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Xu WJ, Zelenovskii P, Tselev A, Verissimo L, Romanyuk K, Yuan W, Zhang WX, Kholkin A, Rocha J. A hybrid double perovskite ferroelastic exhibiting the highest number of orientation states. Chem Commun (Camb) 2023; 59:11264-11267. [PMID: 37661855 DOI: 10.1039/d3cc02645k] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 09/05/2023]
Abstract
Integrating NH4+ as a B'-site ion within a three-dimensional double hybrid perovskite resulted in a novel high-temperature ferroelastic, (Me3NOH)2(NH4)[Co(CN)6], which uniquely demonstrates a reversible triclinic-to-cubic phase transition at 369 K and offers a record-setting 24 orientation states, the highest ever reported among all ferroelastics.
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Affiliation(s)
- Wei-Jian Xu
- Department of Chemistry & CICECO-Aveiro Institute of Materials, University of Aveiro, 3810-193 Aveiro, Portugal.
| | - Pavel Zelenovskii
- Department of Physics & CICECO-Aveiro Institute of Materials, University of Aveiro, 3810-193 Aveiro, Portugal.
| | - Alexander Tselev
- Department of Physics & CICECO-Aveiro Institute of Materials, University of Aveiro, 3810-193 Aveiro, Portugal.
| | - Luis Verissimo
- Department of Chemistry & CICECO-Aveiro Institute of Materials, University of Aveiro, 3810-193 Aveiro, Portugal.
| | - Konstantin Romanyuk
- Department of Physics & CICECO-Aveiro Institute of Materials, University of Aveiro, 3810-193 Aveiro, Portugal.
| | - Wei Yuan
- MOE Key Laboratory of Bioinorganic and Synthetic Chemistry, School of Chemistry, Sun Yat-Sen University, Guangzhou 510275, China.
| | - Wei-Xiong Zhang
- MOE Key Laboratory of Bioinorganic and Synthetic Chemistry, School of Chemistry, Sun Yat-Sen University, Guangzhou 510275, China.
| | - Andrei Kholkin
- Department of Physics & CICECO-Aveiro Institute of Materials, University of Aveiro, 3810-193 Aveiro, Portugal.
| | - João Rocha
- Department of Chemistry & CICECO-Aveiro Institute of Materials, University of Aveiro, 3810-193 Aveiro, Portugal.
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2
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Xu WJ, Li MF, Garcia AR, Romanyuk K, Martinho JMG, Zelenovskii P, Tselev A, Verissimo L, Zhang WX, Chen XM, Kholkin A, Rocha J. Molecular Design of a Metal-Nitrosyl Ferroelectric with Reversible Photoisomerization. J Am Chem Soc 2023. [PMID: 37329320 DOI: 10.1021/jacs.3c01530] [Citation(s) in RCA: 5] [Impact Index Per Article: 5.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 06/19/2023]
Abstract
The development of photo-responsive ferroelectrics whose polarization may be remotely controlled by optical means is of fundamental importance for basic research and technological applications. Herein, we report the design and synthesis of a new metal-nitrosyl ferroelectric crystal (DMA)(PIP)[Fe(CN)5(NO)] (1) (DMA = dimethylammonium, PIP = piperidinium) with potential phototunable polarization via a dual-organic-cation molecular design strategy. Compared to the parent non-ferroelectric (MA)2[Fe(CN)5(NO)] (MA = methylammonium) material with a phase transition at 207 K, the introduction of larger dual organic cations both lowers the crystal symmetry affording robust ferroelectricity and increases the energy barrier of molecular motions, endowing 1 with a large polarization of up to 7.6 μC cm-2 and a high Curie temperature (Tc) of 316 K. Infrared spectroscopy shows that the reversible photoisomerization of the nitrosyl ligand is accomplished by light irradiation. Specifically, the ground state with the N-bound nitrosyl ligand conformation can be reversibly switched to both the metastable state I (MSI) with isonitrosyl conformation and the metastable state II (MSII) with side-on nitrosyl conformation. Quantum chemistry calculations suggest that the photoisomerization significantly changes the dipole moment of the [Fe(CN)5(NO)]2- anion, thus leading to three ferroelectric states with different values of macroscopic polarization. Such optical accessibility and controllability of different ferroelectric states via photoinduced nitrosyl linkage isomerization open up a new and attractive route to optically controllable macroscopic polarization.
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Affiliation(s)
- Wei-Jian Xu
- Department of Chemistry & CICECO-Aveiro Institute of Materials, University of Aveiro, 3810-193 Aveiro, Portugal
| | - Mao-Fan Li
- MOE Key Laboratory of Bioinorganic and Synthetic Chemistry, School of Chemistry, Sun Yat-Sen University, Guangzhou 510275, China
| | - Ana R Garcia
- Centro de Química Estrutural, Institute of Molecular Sciences and Department of Chemical Engineering, Instituto Superior Técnico, University of Lisbon, 1049-001 Lisbon, Portugal
| | - Konstantin Romanyuk
- Department of Physics & CICECO-Aveiro Institute of Materials, University of Aveiro, 3810-193 Aveiro, Portugal
| | - José M G Martinho
- Centro de Química Estrutural, Institute of Molecular Sciences and Department of Chemical Engineering, Instituto Superior Técnico, University of Lisbon, 1049-001 Lisbon, Portugal
| | - Pavel Zelenovskii
- Department of Chemistry & CICECO-Aveiro Institute of Materials, University of Aveiro, 3810-193 Aveiro, Portugal
| | - Alexander Tselev
- Department of Physics & CICECO-Aveiro Institute of Materials, University of Aveiro, 3810-193 Aveiro, Portugal
| | - Luís Verissimo
- Department of Chemistry & CICECO-Aveiro Institute of Materials, University of Aveiro, 3810-193 Aveiro, Portugal
| | - Wei-Xiong Zhang
- MOE Key Laboratory of Bioinorganic and Synthetic Chemistry, School of Chemistry, Sun Yat-Sen University, Guangzhou 510275, China
| | - Xiao-Ming Chen
- MOE Key Laboratory of Bioinorganic and Synthetic Chemistry, School of Chemistry, Sun Yat-Sen University, Guangzhou 510275, China
| | - Andrei Kholkin
- Department of Physics & CICECO-Aveiro Institute of Materials, University of Aveiro, 3810-193 Aveiro, Portugal
| | - João Rocha
- Department of Chemistry & CICECO-Aveiro Institute of Materials, University of Aveiro, 3810-193 Aveiro, Portugal
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3
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Alikin D, Zakharchuk K, Xie W, Romanyuk K, Pereira MJ, Arias-Serrano BI, Weidenkaff A, Kholkin A, Kovalevsky AV, Tselev A. Quantitative Characterization of Local Thermal Properties in Thermoelectric Ceramics Using "Jumping-Mode" Scanning Thermal Microscopy. Small Methods 2023; 7:e2201516. [PMID: 36775977 DOI: 10.1002/smtd.202201516] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 11/18/2022] [Revised: 01/07/2023] [Indexed: 06/18/2023]
Abstract
Thermoelectric conversion may take a significant share in future energy technologies. Oxide-based thermoelectric composite ceramics attract attention for promising routes for control of electrical and thermal conductivity for enhanced thermoelectric performance. However, the variability of the composite properties responsible for the thermoelectric performance, despite nominally identical preparation routes, is significant, and this cannot be explained without detailed studies of thermal transport at the local scale. Scanning thermal microscopy (SThM) is a scanning probe microscopy method providing access to local thermal properties of materials down to length scales below 100 nm. To date, realistic quantitative SThM is shown mostly for topographically very smooth materials. Here, methods for SThM imaging of bulk ceramic samples with relatively rough surfaces are demonstrated. "Jumping mode" SThM (JM-SThM), which serves to preserve the probe integrity while imaging rough surfaces, is developed and applied. Experiments with real thermoelectric ceramics show that the JM-SThM can be used for meaningful quantitative imaging. Quantitative imaging is performed with the help of calibrated finite-elements model of the SThM probe. The modeling reveals non-negligible effects associated with the distributed nature of the resistive SThM probes used; corrections need to be made depending on probe-sample contact thermal resistance and probe current frequency.
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Affiliation(s)
- Denis Alikin
- CICECO - Aveiro Institute of Materials and Department of Physics, University of Aveiro, Aveiro, 3810-193, Portugal
| | - Kiryl Zakharchuk
- CICECO - Aveiro Institute of Materials and Department of Materials and Ceramic Engineering, University of Aveiro, Aveiro, 3810-193, Portugal
| | - Wenjie Xie
- Department of Materials and Earth Sciences, Technical University of Darmstadt, 64287, Darmstadt, Germany
| | - Konstantin Romanyuk
- CICECO - Aveiro Institute of Materials and Department of Physics, University of Aveiro, Aveiro, 3810-193, Portugal
| | - Maria J Pereira
- CICECO - Aveiro Institute of Materials and Department of Physics, University of Aveiro, Aveiro, 3810-193, Portugal
| | - Blanca I Arias-Serrano
- CICECO - Aveiro Institute of Materials and Department of Materials and Ceramic Engineering, University of Aveiro, Aveiro, 3810-193, Portugal
| | - Anke Weidenkaff
- Department of Materials and Earth Sciences, Technical University of Darmstadt, 64287, Darmstadt, Germany
- Fraunhofer Research Institution for Materials Recycling and Resource Strategies IWKS, 63755, Alzenau, Germany
| | - Andrei Kholkin
- CICECO - Aveiro Institute of Materials and Department of Physics, University of Aveiro, Aveiro, 3810-193, Portugal
| | - Andrei V Kovalevsky
- CICECO - Aveiro Institute of Materials and Department of Materials and Ceramic Engineering, University of Aveiro, Aveiro, 3810-193, Portugal
| | - Alexander Tselev
- CICECO - Aveiro Institute of Materials and Department of Physics, University of Aveiro, Aveiro, 3810-193, Portugal
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4
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Alikin D, Abramov A, Turygin A, Ievlev A, Pryakhina V, Karpinsky D, Hu Q, Jin L, Shur V, Tselev A, Kholkin A. Exploring Charged Defects in Ferroelectrics by the Switching Spectroscopy Piezoresponse Force Microscopy. Small Methods 2022; 6:e2101289. [PMID: 34967150 DOI: 10.1002/smtd.202101289] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/14/2021] [Revised: 11/15/2021] [Indexed: 06/14/2023]
Abstract
Monitoring the charged defect concentration at the nanoscale is of critical importance for both the fundamental science and applications of ferroelectrics. However, up-to-date, high-resolution study methods for the investigation of structural defects, such as transmission electron microscopy, X-ray tomography, etc., are expensive and demand complicated sample preparation. With an example of the lanthanum-doped bismuth ferrite ceramics, a novel method is proposed based on the switching spectroscopy piezoresponse force microscopy (SSPFM) that allows probing the electric potential from buried subsurface charged defects in the ferroelectric materials with a nanometer-scale spatial resolution. When compared with the composition-sensitive methods, such as neutron diffraction, X-ray photoelectron spectroscopy, and local time-of-flight secondary ion mass spectrometry, the SSPFM sensitivity to the variation of the electric potential from the charged defects is shown to be equivalent to less than 0.3 at% of the defect concentration. Additionally, the possibility to locally evaluate dynamics of the polarization screening caused by the charged defects is demonstrated, which is of significant interest for further understanding defect-mediated processes in ferroelectrics.
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Affiliation(s)
- Denis Alikin
- School of Natural Sciences and Mathematics, Ural Federal University, Ekaterinburg, 620000, Russia
| | - Alexander Abramov
- School of Natural Sciences and Mathematics, Ural Federal University, Ekaterinburg, 620000, Russia
| | - Anton Turygin
- School of Natural Sciences and Mathematics, Ural Federal University, Ekaterinburg, 620000, Russia
| | - Anton Ievlev
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37830, USA
| | - Victoria Pryakhina
- School of Natural Sciences and Mathematics, Ural Federal University, Ekaterinburg, 620000, Russia
| | - Dmitry Karpinsky
- Scientific-Practical Materials Research Centre of NAS of Belarus, Minsk, 220072, Belarus
| | - Qingyuan Hu
- Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, Xi'an Jiaotong University, Xi'an, 710049, China
| | - Li Jin
- Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, Xi'an Jiaotong University, Xi'an, 710049, China
| | - Vladimir Shur
- School of Natural Sciences and Mathematics, Ural Federal University, Ekaterinburg, 620000, Russia
| | - Alexander Tselev
- Department of Physics & CICECO, University of Aveiro, 3810-193, Aveiro, Portugal
| | - Andrei Kholkin
- School of Natural Sciences and Mathematics, Ural Federal University, Ekaterinburg, 620000, Russia
- Department of Physics & CICECO, University of Aveiro, 3810-193, Aveiro, Portugal
- Piezo- and Magnetoelectric Materials Research & Development Centre, Research School of Chemistry & Applied Biomedical Sciences, National Research Tomsk Polytechnic University, Tomsk, 634050, Russia
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5
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Guo H, Yulaev A, Strelcov E, Tselev A, Arble C, Vladar AE, Villarrubia JS, Kolmakov A. Probing Electrified Liquid-Solid Interfaces with Scanning Electron Microscopy. ACS Appl Mater Interfaces 2020; 12:56650-56657. [PMID: 33327058 DOI: 10.1021/acsami.0c19634] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/12/2023]
Abstract
Electrical double layers play a key role in a variety of electrochemical systems. The mean free path of secondary electrons in aqueous solutions is on the order of a nanometer, making them suitable for probing ultrathin electrical double layers at solid-liquid electrolyte interfaces. Employing graphene as an electron-transparent electrode in a two-electrode electrochemical system, we show that the secondary electron yield of the graphene-liquid interface depends on the ionic strength and concentration of the electrolyte and the applied bias at the remote counter electrode. These observations have been related to polarization-induced changes in the potential distribution within the electrical double layer and demonstrate the feasibility of using scanning electron microscopy to examine and map electrified liquid-solid interfaces.
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Affiliation(s)
- Hongxuan Guo
- SEU-FEI Nano-Pico Center, Key Laboratory of MEMS of Ministry of Education, Southeast University, Nanjing 210096, P. R. China
- Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
- Maryland Nanocenter, University of Maryland, College Park, Maryland 20742, United States
| | - Alexander Yulaev
- Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
- Maryland Nanocenter, University of Maryland, College Park, Maryland 20742, United States
| | - Evgheni Strelcov
- Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
- Maryland Nanocenter, University of Maryland, College Park, Maryland 20742, United States
| | - Alexander Tselev
- Department of Physics and CICECO-Aveiro Institute of Materials, University of Aveiro, Aveiro 3810-193, Portugal
| | - Christopher Arble
- Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
| | - Andras E Vladar
- Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
| | - John S Villarrubia
- Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
| | - Andrei Kolmakov
- Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
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6
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Romanyuk KN, Alikin DO, Slautin BN, Tselev A, Shur VY, Kholkin AL. Local electronic transport across probe/ionic conductor interface in scanning probe microscopy. Ultramicroscopy 2020; 220:113147. [PMID: 33130324 DOI: 10.1016/j.ultramic.2020.113147] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/26/2020] [Revised: 09/29/2020] [Accepted: 10/15/2020] [Indexed: 11/25/2022]
Abstract
Charge carrier transport through the probe-sample junction can have substantial consequences for outcomes of electrical and electromechanical atomic-force-microscopy (AFM) measurements. For understanding physical processes under the probe, we carried out conductive-AFM (C-AFM) measurements of local current-voltage (I-V) curves as well as their derivatives on samples of a mixed ionic-electronic conductor Li1-xMn2O4 and developed an analytical framework for the data analysis. The implemented approach discriminates between contributions the highly resistive sample surface layer and the bulk with the account of ion redistribution in the field of the probe. It was found that, with increasing probe voltage, the conductance mechanism in the surface layer transforms from Pool-Frenkel to space-charge-limited current. The surface layer significantly alters the ion dynamics in the sample bulk under the probe, which leads, in particular, to a decrease of the effective electromechanical AFM signal associated with the ionic motion in the sample. The framework can be applied for the analysis of electronic transport mechanisms across the probe/sample interface as well as to uncover the role of the charge transport in the electric field distribution, mechanical, and other responses in AFM measurements of a broad spectrum of conducting materials.
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Affiliation(s)
- K N Romanyuk
- School of Natural Sciences and Mathematics, Ural Federal University, Ekaterinburg, Russia; Department of Physics and CICECO - Aveiro Institute of Materials, University of Aveiro, 3810-193 Aveiro, Portugal.
| | - D O Alikin
- School of Natural Sciences and Mathematics, Ural Federal University, Ekaterinburg, Russia
| | - B N Slautin
- School of Natural Sciences and Mathematics, Ural Federal University, Ekaterinburg, Russia
| | - A Tselev
- Department of Physics and CICECO - Aveiro Institute of Materials, University of Aveiro, 3810-193 Aveiro, Portugal
| | - V Ya Shur
- School of Natural Sciences and Mathematics, Ural Federal University, Ekaterinburg, Russia
| | - A L Kholkin
- Department of Physics and CICECO - Aveiro Institute of Materials, University of Aveiro, 3810-193 Aveiro, Portugal.
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7
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Strelcov E, Arble C, Guo H, Hoskins BD, Yulaev A, Vlassiouk IV, Zhitenev NB, Tselev A, Kolmakov A. Nanoscale Mapping of the Double Layer Potential at the Graphene-Electrolyte Interface. Nano Lett 2020; 20:1336-1344. [PMID: 31990570 DOI: 10.1021/acs.nanolett.9b04823] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/10/2023]
Abstract
The electrical double layer (EDL) governs the operation of multiple electrochemical devices, determines reaction potentials, and conditions ion transport through cellular membranes in living organisms. The few existing methods of EDL probing have low spatial resolution, usually only providing spatially averaged information. On the other hand, traditional Kelvin probe force microscopy (KPFM) is capable of mapping potential with nanoscale lateral resolution but cannot be used in electrolytes with concentrations higher than several mmol/L. Here, we resolve this experimental impediment by combining KPFM with graphene-capped electrolytic cells to quantitatively measure the potential drop across the EDL in aqueous electrolytes of decimolar and molar concentrations with a high lateral resolution. The surface potential of graphene in contact with deionized water and 0.1 mol/L solutions of CuSO4 and MgSO4 as a function of counter electrode voltage is reported. The measurements are supported by numerical modeling to reveal the role of the graphene membrane in potential screening and to determine the EDL potential drop. The proposed approach proves to be especially useful for imaging spatially inhomogeneous systems, such as nanoparticles submerged in an electrolyte solution. It could be suitable for in operando and in vivo measurements of the potential drop in the EDL on the surfaces of nanocatalysts and biological cells in equilibrium with liquid solutions.
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Affiliation(s)
- Evgheni Strelcov
- Physical Measurement Laboratory , National Institute of Standards and Technology , Gaithersburg , Maryland 20899 , United States
- Maryland NanoCenter , University of Maryland , College Park , Maryland 20742 , United States
| | - Christopher Arble
- Physical Measurement Laboratory , National Institute of Standards and Technology , Gaithersburg , Maryland 20899 , United States
| | - Hongxuan Guo
- SEU-FEI Nano-Pico Center, Key Laboratory of MEMS of Ministry of Education , Southeast University , Nanjing 210096 , China
| | - Brian D Hoskins
- Physical Measurement Laboratory , National Institute of Standards and Technology , Gaithersburg , Maryland 20899 , United States
| | - Alexander Yulaev
- Physical Measurement Laboratory , National Institute of Standards and Technology , Gaithersburg , Maryland 20899 , United States
- Department of Chemistry and Biochemistry , University of Maryland , College Park , Maryland 20742 , United States
| | - Ivan V Vlassiouk
- Oak Ridge National Laboratory , Oak Ridge , Tennessee 37830 , United States
| | - Nikolai B Zhitenev
- Physical Measurement Laboratory , National Institute of Standards and Technology , Gaithersburg , Maryland 20899 , United States
| | - Alexander Tselev
- Department of Physics and CICECO-Aveiro Institute of Materials , University of Aveiro , 3810-193 Aveiro , Portugal
| | - Andrei Kolmakov
- Physical Measurement Laboratory , National Institute of Standards and Technology , Gaithersburg , Maryland 20899 , United States
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8
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Semenov A, Dedyk A, Mylnikov I, Pakhomov O, Es'kov A, Anokhin A, Krylov V, Burovikhin A, Pavlova Y, Tselev A, Kholkin A. Mn-Doped BaTiO 3Ceramics: Thermal and Electrical Properties for Multicaloric Applications. Materials (Basel) 2019; 12:ma12213592. [PMID: 31683682 PMCID: PMC6862048 DOI: 10.3390/ma12213592] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 10/02/2019] [Revised: 10/24/2019] [Accepted: 10/28/2019] [Indexed: 11/16/2022]
Abstract
Multiferroic materials are widely used in microelectronics because they are sensitive to elastic, magnetic, and electric fields and there is an intrinsic coupling between them. In particular, transition metal-doped BaTiO3 is considered as a viable multiferroic because of the simultaneous presence of ferroelectricity and magnetism. In this work, we study the electrical and thermal properties of Mn-doped BaTiO3 ceramics that can be used for multicaloric applications. We found that Mn doping leads to the broadening and shifting of the phase transition accompanied with simultaneous decrease of latent heat and entropy. Mn doping causes a decrease in the bulk resistivity while contact resistance remains intact. Doped ceramics can withstand high electric fields (up to 40 kV/cm) and exhibit linear I-V characteristics followed by the Schottky limited current in contrast to earlier observations. As such, these ceramics are promising for multicaloric applications.
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Affiliation(s)
- Alexander Semenov
- Saint Petersburg State Electrotechnical University, 197376 St. Petersburg, Russia.
| | - Antonina Dedyk
- Saint Petersburg State Electrotechnical University, 197376 St. Petersburg, Russia.
| | - Ivan Mylnikov
- Saint Petersburg State Electrotechnical University, 197376 St. Petersburg, Russia.
| | - Oleg Pakhomov
- Laboratory "Materials and Structures for Electro- and Magnetocaloric Energy Conversion", ITMOUniversity, 197101 St. Petersburg, Russia.
| | - Andrey Es'kov
- Laboratory "Materials and Structures for Electro- and Magnetocaloric Energy Conversion", ITMOUniversity, 197101 St. Petersburg, Russia.
| | - Alexander Anokhin
- SCAMT Institute, ITMOUniversity, 197101 St. Petersburg, Russia.
- Department of Physics & CICECO-Aveiro Institute of Materials, University of Aveiro, 3810-193 Aveiro, Portugal.
| | - Vasiliy Krylov
- Laboratory "Materials and Structures for Electro- and Magnetocaloric Energy Conversion", ITMOUniversity, 197101 St. Petersburg, Russia.
| | - Anton Burovikhin
- Saint Petersburg State Electrotechnical University, 197376 St. Petersburg, Russia.
| | - Yulia Pavlova
- Saint Petersburg State Electrotechnical University, 197376 St. Petersburg, Russia.
| | - Alexander Tselev
- Laboratory "Materials and Structures for Electro- and Magnetocaloric Energy Conversion", ITMOUniversity, 197101 St. Petersburg, Russia.
- School of Natural Sciences and Mathematics, Ural Federal University, 620000 Ekaterinburg, Russia.
| | - Andrei Kholkin
- Saint Petersburg State Electrotechnical University, 197376 St. Petersburg, Russia.
- School of Natural Sciences and Mathematics, Ural Federal University, 620000 Ekaterinburg, Russia.
- Department of Mathematics and Physics, Lappeenranta University of Technology, 53850 Lappeenranta, Finland.
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9
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Vlcek L, Ziatdinov M, Maksov A, Tselev A, Baddorf AP, Kalinin SV, Vasudevan RK. Learning from Imperfections: Predicting Structure and Thermodynamics from Atomic Imaging of Fluctuations. ACS Nano 2019; 13:718-727. [PMID: 30609895 DOI: 10.1021/acsnano.8b07980] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/09/2023]
Abstract
In materials characterization, traditionally a single experimental sample is used to derive information about a single point in the composition space, while the imperfections, impurities, and stochastic details of material structure are deemed irrelevant or complicating factors in the analysis. Here we demonstrate that atomic-scale studies of a single nominal composition can provide information about microstructures and thermodynamic response over a finite area of chemical space. Using the principles of statistical inference, we develop a framework for incorporating structural fluctuations into statistical mechanical models and use it to solve the inverse problem of deriving effective interatomic interactions responsible for elemental segregation in a La5/8Ca3/8MnO3 thin film. The results are further analyzed by a variational autoencoder to detect anomalous behavior in the composition phase diagram. This study provides a framework for creating generative models from a combination of multiple experimental data and provides direct insight into the driving forces for cation segregation in manganites.
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Affiliation(s)
- Lukas Vlcek
- Joint Institute for Computational Sciences , University of Tennessee , Knoxville , Tennessee 37996 , United States
| | | | - Artem Maksov
- UT Bredesen Center for Interdisciplinary Research , University of Tennessee , Knoxville , Tennessee 37996 , United States
| | - Alexander Tselev
- Department of Physics , CICECO - Aveiro Institute of Materials , 3810-193 Aveiro , Portugal
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10
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Nemšák S, Strelcov E, Guo H, Hoskins BD, Duchoň T, Mueller DN, Yulaev A, Vlassiouk I, Tselev A, Schneider CM, Kolmakov A. In Aqua Electrochemistry Probed by XPEEM: Experimental Setup, Examples, and Challenges. Top Catal 2018. [DOI: 10.1007/s11244-018-1065-4] [Citation(s) in RCA: 10] [Impact Index Per Article: 1.7] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/27/2022]
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11
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Tselev A, Fagan J, Kolmakov A. In-situ Near-Field Probe Microscopy of Plasma Processing. Appl Phys Lett 2018; 113:10.1063/1.5049592. [PMID: 35023877 PMCID: PMC8752043 DOI: 10.1063/1.5049592] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/23/2018] [Accepted: 12/03/2018] [Indexed: 06/01/2023]
Abstract
There exists a great necessity for in situ nanoscale characterization of surfaces and thin films during plasma treatments. To address this need, the current approaches rely on either 'post mortem' sample microscopy, or in situ optical methods. The latter, however, lack the required nanoscale spatial resolution. In this paper, we propose scanning near-field microwave microscopy to monitor plasma-assisted processes with a submicron spatial resolution. In our approach, a plasma environment with an object of interest is separated from the near-field probe and the rest of the microscope by a SiN membrane of a few-10s nm thickness, and the imaging is performed through this membrane. As a proof of concept, we were able to monitor gradual transformations of carbon nanotube films upon plasma-induced oxidation by a low-pressure air plasma. In the implemented approach with the near-field probe in contact with the membrane, the plasma processing should be interrupted during imaging to preserve the membrane integrity. Possible solutions to achieve in situ real-time imaging during plasma conditions are discussed.
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Affiliation(s)
- Alexander Tselev
- CICECO and Department of Physics, University of Aveiro, 3810-193 Aveiro, Portugal
| | - Jeffrey Fagan
- National Institute of Standards and Technology, Gaithersburg, MD 20899, USA
| | - Andrei Kolmakov
- National Institute of Standards and Technology, Gaithersburg, MD 20899, USA
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12
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Kalinin A, Atepalikhin V, Pakhomov O, Kholkin AL, Tselev A. An atomic force microscopy mode for nondestructive electromechanical studies and its application to diphenylalanine peptide nanotubes. Ultramicroscopy 2017; 185:49-54. [PMID: 29182919 DOI: 10.1016/j.ultramic.2017.11.009] [Citation(s) in RCA: 11] [Impact Index Per Article: 1.6] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/09/2017] [Revised: 10/12/2017] [Accepted: 11/19/2017] [Indexed: 10/18/2022]
Abstract
Nondestructive scanning probe microscopy of fragile nanoscale objects is currently in increasing need. In this paper, we report a novel atomic force microscopy mode, HybriD Piezoresponse Force Microscopy (HD-PFM), for simultaneous nondestructive analysis of piezoresponse as well as of mechanical and dielectric properties of nanoscale objects. We demonstrate this mode in application to self-assembled diphenylalanine peptide micro- and nanotubes formed on a gold-covered substrate. Nondestructive in- and out-of-plane piezoresponse measurements of tubes of less than 100 nm in diameter are demonstrated for the first time. High-resolution maps of tube elastic properties were obtained simultaneously with HD-PFM. Analysis of the measurement data combined with the finite-elements simulations allowed quantification of tube Young's modulus. The obtained value of 29 ± 1 GPa agrees well with the data obtained with other methods and reported in the literature.
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Affiliation(s)
- Arseny Kalinin
- NT-MDT Spectrum Instruments, Moscow 124460, Russia; Department of Physical and Quantum Electronics, Moscow Institute of Physics and Technology, Dolgoprudny, Moscow Region 141701, Russia
| | | | | | - Andrei L Kholkin
- CICECO-Aveiro Institute of Materials and Department of Physics, University of Aveiro, 3810-193 Aveiro, Portugal; School of Natural Sciences and Mathematics, Ural Federal University, 620000 Ekaterinburg, Russia
| | - Alexander Tselev
- ITMO University, St. Petersburg 197101, Russia; CICECO-Aveiro Institute of Materials and Department of Physics, University of Aveiro, 3810-193 Aveiro, Portugal.
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13
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Balke N, Jesse S, Carmichael B, Okatan MB, Kravchenko II, Kalinin SV, Tselev A. Quantification of in-contact probe-sample electrostatic forces with dynamic atomic force microscopy. Nanotechnology 2017; 28:065704. [PMID: 28050969 DOI: 10.1088/1361-6528/aa5370] [Citation(s) in RCA: 10] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/06/2023]
Abstract
Atomic force microscopy (AFM) methods utilizing resonant mechanical vibrations of cantilevers in contact with a sample surface have shown sensitivities as high as few picometers for detecting surface displacements. Such a high sensitivity is harnessed in several AFM imaging modes. Here, we demonstrate a cantilever-resonance-based method to quantify electrostatic forces on a probe in the probe-sample junction in the presence of a surface potential or when a bias voltage is applied to the AFM probe. We find that the electrostatic forces acting on the probe tip apex can produce signals equivalent to a few pm of surface displacement. In combination with modeling, the measurements of the force were used to access the strength of the electrical field at the probe tip apex in contact with a sample. We find an evidence that the electric field strength in the junction can reach ca. 1 V nm-1 at a bias voltage of a few volts and is limited by non-ideality of the tip-sample contact. This field is sufficiently strong to significantly influence material states and kinetic processes through charge injection, Maxwell stress, shifts of phase equilibria, and reduction of energy barriers for activated processes. Besides, the results provide a baseline for accounting for the effects of local electrostatic forces in electromechanical AFM measurements as well as offer additional means to probe ionic mobility and field-induced phenomena in solids.
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Affiliation(s)
- Nina Balke
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
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14
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Balke N, Jesse S, Yu P, Kalinin SV, Tselev A. Quantification of surface displacements and electromechanical phenomena via dynamic atomic force microscopy. Nanotechnology 2016; 27:425707. [PMID: 27631885 DOI: 10.1088/0957-4484/27/42/425707] [Citation(s) in RCA: 17] [Impact Index Per Article: 2.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/06/2023]
Abstract
Detection of dynamic surface displacements associated with local changes in material strain provides access to a number of phenomena and material properties. Contact resonance-enhanced methods of atomic force microscopy (AFM) have been shown capable of detecting ∼1-3 pm-level surface displacements, an approach used in techniques such as piezoresponse force microscopy, atomic force acoustic microscopy, and ultrasonic force microscopy. Here, based on an analytical model of AFM cantilever vibrations, we demonstrate a guideline to quantify surface displacements with high accuracy by taking into account the cantilever shape at the first resonant contact mode, depending on the tip-sample contact stiffness. The approach has been experimentally verified and further developed for piezoresponse force microscopy (PFM) using well-defined ferroelectric materials. These results open up a way to accurate and precise measurements of surface displacement as well as piezoelectric constants at the pm-scale with nanometer spatial resolution and will allow avoiding erroneous data interpretations and measurement artifacts. This analysis is directly applicable to all cantilever-resonance-based scanning probe microscopy (SPM) techniques.
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Affiliation(s)
- Nina Balke
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
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15
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Strelcov E, Ievlev A, Belianinov A, Tselev A, Kolmakov A, Kalinin SV. Local coexistence of VO2 phases revealed by deep data analysis. Sci Rep 2016; 6:29216. [PMID: 27384473 PMCID: PMC4935893 DOI: 10.1038/srep29216] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/21/2016] [Accepted: 06/13/2016] [Indexed: 11/25/2022] Open
Abstract
We report a synergistic approach of micro-Raman spectroscopic mapping and deep data analysis to study the distribution of crystallographic phases and ferroelastic domains in a defected Al-doped VO2 microcrystal. Bayesian linear unmixing revealed an uneven distribution of the T phase, which is stabilized by the surface defects and uneven local doping that went undetectable by other classical analysis techniques such as PCA and SIMPLISMA. This work demonstrates the impact of information recovery via statistical analysis and full mapping in spectroscopic studies of vanadium dioxide systems, which is commonly substituted by averaging or single point-probing approaches, both of which suffer from information misinterpretation due to low resolving power.
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Affiliation(s)
- Evgheni Strelcov
- Institute for Functional Imaging of Materials and Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States.,Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.,Maryland Nanocenter, University of Maryland, College Park, MD 20742, USA
| | - Anton Ievlev
- Institute for Functional Imaging of Materials and Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
| | - Alex Belianinov
- Institute for Functional Imaging of Materials and Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
| | - Alexander Tselev
- Institute for Functional Imaging of Materials and Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
| | - Andrei Kolmakov
- Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA
| | - Sergei V Kalinin
- Institute for Functional Imaging of Materials and Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
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16
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Tselev A, Yu P, Cao Y, Dedon LR, Martin LW, Kalinin SV, Maksymovych P. Microwave a.c. conductivity of domain walls in ferroelectric thin films. Nat Commun 2016; 7:11630. [PMID: 27240997 PMCID: PMC4895023 DOI: 10.1038/ncomms11630] [Citation(s) in RCA: 70] [Impact Index Per Article: 8.8] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/04/2016] [Accepted: 04/14/2016] [Indexed: 11/08/2022] Open
Abstract
Ferroelectric domain walls are of great interest as elementary building blocks for future electronic devices due to their intrinsic few-nanometre width, multifunctional properties and field-controlled topology. To realize the electronic functions, domain walls are required to be electrically conducting and addressable non-destructively. However, these properties have been elusive because conducting walls have to be electrically charged, which makes them unstable and uncommon in ferroelectric materials. Here we reveal that spontaneous and recorded domain walls in thin films of lead zirconate and bismuth ferrite exhibit large conductance at microwave frequencies despite being insulating at d.c. We explain this effect by morphological roughening of the walls and local charges induced by disorder with the overall charge neutrality. a.c. conduction is immune to large contact resistance enabling completely non-destructive walls read-out. This demonstrates a technological potential for harnessing a.c. conduction for oxide electronics and other materials with poor d.c. conduction, particularly at the nanoscale.
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Affiliation(s)
- Alexander Tselev
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
| | - Pu Yu
- State Key Laboratory for Low-Dimensional Quantum Physics, Department of Physics and Collaborative Innovation Center for Quantum Matter, Tsinghua University, Beijing 100084, China
- RIKEN Center for Emergent Matter Science (CEMS), Wako, Saitama 351-0198, Japan
| | - Ye Cao
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
| | - Liv R. Dedon
- Department of Materials Science and Engineering and Department of Physics, University of California, Berkeley, Berkeley, California 94720, USA
| | - Lane W. Martin
- Department of Materials Science and Engineering and Department of Physics, University of California, Berkeley, Berkeley, California 94720, USA
- Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA
| | - Sergei V. Kalinin
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
| | - Petro Maksymovych
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
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17
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Belianinov A, Iberi V, Tselev A, Susner MA, McGuire MA, Joy D, Jesse S, Rondinone AJ, Kalinin SV, Ovchinnikova OS. Polarization Control via He-Ion Beam Induced Nanofabrication in Layered Ferroelectric Semiconductors. ACS Appl Mater Interfaces 2016; 8:7349-7355. [PMID: 26918591 DOI: 10.1021/acsami.5b12056] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/05/2023]
Abstract
Rapid advances in nanoscience rely on continuous improvements of material manipulation at near-atomic scales. Currently, the workhorse of nanofabrication is resist-based lithography and its various derivatives. However, the use of local electron, ion, and physical probe methods is expanding, driven largely by the need for fabrication without the multistep preparation processes that can result in contamination from resists and solvents. Furthermore, probe-based methods extend beyond nanofabrication to nanomanipulation and to imaging which are all vital for a rapid transition to the prototyping and testing of devices. In this work we study helium ion interactions with the surface of bulk copper indium thiophosphate CuM(III)P2X6 (M = Cr, In; X= S, Se), a novel layered 2D material, with a Helium Ion Microscope (HIM). Using this technique, we are able to control ferrielectric domains and grow conical nanostructures with enhanced conductivity whose material volumes scale with the beam dosage. Compared to the copper indium thiophosphate (CITP) from which they grow, the nanostructures are oxygen rich, sulfur poor, and with virtually unchanged copper concentration as confirmed by energy-dispersive X-ray spectroscopy (EDX). Scanning electron microscopy (SEM) imaging contrast as well as scanning microwave microscopy (SMM) measurements suggest enhanced conductivity in the formed particles, whereas atomic force microscopy (AFM) measurements indicate that the produced structures have lower dissipation and are softer as compared to the CITP.
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Affiliation(s)
- Alex Belianinov
- The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, ‡Center for Nanophase Materials Sciences, and ⊥Materials Sciences and Technology Division, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37831, United States
- Department of Physics and Astronomy and ∥Department of Materials Science and Engineering, University of Tennessee , Knoxville, Tennessee 37996, United States
| | - Vighter Iberi
- The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, ‡Center for Nanophase Materials Sciences, and ⊥Materials Sciences and Technology Division, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37831, United States
- Department of Physics and Astronomy and ∥Department of Materials Science and Engineering, University of Tennessee , Knoxville, Tennessee 37996, United States
| | - Alexander Tselev
- The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, ‡Center for Nanophase Materials Sciences, and ⊥Materials Sciences and Technology Division, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37831, United States
- Department of Physics and Astronomy and ∥Department of Materials Science and Engineering, University of Tennessee , Knoxville, Tennessee 37996, United States
| | - Michael A Susner
- The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, ‡Center for Nanophase Materials Sciences, and ⊥Materials Sciences and Technology Division, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37831, United States
- Department of Physics and Astronomy and ∥Department of Materials Science and Engineering, University of Tennessee , Knoxville, Tennessee 37996, United States
| | - Michael A McGuire
- The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, ‡Center for Nanophase Materials Sciences, and ⊥Materials Sciences and Technology Division, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37831, United States
- Department of Physics and Astronomy and ∥Department of Materials Science and Engineering, University of Tennessee , Knoxville, Tennessee 37996, United States
| | - David Joy
- The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, ‡Center for Nanophase Materials Sciences, and ⊥Materials Sciences and Technology Division, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37831, United States
- Department of Physics and Astronomy and ∥Department of Materials Science and Engineering, University of Tennessee , Knoxville, Tennessee 37996, United States
| | - Stephen Jesse
- The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, ‡Center for Nanophase Materials Sciences, and ⊥Materials Sciences and Technology Division, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37831, United States
- Department of Physics and Astronomy and ∥Department of Materials Science and Engineering, University of Tennessee , Knoxville, Tennessee 37996, United States
| | - Adam J Rondinone
- The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, ‡Center for Nanophase Materials Sciences, and ⊥Materials Sciences and Technology Division, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37831, United States
- Department of Physics and Astronomy and ∥Department of Materials Science and Engineering, University of Tennessee , Knoxville, Tennessee 37996, United States
| | - Sergei V Kalinin
- The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, ‡Center for Nanophase Materials Sciences, and ⊥Materials Sciences and Technology Division, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37831, United States
- Department of Physics and Astronomy and ∥Department of Materials Science and Engineering, University of Tennessee , Knoxville, Tennessee 37996, United States
| | - Olga S Ovchinnikova
- The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, ‡Center for Nanophase Materials Sciences, and ⊥Materials Sciences and Technology Division, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37831, United States
- Department of Physics and Astronomy and ∥Department of Materials Science and Engineering, University of Tennessee , Knoxville, Tennessee 37996, United States
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18
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Tselev A, Velmurugan J, Ievlev AV, Kalinin SV, Kolmakov A. Seeing through Walls at the Nanoscale: Microwave Microscopy of Enclosed Objects and Processes in Liquids. ACS Nano 2016; 10:3562-3570. [PMID: 26866377 PMCID: PMC5424529 DOI: 10.1021/acsnano.5b07919] [Citation(s) in RCA: 10] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/31/2023]
Abstract
Noninvasive in situ nanoscale imaging in liquid environments is a current imperative in the analysis of delicate biomedical objects and electrochemical processes at reactive liquid-solid interfaces. Microwaves of a few gigahertz frequencies offer photons with energies of ≈10 μeV, which can affect neither electronic states nor chemical bonds in condensed matter. Here, we describe an implementation of scanning near-field microwave microscopy for imaging in liquids using ultrathin molecular impermeable membranes separating scanning probes from samples enclosed in environmental cells. We imaged a model electroplating reaction as well as individual live cells. Through a side-by-side comparison of the microwave imaging with scanning electron microscopy, we demonstrate the advantage of microwaves for artifact-free imaging.
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Affiliation(s)
- Alexander Tselev
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
| | - Jeyavel Velmurugan
- Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899
- Maryland NanoCenter, University of Maryland, College Park, MD 20742
| | - Anton V. Ievlev
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
| | - Sergei V. Kalinin
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
| | - Andrei Kolmakov
- Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899
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19
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Jesse S, He Q, Lupini AR, Leonard DN, Oxley MP, Ovchinnikov O, Unocic RR, Tselev A, Fuentes-Cabrera M, Sumpter BG, Pennycook SJ, Kalinin SV, Borisevich AY. Atomic-Level Sculpting of Crystalline Oxides: Toward Bulk Nanofabrication with Single Atomic Plane Precision. Small 2015; 11:5895-5900. [PMID: 26478983 DOI: 10.1002/smll.201502048] [Citation(s) in RCA: 32] [Impact Index Per Article: 3.6] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/09/2015] [Revised: 08/31/2015] [Indexed: 06/05/2023]
Abstract
The atomic-level sculpting of 3D crystalline oxide nanostructures from metastable amorphous films in a scanning transmission electron microscope (STEM) is demonstrated. Strontium titanate nanostructures grow epitaxially from the crystalline substrate following the beam path. This method can be used for fabricating crystalline structures as small as 1-2 nm and the process can be observed in situ with atomic resolution. The fabrication of arbitrary shape structures via control of the position and scan speed of the electron beam is further demonstrated. Combined with broad availability of the atomic resolved electron microscopy platforms, these observations suggest the feasibility of large scale implementation of bulk atomic-level fabrication as a new enabling tool of nanoscience and technology, providing a bottom-up, atomic-level complement to 3D printing.
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Affiliation(s)
- Stephen Jesse
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
- The Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Qian He
- The Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
- Materials Sciences and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Andrew R Lupini
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
- Materials Sciences and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Donovan N Leonard
- Materials Sciences and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Mark P Oxley
- Department of Physics and Astronomy, Vanderbilt University, Nashville, TN, 37235, USA
| | - Oleg Ovchinnikov
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
- Department of Physics and Astronomy, Vanderbilt University, Nashville, TN, 37235, USA
| | - Raymond R Unocic
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
- The Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Alexander Tselev
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
- The Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Miguel Fuentes-Cabrera
- The Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
- Computer Science and Mathematics Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Bobby G Sumpter
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
- The Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
- Computer Science and Mathematics Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Stephen J Pennycook
- Department of Materials Science and Engineering, National University of Singapore, Singapore, 117575, Singapore
| | - Sergei V Kalinin
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
- The Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Albina Y Borisevich
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
- The Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
- Materials Sciences and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
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20
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Li Q, Cao Y, Yu P, Vasudevan RK, Laanait N, Tselev A, Xue F, Chen LQ, Maksymovych P, Kalinin SV, Balke N. Giant elastic tunability in strained BiFeO3 near an electrically induced phase transition. Nat Commun 2015; 6:8985. [PMID: 26597483 PMCID: PMC4673877 DOI: 10.1038/ncomms9985] [Citation(s) in RCA: 37] [Impact Index Per Article: 4.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/17/2015] [Accepted: 10/22/2015] [Indexed: 11/26/2022] Open
Abstract
Elastic anomalies are signatures of phase transitions in condensed matters and have traditionally been studied using various techniques spanning from neutron scattering to static mechanical testing. Here, using band-excitation elastic/piezoresponse spectroscopy, we probed sub-MHz elastic dynamics of a tip bias-induced rhombohedral−tetragonal phase transition of strained (001)-BiFeO3 (rhombohedral) ferroelectric thin films from ∼103 nm3 sample volumes. Near this transition, we observed that the Young's modulus intrinsically softens by over 30% coinciding with two- to three-fold enhancement of local piezoresponse. Coupled with phase-field modelling, we also addressed the influence of polarization switching and mesoscopic structural heterogeneities (for example, domain walls) on the kinetics of this phase transition, thereby providing fresh insights into the morphotropic phase boundary in ferroelectrics. Furthermore, the giant electrically tunable elastic stiffness and corresponding electromechanical properties observed here suggest potential applications of BiFeO3 in next-generation frequency-agile electroacoustic devices, based on the utilization of the soft modes underlying successive ferroelectric phase transitions. Ferroelectric materials possess spontaneous electrical polarization coupled to their underlying lattice structure, which may be utilized technologically. Here, the authors use band-excitation piezoresponse/elastic spectroscopy to study the sub-megahertz dynamics of a structural phase transition in BiFeO3.
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Affiliation(s)
- Q Li
- Center for Nanophase Materials Sciences and Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
| | - Y Cao
- Center for Nanophase Materials Sciences and Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
| | - P Yu
- State Key Laboratory for Low-Dimensional Quantum Physics, Department of Physics and Collaborative Innovation Center for Quantum Matter, Tsinghua University, Beijing 100084, China.,RIKEN Center for Emergent Matter Science (CEMS), Wako, Saitama 351-0198, Japan
| | - R K Vasudevan
- Center for Nanophase Materials Sciences and Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
| | - N Laanait
- Center for Nanophase Materials Sciences and Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
| | - A Tselev
- Center for Nanophase Materials Sciences and Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
| | - F Xue
- Department of Materials Science and Engineering, Pennsylvania State University, University Park, Pennsylvania 16802, USA
| | - L Q Chen
- Department of Materials Science and Engineering, Pennsylvania State University, University Park, Pennsylvania 16802, USA
| | - P Maksymovych
- Center for Nanophase Materials Sciences and Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
| | - S V Kalinin
- Center for Nanophase Materials Sciences and Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
| | - N Balke
- Center for Nanophase Materials Sciences and Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
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21
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Gianfrancesco AG, Tselev A, Baddorf AP, Kalinin SV, Vasudevan RK. The Ehrlich-Schwoebel barrier on an oxide surface: a combined Monte-Carlo and in situ scanning tunneling microscopy approach. Nanotechnology 2015; 26:455705. [PMID: 26489518 DOI: 10.1088/0957-4484/26/45/455705] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/05/2023]
Abstract
The controlled growth of epitaxial films of complex oxides requires an atomistic understanding of key parameters determining final film morphology, such as termination dependence on adatom diffusion, and height of the Ehrlich-Schwoebel (ES) barrier. Here, through an in situ scanning tunneling microscopy study of mixed-terminated La5/8Ca3/8MnO3 (LCMO) films, we image adatoms and observe pile-up at island edges. Image analysis allows determination of the population of adatoms at the edge of islands and fractions on A-site and B-site terminations. A simple Monte-Carlo model, simulating the random walk of adatoms on a sinusoidal potential landscape using Boltzmann statistics is used to reproduce the experimental data, and provides an estimate of the ES barrier as ∼0.18 ± 0.04 eV at T = 1023 K, similar to those of metal adatoms on metallic surfaces. These studies highlight the utility of in situ imaging, in combination with basic Monte-Carlo methods, in elucidating the factors which control the final film growth in complex oxides.
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Affiliation(s)
- Anthony G Gianfrancesco
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge TN 37831, USA. ORNL Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge TN 37831, USA. UT/ORNL Bredesen Center, University of Tennessee, Knoxville, TN, USA
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22
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Qiao L, Jang JH, Singh DJ, Gai Z, Xiao H, Mehta A, Vasudevan RK, Tselev A, Feng Z, Zhou H, Li S, Prellier W, Zu X, Liu Z, Borisevich A, Baddorf AP, Biegalski MD. Dimensionality Controlled Octahedral Symmetry-Mismatch and Functionalities in Epitaxial LaCoO₃/SrTiO₃ Heterostructures. Nano Lett 2015; 15:4677-84. [PMID: 26103204 DOI: 10.1021/acs.nanolett.5b01471] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/27/2023]
Abstract
Epitaxial strain provides a powerful approach to manipulate physical properties of materials through rigid compression or extension of their chemical bonds via lattice-mismatch. Although symmetry-mismatch can lead to new physics by stabilizing novel interfacial structures, challenges in obtaining atomic-level structural information as well as lack of a suitable approach to separate it from the parasitical lattice-mismatch have limited the development of this field. Here, we present unambiguous experimental evidence that the symmetry-mismatch can be strongly controlled by dimensionality and significantly impact the collective electronic and magnetic functionalities in ultrathin perovskite LaCoO3/SrTiO3 heterojunctions. State-of-art diffraction and microscopy reveal that symmetry breaking dramatically modifies the interfacial structure of CoO6 octahedral building-blocks, resulting in expanded octahedron volume, reduced covalent screening, and stronger electron correlations. Such phenomena fundamentally alter the electronic and magnetic behaviors of LaCoO3 thin-films. We conclude that for epitaxial systems, correlation strength can be tuned by changing orbital hybridization, thus affecting the Coulomb repulsion, U, instead of by changing the band structure as the common paradigm in bulks. These results clarify the origin of magnetic ordering for epitaxial LaCoO3 and provide a route to manipulate electron correlation and magnetic functionality by orbital engineering at oxide heterojunctions.
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Affiliation(s)
- Liang Qiao
- †School of Materials, The University of Manchester, Manchester, M13 9PL, United Kingdom
| | | | | | | | | | - Apurva Mehta
- ⊥Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laboratory, Stanford University, Menlo Park, California 94025, United States
| | | | | | | | | | - Sean Li
- ○School of Materials Science and Engineering, University of New South Wales, Sydney, 2052, NSW Australia
| | - Wilfrid Prellier
- ◆Laboratoire CRISMAT, CNRS UMR 6508, ENSICAEN, Normandie Université, 6 Bd Maréchal Juin, F-14050 Caen Cedex 4, France
| | | | - Zijiang Liu
- ¶Department of Physics, Lanzhou City University, Lanzhou 730070, China
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23
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Balke N, Maksymovych P, Jesse S, Herklotz A, Tselev A, Eom CB, Kravchenko II, Yu P, Kalinin SV. Differentiating Ferroelectric and Nonferroelectric Electromechanical Effects with Scanning Probe Microscopy. ACS Nano 2015; 9:6484-92. [PMID: 26035634 DOI: 10.1021/acsnano.5b02227] [Citation(s) in RCA: 32] [Impact Index Per Article: 3.6] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/25/2023]
Abstract
Ferroelectricity in functional materials remains one of the most fascinating areas of modern science in the past several decades. In the last several years, the rapid development of piezoresponse force microscopy (PFM) and spectroscopy revealed the presence of electromechanical hysteresis loops and bias-induced remnant polar states in a broad variety of materials including many inorganic oxides, polymers, and biosystems. In many cases, this behavior was interpreted as the ample evidence for ferroelectric nature of the system. Here, we systematically analyze PFM responses on ferroelectric and nonferroelectric materials and demonstrate that mechanisms unrelated to ferroelectricity can induce ferroelectric-like characteristics through charge injection and electrostatic forces on the tip. We will focus on similarities and differences in various PFM measurement characteristics to provide an experimental guideline to differentiate between ferroelectric material properties and charge injection. In the end, we apply the developed measurement protocols to an unknown ferroelectric material.
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Affiliation(s)
| | | | | | | | | | - Chang-Beom Eom
- ∥Materials Science and Engineering, University of Wisconsin, Madison, Wisconsin 53706, United States
| | | | - Pu Yu
- ⊥State Key Laboratory of Low-Dimensional Quantum Physics and Department of Physics, Tsinghua University, Beijing 100084, China
- #Collaborative Innovation Center of Quantum Matter, Beijing 100084, China
- ¶RIKEN Center for Emergent Matter Science (CEMS), Wako, Saitama 351-0198, Japan
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24
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Belianinov A, Vasudevan R, Strelcov E, Steed C, Yang SM, Tselev A, Jesse S, Biegalski M, Shipman G, Symons C, Borisevich A, Archibald R, Kalinin S. Big data and deep data in scanning and electron microscopies: deriving functionality from multidimensional data sets. Adv Struct Chem Imaging 2015; 1:6. [PMID: 27547705 PMCID: PMC4977326 DOI: 10.1186/s40679-015-0006-6] [Citation(s) in RCA: 67] [Impact Index Per Article: 7.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 01/27/2015] [Accepted: 04/21/2015] [Indexed: 11/10/2022]
Abstract
The development of electron and scanning probe microscopies in the second half of the twentieth century has produced spectacular images of the internal structure and composition of matter with nanometer, molecular, and atomic resolution. Largely, this progress was enabled by computer-assisted methods of microscope operation, data acquisition, and analysis. Advances in imaging technology in the beginning of the twenty-first century have opened the proverbial floodgates on the availability of high-veracity information on structure and functionality. From the hardware perspective, high-resolution imaging methods now routinely resolve atomic positions with approximately picometer precision, allowing for quantitative measurements of individual bond lengths and angles. Similarly, functional imaging often leads to multidimensional data sets containing partial or full information on properties of interest, acquired as a function of multiple parameters (time, temperature, or other external stimuli). Here, we review several recent applications of the big and deep data analysis methods to visualize, compress, and translate this multidimensional structural and functional data into physically and chemically relevant information.
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Affiliation(s)
- Alex Belianinov
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
- The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
| | - Rama Vasudevan
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
- The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
| | - Evgheni Strelcov
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
- The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
| | - Chad Steed
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
- Computational Sciences and Engineering Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
| | - Sang Mo Yang
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
- The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
- Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul, 151-747 South Korea
- Department of Physics and Astronomy, Seoul National University, Seoul, 151-747 South Korea
| | - Alexander Tselev
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
- The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
| | - Stephen Jesse
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
- The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
| | - Michael Biegalski
- The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
| | - Galen Shipman
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
- Computer, Computational, and Statistical Sciences, Los Alamos National Laboratory, Los Alamos, NM 87545 USA
| | - Christopher Symons
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
- Computational Sciences and Engineering Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
| | - Albina Borisevich
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
- Materials Sciences and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
| | - Rick Archibald
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
- Computer Science and Mathematics Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
| | - Sergei Kalinin
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
- The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
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25
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Tselev A, Vasudevan RK, Gianfrancesco AG, Qiao L, Ganesh P, Meyer TL, Lee HN, Biegalski MD, Baddorf AP, Kalinin SV. Surface Control of Epitaxial Manganite Films via Oxygen Pressure. ACS Nano 2015; 9:4316-4327. [PMID: 25758864 DOI: 10.1021/acsnano.5b00743] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/04/2023]
Abstract
The trend to reduce device dimensions demands increasing attention to atomic-scale details of structure of thin films as well as to pathways to control it. This is of special importance in the systems with multiple competing interactions. We have used in situ scanning tunneling microscopy to image surfaces of La5/8Ca3/8MnO3 films grown by pulsed laser deposition. The atomically resolved imaging was combined with in situ angle-resolved X-ray photoelectron spectroscopy. We find a strong effect of the background oxygen pressure during deposition on structural and chemical features of the film surface. Deposition at 50 mTorr of O2 leads to mixed-terminated film surfaces, with B-site (MnO2) termination being structurally imperfect at the atomic scale. A relatively small reduction of the oxygen pressure to 20 mTorr results in a dramatic change of the surface structure leading to a nearly perfectly ordered B-site terminated surface with only a small fraction of A-site (La,Ca)O termination. This is accompanied, however, by surface roughening at a mesoscopic length scale. The results suggest that oxygen has a strong link to the adatom mobility during growth. The effect of the oxygen pressure on dopant surface segregation is also pronounced: Ca surface segregation is decreased with oxygen pressure reduction.
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Affiliation(s)
- Alexander Tselev
- Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
| | - Rama K Vasudevan
- Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
| | | | - Liang Qiao
- Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
| | - P Ganesh
- Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
| | - Tricia L Meyer
- Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
| | - Ho Nyung Lee
- Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
| | | | - Arthur P Baddorf
- Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
| | - Sergei V Kalinin
- Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
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26
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Li Q, Jesse S, Tselev A, Collins L, Yu P, Kravchenko I, Kalinin SV, Balke N. Probing local bias-induced transitions using photothermal excitation contact resonance atomic force microscopy and voltage spectroscopy. ACS Nano 2015; 9:1848-1857. [PMID: 25559112 DOI: 10.1021/nn506753u] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/04/2023]
Abstract
Nanomechanical properties are closely related to the states of matter, including chemical composition, crystal structure, mesoscopic domain configuration, etc. Investigation of these properties at the nanoscale requires not only static imaging methods, e.g., contact resonance atomic force microscopy (CR-AFM), but also spectroscopic methods capable of revealing their dependence on various external stimuli. Here we demonstrate the voltage spectroscopy of CR-AFM, which was realized by combining photothermal excitation (as opposed to the conventional piezoacoustic excitation method) with the band excitation technique. We applied this spectroscopy to explore local bias-induced phenomena ranging from purely physical to surface electromechanical and electrochemical processes. Our measurements show that the changes in the surface properties associated with these bias-induced transitions can be accurately assessed in a fast and dynamic manner, using resonance frequency as a signature. With many of the advantages offered by photothermal excitation, contact resonance voltage spectroscopy not only is expected to find applications in a broader field of nanoscience but also will provide a basis for future development of other nanoscale elastic spectroscopies.
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Affiliation(s)
- Qian Li
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37831, United States
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27
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Yang SM, Strelcov E, Paranthaman MP, Tselev A, Noh TW, Kalinin SV. Humidity effect on nanoscale electrochemistry in solid silver ion conductors and the dual nature of its locality. Nano Lett 2015; 15:1062-1069. [PMID: 25564924 DOI: 10.1021/nl5040286] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/04/2023]
Abstract
Scanning probe microscopy (SPM) is a powerful tool to investigate electrochemistry in nanoscale volumes. While most SPM-based studies have focused on reactions at the tip-surface junction, charge and mass conservation requires coupled and intrinsically nonlocal cathodic and anodic processes that can be significantly affected by ambient humidity. Here, we explore the role of water in both cathodic and anodic processes, associated charge transport, and topographic volume changes depending on the polarity of tip bias. The first-order reversal curve current-voltage technique combined with simultaneous detection of the sample topography, referred to as FORC-IVz, was applied to a silver solid ion conductor. We found that the protons generated from water affect silver ionic conduction, silver particle formation and dissolution, and mechanical integrity of the material. This work highlights the dual nature (simultaneously local and nonlocal) of electrochemical SPM studies, which should be considered for comprehensive understanding of nanoscale electrochemistry.
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Affiliation(s)
- Sang Mo Yang
- Center for Correlated Electron Systems, Institute for Basic Science (IBS) , Seoul 151-747, Korea
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28
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Kumar R, Bocharova V, Strelcov E, Tselev A, Kravchenko II, Berdzinski S, Strehmel V, Ovchinnikova OS, Minutolo JA, Sangoro JR, Agapov AL, Sokolov AP, Kalinin SV, Sumpter BG. Ion transport and softening in a polymerized ionic liquid. Nanoscale 2015; 7:947-955. [PMID: 25463322 DOI: 10.1039/c4nr05491a] [Citation(s) in RCA: 11] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/04/2023]
Abstract
Polymerized ionic liquids (PolyILs) are promising materials for various solid state electronic applications such as dye-sensitized solar cells, lithium batteries, actuators, field-effect transistors, light emitting electrochemical cells, and electrochromic devices. However, fundamental understanding of interconnection between ionic transport and mechanical properties in PolyILs is far from complete. In this work, local charge transport and structural changes in films of a PolyIL are studied using an integrated experiment-theory based approach. Experimental data for the kinetics of charging and steady state current-voltage relations can be explained by taking into account the dissociation of ions under an applied electric field (known as the Wien effect). Onsager's theory of the Wien effect coupled with the Poisson-Nernst-Planck formalism for the charge transport is found to be in excellent agreement with the experimental results. The agreement between the theory and experiments allows us to predict structural properties of the PolyIL films. We have observed significant softening of the PolyIL films beyond certain threshold voltages and formation of holes under a scanning probe microscopy (SPM) tip, through which an electric field was applied. The observed softening is explained by the theory of depression in glass transition temperature resulting from enhanced dissociation of ions with an increase in applied electric field.
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Affiliation(s)
- Rajeev Kumar
- Computer Science and Mathematics Division, Oak Ridge National Laboratory, Oak Ridge, TN-37831, USA.
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29
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Collins L, Jesse S, Kilpatrick JI, Tselev A, Okatan MB, Kalinin SV, Rodriguez BJ. Kelvin probe force microscopy in liquid using electrochemical force microscopy. Beilstein J Nanotechnol 2015; 6:201-14. [PMID: 25671164 PMCID: PMC4311590 DOI: 10.3762/bjnano.6.19] [Citation(s) in RCA: 12] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/14/2014] [Accepted: 12/10/2014] [Indexed: 05/24/2023]
Abstract
Conventional closed loop-Kelvin probe force microscopy (KPFM) has emerged as a powerful technique for probing electric and transport phenomena at the solid-gas interface. The extension of KPFM capabilities to probe electrostatic and electrochemical phenomena at the solid-liquid interface is of interest for a broad range of applications from energy storage to biological systems. However, the operation of KPFM implicitly relies on the presence of a linear lossless dielectric in the probe-sample gap, a condition which is violated for ionically-active liquids (e.g., when diffuse charge dynamics are present). Here, electrostatic and electrochemical measurements are demonstrated in ionically-active (polar isopropanol, milli-Q water and aqueous NaCl) and ionically-inactive (non-polar decane) liquids by electrochemical force microscopy (EcFM), a multidimensional (i.e., bias- and time-resolved) spectroscopy method. In the absence of mobile charges (ambient and non-polar liquids), KPFM and EcFM are both feasible, yielding comparable contact potential difference (CPD) values. In ionically-active liquids, KPFM is not possible and EcFM can be used to measure the dynamic CPD and a rich spectrum of information pertaining to charge screening, ion diffusion, and electrochemical processes (e.g., Faradaic reactions). EcFM measurements conducted in isopropanol and milli-Q water over Au and highly ordered pyrolytic graphite electrodes demonstrate both sample- and solvent-dependent features. Finally, the feasibility of using EcFM as a local force-based mapping technique of material-dependent electrostatic and electrochemical response is investigated. The resultant high dimensional dataset is visualized using a purely statistical approach that does not require a priori physical models, allowing for qualitative mapping of electrostatic and electrochemical material properties at the solid-liquid interface.
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Affiliation(s)
- Liam Collins
- School of Physics, University College Dublin, Belfield, Dublin 4, Ireland
- Conway Institute of Biomolecular and Biomedical Research, University College Dublin, Belfield, Dublin 4, Ireland
| | - Stephen Jesse
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
| | - Jason I Kilpatrick
- Conway Institute of Biomolecular and Biomedical Research, University College Dublin, Belfield, Dublin 4, Ireland
| | - Alexander Tselev
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
| | - M Baris Okatan
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
| | - Sergei V Kalinin
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
| | - Brian J Rodriguez
- School of Physics, University College Dublin, Belfield, Dublin 4, Ireland
- Conway Institute of Biomolecular and Biomedical Research, University College Dublin, Belfield, Dublin 4, Ireland
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30
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Tselev A, Morozovska AN, Udod A, Eliseev EA, Kalinin SV. Self-consistent modeling of electrochemical strain microscopy of solid electrolytes. Nanotechnology 2014; 25:445701. [PMID: 25302673 DOI: 10.1088/0957-4484/25/44/445701] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/04/2023]
Abstract
Electrochemical strain microscopy (ESM) employs a strong electromechanical coupling in solid ionic conductors to map ionic transport and electrochemical processes with nanometer-scale spatial resolution. To elucidate the mechanisms of the ESM image formation, we performed self-consistent numerical modeling of the electromechanical response in solid electrolytes under the probe tip in a linear, small-signal regime using the Boltzmann-Planck-Nernst-Einstein theory and Vegard's law while taking account of the electromigration and diffusion. The characteristic time scales involved in the formation of the ESM response were identified. It was found that the dynamics of the charge carriers in the tip-electrolyte system with blocking interfaces can be described as charging of the diffuse layer at the tip-electrolyte interface through the tip contact spreading resistance. At the high frequencies used in the detection regime, the distribution of the charge carriers under the tip is governed by evanescent concentration waves generated at the tip-electrolyte interface. The ion drift length in the electric field produced by the tip determines the ESM response at high frequencies, which follows a 1/f asymptotic law. The electronic conductivity, as well as the electron transport through the electrode-electrolyte interface, do not have a significant effect on the ESM signal in the detection regime. The results indicate, however, that for typical solid electrolytes at room temperature, the ESM response originates at and contains information about the very surface layer of a sample, and the properties of the one-unit-cell-thick surface layer may significantly contribute to the ESM response, implying a high surface sensitivity and a high lateral resolution of the technique. On the other hand, it follows that a rigorous analysis of the ESM signals requires techniques that account for the discrete nature of a solid.
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Affiliation(s)
- Alexander Tselev
- The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
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31
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Collins L, Tselev A, Jesse S, Okatan MB, Proksch R, Mathews JP, Mitchell GD, Rodriguez BJ, Kalinin SV, Ivanov IN. Breaking the limits of structural and mechanical imaging of the heterogeneous structure of coal macerals. Nanotechnology 2014; 25:435402. [PMID: 25299223 DOI: 10.1088/0957-4484/25/43/435402] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/04/2023]
Abstract
The correlation between local mechanical (elasto-plastic) and structural (composition) properties of coal presents significant fundamental and practical interest for coal processing and for the development of rheological models of coal to coke transformations. Here, we explore the relationship between the local structural, chemical composition, and mechanical properties of coal using a combination of confocal micro-Raman imaging and band excitation atomic force acoustic microscopy for a bituminous coal. This allows high resolution imaging (10s of nm) of mechanical properties of the heterogeneous (banded) architecture of coal and correlating them to the optical gap, average crystallite size, the bond-bending disorder of sp(2) aromatic double bonds, and the defect density. This methodology allows the structural and mechanical properties of coal components (lithotypes, microlithotypes, and macerals) to be understood, and related to local chemical structure, potentially allowing for knowledge-based modeling and optimization of coal utilization processes.
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Affiliation(s)
- L Collins
- School of Physics, University College Dublin, Belfield, Dublin 4, Ireland. Conway Institute of Biomedical and Biomolecular Research, University College Dublin, Belfield, Dublin 4, Ireland
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32
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Vasudevan RK, Tselev A, Baddorf AP, Kalinin SV. Big-data reflection high energy electron diffraction analysis for understanding epitaxial film growth processes. ACS Nano 2014; 8:10899-908. [PMID: 25268549 DOI: 10.1021/nn504730n] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/27/2023]
Abstract
Reflection high energy electron diffraction (RHEED) has by now become a standard tool for in situ monitoring of film growth by pulsed laser deposition and molecular beam epitaxy. Yet despite the widespread adoption and wealth of information in RHEED images, most applications are limited to observing intensity oscillations of the specular spot, and much additional information on growth is discarded. With ease of data acquisition and increased computation speeds, statistical methods to rapidly mine the data set are now feasible. Here, we develop such an approach to the analysis of the fundamental growth processes through multivariate statistical analysis of a RHEED image sequence. This approach is illustrated for growth of La(x)Ca(1-x)MnO(3) films grown on etched (001) SrTiO(3) substrates, but is universal. The multivariate methods including principal component analysis and k-means clustering provide insight into the relevant behaviors, the timing and nature of a disordered to ordered growth change, and highlight statistically significant patterns. Fourier analysis yields the harmonic components of the signal and allows separation of the relevant components and baselines, isolating the asymmetric nature of the step density function and the transmission spots from the imperfect layer-by-layer (LBL) growth. These studies show the promise of big data approaches to obtaining more insight into film properties during and after epitaxial film growth. Furthermore, these studies open the pathway to use forward prediction methods to potentially allow significantly more control over growth process and hence final film quality.
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Affiliation(s)
- Rama K Vasudevan
- Center for Nanophase Materials Sciences and ‡ORNL Institute for Functional Imaging of Materials, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37831, United States
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33
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Sugiyama I, Kim Y, Jesse S, Strelcov E, Kumar A, Tselev A, Rahani EK, Shenoy VB, Yamamoto T, Shibata N, Ikuhara Y, Kalinin SV. Spatially-resolved mapping of history-dependent coupled electrochemical and electronical behaviors of electroresistive NiO. Sci Rep 2014; 4:6725. [PMID: 25335689 PMCID: PMC4205888 DOI: 10.1038/srep06725] [Citation(s) in RCA: 11] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/26/2014] [Accepted: 10/02/2014] [Indexed: 11/09/2022] Open
Abstract
Bias-induced oxygen ion dynamics underpins a broad spectrum of electroresistive and memristive phenomena in oxide materials. Although widely studied by device-level and local voltage-current spectroscopies, the relationship between electroresistive phenomena, local electrochemical behaviors, and microstructures remains elusive. Here, the interplay between history-dependent electronic transport and electrochemical phenomena in a NiO single crystalline thin film with a number of well-defined defect types is explored on the nanometer scale using an atomic force microscopy-based technique. A variety of electrochemically-active regions were observed and spatially resolved relationship between the electronic and electrochemical phenomena was revealed. The regions with pronounced electroresistive activity were further correlated with defects identified by scanning transmission electron microscopy. Using fully coupled mechanical-electrochemical modeling, we illustrate that the spatial distribution of strain plays an important role in electrochemical and electroresistive phenomena. These studies illustrate an approach for simultaneous mapping of the electronic and ionic transport on a single defective structure level such as dislocations or interfaces, and pave the way for creating libraries of defect-specific electrochemical responses.
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Affiliation(s)
- Issei Sugiyama
- Institute of Engineering Innovation, The University of Tokyo, Yayoi 2-11-16, Bunkyo-ku, Tokyo, Japan, 113-8656
| | - Yunseok Kim
- School of Advanced Materials Science and Engineering, Sungkyunkwan University, Cheoncheon-dong 300, Jangan-gu, Suwon, Gyeonggi-do 440-746, Republic of Korea
| | - Stephen Jesse
- The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6496, United States
| | - Evgheni Strelcov
- The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6496, United States
| | - Amit Kumar
- School of Mathematics and Physics, Queen's University Belfast, University Road Belfast, Northern Ireland, BT7 1NN, United Kingdom
| | - Alexander Tselev
- The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6496, United States
| | - Ehasan Kabiri Rahani
- Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia PA, 19104-6272
| | - Vivek B. Shenoy
- Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia PA, 19104-6272
| | - Takahisa Yamamoto
- Institute of Engineering Innovation, The University of Tokyo, Yayoi 2-11-16, Bunkyo-ku, Tokyo, Japan, 113-8656
- Department of Quantum Engineering, Nagoya University, Furo-cho, Chiho-ku, Nagoya-shi, Aichi, Japan, 464-8603
- Nanostructures Research Laboratory, Japan Fine Ceramics Center, Rokuno 2-4-1, Atsuta-ku, Nagoya-shi, Aichi, Japan, 456-8587
| | - Naoya Shibata
- Institute of Engineering Innovation, The University of Tokyo, Yayoi 2-11-16, Bunkyo-ku, Tokyo, Japan, 113-8656
- PRESTO Japan Science and Technology Agency, 4-1-8 Honcho Kawaguchi, Saitama 332-0012, Japan
| | - Yuichi Ikuhara
- Institute of Engineering Innovation, The University of Tokyo, Yayoi 2-11-16, Bunkyo-ku, Tokyo, Japan, 113-8656
- Nanostructures Research Laboratory, Japan Fine Ceramics Center, Rokuno 2-4-1, Atsuta-ku, Nagoya-shi, Aichi, Japan, 456-8587
- WPI Advanced Institute for Materials Research, Tohoku University, Katahira 2-1-1, Aoba-ku, Sendai-shi, Miyagi, Japan, 980-8577
| | - Sergei V. Kalinin
- The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6496, United States
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6496, United States
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34
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Collins L, Kilpatrick JI, Weber SAL, Tselev A, Vlassiouk IV, Ivanov IN, Jesse S, Kalinin SV, Rodriguez BJ. Open loop Kelvin probe force microscopy with single and multi-frequency excitation. Nanotechnology 2013; 24:475702. [PMID: 24176878 DOI: 10.1088/0957-4484/24/47/475702] [Citation(s) in RCA: 37] [Impact Index Per Article: 3.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/07/2023]
Abstract
Conventional Kelvin probe force microscopy (KPFM) relies on closed loop (CL) bias feedback for the determination of surface potential (SP). However, SP measured by CL-KPFM has been shown to be strongly influenced by the choice of measurement parameters due to non-electrostatic contributions to the input signal of the bias feedback loop. This often leads to systematic errors of several hundred mV and can also result in topographical crosstalk. Here, open loop (OL)-KPFM modes are investigated as a means of obtaining a quantitative, crosstalk free measurement of the SP of graphene grown on Cu foil, and are directly contrasted with CL-KPFM. OL-KPFM operation is demonstrated in both single and multi-frequency excitation regimes, yielding quantitative SP measurements. The SP difference between single and multilayer graphene structures using OL-KPFM was found to be 63 ± 11 mV, consistent with values previously reported by CL-KPFM. Furthermore, the same relative potential difference between Al2O3-coated graphene and Al2O3-coated Cu was observed using both CL and OL techniques. We observed an offset of 55 mV between absolute SP values obtained by OL and CL techniques, which is attributed to the influence of non-electrostatic contributions to the input of the bias feedback used in CL-KPFM.
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Affiliation(s)
- L Collins
- School of Physics, University College Dublin, Belfield, Dublin 4, Ireland. Conway Institute of Biomedical and Biomolecular Research, University College Dublin, Belfield, Dublin 4, Ireland
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35
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Arruda TM, Kumar A, Jesse S, Veith GM, Tselev A, Baddorf AP, Balke N, Kalinin SV. Toward quantitative electrochemical measurements on the nanoscale by scanning probe microscopy: environmental and current spreading effects. ACS Nano 2013; 7:8175-8182. [PMID: 23968334 DOI: 10.1021/nn4034772] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/02/2023]
Abstract
The application of electric bias across tip-surface junctions in scanning probe microscopy can readily induce surface and bulk electrochemical processes that can be further detected though changes in surface topography, Faradaic or conductive currents, or electromechanical strain responses. However, the basic factors controlling tip-induced electrochemical processes, including the relationship between applied tip bias and the thermodynamics of local processes, remains largely unexplored. Using the model Li-ion reduction reaction on the surface in Li-ion conducting glass ceramic, we explore the factors controlling Li-metal formation and find surprisingly strong effects of atmosphere and back electrode composition on the process. We find that reaction processes are highly dependent on the nature of the counter electrode and environmental conditions. Using a nondepleting Li counter electrode, Li particles could grow significantly larger and faster than a depleting counter electrode. Significant Li ion depletion leads to the inability for further Li reduction. Time studies suggest that Li diffusion replenishes the vacant sites after ∼12 h. These studies suggest the feasibility of SPM-based quantitative electrochemical studies under proper environmental controls, extending the concepts of ultramicroelectrodes to the single-digit nanometer scale.
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Affiliation(s)
- Thomas M Arruda
- The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37831, United States
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36
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Tselev A, Ganesh P, Qiao L, Siemons W, Gai Z, Biegalski MD, Baddorf AP, Kalinin SV. Oxygen control of atomic structure and physical properties of SrRuO3 surfaces. ACS Nano 2013; 7:4403-4413. [PMID: 23570268 DOI: 10.1021/nn400923n] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/02/2023]
Abstract
Complex oxide thin films and heterostructures have become one of the foci for condensed matter physics research due to a broad variety of properties they exhibit. Similar to the bulk, properties of oxide surfaces can be expected to be strongly affected by oxygen stoichiometry. Here we explore the coupling between atomic structure and physical properties of SrRuO3 (SRO), one of the most well-studied oxide materials. We perform a detailed in situ and ex situ experimental investigation of the surfaces of SRO thin films using a combination of scanning tunneling microscopy (STM), X-ray and ultraviolet photoelectron spectroscopy, SQUID magnetometry, and magnetotransport measurements, as well as ab initio modeling. A number of remarkable linear surface reconstructions were observed by STM and interpreted as oxygen adatoms, favorably adsorbed in a regular rectangular or zigzag patterns. The degree of oxygen coverage and different surface patterns change the work function of the thin films, and modify local electronic and magnetic properties of the topmost atomic layer. The ab initio modeling reveals that oxygen adatoms possess frustrated local spin moments with possible spin-glass behavior of the surface covered by adsorbed oxygen. Additionally, the modeling indicates presence of a pseudo gap on the topmost SrO layer on pristine SrO-terminated surface, suggesting possibility for realization of a surface half-metallic film.
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Affiliation(s)
- Alexander Tselev
- Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States.
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37
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Kumar A, Leonard D, Jesse S, Ciucci F, Eliseev EA, Morozovska AN, Biegalski MD, Christen HM, Tselev A, Mutoro E, Crumlin EJ, Morgan D, Shao-Horn Y, Borisevich A, Kalinin SV. Spatially resolved mapping of oxygen reduction/evolution reaction on solid-oxide fuel cell cathodes with sub-10 nm resolution. ACS Nano 2013; 7:3808-3814. [PMID: 23565822 DOI: 10.1021/nn303239e] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/02/2023]
Abstract
Spatial localization of the oxygen reduction/evolution reactions on lanthanum strontium cobaltite (LSCO) surfaces with perovskite and layered perovskite structures is studied at the sub-10 nm level. Comparison between electrochemical strain microscopy (ESM) and structural imaging by scanning transmission electron microscopy (STEM) suggests that small-angle grain boundaries act as regions with enhanced electrochemical activity. The ESM activity is compared across a family of LSCO samples, demonstrating excellent agreement with macroscopic behaviors. This study potentially paves the way for deciphering the mechanisms of electrochemical activity of solids on the level of single extended structural defects such as grain boundaries and dislocations.
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Affiliation(s)
- Amit Kumar
- Oak Ridge National Laboratory, 1 Bethel Valley Road, Oak Ridge, Tennessee 37831, United States.
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38
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Kim YM, Kumar A, Hatt A, Morozovska AN, Tselev A, Biegalski MD, Ivanov I, Eliseev EA, Pennycook SJ, Rondinelli JM, Kalinin SV, Borisevich AY. Interplay of octahedral tilts and polar order in BiFeO3 films. Adv Mater 2013; 25:2497-2504. [PMID: 23505214 DOI: 10.1002/adma.201204584] [Citation(s) in RCA: 19] [Impact Index Per Article: 1.7] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Received: 11/05/2012] [Revised: 01/04/2013] [Indexed: 06/01/2023]
Abstract
Heterointerface stabilization of a distinct nonpolar BiFeO3 phase occurs simultaneously with changes in octahedral tilts. The resulting phase arises via suppression of polarization by a structural order parameter and can thus be identified as anti-ferroelectric (Fe displacements - bottom panel). The phase is metastable and can be switched into a polar ferroelectric state (top panel) under an applied electric bias.
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Affiliation(s)
- Young-Min Kim
- Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
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39
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Strelcov E, Tselev A, Ivanov I, Budai JD, Zhang J, Tischler JZ, Kravchenko I, Kalinin SV, Kolmakov A. Doping-based stabilization of the M2 phase in free-standing VO₂ nanostructures at room temperature. Nano Lett 2012; 12:6198-6205. [PMID: 23145774 DOI: 10.1021/nl303065h] [Citation(s) in RCA: 48] [Impact Index Per Article: 4.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/01/2023]
Abstract
A new high-yield method of doping VO(2) nanostructures with aluminum is proposed, which renders possible stabilization of the monoclinic M2 phase in free-standing nanoplatelets in ambient conditions and opens an opportunity for realization of a purely electronic Mott transition field-effect transistor without an accompanying structural transition. The synthesized free-standing M2-phase nanostructures are shown to have very high crystallinity and an extremely sharp temperature-driven metal-insulator transition. A combination of X-ray microdiffraction, micro-Raman spectroscopy, energy-dispersive X-ray spectroscopy, and four-probe electrical measurements allowed thorough characterization of the doped nanostructures. Light is shed onto some aspects of the nanostructure growth, and the temperature-doping level phase diagram is established.
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Affiliation(s)
- Evgheni Strelcov
- The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States.
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40
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Balke N, Tselev A, Arruda TM, Jesse S, Chu YH, Kalinin SV. Probing local electromechanical effects in highly conductive electrolytes. ACS Nano 2012; 6:10139-10146. [PMID: 23106854 DOI: 10.1021/nn3038868] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/01/2023]
Abstract
The functionality of a variety of materials and devices is strongly coupled with electromechanical effects which can be used to characterize their functionality. Of high interest is the investigation of these electromechanical effects on the nanoscale which can be achieved by using scanning probe microscopy. Here, an electrical bias is applied locally to the scanning probe tip, and the mechanical sample response is detected. In some applications with electromechanical phenomena, such as energy storage or for biological samples, a liquid environment is required to provide full functionality and sample stability. However, electromechanical sample characterization has mostly been applied in air or under vacuum due to the difficulties of applying local electric fields in a conductive environment. Here, we present a detailed study of piezoresponse force microscopy of ferroelectric samples in liquid environments as a model system for electromechanical effects in general. The ionic strength of the liquid is varied, and possibilities and limitations of the technique are explored. Numerical simulations are used to explain the observed phenomena and used to suggest strategies to work in liquid environments with high ionic strength.
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Affiliation(s)
- Nina Balke
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States.
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41
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Tselev A, Lavrik NV, Vlassiouk I, Briggs DP, Rutgers M, Proksch R, Kalinin SV. Near-field microwave scanning probe imaging of conductivity inhomogeneities in CVD graphene. Nanotechnology 2012; 23:385706. [PMID: 22948033 DOI: 10.1088/0957-4484/23/38/385706] [Citation(s) in RCA: 13] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/01/2023]
Abstract
We have performed near-field scanning microwave microscopy (SMM) of graphene grown by chemical vapor deposition. Due to the use of probe-sample capacitive coupling and a relatively high ac frequency of a few GHz, this scanning probe method allows mapping of local conductivity without a dedicated counter electrode, with a spatial resolution of about 50 nm. Here, the coupling was enabled by atomic layer deposition of alumina on top of graphene, which in turn enabled imaging both large-area films, as well as micron-sized islands, with a dynamic range covering a low sheet resistance of a metal film and a high resistance of highly disordered graphene. The structures of graphene grown on Ni films and Cu foils are explored, and the effects of growth conditions are elucidated. We present a simple general scheme for interpretation of the contrast in the SMM images of our graphene samples and other two-dimensional conductors, which is supported by extensive numerical finite-element modeling. We further demonstrate that combination of the SMM and numerical modeling allows quantitative information about the sheet resistance of graphene to be obtained, paving the pathway for characterization of graphene conductivity with a sub-100 nm special resolution.
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Affiliation(s)
- Alexander Tselev
- The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.
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42
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Bernal A, Tselev A, Kalinin S, Bassiri-Gharb N. Free-standing ferroelectric nanotubes processed via soft-template infiltration. Adv Mater 2012; 24:1160-1165. [PMID: 22279013 DOI: 10.1002/adma.201103993] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/17/2011] [Revised: 12/20/2011] [Indexed: 05/31/2023]
Abstract
A new nano-manufacturing method for the creation of high aspect-ratio ferroelectric (PbZr0.52Ti0.48O3) nanostructures by use of polymeric templates is presented. The ferroelectric response is characterized by band-excitation PFM, supporting the high quality of the nanostructures. Piezoelectric size effects for ferroelectric materials are reported for the first time in nanotube configuration (critical thickness ∼15 nm) and compared to thin films' response.
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Affiliation(s)
- Ashley Bernal
- GW Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332, USA
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43
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Jesse S, Balke N, Eliseev E, Tselev A, Dudney NJ, Morozovska AN, Kalinin SV. Direct mapping of ionic transport in a Si anode on the nanoscale: time domain electrochemical strain spectroscopy study. ACS Nano 2011; 5:9682-9695. [PMID: 22054414 DOI: 10.1021/nn203141g] [Citation(s) in RCA: 13] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/31/2023]
Abstract
Local Li-ion transport in amorphous silicon is studied on the nanometer scale using time domain electrochemical strain microscopy (ESM). A strong variability of ionic transport controlled by the anode surface morphology is observed. The observed relaxing and nonrelaxing response components are discussed in terms of local and global ionic transport mechanisms, thus establishing the signal formation mechanisms in ESM. This behavior is further correlated with local conductivity measurements. The implications of these studies for Si-anode batteries are discussed. The universal presence of concentration-strain coupling suggests that ESM and associated time and voltage spectroscopies can be applied to a broad range of electrochemical systems ranging from batteries to fuel cells.
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Affiliation(s)
- Stephen Jesse
- Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
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44
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Kim Y, Kumar A, Tselev A, Kravchenko II, Han H, Vrejoiu I, Lee W, Hesse D, Alexe M, Kalinin SV, Jesse S. Nonlinear phenomena in multiferroic nanocapacitors: joule heating and electromechanical effects. ACS Nano 2011; 5:9104-9112. [PMID: 21955139 DOI: 10.1021/nn203342v] [Citation(s) in RCA: 13] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/31/2023]
Abstract
We demonstrate an approach for probing nonlinear electromechanical responses in BiFeO(3) thin film nanocapacitors using half-harmonic band excitation piezoresponse force microscopy (PFM). Nonlinear PFM images of nanocapacitor arrays show clearly visible clusters of capacitors associated with variations of local leakage current through the BiFeO(3) film. Strain spectroscopy measurements and finite element modeling point to significance of the Joule heating and show that the thermal effects caused by the Joule heating can provide nontrivial contributions to the nonlinear electromechanical responses in ferroic nanostructures. This approach can be further extended to unambiguous mapping of electrostatic signal contributions to PFM and related techniques.
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Affiliation(s)
- Yunseok Kim
- The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA.
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45
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Tselev A, Budai JD, Strelcov E, Tischler JZ, Kolmakov A, Kalinin SV. Electromechanical actuation and current-induced metastable states in suspended single-crystalline VO₂ nanoplatelets. Nano Lett 2011; 11:3065-3073. [PMID: 21714518 DOI: 10.1021/nl200493k] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/31/2023]
Abstract
Current-induced electromechanical actuation enabled by the metal-insulator transition in VO(2) nanoplatelets is demonstrated. The Joule heating by a sufficient current flowing through suspended nanoplatelets results in formation of heterophase domain patterns and is accompanied by nanoplatelet deformation. The actuation action can be achieved in a wide temperature range below the bulk phase transition temperature (68 °C). The observed current-sustained heterophase domain structures should be interpreted as distinct metastable states in free-standing and end-clamped VO(2) samples. We analyze the main prerequisites for the realization of a current-controlled actuator based on the proposed concept.
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Affiliation(s)
- Alexander Tselev
- Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States.
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46
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Kalinin SV, Jesse S, Tselev A, Baddorf AP, Balke N. The role of electrochemical phenomena in scanning probe microscopy of ferroelectric thin films. ACS Nano 2011; 5:5683-91. [PMID: 21682317 DOI: 10.1021/nn2013518] [Citation(s) in RCA: 18] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/13/2023]
Abstract
Applications of piezoresponse force microscopy and conductive atomic force microscopy to ferroelectric thin films necessitate understanding of the possible bias-induced electrochemical reactivity of oxide surfaces. These range from reversible ionic surface charging (possibly coupled to polarization) and vacancy and proton injection to partially reversible vacancy ordering, to irreversible electrochemical degradation of the film and bottom electrode. Here, the electrochemical phenomena induced by a biased tip are analyzed and both theoretical and experimental criteria for their identification are summarized.
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47
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Tselev A, Luk'yanchuk IA, Ivanov IN, Budai JD, Tischler JZ, Strelcov E, Kolmakov A, Kalinin SV. Symmetry relationship and strain-induced transitions between insulating M1 and M2 and metallic R phases of vanadium dioxide. Nano Lett 2010; 10:4409-4416. [PMID: 20939599 DOI: 10.1021/nl1020443] [Citation(s) in RCA: 18] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/30/2023]
Abstract
The ability to synthesize VO2 in the form of single-crystalline nanobeams and nano- and microcrystals uncovered a number of previously unknown aspects of the metal-insulator transition (MIT) in this oxide. In particular, several reports demonstrated that the MIT can proceed through competition between two monoclinic (insulating) phases M1 and M2 and the tetragonal (metallic) R phase under influence of strain. The nature of such phase behavior has been not identified. Here we show that the competition between M1 and M2 phases is purely lattice-symmetry-driven. Within the framework of the Ginzburg-Landau formalism, both M phases correspond to different directions of the same four-component structural order parameter, and as a consequence, the M2 phase can appear under a small perturbation of the M1 structure such as doping or stress. We analyze the strain-controlled phase diagram of VO2 in the vicinity of the R-M2-M1 triple point using the Ginzburg-Landau formalism and identify and experimentally verify the pathways for strain-control of the transition. These insights open the door toward more systematic approaches to synthesis of VO2 nanostructures in desired phase states and to use of external fields in the control of the VO2 phase states. Additionally, we report observation of the triclinic T phase at the heterophase domain boundaries in strained quasi-two-dimensional VO2 nanoplatelets, and theoretically predict phases that have not been previously observed.
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Affiliation(s)
- A Tselev
- Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States.
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48
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Balke N, Jesse S, Kim Y, Adamczyk L, Tselev A, Ivanov IN, Dudney NJ, Kalinin SV. Real space mapping of Li-ion transport in amorphous Si anodes with nanometer resolution. Nano Lett 2010; 10:3420-3425. [PMID: 20672826 DOI: 10.1021/nl101439x] [Citation(s) in RCA: 52] [Impact Index Per Article: 3.7] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/29/2023]
Abstract
The electrical bias driven Li-ion motion in silicon anode materials in thin film battery heterostructures is investigated using electrochemical strain microscopy (ESM), which is a newly developed scanning probe microscopy based characterization method. ESM utilizes the intrinsic link between bias-controlled Li-ion concentration and molar volume of electrode materials, providing the capability for studies on the sub-20 nm scale, and allows the relationship between Li-ion flow and microstructure to be established. The evolution of Li-ion transport during the battery charging is directly observed.
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Affiliation(s)
- Nina Balke
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA.
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49
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Tselev A, Meunier V, Strelcov E, Shelton WA, Luk'yanchuk IA, Jones K, Proksch R, Kolmakov A, Kalinin SV. Mesoscopic metal-insulator transition at ferroelastic domain walls in VO2. ACS Nano 2010; 4:4412-4419. [PMID: 20731427 DOI: 10.1021/nn1004364] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/29/2023]
Abstract
The novel phenomena induced by symmetry breaking at homointerfaces between ferroic variants in ferroelectric and ferroelastic materials have attracted recently much attention. Using variable temperature scanning microwave microscopy, we demonstrate the mesoscopic strain-induced metal-insulator phase transitions in the vicinity of ferroelastic domain walls in the semiconductive VO(2) that nucleated at temperatures as much as 10-12 degrees C below bulk transition, resulting in the formation of conductive channels in the material. Density functional theory is used to rationalize the process low activation energy. This behavior, linked to the strain inhomogeneity inherent in ferroelastic materials, can strongly affect interpretation of phase-transition studies in VO(2) and similar materials with symmetry-lowering transitions, and can also be used to enable new generations of electronic devices though strain engineering of conductive and semiconductive regions.
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50
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Tselev A, Strelcov E, Luk'yanchuk IA, Budai JD, Tischler JZ, Ivanov IN, Jones K, Proksch R, Kalinin SV, Kolmakov A. Interplay between ferroelastic and metal-insulator phase transitions in strained quasi-two-dimensional VO2 nanoplatelets. Nano Lett 2010; 10:2003-2011. [PMID: 20455527 DOI: 10.1021/nl1008794] [Citation(s) in RCA: 45] [Impact Index Per Article: 3.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/29/2023]
Abstract
Formation of ferroelastic twin domains in vanadium dioxide (VO(2)) nanosystems can strongly affect local strain distributions, and hence couple to the strain-controlled metal-insulator transition. Here we report polarized-light optical and scanning microwave microscopy studies of interrelated ferroelastic and metal-insulator transitions in single-crystalline VO(2) quasi-two-dimensional (quasi-2D) nanoplatelets (NPls). In contrast to quasi-1D single-crystalline nanobeams, the 2D geometric frustration results in emergence of several possible families of ferroelastic domains in NPls, thus allowing systematic studies of strain-controlled transitions in the presence of geometrical frustration. We demonstrate the possibility of controlling the ferroelastic domain population by the strength of the NPl-substrate interaction, mechanical stress, and by the NPl lateral size. Ferroelastic domain species and domain walls are identified based on standard group-theoretical considerations. Using variable temperature microscopy, we imaged the development of domains of metallic and semiconducting phases during the metal-insulator phase transition and nontrivial strain-driven reentrant domain formation. A long-range reconstruction of ferroelastic structures accommodating metal-insulator domain formation has been observed. These studies illustrate that a complete picture of the phase transitions in single-crystalline and disordered VO(2) structures can be drawn only if both ferroelastic and metal-insulator strain effects are taken into consideration and understood.
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Affiliation(s)
- Alexander Tselev
- The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA.
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