Towards Unbiased Fluorophore Counting in Superresolution Fluorescence Microscopy

With the advent of fluorescence superresolution microscopy, nano-sized structures can be imaged with a previously unprecedented accuracy. Therefore, it is rapidly gaining importance as an analytical tool in the life sciences and beyond. However, the images obtained so far lack an absolute scale in terms of fluorophore numbers. Here, we use, for the first time, a detailed statistical model of the temporal imaging process which relies on a hidden Markov model operating on two timescales. This allows us to extract this information from the raw data without additional calibration measurements. We show this on the basis of added data from experiments on single Alexa 647 molecules as well as GSDIM/dSTORM measurements on DNA origami structures with a known number of labeling positions.

Nanoscale mechanical and electrical characterization of the interphase in polyimide/silicon nitride nanocomposites

Polymer nanocomposites (pNC) have attracted wide interests in electrical insulation applications. Compared to neat matrices or microcomposites, pNC provide significant improvements in combined electrical, mechanical and thermal properties. In the understanding of the reasons behind these improvements, a major role was attributed to the interphase, the interaction zone between the nanoparticles (NP) and the matrix. Because of their nanoscale dimensions, the interphase properties are mostly theoretically described but rarely experimentally characterized. The aim of this study is to propose a nanoscale measurement protocol in order to probe mechanical (Young modulus) and electrical (dielectric permittivity) interphase features using, respectively, the peak force quantitative nanomechanical (PF-QNM) and the electrostatic force microscopy (EFM) modes of the atomic force microscopy. Measurements are performed on polyimide/silicon nitride (Si₃N₄) nanocomposite and the effect of a silane coupling agent treatment of Si₃N₄NP is considered. In order to accurately probe mechanical properties in PF-QNM mode, the impacting parameters such as the applied force, the deformation and the topography are taken into account. The interphase region has shown a higher elastic modulus compared to the matrix and a higher width (W_I) value for treated NP. From EFM measurements combined to a finite element model feeded with theW_Ivalues obtained from PF-QNM, the interphase permittivity is determined. The corresponding values are lower than the matrix one and similar for untreated and treated NP. This is in total agreement with its higher elastic modulus and implies that the interphase is a region around the NP where the polymer chains present a better organization and thus, a restricted mobility.

Comparative Apex Electrostatics of Atom Probe Tomography Specimens

Rigorous electrostatic modeling of the specimen-electrode environment is required to better understand the fundamental processes of atom probe tomography (APT) and guide the analysis of APT data. We have developed a simulation tool that self-consistently solves the nonlinear electrostatic Poisson equation along with the mobile charge carrier concentrations and provides a detailed picture of the electrostatic environment of APT specimen tips. We consider cases of metals, semiconductors, and dielectrics. Traditionally in APT, and regardless of specimen composition, the apex electric field E a p e x has been approximated by the relation E a p e x = S V / ( k r ) , which was originally derived for sharp, metallic conductors; we refer to this equation as the "k-factor approximation". Here, S V is tip-electrode bias, r is the radius of curvature of the tip apex, and k is a dimensionless fitting parameter with 1.5 < k < 8.5 . As expected, our Poisson solver agrees well with the k-factor approximation for metal tips; it also agrees remarkably well for semiconductor tips-regardless of the semiconductor doping level. We ascribe this finding to the fact that even if a semiconductor tip is fully depleted of majority carriers under the typical S V conditions used in APT, an inversion layer will appear at the apex surface. The inversion forms a thin, conducting layer that screens the interior of the tip -thus mimicking metallic behavior at the apex surface. By contrast, we find that the k-factor approximation applied to a purely dielectric tip results in k values far greater than the typical range for metallic tips. We put our numerical results into further context with a brief discussion of our own, separate, experimental work and the results of other publications.

Curcumin Loaded Nanoliposomes Localization by Nanoscale Characterization

Curcumin is a hydrophobic drug gaining growing attention because of its high availability, its innocuity, and its anticancer, antitumoral, and antioxidative activity. However, its poor ‎‎bioavailability in the human body, caused by its low aqueous solubility and fast degradation, ‎‎presents a big hurdle for its oral administration. Here, we used nano-vesicles made of ‎‎phospholipids to carry and protect curcumin in its membrane. Various curcumin amounts were ‎‎encapsulated in the produced phospholipid system to form drug-loaded liposomes. ‎Curcumin's ‎concentration was evaluated using UV-visible measurements. The maximal ‎amount of curcumin ‎that could be added to liposomes was assessed. Nuclear magnetic ‎resonance (NMR) analyses ‎were used to determine curcumin's interactions and localization ‎within the phospholipid ‎membrane of the liposomes. X-ray scattering (SAXS) and atomic ‎force microscopy (AFM) ‎experiments were performed to characterize the membrane structure ‎and organization, as well as its ‎mechanical properties at the nanoscale. Conservation of the membrane's properties is found with ‎the addition of curcumin in various ‎amounts before saturation, allowing the preparation of a ‎defined nanocarrier with desired ‎amounts of the drug.

Scanning Probe Microscopy Analysis of Nonfullerene Organic Solar Cells

In this work, scanning probe microscopies (SPMs) are used for the analysis of PBDB-T, ITIC, and PBDB-T:ITIC layers of solar cells (OSCs). Scanning tunneling microscopy (STM) images of PBDB-T reveal that thin films (<1 nm) tend to form worm-like pattern (amorphous type) domains with an average chain-to-chain distance of 950 pm; likewise, STM images of ITIC show that side arms form chain-like patterns. STM images of PBDB-T:ITIC blend suggest why PBDB-T domains could facilitate charge dissociation. Further, a strong interchain π-π interaction of the ITIC molecules could promote self-organization, and under the mutual interaction with the PBDB-T polymer, it could influence the pathway formation for electron transport. Moreover, when correlating electrostatic force microscopy (EFM) and photoconductive atomic force microscopy (pc-AFM), the blend morphology and its electrical/electronic properties are determined; the ideal domain size of PBDB-T:ITIC blend phases for maximizing the generated photocurrent is 15-35 nm. Furthermore, phase contrast and surface electric potential characteristics with Kelvin probe force microscopy (KPFM) are measured to examine additional details about the surface and potential changes due to the domain differences in the active layer. OSCs based on the nonfullerene PBDB-T:ITIC active layer reach an average power conversion efficiency (PCE) of 9.1% (best 9.2%).

Recent Applications of Advanced Atomic Force Microscopy in Polymer Science: A Review

Atomic force microscopy (AFM) has been extensively used for the nanoscale characterization of polymeric materials. The coupling of AFM with infrared spectroscope (AFM-IR) provides another advantage to the chemical analyses and thus helps to shed light upon the study of polymers. This paper reviews some recent progress in the application of AFM and AFM-IR in polymer science. We describe the principle of AFM-IR and the recent improvements to enhance its resolution. We also discuss the latest progress in the use of AFM-IR as a super-resolution correlated scanned-probe infrared spectroscopy for the chemical characterization of polymer materials dealing with polymer composites, polymer blends, multilayers, and biopolymers. To highlight the advantages of AFM-IR, we report several results in studying the crystallization of both miscible and immiscible blends as well as polymer aging. Finally, we demonstrate how this novel technique can be used to determine phase separation, spherulitic structure, and crystallization mechanisms at nanoscales, which has never been achieved before. The review also discusses future trends in the use of AFM-IR in polymer materials, especially in polymer thin film investigation.

Nanoscale simultaneous chemical and mechanical imaging via peak force infrared microscopy

Nondestructive chemical and mechanical measurements of materials with ~10-nm spatial resolution together with topography provide rich information on the compositions and organizations of heterogeneous materials and nanoscale objects. However, multimodal nanoscale correlations are difficult to achieve because of the limitation on spatial resolution of optical microscopy and constraints from instrumental complexities. We report a novel noninvasive spectroscopic scanning probe microscopy method-peak force infrared (PFIR) microscopy-that allows chemical imaging, collection of broadband infrared spectra, and mechanical mapping at a spatial resolution of 10 nm. In our technique, chemical absorption information is directly encoded in the withdraw curve of the peak force tapping cycle after illumination with synchronized infrared laser pulses in a simple apparatus. Nanoscale phase separation in block copolymers and inhomogeneity in CH₃NH₃PbBr₃ perovskite crystals are studied with correlative infrared/mechanical nanoimaging. Furthermore, we show that the PFIR method is sensitive to the presence of surface phonon polaritons in boron nitride nanotubes. PFIR microscopy will provide a powerful analytical tool for explorations at the nanoscale across wide disciplines.

A Complementary Metal Oxide Semiconductor Process-Compatible Ferroelectric Tunnel Junction

In recent years, experimental demonstration of ferroelectric tunnel junctions (FTJ) based on perovskite tunnel barriers has been reported. However, integrating these perovskite materials into conventional silicon memory technology remains challenging due to their lack of compatibility with the complementary metal oxide semiconductor process (CMOS). This communication reports the fabrication of an FTJ based on a CMOS-compatible tunnel barrier Hf_0.5Zr_0.5O₂ (6 unit cells thick) on an equally CMOS-compatible TiN electrode. Analysis of the FTJ by grazing angle incidence X-ray diffraction confirmed the formation of the noncentrosymmetric orthorhombic phase (Pbc2₁, ferroelectric phase). The FTJ characterization is followed by the reconstruction of the electrostatic potential profile in the as-grown TiN/Hf_0.5Zr_0.5O₂/Pt heterostructure. A direct tunneling current model across a trapezoidal barrier was used to correlate the electronic and electrical properties of our FTJ devices. The good agreement between the experimental and theoretical model attests to the tunneling electroresistance effect (TER) in our FTJ device. A TER ratio of ∼15 was calculated for the present FTJ device at low read voltage (+0.2 V). This study suggests that Hf_0.5Zr_0.5O₂ is a promising candidate for integration into conventional Si memory technology.

Determination of Elemental Ratio in an Atomic Column by Electron Energy Loss Spectroscopy

Atomic-resolution quantification of the elemental ratio of Fe to Mn at the octahedral and tetrahedral sites in brownmillerite Ca2Fe1.07Mn0.93O5 was determined using electron energy-loss spectroscopy combined with aberration-corrected scanning transmission electron microscopy. The combined techniques revealed that oversampling of the spectral imaging data yielded a spatially resolved area that very nearly reflects atomic resolution (∼1.2 Å radius). The average experimental ratios of Fe to Mn within this region were 17.5:82.5 for the octahedral sites and 81.6:18.4 for the tetrahedral sites. The elemental ratio in an octahedral atomic column was successfully extracted by estimating the mixing of signals from nearest neighbor columns. The results indicated that the ratio of Fe to Mn was 13:87 at the octahedral site, which is in good agreement with the results of neutron diffraction analysis. In addition, the uncertainty of experimental results obtained by using an average 1.2 Å radius was less than 10% at octahedral sites, depending on the sample thickness. In contrast, the experimental error due to dechanneling of incident electrons was larger at the tetrahedral sites. This experimental procedure has wide application for determining the spatially resolved composition ratio of elements in perovskite-like compounds.