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1
Hotz MT, Martis J, Radlicka T, Bacon NJ, Dellby N, Lovejoy TC, Quillin SC, Hwang HY, Singh P, Krivanek OL. Atomic Resolution SE Imaging in a 30-200 keV Aberration-corrected UHV STEM. Microsc Microanal 2023;29:2064-2065. [PMID: 37612905 DOI: 10.1093/micmic/ozad067.1068] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 08/25/2023]
2
Plotkin-Swing B, Mittelberger A, Haas B, Idrobo JC, Graner B, Dellby N, Hotz MT, Meyer CE, Quillin SC, Krivanek OL, Lovejoy TC. Ultra-high Energy Resolution EELS and 4D STEM at Cryogenic Temperatures. Microsc Microanal 2023;29:1698-1699. [PMID: 37613909 DOI: 10.1093/micmic/ozad067.875] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 08/25/2023]
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