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Zeng Y, Lei Y, Wang Y, Cheng M, Liao L, Wang X, Ge J, Liu Z, Ming W, Li C, Xie S, Li J, Li C. High Quality Epitaxial Piezoelectric and Ferroelectric Wurtzite Al 1- xSc xN Thin Films. SMALL METHODS 2024:e2400722. [PMID: 39118585 DOI: 10.1002/smtd.202400722] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/16/2024] [Revised: 07/25/2024] [Indexed: 08/10/2024]
Abstract
Piezoelectric and ferroelectric wurtzite are promising to reshape modern microelectronics because they can be easily integrated with mainstream semiconductor technology. Sc doped AlN (Al1- xScxN) has attracted much attention for its enhanced piezoelectric and emerging ferroelectric properties, yet the commonly used sputtering results in polycrystalline Al1- xScxN films with high leakage current. Here, the pulsed laser deposition of single crystalline epitaxial Al1- xScxN thin films on sapphire and 4H-SiC substrates is reported. Pure wurtzite phase is maintained up to x = 0.3 with ≤0.1 at% oxygen contamination. Polarization is estimated to be 140 µC cm-2 via atomic scale microscopy imaging and found to be switchable via a scanning probe. The piezoelectric coefficient is found to be five times of the undoped one when x = 0.3, making it desirable for high-frequency radiofrequency (RF) filters and 3D nonvolatile memories.
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Affiliation(s)
- Yang Zeng
- Key Laboratory of Low Dimensional Materials and Application Technology of Ministry of Education, School of Materials Science and Engineering, Xiangtan University, Xiangtan, Hunan, 411105, China
| | - Yihan Lei
- Department of Materials Science and Engineering, Southern University of Science and Technology, Shenzhen, Guangdong, 518055, China
- Guangdong Provincial Key Laboratory of Functional Oxide Materials and Devices, Southern University of Science and Technology, Shenzhen, Guangdong, 518055, China
| | - Yanghe Wang
- Department of Materials Science and Engineering, Southern University of Science and Technology, Shenzhen, Guangdong, 518055, China
- Guangdong Provincial Key Laboratory of Functional Oxide Materials and Devices, Southern University of Science and Technology, Shenzhen, Guangdong, 518055, China
| | - Mingqiang Cheng
- Department of Materials Science and Engineering, Southern University of Science and Technology, Shenzhen, Guangdong, 518055, China
- Guangdong Provincial Key Laboratory of Functional Oxide Materials and Devices, Southern University of Science and Technology, Shenzhen, Guangdong, 518055, China
| | - Luocheng Liao
- Department of Materials Science and Engineering, Southern University of Science and Technology, Shenzhen, Guangdong, 518055, China
- Guangdong Provincial Key Laboratory of Functional Oxide Materials and Devices, Southern University of Science and Technology, Shenzhen, Guangdong, 518055, China
| | - Xuyang Wang
- Department of Materials Science and Engineering, Southern University of Science and Technology, Shenzhen, Guangdong, 518055, China
- Guangdong Provincial Key Laboratory of Functional Oxide Materials and Devices, Southern University of Science and Technology, Shenzhen, Guangdong, 518055, China
| | - Jinxin Ge
- Department of Materials Science and Engineering, Southern University of Science and Technology, Shenzhen, Guangdong, 518055, China
- Guangdong Provincial Key Laboratory of Functional Oxide Materials and Devices, Southern University of Science and Technology, Shenzhen, Guangdong, 518055, China
| | - Zhenghao Liu
- Department of Materials Science and Engineering, Southern University of Science and Technology, Shenzhen, Guangdong, 518055, China
- Guangdong Provincial Key Laboratory of Functional Oxide Materials and Devices, Southern University of Science and Technology, Shenzhen, Guangdong, 518055, China
| | - Wenjie Ming
- Department of Materials Science and Engineering, Southern University of Science and Technology, Shenzhen, Guangdong, 518055, China
- Guangdong Provincial Key Laboratory of Functional Oxide Materials and Devices, Southern University of Science and Technology, Shenzhen, Guangdong, 518055, China
| | - Chao Li
- Department of Materials Science and Engineering, Southern University of Science and Technology, Shenzhen, Guangdong, 518055, China
- Guangdong Provincial Key Laboratory of Functional Oxide Materials and Devices, Southern University of Science and Technology, Shenzhen, Guangdong, 518055, China
| | - Shuhong Xie
- Key Laboratory of Low Dimensional Materials and Application Technology of Ministry of Education, School of Materials Science and Engineering, Xiangtan University, Xiangtan, Hunan, 411105, China
- Key Laboratory of Thin Film Materials and Devices, School of Materials Science and Engineering, Xiangtan University, Xiangtan, Hunan, 411105, China
| | - Jiangyu Li
- Department of Materials Science and Engineering, Southern University of Science and Technology, Shenzhen, Guangdong, 518055, China
- Guangdong Provincial Key Laboratory of Functional Oxide Materials and Devices, Southern University of Science and Technology, Shenzhen, Guangdong, 518055, China
| | - Changjian Li
- Department of Materials Science and Engineering, Southern University of Science and Technology, Shenzhen, Guangdong, 518055, China
- Guangdong Provincial Key Laboratory of Functional Oxide Materials and Devices, Southern University of Science and Technology, Shenzhen, Guangdong, 518055, China
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Maurya AK, Chatterjee K, Jha R. Ultra-wide range non-contact surface profilometry based on reconfigurable fiber interferometry. OPTICS LETTERS 2024; 49:3588-3591. [PMID: 38950216 DOI: 10.1364/ol.531327] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/28/2024] [Accepted: 06/05/2024] [Indexed: 07/03/2024]
Abstract
Surface characterization is essential for a technical evaluation of device performance and to assess surface dynamics in fabrication units. In this regard, a number of surface profiling techniques have been developed that accurately map sample topography but have significantly limited detection range. Here, we demonstrate a cascaded non-contact fiber interferometer-based approach for real-time high-precision surface profiling with ultrawide detection range (nm to mm). This compact interferometers' system operates by wavelength interrogation that provides a scope to study several types of surfaces and has a tunable cavity configuration for varying the sensitivity and range of the detectable features' size. The proposed system enables nanoscale profiling over 10-1000 nm with resolution of 10 nm and microscale mapping over 1-1000 µm with resolution of 0.2 µm. The technique is utilized to map the features of nanostructured surfaces and estimate the surface roughness of standardized industrial samples.
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3
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Ukraintsev E, Rezek B. Non-contact non-resonant atomic force microscopy method for measurements of highly mobile molecules and nanoparticles. Ultramicroscopy 2023; 253:113816. [PMID: 37531754 DOI: 10.1016/j.ultramic.2023.113816] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/07/2022] [Revised: 04/13/2023] [Accepted: 07/25/2023] [Indexed: 08/04/2023]
Abstract
Atomic force microscopy (AFM) is nowadays indispensable versatile scanning probe method widely employed for fundamental and applied research in physics, chemistry, biology as well as industrial metrology. Conventional AFM systems can operate in various environments such as ultra-high vacuum, electrolyte solutions, or controlled gas atmosphere. Measurements in ambient air are prevalent due to their technical simplicity; however, there are drawbacks such as formation of water meniscus that greatly increases attractive interaction (adhesion) between the tip and the sample, reduced spatial resolution, and too strong interactions leading to tip and/or sample modifications. Here we show how the attractive forces in AFM under ambient conditions can be used with advantage to probe surface properties in a very sensitive way even on highly mobile molecules and nanoparticles. We introduce a stable non-contact non-resonant (NCNR) AFM method which enables to reliably perform measurements in the attractive force regime even in air by controlling the tip position in the intimate surface vicinity without touching it. We demonstrate proof-of-concept results on helicene-based macrocycles, DNA on mica, and nanodiamonds on SiO2. We compare the results with other conventional AFM regimes, showing NCNR advantages such as higher spatial resolution, reduced tip contamination, and negligible sample modification. We analyze principle physical and chemical mechanisms influencing the measurements, discuss issues of stability and various possible method implementations. We explain how the NCNR method can be applied in any AFM system by a mere software modification. The method thus opens a new research field for measurements of highly sensitive and mobile nanoscale objects under air and other environments.
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Affiliation(s)
- Egor Ukraintsev
- Faculty of Electrical Engineering, Czech Technical University in Prague, Technická 2, Prague 6, 166 27, Czech Republic.
| | - Bohuslav Rezek
- Faculty of Electrical Engineering, Czech Technical University in Prague, Technická 2, Prague 6, 166 27, Czech Republic
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4
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Wu N, Huang G, Huang H, Wang Y, Gu X, Wang X, Qiu L. Achieving High Performance Stretchable Conjugated Polymers via Donor Structure Engineering. Macromol Rapid Commun 2023; 44:e2300169. [PMID: 37191155 DOI: 10.1002/marc.202300169] [Citation(s) in RCA: 1] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/23/2023] [Revised: 04/25/2023] [Indexed: 05/17/2023]
Abstract
A backbone engineering strategy is developed to tune the mechanical and electrical properties of conjugated polymer semiconductors. Four Donor-Acceptor (D-A) polymers, named PTDPPSe, PTDPPTT, PTDPPBT, and PTDPPTVT, are synthesized using selenophene (Se), thienothiophene (TT), bithiophene (BT), and thienylenevinylenethiophene (TVT) as the donors and siloxane side chain modified diketopyrrolopyrrole (DPP) as acceptor. The influences of the donor structure on the polymer energy level, film morphology, molecular stacking, carrier transport properties, and tensile properties are all examined. The films of PTDPPSe show the best stretchability with crack-onset-strain greater than 100%, but the worst electrical properties with a mobility of only 0.54 cm2 V-1 s-1 . The replacement of the Se donor with larger conjugated donors, that is, TT, BT, and TVT, significantly improves the mobility of conjugated polymers but also leads to reduced stretchability. Remarkably, PTDPPBT exhibits moderate stretchability with crack-onset-strain ≈50% and excellent electrical properties. At 50% strain, it has a mobility of 2.37 cm2 V-1 s-1 parallel to the stretched direction, which is higher than the mobility of most stretchable conjugated polymers in this stretching state.
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Affiliation(s)
- Ning Wu
- National Engineering Lab of Special Display Technology, Special Display and Imaging Technology Innovation Center of Anhui Province, Academy of Opto-Electronic Technology, Hefei University of Technology, Hefei, 230009, China
- Intelligent Interconnected Systems Laboratory of Anhui, Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, 230009, China
| | - Gang Huang
- National Engineering Lab of Special Display Technology, Special Display and Imaging Technology Innovation Center of Anhui Province, Academy of Opto-Electronic Technology, Hefei University of Technology, Hefei, 230009, China
- Intelligent Interconnected Systems Laboratory of Anhui, Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, 230009, China
| | - Hua Huang
- National Engineering Lab of Special Display Technology, Special Display and Imaging Technology Innovation Center of Anhui Province, Academy of Opto-Electronic Technology, Hefei University of Technology, Hefei, 230009, China
- Intelligent Interconnected Systems Laboratory of Anhui, Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, 230009, China
| | - Yunfei Wang
- School of Polymer Science and Engineering, The University of Southern Mississippi, Hattiesburg, MS, 39406, USA
| | - Xiaodan Gu
- School of Polymer Science and Engineering, The University of Southern Mississippi, Hattiesburg, MS, 39406, USA
| | - Xiaohong Wang
- National Engineering Lab of Special Display Technology, Special Display and Imaging Technology Innovation Center of Anhui Province, Academy of Opto-Electronic Technology, Hefei University of Technology, Hefei, 230009, China
- Intelligent Interconnected Systems Laboratory of Anhui, Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, 230009, China
| | - Longzhen Qiu
- National Engineering Lab of Special Display Technology, Special Display and Imaging Technology Innovation Center of Anhui Province, Academy of Opto-Electronic Technology, Hefei University of Technology, Hefei, 230009, China
- Intelligent Interconnected Systems Laboratory of Anhui, Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, 230009, China
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5
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Li W, Zhang X, Yang J, Zhou S, Song C, Cheng P, Zhang YQ, Feng B, Wang Z, Lu Y, Wu K, Chen L. Emergence of ferroelectricity in a nonferroelectric monolayer. Nat Commun 2023; 14:2757. [PMID: 37179407 PMCID: PMC10183010 DOI: 10.1038/s41467-023-38445-1] [Citation(s) in RCA: 18] [Impact Index Per Article: 18.0] [Reference Citation Analysis] [Abstract] [Grants] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/03/2022] [Accepted: 04/28/2023] [Indexed: 05/15/2023] Open
Abstract
Ferroelectricity in ultrathin two-dimensional (2D) materials has attracted broad interest due to potential applications in nonvolatile memory, nanoelectronics and optoelectronics. However, ferroelectricity is barely explored in materials with native centro or mirror symmetry, especially in the 2D limit. Here, we report the first experimental realization of room-temperature ferroelectricity in van der Waals layered GaSe down to monolayer with mirror symmetric structures, which exhibits strong intercorrelated out-of-plane and in-plane electric polarization. The origin of ferroelectricity in GaSe comes from intralayer sliding of the Se atomic sublayers, which breaks the local structural mirror symmetry and forms dipole moment alignment. Ferroelectric switching is demonstrated in nano devices fabricated with GaSe nanoflakes, which exhibit exotic nonvolatile memory behavior with a high channel current on/off ratio. Our work reveals that intralayer sliding is a new approach to generate ferroelectricity within mirror symmetric monolayer, and offers great opportunity for novel nonvolatile memory devices and optoelectronics applications.
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Affiliation(s)
- Wenhui Li
- Institute of Physics, Chinese Academy of Sciences, Beijing, 100190, China
- School of Physical Sciences, University of Chinese Academy of Sciences, Beijing, 100190, China
| | - Xuanlin Zhang
- State Key Laboratory of Silicon Materials, School of Materials Science and Engineering, Zhejiang University, Hangzhou, 310027, China
| | - Jia Yang
- School of Physical Sciences, University of Chinese Academy of Sciences, Beijing, 100190, China
- National Center for Nanoscience and Technology, Chinese Academy of Sciences, Beijing, 100190, China
| | - Song Zhou
- Institute of Physics, Chinese Academy of Sciences, Beijing, 100190, China
- School of Physical Sciences, University of Chinese Academy of Sciences, Beijing, 100190, China
| | - Chuangye Song
- Institute of Physics, Chinese Academy of Sciences, Beijing, 100190, China
- Songshan Lake Materials Laboratory, Dongguan, Guangdong, 523808, China
| | - Peng Cheng
- Institute of Physics, Chinese Academy of Sciences, Beijing, 100190, China
- School of Physical Sciences, University of Chinese Academy of Sciences, Beijing, 100190, China
| | - Yi-Qi Zhang
- Institute of Physics, Chinese Academy of Sciences, Beijing, 100190, China
- School of Physical Sciences, University of Chinese Academy of Sciences, Beijing, 100190, China
| | - Baojie Feng
- Institute of Physics, Chinese Academy of Sciences, Beijing, 100190, China
- School of Physical Sciences, University of Chinese Academy of Sciences, Beijing, 100190, China
| | - Zhenxing Wang
- School of Physical Sciences, University of Chinese Academy of Sciences, Beijing, 100190, China
- National Center for Nanoscience and Technology, Chinese Academy of Sciences, Beijing, 100190, China
| | - Yunhao Lu
- State Key Laboratory of Silicon Materials, School of Materials Science and Engineering, Zhejiang University, Hangzhou, 310027, China.
- Zhejiang Province Key Laboratory of Quantum Technology and Device, School of Physics, Zhejiang University, Hangzhou, 310027, China.
| | - Kehui Wu
- Institute of Physics, Chinese Academy of Sciences, Beijing, 100190, China.
- School of Physical Sciences, University of Chinese Academy of Sciences, Beijing, 100190, China.
- Songshan Lake Materials Laboratory, Dongguan, Guangdong, 523808, China.
| | - Lan Chen
- Institute of Physics, Chinese Academy of Sciences, Beijing, 100190, China.
- School of Physical Sciences, University of Chinese Academy of Sciences, Beijing, 100190, China.
- Songshan Lake Materials Laboratory, Dongguan, Guangdong, 523808, China.
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6
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Zheng W, Wang X, Zhang X, Chen B, Suo H, Xing Z, Wang Y, Wei HL, Chen J, Guo Y, Wang F. Emerging Halide Perovskite Ferroelectrics. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2023; 35:e2205410. [PMID: 36517207 DOI: 10.1002/adma.202205410] [Citation(s) in RCA: 29] [Impact Index Per Article: 29.0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/14/2022] [Revised: 11/23/2022] [Indexed: 05/26/2023]
Abstract
Halide perovskites have gained tremendous attention in the past decade owing to their excellent properties in optoelectronics. Recently, a fascinating property, ferroelectricity, has been discovered in halide perovskites and quickly attracted widespread interest. Compared with traditional perovskite oxide ferroelectrics, halide perovskites display natural advantages such as structural softness, low weight, and easy processing, which are highly desirable in applications pursuing miniaturization and flexibility. This review focuses on the current research progress in halide perovskite ferroelectrics, encompassing the emerging materials systems and their potential applications in ferroelectric photovoltaics, self-powered photodetection, and X-ray detection. The main challenges and possible solutions in the future development of halide perovskite ferroelectric materials are also attempted to be pointed out.
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Affiliation(s)
- Weilin Zheng
- Department of Materials Science and Engineering, City University of Hong Kong, 83 Tat Chee Avenue, Hong Kong SAR, China
- City University of Hong Kong Shenzhen Research Institute, Shenzhen, 518057, China
| | - Xiucai Wang
- School of Materials Science and Hydrogen Energy, Foshan University, Foshan, 528000, P. R. China
| | - Xin Zhang
- Department of Materials Science and Engineering, City University of Hong Kong, 83 Tat Chee Avenue, Hong Kong SAR, China
- City University of Hong Kong Shenzhen Research Institute, Shenzhen, 518057, China
| | - Bing Chen
- Department of Materials Science and Engineering, City University of Hong Kong, 83 Tat Chee Avenue, Hong Kong SAR, China
- City University of Hong Kong Shenzhen Research Institute, Shenzhen, 518057, China
| | - Hao Suo
- Department of Materials Science and Engineering, City University of Hong Kong, 83 Tat Chee Avenue, Hong Kong SAR, China
- City University of Hong Kong Shenzhen Research Institute, Shenzhen, 518057, China
| | - Zhifeng Xing
- Department of Materials Science and Engineering, City University of Hong Kong, 83 Tat Chee Avenue, Hong Kong SAR, China
- City University of Hong Kong Shenzhen Research Institute, Shenzhen, 518057, China
| | - Yanze Wang
- Department of Materials Science and Engineering, City University of Hong Kong, 83 Tat Chee Avenue, Hong Kong SAR, China
- City University of Hong Kong Shenzhen Research Institute, Shenzhen, 518057, China
| | - Han-Lin Wei
- Department of Materials Science and Engineering, City University of Hong Kong, 83 Tat Chee Avenue, Hong Kong SAR, China
- City University of Hong Kong Shenzhen Research Institute, Shenzhen, 518057, China
| | - Jiangkun Chen
- Department of Materials Science and Engineering, City University of Hong Kong, 83 Tat Chee Avenue, Hong Kong SAR, China
- City University of Hong Kong Shenzhen Research Institute, Shenzhen, 518057, China
| | - Yang Guo
- Department of Materials Science and Engineering, City University of Hong Kong, 83 Tat Chee Avenue, Hong Kong SAR, China
- City University of Hong Kong Shenzhen Research Institute, Shenzhen, 518057, China
| | - Feng Wang
- Department of Materials Science and Engineering, City University of Hong Kong, 83 Tat Chee Avenue, Hong Kong SAR, China
- City University of Hong Kong Shenzhen Research Institute, Shenzhen, 518057, China
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7
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Li P, Shao Y, Xu K, Liu X. High-speed multiparametric imaging through off-resonance tapping AFM with active probe. Ultramicroscopy 2023; 248:113712. [PMID: 36881947 DOI: 10.1016/j.ultramic.2023.113712] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/17/2022] [Revised: 12/18/2022] [Accepted: 03/02/2023] [Indexed: 03/06/2023]
Abstract
Off-resonance tapping (ORT) mode of atomic force microscopy (AFM), based on force-distance curve, is widely concerned due to its advantages of weak tip-sample interaction and concurrent quantitative property mapping. However, the ORT-AFM still has the disadvantage of slow scan speed caused by low modulation frequency. In this paper, we overcome this disadvantage by introducing active probe method. With active probe, the cantilever was directly actuated with the induced strain after applying voltage in the piezoceramic film. In this way, the modulation frequency could be increased to more than an order of magnitude faster than that of traditional ORT, thus improving the scan rate. We demonstrated high-speed multiparametric imaging with the active probe method in ORT-AFM.
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Affiliation(s)
- Peng Li
- Faculty of Information Technology, Beijing University of Technology, Beijing 100124, P.R. China.
| | - Yongjian Shao
- School of Electrical and Control Engineering, Shenyang Jianzhu University, Shenyang 110168, P.R. China
| | - Ke Xu
- School of Electrical and Control Engineering, Shenyang Jianzhu University, Shenyang 110168, P.R. China
| | - Xiucheng Liu
- Faculty of Information Technology, Beijing University of Technology, Beijing 100124, P.R. China
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8
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Magnani A, Capaccioli S, Azimi B, Danti S, Labardi M. Local Piezoelectric Response of Polymer/Ceramic Nanocomposite Fibers. Polymers (Basel) 2022; 14:5379. [PMID: 36559746 PMCID: PMC9783531 DOI: 10.3390/polym14245379] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/04/2022] [Revised: 11/29/2022] [Accepted: 12/06/2022] [Indexed: 12/13/2022] Open
Abstract
Effective converse piezoelectric coefficient (d33,eff) mapping of poly(vinylidene fluoride) (PVDF) nanofibers with ceramic BaTiO3 nanoparticle inclusions obtained by electrospinning was carried out by piezoresponse force microscopy (PFM) in a peculiar dynamic mode, namely constant-excitation frequency-modulation (CE-FM), particularly suitable for the analysis of compliant materials. Mapping of single nanocomposite fibers was carried out to demonstrate the ability of CE-FM-PFM to investigate the nanostructure of semicrystalline polymers well above their glass transition temperature, such as PVDF, by revealing the distribution of piezoelectric activity of the nanofiber, as well as of the embedded nanoparticles employed. A decreased piezoelectric activity at the nanoparticle site compared to the polymeric fiber was found. This evidence can be rationalized in terms of a tradeoff between the dielectric constants and piezoelectric coefficients of the component materials, as well as on the mutual orientation of polar axes.
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Affiliation(s)
- Aurora Magnani
- Dipartimento di Fisica “Enrico Fermi”, Università di Pisa, Largo Pontecorvo 3, 56127 Pisa, Italy
| | - Simone Capaccioli
- Dipartimento di Fisica “Enrico Fermi”, Università di Pisa, Largo Pontecorvo 3, 56127 Pisa, Italy
- CNR-IPCF, Pisa Unit, Largo Pontecorvo 3, 56127 Pisa, Italy
- CISUP, Centro per l’Integrazione della Strumentazione dell’Università di Pisa, 56126 Pisa, Italy
| | - Bahareh Azimi
- Dipartimento di Ingegneria Civile ed Industriale (DICI), Università di Pisa, L. Lazzarino 1, 56122 Pisa, Italy
- Department of Translational Research and New Technologies in Medicine and Surgery, University of Pisa, 56126 Pisa, Italy
| | - Serena Danti
- Dipartimento di Ingegneria Civile ed Industriale (DICI), Università di Pisa, L. Lazzarino 1, 56122 Pisa, Italy
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9
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Liu Y, Kelley KP, Vasudevan RK, Zhu W, Hayden J, Maria JP, Funakubo H, Ziatdinov MA, Trolier-McKinstry S, Kalinin SV. Automated Experiments of Local Non-Linear Behavior in Ferroelectric Materials. SMALL (WEINHEIM AN DER BERGSTRASSE, GERMANY) 2022; 18:e2204130. [PMID: 36253123 DOI: 10.1002/smll.202204130] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/05/2022] [Revised: 09/19/2022] [Indexed: 06/16/2023]
Abstract
An automated experiment in multimodal imaging to probe structural, chemical, and functional behaviors in complex materials and elucidate the dominant physical mechanisms that control device function is developed and implemented. Here, the emergence of non-linear electromechanical responses in piezoresponse force microscopy (PFM) is explored. Non-linear responses in PFM can originate from multiple mechanisms, including intrinsic material responses often controlled by domain structure, surface topography that affects the mechanical phenomena at the tip-surface junction, and the presence of surface contaminants. Using an automated experiment to probe the origins of non-linear behavior in ferroelectric lead titanate (PTO) and ferroelectric Al0.93 B0.07 N films, it is found that PTO shows asymmetric nonlinear behavior across a/c domain walls and a broadened high nonlinear response region around c/c domain walls. In contrast, for Al0.93 B0.07 N, well-poled regions show high linear piezoelectric responses, when paired with low non-linear responses regions that are multidomain show low linear responses and high nonlinear responses. It is shown that formulating dissimilar exploration strategies in deep kernel learning as alternative hypotheses allows for establishing the preponderant physical mechanisms behind the non-linear behaviors, suggesting that automated experiments can potentially discern between competing physical mechanisms. This technique can also be extended to electron, probe, and chemical imaging.
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Affiliation(s)
- Yongtao Liu
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Kyle P Kelley
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Rama K Vasudevan
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Wanlin Zhu
- Department of Materials Science and Engineering and Materials Research Institute, The Pennsylvania State University, University Park, PA, 16802, USA
| | - John Hayden
- Department of Materials Science and Engineering and Materials Research Institute, The Pennsylvania State University, University Park, PA, 16802, USA
| | - Jon-Paul Maria
- Department of Materials Science and Engineering and Materials Research Institute, The Pennsylvania State University, University Park, PA, 16802, USA
- Center for Dielectrics and Piezoelectrics, Materials Research Institute, The Pennsylvania State University, University Park, PA, 16802, USA
| | - Hiroshi Funakubo
- Department of Material Science and Engineering, Tokyo Institute of Technology, Yokohama, 226-8502, Japan
| | - Maxim A Ziatdinov
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
- Computational Sciences and Engineering Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Susan Trolier-McKinstry
- Department of Materials Science and Engineering and Materials Research Institute, The Pennsylvania State University, University Park, PA, 16802, USA
- Center for Dielectrics and Piezoelectrics, Materials Research Institute, The Pennsylvania State University, University Park, PA, 16802, USA
| | - Sergei V Kalinin
- Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN, 37916, USA
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10
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Zhao Y, Liu F, Xie N, Wang Y, Liu M, Han Z, Hou T. Achieving Ultrasensitivity and Long-Term Durability Simultaneously for Microcantilevers Inspired by a Scorpion's Circular Tip Slits. ACS NANO 2022; 16:18048-18057. [PMID: 36255256 DOI: 10.1021/acsnano.2c04251] [Citation(s) in RCA: 2] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/16/2023]
Abstract
Microcantilevers are one of the most essential sensitive elements for various mechanical sensors. Their sensing performance determines the index level of a series of sensors. To date, the long-standing trade-off between ultrasensitivity and long-term durability of microcantilevers still remains a challenge. In nature, scorpions can sense vibrations as low as 10 nm amplitude through their circular tip slits sensilla. Such slit sensilla embedded in the exoskeleton of walking legs endure the compressing and stretching of every movement without spontaneous fracture failures. Here, we focused on the structural design of the circular tip slits which concentrate stress effectively and disperse energy smoothly, with the result that the microcantilevers are ultrasensitive and durable simultaneously in a single element. We devised a reproducible circular tip slits cantilever with enhanced sensitivity and ultralow detection limits to monitor 7 nm amplitude vibrations. The sensor possessed excellent durability and remained highly consistent with the correlation coefficient of nearly 0.999 over 100 000 cycles. Furthermore, the circular tip slits cantilever could precisely sense diverse subtle mechanical signals and exhibited potential applications in monitoring respiratory patterns. The simple geometric design can be easily manufactured on various sensory materials for applications requiring ultrahigh sensitivity and long-time durability.
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Affiliation(s)
- Yufeng Zhao
- College of Communication Engineering, Jilin University, Changchun 130022, China
| | - Fu Liu
- College of Communication Engineering, Jilin University, Changchun 130022, China
| | - Nan Xie
- College of Communication Engineering, Jilin University, Changchun 130022, China
| | - Yueqiao Wang
- College of Communication Engineering, Jilin University, Changchun 130022, China
| | - Meihe Liu
- College of Communication Engineering, Jilin University, Changchun 130022, China
| | - Zhiwu Han
- Key Laboratory of Bionic Engineering, Ministry of Education, Jilin University, Changchun 130022, China
| | - Tao Hou
- College of Communication Engineering, Jilin University, Changchun 130022, China
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11
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Buragohain P, Lu H, Richter C, Schenk T, Kariuki P, Glinsek S, Funakubo H, Íñiguez J, Defay E, Schroeder U, Gruverman A. Quantification of the Electromechanical Measurements by Piezoresponse Force Microscopy. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2022; 34:e2206237. [PMID: 36210741 DOI: 10.1002/adma.202206237] [Citation(s) in RCA: 7] [Impact Index Per Article: 3.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/09/2022] [Revised: 09/10/2022] [Indexed: 06/16/2023]
Abstract
Piezoresponse force microscopy (PFM) is widely used for characterization and exploration of the nanoscale properties of ferroelectrics. However, quantification of the PFM signal is challenging due to the convolution of various extrinsic and intrinsic contributions. Although quantification of the PFM amplitude signal has received considerable attention, quantification of the PFM phase signal has not been addressed. A properly calibrated PFM phase signal can provide valuable information on the sign of the local piezoelectric coefficient-an important and nontrivial issue for emerging ferroelectrics. In this work, two complementary methodologies to calibrate the PFM phase signal are discussed. The first approach is based on using a standard reference sample with well-known independently measured piezoelectric coefficients, while the second approach exploits the electrostatic sample-cantilever interactions to determine the parasitic phase offset. Application of these methodologies to studies of the piezoelectric behavior in ferroelectric HfO2 -based thin-film capacitors reveals intriguing variations in the sign of the longitudinal piezoelectric coefficient, d33,eff . It is shown that the piezoelectric properties of the HfO2 -based capacitors are inherently sensitive to their thickness, electrodes, as well as deposition methods, and can exhibit wide variations including a d33,eff sign change within a single device.
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Affiliation(s)
- Pratyush Buragohain
- Department of Physics and Astronomy, University of Nebraska-Lincoln, Lincoln, NE 68588, USA
| | - Haidong Lu
- Department of Physics and Astronomy, University of Nebraska-Lincoln, Lincoln, NE 68588, USA
| | - Claudia Richter
- NaMLab gGmbH, 01187, Noethnitzer Strasse 64 a, Dresden, Germany
| | - Tony Schenk
- Ferroelectric Memory GmbH, 01099, Charlotte-Bühler-Str. 12, Dresden, Germany
| | - Pamenas Kariuki
- NaMLab gGmbH, 01187, Noethnitzer Strasse 64 a, Dresden, Germany
| | - Sebastjan Glinsek
- Materials Research and Technology Department, Luxembourg Institute of Science and Technology, 41 Rue du Brill, Belvaux, L-4422, Luxembourg
| | - Hiroshi Funakubo
- School of Materials and Chemical Technology, Tokyo Institute of Technology, Yokohama, 226-8502, Japan
| | - Jorge Íñiguez
- Materials Research and Technology Department, Luxembourg Institute of Science and Technology, 41 Rue du Brill, Belvaux, L-4422, Luxembourg
- Department of Physics and Materials Science, University of Luxembourg, 41 Rue du Brill, Belvaux, L-4422, Luxembourg
| | - Emmanuel Defay
- Materials Research and Technology Department, Luxembourg Institute of Science and Technology, 41 Rue du Brill, Belvaux, L-4422, Luxembourg
| | - Uwe Schroeder
- NaMLab gGmbH, 01187, Noethnitzer Strasse 64 a, Dresden, Germany
| | - Alexei Gruverman
- Department of Physics and Astronomy, University of Nebraska-Lincoln, Lincoln, NE 68588, USA
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12
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Checa M, Jin X, Millan-Solsona R, Neumayer SM, Susner MA, McGuire MA, O'Hara A, Gomila G, Maksymovych P, Pantelides ST, Collins L. Revealing Fast Cu-Ion Transport and Enhanced Conductivity at the CuInP 2S 6-In 4/3P 2S 6 Heterointerface. ACS NANO 2022; 16:15347-15357. [PMID: 35998341 DOI: 10.1021/acsnano.2c06992] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/15/2023]
Abstract
Van der Waals layered ferroelectrics, such as CuInP2S6 (CIPS), offer a versatile platform for miniaturization of ferroelectric device technologies. Control of the targeted composition and kinetics of CIPS synthesis enables the formation of stable self-assembled heterostructures of ferroelectric CIPS and nonferroelectric In4/3P2S6 (IPS). Here, we use quantitative scanning probe microscopy methods combined with density functional theory (DFT) to explore in detail the nanoscale variability in dynamic functional properties of the CIPS-IPS heterostructure. We report evidence of fast ionic transport which mediates an appreciable out-of-plane electromechanical response of the CIPS surface in the paraelectric phase. Further, we map the nanoscale dielectric and ionic conductivity properties as we thermally stimulate the ferroelectric-paraelectric phase transition, recovering the local dielectric behavior during this phase transition. Finally, aided by DFT, we reveal a substantial and tunable conductivity enhancement at the CIPS/IPS interface, indicating the possibility of engineering its interfacial properties for next generation device applications.
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Affiliation(s)
- Marti Checa
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
| | - Xin Jin
- Department of Physics and Astronomy, Vanderbilt University, Nashville, Tennessee 37235, United States
- Institute of Physics and University of the Chinese Academy of Sciences, Chinese Academy of Sciences, Beijing 100190, China
| | - Ruben Millan-Solsona
- Institut de Bioenginyeria de Catalunya (IBEC), The Barcelona Institute of Science and Technology (BIST), c/Baldiri i Reixac 11-15, 08028 Barcelona, Spain
- Departament d'Enginyeria Electrònica i Biomèdica, Universitat de Barcelona, Martí i Franqués 1, 08028 Barcelona, Spain
| | - Sabine M Neumayer
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
| | - Michael A Susner
- Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, Ohio 45433, United States
| | - Michael A McGuire
- Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
| | - Andrew O'Hara
- Department of Physics and Astronomy, Vanderbilt University, Nashville, Tennessee 37235, United States
| | - Gabriel Gomila
- Institut de Bioenginyeria de Catalunya (IBEC), The Barcelona Institute of Science and Technology (BIST), c/Baldiri i Reixac 11-15, 08028 Barcelona, Spain
- Departament d'Enginyeria Electrònica i Biomèdica, Universitat de Barcelona, Martí i Franqués 1, 08028 Barcelona, Spain
| | - Petro Maksymovych
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
| | - Sokrates T Pantelides
- Department of Physics and Astronomy, Vanderbilt University, Nashville, Tennessee 37235, United States
- Department of Electrical and Computer Engineering, Vanderbilt University, Nashville, Tennessee 37235, United States
| | - Liam Collins
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
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13
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Loo CC, Ng SS, Chang WS. Electrostatic Contribution to the Photo-Assisted Piezoresponse Force Microscopy by Photo-Induced Surface Charge. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2022; 28:1-5. [PMID: 35616223 DOI: 10.1017/s143192762200085x] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/15/2023]
Abstract
The surging interest in manipulating the polarization of piezo/ferroelectric materials by means of light has driven an increasing number of studies toward their light-polarization interaction. One way to investigate such interaction is by performing piezoresponse force microscopy (PFM) while/after the sample is exposed to light illumination. However, caution must be exercised when analyzing and interpreting the data, as demonstrated in this paper, because sizeable photo-response observed in the PFM amplitude image of the sample is shown to be caused by the electrostatic interaction between the photo-induced surface charge and tip. Through photo-assisted Kelvin probe force microscopy (KPFM), positive surface potential is found to be developed near the sample's surface under 405 nm light illumination, whose effects on the measured PFM signal is revealed by the comparative studies on its amplitude curves that are obtained using PFM spectroscopy mode with/without illumination. This work exemplifies the need for complementary use of KPFM, PFM imaging mode, and PFM spectroscopy mode in order to distinguish real behavior from artifacts.
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Affiliation(s)
- Chin Chyi Loo
- Mechanical Engineering Discipline, School of Engineering, Monash University, Bandar Sunway, Selangor 47500, Malaysia
| | - Sha Shiong Ng
- Institute of Nano Optoelectronics Research and Technology (INOR), Universiti Sains Malaysia, 11800 USM, Penang, Malaysia
| | - Wei Sea Chang
- Mechanical Engineering Discipline, School of Engineering, Monash University, Bandar Sunway, Selangor 47500, Malaysia
- Department of Mechanical Engineering and Research Center for Intelligent Medical devices, Ming Chi University of Technology, New Taipei City 24301, Taiwan
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14
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Kang S, Jang WS, Morozovska AN, Kwon O, Jin Y, Kim YH, Bae H, Wang C, Yang SH, Belianinov A, Randolph S, Eliseev EA, Collins L, Park Y, Jo S, Jung MH, Go KJ, Cho HW, Choi SY, Jang JH, Kim S, Jeong HY, Lee J, Ovchinnikova OS, Heo J, Kalinin SV, Kim YM, Kim Y. Highly enhanced ferroelectricity in HfO 2-based ferroelectric thin film by light ion bombardment. Science 2022; 376:731-738. [PMID: 35549417 DOI: 10.1126/science.abk3195] [Citation(s) in RCA: 25] [Impact Index Per Article: 12.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/02/2022]
Abstract
Continuous advancement in nonvolatile and morphotropic beyond-Moore electronic devices requires integration of ferroelectric and semiconductor materials. The emergence of hafnium oxide (HfO2)-based ferroelectrics that are compatible with atomic-layer deposition has opened interesting and promising avenues of research. However, the origins of ferroelectricity and pathways to controlling it in HfO2 are still mysterious. We demonstrate that local helium (He) implantation can activate ferroelectricity in these materials. The possible competing mechanisms, including He ion-induced molar volume changes, vacancy redistribution, vacancy generation, and activation of vacancy mobility, are analyzed. These findings both reveal the origins of ferroelectricity in this system and open pathways for nanoengineered binary ferroelectrics.
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Affiliation(s)
- Seunghun Kang
- School of Advanced Materials Science and Engineering, Sungkyunkwan University (SKKU), Suwon 16419, Republic of Korea
| | - Woo-Sung Jang
- Department of Energy Science, Sungkyunkwan University (SKKU), Suwon 16419, Republic of Korea
| | - Anna N Morozovska
- Institute of Physics, National Academy of Sciences of Ukraine, 46, Prospekt. Nauky, 03028 Kyiv, Ukraine
| | - Owoong Kwon
- School of Advanced Materials Science and Engineering, Sungkyunkwan University (SKKU), Suwon 16419, Republic of Korea
| | - Yeongrok Jin
- Department of Physics, Pusan National University, Busan 46241, Republic of Korea
| | - Young-Hoon Kim
- Department of Energy Science, Sungkyunkwan University (SKKU), Suwon 16419, Republic of Korea
| | - Hagyoul Bae
- Samsung Advanced Institute of Technology, Suwon 16678, Republic of Korea
| | - Chenxi Wang
- School of Advanced Materials Science and Engineering, Sungkyunkwan University (SKKU), Suwon 16419, Republic of Korea
| | - Sang-Hyeok Yang
- Department of Energy Science, Sungkyunkwan University (SKKU), Suwon 16419, Republic of Korea
| | - Alex Belianinov
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.,Sandia National Laboratories, Albuquerque, NM 87123, USA
| | - Steven Randolph
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
| | - Eugene A Eliseev
- Institute for Problems of Materials Science, National Academy of Sciences of Ukraine, Krjijanovskogo 3, 03142 Kyiv, Ukraine
| | - Liam Collins
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
| | - Yeehyun Park
- School of Advanced Materials Science and Engineering, Sungkyunkwan University (SKKU), Suwon 16419, Republic of Korea
| | - Sanghyun Jo
- Samsung Advanced Institute of Technology, Suwon 16678, Republic of Korea
| | - Min-Hyoung Jung
- Department of Energy Science, Sungkyunkwan University (SKKU), Suwon 16419, Republic of Korea
| | - Kyoung-June Go
- Department of Materials Science and Engineering, Pohang University of Science and Technology (POSTECH), Pohang 37673, Republic of Korea
| | - Hae Won Cho
- School of Advanced Materials Science and Engineering, Sungkyunkwan University (SKKU), Suwon 16419, Republic of Korea
| | - Si-Young Choi
- Department of Materials Science and Engineering, Pohang University of Science and Technology (POSTECH), Pohang 37673, Republic of Korea
| | - Jae Hyuck Jang
- Center for Scientific Instrumentation, Korea Basic Science Institute (KBSI), Daejeon 34133, Republic of Korea
| | - Sunkook Kim
- School of Advanced Materials Science and Engineering, Sungkyunkwan University (SKKU), Suwon 16419, Republic of Korea
| | - Hu Young Jeong
- Graduate School of Semiconductor Materials and Devices Engineering, Ulsan National Institute of Science and Technology (UNIST), Ulsan 44919, Republic of Korea
| | - Jaekwang Lee
- Department of Physics, Pusan National University, Busan 46241, Republic of Korea
| | - Olga S Ovchinnikova
- Computational Sciences and Engineering Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
| | - Jinseong Heo
- Samsung Advanced Institute of Technology, Suwon 16678, Republic of Korea
| | - Sergei V Kalinin
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.,Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN 37920, USA
| | - Young-Min Kim
- Department of Energy Science, Sungkyunkwan University (SKKU), Suwon 16419, Republic of Korea
| | - Yunseok Kim
- School of Advanced Materials Science and Engineering, Sungkyunkwan University (SKKU), Suwon 16419, Republic of Korea
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15
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Killgore JP, Robins L, Collins L. Electrostatically-blind quantitative piezoresponse force microscopy free of distributed-force artifacts. NANOSCALE ADVANCES 2022; 4:2036-2045. [PMID: 36133417 PMCID: PMC9418616 DOI: 10.1039/d2na00046f] [Citation(s) in RCA: 3] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 01/19/2022] [Accepted: 03/15/2022] [Indexed: 06/16/2023]
Abstract
The presence of electrostatic forces and associated artifacts complicates the interpretation of piezoresponse force microscopy (PFM) and electrochemical strain microscopy (ESM). Eliminating these artifacts provides an opportunity for precisely mapping domain wall structures and dynamics, accurately quantifying local piezoelectric coupling coefficients, and reliably investigating hysteretic processes at the single nanometer scale to determine properties and mechanisms which underly important applications including computing, batteries and biology. Here we exploit the existence of an electrostatic blind spot (ESBS) along the length of the cantilever, due to the distributed nature of the electrostatic force, which can be universally used to separate unwanted long range electrostatic contributions from short range electromechanical responses of interest. The results of ESBS-PFM are compared to state-of-the-art interferometric displacement sensing PFM, showing excellent agreement above their respective noise floors. Ultimately, ESBS-PFM allows for absolute quantification of piezoelectric coupling coefficients independent of probe, lab or experimental conditions. As such, we expect the widespread adoption of EBSB-PFM to be a paradigm shift in the quantification of nanoscale electromechanics.
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Affiliation(s)
- Jason P Killgore
- Applied Chemicals and Materials Division, National Institute of Standards and Technology Boulder CO USA
| | - Larry Robins
- Applied Chemicals and Materials Division, National Institute of Standards and Technology Boulder CO USA
| | - Liam Collins
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory Oak Ridge TN USA
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16
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Wan Y, Hu T, Mao X, Fu J, Yuan K, Song Y, Gan X, Xu X, Xue M, Cheng X, Huang C, Yang J, Dai L, Zeng H, Kan E. Room-Temperature Ferroelectricity in 1T^{'}-ReS_{2} Multilayers. PHYSICAL REVIEW LETTERS 2022; 128:067601. [PMID: 35213175 DOI: 10.1103/physrevlett.128.067601] [Citation(s) in RCA: 31] [Impact Index Per Article: 15.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/16/2021] [Accepted: 12/23/2021] [Indexed: 05/27/2023]
Abstract
van der Waals materials possess an innate layer degree of freedom and thus are excellent candidates for exploring emergent two-dimensional ferroelectricity induced by interlayer translation. However, despite being theoretically predicted, experimental realization of this type of ferroelectricity is scarce at the current stage. Here, we demonstrate robust sliding ferroelectricity in semiconducting 1T^{'}-ReS_{2} multilayers via a combined study of theory and experiment. Room-temperature vertical ferroelectricity is observed in two-dimensional 1T^{'}-ReS_{2} with layer number N≥2. The electric polarization stems from the uncompensated charge transfer between layers and can be switched by interlayer sliding. For bilayer 1T^{'}-ReS_{2}, the ferroelectric transition temperature is estimated to be ∼405 K from the second harmonic generation measurements. Our results highlight the importance of interlayer engineering in the realization of atomic-scale ferroelectricity.
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Affiliation(s)
- Yi Wan
- MIIT Key Laboratory of Semiconductor Microstructure and Quantum Sensing, and Department of Applied Physics, Nanjing University of Science and Technology, Nanjing 210094, China
- State Key Laboratory for Artificial Microstructure & Mesoscopic Physics, School of Physics, Peking University, Beijing 100871, China
| | - Ting Hu
- MIIT Key Laboratory of Semiconductor Microstructure and Quantum Sensing, and Department of Applied Physics, Nanjing University of Science and Technology, Nanjing 210094, China
| | - Xiaoyu Mao
- International Center for Quantum Design of Functional Materials (ICQD), Hefei National Laboratory for Physical Sciences at the Microscale, and Department of Physics, University of Science and Technology of China, Hefei 230026, China
| | - Jun Fu
- International Center for Quantum Design of Functional Materials (ICQD), Hefei National Laboratory for Physical Sciences at the Microscale, and Department of Physics, University of Science and Technology of China, Hefei 230026, China
| | - Kai Yuan
- State Key Laboratory for Artificial Microstructure & Mesoscopic Physics, School of Physics, Peking University, Beijing 100871, China
- Collaborative Innovation Center of Quantum Matter, Beijing 100871, China
| | - Yu Song
- MOE Key Laboratory of Material Physics and Chemistry under Extraordinary Conditions, and Shaanxi Key Laboratory of Optical Information Technology, School of Science, Northwestern Polytechnical University, Xi'an 710072, China
| | - Xuetao Gan
- MOE Key Laboratory of Material Physics and Chemistry under Extraordinary Conditions, and Shaanxi Key Laboratory of Optical Information Technology, School of Science, Northwestern Polytechnical University, Xi'an 710072, China
| | - Xiaolong Xu
- State Key Laboratory for Artificial Microstructure & Mesoscopic Physics, School of Physics, Peking University, Beijing 100871, China
| | - Mingzhu Xue
- State Key Laboratory for Artificial Microstructure & Mesoscopic Physics, School of Physics, Peking University, Beijing 100871, China
| | - Xing Cheng
- State Key Laboratory for Artificial Microstructure & Mesoscopic Physics, School of Physics, Peking University, Beijing 100871, China
| | - Chengxi Huang
- MIIT Key Laboratory of Semiconductor Microstructure and Quantum Sensing, and Department of Applied Physics, Nanjing University of Science and Technology, Nanjing 210094, China
| | - Jinbo Yang
- State Key Laboratory for Artificial Microstructure & Mesoscopic Physics, School of Physics, Peking University, Beijing 100871, China
- Collaborative Innovation Center of Quantum Matter, Beijing 100871, China
| | - Lun Dai
- State Key Laboratory for Artificial Microstructure & Mesoscopic Physics, School of Physics, Peking University, Beijing 100871, China
- Collaborative Innovation Center of Quantum Matter, Beijing 100871, China
| | - Hualing Zeng
- International Center for Quantum Design of Functional Materials (ICQD), Hefei National Laboratory for Physical Sciences at the Microscale, and Department of Physics, University of Science and Technology of China, Hefei 230026, China
| | - Erjun Kan
- MIIT Key Laboratory of Semiconductor Microstructure and Quantum Sensing, and Department of Applied Physics, Nanjing University of Science and Technology, Nanjing 210094, China
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17
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Zeng Q, Huang Q, Wang H, Li C, Fan Z, Chen D, Cheng Y, Zeng K. Breaking the Fundamental Limitations of Nanoscale Ferroelectric Characterization: Non-Contact Heterodyne Electrostrain Force Microscopy. SMALL METHODS 2021; 5:e2100639. [PMID: 34927968 DOI: 10.1002/smtd.202100639] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/14/2021] [Revised: 09/09/2021] [Indexed: 06/14/2023]
Abstract
Perceiving nanoscale ferroelectric phenomena from real space is of great importance for elucidating underlying ferroelectric physics. During the past decades, nanoscale ferroelectric characterization has mainly relied on the Piezoresponse Force Microscopy (PFM) invented in 1992, however, the fundamental limitations of PFM have made the nanoscale ferroelectric studies encounter significant bottlenecks. In this study, a high-resolution non-contact ferroelectric measurement, named Non-Contact Heterodyne Electrostrain Force Microscopy (NC-HEsFM), is introduced. It is demonstrated that NC-HEsFM can operate on multiple eigenmodes to perform ideal high-resolution ferroelectric domain mapping, standard ferroelectric hysteresis loop measurement, and controllable domain manipulation. By using a quartz tuning fork (QTF) sensor, multi-frequency operation, and heterodyne detection schemes, NC-HEsFM achieves a real non-contact yet non-destructive ferroelectric characterization with negligible electrostatic force effect and hence breaks the fundamental limitations of the conventional PFM. It is believed that NC-HEsFM can be extensively used in various ferroelectric or piezoelectric studies with providing substantially improved characterization performance. Meanwhile, the QTF-based force detection makes NC-HEsFM highly compatible for high-vacuum and low-temperature environments, providing ideal conditions for investigating the intrinsic ferroelectric phenomena with the possibility of achieving an atomically resolved ferroelectric characterization.
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Affiliation(s)
- Qibin Zeng
- Department of Mechanical Engineering, National University of Singapore, Singapore, 117576, Singapore
| | - Qicheng Huang
- Institute for Advanced Materials, South China Academy of Advanced Optoelectronics, South China Normal University, Guangzhou, 510006, China
| | - Hongli Wang
- Department of Mechanical Engineering, National University of Singapore, Singapore, 117576, Singapore
- The Key Lab of Guangdong for Modern Surface Engineering Technology, National Engineering Laboratory for Modern Materials Surface Engineering Technology, Institute of New Materials, Guangdong Academy of Sciences, Guangzhou, 510650, China
| | - Caiwen Li
- Institute for Advanced Materials, South China Academy of Advanced Optoelectronics, South China Normal University, Guangzhou, 510006, China
- Guangdong Provincial Key Laboratory of Optical Information Materials and Technology, South China Academy of Advanced Optoelectronics, South China Normal University, Guangzhou, 510006, China
| | - Zhen Fan
- Institute for Advanced Materials, South China Academy of Advanced Optoelectronics, South China Normal University, Guangzhou, 510006, China
| | - Deyang Chen
- Institute for Advanced Materials, South China Academy of Advanced Optoelectronics, South China Normal University, Guangzhou, 510006, China
- Guangdong Provincial Key Laboratory of Optical Information Materials and Technology, South China Academy of Advanced Optoelectronics, South China Normal University, Guangzhou, 510006, China
| | - Yuan Cheng
- Institute of High-Performance Computing, Agency for Science Technology and Research, Singapore, 138632, Singapore
- Monash Suzhou Research Institute, Suzhou, 215123, China
| | - Kaiyang Zeng
- Department of Mechanical Engineering, National University of Singapore, Singapore, 117576, Singapore
- NUS (Suzhou) Research Institute (NUSRI), Suzhou, 215123, China
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18
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Badur S, Renz D, Cronau M, Göddenhenrich T, Dietzel D, Roling B, Schirmeisen A. Characterization of Vegard strain related to exceptionally fast Cu-chemical diffusion in Cu[Formula: see text]Mo[Formula: see text]S[Formula: see text] by an advanced electrochemical strain microscopy method. Sci Rep 2021; 11:18133. [PMID: 34518556 PMCID: PMC8438055 DOI: 10.1038/s41598-021-96602-2] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/10/2021] [Accepted: 08/04/2021] [Indexed: 12/04/2022] Open
Abstract
Electrochemical strain microscopy (ESM) has been developed with the aim of measuring Vegard strains in mixed ionic-electronic conductors (MIECs), such as electrode materials for Li-ion batteries, caused by local changes in the chemical composition. In this technique, a voltage-biased AFM tip is used in contact resonance mode. However, extracting quantitative strain information from ESM experiments is highly challenging due to the complexity of the signal generation process. In particular, electrostatic interactions between tip and sample contribute significantly to the measured ESM signals, and the separation of Vegard strain-induced signal contributions from electrostatically induced signal contributions is by no means a trivial task. Recently, we have published a compensation method for eliminating frequency-independent electrostatic contributions in ESM measurements. Here, we demonstrate the potential of this method for detecting Vegard strain in MIECs by choosing Cu[Formula: see text]Mo[Formula: see text]S[Formula: see text] as a model-type MIEC with an exceptionally high Cu chemical diffusion coefficient. Even for this material, Vegard strains are only measurable around and above room-temperature and with proper elimination of electrostatics. The analyis of the measured Vegards strains gives strong indication that due to a high charge transfer resistance at the tip/interface, the local Cu concentration variations are much smaller than predicted by the local Nernst equation. This suggests that charge transfer resistances have to be analyzed in more detail in future ESM studies.
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Affiliation(s)
- Sebastian Badur
- Institute of Applied Physics, Justus-Liebig-Universität Giessen, 35392 Giessen, Germany
| | - Diemo Renz
- Department of Chemistry, Philipps-Universität Marburg, Hans-Meerwein-Straße 4, 35032 Marburg, Germany
| | - Marvin Cronau
- Department of Chemistry, Philipps-Universität Marburg, Hans-Meerwein-Straße 4, 35032 Marburg, Germany
| | - Thomas Göddenhenrich
- Institute of Applied Physics, Justus-Liebig-Universität Giessen, 35392 Giessen, Germany
| | - Dirk Dietzel
- Institute of Applied Physics, Justus-Liebig-Universität Giessen, 35392 Giessen, Germany
- Center for Materials Research, Justus-Liebig-Universität Giessen, 35392 Giessen, Germany
| | - Bernhard Roling
- Department of Chemistry, Philipps-Universität Marburg, Hans-Meerwein-Straße 4, 35032 Marburg, Germany
| | - André Schirmeisen
- Institute of Applied Physics, Justus-Liebig-Universität Giessen, 35392 Giessen, Germany
- Center for Materials Research, Justus-Liebig-Universität Giessen, 35392 Giessen, Germany
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19
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Labardi M, Capaccioli S. Tuning-fork-based piezoresponse force microscopy. NANOTECHNOLOGY 2021; 32:445701. [PMID: 34284362 DOI: 10.1088/1361-6528/ac1634] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/03/2021] [Accepted: 07/20/2021] [Indexed: 06/13/2023]
Abstract
Surface displacements of a few picometers, occurring after application of an electric potential to piezoelectric materials, can be detected and mapped with nanometer-scale lateral resolution by scanning probe methods, the most notable being piezoresponse force microscopy (PFM). Yet, absolute determination of such displacements, giving access for instance to materials' piezoelectric coefficients, are hindered by both mechanical and electrostatic side-effects, requiring complex experimental and/or post-processing procedures for carrying out reliable results. The employment of quartz tuning-fork force sensors in an intermittent contact mode PFM is able to provide measurements of electrically-induced surface displacements that are not influenced by electrostatic side-effects typical of more conventional cantilever-based PFM. The method is shown to yield piezoeffect mapping on standard ferroelectric test crystals (periodically-poled lithium niobate and triglycine sulfate), as well as on a ferroelectric polymer (PVDF), with no visible influence from the applied dc electric potential.
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Affiliation(s)
- M Labardi
- CNR-IPCF, Sede Secondaria di Pisa, c/o Physics Department, University of Pisa, Largo Pontecorvo 3, I-56127 Pisa, Italy
| | - S Capaccioli
- CNR-IPCF, Sede Secondaria di Pisa, c/o Physics Department, University of Pisa, Largo Pontecorvo 3, I-56127 Pisa, Italy
- Physics Department, University of Pisa, Largo Pontecorvo 3, I-56127 Pisa, Italy
- CISUP, Centro per l'Integrazione della Strumentazione dell'Università di Pisa, Lungarno Pacinotti 43, I-56126 Pisa, Italy
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20
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Liu Y, Trimby P, Collins L, Ahmadi M, Winkelmann A, Proksch R, Ovchinnikova OS. Correlating Crystallographic Orientation and Ferroic Properties of Twin Domains in Metal Halide Perovskites. ACS NANO 2021; 15:7139-7148. [PMID: 33770442 DOI: 10.1021/acsnano.1c00310] [Citation(s) in RCA: 3] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/12/2023]
Abstract
Metal halide perovskite (MHP) solar cells have attracted worldwide research interest. Although it has been well established that grain, grain boundary, and grain facet affect MHPs optoelectronic properties, less is known about subgrain structures. Recently, MHP twin stripes, a subgrain feature, have stimulated extensive discussion due to the potential for both beneficial and detrimental effects of ferroelectricity on optoelectronic properties. Connecting the ferroic behavior of twin stripes in MHPs with crystal orientation will be a vital step to understand the ferroic nature and the effects of twin stripes. In this work, we studied the crystallographic orientation and ferroic properties of CH3NH3PbI3 twin stripes, using electron backscatter diffraction (EBSD) and advanced piezoresponse force microscopy (PFM), respectively. Using EBSD, we discovered that the orientation relationship across the twin walls in CH3NH3PbI3 is a 90° rotation about ⟨1̅1̅0⟩, with the ⟨030⟩ and ⟨111⟩ directions parallel to the direction normal to the surface. By careful inspection of CH3NH3PbI3 PFM results including in-plane and out-of-plane PFM measurements, we demonstrate some nonferroelectric contributions to the PFM responses of this CH3NH3PbI3 sample, suggesting that the PFM signal in this CH3NH3PbI3 sample is affected by nonferroelectric and nonpiezoelectric forces. If there is piezoelectric response, it is below the detection sensitivity of our interferometric displacement sensor PFM (<0.615 pm/V). Overall, this work offers an integrated picture describing the crystallographic orientations and the origin of PFM signal of MHPs twin stripes, which is critical to understanding the ferroicity in MHPs.
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Affiliation(s)
- Yongtao Liu
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37830, United States
- Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996, United States
| | - Patrick Trimby
- Oxford Instruments Nanoanalysis, High Wycombe, Buckinghamshire HP123SE, United Kingdom
| | - Liam Collins
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37830, United States
| | - Mahshid Ahmadi
- Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996, United States
| | - Aimo Winkelmann
- Academic Centre for Materials and Nanotechnology (ACMiN), AGH University of Science and Technology, 30-059 Kraków, Poland
| | - Roger Proksch
- Asylum Research, An Oxford Instruments Company, Santa Barbara, California 93117, United States
| | - Olga S Ovchinnikova
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37830, United States
- Computational Sciences and Engineering Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
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21
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Yu J, Giridharagopal R, Li Y, Xie K, Li J, Cao T, Xu X, Ginger DS. Imaging Graphene Moiré Superlattices via Scanning Kelvin Probe Microscopy. NANO LETTERS 2021; 21:3280-3286. [PMID: 33749279 DOI: 10.1021/acs.nanolett.1c00609] [Citation(s) in RCA: 6] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/25/2023]
Abstract
Moiré superlattices in van der Waals heterostructures are gaining increasing attention because they offer new opportunities to tailor and explore unique electronic phenomena. Using a combination of lateral piezoresponse force microscopy (LPFM) and scanning Kelvin probe microscopy (SKPM), we directly correlate ABAB and ABCA stacked graphene with local surface potential. We find that the surface potential of the ABCA domains is ∼15 mV higher (smaller work function) than that of the ABAB domains. First-principles calculations show that the different work functions between ABCA and ABAB domains arise from the stacking-dependent electronic structure. Moreover, while the moiré superlattice visualized by LPFM can change with time, imaging the surface potential distribution via SKPM appears more stable, enabling the mapping of ABAB and ABCA domains without tip-sample contact-induced effects. Our results provide a new means to visualize and probe local domain stacking in moiré superlattices along with its impact on electronic properties.
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Affiliation(s)
- Junxi Yu
- Department of Chemistry, University of Washington, Seattle, Washington 98195, United States
- Key Laboratory of Low Dimensional Materials and Application Technology of Ministry of Education, and School of Materials Science and Engineering, Xiangtan University, Xiangtan 411105, Hunan, China
| | - Rajiv Giridharagopal
- Department of Chemistry, University of Washington, Seattle, Washington 98195, United States
| | - Yuhao Li
- Department of Physics, University of Washington, Seattle, Washington 98195, United States
| | - Kaichen Xie
- Department of Materials Science and Engineering, University of Washington, Seattle, Washington 98195, United States
| | - Jiangyu Li
- Department of Materials Science and Engineering, Southern University of Science and Technology, Shenzhen 518055, Guangdong, China
| | - Ting Cao
- Department of Materials Science and Engineering, University of Washington, Seattle, Washington 98195, United States
| | - Xiaodong Xu
- Department of Physics, University of Washington, Seattle, Washington 98195, United States
| | - David S Ginger
- Department of Chemistry, University of Washington, Seattle, Washington 98195, United States
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22
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Zeng Q, Wang H, Xiong Z, Huang Q, Lu W, Sun K, Fan Z, Zeng K. Nanoscale Ferroelectric Characterization with Heterodyne Megasonic Piezoresponse Force Microscopy. ADVANCED SCIENCE (WEINHEIM, BADEN-WURTTEMBERG, GERMANY) 2021; 8:2003993. [PMID: 33898182 PMCID: PMC8061351 DOI: 10.1002/advs.202003993] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/20/2020] [Revised: 01/10/2021] [Indexed: 05/29/2023]
Abstract
Piezoresponse force microscopy (PFM), as a powerful nanoscale characterization technique, has been extensively utilized to elucidate diverse underlying physics of ferroelectricity. However, intensive studies of conventional PFM have revealed a growing number of concerns and limitations which are largely challenging its validity and applications. In this study, an advanced PFM technique is reported, namely heterodyne megasonic piezoresponse force microscopy (HM-PFM), which uses 106 to 108 Hz high-frequency excitation and heterodyne method to measure the piezoelectric strain at nanoscale. It is found that HM-PFM can unambiguously provide standard ferroelectric domain and hysteresis loop measurements, and an effective domain characterization with excitation frequency up to ≈110 MHz is demonstrated. Most importantly, owing to the high-frequency and heterodyne scheme, the contributions from both electrostatic force and electrochemical strain can be significantly minimized in HM-PFM. Furthermore, a special measurement of difference-frequency piezoresponse frequency spectrum (DFPFS) is developed on HM-PFM and a distinct DFPFS characteristic is observed on the materials with piezoelectricity. By performing DFPFS measurement, a truly existed but very weak electromechanical coupling in CH3NH3PbI3 perovskite is revealed. It is believed that HM-PFM can be an excellent candidate for the ferroelectric or piezoelectric studies where conventional PFM results are highly controversial.
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Affiliation(s)
- Qibin Zeng
- Department of Mechanical EngineeringNational University of SingaporeSingapore117576Singapore
| | - Hongli Wang
- Department of Mechanical EngineeringNational University of SingaporeSingapore117576Singapore
- The Key Lab of Guangdong for Modern Surface Engineering TechnologyNational Engineering Laboratory for Modern Materials Surface Engineering TechnologyInstitute of New Materials, Guangdong Academy of ScienceGuangzhou510650China
| | - Zhuang Xiong
- MOE Key Laboratory of Low‐Grade Energy Utilization Technologies and Systems, School of Energy & Power EngineeringChongqing UniversityChongqing400044China
| | - Qicheng Huang
- Institute for Advanced Materials, South China Academy of Advanced OptoelectronicsSouth China Normal UniversityGuangzhou510006China
| | - Wanheng Lu
- Department of Electrical and Computer EngineeringNational University of SingaporeSingapore117583Singapore
| | - Kuan Sun
- MOE Key Laboratory of Low‐Grade Energy Utilization Technologies and Systems, School of Energy & Power EngineeringChongqing UniversityChongqing400044China
| | - Zhen Fan
- Institute for Advanced Materials, South China Academy of Advanced OptoelectronicsSouth China Normal UniversityGuangzhou510006China
| | - Kaiyang Zeng
- Department of Mechanical EngineeringNational University of SingaporeSingapore117576Singapore
- NUS (Suzhou) Research Institute (NUSRI)Suzhou215123China
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23
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Hong S, Liow CH, Yuk JM, Byon HR, Yang Y, Cho E, Yeom J, Park G, Kang H, Kim S, Shim Y, Na M, Jeong C, Hwang G, Kim H, Kim H, Eom S, Cho S, Jun H, Lee Y, Baucour A, Bang K, Kim M, Yun S, Ryu J, Han Y, Jetybayeva A, Choi PP, Agar JC, Kalinin SV, Voorhees PW, Littlewood P, Lee HM. Reducing Time to Discovery: Materials and Molecular Modeling, Imaging, Informatics, and Integration. ACS NANO 2021; 15:3971-3995. [PMID: 33577296 DOI: 10.1021/acsnano.1c00211] [Citation(s) in RCA: 14] [Impact Index Per Article: 4.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/28/2023]
Abstract
Multiscale and multimodal imaging of material structures and properties provides solid ground on which materials theory and design can flourish. Recently, KAIST announced 10 flagship research fields, which include KAIST Materials Revolution: Materials and Molecular Modeling, Imaging, Informatics and Integration (M3I3). The M3I3 initiative aims to reduce the time for the discovery, design and development of materials based on elucidating multiscale processing-structure-property relationship and materials hierarchy, which are to be quantified and understood through a combination of machine learning and scientific insights. In this review, we begin by introducing recent progress on related initiatives around the globe, such as the Materials Genome Initiative (U.S.), Materials Informatics (U.S.), the Materials Project (U.S.), the Open Quantum Materials Database (U.S.), Materials Research by Information Integration Initiative (Japan), Novel Materials Discovery (E.U.), the NOMAD repository (E.U.), Materials Scientific Data Sharing Network (China), Vom Materials Zur Innovation (Germany), and Creative Materials Discovery (Korea), and discuss the role of multiscale materials and molecular imaging combined with machine learning in realizing the vision of M3I3. Specifically, microscopies using photons, electrons, and physical probes will be revisited with a focus on the multiscale structural hierarchy, as well as structure-property relationships. Additionally, data mining from the literature combined with machine learning will be shown to be more efficient in finding the future direction of materials structures with improved properties than the classical approach. Examples of materials for applications in energy and information will be reviewed and discussed. A case study on the development of a Ni-Co-Mn cathode materials illustrates M3I3's approach to creating libraries of multiscale structure-property-processing relationships. We end with a future outlook toward recent developments in the field of M3I3.
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Affiliation(s)
- Seungbum Hong
- Department of Materials Science and Engineering, Korea Advanced Institute of Science and Engineering (KAIST), Daejeon 34141, Republic of Korea
- KAIST Institute for NanoCentury (KINC), Korea Advanced Institute of Science and Engineering (KAIST), Daejeon, 34141, Republic of Korea
| | - Chi Hao Liow
- Department of Materials Science and Engineering, Korea Advanced Institute of Science and Engineering (KAIST), Daejeon 34141, Republic of Korea
| | - Jong Min Yuk
- Department of Materials Science and Engineering, Korea Advanced Institute of Science and Engineering (KAIST), Daejeon 34141, Republic of Korea
| | - Hye Ryung Byon
- Department of Chemistry, Korea Advanced Institute of Science and Engineering (KAIST), Daejeon 34141, Republic of Korea
| | - Yongsoo Yang
- Department of Physics, Korea Advanced Institute of Science and Engineering (KAIST), Daejeon 34141, Republic of Korea
| | - EunAe Cho
- Department of Materials Science and Engineering, Korea Advanced Institute of Science and Engineering (KAIST), Daejeon 34141, Republic of Korea
| | - Jiwon Yeom
- Department of Materials Science and Engineering, Korea Advanced Institute of Science and Engineering (KAIST), Daejeon 34141, Republic of Korea
| | - Gun Park
- Department of Materials Science and Engineering, Korea Advanced Institute of Science and Engineering (KAIST), Daejeon 34141, Republic of Korea
| | - Hyeonmuk Kang
- Department of Materials Science and Engineering, Korea Advanced Institute of Science and Engineering (KAIST), Daejeon 34141, Republic of Korea
| | - Seunggu Kim
- Department of Chemistry, Korea Advanced Institute of Science and Engineering (KAIST), Daejeon 34141, Republic of Korea
| | - Yoonsu Shim
- Department of Materials Science and Engineering, Korea Advanced Institute of Science and Engineering (KAIST), Daejeon 34141, Republic of Korea
| | - Moony Na
- Department of Chemistry, Korea Advanced Institute of Science and Engineering (KAIST), Daejeon 34141, Republic of Korea
| | - Chaehwa Jeong
- Department of Physics, Korea Advanced Institute of Science and Engineering (KAIST), Daejeon 34141, Republic of Korea
| | - Gyuseong Hwang
- Department of Materials Science and Engineering, Korea Advanced Institute of Science and Engineering (KAIST), Daejeon 34141, Republic of Korea
| | - Hongjun Kim
- Department of Materials Science and Engineering, Korea Advanced Institute of Science and Engineering (KAIST), Daejeon 34141, Republic of Korea
| | - Hoon Kim
- Department of Materials Science and Engineering, Korea Advanced Institute of Science and Engineering (KAIST), Daejeon 34141, Republic of Korea
| | - Seongmun Eom
- Department of Materials Science and Engineering, Korea Advanced Institute of Science and Engineering (KAIST), Daejeon 34141, Republic of Korea
| | - Seongwoo Cho
- Department of Materials Science and Engineering, Korea Advanced Institute of Science and Engineering (KAIST), Daejeon 34141, Republic of Korea
| | - Hosun Jun
- Department of Materials Science and Engineering, Korea Advanced Institute of Science and Engineering (KAIST), Daejeon 34141, Republic of Korea
| | - Yongju Lee
- Department of Materials Science and Engineering, Korea Advanced Institute of Science and Engineering (KAIST), Daejeon 34141, Republic of Korea
| | - Arthur Baucour
- Department of Materials Science and Engineering, Korea Advanced Institute of Science and Engineering (KAIST), Daejeon 34141, Republic of Korea
| | - Kihoon Bang
- Department of Materials Science and Engineering, Korea Advanced Institute of Science and Engineering (KAIST), Daejeon 34141, Republic of Korea
| | - Myungjoon Kim
- Department of Materials Science and Engineering, Korea Advanced Institute of Science and Engineering (KAIST), Daejeon 34141, Republic of Korea
| | - Seokjung Yun
- Department of Materials Science and Engineering, Korea Advanced Institute of Science and Engineering (KAIST), Daejeon 34141, Republic of Korea
| | - Jeongjae Ryu
- Department of Materials Science and Engineering, Korea Advanced Institute of Science and Engineering (KAIST), Daejeon 34141, Republic of Korea
| | - Youngjoon Han
- Department of Materials Science and Engineering, Korea Advanced Institute of Science and Engineering (KAIST), Daejeon 34141, Republic of Korea
| | - Albina Jetybayeva
- Department of Materials Science and Engineering, Korea Advanced Institute of Science and Engineering (KAIST), Daejeon 34141, Republic of Korea
| | - Pyuck-Pa Choi
- Department of Materials Science and Engineering, Korea Advanced Institute of Science and Engineering (KAIST), Daejeon 34141, Republic of Korea
| | - Joshua C Agar
- Department of Materials Science and Engineering, Lehigh University, Bethlehem, Pennsylvania 18015, United States
| | - Sergei V Kalinin
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
| | - Peter W Voorhees
- Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208, United States
| | - Peter Littlewood
- James Franck Institute, University of Chicago, Chicago, Illinois 60637, United States
| | - Hyuck Mo Lee
- Department of Materials Science and Engineering, Korea Advanced Institute of Science and Engineering (KAIST), Daejeon 34141, Republic of Korea
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24
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Mahmood A, Echtenkamp W, Street M, Wang JL, Cao S, Komesu T, Dowben PA, Buragohain P, Lu H, Gruverman A, Parthasarathy A, Rakheja S, Binek C. Voltage controlled Néel vector rotation in zero magnetic field. Nat Commun 2021; 12:1674. [PMID: 33723249 PMCID: PMC7960997 DOI: 10.1038/s41467-021-21872-3] [Citation(s) in RCA: 11] [Impact Index Per Article: 3.7] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/25/2020] [Accepted: 02/11/2021] [Indexed: 11/16/2022] Open
Abstract
Multi-functional thin films of boron (B) doped Cr2O3 exhibit voltage-controlled and nonvolatile Néel vector reorientation in the absence of an applied magnetic field, H. Toggling of antiferromagnetic states is demonstrated in prototype device structures at CMOS compatible temperatures between 300 and 400 K. The boundary magnetization associated with the Néel vector orientation serves as state variable which is read via magnetoresistive detection in a Pt Hall bar adjacent to the B:Cr2O3 film. Switching of the Hall voltage between zero and non-zero values implies Néel vector rotation by 90 degrees. Combined magnetometry, spin resolved inverse photoemission, electric transport and scanning probe microscopy measurements reveal B-dependent TN and resistivity enhancement, spin-canting, anisotropy reduction, dynamic polarization hysteresis and gate voltage dependent orientation of boundary magnetization. The combined effect enables H = 0, voltage controlled, nonvolatile Néel vector rotation at high-temperature. Theoretical modeling estimates switching speeds of about 100 ps making B:Cr2O3 a promising multifunctional single-phase material for energy efficient nonvolatile CMOS compatible memory applications.
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Affiliation(s)
- Ather Mahmood
- Department of Physics & Astronomy and the Nebraska Center for Materials and Nanoscience, University of Nebraska-Lincoln, Lincoln, NE, USA
| | - Will Echtenkamp
- Department of Physics & Astronomy and the Nebraska Center for Materials and Nanoscience, University of Nebraska-Lincoln, Lincoln, NE, USA
| | - Mike Street
- Department of Physics & Astronomy and the Nebraska Center for Materials and Nanoscience, University of Nebraska-Lincoln, Lincoln, NE, USA
| | - Jun-Lei Wang
- Department of Physics & Astronomy and the Nebraska Center for Materials and Nanoscience, University of Nebraska-Lincoln, Lincoln, NE, USA
| | - Shi Cao
- Department of Physics & Astronomy and the Nebraska Center for Materials and Nanoscience, University of Nebraska-Lincoln, Lincoln, NE, USA
| | - Takashi Komesu
- Department of Physics & Astronomy and the Nebraska Center for Materials and Nanoscience, University of Nebraska-Lincoln, Lincoln, NE, USA
| | - Peter A Dowben
- Department of Physics & Astronomy and the Nebraska Center for Materials and Nanoscience, University of Nebraska-Lincoln, Lincoln, NE, USA
| | - Pratyush Buragohain
- Department of Physics & Astronomy and the Nebraska Center for Materials and Nanoscience, University of Nebraska-Lincoln, Lincoln, NE, USA
| | - Haidong Lu
- Department of Physics & Astronomy and the Nebraska Center for Materials and Nanoscience, University of Nebraska-Lincoln, Lincoln, NE, USA
| | - Alexei Gruverman
- Department of Physics & Astronomy and the Nebraska Center for Materials and Nanoscience, University of Nebraska-Lincoln, Lincoln, NE, USA
| | - Arun Parthasarathy
- Department of Electrical Engineering, New York University, Brooklyn, NY, USA
| | - Shaloo Rakheja
- Holonyak Micro and Nanotechnology Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL, USA
| | - Christian Binek
- Department of Physics & Astronomy and the Nebraska Center for Materials and Nanoscience, University of Nebraska-Lincoln, Lincoln, NE, USA.
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25
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Pryshchepa O, Pomastowski P, Buszewski B. Silver nanoparticles: Synthesis, investigation techniques, and properties. Adv Colloid Interface Sci 2020; 284:102246. [PMID: 32977142 DOI: 10.1016/j.cis.2020.102246] [Citation(s) in RCA: 95] [Impact Index Per Article: 23.8] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/19/2020] [Revised: 08/15/2020] [Accepted: 08/18/2020] [Indexed: 12/19/2022]
Abstract
The unique silver properties, especially in the form of nanoparticles (NPs), allow to utilize them in numerous applications. For instance, Ag NPs can be utilized for the production of electronic and solar energy harvesting devices, in advanced analytical techniques (NALDI, SERS), catalysis and photocatalysis. Moreover, the Ag NPs can be useful in medicine for bioimaging, biosensing as well as in antibacterial and anticancer therapies. The Ag NPs utilization requires comprehensive knowledge about their features regarding the synthesis approaches as well as exploitation conditions. Unfortunately, a large number of scientific articles provide only restricted information according to the objects under investigation. Additionally, the results could be affected by artifacts introduced with exploited equipment, the utilized technique or sample preparation stages. However, it is rather difficult to get information about problems, which may occur during the studies. Thus, the review provides information about novel trends in the Ag NPs synthesis, among which the physical, chemical, and biological approaches can be found. Basic information about approaches for the control of critical parameters of NPs, i.e. size and shape, was also revealed. It was shown, that the reducing agent, stabilizer, the synthesis environment, including trace ions, have a direct impact on the Ag NPs properties. Further, the capabilities of modern analytical techniques for Ag NPs and nanocomposites investigations were shown, among other microscopic (optical, TEM, SEM, STEM, AFM), spectroscopic (UV-Vis, IR, Raman, NMR, electron spectroscopy, XRD), spectrometric (MALDI-TOF MS, SIMS, ICP-MS), and separation (CE, FFF, gel electrophoresis) techniques were described. The limitations and possible artifacts of the techniques were mentioned. A large number of presented techniques is a distinguishing feature, which makes the review different from others. Finally, the physicochemical and biological properties of Ag NPs were demonstrated. It was shown, that Ag NPs features are dependent on their basic parameters, such as size, shape, chemical composition, etc. At the end of the review, the modern theories of the Ag NPs toxic mechanism were shown in a way that has never been presented before. The review should be helpful for scientists in their own studies, as it can help to prepare experiments more carefully.
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26
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Collins L, Celano U. Revealing Antiferroelectric Switching and Ferroelectric Wakeup in Hafnia by Advanced Piezoresponse Force Microscopy. ACS APPLIED MATERIALS & INTERFACES 2020; 12:41659-41665. [PMID: 32870659 DOI: 10.1021/acsami.0c07809] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
Abstract
Hafnium oxide (HfO2)-based ferroelectrics offer remarkable promise for memory and logic devices in view of their compatibility with traditional silicon complementary metal oxide semiconductor (CMOS) technology, high switchable polarization, good endurance, and thickness scalability. These factors have led to a steep rise in the level of research on HfO2 over the past number of years. While measurements on capacitors are promising for understanding macroscopic effects, many open questions regarding the emergence of ferroelectricity and electric field cycling behaviors remain. Continued progress requires information regarding the nanoscale ferroelectric behaviors on the bare surface (i.e., without encapsulation), which is notably absent. To overcome this barrier, we have applied complementary modes of piezoresponse force microscopy with the goal of directly and quantitatively sensing nanoscale ferroelectric behaviors in bare HfO2 thin films. Our results on 8 nm Si-doped HfO2 reveal nanoscale domains of local remnant polarization states exhibiting a weak piezoelectric coupling (deff) in the range 0.6-1.5 pm/V. While we observed localized enhancement of deff during progressive stressing of the bare HfO2 thin film, we did not detect stable polarization switching which is a prerequisite of ferroelectric switching. This result could be explained using polarization switching spectroscopy which revealed antiferroelectric-like switching in the form of pinched hysteresis loops as well as increasing remnant response with repeated cycling. As such, our results offer a promising route for material scientists who want to explore the nanoscale origins of antiferroelectricity and ferroelectric wakeup in HfO2.
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Affiliation(s)
- Liam Collins
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
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27
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Griffin LA, Gaponenko I, Bassiri-Gharb N. Better, Faster, and Less Biased Machine Learning: Electromechanical Switching in Ferroelectric Thin Films. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2020; 32:e2002425. [PMID: 32794355 DOI: 10.1002/adma.202002425] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/08/2020] [Revised: 06/23/2020] [Accepted: 07/10/2020] [Indexed: 06/11/2023]
Abstract
Machine-learning techniques are more and more often applied to the analysis of complex behaviors in materials research. Frequently used to identify fundamental behaviors within large and multidimensional datasets, these techniques are strictly based on mathematical models. Thus, without inherent physical or chemical meaning or constraints, they are prone to biased interpretation. The interpretability of machine-learning results in materials science, specifically materials' functionalities, can be vastly improved through physical insights and careful data handling. The use of techniques such as dimensional stacking can provide the much needed physical and chemical constraints, while proper understanding of the assumptions imposed by model parameters can help avoid overinterpretation. These concepts are illustrated by application to recently reported ferroelectric switching experiments in PbZr0.2 Ti0.8 O3 thin films. Through systematic analysis and introduction of physical constraints, it is argued that the behaviors present are not necessarily due to exotic mechanisms previously suggested, but rather well described by classical ferroelectric switching superimposed by non-ferroelectric phenomena, such as electrochemical deformation, electrostatic interactions, and/or charge injection.
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Affiliation(s)
- Lee A Griffin
- G. W. Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta, GA, 30332, USA
- School of Electrical Engineering, Georgia Institute of Technology, Atlanta, GA, 30332, USA
| | - Iaroslav Gaponenko
- G. W. Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta, GA, 30332, USA
- Department of Quantum Matter Physics, University of Geneva, Geneva, 1204, Switzerland
| | - Nazanin Bassiri-Gharb
- G. W. Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta, GA, 30332, USA
- School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, GA, 30332, USA
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28
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Kwon O, Seol D, Qiao H, Kim Y. Recent Progress in the Nanoscale Evaluation of Piezoelectric and Ferroelectric Properties via Scanning Probe Microscopy. ADVANCED SCIENCE (WEINHEIM, BADEN-WURTTEMBERG, GERMANY) 2020; 7:1901391. [PMID: 32995111 PMCID: PMC7507502 DOI: 10.1002/advs.201901391] [Citation(s) in RCA: 8] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/07/2019] [Revised: 06/05/2020] [Indexed: 05/21/2023]
Abstract
Piezoelectric and ferroelectric materials have garnered significant interest owing to their excellent physical properties and multiple potential applications. Accordingly, the need for evaluating piezoelectric and ferroelectric properties has also increased. The piezoelectric and ferroelectric properties are evaluated macroscopically using laser interferometers and polarization-electric field loop measurements. However, as the research focus is shifted from bulk to nanosized materials, scanning probe microscopy (SPM) techniques have been suggested as an alternative approach for evaluating piezoelectric and ferroelectric properties. In this Progress Report, the recent progress on the nanoscale evaluation of piezoelectric and ferroelectric properties of diverse materials using SPM-based methods is summarized. Among the SPM techniques, the focus is on recent studies that are related to piezoresponse force microscopy and conductive atomic force microscopy; further, the utilization of these two modes to understand piezoelectric and ferroelectric properties at the nanoscale level is discussed. This work can provide guidelines for evaluating the piezoelectric and ferroelectric properties of materials based on SPM techniques.
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Affiliation(s)
- Owoong Kwon
- School of Advanced Materials and Engineering & Research Center for Advanced Materials TechnologySungkyunkwan University (SKKU)Suwon16419Republic of Korea
| | - Daehee Seol
- School of Advanced Materials and Engineering & Research Center for Advanced Materials TechnologySungkyunkwan University (SKKU)Suwon16419Republic of Korea
| | - Huimin Qiao
- School of Advanced Materials and Engineering & Research Center for Advanced Materials TechnologySungkyunkwan University (SKKU)Suwon16419Republic of Korea
| | - Yunseok Kim
- School of Advanced Materials and Engineering & Research Center for Advanced Materials TechnologySungkyunkwan University (SKKU)Suwon16419Republic of Korea
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29
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Ferroelectricity in Si-Doped Hafnia: Probing Challenges in Absence of Screening Charges. NANOMATERIALS 2020; 10:nano10081576. [PMID: 32796703 PMCID: PMC7466465 DOI: 10.3390/nano10081576] [Citation(s) in RCA: 9] [Impact Index Per Article: 2.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 07/21/2020] [Revised: 08/05/2020] [Accepted: 08/07/2020] [Indexed: 11/28/2022]
Abstract
The ability to develop ferroelectric materials using binary oxides is critical to enable novel low-power, high-density non-volatile memory and fast switching logic. The discovery of ferroelectricity in hafnia-based thin films, has focused the hopes of the community on this class of materials to overcome the existing problems of perovskite-based integrated ferroelectrics. However, both the control of ferroelectricity in doped-HfO2 and the direct characterization at the nanoscale of ferroelectric phenomena, are increasingly difficult to achieve. The main limitations are imposed by the inherent intertwining of ferroelectric and dielectric properties, the role of strain, interfaces and electric field-mediated phase, and polarization changes. In this work, using Si-doped HfO2 as a material system, we performed a correlative study with four scanning probe techniques for the local sensing of intrinsic ferroelectricity on the oxide surface. Putting each technique in perspective, we demonstrated that different origins of spatially resolved contrast can be obtained, thus highlighting possible crosstalk not originated by a genuine ferroelectric response. By leveraging the strength of each method, we showed how intrinsic processes in ultrathin dielectrics, i.e., electronic leakage, existence and generation of energy states, charge trapping (de-trapping) phenomena, and electrochemical effects, can influence the sensed response. We then proceeded to initiate hysteresis loops by means of tip-induced spectroscopic cycling (i.e., “wake-up”), thus observing the onset of oxide degradation processes associated with this step. Finally, direct piezoelectric effects were studied using the high pressure resulting from the probe’s confinement, noticing the absence of a net time-invariant piezo-generated charge. Our results are critical in providing a general framework of interpretation for multiple nanoscale processes impacting ferroelectricity in doped-hafnia and strategies for sensing it.
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Enhanced ferroelectricity in ultrathin films grown directly on silicon. Nature 2020; 580:478-482. [DOI: 10.1038/s41586-020-2208-x] [Citation(s) in RCA: 275] [Impact Index Per Article: 68.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/15/2019] [Accepted: 01/27/2020] [Indexed: 11/08/2022]
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Labardi M. Model of frequency-modulated atomic force microscopy for interpretation of noncontact piezoresponse measurements. NANOTECHNOLOGY 2020; 31:245705. [PMID: 32109904 DOI: 10.1088/1361-6528/ab7b05] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/10/2023]
Abstract
A model to describe the behavior of the probe of an atomic force microscope (AFM) operated in frequency modulation (FM) dynamic mode with constant excitation (CE) is developed, with the aim of describing recent experiments after the introduction of a noncontact piezoresponse force microscopy (PFM) method based on such an operation mode, named CE-FM-PFM (Labardi et al 2020 Nanotechnology 31, 075707). The model provides insight into improving the accuracy of converse piezoelectric coefficient (d 33) measurements on the local scale in this PFM mode. Its rather general applicability helps to quantify the residual electrostatic contribution in local piezoresponse measurements by AFM, which is anticipated to be strongly mitigated in the CE-FM-PFM compared to the more standard contact-mode PFM.
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Affiliation(s)
- M Labardi
- CNR-IPCF, Sede Secondaria di Pisa, Largo Pontecorvo 3, 56127 Pisa, Italy
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32
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Wang X, Chen K, de Vasconcelos LS, He J, Shin YC, Mei J, Zhao K. Mechanical breathing in organic electrochromics. Nat Commun 2020; 11:211. [PMID: 31924784 PMCID: PMC6954196 DOI: 10.1038/s41467-019-14047-8] [Citation(s) in RCA: 21] [Impact Index Per Article: 5.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/30/2019] [Accepted: 12/10/2019] [Indexed: 11/24/2022] Open
Abstract
The repetitive size change of the electrode over cycles, termed as mechanical breathing, is a crucial issue limiting the quality and lifetime of organic electrochromic devices. The mechanical deformation originates from the electron transport and ion intercalation in the redox active material. The dynamics of the state of charge induces drastic changes of the microstructure and properties of the host, and ultimately leads to structural disintegration at the interfaces. We quantify the breathing strain and the evolution of the mechanical properties of poly(3,4-propylenedioxythiophene) thin films in-situ using customized environmental nanoindentation. Upon oxidation, the film expands nearly 30% in volume, and the elastic modulus and hardness decrease by a factor of two. We perform theoretical modeling to understand thin film delamination from an indium tin oxide (ITO) current collector under cyclic load. We show that toughening the interface with roughened or silica-nanoparticle coated ITO surface significantly improves the cyclic performance.
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Affiliation(s)
- Xiaokang Wang
- School of Mechanical Engineering, Purdue University, West Lafayette, IN, 47907, USA
| | - Ke Chen
- Department of Chemistry, Purdue University, West Lafayette, IN, 47907, USA
| | | | - Jiazhi He
- Department of Chemistry, Purdue University, West Lafayette, IN, 47907, USA
| | - Yung C Shin
- School of Mechanical Engineering, Purdue University, West Lafayette, IN, 47907, USA
| | - Jianguo Mei
- Department of Chemistry, Purdue University, West Lafayette, IN, 47907, USA.
| | - Kejie Zhao
- School of Mechanical Engineering, Purdue University, West Lafayette, IN, 47907, USA.
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Ares P, Cea T, Holwill M, Wang YB, Roldán R, Guinea F, Andreeva DV, Fumagalli L, Novoselov KS, Woods CR. Piezoelectricity in Monolayer Hexagonal Boron Nitride. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2020; 32:e1905504. [PMID: 31736228 DOI: 10.1002/adma.201905504] [Citation(s) in RCA: 44] [Impact Index Per Article: 11.0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/24/2019] [Revised: 10/18/2019] [Indexed: 05/28/2023]
Abstract
2D hexagonal boron nitride (hBN) is a wide-bandgap van der Waals crystal with a unique combination of properties, including exceptional strength, large oxidation resistance at high temperatures, and optical functionalities. Furthermore, in recent years hBN crystals have become the material of choice for encapsulating other 2D crystals in a variety of technological applications, from optoelectronic and tunneling devices to composites. Monolayer hBN, which has no center of symmetry, is predicted to exhibit piezoelectric properties, yet experimental evidence is lacking. Here, by using electrostatic force microscopy, this effect is observed as a strain-induced change in the local electric field around bubbles and creases, in agreement with theoretical calculations. No piezoelectricity is found in bilayer and bulk hBN, where the center of symmetry is restored. These results add piezoelectricity to the known properties of monolayer hBN, which makes it a desirable candidate for novel electromechanical and stretchable optoelectronic devices, and pave a way to control the local electric field and carrier concentration in van der Waals heterostructures via strain. The experimental approach used here also shows a way to investigate the piezoelectric properties of other materials on the nanoscale by using electrostatic scanning probe techniques.
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Affiliation(s)
- Pablo Ares
- Department of Physics & Astronomy and National Graphene Institute, University of Manchester, Manchester, M13 9PL, UK
| | - Tommaso Cea
- Imdea Nanociencia, Faraday 9, Madrid, 28049, Spain
| | - Matthew Holwill
- Department of Physics & Astronomy and National Graphene Institute, University of Manchester, Manchester, M13 9PL, UK
| | - Yi Bo Wang
- Department of Physics & Astronomy and National Graphene Institute, University of Manchester, Manchester, M13 9PL, UK
| | - Rafael Roldán
- Instituto de Ciencia de Materiales de Madrid, Sor Juana Inés de la Cruz 3, Madrid, 28049, Spain
| | - Francisco Guinea
- Imdea Nanociencia, Faraday 9, Madrid, 28049, Spain
- Department of Physics & Astronomy, University of Manchester, Manchester, M13 9PL, UK
| | - Daria V Andreeva
- Department of Materials Science and Engineering, National University of Singapore, Singapore, 117575, Singapore
| | - Laura Fumagalli
- Department of Physics & Astronomy and National Graphene Institute, University of Manchester, Manchester, M13 9PL, UK
| | - Konstantin S Novoselov
- Department of Physics & Astronomy and National Graphene Institute, University of Manchester, Manchester, M13 9PL, UK
- Centre for Advanced 2D Materials, National University of Singapore, Singapore, 117546, Singapore
- Chongqing 2D Materials Institute, Liangjiang New Area, Chongqing, 400714, China
| | - Colin R Woods
- Department of Physics & Astronomy and National Graphene Institute, University of Manchester, Manchester, M13 9PL, UK
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Liu Y, Collins L, Proksch R, Kim S, Watson BR, Doughty B, Calhoun TR, Ahmadi M, Ievlev AV, Jesse S, Retterer ST, Belianinov A, Xiao K, Huang J, Sumpter BG, Kalinin SV, Hu B, Ovchinnikova OS. Reply to: On the ferroelectricity of CH 3NH 3PbI 3 perovskites. NATURE MATERIALS 2019; 18:1051-1053. [PMID: 31527812 DOI: 10.1038/s41563-019-0481-6] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/17/2019] [Accepted: 08/12/2019] [Indexed: 06/10/2023]
Affiliation(s)
- Yongtao Liu
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
- Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN, USA
| | - Liam Collins
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
| | - Roger Proksch
- Asylum Research an Oxford Instruments Company, Santa Barbara, CA, USA
| | - Songkil Kim
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
- School of Mechanical Engineering, Pusan National University, Busan, South Korea
| | - Brianna R Watson
- Department of Chemistry, University of Tennessee, Knoxville, TN, USA
| | - Benjamin Doughty
- Chemical Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA
| | - Tessa R Calhoun
- Department of Chemistry, University of Tennessee, Knoxville, TN, USA
| | - Mahshid Ahmadi
- Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN, USA
| | - Anton V Ievlev
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
| | - Stephen Jesse
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
| | - Scott T Retterer
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
| | - Alex Belianinov
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
| | - Kai Xiao
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
| | - Jingsong Huang
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
- Computational Sciences and Engineering Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA
| | - Bobby G Sumpter
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
- Computational Sciences and Engineering Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA
| | - Sergei V Kalinin
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
| | - Bin Hu
- Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN, USA
| | - Olga S Ovchinnikova
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
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