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For: Krivanek OL, Dellby N, Murfitt MF, Chisholm MF, Pennycook TJ, Suenaga K, Nicolosi V. Gentle STEM: ADF imaging and EELS at low primary energies. Ultramicroscopy 2010. [DOI: 10.1016/j.ultramic.2010.02.007] [Citation(s) in RCA: 156] [Impact Index Per Article: 11.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/16/2022]
Number Cited by Other Article(s)
1
Ishida Y. Atomic-Scale Imaging of Clay Mineral Nanosheets and Their Supramolecular Complexes through Electron Microscopy: A Supramolecular Chemist's Perspective. LANGMUIR : THE ACS JOURNAL OF SURFACES AND COLLOIDS 2024;40:6065-6076. [PMID: 38484331 DOI: 10.1021/acs.langmuir.3c03779] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 03/27/2024]
2
Dellby N, Quillin SC, Krivanek OL, Hrncirik P, Mittelberger A, Plotkin-Swing B, Lovejoy TC. Ultra-high Resolution EELS Analysis and STEM Imaging at 20 keV. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2023;29:626-627. [PMID: 37613322 DOI: 10.1093/micmic/ozad067.305] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 08/25/2023]
3
Dyck O, Lupini AR, Jesse S. Atom-by-Atom Direct Writing. NANO LETTERS 2023;23:2339-2346. [PMID: 36877825 DOI: 10.1021/acs.nanolett.3c00114] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/18/2023]
4
Mendis BG, Talmantaite A. Towards Electron Energy Loss Compton Spectra Free From Dynamical Diffraction Artifacts. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2022;28:1-10. [PMID: 36062365 DOI: 10.1017/s1431927622012223] [Citation(s) in RCA: 4] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/15/2023]
5
Keene JD, Freymeyer NJ, McBride JR, Rosenthal SJ. Ultrafast spectroscopy studies of carrier dynamics in semiconductor nanocrystals. iScience 2022;25:103831. [PMID: 35198890 PMCID: PMC8844678 DOI: 10.1016/j.isci.2022.103831] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/22/2022]  Open
6
Liu JJ. Advances and Applications of Atomic-Resolution Scanning Transmission Electron Microscopy. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2021;27:1-53. [PMID: 34414878 DOI: 10.1017/s1431927621012125] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/13/2023]
7
Giannazzo F, Dagher R, Schilirò E, Panasci SE, Greco G, Nicotra G, Roccaforte F, Agnello S, Brault J, Cordier Y, Michon A. Nanoscale structural and electrical properties of graphene grown on AlGaN by catalyst-free chemical vapor deposition. NANOTECHNOLOGY 2021;32:015705. [PMID: 33043906 DOI: 10.1088/1361-6528/abb72b] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
8
Ilett M, S'ari M, Freeman H, Aslam Z, Koniuch N, Afzali M, Cattle J, Hooley R, Roncal-Herrero T, Collins SM, Hondow N, Brown A, Brydson R. Analysis of complex, beam-sensitive materials by transmission electron microscopy and associated techniques. PHILOSOPHICAL TRANSACTIONS. SERIES A, MATHEMATICAL, PHYSICAL, AND ENGINEERING SCIENCES 2020;378:20190601. [PMID: 33100161 PMCID: PMC7661278 DOI: 10.1098/rsta.2019.0601] [Citation(s) in RCA: 13] [Impact Index Per Article: 3.3] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Accepted: 06/12/2020] [Indexed: 06/11/2023]
9
Boniface M, Plodinec M, Schlögl R, Lunkenbein T. Quo Vadis Micro-Electro-Mechanical Systems for the Study of Heterogeneous Catalysts Inside the Electron Microscope? Top Catal 2020. [DOI: 10.1007/s11244-020-01398-6] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/26/2022]
10
Guan E, Ciston J, Bare SR, Runnebaum RC, Katz A, Kulkarni A, Kronawitter CX, Gates BC. Supported Metal Pair-Site Catalysts. ACS Catal 2020. [DOI: 10.1021/acscatal.0c02000] [Citation(s) in RCA: 40] [Impact Index Per Article: 10.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/26/2022]
11
Latychevskaia T, Escher C, Fink HW. Moiré structures in twisted bilayer graphene studied by transmission electron microscopy. Ultramicroscopy 2019;197:46-52. [DOI: 10.1016/j.ultramic.2018.11.009] [Citation(s) in RCA: 14] [Impact Index Per Article: 2.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/26/2018] [Revised: 11/19/2018] [Accepted: 11/21/2018] [Indexed: 10/27/2022]
12
Yamashita S, Kikkawa J, Yanagisawa K, Nagai T, Ishizuka K, Kimoto K. Atomic number dependence of Z contrast in scanning transmission electron microscopy. Sci Rep 2018;8:12325. [PMID: 30120323 PMCID: PMC6098135 DOI: 10.1038/s41598-018-30941-5] [Citation(s) in RCA: 39] [Impact Index Per Article: 6.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/08/2018] [Accepted: 08/08/2018] [Indexed: 11/12/2022]  Open
13
Tripathi M, Markevich A, Böttger R, Facsko S, Besley E, Kotakoski J, Susi T. Implanting Germanium into Graphene. ACS NANO 2018;12:4641-4647. [PMID: 29727567 DOI: 10.1021/acsnano.8b01191] [Citation(s) in RCA: 36] [Impact Index Per Article: 6.0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/08/2023]
14
Mittelberger A, Kramberger C, Meyer JC. Software electron counting for low-dose scanning transmission electron microscopy. Ultramicroscopy 2018;188:1-7. [DOI: 10.1016/j.ultramic.2018.02.005] [Citation(s) in RCA: 12] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/15/2017] [Revised: 01/17/2018] [Accepted: 02/16/2018] [Indexed: 11/25/2022]
15
Getting the most out of a post-column EELS spectrometer on a TEM/STEM by optimising the optical coupling. Ultramicroscopy 2017;180:66-80. [DOI: 10.1016/j.ultramic.2017.03.017] [Citation(s) in RCA: 15] [Impact Index Per Article: 2.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/16/2016] [Revised: 03/01/2017] [Accepted: 03/14/2017] [Indexed: 11/23/2022]
16
Single-atom detection of light elements: Imaging or spectroscopy? Ultramicroscopy 2017;180:150-155. [DOI: 10.1016/j.ultramic.2016.12.007] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/05/2016] [Revised: 11/17/2016] [Accepted: 12/08/2016] [Indexed: 11/22/2022]
17
The impact of STEM aberration correction on materials science. Ultramicroscopy 2017;180:22-33. [DOI: 10.1016/j.ultramic.2017.03.020] [Citation(s) in RCA: 45] [Impact Index Per Article: 6.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/12/2016] [Revised: 03/04/2017] [Accepted: 03/16/2017] [Indexed: 11/22/2022]
18
Ramasse QM. Twenty years after: How “Aberration correction in the STEM” truly placed a “A synchrotron in a Microscope”. Ultramicroscopy 2017;180:41-51. [DOI: 10.1016/j.ultramic.2017.03.016] [Citation(s) in RCA: 12] [Impact Index Per Article: 1.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/31/2016] [Revised: 03/06/2017] [Accepted: 03/14/2017] [Indexed: 10/19/2022]
19
Susi T, Meyer JC, Kotakoski J. Manipulating low-dimensional materials down to the level of single atoms with electron irradiation. Ultramicroscopy 2017;180:163-172. [DOI: 10.1016/j.ultramic.2017.03.005] [Citation(s) in RCA: 92] [Impact Index Per Article: 13.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/30/2016] [Revised: 02/24/2017] [Accepted: 03/01/2017] [Indexed: 10/20/2022]
20
Idrobo JC, Zhou W. A short story of imaging and spectroscopy of two-dimensional materials by scanning transmission electron microscopy. Ultramicroscopy 2017;180:156-162. [DOI: 10.1016/j.ultramic.2017.02.002] [Citation(s) in RCA: 9] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/31/2016] [Revised: 02/13/2017] [Accepted: 02/18/2017] [Indexed: 11/29/2022]
21
Simulation in elemental mapping using aberration-corrected electron microscopy. Ultramicroscopy 2017;180:142-149. [PMID: 28314556 DOI: 10.1016/j.ultramic.2017.03.001] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/30/2016] [Revised: 02/24/2017] [Accepted: 03/01/2017] [Indexed: 11/21/2022]
22
Kisielowski C, Frei H, Specht P, Sharp ID, Haber JA, Helveg S. Detecting structural variances of Co3O4 catalysts by controlling beam-induced sample alterations in the vacuum of a transmission electron microscope. ACTA ACUST UNITED AC 2016;2:13. [PMID: 27867836 PMCID: PMC5093192 DOI: 10.1186/s40679-016-0027-9] [Citation(s) in RCA: 14] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/25/2016] [Accepted: 10/19/2016] [Indexed: 11/15/2022]
23
Jesse S, Borisevich AY, Fowlkes JD, Lupini AR, Rack PD, Unocic RR, Sumpter BG, Kalinin SV, Belianinov A, Ovchinnikova OS. Directing Matter: Toward Atomic-Scale 3D Nanofabrication. ACS NANO 2016;10:5600-18. [PMID: 27183171 DOI: 10.1021/acsnano.6b02489] [Citation(s) in RCA: 25] [Impact Index Per Article: 3.1] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/19/2023]
24
Su YF, Park JG, Koo A, Trayner S, Hao A, Downes R, Liang R. Characterization at Atomic Resolution of Carbon Nanotube/Resin Interface in Nanocomposites by Mapping sp 2-Bonding States Using Electron Energy-Loss Spectroscopy. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2016;22:666-672. [PMID: 27329314 DOI: 10.1017/s1431927616000805] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/06/2023]
25
Koshiya S, Yamashita S, Kimoto K. Microscopic observation of dye molecules for solar cells on a titania surface. Sci Rep 2016;6:24616. [PMID: 27087005 PMCID: PMC4834531 DOI: 10.1038/srep24616] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/19/2015] [Accepted: 03/21/2016] [Indexed: 01/16/2023]  Open
26
Tizei LH, Iizumi Y, Okazaki T, Nakanishi R, Kitaura R, Shinohara H, Suenaga K. Single atom spectroscopy: Decreased scattering delocalization at high energy losses, effects of atomic movement and X-ray fluorescence yield. Ultramicroscopy 2016;160:239-246. [DOI: 10.1016/j.ultramic.2015.10.019] [Citation(s) in RCA: 9] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/06/2015] [Revised: 10/11/2015] [Accepted: 10/18/2015] [Indexed: 10/22/2022]
27
Kirkland EJ. Computation in electron microscopy. ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES 2016;72:1-27. [DOI: 10.1107/s205327331501757x] [Citation(s) in RCA: 26] [Impact Index Per Article: 3.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/09/2015] [Accepted: 09/19/2015] [Indexed: 11/11/2022]
28
Critical conditions for atomic resolution imaging of molecular crystals by aberration-corrected HRTEM. Ultramicroscopy 2015;159 Pt 1:73-80. [DOI: 10.1016/j.ultramic.2015.08.006] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/09/2015] [Revised: 07/22/2015] [Accepted: 08/23/2015] [Indexed: 11/24/2022]
29
Kepaptsoglou D, Hardcastle TP, Seabourne CR, Bangert U, Zan R, Amani JA, Hofsäss H, Nicholls RJ, Brydson RMD, Scott AJ, Ramasse QM. Electronic Structure Modification of Ion Implanted Graphene: The Spectroscopic Signatures of p- and n-Type Doping. ACS NANO 2015;9:11398-11407. [PMID: 26446310 DOI: 10.1021/acsnano.5b05305] [Citation(s) in RCA: 32] [Impact Index Per Article: 3.6] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/05/2023]
30
Li J, Menguy N, Gatel C, Boureau V, Snoeck E, Patriarche G, Leroy E, Pan Y. Crystal growth of bullet-shaped magnetite in magnetotactic bacteria of the Nitrospirae phylum. J R Soc Interface 2015;12:rsif.2014.1288. [PMID: 25566884 DOI: 10.1098/rsif.2014.1288] [Citation(s) in RCA: 44] [Impact Index Per Article: 4.9] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/12/2022]  Open
31
KRIVANEK O, LOVEJOY T, DELLBY N. Aberration-corrected STEM for atomic-resolution imaging and analysis. J Microsc 2015;259:165-72. [DOI: 10.1111/jmi.12254] [Citation(s) in RCA: 13] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/07/2014] [Accepted: 03/22/2015] [Indexed: 11/29/2022]
32
Ilari GM, Hage FS, Zhang Y, Rossell MD, Ramasse QM, Niederberger M, Erni R. Carbon–metal interfaces analyzed by aberration-corrected TEM: How copper and nickel nanoparticles interact with MWCNTs. Micron 2015;72:52-8. [DOI: 10.1016/j.micron.2015.03.004] [Citation(s) in RCA: 13] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/02/2015] [Revised: 03/09/2015] [Accepted: 03/09/2015] [Indexed: 11/17/2022]
33
The correction of electron lens aberrations. Ultramicroscopy 2015;156:A1-64. [PMID: 26025209 DOI: 10.1016/j.ultramic.2015.03.007] [Citation(s) in RCA: 61] [Impact Index Per Article: 6.8] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/10/2014] [Revised: 03/07/2015] [Accepted: 03/12/2015] [Indexed: 11/23/2022]
34
Su DS, Zhang B, Schlögl R. Electron microscopy of solid catalysts--transforming from a challenge to a toolbox. Chem Rev 2015;115:2818-82. [PMID: 25826447 DOI: 10.1021/cr500084c] [Citation(s) in RCA: 142] [Impact Index Per Article: 15.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 02/08/2023]
35
Guttmann P, Bittencourt C. Overview of nanoscale NEXAFS performed with soft X-ray microscopes. BEILSTEIN JOURNAL OF NANOTECHNOLOGY 2015;6:595-604. [PMID: 25821700 PMCID: PMC4362056 DOI: 10.3762/bjnano.6.61] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/09/2014] [Accepted: 02/05/2015] [Indexed: 05/28/2023]
36
Bachmatiuk A, Zhao J, Gorantla SM, Martinez IGG, Wiedermann J, Lee C, Eckert J, Rummeli MH. Low voltage transmission electron microscopy of graphene. SMALL (WEINHEIM AN DER BERGSTRASSE, GERMANY) 2015;11:515-42. [PMID: 25408379 DOI: 10.1002/smll.201401804] [Citation(s) in RCA: 30] [Impact Index Per Article: 3.3] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/20/2014] [Revised: 08/27/2014] [Indexed: 05/27/2023]
37
Atomic scale dynamics of a solid state chemical reaction directly determined by annular dark-field electron microscopy. Sci Rep 2014;4:7555. [PMID: 25532123 PMCID: PMC4273600 DOI: 10.1038/srep07555] [Citation(s) in RCA: 19] [Impact Index Per Article: 1.9] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/11/2014] [Accepted: 11/07/2014] [Indexed: 11/08/2022]  Open
38
Gontard LC, Fernández A, Dunin-Borkowski RE, Kasama T, Lozano-Pérez S, Lucas S. Transmission electron microscopy of unstained hybrid Au nanoparticles capped with PPAA (plasma-poly-allylamine): Structure and electron irradiation effects. Micron 2014;67:1-9. [DOI: 10.1016/j.micron.2014.06.004] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/12/2014] [Revised: 06/11/2014] [Accepted: 06/12/2014] [Indexed: 10/25/2022]
39
Harris PJF, Slater TJA, Haigh SJ, Hage FS, Kepaptsoglou DM, Ramasse QM, Brydson R. Bilayer graphene formed by passage of current through graphite: evidence for a three-dimensional structure. NANOTECHNOLOGY 2014;25:465601. [PMID: 25354780 DOI: 10.1088/0957-4484/25/46/465601] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/04/2023]
40
Senga R, Komsa HP, Liu Z, Hirose-Takai K, Krasheninnikov AV, Suenaga K. Atomic structure and dynamic behaviour of truly one-dimensional ionic chains inside carbon nanotubes. NATURE MATERIALS 2014;13:1050-4. [PMID: 25218060 DOI: 10.1038/nmat4069] [Citation(s) in RCA: 47] [Impact Index Per Article: 4.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/24/2014] [Accepted: 07/28/2014] [Indexed: 05/28/2023]
41
Tizei LHG, Liu Z, Koshino M, Iizumi Y, Okazaki T, Suenaga K. Single molecular spectroscopy: identification of individual fullerene molecules. PHYSICAL REVIEW LETTERS 2014;113:185502. [PMID: 25396379 DOI: 10.1103/physrevlett.113.185502] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/11/2014] [Indexed: 06/04/2023]
42
Arenal R, March K, Ewels CP, Rocquefelte X, Kociak M, Loiseau A, Stéphan O. Atomic configuration of nitrogen-doped single-walled carbon nanotubes. NANO LETTERS 2014;14:5509-16. [PMID: 25157857 DOI: 10.1021/nl501645g] [Citation(s) in RCA: 31] [Impact Index Per Article: 3.1] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/20/2023]
43
Fluid-induced organic synthesis in the solar nebula recorded in extraterrestrial dust from meteorites. Proc Natl Acad Sci U S A 2014;111:15338-43. [PMID: 25288736 DOI: 10.1073/pnas.1408206111] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/18/2022]  Open
44
Sasaki T, Sawada H, Hosokawa F, Sato Y, Suenaga K. Aberration-corrected STEM/TEM imaging at 15 kV. Ultramicroscopy 2014;145:50-5. [DOI: 10.1016/j.ultramic.2014.04.006] [Citation(s) in RCA: 37] [Impact Index Per Article: 3.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/01/2013] [Revised: 04/01/2014] [Accepted: 04/14/2014] [Indexed: 11/17/2022]
45
Lee Z, Rose H, Lehtinen O, Biskupek J, Kaiser U. Electron dose dependence of signal-to-noise ratio, atom contrast and resolution in transmission electron microscope images. Ultramicroscopy 2014;145:3-12. [DOI: 10.1016/j.ultramic.2014.01.010] [Citation(s) in RCA: 17] [Impact Index Per Article: 1.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/30/2013] [Revised: 12/23/2013] [Accepted: 01/27/2014] [Indexed: 10/25/2022]
46
Bell DC, Mankin M, Day RW, Erdman N. Successful application of Low Voltage Electron Microscopy to practical materials problems. Ultramicroscopy 2014;145:56-65. [DOI: 10.1016/j.ultramic.2014.03.005] [Citation(s) in RCA: 24] [Impact Index Per Article: 2.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/30/2013] [Revised: 02/25/2014] [Accepted: 03/08/2014] [Indexed: 11/17/2022]
47
A short note on how to convert a conventional analytical TEM into an analytical Low Voltage TEM. Ultramicroscopy 2014;145:94-7. [DOI: 10.1016/j.ultramic.2014.01.008] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/20/2013] [Revised: 11/29/2013] [Accepted: 01/10/2014] [Indexed: 11/19/2022]
48
Egerton R. Choice of operating voltage for a transmission electron microscope. Ultramicroscopy 2014;145:85-93. [DOI: 10.1016/j.ultramic.2013.10.019] [Citation(s) in RCA: 77] [Impact Index Per Article: 7.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/27/2013] [Revised: 10/14/2013] [Accepted: 10/24/2013] [Indexed: 10/25/2022]
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Low voltage EELS—How low? Ultramicroscopy 2014;145:98-104. [DOI: 10.1016/j.ultramic.2013.07.004] [Citation(s) in RCA: 10] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/12/2013] [Revised: 06/26/2013] [Accepted: 07/01/2013] [Indexed: 11/23/2022]
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Kaiser U, Stöger-Pollach M. Foreword to the special issue low-voltage electron microscopy. Ultramicroscopy 2014;145:1-2. [PMID: 24907889 DOI: 10.1016/j.ultramic.2014.05.002] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/02/2014] [Accepted: 05/05/2014] [Indexed: 10/25/2022]
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