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Kale S, Petraru A, Kohlstedt H, Soni R. Ferroelectric Size Effects on Statics and Dynamics of Domain Wall. SMALL (WEINHEIM AN DER BERGSTRASSE, GERMANY) 2024; 20:e2303880. [PMID: 37661596 DOI: 10.1002/smll.202303880] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/09/2023] [Revised: 07/28/2023] [Indexed: 09/05/2023]
Abstract
Domain walls separating differently oriented polarization regions of ferroelectric materials are known to greatly impact nanoscale materials and device functionalities. Though the understanding of size effects in ferroelectric nanostructures has progressed, the effect of thickness downsizing on domain wall scaling behavior has remained unexplored. Using piezoresponse force microscopy, epitaxial BaTiO3 film thickness size (2-90 nm) effects on the critical scaling universality of the domain wall dynamical creep and static roughness exponents including dimensionality is demonstrated. Independently estimated static roughness exponents ranging between 0.34 and 0.28 and dynamical creep exponents transition from 0.54 to 0.22 elucidate the domain wall dimensionality transition from two- to quasi-one-dimension in the thickness range of 10-25 nm, which is later validated by evaluating effective dimensionality within the paradigm of random-bond universality. The observed interdimensional transition is further credenced to the compressive strain and long-range strain-dipolar interactions, as revealed by the structural analyses and additional measurements with modified substrate-induced strain. These results provide new insights into the understanding of size effects in nanoscale ferroelectricity, paving the way toward future nanodevices.
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Affiliation(s)
- Somnath Kale
- Department of Physical Sciences, Indian Institute of Science Education and Research Berhampur, Berhampur, 760010, India
| | - Adrian Petraru
- Nanoelectronics, Institute of Electrical Engineering and Information Engineering, Kiel University, 24143, Kiel, Germany
| | - Hermann Kohlstedt
- Nanoelectronics, Institute of Electrical Engineering and Information Engineering, Kiel University, 24143, Kiel, Germany
| | - Rohit Soni
- Department of Physical Sciences, Indian Institute of Science Education and Research Berhampur, Berhampur, 760010, India
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Alikin D, Safina V, Abramov A, Slautin B, Shur V, Pavlenko A, Kholkin A. Defining ferroelectric characteristics with reversible piezoresponse: PUND switching spectroscopy PFM characterization. NANOTECHNOLOGY 2024; 35:175702. [PMID: 38181439 DOI: 10.1088/1361-6528/ad1b97] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/29/2023] [Accepted: 01/05/2024] [Indexed: 01/07/2024]
Abstract
Detecting ferroelectricity at micro- and nanoscales is crucial for advanced nanomaterials and materials with complicated topography. Switching spectroscopy piezoresponse force microscopy (SSPFM), which involves measuring piezoelectric hysteresis loops via a scanning probe microscopy tip, is a widely accepted approach to characterize polarization reversal at the local scale and confirm ferroelectricity. However, the local hysteresis loops acquired through this method often exhibit unpredictable shapes, a phenomenon often attributed to the influence of parasitic factors such as electrostatic forces and current flow. Our research has uncovered that the deviation in hysteresis loop shapes can be caused by spontaneous backswitching occurring after polarization reversal. Moreover, we've determined that the extent of this effect can be exacerbated when employing inappropriate SSPFM waveform parameters, including duration, frequency, and AC voltage amplitude. Notably, the conventional 'pulse-mode' SSPFM method has been found to intensify spontaneous backswitching. In response to these challenges, we have redesigned SSPFM approach by introducing the positive up-negative down (PUND) method within the 'step-mode' SSPFM. This modification allows for effective probing of local piezoelectric hysteresis loops in ferroelectrics with reversible piezoresponse while removing undesirable electrostatic contribution. This advancement extends the applicability of the technique to a diverse range of ferroelectrics, including semiconductor ferroelectrics and relaxors, promising a more reliable and accurate characterization of their properties.
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Affiliation(s)
- Denis Alikin
- School of Natural Sciences and Mathematics, Ural Federal University, Ekaterinburg, Russia
| | - Violetta Safina
- School of Natural Sciences and Mathematics, Ural Federal University, Ekaterinburg, Russia
| | - Alexander Abramov
- School of Natural Sciences and Mathematics, Ural Federal University, Ekaterinburg, Russia
| | - Boris Slautin
- School of Natural Sciences and Mathematics, Ural Federal University, Ekaterinburg, Russia
| | - Vladimir Shur
- School of Natural Sciences and Mathematics, Ural Federal University, Ekaterinburg, Russia
| | - Anatoly Pavlenko
- Southern Scientific Center, Russian Academy of Sciences, Rostov-on-Don, Russia
| | - Andrei Kholkin
- School of Natural Sciences and Mathematics, Ural Federal University, Ekaterinburg, Russia
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3
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Ignatans R, Damjanovic D, Tileli V. Individual Barkhausen Pulses of Ferroelastic Nanodomains. PHYSICAL REVIEW LETTERS 2021; 127:167601. [PMID: 34723579 DOI: 10.1103/physrevlett.127.167601] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/01/2021] [Accepted: 09/03/2021] [Indexed: 06/13/2023]
Abstract
Ferroelectric materials, upon electric field biasing, display polarization discontinuities known as Barkhausen jumps, a subclass of a more general phenomenon known as crackling noise. Herein, we follow and visualize in real time the motion of single 90° needle domains induced by an electric field applied in the polarization direction of the prototypical ferroelectric BaTiO_{3}, inside a transmission electron microscope. The nature of motion and periodicity of the Barkhausen pulses leads to distinctive interactions between domains forming a herringbone pattern. Remarkably, the tips of the domains do not come into contact with the body of the perpendicular domain, suggesting the presence of strong electromechanical fields around the tips of the needle domains. Additionally, interactions of the domains with the lattice result in relatively free movement of the domain walls through the dielectric medium, indicating that their motion-related activation energy depends only on weak Peierls-like potentials. Control over the kinetics of ferroelastic domain wall motion can lead to novel nanoelectronic devices pertinent to computing and data storage applications.
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Affiliation(s)
- Reinis Ignatans
- Institute of Materials, École polytechnique fédérale de Lausanne, Station 12, 1015 Lausanne, Switzerland
| | - Dragan Damjanovic
- Institute of Materials, École polytechnique fédérale de Lausanne, Station 12, 1015 Lausanne, Switzerland
| | - Vasiliki Tileli
- Institute of Materials, École polytechnique fédérale de Lausanne, Station 12, 1015 Lausanne, Switzerland
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Ahn Y, Everhardt AS, Lee HJ, Park J, Pateras A, Damerio S, Zhou T, DiChiara AD, Wen H, Noheda B, Evans PG. Dynamic Tilting of Ferroelectric Domain Walls Caused by Optically Induced Electronic Screening. PHYSICAL REVIEW LETTERS 2021; 127:097402. [PMID: 34506196 DOI: 10.1103/physrevlett.127.097402] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/15/2020] [Accepted: 06/25/2021] [Indexed: 06/13/2023]
Abstract
Optical excitation perturbs the balance of phenomena selecting the tilt orientation of domain walls within ferroelectric thin films. The high carrier density induced in a low-strain BaTiO_{3} thin film by an above-band-gap ultrafast optical pulse changes the tilt angle that 90° a/c domain walls form with respect to the substrate-film interface. The dynamics of the changes are apparent in time-resolved synchrotron x-ray scattering studies of the domain diffuse scattering. Tilting occurs at 298 K, a temperature at which the a/b and a/c domain phases coexist but is absent at 343 K in the better ordered single-phase a/c regime. Phase coexistence at 298 K leads to increased domain-wall charge density, and thus a larger screening effect than in the single-phase regime. The screening mechanism points to new directions for the manipulation of nanoscale ferroelectricity.
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Affiliation(s)
- Youngjun Ahn
- Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706, USA
| | - Arnoud S Everhardt
- Zernike Institute for Advanced Materials, University of Groningen, 9747AG- Groningen, Netherlands
| | - Hyeon Jun Lee
- Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706, USA
| | - Joonkyu Park
- Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706, USA
| | - Anastasios Pateras
- Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706, USA
| | - Silvia Damerio
- Zernike Institute for Advanced Materials, University of Groningen, 9747AG- Groningen, Netherlands
| | - Tao Zhou
- ID01/ESRF, 71 Avenue des Martyrs, 38000 Grenoble Cedex, France
| | - Anthony D DiChiara
- Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA
| | - Haidan Wen
- Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA
| | - Beatriz Noheda
- Zernike Institute for Advanced Materials, University of Groningen, 9747AG- Groningen, Netherlands
- CogniGron Center, University of Groningen, 9747AG- Groningen, Netherlands
| | - Paul G Evans
- Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706, USA
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Jin MH, Xiong L, Zhou NJ, Zheng B, Zhou TJ. Universality classes of the domain-wall creep motion driven by spin-transfer torques. Phys Rev E 2021; 103:062119. [PMID: 34271735 DOI: 10.1103/physreve.103.062119] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/26/2020] [Accepted: 05/27/2021] [Indexed: 11/07/2022]
Abstract
With the stochastic Landau-Lifshitz-Gilbert equation, we numerically simulate the creep motion of a magnetic domain wall driven by the adiabatic and nonadiabatic spin-transfer torques induced by the electric current. The creep exponent μ and the roughness exponent ζ are accurately determined from the scaling behaviors. The creep motions driven by the adiabatic and nonadiabatic spin-transfer torques belong to different universality classes. The scaling relation between μ and ζ based on certain simplified assumptions is valid for the nonadiabatic spin-transfer torque, while invalid for the adiabatic one. Our results are compatible with the experimental ones, but go beyond the existing theoretical prediction. Our investigation reveals that the disorder-induced pinning effect on the domain-wall rotation alters the universality class of the creep motion.
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Affiliation(s)
- M H Jin
- College of Electronics and Information, Hangzhou Dianzi University, Hangzhou 310018, People's Republic of China
| | - L Xiong
- School of Physics and Astronomy, Yunnan University, Kunming 650091, People's Republic of China.,Department of Physics, Zhejiang University, Hangzhou 310027, People's Republic of China
| | - N J Zhou
- Department of Physics, Hangzhou Normal University, Hangzhou 310036, People's Republic of China
| | - B Zheng
- School of Physics and Astronomy, Yunnan University, Kunming 650091, People's Republic of China.,Department of Physics, Zhejiang University, Hangzhou 310027, People's Republic of China.,Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing 210093, People's Republic of China
| | - T J Zhou
- College of Electronics and Information, Hangzhou Dianzi University, Hangzhou 310018, People's Republic of China
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Alsubaie A, Sharma P, Lee JH, Kim JY, Yang CH, Seidel J. Uniaxial Strain-Controlled Ferroelastic Domain Evolution in BiFeO 3. ACS APPLIED MATERIALS & INTERFACES 2018; 10:11768-11775. [PMID: 29557167 DOI: 10.1021/acsami.8b01711] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/08/2023]
Abstract
We investigate the effect of variable uniaxial tensile strain on the evolution of 71° ferroelastic domains in (001)-oriented epitaxial BiFeO3 (BFO) thin films using piezoresponse force microscopy (PFM). For this purpose, a newly designed bending stage has been employed, which allows tensile bending as wells as in situ PFM characterization. In situ PFM imaging reveals polarization-strain correlations at the nanoscale. Specifically, ferroelastic domains with in-plane polarization along the direction of applied tensile strain expand, whereas the adjoining domains with orthogonal in-plane polarization contract. The switching is mediated by significant domain wall roughening and opposite displacement of the successive walls. Further, the domains with long-range order are more susceptible to an applied external mechanical stimulus compared to the domains, which exhibit short-range periodicity. In addition, the imprint state of film reverses direction under applied tensile strain. Finally, the strain-induced changes in the domain structure and wall motion are fully reversible and revert to their as-grown state upon release of the applied stress. The strain-induced non-180° polarization rotation constitutes a route to control connected functionalities, such as magnetism, via coupled in-plane rotation of the magnetic plane in multiferroic BFO thin films.
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Affiliation(s)
- Abdullah Alsubaie
- School of Materials Science and Engineering , UNSW Sydney , Sydney , NSW 2052 , Australia
- School of Physics , Taif University , Taif 26571 , Kingdom of Saudi Arabia
| | - Pankaj Sharma
- School of Materials Science and Engineering , UNSW Sydney , Sydney , NSW 2052 , Australia
| | - Jin Hong Lee
- Unité Mixte de Physique , CNRS, Thales, Université Paris Sud, Université Paris-Saclay , 91767 Palaiseau , France
| | | | | | - Jan Seidel
- School of Materials Science and Engineering , UNSW Sydney , Sydney , NSW 2052 , Australia
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Hlinka J, Paściak M, Körbel S, Marton P. Terahertz-Range Polar Modes in Domain-Engineered BiFeO_{3}. PHYSICAL REVIEW LETTERS 2017; 119:057604. [PMID: 28949744 DOI: 10.1103/physrevlett.119.057604] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/02/2017] [Indexed: 06/07/2023]
Abstract
The dielectric permittivity and properties of electrically active lattice resonances in nanotwinned BiFeO_{3} crystals have been studied theoretically using an earlier established interatomic potential. The results suggest that an array of 71° domain walls with about 2-5 nm spacing enhances the static permittivity of BiFeO_{3} by more than an order of magnitude. This enhancement is associated with an electrically active excitation, corresponding to a collective vibration of pinned domain walls at a remarkably high frequency of about 0.3 THz.
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Affiliation(s)
- Jirka Hlinka
- Institute of Physics, Academy of Sciences of the Czech Republic, Na Slovance 2, 182 21 Prague 8, Czech Republic
| | - Marek Paściak
- Institute of Physics, Academy of Sciences of the Czech Republic, Na Slovance 2, 182 21 Prague 8, Czech Republic
| | - Sabine Körbel
- Institute of Physics, Academy of Sciences of the Czech Republic, Na Slovance 2, 182 21 Prague 8, Czech Republic
| | - Pavel Marton
- Institute of Physics, Academy of Sciences of the Czech Republic, Na Slovance 2, 182 21 Prague 8, Czech Republic
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Tselev A, Yu P, Cao Y, Dedon LR, Martin LW, Kalinin SV, Maksymovych P. Microwave a.c. conductivity of domain walls in ferroelectric thin films. Nat Commun 2016; 7:11630. [PMID: 27240997 PMCID: PMC4895023 DOI: 10.1038/ncomms11630] [Citation(s) in RCA: 70] [Impact Index Per Article: 8.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/04/2016] [Accepted: 04/14/2016] [Indexed: 11/08/2022] Open
Abstract
Ferroelectric domain walls are of great interest as elementary building blocks for future electronic devices due to their intrinsic few-nanometre width, multifunctional properties and field-controlled topology. To realize the electronic functions, domain walls are required to be electrically conducting and addressable non-destructively. However, these properties have been elusive because conducting walls have to be electrically charged, which makes them unstable and uncommon in ferroelectric materials. Here we reveal that spontaneous and recorded domain walls in thin films of lead zirconate and bismuth ferrite exhibit large conductance at microwave frequencies despite being insulating at d.c. We explain this effect by morphological roughening of the walls and local charges induced by disorder with the overall charge neutrality. a.c. conduction is immune to large contact resistance enabling completely non-destructive walls read-out. This demonstrates a technological potential for harnessing a.c. conduction for oxide electronics and other materials with poor d.c. conduction, particularly at the nanoscale.
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Affiliation(s)
- Alexander Tselev
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
| | - Pu Yu
- State Key Laboratory for Low-Dimensional Quantum Physics, Department of Physics and Collaborative Innovation Center for Quantum Matter, Tsinghua University, Beijing 100084, China
- RIKEN Center for Emergent Matter Science (CEMS), Wako, Saitama 351-0198, Japan
| | - Ye Cao
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
| | - Liv R. Dedon
- Department of Materials Science and Engineering and Department of Physics, University of California, Berkeley, Berkeley, California 94720, USA
| | - Lane W. Martin
- Department of Materials Science and Engineering and Department of Physics, University of California, Berkeley, Berkeley, California 94720, USA
- Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA
| | - Sergei V. Kalinin
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
| | - Petro Maksymovych
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
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Energy landscape scheme for an intuitive understanding of complex domain dynamics in ferroelectric thin films. Sci Rep 2015; 5:11625. [PMID: 26130159 PMCID: PMC4486935 DOI: 10.1038/srep11625] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/22/2015] [Accepted: 06/01/2015] [Indexed: 11/23/2022] Open
Abstract
Fundamental understanding of domain dynamics in ferroic materials has been a longstanding issue because of its relevance to many systems and to the design of nanoscale domain-wall devices. Despite many theoretical and experimental studies, a full understanding of domain dynamics still remains incomplete, partly due to complex interactions between domain-walls and disorder. We report domain-shape-preserving deterministic domain-wall motion, which directly confirms microscopic return point memory, by observing domain-wall breathing motion in ferroelectric BiFeO3 thin film using stroboscopic piezoresponse force microscopy. Spatial energy landscape that provides new insights into domain dynamics is also mapped based on the breathing motion of domain walls. The evolution of complex domain structure can be understood by the process of occupying the lowest available energy states of polarization in the energy landscape which is determined by defect-induced internal fields. Our result highlights a pathway for the novel design of ferroelectric domain-wall devices through the engineering of energy landscape using defect-induced internal fields such as flexoelectric fields.
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Sando D, Barthélémy A, Bibes M. BiFeO3 epitaxial thin films and devices: past, present and future. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2014; 26:473201. [PMID: 25352066 DOI: 10.1088/0953-8984/26/47/473201] [Citation(s) in RCA: 58] [Impact Index Per Article: 5.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/04/2023]
Abstract
The celebrated renaissance of the multiferroics family over the past ten years has also been that of its most paradigmatic member, bismuth ferrite (BiFeO3). Known since the 1960s to be a high temperature antiferromagnet and since the 1970s to be ferroelectric, BiFeO3 only had its bulk ferroic properties clarified in the mid-2000s. It is however the fabrication of BiFeO3 thin films and their integration into epitaxial oxide heterostructures that have fully revealed its extraordinarily broad palette of functionalities. Here we review the first decade of research on BiFeO3 films, restricting ourselves to epitaxial structures. We discuss how thickness and epitaxial strain influence not only the unit cell parameters, but also the crystal structure, illustrated for instance by the discovery of the so-called T-like phase of BiFeO3. We then present its ferroelectric and piezoelectric properties and their evolution near morphotropic phase boundaries. Magnetic properties and their modification by thickness and strain effects, as well as optical parameters, are covered. Finally, we highlight various types of devices based on BiFeO3 in electronics, spintronics, and optics, and provide perspectives for the development of further multifunctional devices for information technology and energy harvesting.
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Affiliation(s)
- D Sando
- Unité Mixte de Physique CNRS/Thales, 1 Avenue Fresnel, Campus de l'Ecole Polytechnique, 91767 Palaiseau, France, and Université Paris Sud, 91405 Orsay, France. Center for Correlated Electron Systems, Institute for Basic Science (IBS), and Department of Physics and Astronomy, Seoul National University, 1 Gwanak-ro, Gwanak-gu, Seoul 151-747, Republic of Korea
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