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Zhou X, Kerelsky A, Elahi MM, Wang D, Habib KMM, Sajjad RN, Agnihotri P, Lee JU, Ghosh AW, Ross FM, Pasupathy AN. Atomic-Scale Characterization of Graphene p-n Junctions for Electron-Optical Applications. ACS Nano 2019; 13:2558-2566. [PMID: 30689949 DOI: 10.1021/acsnano.8b09575] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/24/2023]
Abstract
Graphene p-n junctions offer a potentially powerful approach toward controlling electron trajectories via collimation and focusing in ballistic solid-state devices. The ability of p-n junctions to control electron trajectories depends crucially on the doping profile and roughness of the junction. Here, we use four-probe scanning tunneling microscopy and spectroscopy (STM/STS) to characterize two state-of-the-art graphene p-n junction geometries at the atomic scale, one with CMOS polySi gates and another with naturally cleaved graphite gates. Using spectroscopic imaging, we characterize the local doping profile across and along the p-n junctions. We find that realistic junctions exhibit non-ideality both in their geometry as well as in the doping profile across the junction. We show that the geometry of the junction can be improved by using the cleaved edge of van der Waals metals such as graphite to define the junction. We quantify the geometric roughness and doping profiles of junctions experimentally and use these parameters in non-equilibrium Green's function-based simulations of focusing and collimation in these realistic junctions. We find that for realizing Veselago focusing, it is crucial to minimize lateral interface roughness which only natural graphite gates achieve and to reduce junction width, in which both devices under investigation underperform. We also find that carrier collimation is currently limited by the non-linearity of the doping profile across the junction. Our work provides benchmarks of the current graphene p-n junction quality and provides guidance for future improvements.
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Affiliation(s)
- Xiaodong Zhou
- Department of Physics , Columbia University , New York , New York 10027 , United States
- IBM T. J. Watson Research Center , Yorktown Heights , New York 10598 , United States
- Institute for Nanoelectronic Devices and Quantum Computing , Fudan University , Shanghai 200438 , P.R. China
| | - Alexander Kerelsky
- Department of Physics , Columbia University , New York , New York 10027 , United States
| | - Mirza M Elahi
- Department of Electrical and Computer Engineering , University of Virginia , Charlottesville , Virginia 22904 , United States
| | - Dennis Wang
- Department of Physics , Columbia University , New York , New York 10027 , United States
| | - K M Masum Habib
- Department of Electrical and Computer Engineering , University of Virginia , Charlottesville , Virginia 22904 , United States
- Intel Corporation , Santa Clara , California 95054 , United States
| | - Redwan N Sajjad
- Microsystems Technology Laboratories , Massachusetts Institute of Technology , Cambridge , Massachusetts 02139 , United States
| | - Pratik Agnihotri
- College of Nanoscale Science and Engineering , The State University of New York at Albany , Albany , New York 12203 , United States
| | - Ji Ung Lee
- College of Nanoscale Science and Engineering , The State University of New York at Albany , Albany , New York 12203 , United States
| | - Avik W Ghosh
- Department of Electrical and Computer Engineering , University of Virginia , Charlottesville , Virginia 22904 , United States
- Department of Physics , University of Virginia , Charlottesville , Virginia 22904 , United States
| | - Frances M Ross
- IBM T. J. Watson Research Center , Yorktown Heights , New York 10598 , United States
- Department of Materials Science and Engineering , Massachusetts Institute of Technology , Cambridge , Massachusetts 02139 , United States
| | - Abhay N Pasupathy
- Department of Physics , Columbia University , New York , New York 10027 , United States
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Nourbakhsh A, Zubair A, Sajjad RN, Tavakkoli K G A, Chen W, Fang S, Ling X, Kong J, Dresselhaus MS, Kaxiras E, Berggren KK, Antoniadis D, Palacios T. MoS 2 Field-Effect Transistor with Sub-10 nm Channel Length. Nano Lett 2016; 16:7798-7806. [PMID: 27960446 DOI: 10.1021/acs.nanolett.6b03999] [Citation(s) in RCA: 137] [Impact Index Per Article: 17.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/06/2023]
Abstract
Atomically thin molybdenum disulfide (MoS2) is an ideal semiconductor material for field-effect transistors (FETs) with sub-10 nm channel lengths. The high effective mass and large bandgap of MoS2 minimize direct source-drain tunneling, while its atomically thin body maximizes the gate modulation efficiency in ultrashort-channel transistors. However, no experimental study to date has approached the sub-10 nm scale due to the multiple challenges related to nanofabrication at this length scale and the high contact resistance traditionally observed in MoS2 transistors. Here, using the semiconducting-to-metallic phase transition of MoS2, we demonstrate sub-10 nm channel-length transistor fabrication by directed self-assembly patterning of mono- and trilayer MoS2. This is done in a 7.5 nm half-pitch periodic chain of transistors where semiconducting (2H) MoS2 channel regions are seamlessly connected to metallic-phase (1T') MoS2 access and contact regions. The resulting 7.5 nm channel-length MoS2 FET has a low off-current of 10 pA/μm, an on/off current ratio of >107, and a subthreshold swing of 120 mV/dec. The experimental results presented in this work, combined with device transport modeling, reveal the remarkable potential of 2D MoS2 for future sub-10 nm technology nodes.
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Affiliation(s)
| | | | | | | | - Wei Chen
- Department of Physics, Harvard University , Cambridge, Massachusetts 02138, United States
| | - Shiang Fang
- Department of Physics, Harvard University , Cambridge, Massachusetts 02138, United States
| | | | | | | | - Efthimios Kaxiras
- Department of Physics, Harvard University , Cambridge, Massachusetts 02138, United States
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Habib KMM, Sajjad RN, Ghosh AW. Chiral tunneling of topological states: towards the efficient generation of spin current using spin-momentum locking. Phys Rev Lett 2015; 114:176801. [PMID: 25978247 DOI: 10.1103/physrevlett.114.176801] [Citation(s) in RCA: 10] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/10/2014] [Indexed: 06/04/2023]
Abstract
We show that the interplay between chiral tunneling and spin-momentum locking of helical surface states leads to spin amplification and filtering in a 3D topological insulator (TI). Our calculations show that the chiral tunneling across a TI pn junction allows normally incident electrons to transmit, while the rest are reflected with their spins flipped due to spin-momentum locking. The net result is that the spin current is enhanced while the dissipative charge current is simultaneously suppressed, leading to an extremely large, gate-tunable spin-to-charge current ratio (∼20) at the reflected end. At the transmitted end, the ratio stays close to 1 and the electrons are completely spin polarized.
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Affiliation(s)
- K M Masum Habib
- Department of Electrical and Computer Engineering, University of Virginia, Charlottesville, Virginia 22904, USA
| | - Redwan N Sajjad
- Department of Electrical and Computer Engineering, University of Virginia, Charlottesville, Virginia 22904, USA
| | - Avik W Ghosh
- Department of Electrical and Computer Engineering, University of Virginia, Charlottesville, Virginia 22904, USA
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Sajjad RN, Ghosh AW. Manipulating chiral transmission by gate geometry: switching in graphene with transmission gaps. ACS Nano 2013; 7:9808-9813. [PMID: 24127633 DOI: 10.1021/nn403336n] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/02/2023]
Abstract
We explore the chiral transmission of electrons across graphene heterojunctions for electronic switching using gate geometry alone. A sequence of gates is used to collimate and orthogonalize the chiral transmission lobes across multiple junctions, resulting in negligible overall current. The resistance of the device is enhanced by several orders of magnitude by biasing the gates into the bipolar npn doping regime, even as the ON state in the homogeneous nnn regime remains highly conductive. The mobility is preserved because the switching involves the suppression of transmission over a range of energy (transmission gap) instead of a structural band gap that would reduce the number of available channels of conduction. Under a different biasing scheme (npn to npp), this transmission gap can be made highly gate tunable, allowing a subthermal turn-on that beats the Landauer bound on switching energy, limiting present-day digital electronics.
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Affiliation(s)
- Redwan N Sajjad
- Department of Electrical and Computer Engineering, University of Virginia , Charlottesville, Virginia 22904, United States
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