1
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Review of Fe-based spin crossover metal complexes in multiscale device architectures. Inorganica Chim Acta 2023. [DOI: 10.1016/j.ica.2022.121168] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/22/2022]
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2
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Ge L, Hou S, Chen Y, Wu Q, Long L, Yang X, Ji Y, Lin L, Xue G, Liu J, Liu X, Lambert CJ, Hong W, Zheng Y. Hydrogen-bond-induced quantum interference in single-molecule junctions of regioisomers. Chem Sci 2022; 13:9552-9559. [PMID: 36091890 PMCID: PMC9400588 DOI: 10.1039/d2sc03229e] [Citation(s) in RCA: 7] [Impact Index Per Article: 3.5] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/09/2022] [Accepted: 08/02/2022] [Indexed: 11/21/2022] Open
Abstract
Solvents can play a significant role in tuning the electrical conductance of single-molecule junctions. In this respect, protic solvents offer the potential to form hydrogen bonds with molecular backbones and induce electrostatic gating via their dipole moments. Here we demonstrate that the effect of hydrogen bond formation on conductance depends on whether transport through the junction is controlled by destructive quantum interference (DQI) or constructive quantum interference (CQI). Furthermore, we show that a protic solvent can be used to switch the conductance of single-molecule junctions between the two forms of quantum interference. To explore this possibility, two regioisomers (BIT-Zwitterion and BIT-Neutral) were synthesized and their single-molecule conductances in aprotic and protic solvents were investigated using a scanning-tunneling-microscope-based break junction technique, combined with density functional theory and quantum transport theory. We find that the protic solvent twists the geometry of BIT-Zwitterion by introducing intermolecular hydrogen bonds between the solvent and target molecule. Moreover, it increases the energy gap between the highest occupied molecular orbital (HOMO) and the lowest unoccupied molecular orbital (LUMO) of the molecule by imposing different electrostatic gating on the delocalized HOMO and localized LUMO, leading to a lower conductance compared to that in aprotic solvent. In contrast, the conductance of BIT-Neutral increases due to a transformation from DQI to CQI originating from a change from a planar to a folded conformation in the protic solvent. In addition, the stacking between the two folded moieties produces an extra through-space transport path, which further contributes to conductance. This study demonstrates that combinations of protic solvents and regioisomers present a versatile route to controlling quantum interference and therefore single-molecule conductance, by enabling control of hydrogen bond formation, electrostatic gating and through-space transport.
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Affiliation(s)
- Lingbing Ge
- School of Optoelectronic Science and Engineering, University of Electronic Science and Technology of China (UESTC) Chengdu 610054 People's Republic of China
| | - Songjun Hou
- Department of Physics, Lancaster University Lancaster LA1 4YB UK
| | - Yaorong Chen
- State Key Laboratory of Physical Chemistry of Solid Surfaces, College of Chemistry and Chemical Engineering, Xiamen University Xiamen 361005 People's Republic of China
| | - Qingqing Wu
- Department of Physics, Lancaster University Lancaster LA1 4YB UK
| | - Lanxin Long
- School of Optoelectronic Science and Engineering, University of Electronic Science and Technology of China (UESTC) Chengdu 610054 People's Republic of China
| | - Xingzhou Yang
- School of Optoelectronic Science and Engineering, University of Electronic Science and Technology of China (UESTC) Chengdu 610054 People's Republic of China
| | - Yu Ji
- School of Optoelectronic Science and Engineering, University of Electronic Science and Technology of China (UESTC) Chengdu 610054 People's Republic of China
| | - Luchun Lin
- State Key Laboratory of Physical Chemistry of Solid Surfaces, College of Chemistry and Chemical Engineering, Xiamen University Xiamen 361005 People's Republic of China
| | - Guodong Xue
- School of Optoelectronic Science and Engineering, University of Electronic Science and Technology of China (UESTC) Chengdu 610054 People's Republic of China
| | - Junyang Liu
- State Key Laboratory of Physical Chemistry of Solid Surfaces, College of Chemistry and Chemical Engineering, Xiamen University Xiamen 361005 People's Republic of China
| | - Xiaodong Liu
- School of Optoelectronic Science and Engineering, University of Electronic Science and Technology of China (UESTC) Chengdu 610054 People's Republic of China
| | - Colin J Lambert
- Department of Physics, Lancaster University Lancaster LA1 4YB UK
| | - Wenjing Hong
- State Key Laboratory of Physical Chemistry of Solid Surfaces, College of Chemistry and Chemical Engineering, Xiamen University Xiamen 361005 People's Republic of China
| | - Yonghao Zheng
- School of Optoelectronic Science and Engineering, University of Electronic Science and Technology of China (UESTC) Chengdu 610054 People's Republic of China
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3
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Lee JW, Kim J, Eom K, Jeon J, Kim YC, Kim HS, Ahn YH, Kim S, Eom CB, Lee H. Strong Interfacial Charge Trapping in Ultrathin SrRuO 3 on SrTiO 3 Probed by Noise Spectroscopy. J Phys Chem Lett 2022; 13:5618-5625. [PMID: 35704419 DOI: 10.1021/acs.jpclett.2c01163] [Citation(s) in RCA: 3] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 06/15/2023]
Abstract
SrRuO3 (SRO) has emerged as a promising quantum material due to its exotic electron correlations and topological properties. In epitaxial SRO films, electron scattering against lattice phonons or defects has been considered as only a predominant mechanism accounting for electronic properties. Although the charge trapping by polar defects can also strongly influence the electronic behavior, it has often been neglected. Herein, we report strong interfacial charge trapping in ultrathin SRO films on SrTiO3 (STO) substrates probed by noise spectroscopy. We find that oxygen vacancies in the STO cause stochastic interfacial charge trapping, resulting in high electrical noise. Spectral analyses of the photoinduced noise prove that the oxygen vacancies buried deep in the STO can effectively contribute to the charge trapping process. These results unambiguously reveal that electron transport in ultrathin SRO films is dominated by the carrier number fluctuation that correlates with interfacial charge trapping.
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Affiliation(s)
- Jung-Woo Lee
- KIURI Institute, Yonsei University, Seoul 03722, Republic of Korea
| | - Jiyeong Kim
- Department of Physics, Ajou University, Suwon 16499, Republic of Korea
| | - Kitae Eom
- Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706, United States
| | - Jaeyoung Jeon
- Department of Physics, Ajou University, Suwon 16499, Republic of Korea
- Department of Energy Systems Research, Ajou University, Suwon 16499, Republic of Korea
| | - Young Chul Kim
- Department of Physics, Ajou University, Suwon 16499, Republic of Korea
- Department of Energy Systems Research, Ajou University, Suwon 16499, Republic of Korea
| | - Hwan Sik Kim
- Department of Physics, Ajou University, Suwon 16499, Republic of Korea
- Department of Energy Systems Research, Ajou University, Suwon 16499, Republic of Korea
| | - Yeong Hwan Ahn
- Department of Physics, Ajou University, Suwon 16499, Republic of Korea
- Department of Energy Systems Research, Ajou University, Suwon 16499, Republic of Korea
| | - Sungkyu Kim
- Department of Nanotechnology and Advanced Materials Engineering, Sejong University, Seoul 05006, Republic of Korea
| | - Chang-Beom Eom
- Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706, United States
| | - Hyungwoo Lee
- Department of Physics, Ajou University, Suwon 16499, Republic of Korea
- Department of Energy Systems Research, Ajou University, Suwon 16499, Republic of Korea
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4
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Shein-Lumbroso O, Liu J, Shastry A, Segal D, Tal O. Quantum Flicker Noise in Atomic and Molecular Junctions. PHYSICAL REVIEW LETTERS 2022; 128:237701. [PMID: 35749205 DOI: 10.1103/physrevlett.128.237701] [Citation(s) in RCA: 3] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/25/2021] [Accepted: 05/02/2022] [Indexed: 06/15/2023]
Abstract
We report on a quantum form of electronic flicker noise in nanoscale conductors that contains valuable information on quantum transport. This noise is experimentally identified in atomic and molecular junctions and theoretically analyzed by considering quantum interference due to fluctuating scatterers. Using conductance, shot-noise, and flicker-noise measurements, we show that the revealed quantum flicker noise uniquely depends on the distribution of transmission channels, a key characteristic of quantum conductors. This dependence opens the door for the application of flicker noise as a diagnostic probe for fundamental properties of quantum conductors and many-body quantum effects, a role that up to now has been performed by the experimentally less-accessible shot noise.
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Affiliation(s)
- Ofir Shein-Lumbroso
- Department of Chemical and Biological Physics, Weizmann Institute of Science, Rehovot 7610001, Israel
| | - Junjie Liu
- Department of Chemistry and Centre for Quantum Information and Quantum Control, University of Toronto, 80 Saint George Street, Toronto, Ontario M5S 3H6, Canada
| | - Abhay Shastry
- Department of Chemistry and Centre for Quantum Information and Quantum Control, University of Toronto, 80 Saint George Street, Toronto, Ontario M5S 3H6, Canada
| | - Dvira Segal
- Department of Chemistry and Centre for Quantum Information and Quantum Control, University of Toronto, 80 Saint George Street, Toronto, Ontario M5S 3H6, Canada
- Department of Physics, 60 Saint George Street, University of Toronto, Toronto, Ontario M5S 1A7, Canada
| | - Oren Tal
- Department of Chemical and Biological Physics, Weizmann Institute of Science, Rehovot 7610001, Israel
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5
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Kamada M, Laitinen A, Zeng W, Will M, Sarkar J, Tappura K, Seppä H, Hakonen P. Electrical Low-Frequency 1/ fγ Noise Due to Surface Diffusion of Scatterers on an Ultra-low-Noise Graphene Platform. NANO LETTERS 2021; 21:7637-7643. [PMID: 34491764 PMCID: PMC8461652 DOI: 10.1021/acs.nanolett.1c02325] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 06/15/2021] [Revised: 08/26/2021] [Indexed: 06/13/2023]
Abstract
Low-frequency 1/f γ noise is ubiquitous, even in high-end electronic devices. Recently, it was found that adsorbed O2 molecules provide the dominant contribution to flux noise in superconducting quantum interference devices. To clarify the basic principles of such adsorbate noise, we have investigated low-frequency noise, while the mobility of surface adsorbates is varied by temperature. We measured low-frequency current noise in suspended monolayer graphene Corbino samples under the influence of adsorbed Ne atoms. Owing to the extremely small intrinsic noise of suspended graphene, we could resolve a combination of 1/f γ and Lorentzian noise induced by the presence of Ne. We find that the 1/f γ noise is caused by surface diffusion of Ne atoms and by temporary formation of few-Ne-atom clusters. Our results support the idea that clustering dynamics of defects is relevant for understanding of 1/f noise in metallic systems.
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Affiliation(s)
- Masahiro Kamada
- Low
Temperature Laboratory, Department of Applied Physics, Aalto University School of Science, P.O. Box 15100, 00076 Aalto, Finland
| | - Antti Laitinen
- Low
Temperature Laboratory, Department of Applied Physics, Aalto University School of Science, P.O. Box 15100, 00076 Aalto, Finland
| | - Weijun Zeng
- Low
Temperature Laboratory, Department of Applied Physics, Aalto University School of Science, P.O. Box 15100, 00076 Aalto, Finland
| | - Marco Will
- Low
Temperature Laboratory, Department of Applied Physics, Aalto University School of Science, P.O. Box 15100, 00076 Aalto, Finland
| | - Jayanta Sarkar
- Low
Temperature Laboratory, Department of Applied Physics, Aalto University School of Science, P.O. Box 15100, 00076 Aalto, Finland
| | - Kirsi Tappura
- Microelectronics
and quantum technology, VTT Technical Research Centre of Finland Ltd., QTF Centre of Excellence, 02044, Espoo, Finland
| | - Heikki Seppä
- Quantum
systems, VTT Technical Research Centre of Finland Ltd., P.O. Box 1000, 02044 Espoo, Finland
| | - Pertti Hakonen
- Low
Temperature Laboratory, Department of Applied Physics, Aalto University School of Science, P.O. Box 15100, 00076 Aalto, Finland
- QTF
Centre of Excellence, Department of Applied Physics, Aalto University School of Science, P.O. Box 15100, 00076 Aalto, Finland
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6
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Yuan S, Gao T, Cao W, Pan Z, Liu J, Shi J, Hong W. The Characterization of Electronic Noise in the Charge Transport through Single-Molecule Junctions. SMALL METHODS 2021; 5:e2001064. [PMID: 34927823 DOI: 10.1002/smtd.202001064] [Citation(s) in RCA: 3] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/31/2020] [Revised: 12/09/2020] [Indexed: 06/14/2023]
Abstract
With the goal of creating single-molecule devices and integrating them into circuits, the emergence of single-molecule electronics provides various techniques for the fabrication of single-molecule junctions and the investigation of charge transport through such junctions. Among the techniques for characterization of charge transport through molecular junctions, electronic noise characterization is an effective strategy with which issues from molecule-electrode interfaces, mechanisms of charge transport, and changes in junction configurations are studied. Electronic noise analysis in single-molecule junctions can be used to identify molecular conformations and even monitor reaction kinetics. This review summarizes the various types of electronic noise that have been characterized during single-molecule electrical detection, including the functions of random telegraph signal (RTS) noise, flicker noise, shot noise, and their corresponding applications, which provide some guidelines for the future application of these techniques to problems of charge transport through single-molecule junctions.
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Affiliation(s)
- Saisai Yuan
- State Key Laboratory of Physical Chemistry of Solid Surfaces, College of Chemistry and Chemical Engineering iChEM, Xiamen University, Xiamen, 361005, China
| | - Tengyang Gao
- State Key Laboratory of Physical Chemistry of Solid Surfaces, College of Chemistry and Chemical Engineering iChEM, Xiamen University, Xiamen, 361005, China
| | - Wenqiang Cao
- State Key Laboratory of Physical Chemistry of Solid Surfaces, College of Chemistry and Chemical Engineering iChEM, Xiamen University, Xiamen, 361005, China
| | - Zhichao Pan
- State Key Laboratory of Physical Chemistry of Solid Surfaces, College of Chemistry and Chemical Engineering iChEM, Xiamen University, Xiamen, 361005, China
| | - Junyang Liu
- State Key Laboratory of Physical Chemistry of Solid Surfaces, College of Chemistry and Chemical Engineering iChEM, Xiamen University, Xiamen, 361005, China
| | - Jia Shi
- State Key Laboratory of Physical Chemistry of Solid Surfaces, College of Chemistry and Chemical Engineering iChEM, Xiamen University, Xiamen, 361005, China
| | - Wenjing Hong
- State Key Laboratory of Physical Chemistry of Solid Surfaces, College of Chemistry and Chemical Engineering iChEM, Xiamen University, Xiamen, 361005, China
- Beijing National Laboratory for Molecular Sciences, Beijing, 100190, China
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7
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Sánta B, Balogh Z, Pósa L, Krisztián D, Török TN, Molnár D, Sinkó C, Hauert R, Csontos M, Halbritter A. Noise Tailoring in Memristive Filaments. ACS APPLIED MATERIALS & INTERFACES 2021; 13:7453-7460. [PMID: 33533590 PMCID: PMC7899176 DOI: 10.1021/acsami.0c21156] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 11/27/2020] [Accepted: 01/25/2021] [Indexed: 06/12/2023]
Abstract
In this study, the possibilities of noise tailoring in filamentary resistive switching memory devices are investigated. To this end, the resistance and frequency scaling of the low-frequency 1/f-type noise properties are studied in representative mainstream material systems. It is shown that the overall noise floor is tailorable by the proper material choice, as demonstrated by the order-of-magnitude smaller noise levels in Ta2O5 and Nb2O5 transition-metal oxide memristors compared to Ag-based devices. Furthermore, the variation of the resistance states allows orders-of-magnitude tuning of the relative noise level in all of these material systems. This behavior is analyzed in the framework of a point-contact noise model highlighting the possibility for the disorder-induced suppression of the noise contribution arising from remote fluctuators. These findings promote the design of multipurpose resistive switching units, which can simultaneously serve as analog-tunable memory elements and tunable noise sources in probabilistic computing machines.
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Affiliation(s)
- Botond Sánta
- Department of Physics, Budapest
University of Technology and Economics, Budafoki út 8, 1111
Budapest, Hungary
- MTA-BME Condensed Matter Research
Group, Budafoki út 8, 1111 Budapest,
Hungary
| | - Zoltán Balogh
- Department of Physics, Budapest
University of Technology and Economics, Budafoki út 8, 1111
Budapest, Hungary
- MTA-BME Condensed Matter Research
Group, Budafoki út 8, 1111 Budapest,
Hungary
| | - László Pósa
- Department of Physics, Budapest
University of Technology and Economics, Budafoki út 8, 1111
Budapest, Hungary
- Institute of Technical Physics and
Materials Science, Centre for Energy Research, Konkoly-Thege M. út
29-33, 1121 Budapest, Hungary
| | - Dávid Krisztián
- Department of Physics, Budapest
University of Technology and Economics, Budafoki út 8, 1111
Budapest, Hungary
| | - Tímea Nóra Török
- Department of Physics, Budapest
University of Technology and Economics, Budafoki út 8, 1111
Budapest, Hungary
- MTA-BME Condensed Matter Research
Group, Budafoki út 8, 1111 Budapest,
Hungary
| | - Dániel Molnár
- Department of Physics, Budapest
University of Technology and Economics, Budafoki út 8, 1111
Budapest, Hungary
- MTA-BME Condensed Matter Research
Group, Budafoki út 8, 1111 Budapest,
Hungary
| | - Csaba Sinkó
- Department of Physics, Budapest
University of Technology and Economics, Budafoki út 8, 1111
Budapest, Hungary
| | - Roland Hauert
- Laboratory for Joining Technologies & Corrosion,
Empa, Swiss Federal Laboratories for Materials Science and
Technology, Überlandstrasse 129, CH-8600 Dübendorf,
Switzerland
| | - Miklós Csontos
- Department of Physics, Budapest
University of Technology and Economics, Budafoki út 8, 1111
Budapest, Hungary
- Transport at Nanoscale Interfaces Laboratory,
Empa, Swiss Federal Laboratories for Materials Science and
Technology, Überlandstrasse 129, CH-8600 Dübendorf,
Switzerland
| | - András Halbritter
- Department of Physics, Budapest
University of Technology and Economics, Budafoki út 8, 1111
Budapest, Hungary
- MTA-BME Condensed Matter Research
Group, Budafoki út 8, 1111 Budapest,
Hungary
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8
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Ghasemi S, Moth-Poulsen K. Single molecule electronic devices with carbon-based materials: status and opportunity. NANOSCALE 2021; 13:659-671. [PMID: 33406181 DOI: 10.1039/d0nr07844a] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/12/2023]
Abstract
The field of single molecule electronics has progressed remarkably in the past decades by allowing for more versatile molecular functions and improving device fabrication techniques. In particular, electrodes made from carbon-based materials such as graphene and carbon nanotubes (CNTs) may enable parallel fabrication of multiple single molecule devices. In this perspective, we review the recent progress in the field of single molecule electronics, with a focus on devices that utilizes carbon-based electrodes. The paper is structured in three main sections: (i) controlling the molecule/graphene electrode interface using covalent and non-covalent approaches, (ii) using CNTs as electrodes for fabricating single molecule devices, and (iii) a discussion of possible future directions employing new or emerging 2D materials.
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Affiliation(s)
- Shima Ghasemi
- Department of Chemistry and Chemical Engineering, Chalmers University of Technology, SE-412-96 Göteborg, Sweden.
| | - Kasper Moth-Poulsen
- Department of Chemistry and Chemical Engineering, Chalmers University of Technology, SE-412-96 Göteborg, Sweden.
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9
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Fried JP, Bian X, Swett JL, Kravchenko II, Briggs GAD, Mol JA. Large amplitude charge noise and random telegraph fluctuations in room-temperature graphene single-electron transistors. NANOSCALE 2020; 12:871-876. [PMID: 31833518 DOI: 10.1039/c9nr08574b] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [MESH Headings] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/10/2023]
Abstract
We analyze the noise in liquid-gated, room temperature, graphene quantum dots. These devices display extremely large noise amplitudes. The observed noise is explained in terms of a charge noise model by considering fluctuations in the applied source-drain and gate potentials. We show that the liquid environment and substrate have little effect on the observed noise and as such attribute the noise to charge trapping/detrapping at the disordered graphene edges. The trapping/detrapping of individual charges can be tuned by gating the device, which can result in stable two-level fluctuations in the measured current. These results have important implications for the use of electronic graphene nanodevices in single-molecule biosensing.
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Affiliation(s)
- Jasper P Fried
- Department of Materials, University of Oxford, Oxford, OX1 3PH, UK.
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10
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Sánta B, Balogh Z, Gubicza A, Pósa L, Krisztián D, Mihály G, Csontos M, Halbritter A. Universal 1/f type current noise of Ag filaments in redox-based memristive nanojunctions. NANOSCALE 2019; 11:4719-4725. [PMID: 30839979 DOI: 10.1039/c8nr09985e] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/09/2023]
Abstract
The microscopic origins and technological impact of 1/f type current fluctuations in Ag based, filamentary type resistive switching devices have been investigated upon downscaling toward the ultimate single atomic limit. The analysis of the low-frequency current noise spectra revealed that the main electronic noise contribution arises from the resistance fluctuations due to internal dynamical defects of Ag nanofilaments. The resulting 0.01-1% current noise ratio, i.e. the total noise level with respect to the mean value of the current, is found to be universal: its magnitude only depends on the total resistance of the device, irrespective of the materials aspects of the surrounding solid electrolyte and of the specific filament formation procedure. Moreover, the resistance dependence of the current noise ratio also displays the diffusive to ballistic crossover, confirming that stable resistive switching operation utilizing Ag nanofilaments is not compromised even in truly atomic scale junctions by technologically impeding noise levels.
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Affiliation(s)
- Botond Sánta
- Department of Physics, Budapest University of Technology and Economics, Budafoki ut 8, 1111 Budapest, Hungary. and MTA-BME Condensed Matter Research Group, Budafoki ut 8, 1111 Budapest, Hungary
| | - Zoltán Balogh
- Department of Physics, Budapest University of Technology and Economics, Budafoki ut 8, 1111 Budapest, Hungary. and MTA-BME Condensed Matter Research Group, Budafoki ut 8, 1111 Budapest, Hungary
| | - Agnes Gubicza
- Department of Physics, Budapest University of Technology and Economics, Budafoki ut 8, 1111 Budapest, Hungary. and Empa, Swiss Federal Laboratories for Materials Science and Technology, Transport at Nanoscale Interfaces Laboratory, Überlandstrasse 129, CH-8600 Dübendorf, Switzerland
| | - László Pósa
- Department of Physics, Budapest University of Technology and Economics, Budafoki ut 8, 1111 Budapest, Hungary. and Institute for Technical Physics and Materials Science, Centre for Energy Research, Hungarian Academy of Sciences, Konkoly Thege ut 29-33, 1121 Budapest, Hungary
| | - Dávid Krisztián
- Department of Physics, Budapest University of Technology and Economics, Budafoki ut 8, 1111 Budapest, Hungary.
| | - György Mihály
- Department of Physics, Budapest University of Technology and Economics, Budafoki ut 8, 1111 Budapest, Hungary. and MTA-BME Condensed Matter Research Group, Budafoki ut 8, 1111 Budapest, Hungary
| | - Miklós Csontos
- Department of Physics, Budapest University of Technology and Economics, Budafoki ut 8, 1111 Budapest, Hungary. and Empa, Swiss Federal Laboratories for Materials Science and Technology, Transport at Nanoscale Interfaces Laboratory, Überlandstrasse 129, CH-8600 Dübendorf, Switzerland
| | - András Halbritter
- Department of Physics, Budapest University of Technology and Economics, Budafoki ut 8, 1111 Budapest, Hungary. and MTA-BME Condensed Matter Research Group, Budafoki ut 8, 1111 Budapest, Hungary
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