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Delord T, Monge R, Meriles CA. Correlated Spectroscopy of Electric Noise with Color Center Clusters. NANO LETTERS 2024; 24:6474-6479. [PMID: 38767585 PMCID: PMC11157654 DOI: 10.1021/acs.nanolett.4c00222] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/15/2024] [Revised: 05/11/2024] [Accepted: 05/13/2024] [Indexed: 05/22/2024]
Abstract
Experimental noise often contains information about the interactions of a system with its environment, but establishing a relation between the measured time fluctuations and the underlying physical observables is rarely apparent. Here, we leverage a multidimensional and multisensor analysis of spectral diffusion to investigate the dynamics of trapped carriers near subdiffraction clusters of nitrogen-vacancy (NV) centers in diamond. We establish statistical correlations in the spectral fluctuations we measure as we recursively probe the cluster optical resonances, which we then exploit to reveal proximal traps. Further, we deterministically induce Stark shifts in the cluster spectrum, ultimately allowing us to pinpoint the relative three-dimensional positions of interacting NVs as well as the location and charge sign of surrounding traps. Our results can be generalized to other color centers and provide opportunities for the characterization of photocarrier dynamics in semiconductors and the manipulation of nanoscale spin-qubit clusters connected via electric fields.
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Affiliation(s)
- Tom Delord
- Department
of Physics, CUNY-City College of New York, New York, New York 10031, United States
| | - Richard Monge
- Department
of Physics, CUNY-City College of New York, New York, New York 10031, United States
| | - Carlos A. Meriles
- Department
of Physics, CUNY-City College of New York, New York, New York 10031, United States
- CUNY-Graduate
Center, New York, New York 10016, United States
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2
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Sullivan RP, Morningstar JT, Castellanos-Trejo E, Welker ME, Jurchescu OD. The Stark Effect: A Tool for the Design of High-Performance Molecular Rectifiers. NANO LETTERS 2023. [PMID: 37974048 DOI: 10.1021/acs.nanolett.3c03068] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/19/2023]
Abstract
Molecular electronic devices offer a path to the miniaturization of electronic circuits and could potentially facilitate novel functionalities that can be embedded into the molecular structure. Given their nanoscale dimensions, device properties are strongly influenced by quantum effects, yet many of these phenomena have been largely overlooked. We investigated the mechanism responsible for current rectification in molecular diodes and found that efficient rectification is achieved by enhancing the Stark effect strength and enabling a large number of molecules to participate in transport. These findings provided insights into the operation of molecular rectifiers and guided the development of high-performance devices via the design of molecules containing polarizable aromatic rings. Our results are consistent for different molecular structures and are expected to have broad applicability to all molecular devices by answering key questions related to charge transport mechanisms in such systems.
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Affiliation(s)
- Ryan P Sullivan
- Department of Physics and Center for Functional Materials, Wake Forest University, Winston-Salem, North Carolina 27109, United States
| | - John T Morningstar
- Department of Chemistry and Center for Functional Materials, Wake Forest University, Winston-Salem, North Carolina 27109, United States
| | - Eduardo Castellanos-Trejo
- Department of Physics and Center for Functional Materials, Wake Forest University, Winston-Salem, North Carolina 27109, United States
| | - Mark E Welker
- Department of Chemistry and Center for Functional Materials, Wake Forest University, Winston-Salem, North Carolina 27109, United States
| | - Oana D Jurchescu
- Department of Physics and Center for Functional Materials, Wake Forest University, Winston-Salem, North Carolina 27109, United States
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3
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Conradt F, Bezold V, Wiechert V, Huber S, Mecking S, Leitenstorfer A, Tenne R. Electric-Field Fluctuations as the Cause of Spectral Instabilities in Colloidal Quantum Dots. NANO LETTERS 2023; 23:9753-9759. [PMID: 37871158 PMCID: PMC10636921 DOI: 10.1021/acs.nanolett.3c02318] [Citation(s) in RCA: 1] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/22/2023] [Revised: 10/15/2023] [Accepted: 10/17/2023] [Indexed: 10/25/2023]
Abstract
Spectral diffusion (SD) represents a substantial obstacle toward implementation of solid-state quantum emitters as a source of indistinguishable photons. By performing high-resolution emission spectroscopy for individual colloidal quantum dots at cryogenic temperatures, we prove the causal link between the quantum-confined Stark effect and SD. Statistically analyzing the wavelength of emitted photons, we show that increasing the sensitivity of the transition energy to an applied electric field results in amplified spectral fluctuations. This relation is quantitatively fit to a straightforward model, indicating the presence of a stochastic electric field on a microscopic scale, whose standard deviation is 9 kV/cm, on average. The current method will enable the study of SD in multiple types of quantum emitters such as solid-state defects or organic lead halide perovskite quantum dots, for which spectral instability is a critical barrier for applications in quantum sensing.
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Affiliation(s)
- Frieder Conradt
- Department
of Physics and Center for Applied Photonics, University of Konstanz, D-78457 Konstanz, Germany
| | - Vincent Bezold
- Department
of Physics and Center for Applied Photonics, University of Konstanz, D-78457 Konstanz, Germany
| | - Volker Wiechert
- Department
of Physics and Center for Applied Photonics, University of Konstanz, D-78457 Konstanz, Germany
| | - Steffen Huber
- Chair
of Chemical Materials Science, Department of Chemistry, University of Konstanz, D-78457 Konstanz, Germany
| | - Stefan Mecking
- Chair
of Chemical Materials Science, Department of Chemistry, University of Konstanz, D-78457 Konstanz, Germany
| | - Alfred Leitenstorfer
- Department
of Physics and Center for Applied Photonics, University of Konstanz, D-78457 Konstanz, Germany
| | - Ron Tenne
- Department
of Physics and Center for Applied Photonics, University of Konstanz, D-78457 Konstanz, Germany
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4
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Geng Y, Luo J, van Deurzen L, Xing HG, Jena D, Fuchs GD, Rana F. Dephasing by optical phonons in GaN defect single-photon emitters. Sci Rep 2023; 13:8678. [PMID: 37248283 DOI: 10.1038/s41598-023-35003-z] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/25/2023] [Accepted: 05/11/2023] [Indexed: 05/31/2023] Open
Abstract
Single-photon defect emitters (SPEs), especially those with magnetically and optically addressable spin states, in technologically mature wide bandgap semiconductors are attractive for realizing integrated platforms for quantum applications. Broadening of the zero phonon line (ZPL) caused by dephasing in solid state SPEs limits the indistinguishability of the emitted photons. Dephasing also limits the use of defect states in quantum information processing, sensing, and metrology. In most defect emitters, such as those in SiC and diamond, interaction with low-energy acoustic phonons determines the temperature dependence of the dephasing rate and the resulting broadening of the ZPL with the temperature obeys a power law. GaN hosts bright and stable single-photon emitters in the 600-700 nm wavelength range with strong ZPLs even at room temperature. In this work, we study the temperature dependence of the ZPL spectra of GaN SPEs integrated with solid immersion lenses with the goal of understanding the relevant dephasing mechanisms. At temperatures below ~ 50 K, the ZPL lineshape is found to be Gaussian and the ZPL linewidth is temperature independent and dominated by spectral diffusion. Above ~ 50 K, the linewidth increases monotonically with the temperature and the lineshape evolves into a Lorentzian. Quite remarkably, the temperature dependence of the linewidth does not follow a power law. We propose a model in which dephasing caused by absorption/emission of optical phonons in an elastic Raman process determines the temperature dependence of the lineshape and the linewidth. Our model explains the temperature dependence of the ZPL linewidth and lineshape in the entire 10-270 K temperature range explored in this work. The ~ 19 meV optical phonon energy extracted by fitting the model to the data matches remarkably well the ~ 18 meV zone center energy of the lowest optical phonon band ([Formula: see text]) in GaN. Our work sheds light on the mechanisms responsible for linewidth broadening in GaN SPEs. Since a low energy optical phonon band ([Formula: see text]) is a feature of most group III-V nitrides with a wurtzite crystal structure, including hBN and AlN, we expect our proposed mechanism to play an important role in defect emitters in these materials as well.
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Affiliation(s)
- Yifei Geng
- School of Electrical and Computer Engineering, Cornell University, Ithaca, NY, 14853, USA.
| | - Jialun Luo
- Department of Physics, Cornell University, Ithaca, NY, 14853, USA
| | - Len van Deurzen
- School of Applied and Engineering Physics, Cornell University, Ithaca, NY, 14853, USA
| | - Huili Grace Xing
- School of Electrical and Computer Engineering, Cornell University, Ithaca, NY, 14853, USA
- Department of Materials Science and Engineering, Cornell University, Ithaca, NY, 14853, USA
| | - Debdeep Jena
- School of Electrical and Computer Engineering, Cornell University, Ithaca, NY, 14853, USA
- Department of Materials Science and Engineering, Cornell University, Ithaca, NY, 14853, USA
| | - Gregory David Fuchs
- School of Applied and Engineering Physics, Cornell University, Ithaca, NY, 14853, USA
| | - Farhan Rana
- School of Electrical and Computer Engineering, Cornell University, Ithaca, NY, 14853, USA
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5
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Wang H, Trusheim ME, Kim L, Raniwala H, Englund DR. Field programmable spin arrays for scalable quantum repeaters. Nat Commun 2023; 14:704. [PMID: 36759601 PMCID: PMC9911411 DOI: 10.1038/s41467-023-36098-8] [Citation(s) in RCA: 1] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/05/2022] [Accepted: 01/16/2023] [Indexed: 02/11/2023] Open
Abstract
The large scale control over thousands of quantum emitters desired by quantum network technology is limited by the power consumption and cross-talk inherent in current microwave techniques. Here we propose a quantum repeater architecture based on densely-packed diamond color centers (CCs) in a programmable electrode array, with quantum gates driven by electric or strain fields. This 'field programmable spin array' (FPSA) enables high-speed spin control of individual CCs with low cross-talk and power dissipation. Integrated in a slow-light waveguide for efficient optical coupling, the FPSA serves as a quantum interface for optically-mediated entanglement. We evaluate the performance of the FPSA architecture in comparison to a routing-tree design and show an increased entanglement generation rate scaling into the thousand-qubit regime. Our results enable high fidelity control of dense quantum emitter arrays for scalable networking.
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Affiliation(s)
- Hanfeng Wang
- Research Laboratory of Electronics, M.I.T., 50 Vassar Street, Cambridge, MA, 02139, USA
- Department of Electrical Engineering and Computer Science, M.I.T., Cambridge, MA, 02139, USA
| | - Matthew E Trusheim
- Research Laboratory of Electronics, M.I.T., 50 Vassar Street, Cambridge, MA, 02139, USA.
- DEVCOM, Army Research Laboratory, Adelphi, MD, 20783, USA.
| | - Laura Kim
- Research Laboratory of Electronics, M.I.T., 50 Vassar Street, Cambridge, MA, 02139, USA
- Department of Materials Science and Engineering, University of California, Los Angeles, Los Angeles, CA, 90095, USA
| | - Hamza Raniwala
- Research Laboratory of Electronics, M.I.T., 50 Vassar Street, Cambridge, MA, 02139, USA
- Department of Electrical Engineering and Computer Science, M.I.T., Cambridge, MA, 02139, USA
| | - Dirk R Englund
- Research Laboratory of Electronics, M.I.T., 50 Vassar Street, Cambridge, MA, 02139, USA.
- Department of Electrical Engineering and Computer Science, M.I.T., Cambridge, MA, 02139, USA.
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6
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Arjona Martínez J, Parker RA, Chen KC, Purser CM, Li L, Michaels CP, Stramma AM, Debroux R, Harris IB, Hayhurst Appel M, Nichols EC, Trusheim ME, Gangloff DA, Englund D, Atatüre M. Photonic Indistinguishability of the Tin-Vacancy Center in Nanostructured Diamond. PHYSICAL REVIEW LETTERS 2022; 129:173603. [PMID: 36332262 DOI: 10.1103/physrevlett.129.173603] [Citation(s) in RCA: 2] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/30/2022] [Accepted: 09/28/2022] [Indexed: 06/16/2023]
Abstract
Tin-vacancy centers in diamond are promising spin-photon interfaces owing to their high quantum efficiency, large Debye-Waller factor, and compatibility with photonic nanostructuring. Benchmarking their single-photon indistinguishability is a key challenge for future applications. Here, we report the generation of single photons with 99.7_{-2.5}^{+0.3}% purity and 63(9)% indistinguishability from a resonantly excited tin-vacancy center in a single-mode waveguide. We obtain quantum control of the optical transition with 1.71(1)-ns-long π pulses of 77.1(8)% fidelity and show it is spectrally stable over 100 ms. A modest Purcell enhancement factor of 12 would enhance the indistinguishability to 95%.
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Affiliation(s)
- Jesús Arjona Martínez
- Cavendish Laboratory, University of Cambridge, JJ Thomson Avenue, Cambridge CB3 0HE, United Kingdom
| | - Ryan A Parker
- Cavendish Laboratory, University of Cambridge, JJ Thomson Avenue, Cambridge CB3 0HE, United Kingdom
| | - Kevin C Chen
- Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA
| | - Carola M Purser
- Cavendish Laboratory, University of Cambridge, JJ Thomson Avenue, Cambridge CB3 0HE, United Kingdom
| | - Linsen Li
- Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA
| | - Cathryn P Michaels
- Cavendish Laboratory, University of Cambridge, JJ Thomson Avenue, Cambridge CB3 0HE, United Kingdom
| | - Alexander M Stramma
- Cavendish Laboratory, University of Cambridge, JJ Thomson Avenue, Cambridge CB3 0HE, United Kingdom
| | - Romain Debroux
- Cavendish Laboratory, University of Cambridge, JJ Thomson Avenue, Cambridge CB3 0HE, United Kingdom
| | - Isaac B Harris
- Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA
| | - Martin Hayhurst Appel
- Cavendish Laboratory, University of Cambridge, JJ Thomson Avenue, Cambridge CB3 0HE, United Kingdom
| | - Eleanor C Nichols
- Cavendish Laboratory, University of Cambridge, JJ Thomson Avenue, Cambridge CB3 0HE, United Kingdom
| | - Matthew E Trusheim
- Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA
| | - Dorian A Gangloff
- Cavendish Laboratory, University of Cambridge, JJ Thomson Avenue, Cambridge CB3 0HE, United Kingdom
- Department of Engineering Science, University of Oxford, Parks Road, Oxford OX1 3PJ, United Kingdom
| | - Dirk Englund
- Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA
| | - Mete Atatüre
- Cavendish Laboratory, University of Cambridge, JJ Thomson Avenue, Cambridge CB3 0HE, United Kingdom
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7
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Titze M, Byeon H, Flores A, Henshaw J, Harris CT, Mounce AM, Bielejec ES. In Situ Ion Counting for Improved Implanted Ion Error Rate and Silicon Vacancy Yield Uncertainty. NANO LETTERS 2022; 22:3212-3218. [PMID: 35426685 DOI: 10.1021/acs.nanolett.1c04646] [Citation(s) in RCA: 4] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/14/2023]
Abstract
An in situ counted ion implantation experiment improving the error on the number of ions required to form a single optically active silicon vacancy (SiV) defect in diamond 7-fold compared to timed implantation is presented. Traditional timed implantation relies on a beam current measurement followed by implantation with a preset pulse duration. It is dominated by Poisson statistics, resulting in large errors for low ion numbers. Instead, our in situ detection, measuring the ion number arriving at the substrate, results in a 2-fold improvement of the error on the ion number required to generate a single SiV compared to timed implantation. Through postimplantation analysis, the error is improved 7-fold compared to timed implantation. SiVs are detected by photoluminescence spectroscopy, and the yield of 2.98% is calculated through the photoluminescence count rate. Hanbury-Brown-Twiss interferometry is performed on locations potentially hosting single-photon emitters, confirming that 82% of the locations exhibit single photon emission statistics.
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Affiliation(s)
- Michael Titze
- Sandia National Laboratories, Albuquerque, New Mexico 87123, United States
| | - Heejun Byeon
- Center for Integrated Nanotechnologies, Sandia National Laboratories, Albuquerque, New Mexico 87123, United States
| | - Anthony Flores
- Sandia National Laboratories, Albuquerque, New Mexico 87123, United States
| | - Jacob Henshaw
- Center for Integrated Nanotechnologies, Sandia National Laboratories, Albuquerque, New Mexico 87123, United States
| | - C Thomas Harris
- Center for Integrated Nanotechnologies, Sandia National Laboratories, Albuquerque, New Mexico 87123, United States
| | - Andrew M Mounce
- Center for Integrated Nanotechnologies, Sandia National Laboratories, Albuquerque, New Mexico 87123, United States
| | - Edward S Bielejec
- Sandia National Laboratories, Albuquerque, New Mexico 87123, United States
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