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Hotz MT, Martis J, Radlicka T, Bacon NJ, Dellby N, Lovejoy TC, Quillin SC, Hwang HY, Singh P, Krivanek OL. Atomic Resolution SE Imaging in a 30-200 keV Aberration-corrected UHV STEM. Microsc Microanal 2023; 29:2064-2065. [PMID: 37612905 DOI: 10.1093/micmic/ozad067.1068] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 08/25/2023]
Affiliation(s)
- M T Hotz
- Nion R&D, 11511 NE 118th St, Kirkland, WA, USA
| | - J Martis
- Nion R&D, 11511 NE 118th St, Kirkland, WA, USA
- Department of Mechanical Engineering, Stanford University, Stanford, CA, USA
| | - T Radlicka
- Institute of Scientific Instruments of CAS, Královopolská 147, Brno, Czech Republic
| | - N J Bacon
- Nion R&D, 11511 NE 118th St, Kirkland, WA, USA
| | - N Dellby
- Nion R&D, 11511 NE 118th St, Kirkland, WA, USA
| | - T C Lovejoy
- Nion R&D, 11511 NE 118th St, Kirkland, WA, USA
| | - S C Quillin
- Nion R&D, 11511 NE 118th St, Kirkland, WA, USA
| | - H Y Hwang
- Department of Applied Physics, Stanford University, Stanford, CA, USA
| | - P Singh
- Department of Applied Physics, Stanford University, Stanford, CA, USA
| | - O L Krivanek
- Nion R&D, 11511 NE 118th St, Kirkland, WA, USA
- Department of Physics, Arizona State University, Tempe, AZ, USA
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Bhat RM, Nandakishore B, Sequeira FF, Sukumar D, Kamath GH, Martis J, Furtado S. Pyoderma gangrenosum: an Indian perspective. Clin Exp Dermatol 2010; 36:242-7. [DOI: 10.1111/j.1365-2230.2010.03941.x] [Citation(s) in RCA: 29] [Impact Index Per Article: 2.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022]
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