1
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Zhou Z, Lin M, Zhou X, Zhang C. Implementation of memristive emotion associative learning circuit. Cogn Neurodyn 2025; 19:13. [PMID: 39801920 PMCID: PMC11717764 DOI: 10.1007/s11571-024-10211-z] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/26/2024] [Revised: 07/10/2024] [Accepted: 09/23/2024] [Indexed: 01/16/2025] Open
Abstract
Psychological studies have demonstrated that the music can affect memory by triggering different emotions. Building on the relationships among music, emotion, and memory, a memristor-based emotion associative learning circuit is designed by utilizing the nonlinear and non-volatile characteristics of memristors, which includes a music judgment module, three emotion generation modules, three emotional homeostasis modules, and a memory module to implement functions such as learning, second learning, forgetting, emotion generation, and emotional homeostasis. The experimental results indicate that the proposed circuit can simulate the learning and forgetting processes of human under different music circumstances, demonstrate the feasibility of memristors in biomimetic circuits, verify the impact of music on memory, and provide a foundation for in-depth research and application development of the interaction mechanism between emotion and memory.
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Affiliation(s)
- Zhangzhi Zhou
- School of Electronics and Information, Hangzhou Dianzi University, Hangzhou, 310018 China
| | - Mi Lin
- School of Electronics and Information, Hangzhou Dianzi University, Hangzhou, 310018 China
| | - Xuanxuan Zhou
- School of Electronics and Information, Hangzhou Dianzi University, Hangzhou, 310018 China
| | - Chong Zhang
- School of Electronics and Information, Hangzhou Dianzi University, Hangzhou, 310018 China
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2
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Fritscher M, Singh S, Rizzi T, Baroni A, Reiser D, Mallah M, Hartmann D, Bende A, Kempen T, Uhlmann M, Kahmen G, Fey D, Rana V, Menzel S, Reichenbach M, Krstic M, Merchant F, Wenger C. A flexible and fast digital twin for RRAM systems applied for training resilient neural networks. Sci Rep 2024; 14:23695. [PMID: 39390001 PMCID: PMC11467404 DOI: 10.1038/s41598-024-73439-z] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/09/2024] [Accepted: 09/16/2024] [Indexed: 10/12/2024] Open
Abstract
Resistive Random Access Memory (RRAM) has gained considerable momentum due to its non-volatility and energy efficiency. Material and device scientists have been proposing novel material stacks that can mimic the "ideal memristor" which can deliver performance, energy efficiency, reliability and accuracy. However, designing RRAM-based systems is challenging. Engineering a new material stack, designing a device, and experimenting takes significant time for material and device researchers. Furthermore, the acceptability of the device is ultimately decided at the system level. We see a gap here where there is a need for facilitating material and device researchers with a "push button" modeling framework that allows to evaluate the efficacy of the device at system level during early device design stages. Speed, accuracy, and adaptability are the fundamental requirements of this modelling framework. In this paper, we propose a digital twin (DT)-like modeling framework that automatically creates RRAM device models from device measurement data. Furthermore, the model incorporates the peripheral circuit to ensure accurate energy and performance evaluations. We demonstrate the DT generation and DT usage for multiple RRAM technologies and applications and illustrate the achieved performance of our GPU implementation. We conclude with the application of our modeling approach to measurement data from two distinct fabricated devices, validating its effectiveness in a neural network processing an Electrocardiogram (ECG) dataset and incorporating Fault Aware Training (FAT).
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Affiliation(s)
- Markus Fritscher
- IHP - Leibniz Institut für innovative Mikroelektronik, Frankfurt (Oder), Germany.
- BTU Cottbus-Senftenberg, Cottbus, Germany.
| | | | - Tommaso Rizzi
- IHP - Leibniz Institut für innovative Mikroelektronik, Frankfurt (Oder), Germany
| | - Andrea Baroni
- IHP - Leibniz Institut für innovative Mikroelektronik, Frankfurt (Oder), Germany
| | | | | | | | - Ankit Bende
- Forschungszentrum Jülich GmbH, Jülich, Germany
| | - Tim Kempen
- Forschungszentrum Jülich GmbH, Jülich, Germany
| | - Max Uhlmann
- IHP - Leibniz Institut für innovative Mikroelektronik, Frankfurt (Oder), Germany
| | - Gerhard Kahmen
- IHP - Leibniz Institut für innovative Mikroelektronik, Frankfurt (Oder), Germany
- BTU Cottbus-Senftenberg, Cottbus, Germany
| | | | - Vikas Rana
- Indian Institute of Technology Bombay, Mumbai, India
| | | | | | - Milos Krstic
- IHP - Leibniz Institut für innovative Mikroelektronik, Frankfurt (Oder), Germany
- University of Potsdam, Potsdam, Germany
| | - Farhad Merchant
- Newcastle University, Newcastle upon Tyne, UK
- Cognigron and Bernoulli Institute, University of Groningen, Groningen, The Netherlands
| | - Christian Wenger
- IHP - Leibniz Institut für innovative Mikroelektronik, Frankfurt (Oder), Germany
- BTU Cottbus-Senftenberg, Cottbus, Germany
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3
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Zhang Y, Shen L. Automatic Learning Rate Adaption for Memristive Deep Learning Systems. IEEE TRANSACTIONS ON NEURAL NETWORKS AND LEARNING SYSTEMS 2024; 35:10791-10802. [PMID: 37027694 DOI: 10.1109/tnnls.2023.3244006] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/19/2023]
Abstract
As a possible device to further enhance the performance of the hybrid complementary metal oxide semiconductor (CMOS) technology in the hardware, the memristor has attracted widespread attention in implementing efficient and compact deep learning (DL) systems. In this study, an automatic learning rate tuning method for memristive DL systems is presented. Memristive devices are utilized to adjust the adaptive learning rate in deep neural networks (DNNs). The speed of the learning rate adaptation process is fast at first and then becomes slow, which consist of the memristance or conductance adjustment process of the memristors. As a result, no manual tuning of learning rates is required in the adaptive back propagation (BP) algorithm. While cycle-to-cycle and device-to-device variations could be a significant issue in memristive DL systems, the proposed method appears robust to noisy gradients, various architectures, and different datasets. Moreover, fuzzy control methods for adaptive learning are presented for pattern recognition, such that the over-fitting issue can be well addressed. To our best knowledge, this is the first memristive DL system using an adaptive learning rate for image recognition. Another highlight of the presented memristive adaptive DL system is that quantized neural network architecture is utilized, and there is therefore a significant increase in the training efficiency, without the loss of testing accuracy.
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Choi S, Moon T, Wang G, Yang JJ. Filament-free memristors for computing. NANO CONVERGENCE 2023; 10:58. [PMID: 38110639 PMCID: PMC10728429 DOI: 10.1186/s40580-023-00407-0] [Citation(s) in RCA: 3] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/16/2023] [Accepted: 12/06/2023] [Indexed: 12/20/2023]
Abstract
Memristors have attracted increasing attention due to their tremendous potential to accelerate data-centric computing systems. The dynamic reconfiguration of memristive devices in response to external electrical stimuli can provide highly desirable novel functionalities for computing applications when compared with conventional complementary-metal-oxide-semiconductor (CMOS)-based devices. Those most intensively studied and extensively reviewed memristors in the literature so far have been filamentary type memristors, which typically exhibit a relatively large variability from device to device and from switching cycle to cycle. On the other hand, filament-free switching memristors have shown a better uniformity and attractive dynamical properties, which can enable a variety of new computing paradigms but have rarely been reviewed. In this article, a wide range of filament-free switching memristors and their corresponding computing applications are reviewed. Various junction structures, switching properties, and switching principles of filament-free memristors are surveyed and discussed. Furthermore, we introduce recent advances in different computing schemes and their demonstrations based on non-filamentary memristors. This Review aims to present valuable insights and guidelines regarding the key computational primitives and implementations enabled by these filament-free switching memristors.
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Affiliation(s)
- Sanghyeon Choi
- Department of Electrical and Computer Engineering, University of Southern California, Los Angeles, CA, 90089, USA
- KU-KIST Graduate School of Converging Science and Technology, Korea University, 145 Anam-ro, Seongbuk-gu, Seoul, 02841, Republic of Korea
- Department of Electrical and Computer Engineering, University of California, Santa Barbara, CA, 93106, USA
| | - Taehwan Moon
- Department of Electrical and Computer Engineering, University of Southern California, Los Angeles, CA, 90089, USA
| | - Gunuk Wang
- KU-KIST Graduate School of Converging Science and Technology, Korea University, 145 Anam-ro, Seongbuk-gu, Seoul, 02841, Republic of Korea
- Department of Integrative Energy Engineering, Korea University, 145 Anam-ro, Seongbuk-gu, Seoul, 02841, Republic of Korea
- Center for Neuromorphic Engineering, Korea Institute of Science and Technology, Seoul, 02792, Republic of Korea
| | - J Joshua Yang
- Department of Electrical and Computer Engineering, University of Southern California, Los Angeles, CA, 90089, USA.
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Kim DS, Suh HW, Cho SW, Oh SY, Lee HH, Lee KW, Choi JH, Cho HK. Intensive harmonized synapses with amorphous Cu 2O-based memristors using ultrafine Cu nanoparticle sublayers formed via atomically controlled electrochemical pulse deposition. MATERIALS HORIZONS 2023; 10:3382-3392. [PMID: 37439537 DOI: 10.1039/d3mh00508a] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 07/14/2023]
Abstract
Resistive random-access memory (RRAM) devices have significant advantages for neuromorphic computing but have fatal problems of uncontrollability and abrupt resistive switching behaviors degrading their synaptic performance. In this paper, we propose the electrochemical design of an active Cu2O layer containing a strategic sublayer of ultrafine Cu nanoparticles (U-Cu NPs) to form uniformly dispersed conducting filaments, which can effectively improve the reliability for analog switching of RRAM-based neuromorphic computing. The electrochemical pulse deposited (EPD) U-Cu NPs are linked to the bottom electrode through a semi-conductive path within the bottom Cu2O layer, since the EPD is preferentially carried out on the conductive sites. All Cu2O films with U-Cu NPs are developed in situ in the single electrolyte bath without any pause. The proposed U-Cu NPs can concentrate the external electric field and can generate conductive filament paths for analog resistive switching. The applied electric field was uniformly spread to U-Cu NPs at the center of the active layer and displays resistive switching behavior via multiple conductive filaments. This shows a strong harmony between the resistance-switching characteristics and the analog operation of the active layer. This RRAM device shows outstanding gradual analog switching, great linearity, dynamic range, endurance, precision, speed, and retention characteristics simultaneously and adequately for neuromorphic computing by realizing multiple weak filament-type operation.
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Affiliation(s)
- Dong Su Kim
- School of Advanced Materials Science and Engineering, Sungkyunkwan University, 2066, Seobu-ro, Jangan-gu, Suwon-si, Gyeonggi-do, 16419, Republic of Korea.
| | - Hee Won Suh
- School of Advanced Materials Science and Engineering, Sungkyunkwan University, 2066, Seobu-ro, Jangan-gu, Suwon-si, Gyeonggi-do, 16419, Republic of Korea.
| | - Sung Woon Cho
- Department of Advanced Components and Materials Engineering, Sunchon National University, 255, Jungang-ro, Sunchon-si, Jeollanam-do, Republic of Korea
| | - Shin Young Oh
- School of Advanced Materials Science and Engineering, Sungkyunkwan University, 2066, Seobu-ro, Jangan-gu, Suwon-si, Gyeonggi-do, 16419, Republic of Korea.
| | - Hak Hyeon Lee
- School of Advanced Materials Science and Engineering, Sungkyunkwan University, 2066, Seobu-ro, Jangan-gu, Suwon-si, Gyeonggi-do, 16419, Republic of Korea.
| | - Kun Woong Lee
- School of Advanced Materials Science and Engineering, Sungkyunkwan University, 2066, Seobu-ro, Jangan-gu, Suwon-si, Gyeonggi-do, 16419, Republic of Korea.
| | - Ji Hoon Choi
- School of Advanced Materials Science and Engineering, Sungkyunkwan University, 2066, Seobu-ro, Jangan-gu, Suwon-si, Gyeonggi-do, 16419, Republic of Korea.
| | - Hyung Koun Cho
- School of Advanced Materials Science and Engineering, Sungkyunkwan University, 2066, Seobu-ro, Jangan-gu, Suwon-si, Gyeonggi-do, 16419, Republic of Korea.
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6
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Chen PX, Panda D, Tseng TY. All oxide based flexible multi-folded invisible synapse as vision photo-receptor. Sci Rep 2023; 13:1454. [PMID: 36702838 PMCID: PMC9880003 DOI: 10.1038/s41598-023-28505-3] [Citation(s) in RCA: 4] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/22/2022] [Accepted: 01/19/2023] [Indexed: 01/27/2023] Open
Abstract
All oxide-based transparent flexible memristor is prioritized for the potential application in artificially simulated biological optoelectronic synaptic devices. SnOx memristor with HfOx layer is found to enable a significant effect on synaptic properties. The memristor exhibits good reliability with long retention, 104 s, and high endurance, 104 cycles. The optimized 6 nm thick HfOx layer in SnOx-based memristor possesses the excellent synaptic properties of stable 350 epochs training, multi-level conductance (MLC) behaviour, and the nonlinearity of 1.53 and 1.46 for long-term potentiation and depression, respectively, and faster image recognition accuracy of 100% after 23 iterations. The maximum weight changes of -73.12 and 79.91% for the potentiation and depression of the synaptic device, respectively, are observed from the spike-timing-dependent plasticity (STDP) characteristics making it suitable for biological applications. The flexibility of the device on the PEN substrate is confirmed by the acceptable change of nonlinearities up to 4 mm bending. Such a synaptic device is expected to be used as a vision photo-receptor.
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Affiliation(s)
- Ping-Xing Chen
- Institute of Electronics, National Yang-Ming Chiao Tung University, Hsinchu, 30010, Taiwan
| | - Debashis Panda
- Institute of Electronics, National Yang-Ming Chiao Tung University, Hsinchu, 30010, Taiwan.
- Department of Electronics and Communication Engineering, CV Raman Global University, Bhubaneswar, 752054, India.
| | - Tseung-Yuen Tseng
- Institute of Electronics, National Yang-Ming Chiao Tung University, Hsinchu, 30010, Taiwan
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7
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Li D, Dong X, Cheng P, Song L, Wu Z, Chen Y, Huang W. Metal Halide Perovskite/Electrode Contacts in Charge-Transporting-Layer-Free Devices. ADVANCED SCIENCE (WEINHEIM, BADEN-WURTTEMBERG, GERMANY) 2022; 9:e2203683. [PMID: 36319474 PMCID: PMC9798992 DOI: 10.1002/advs.202203683] [Citation(s) in RCA: 3] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 07/04/2022] [Revised: 09/13/2022] [Indexed: 06/16/2023]
Abstract
Metal halide perovskites have drawn substantial interest in optoelectronic devices in the past decade. Perovskite/electrode contacts are crucial for constructing high-performance charge-transporting-layer-free perovskite devices, such as solar cells, field-effect transistors, artificial synapses, memories, etc. Many studies have evidenced that the perovskite layer can directly contact the electrodes, showing abundant physicochemical, electronic, and photoelectric properties in charge-transporting-layer-free perovskite devices. Meanwhile, for perovskite/metal contacts, some critical interfacial physical and chemical processes are reported, including band bending, interface dipoles, metal halogenation, and perovskite decomposition induced by metal electrodes. Thus, a systematic summary of the role of metal halide perovskite/electrode contacts on device performance is essential. This review summarizes and discusses charge carrier dynamics, electronic band engineering, electrode corrosion, electrochemical metallization and dissolution, perovskite decomposition, and interface engineering in perovskite/electrode contacts-based electronic devices for a comprehensive understanding of the contacts. The physicochemical, electronic, and morphological properties of various perovskite/electrode contacts, as well as relevant engineering techniques, are presented. Finally, the current challenges are analyzed, and appropriate recommendations are put forward. It can be expected that further research will lead to significant breakthroughs in their application and promote reforms and innovations in future solid-state physics and materials science.
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Affiliation(s)
- Deli Li
- Frontiers Science Center for Flexible ElectronicsXi'an Institute of Flexible Electronics (IFE) and Xi'an Institute of Biomedical Materials and EngineeringNorthwestern Polytechnical University127 West Youyi RoadXi'an710072P. R. China
- Fujian cross Strait Institute of Flexible Electronics (Future Technologies)Fujian Normal UniversityFuzhou350117P. R. China
| | - Xue Dong
- Frontiers Science Center for Flexible ElectronicsXi'an Institute of Flexible Electronics (IFE) and Xi'an Institute of Biomedical Materials and EngineeringNorthwestern Polytechnical University127 West Youyi RoadXi'an710072P. R. China
| | - Peng Cheng
- Frontiers Science Center for Flexible ElectronicsXi'an Institute of Flexible Electronics (IFE) and Xi'an Institute of Biomedical Materials and EngineeringNorthwestern Polytechnical University127 West Youyi RoadXi'an710072P. R. China
| | - Lin Song
- Frontiers Science Center for Flexible ElectronicsXi'an Institute of Flexible Electronics (IFE) and Xi'an Institute of Biomedical Materials and EngineeringNorthwestern Polytechnical University127 West Youyi RoadXi'an710072P. R. China
| | - Zhongbin Wu
- Frontiers Science Center for Flexible ElectronicsXi'an Institute of Flexible Electronics (IFE) and Xi'an Institute of Biomedical Materials and EngineeringNorthwestern Polytechnical University127 West Youyi RoadXi'an710072P. R. China
| | - Yonghua Chen
- Key Laboratory of Flexible Electronics (KLoFE) and Institute of Advanced Materials (IAM)Nanjing Tech University30 South Puzhu RoadNanjingJiangsu211816P. R. China
| | - Wei Huang
- Frontiers Science Center for Flexible ElectronicsXi'an Institute of Flexible Electronics (IFE) and Xi'an Institute of Biomedical Materials and EngineeringNorthwestern Polytechnical University127 West Youyi RoadXi'an710072P. R. China
- Key Laboratory of Flexible Electronics (KLoFE) and Institute of Advanced Materials (IAM)Nanjing Tech University30 South Puzhu RoadNanjingJiangsu211816P. R. China
- Key Laboratory for Organic Electronics and Information Displays and Institute of Advanced MaterialsNanjing University of Posts and TelecommunicationsNanjing210023P. R. China
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8
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Banerjee W, Kashir A, Kamba S. Hafnium Oxide (HfO 2 ) - A Multifunctional Oxide: A Review on the Prospect and Challenges of Hafnium Oxide in Resistive Switching and Ferroelectric Memories. SMALL (WEINHEIM AN DER BERGSTRASSE, GERMANY) 2022; 18:e2107575. [PMID: 35510954 DOI: 10.1002/smll.202107575] [Citation(s) in RCA: 33] [Impact Index Per Article: 11.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/26/2022] [Revised: 03/24/2022] [Indexed: 06/14/2023]
Abstract
Hafnium oxide (HfO2 ) is one of the mature high-k dielectrics that has been standing strong in the memory arena over the last two decades. Its dielectric properties have been researched rigorously for the development of flash memory devices. In this review, the application of HfO2 in two main emerging nonvolatile memory technologies is surveyed, namely resistive random access memory and ferroelectric memory. How the properties of HfO2 equip the former to achieve superlative performance with high-speed reliable switching, excellent endurance, and retention is discussed. The parameters to control HfO2 domains are further discussed, which can unleash the ferroelectric properties in memory applications. Finally, the prospect of HfO2 materials in emerging applications, such as high-density memory and neuromorphic devices are examined, and the various challenges of HfO2 -based resistive random access memory and ferroelectric memory devices are addressed with a future outlook.
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Affiliation(s)
- Writam Banerjee
- Center for Single Atom-based Semiconductor Device, Department of Material Science and Engineering, Pohang University of Science and Technology (POSTECH), Pohang, 37673, Republic of Korea
| | - Alireza Kashir
- Institute of Physics of the Czech Academy of Sciences, Na Slovance 2, Prague 8, 182 21, Czech Republic
| | - Stanislav Kamba
- Institute of Physics of the Czech Academy of Sciences, Na Slovance 2, Prague 8, 182 21, Czech Republic
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9
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Empirical Characterization of ReRAM Devices Using Memory Maps and a Dynamic Route Map. ELECTRONICS 2022. [DOI: 10.3390/electronics11111672] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/16/2022]
Abstract
Memristors were proposed in the early 1970s by Leon Chua as a new electrical element linking charge to flux. Since that first introduction, these devices have positioned themselves to be considered as possible fundamental ones for the generations of electronic devices to come. In this paper, we propose a new way to investigate the effects of the electrical variables on the memristance of a device, and we successfully apply this technique to model the behavior of a TiN/Ti/HfO2/W ReRAM structure. To do so, we initially apply the Dynamic Route Map technique in the general case to obtain an approximation to the differential equation that determines the behaviour of the device. This is performed by choosing a variable of interest and observing the evolution of its own temporal derivative versus both its value and the applied voltage. Then, according to this technique, it is possible to obtain an approach to the governing equations with no need to make any assumption about the underlying physical mechanisms, by fitting a function to this. We have used a polynomial function, which allows accurate reproduction of the observed electrical behavior of the measured devices, by integrating the resulting differential equation system.
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Aguirre FL, Suñé J, Miranda E. SPICE Implementation of the Dynamic Memdiode Model for Bipolar Resistive Switching Devices. MICROMACHINES 2022; 13:330. [PMID: 35208454 PMCID: PMC8874538 DOI: 10.3390/mi13020330] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 01/21/2022] [Revised: 02/11/2022] [Accepted: 02/14/2022] [Indexed: 11/25/2022]
Abstract
This paper reports the fundamentals and the SPICE implementation of the Dynamic Memdiode Model (DMM) for the conduction characteristics of bipolar-type resistive switching (RS) devices. Following Prof. Chua's memristive devices theory, the memdiode model comprises two equations, one for the electron transport based on a heuristic extension of the quantum point-contact model for filamentary conduction in thin dielectrics and a second equation for the internal memory state related to the reversible displacement of atomic species within the oxide film. The DMM represents a breakthrough with respect to the previous Quasi-static Memdiode Model (QMM) since it describes the memory state of the device as a balance equation incorporating both the snapback and snapforward effects, features of utmost importance for the accurate and realistic simulation of the RS phenomenon. The DMM allows simple setting of the initial memory condition as well as decoupled modeling of the set and reset transitions. The model equations are implemented in the LTSpice simulator using an equivalent circuital approach with behavioral components and sources. The practical details of the model implementation and its modes of use are also discussed.
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Affiliation(s)
- Fernando Leonel Aguirre
- Departament d’Enginyeria Electrònica, Universitat Autònoma de Barcelona (UAB), 08193 Barcelona, Spain;
| | | | - Enrique Miranda
- Departament d’Enginyeria Electrònica, Universitat Autònoma de Barcelona (UAB), 08193 Barcelona, Spain;
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11
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GERARD: GEneral RApid Resolution of Digital Mazes Using a Memristor Emulator. PHYSICS 2021. [DOI: 10.3390/physics4010001] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/17/2022]
Abstract
Memristive technology is a promising game-changer in computers and electronics. In this paper, a system exploring the optimal paths through a maze, utilizing a memristor-based setup, is developed and concreted on a FPGA (field-programmable gate array) device. As a memristor, a digital emulator has been used. According to the proposed approach, the memristor is used as a delay element, further configuring the test graph as a memristor network. A parallel algorithm is then applied, successfully reducing computing time and increasing the system’s efficiency. The proposed system is simple, easy to scale up and capable of implementing different graph configurations. The operation of the algorithm in the MATLAB (matrix laboratory) programming enviroment is checked beforehand and then exported to two different Intel FPGAs: a DE0-Nano board and an Arria 10 GX 220 FPGA. In both cases, reliable results are obtained quickly and conveniently, even for the case of a 300 × 300 nodes maze.
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12
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Ader C, Falkenstein A, Martin M. Transition between bipolar and abnormal bipolar resistive switching in amorphous oxides with a mobility edge. Sci Rep 2021; 11:14384. [PMID: 34257338 PMCID: PMC8277833 DOI: 10.1038/s41598-021-93777-6] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/29/2021] [Accepted: 06/28/2021] [Indexed: 11/17/2022] Open
Abstract
Resistive switching is an important phenomenon for future memory devices such as resistance random access memories or neuronal networks. While there are different types of resistive switching, such as filament or interface switching, this work focuses on bulk switching in amorphous, binary oxides. Bulk switching was found experimentally in different oxides, for example in amorphous gallium oxide. The forms of the observed current-voltage curves differ, however, fundamentally. Even within the same material, both abnormal bipolar and normal bipolar resistive switching were found. Here, we use a new drift-diffusion model to theoretically investigate bulk switching in amorphous oxides where the electronic conductivity can be described by Mott's concept of a mobility edge. We show not only that a strong, non-linear dependence of the electronic conductivity on the oxygen content is necessary for bulk switching but also that changing the geometry of the memristive device causes the transition between abnormal and normal bipolar switching.
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Affiliation(s)
- Christiane Ader
- Institute of Physical Chemistry, RWTH Aachen University, 52074, Aachen, Germany
| | - Andreas Falkenstein
- Institute of Physical Chemistry, RWTH Aachen University, 52074, Aachen, Germany
| | - Manfred Martin
- Institute of Physical Chemistry, RWTH Aachen University, 52074, Aachen, Germany.
- JARA-CSD, Forschungszentrum Jülich and RWTH Aachen University, Aachen, Germany.
- JARA-FIT, Forschungszentrum Jülich and RWTH Aachen University, Aachen, Germany.
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13
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Roldán JB, González-Cordero G, Picos R, Miranda E, Palumbo F, Jiménez-Molinos F, Moreno E, Maldonado D, Baldomá SB, Moner Al Chawa M, de Benito C, Stavrinides SG, Suñé J, Chua LO. On the Thermal Models for Resistive Random Access Memory Circuit Simulation. NANOMATERIALS (BASEL, SWITZERLAND) 2021; 11:1261. [PMID: 34065014 PMCID: PMC8151724 DOI: 10.3390/nano11051261] [Citation(s) in RCA: 13] [Impact Index Per Article: 3.3] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 04/11/2021] [Revised: 04/28/2021] [Accepted: 05/01/2021] [Indexed: 11/23/2022]
Abstract
Resistive Random Access Memories (RRAMs) are based on resistive switching (RS) operation and exhibit a set of technological features that make them ideal candidates for applications related to non-volatile memories, neuromorphic computing and hardware cryptography. For the full industrial development of these devices different simulation tools and compact models are needed in order to allow computer-aided design, both at the device and circuit levels. Most of the different RRAM models presented so far in the literature deal with temperature effects since the physical mechanisms behind RS are thermally activated; therefore, an exhaustive description of these effects is essential. As far as we know, no revision papers on thermal models have been published yet; and that is why we deal with this issue here. Using the heat equation as the starting point, we describe the details of its numerical solution for a conventional RRAM structure and, later on, present models of different complexity to integrate thermal effects in complete compact models that account for the kinetics of the chemical reactions behind resistive switching and the current calculation. In particular, we have accounted for different conductive filament geometries, operation regimes, filament lateral heat losses, the use of several temperatures to characterize each conductive filament, among other issues. A 3D numerical solution of the heat equation within a complete RRAM simulator was also taken into account. A general memristor model is also formulated accounting for temperature as one of the state variables to describe electron device operation. In addition, to widen the view from different perspectives, we deal with a thermal model contextualized within the quantum point contact formalism. In this manner, the temperature can be accounted for the description of quantum effects in the RRAM charge transport mechanisms. Finally, the thermometry of conducting filaments and the corresponding models considering different dielectric materials are tackled in depth.
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Affiliation(s)
- Juan B. Roldán
- Departamento de Electrónica y Tecnología de Computadores, Facultad de Ciencias, Universidad de Granada, Avd. Fuentenueva s/n, 18071 Granada, Spain; (G.G.-C.); (F.J.-M.); (D.M.)
| | - Gerardo González-Cordero
- Departamento de Electrónica y Tecnología de Computadores, Facultad de Ciencias, Universidad de Granada, Avd. Fuentenueva s/n, 18071 Granada, Spain; (G.G.-C.); (F.J.-M.); (D.M.)
| | - Rodrigo Picos
- Industrial Engineering and Construction Department, University of Balearic Islands, 07122 Palma, Spain; (R.P.); (C.d.B.)
| | - Enrique Miranda
- Department Enginyeria Electrònica, Universitat Autònoma de Barcelona, Edifici Q., 08193 Bellaterra, Spain; (E.M.); (J.S.)
| | - Félix Palumbo
- Consejo Nacional de Investigaciones Científicas y Técnicas (CONICET), Godoy Cruz 2290, Buenos Aires C1425FQB, Argentina;
| | - Francisco Jiménez-Molinos
- Departamento de Electrónica y Tecnología de Computadores, Facultad de Ciencias, Universidad de Granada, Avd. Fuentenueva s/n, 18071 Granada, Spain; (G.G.-C.); (F.J.-M.); (D.M.)
| | - Enrique Moreno
- UJM-St-Etienne, CNRS, Laboratoire Hubert Curien UMR 5516, Institute of Optics Graduate School, University Lyon, F-42023 St-Etienne, France;
| | - David Maldonado
- Departamento de Electrónica y Tecnología de Computadores, Facultad de Ciencias, Universidad de Granada, Avd. Fuentenueva s/n, 18071 Granada, Spain; (G.G.-C.); (F.J.-M.); (D.M.)
| | - Santiago B. Baldomá
- Unidad de Investigación y Desarrollo de las Ingenierías (UIDI), Facultad Regional Buenos Aires, Universidad Tecnológica Nacional, Medrano 951, Buenos Aires C1179AAQ, Argentina;
| | - Mohamad Moner Al Chawa
- Institute of Circuits and Systems, Technische Universität Dresden, 01062 Dresden, Germany;
| | - Carol de Benito
- Industrial Engineering and Construction Department, University of Balearic Islands, 07122 Palma, Spain; (R.P.); (C.d.B.)
| | - Stavros G. Stavrinides
- School of Science and Technology, Thermi University Campus, International Hellenic University, 57001 Thessaloniki, Greece;
| | - Jordi Suñé
- Department Enginyeria Electrònica, Universitat Autònoma de Barcelona, Edifici Q., 08193 Bellaterra, Spain; (E.M.); (J.S.)
| | - Leon O. Chua
- Electrical Engineering and Computer Science Department, University of California, Berkeley, CA 94720-1770, USA;
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14
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Pan J, Hu H, Li Z, Mu J, Cai Y, Zhu H. Recent progress in two-dimensional materials for terahertz protection. NANOSCALE ADVANCES 2021; 3:1515-1531. [PMID: 36132557 PMCID: PMC9419147 DOI: 10.1039/d0na01046d] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 12/15/2020] [Accepted: 01/28/2021] [Indexed: 06/15/2023]
Abstract
With the wide applications of terahertz (THz) devices in future communication technology, THz protection materials are essential to overcome potential threats. Recently, THz metamaterials (MMs) based on two-dimensional (2D) materials (e.g., graphene, MXenes) have been extensively investigated due to their unique THz response properties. In this review, THz protection theories are briefly presented first, including reflection loss and shielding mechanisms. Then, the research progress of graphene and other 2D material-based THz MMs and intrinsic materials are reviewed. MMs absorbers in the forms of single layer, multiple layers, hybrid and tunable metasurfaces show excellent THz absorbing performance. These studies provide a sufficient theoretical and practical basis for THz protection, and superior properties promised the wide application prospects of 2D MMs. Three-dimensional intrinsic THz absorbing materials based on porous and ordered 2D materials also show exceptional THz protection performance and effectively integrate the advantages of intrinsic properties and the structural characteristics of 2D materials. These special structures can optimize the surface impedance matching and enable multiple THz scatterings and electric transmission loss, which can realize high-efficiency absorption loss and active controllable protection performance in ultra-wide THz wavebands. Finally, the advantages and existing problems of current THz protection materials are summarized, and their possible future development and applications are prospected.
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Affiliation(s)
- Jialiang Pan
- State Key Lab of New Ceramics and Fine Processing, School of Materials Science and Engineering, Tsinghua University Beijing 100084 China
- The First Scientific Research Institute of Wuxi Wuxi 214035 Jiangsu China
| | - Haowen Hu
- State Key Lab of New Ceramics and Fine Processing, School of Materials Science and Engineering, Tsinghua University Beijing 100084 China
| | - Zechen Li
- State Key Lab of New Ceramics and Fine Processing, School of Materials Science and Engineering, Tsinghua University Beijing 100084 China
| | - Jingyang Mu
- The First Scientific Research Institute of Wuxi Wuxi 214035 Jiangsu China
| | - Yunxiang Cai
- The First Scientific Research Institute of Wuxi Wuxi 214035 Jiangsu China
| | - Hongwei Zhu
- State Key Lab of New Ceramics and Fine Processing, School of Materials Science and Engineering, Tsinghua University Beijing 100084 China
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15
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Toward Reliable Compact Modeling of Multilevel 1T-1R RRAM Devices for Neuromorphic Systems. ELECTRONICS 2021. [DOI: 10.3390/electronics10060645] [Citation(s) in RCA: 10] [Impact Index Per Article: 2.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/16/2022]
Abstract
In this work, three different RRAM compact models implemented in Verilog-A are analyzed and evaluated in order to reproduce the multilevel approach based on the switching capability of experimental devices. These models are integrated in 1T-1R cells to control their analog behavior by means of the compliance current imposed by the NMOS select transistor. Four different resistance levels are simulated and assessed with experimental verification to account for their multilevel capability. Further, an Artificial Neural Network study is carried out to evaluate in a real scenario the viability of the multilevel approach under study.
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16
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Choi S, Yang J, Wang G. Emerging Memristive Artificial Synapses and Neurons for Energy-Efficient Neuromorphic Computing. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2020; 32:e2004659. [PMID: 33006204 DOI: 10.1002/adma.202004659] [Citation(s) in RCA: 104] [Impact Index Per Article: 20.8] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/08/2020] [Revised: 08/12/2020] [Indexed: 06/11/2023]
Abstract
Memristors have recently attracted significant interest due to their applicability as promising building blocks of neuromorphic computing and electronic systems. The dynamic reconfiguration of memristors, which is based on the history of applied electrical stimuli, can mimic both essential analog synaptic and neuronal functionalities. These can be utilized as the node and terminal devices in an artificial neural network. Consequently, the ability to understand, control, and utilize fundamental switching principles and various types of device architectures of the memristor is necessary for achieving memristor-based neuromorphic hardware systems. Herein, a wide range of memristors and memristive-related devices for artificial synapses and neurons is highlighted. The device structures, switching principles, and the applications of essential synaptic and neuronal functionalities are sequentially presented. Moreover, recent advances in memristive artificial neural networks and their hardware implementations are introduced along with an overview of the various learning algorithms. Finally, the main challenges of the memristive synapses and neurons toward high-performance and energy-efficient neuromorphic computing are briefly discussed. This progress report aims to be an insightful guide for the research on memristors and neuromorphic-based computing.
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Affiliation(s)
- Sanghyeon Choi
- KU-KIST Graduate School of Converging Science and Technology, Korea University, 145, Anam-ro, Seongbuk-gu, Seoul, 02841, Republic of Korea
| | - Jehyeon Yang
- KU-KIST Graduate School of Converging Science and Technology, Korea University, 145, Anam-ro, Seongbuk-gu, Seoul, 02841, Republic of Korea
| | - Gunuk Wang
- KU-KIST Graduate School of Converging Science and Technology, Korea University, 145, Anam-ro, Seongbuk-gu, Seoul, 02841, Republic of Korea
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17
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Alialy S, Esteki K, Ferreira MS, Boland JJ, Gomes da Rocha C. Nonlinear ion drift-diffusion memristance description of TiO 2 RRAM devices. NANOSCALE ADVANCES 2020; 2:2514-2524. [PMID: 36133364 PMCID: PMC9419089 DOI: 10.1039/d0na00195c] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 03/07/2020] [Accepted: 04/20/2020] [Indexed: 06/16/2023]
Abstract
The nature and direction of the hysteresis in memristive devices is critical to device operation and performance and the ability to realise their potential in neuromorphic applications. TiO2 is a prototypical memristive device material and is known to show hysteresis loops with both clockwise switching and counter-clockwise switching and in many instances evidence of negative differential resistance (NDR) behaviour. Here we study the electrical response of a device composed of a single nanowire channel Au-Ti/TiO2/Ti-Au both in air and under vacuum and simulate the I-V characteristics in each case using the Schottky barrier and an ohmic-like transport memristive model which capture nonlinear diffusion and migration of ions within the wire. The dynamics of this complex charge conduction phenomenon is obtained by fitting the nonlinear ion-drift equations with the experimental data. Our experimental results support a nonlinear drift of oxygen vacancies acting as shallow donors under vacuum conditions. Simulations show that dopant diffusion under bias creates a depletion region along the channel which results in NDR behaviour, but it is overcome at higher applied bias due to oxygen vacancy generation at the anode. The model allows the motion of the charged dopants to be visualised during device operation in air and under vacuum and predicts the elimination of the NDR under low bias operation, in agreement with experiments.
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Affiliation(s)
- Sahar Alialy
- School of Chemistry, Trinity College Dublin Dublin 2 Dublin Ireland
- Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN), Advanced Materials and Bioengineering Research (AMBER) Research Centre, Trinity College Dublin Dublin 2 Dublin Ireland
| | - Koorosh Esteki
- Department of Physics and Astronomy, University of Calgary 2500 University Drive NW Calgary Alberta T2N 1N4 Canada
| | - Mauro S Ferreira
- Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN), Advanced Materials and Bioengineering Research (AMBER) Research Centre, Trinity College Dublin Dublin 2 Dublin Ireland
- School of Physics, Trinity College Dublin Dublin 2 Dublin Ireland
| | - John J Boland
- School of Chemistry, Trinity College Dublin Dublin 2 Dublin Ireland
- Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN), Advanced Materials and Bioengineering Research (AMBER) Research Centre, Trinity College Dublin Dublin 2 Dublin Ireland
| | - Claudia Gomes da Rocha
- Department of Physics and Astronomy, University of Calgary 2500 University Drive NW Calgary Alberta T2N 1N4 Canada
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18
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Zahoor F, Azni Zulkifli TZ, Khanday FA. Resistive Random Access Memory (RRAM): an Overview of Materials, Switching Mechanism, Performance, Multilevel Cell (mlc) Storage, Modeling, and Applications. NANOSCALE RESEARCH LETTERS 2020; 15:90. [PMID: 32323059 PMCID: PMC7176808 DOI: 10.1186/s11671-020-03299-9] [Citation(s) in RCA: 133] [Impact Index Per Article: 26.6] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/19/2019] [Accepted: 03/17/2020] [Indexed: 05/10/2023]
Abstract
In this manuscript, recent progress in the area of resistive random access memory (RRAM) technology which is considered one of the most standout emerging memory technologies owing to its high speed, low cost, enhanced storage density, potential applications in various fields, and excellent scalability is comprehensively reviewed. First, a brief overview of the field of emerging memory technologies is provided. The material properties, resistance switching mechanism, and electrical characteristics of RRAM are discussed. Also, various issues such as endurance, retention, uniformity, and the effect of operating temperature and random telegraph noise (RTN) are elaborated. A discussion on multilevel cell (MLC) storage capability of RRAM, which is attractive for achieving increased storage density and low cost is presented. Different operation schemes to achieve reliable MLC operation along with their physical mechanisms have been provided. In addition, an elaborate description of switching methodologies and current voltage relationships for various popular RRAM models is covered in this work. The prospective applications of RRAM to various fields such as security, neuromorphic computing, and non-volatile logic systems are addressed briefly. The present review article concludes with the discussion on the challenges and future prospects of the RRAM.
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Affiliation(s)
- Furqan Zahoor
- Department of Electrical and Electronics Engineering, Universiti Teknologi Petronas, Seri Iskandar, Perak, 32610 Malaysia
| | - Tun Zainal Azni Zulkifli
- Department of Electrical and Electronics Engineering, Universiti Teknologi Petronas, Seri Iskandar, Perak, 32610 Malaysia
| | - Farooq Ahmad Khanday
- P.G. Department of Electronics and Instrumentation Technology, University of Kashmir, Srinagar, Jammu and Kashmir, 190005 India
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Despotuli AL, Andreeva AV. Spatial averaging of electrostatic potential differences in layered nanostructures with ionic hopping conductivity. J Electroanal Chem (Lausanne) 2018. [DOI: 10.1016/j.jelechem.2018.09.046] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/30/2022]
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