Hussain B, Ahmed M, Nawaz M, Saleem M, Razzaq M, Aslam Zia M, Iqbal M. Simultaneous determination of thickness and refractive index based on time-of-flight measurements of terahertz pulse.
Appl Opt 2012;
51:5326-5330. [PMID:
22858978 DOI:
10.1364/ao.51.005326]
[Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/20/2012] [Accepted: 06/20/2012] [Indexed: 06/01/2023]
Abstract
We present a simple technique for simultaneous determination of thickness and refractive index of plane-parallel samples in the terahertz radiation domain. The technique uses time-of-flight measurements of the terahertz pulse. It has been employed on nine different polymers and semiconductor materials, which are transparent for terahertz frequencies. Our results of thickness measurement are in good agreement with micrometer reading. The accuracy in the determination of refractive index is on the order of two decimal points.
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