• Reference Citation Analysis
  • v
  • v
  • Find an Article
  • Find an Author
Download
Number Citation Analysis
1
Yoshimura A, Lamparski M, Giedt J, Lingerfelt D, Jakowski J, Ganesh P, Yu T, Sumpter BG, Meunier V. Quantum theory of electronic excitation and sputtering by transmission electron microscopy. Nanoscale 2023;15:1053-1067. [PMID: 35703316 DOI: 10.1039/d2nr01018f] [Citation(s) in RCA: 1] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/15/2023]
2
Gadelha AC, Nguyen VH, Neto EGS, Santana F, Raschke MB, Lamparski M, Meunier V, Charlier JC, Jorio A. Electron-Phonon Coupling in a Magic-Angle Twisted-Bilayer Graphene Device from Gate-Dependent Raman Spectroscopy and Atomistic Modeling. Nano Lett 2022;22:6069-6074. [PMID: 35878122 DOI: 10.1021/acs.nanolett.2c00905] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/15/2023]
3
Borin Barin G, Sun Q, Di Giovannantonio M, Du CZ, Wang XY, Llinas JP, Mutlu Z, Lin Y, Wilhelm J, Overbeck J, Daniels C, Lamparski M, Sahabudeen H, Perrin ML, Urgel JI, Mishra S, Kinikar A, Widmer R, Stolz S, Bommert M, Pignedoli C, Feng X, Calame M, Müllen K, Narita A, Meunier V, Bokor J, Fasel R, Ruffieux P. Growth Optimization and Device Integration of Narrow-Bandgap Graphene Nanoribbons. Small 2022;18:e2202301. [PMID: 35713270 DOI: 10.1002/smll.202202301] [Citation(s) in RCA: 10] [Impact Index Per Article: 5.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/23/2022] [Indexed: 06/15/2023]
4
San Roman D, Krishnamurthy D, Garg R, Hafiz H, Lamparski M, Nuhfer NT, Meunier V, Viswanathan V, Cohen-Karni T. Engineering Three-Dimensional (3D) Out-of-Plane Graphene Edge Sites for Highly Selective Two-Electron Oxygen Reduction Electrocatalysis. ACS Catal 2020. [DOI: 10.1021/acscatal.9b03919] [Citation(s) in RCA: 65] [Impact Index Per Article: 16.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/28/2022]
5
Yoshimura A, Lamparski M, Kharche N, Meunier V. First-principles simulation of local response in transition metal dichalcogenides under electron irradiation. Nanoscale 2018;10:2388-2397. [PMID: 29334100 DOI: 10.1039/c7nr07024a] [Citation(s) in RCA: 20] [Impact Index Per Article: 3.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/07/2023]
6
Garg R, Rastogi SK, Lamparski M, de la Barrera SC, Pace GT, Nuhfer NT, Hunt BM, Meunier V, Cohen-Karni T. Nanowire-Mesh-Templated Growth of Out-of-Plane Three-Dimensional Fuzzy Graphene. ACS Nano 2017;11:6301-6311. [PMID: 28549215 DOI: 10.1021/acsnano.7b02612] [Citation(s) in RCA: 12] [Impact Index Per Article: 1.7] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/07/2023]
7
Parkin WM, Balan A, Liang L, Das PM, Lamparski M, Naylor CH, Rodríguez-Manzo JA, Johnson ATC, Meunier V, Drndić M. Raman Shifts in Electron-Irradiated Monolayer MoS2. ACS Nano 2016;10:4134-42. [PMID: 26998814 PMCID: PMC5893938 DOI: 10.1021/acsnano.5b07388] [Citation(s) in RCA: 127] [Impact Index Per Article: 15.9] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [MESH Headings] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/07/2023]
PrevPage 1 of 1 1Next
© 2004-2024 Baishideng Publishing Group Inc. All rights reserved. 7041 Koll Center Parkway, Suite 160, Pleasanton, CA 94566, USA