Diffractive X-ray Waveguiding Reveals Orthogonal Crystalline Stratification in Conjugated Polymer Thin Films

Correlation of Broad Absorption Band with Small Singlet-Triplet Energy Gap in Organic Photovoltaics

Organic photovoltaics (OPV) are one of the most effective ways to harvest renewable solar energy, with the power conversion efficiency (PCE) of the devices soaring above 19 % when processed with halogenated solvents. The superior photocurrent of OPV over other emerging photovoltaics offers more opportunities to further improve the efficiency. Tailoring the absorption band of photoactive materials is an effective way to further enhance OPV photocurrent. However, the field has mostly been focusing on improving the near-infrared region photo-response, with the absorption shoulders in short-wavelength region (SWR) usually being neglected. Herein, by developing a series of non-fullerene acceptors (NFAs) with varied side-group conjugations, we observe an enhanced SWR absorption band with increased side-group conjugation length. The underpinning factors of how molecular structures and geometries improve SWR absorption are clearly elucidated through theoretical modelling and crystallography. Moreover, a clear relationship between the enhanced SWR absorption and reduced singlet-triplet energy gap is established, both of which are favorable for the OPV performance and can be tailored by rational structure design of NFAs. Finally, the rationally designed NFA, BO-TTBr, affords a decent PCE of 18.5 % when processed with a non-halogenated green solvent.

Foundry-compatible high-resolution patterning of vertically phase-separated semiconducting films for ultraflexible organic electronics

Solution processability of polymer semiconductors becomes an unfavorable factor during the fabrication of pixelated films since the underlying layer is vulnerable to subsequent solvent exposure. A foundry-compatible patterning process must meet requirements including high-throughput and high-resolution patternability, broad generality, ambient processability, environmentally benign solvents, and, minimal device performance degradation. However, known methodologies can only meet very few of these requirements. Here, a facile photolithographic approach is demonstrated for foundry-compatible high-resolution patterning of known p- and n-type semiconducting polymers. This process involves crosslinking a vertically phase-separated blend of the semiconducting polymer and a UV photocurable additive, and enables ambient processable photopatterning at resolutions as high as 0.5 μm in only three steps with environmentally benign solvents. The patterned semiconducting films can be integrated into thin-film transistors having excellent transport characteristics, low off-currents, and high thermal (up to 175 °C) and chemical (24 h immersion in chloroform) stability. Moreover, these patterned organic structures can also be integrated on 1.5 μm-thick parylene substrates to yield highly flexible (1 mm radius) and mechanically robust (5,000 bending cycles) thin-film transistors.

Though shape-changing devices are promising for future haptic displays, existing designs fail to provide smooth surfaces for the user during tactile exploration. Here, the authors utilize flexible auxetic structures to realize shape displays with smooth surfaces and different Gaussian curvatures.

Probing morphology and chemistry in complex soft materials within situresonant soft x-ray scattering

Small angle scattering methodologies have been evolving at fast pace over the past few decades due to the ever-increasing demands for more details on the complex nanostructures of multiphase and multicomponent soft materials like polymer assemblies and biomaterials. Currently, element-specific and contrast variation techniques such as resonant (elastic) soft/tender x-ray scattering, anomalous small angle x-ray scattering, and contrast-matching small angle neutron scattering, or combinations of above are routinely used to extract the chemical composition and spatial arrangement of constituent elements at multiple length scales and examine electronic ordering phenomena. Here we present some recent advances in selectively characterizing structural architectures of complex soft materials, which often contain multi-components with a wide range of length scales and multiple functionalities, where novel resonant scattering approaches have been demonstrated to decipher a higher level of structural complexity that correlates to functionality. With the advancement of machine learning and artificial intelligence assisted correlative analysis, high-throughput and autonomous experiments would open a new paradigm of material research. Further development of resonant x-ray scattering instrumentation with crossplatform sample environments will enable multimodalin situ/operando characterization of the system dynamics with much improved spatial and temporal resolution.

Charge transport physics of a unique class of rigid-rod conjugated polymers with fused-ring conjugated units linked by double carbon-carbon bonds

We investigate the charge transport physics of a previously unidentified class of electron-deficient conjugated polymers that do not contain any single bonds linking monomer units along the backbone but only double-bond linkages. Such polymers would be expected to behave as rigid rods, but little is known about their actual chain conformations and electronic structure. Here, we present a detailed study of the structural and charge transport properties of a family of four such polymers. By adopting a copolymer design, we achieve high electron mobilities up to 0.5 cm2 V-1 s-1 Field-induced electron spin resonance measurements of charge dynamics provide evidence for relatively slow hopping over, however, long distances. Our work provides important insights into the factors that limit charge transport in this unique class of polymers and allows us to identify molecular design strategies for achieving even higher levels of performance.

Electric-field-intensity-modulated scattering as a thin-film depth probe

Grazing-incidence X-ray scattering is a common technique to elucidate nanostructural information for thin-film samples, but depth-resolving this nanostructure is difficult using a single or few images. An in situ method to extract film thickness, the index of refraction and depth information using scattering images taken across a range of incident angles is presented here. The technique is described within the multilayer distorted-wave Born approximation and validated using two sets of polymer thin films. Angular divergence and energy resolution effects are considered, and implementation of the technique as a general beamline procedure is discussed. Electric-field-intensity-modulated scattering is a general technique applicable to myriad materials and enables the acquisition of depth-sensitive information in situ at any grazing-incidence-capable beamline.

GIWAXS-SIIRkit: scattering intensity, indexing and refraction calculation toolkit for grazing-incidence wide-angle X-ray scattering of organic materials

Grazing-incidence wide-angle X-ray scattering (GIWAXS) has become an increasingly popular technique for quantitative structural characterization and comparison of thin films. For this purpose, accurate intensity normalization and peak position determination are crucial. At present, few tools exist to estimate the uncertainties of these measurements. Here, a simulation package is introduced called GIWAXS-SIIRkit, where SIIR stands for scattering intensity, indexing and refraction. The package contains several tools that are freely available for download and can be executed in MATLAB. The package includes three functionalities: estimation of the relative scattering intensity and the corresponding uncertainty based on experimental setup and sample dimensions; extraction and indexing of peak positions to approximate the crystal structure of organic materials starting from calibrated GIWAXS patterns; and analysis of the effects of refraction on peak positions. Each tool is based on a graphical user interface and designed to have a short learning curve. A user guide is provided with detailed usage instruction, tips for adding functionality and customization, and exemplary files.

Effect of Backbone Sequence of a Naphthalene Diimide-Based Copolymer on Performance in n-Type Organic Thin-Film Transistors

We report two newly synthesized naphthalene diimide (NDI)-based conjugated polymers, poly[(E)-2,7-bis(2-decyltetradecyl)benzo[lmn][3,8]phenanthroline-1,3,6,8(2H,7H)-tetraone-vinylene-thiophene-vinylene] (PNDI-VTV) and poly[(E)-2,7-bis(2-decyltetradecyl)benzo[lmn][3,8]phenanthroline-1,3,6,8(2H,7H)-tetraone-vinylene-selenophene-vinylene] (PNDI-VSV) with different donor units as electron-transporting organic semiconductors for organic field-effect transistors (OFETs). Furthermore, we study the effect of vinylene position on electron transport in the NDI polymers by using two similar polymers but with thiophene-vinylene-thiophene (PNDI-TVT) instead of vinylene-thiophene-vinylene or selenophene-vinylene-selenophene (PNDI-SVS) instead of vinylene-selenophene-vinylene. By incorporating vinylene between thiophene (or selenophene) units, the resulting NDI-based polymers PNDI-VTV and PNDI-VSV show larger backbone planarity than PNDI-TVT and PNDI-SVS. The polymers with a shorter acceptor monomer unit (PNDI-VTV and PNDI-VSV) show a strong face-on orientation, whereas those with a longer monomer unit (PNDI-TVT and SVS) exhibit a mixed face-on and edge-on orientation by two-dimensional grazing incidence X-ray diffraction. Optimized PNDI-VTV and PNDI-VSV OFETs exhibit electron mobilities of 0.043 and 0.7 cm²/(V·s), which is quite lower than those of PNDI-TVT and PNDI-SVS. In addition, the activation energies for electron transport of PNDI-VTV and PNDI-VSV were larger than those of PNDI-TVT and PNDI-SVS. Overall, this research provides the insight that the molecular alignment on the substrate can be controlled by the sequence of rigid acceptor monomer molecules for improving the electron transport of NDI polymers.