nanochannels with the desired shape of cross section, and desired types of channel material, such as metals and oxides. This technique shows a good potential for the development of various microfluidic and nanofluidic devices.

Optimization of multi-walled carbon nanotube-metal contacts by electrical stressing

We present experimental data on the contact resistances of three different metal probes, tungsten, palladium and indium, with chemical vapour deposited (CVD) multi-wall carbon nanotubes (MWCNTs). We demonstrate that there is an irreversible modification of the contacts following electrical stressing whereby the circuit resistance converges towards its optimal value prior to current-induced tube failure. Once the probe-MWCNT contact is broken, subsequent recontact experiments reveal that the circuit resistance returns to its initial high level, demonstrating that the modification occurs at the probe contact location and not elsewhere in the circuit. Contact studies with the different metals reveal that Pd metal provides the lowest resistance contact to the MWCNT in our sample.

Electrical conductivity studies on individual conjugated polymer nanowires: two-probe and four-probe results

Two- and four-probe electrical measurements on individual conjugated polymer nanowires with different diameters ranging from 20 to 190 nm have been performed to study their conductivity and nanocontact resistance. The two-probe results reveal that all the measured polymer nanowires with different diameters are semiconducting. However, the four-probe results show that the measured polymer nanowires with diameters of 190, 95-100, 35-40 and 20-25 nm are lying in the insulating, critical, metallic and insulting regimes of metal-insulator transition, respectively. The 35-40 nm nanowire displays a metal-insulator transition at around 35 K. In addition, it was found that the nanocontact resistance is in the magnitude of 104Ω at room temperature, which is comparable to the intrinsic resistance of the nanowires. These results demonstrate that four-probe electrical measurement is necessary to explore the intrinsic electronic transport properties of isolated nanowires, especially in the case of metallic nanowires, because the metallic nature of the measured nanowires may be coved by the nanocontact resistance that cannot be excluded by a two-probe technique.

Graphitic electrical contacts to metallic single-walled carbon nanotubes using Pt electrodes

We investigate electronic devices consisting of individual, metallic, single-walled carbon nanotubes contacted by Pt electrodes in a field effect transistor configuration, focusing on improvements to the metal-nanotube contact resistance as the devices are annealed in inert environments including ultrahigh vacuum. At moderate temperatures (T < 880 K), thermal processing results in high resistance contacts with thermally activated barriers. Higher temperatures (T > 880 K) achieve nearly transparent contacts. In the latter case, analytical surface measurements reveal the catalytic decomposition of hydrocarbons into graphene layers on the Pt surface, suggesting that improved electronic behavior is primarily due to the formation of an all-carbon nanotube-graphite interface rather than to the improvement of the nanotube-Pt one.

The fabrication of nanoelectrodes based on a single carbon nanotube

Nanoelectrodes are fabricated from individual carbon nanotubes (CNTs) connected to tungsten probes or carbon fibers. The whole electrode was covered by an insulating HfO(2) layer except for a section of conducting CNT at the apex. The fabrication process includes mounting individual CNTs to the conductive support through nanomanipulation, coating the whole probe by a dielectric layer using atomic layer deposition and removing the dielectric layer at the apex through a nanomanipulation process. Differential pulse voltammetry and cyclic voltammetry measurements show the CNT nanoelectrode has similar electrochemical behavior to the widely used carbon fiber probe, but has a much smaller active electrode area and can provide much higher spatial resolution and signal-to-noise ratio.

In situ comprehensive characterization of optoelectronic nanomaterials for device purposes

We have combined optical fiber probe and nanoprobe techniques in a scanning electron microscope, which enables in situ optical, electrical and structural characterization of optoelectronic nanomaterials and nanodevices. The nanoprobe technique, employing sharp metal tips, is used for in situ nano-manipulation, contact and electrical measurement. The fiber probe, coupled to a spectrometer or a laser and controlled by a nano-manipulator, allows local optical detection or excitation. We show in situ assembly of a light emitter and photodetector based on individual nanostructures, demonstrating the potential application of the above technique in building prototype optoelectronic devices and selecting suitable nanostructures for device purposes. In addition, the angular resolving power of the fiber probe detection is demonstrated to be useful for studying nanoscale waveguides.

Field emission from a selected multiwall carbon nanotube

The electron field emission characteristics of individual multiwalled carbon nanotubes were investigated by a piezoelectric nanomanipulation system operating inside a scanning electron microscopy chamber. The experimental set-up ensures a precise evaluation of the geometric parameters (multiwalled carbon nanotube length and diameter and anode-cathode separation) of the field emission system. For several multiwalled carbon nanotubes, reproducible and quite stable emission current behaviour was obtained, with a dependence on the applied voltage well described by a series resistance modified Fowler-Nordheim model. A turn-on field of ∼30 V µm(-1) and a field enhancement factor of around 100 at a cathode-anode distance of the order of 1 µm were evaluated. Finally, the effect of selective electron beam irradiation on the nanotube field emission capabilities was extensively investigated.

Stepwise current-driven release of attogram quantities of copper iodide encapsulated in carbon nanotubes

Encapsulated nanograins of copper iodide have been sequentially discharged from individual carbon nanotubes. Using a high resolution electron microscope equipped with a two-terminal electrical measurements unit, it was possible to manipulate the filling contents with precisions of a few attograms at a time. Changes in electrical resistance and filling ratio were followed in tandem and in real-time. It is shown that the pulsed release of the halide is directly related to the overall conductance of the filled nanotube.

Controlling electron-beam-induced carbon deposition on carbon nanotubes by Joule heating

Electron-beam-induced deposition (EBID) of carbon on the surface of carbon nanotubes was well controlled by passing different electrical currents through the nanotubes. The control is due to Joule heating and the temperature of the carbon nanotubes was estimated. The deposition rate was found to increase and then decrease with the temperature and was maximized at about 310 K and approached zero at about 400 K. The method can be used to control the deposition rate of EBID in nanowelding and nanofabrication and to eliminate amorphous carbon contamination in in situ study of nanostructures.

The role of an amorphous carbon layer on a multi-wall carbon nanotube attached atomic force microscope tip in making good electrical contact to a gold electrode

Multi-wall carbon nanotube (MWNT) attached atomic force microscope (AFM) tips (MWNT tips) have good potential for use in AFM lithography. Good conducting MWNT tips are needed in such applications. However, characterizing the conductance of MWNT tips is nontrivial: making a good electrical contact between the MWNT and electrode is difficult. We observed that MWNT tips produced by hydrocarbon-deposition attachment usually do not make good electrical contacts to gold electrodes because of the thin and rough amorphous carbon layer on the MWNT that was unintentionally deposited during the attachment. We found that good contacts can be made if a more amorphous carbon layer is deposited to form a thick and smooth amorphous carbon layer on MWNTs. Good contact was made either by transformation of the amorphous carbon layer into a conducting or peel-off layer, exposing the bare MWNT surface. MWNT tips with an exposed MWNT surface showed the well-known high-current-flowing capacity and the stepped-cutting behavior of bare MWNTs. The peeling-off behavior of a thick amorphous carbon layer may be utilized in producing bare-surfaced MWNT tips that have good conductance and therefore are useful for applications.

Four-probe electrical characterization of Pt-coated TMV-based nanostructures

The electrical transport and structural properties of tobacco mosaic virus (TMV)-based nanostructures have been studied. Electroless deposition was used to coat the TMV outer surface with a 13 nm thick homogeneous Pt layer. SEM, TEM and electrical characterization of the obtained nanostructures has been performed. Using four independently controlled scanning tunnelling microscope tips we were able to perform four-point probe resistance measurements on linear virus assemblies and demonstrate the continuous nature of the metallic coating. The measured resistivity values of the virial nanowires exceeded the bulk value by 10-100 times; notwithstanding this the coated structure allowed high current densities, of the order of 10(5)-10(8) A cm(-2). The four-probe technique proved to be useful for analysing the electrical properties of bio-inorganic nanowires.