Switchable tribology of ferroelectrics

Switchable tribological properties of ferroelectrics offer an alternative route to visualize and control ferroelectric domains. Here, we observe the switchable friction and wear behavior of ferroelectrics using a nanoscale scanning probe-down domains have lower friction coefficients and show slower wear rates than up domains and can be used as smart masks. This asymmetry is enabled by flexoelectrically coupled polarization in the up and down domains under a sufficiently high contact force. Moreover, we determine that this polarization-sensitive tribological asymmetry is widely applicable across various ferroelectrics with different chemical compositions and crystalline symmetry. Finally, using this switchable tribology and multi-pass patterning with a domain-based dynamic smart mask, we demonstrate three-dimensional nanostructuring exploiting the asymmetric wear rates of up and down domains, which can, furthermore, be scaled up to technologically relevant (mm-cm) size. These findings demonstrate that ferroelectrics are electrically tunable tribological materials at the nanoscale for versatile applications.

Hystorian: A processing tool for scanning probe microscopy and other n-dimensional datasets

Research in materials science increasingly depends on the correlation of information from multiple characterisation techniques, acquired in ever larger datasets. Efficient methods of processing and storing these complex datasets are therefore crucial. Reliably keeping track of data processing is also essential to conform with the goals of open science. Here, we introduce Hystorian, a generic materials science data analysis Python package built at its core to improve the traceability, reproducibility, and archival ability of data processing. Proprietary data formats are converted into open hierarchical data format (HDF5) files, with both datasets and subsequent workflows automatically stored into a single location, thus allowing easy management of multiple data types. At present, Hystorian provides a basic scanning probe microscopy and x-ray diffraction analysis toolkit, and is readily extensible to suit user needs. It is also able to wrap over any existing processing functions, making it easy to append in an extant workflow.