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1
Cui H, Tian W, Zhang Y, Chen Z. The Study of the Reliability of Complex Components during the Electromigration Process. Micromachines (Basel) 2023;14:499. [PMID: 36984906 PMCID: PMC10051856 DOI: 10.3390/mi14030499] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 02/09/2023] [Revised: 02/18/2023] [Accepted: 02/19/2023] [Indexed: 06/18/2023]
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Paprocka I, Kempa WM, Ćwikła G. Predictive Maintenance Scheduling with Failure Rate Described by Truncated Normal Distribution. Sensors (Basel) 2020;20:E6787. [PMID: 33261083 DOI: 10.3390/s20236787] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 10/21/2020] [Revised: 11/20/2020] [Accepted: 11/24/2020] [Indexed: 11/16/2022]
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