In Operando Study of Charge Modulation in MoS2 Transistors by Excitonic Reflection Microscopy

Monolayers of transition metal dichalcogenides (2D TMDs) experience strong modulation of their optical properties when the charge density is varied. Indeed, the transition from carriers composed mostly of excitons at low electron density to a situation in which trions dominate at high density is accompanied by a significant evolution of both the refractive index and the extinction coefficient. Using optical interference reflection microscopy at the excitonic wavelength, this (n, κ)-q relationship can be exploited to directly image the electron density in operating TMD devices. In this work, we show how this technique, which we call XRM (excitonic reflection microscopy), can be used to study charge distribution in MoS2 field-effect transistors with subsecond throughput, in wide-field mode. Complete maps of the charge distribution in the transistor channel at any drain and gate bias polarization point (VDS, VGS) are obtained, at ∼3 orders of magnitude faster than with scanning probe techniques such as KPFM. We notably show how the advantages of XRM enable real-time mapping of bias-dependent charge inhomogeneities, the study of resistive delays in 2D polycrystalline networks, and the evaluation of the VDS vs VGS competition to control the charge distribution in active devices.

The Role of Side Chains and Hydration on Mixed Charge Transport in n-Type Polymer Films

Introducing ethylene glycol (EG) side chains to a conjugated polymer backbone is a well-established synthetic strategy for designing organic mixed ion-electron conductors (OMIECs). However, the impact that film swelling has on mixed conduction properties has yet to be scoped, particularly for electron-transporting (n-type) OMIECs. Here, the authors investigate the effect of the length of branched EG chains on mixed charge transport of n-type OMIECs based on a naphthalene-1,4,5,8-tetracarboxylic-diimide-bithiophene backbone. Atomic force microscopy (AFM), grazing-incidence wide-angle X-ray scattering (GIWAXS), and scanning tunneling microscopy (STM) are used to establish the similarities between the common-backbone films in dry conditions. Electrochemical quartz crystal microbalance with dissipation monitoring (EQCM-D) and in situ GIWAXS measurements reveal stark changes in film swelling properties and microstructure during electrochemical doping, depending on the side chain length. It is found that even in the loss of the crystallite content upon contact with the aqueous electrolyte, the films can effectively transport charges and that it is rather the high water content that harms the electronic interconnectivity within the OMIEC films. These results highlight the importance of controlling water uptake in the films to impede charge transport in n-type electrochemical devices.

Diagnosis of Current Flow Patterns Inside Fault-Simulated Li-Ion Batteries via Non-Invasive, In Operando Magnetic Field Imaging

With the growing popularity of Li-ion batteries in large-scale applications, building a safer battery has become a common goal of the battery community. Although the small errors inside the cells trigger catastrophic failures, tracing them and distinguishing cell failure modes without knowledge of cell anatomy can be challenging using conventional methods. In this study, a real-time, non-invasive magnetic field imaging (MFI) analysis that can signal the battery current-induced magnetic field and visualize the current flow within Li-ion cells is developed. A high-speed, spatially resolved MFI scan is used to derive the current distribution pattern from cells with different tab positions at a current load. Current maps are collected to determine possible cell failures using fault-simulated batteries that intentionally possess manufacturing faults such as lead-tab connection failures, electrode misalignment, and stacking faults (electrode folding). A modified MFI analysis exploiting the magnetic field interference with the countercurrent-carrying plate enables the direct identification of defect spots where abnormal current flow occurs within the pouch cells.

In Operando Visualization of Interfacial Band Bending in Photomultiplying Organic Photodetectors

Charge injection is a basic transport process that strongly affects performance of optoelectronic devices such as light-emitting diodes and photodetectors. In these devices, the charge injection barrier is related to the band bending at the active layer/electrode interface and exhibits sophisticated dependence on interface structure and device operating conditions, making it difficult to determine via either theoretical prediction or experimental measurements. Here, in operando cross-sectional scanning Kelvin probe microscopy (SKPM) has been applied in organic photodetectors to visualize the interfacial band bending. The photoinduced interfacial band bending becomes more significant with increasing reverse bias voltage, resulting in reduced charge injection barrier and facilitated charge injection. The photoinduced injection current is orders of magnitude higher than the photocurrent directly generated from light absorption and thus leads to significant photomultiplication. Furthermore, the interfacial structure is tuned to further enhance photoinduced interfacial band bending and the photomultiplication factor.

In Operando GISAXS and GIWAXS Stability Study of Organic Solar Cells Based on PffBT4T-2OD:PC71BM with and without Solvent Additive

Solvent additives are known to modify the morphology of bulk heterojunction active layers to achieve high efficiency organic solar cells. However, the knowledge about the influence of solvent additives on the morphology degradation is limited. Hence, in operando grazing-incidence small and wide angle X-ray scattering (GISAXS and GIWAXS) measurements are applied on a series of PffBT4T-2OD:PC71BM-based solar cells prepared without and with solvent additives. The solar cells fabricated without a solvent additive, with 1,8-diiodoctane (DIO), and with o-chlorobenzaldehyde (CBA) additive show differences in the device degradation and changes in the morphology and crystallinity of the active layers. The mesoscale morphology changes are correlated with the decay of the short-circuit current J sc and the evolution of crystalline grain sizes is codependent with the decay of open-circuit voltage V oc. Without additive, the loss in J sc dominates the degradation, whereas with solvent additive (DIO and CBA) the loss in V oc rules the degradation. CBA addition increases the overall device stability as compared to DIO or absence of additive.

Probing the Atomic-Scale Structure of Amorphous Aluminum Oxide Grown by Atomic Layer Deposition

Atomic layer deposition (ALD) is a well-established technique for depositing nanoscale coatings with pristine control of film thickness and composition. The trimethylaluminum (TMA) and water (H₂O) ALD chemistry is inarguably the most widely used and yet to date, we have little information about the atomic-scale structure of the amorphous aluminum oxide (AlO_x) formed by this chemistry. This lack of understanding hinders our ability to establish process-structure-property relationships and ultimately limits technological advancements employing AlO_x made via ALD. In this work, we employ synchrotron high-energy X-ray diffraction (HE-XRD) coupled with pair distribution function (PDF) analysis to characterize the atomic structure of amorphous AlO_x ALD coatings. We combine ex situ and in operando HE-XRD measurements on ALD AlO_x and fit these experimental data using stochastic structural modeling to reveal variations in the Al-O bond length, Al and O coordination environment, and extent of Al vacancies as a function of growth conditions. In particular, the local atomic structure of ALD AlO_x is found to change with the substrate and number of ALD cycles. The observed trends are consistent with the formation of bulk Al₂O₃ surrounded by an O-rich surface layer. We deconvolute these data to reveal atomic-scale structural information for both the bulk and surface phases. Overall, this work demonstrates the usefulness of HE-XRD and PDF analysis in improving our understanding of the structure of amorphous ALD thin films and provides a pathway to evaluate how process changes impact the structure and properties of ALD films.

In Operando Probing of Lithium-Ion Storage on Single-Layer Graphene

Despite high-surface area carbons, e.g., graphene-based materials, being investigated as anodes for lithium (Li)-ion batteries, the fundamental mechanism of Li-ion storage on such carbons is insufficiently understood. In this work, the evolution of the electrode/electrolyte interface is probed on a single-layer graphene (SLG) film by performing Raman spectroscopy and Fourier transform infrared spectroscopy when the SLG film is electrochemically cycled as the anode in a half cell. The utilization of SLG eliminates the inevitable intercalation of Li ions in graphite or few-layer graphene, which may have complicated the discussion in previous work. Combining the in situ studies with ex situ observations and ab initio simulations, the formation of solid electrolyte interphase and the structural evolution of SLG are discussed when the SLG is biased in an electrolyte. This study provides new insights into the understanding of Li-ion storage on SLG and suggests how high-surface-area carbons could play proper roles in anodes for Li-ion batteries.

In operando plasmonic monitoring of electrochemical evolution of lithium metal

The recent renaissance of lithium metal batteries as promising energy storage devices calls for in operando monitoring and control of electrochemical evolution of lithium metal morphologies. While the development of plasmonics has led to significant advancement in real-time and ultrasensitive chemical and biological sensing and surface-enhanced spectroscopies, alkali metals featured by ideal free electron gas models have long been regarded as promising plasmonic materials but seldom been explored due to their high chemical reactivity. Here, we demonstrate the in operando plasmonic monitoring of the electrochemical evolution of lithium metal during battery cycling by taking advantage of selective electrochemical deposition. The relationships between the evolving morphologies of lithium metal and in operando optical spectra are established both numerically and experimentally: Ordered growth of lithium particles shows clear size-dependent reflective dips due to hybrid surface plasmon resonances, while the formation of undesirable disordered lithium dendrites exhibits a flat spectroscopic profile with pure suppression in reflection intensity. Under the in operando plasmonic monitoring enabled by the microscopic morphology of metal, the differences of lithium evolutionary behaviors with different electrolytes can be conveniently identified without destruction. At the intersection of energy storage and plasmonics, it is expected that the ability to actively control and in operando plasmonically monitor electrochemical evolution of lithium metal can provide a promising platform for investigating lithium metal behavior during electrochemical cycling under various working conditions.

An X-ray Tomographic Study of Rechargeable Zn/MnO₂ Batteries

We present non-destructive and non-invasive in operando X-ray tomographic investigations of the charge and discharge behavior of rechargeable alkaline-manganese (RAM) batteries (Zn-MnO₂ batteries). Changes in the three-dimensional structure of the zinc anode and the MnO₂ cathode material after several charge/discharge cycles were analyzed. Battery discharge leads to a decrease in the zinc particle sizes, revealing a layer-by-layer dissolving behavior. During charging, the particles grow again to almost their initial size and shape. After several cycles, the particles sizes slowly decrease until most of the particles become smaller than the spatial resolution of the tomography. Furthermore, the number of cracks in the MnO₂ bulk continuously increases and the separator changes its shape. The results are compared to the behavior of a conventional primary cell that was also charged and discharged several times.

Effect of Polarization Reversal in Ferroelectric TiN/Hf0.5Zr0.5O2/TiN Devices on Electronic Conditions at Interfaces Studied in Operando by Hard X-ray Photoemission Spectroscopy

Because of their compatibility with modern Si-based technology, HfO₂-based ferroelectric films have recently attracted attention as strong candidates for applications in memory devices, in particular, ferroelectric field-effect transistors or ferroelectric tunnel junctions. A key property defining the functionality of these devices is the polarization dependent change of the electronic band alignment at the metal/ferroelectric interface. Here, we report on the effect of polarization reversal in functional ferroelectric TiN/Hf_0.5Zr_0.5O₂/TiN capacitors on the potential distribution across the stack and the electronic band line-up at the interfaces studied in operando by hard X-ray photoemission spectroscopy. By tracking changes in the position of Hf_0.5Zr_0.5O₂ core-level lines with respect to those of the TiN electrode in both short- and open-circuit configurations following in situ polarization reversal, we derive the conduction band offset to be 0.7 (1.0) eV at the top and 1.7 (1.0) eV at the bottom interfaces for polarization, pointing up (down), respectively. Energy dispersive X-ray spectroscopy profiling of the sample cross-section in combination with the laboratory X-ray photoelectron spectroscopy reveal the presence of a TiO_x/TiON layer at  both interfaces. The observed asymmetry in the band line-up changes in the TiN/Hf_0.5Zr_0.5O₂/TiN memory stack is explained by different origin of these oxidized layers and effective pinning of polarization at the top interface. The described methodology and first experimental results are useful for the optimization of HfO₂-based ferroelectric memory devices under development.

Why does the Conductivity of a Nickel Catalyst Increase during Sulfidation? An Exemplary Study Using an In Operando Sensor Device

In order to study the sulfidation of a catalyst fixed bed, an in operando single pellet sensor was designed. A catalyst pellet from the fixed bed was electrically contacted and its electrical response was correlated with the catalyst behavior. For the sulfidation tests, a nickel catalyst was used and was sulfidized with H₂S. This catalyst had a very low conductivity in the reduced state. During sulfidation, the conductivity of the catalyst increased by decades. A reaction from nickel to nickel sulfide occurred. This conductivity increase by decades during sulfidation had not been expected since both nickel and nickel sulfides behave metallic. Only by assuming a percolation phenomenon that originates from a volume increase of the nickel contacts when reacting to nickel sulfides, this effect can be explained. This assumption was supported by sulfidation tests with differently nickel loaded catalysts and it was quantitatively estimated by a general effective media theory. The single pellet sensor device for in operando investigation of sulfidation can be considered as a valuable tool to get further insights into catalysts under reaction conditions.