1
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Sim J, Ryoo S, Kim JS, Jang J, Ahn H, Kim D, Jung J, Kong T, Choi H, Lee YS, Lee TW, Cho K, Kang K, Lee T. Enhanced Photodetection Performance of an In Situ Core/Shell Perovskite-MoS 2 Phototransistor. ACS NANO 2024; 18:16905-16913. [PMID: 38904449 DOI: 10.1021/acsnano.4c02775] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/22/2024]
Abstract
While two-dimensional transition metal dichalcogenides (TMDCs)-based photodetectors offer prospects for high integration density and flexibility, their thinness poses a challenge regarding low light absorption, impacting photodetection sensitivity. Although the integration of TMDCs with metal halide perovskite nanocrystals (PNCs) has been known to be promising for photodetection with a high absorption coefficient of PNCs, the low charge mobility of PNCs delays efficient photocarrier injection into TMDCs. In this study, we integrated MoS2 with in situ formed core/shell PNCs with short ligands that minimize surface defects and enhance photocarrier injection. The PNCs/MoS2 heterostructure efficiently separates electrons and holes by establishing type II band alignment and consequently inducing a photogating effect. The synergistic interplay between photoconductive and photogating effects yields a high responsivity of 2.2 × 106 A/W and a specific detectivity of 9.0 × 1011 Jones. Our findings offer a promising pathway for developing low-cost, high-performance phototransistors leveraging the advantages of two-dimensional (2D) materials.
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Affiliation(s)
- Jinwoo Sim
- Department of Physics and Astronomy, Seoul National University, Seoul 08826, Korea
| | - Sunggyu Ryoo
- Department of Physics and Astronomy, Seoul National University, Seoul 08826, Korea
| | - Joo Sung Kim
- Department of Materials Science and Engineering, Seoul National University, Seoul 08826, Korea
- SN DISPLAY Co., Ltd., Seoul 08826, Korea
| | - Juntae Jang
- Department of Physics and Astronomy, Seoul National University, Seoul 08826, Korea
| | - Heebeom Ahn
- Department of Materials Science and Engineering, Seoul National University, Seoul 08826, Korea
| | - Donguk Kim
- Department of Physics and Astronomy, Seoul National University, Seoul 08826, Korea
| | - Joonha Jung
- Department of Materials Science and Engineering, Seoul National University, Seoul 08826, Korea
| | - Taehyun Kong
- Department of Materials Science and Engineering, Seoul National University, Seoul 08826, Korea
| | - Hyeonmin Choi
- Department of Materials Science and Engineering, Seoul National University, Seoul 08826, Korea
| | - Yun Seog Lee
- Department of Mechanical Engineering, Seoul National University, Seoul 08826, Korea
| | - Tae-Woo Lee
- Department of Materials Science and Engineering, Seoul National University, Seoul 08826, Korea
- SN DISPLAY Co., Ltd., Seoul 08826, Korea
- Research Institute of Advanced Materials, Seoul National University, Seoul 08826, Korea
- Institute of Engineering Research, Seoul National University, Seoul 08826, Korea
| | - Kyungjune Cho
- Convergence Research Center for Solutions to Electromagnetic Interference in Future-mobility, Korea Institute of Science and Technology, Seoul 02792, Korea
| | - Keehoon Kang
- Department of Materials Science and Engineering, Seoul National University, Seoul 08826, Korea
- Research Institute of Advanced Materials, Seoul National University, Seoul 08826, Korea
- Institute of Applied Physics, Seoul National University, Seoul 08826, Korea
| | - Takhee Lee
- Department of Physics and Astronomy, Seoul National University, Seoul 08826, Korea
- Institute of Applied Physics, Seoul National University, Seoul 08826, Korea
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2
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Mooshammer F, Xu X, Trovatello C, Peng ZH, Yang B, Amontree J, Zhang S, Hone J, Dean CR, Schuck PJ, Basov DN. Enabling Waveguide Optics in Rhombohedral-Stacked Transition Metal Dichalcogenides with Laser-Patterned Grating Couplers. ACS NANO 2024; 18:4118-4130. [PMID: 38261768 DOI: 10.1021/acsnano.3c08522] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 01/25/2024]
Abstract
Waveguides play a key role in the implementation of on-chip optical elements and, therefore, lie at the heart of integrated photonics. To add the functionalities of layered materials to existing technologies, dedicated fabrication protocols are required. Here, we build on laser writing to pattern grating structures into bulk noncentrosymmetric transition metal dichalcogenides with grooves as sharp as 250 nm. Using thin flakes of 3R-MoS2 that act as waveguides for near-infrared light, we demonstrate the functionality of the grating couplers with two complementary experiments: first, nano-optical imaging is used to visualize transverse electric and magnetic modes, whose directional outcoupling is captured by finite element simulations. Second, waveguide second-harmonic generation is demonstrated by grating-coupling femtosecond pulses into the slabs in which the radiation partially undergoes frequency doubling throughout the propagation. Our work provides a straightforward strategy for laser patterning of van der Waals crystals, demonstrates the feasibility of compact frequency converters, and examines the tuning knobs that enable optimized coupling into layered waveguides.
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Affiliation(s)
- Fabian Mooshammer
- Department of Physics, Columbia University, New York, New York 10027, United States
- Department of Physics, Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), 91058 Erlangen, Germany
| | - Xinyi Xu
- Department of Mechanical Engineering, Columbia University, New York, New York 10027, United States
| | - Chiara Trovatello
- Department of Mechanical Engineering, Columbia University, New York, New York 10027, United States
| | - Zhi Hao Peng
- Department of Mechanical Engineering, Columbia University, New York, New York 10027, United States
| | - Birui Yang
- Department of Physics, Columbia University, New York, New York 10027, United States
| | - Jacob Amontree
- Department of Mechanical Engineering, Columbia University, New York, New York 10027, United States
| | - Shuai Zhang
- Department of Physics, Columbia University, New York, New York 10027, United States
| | - James Hone
- Department of Mechanical Engineering, Columbia University, New York, New York 10027, United States
| | - Cory R Dean
- Department of Physics, Columbia University, New York, New York 10027, United States
| | - P James Schuck
- Department of Mechanical Engineering, Columbia University, New York, New York 10027, United States
| | - D N Basov
- Department of Physics, Columbia University, New York, New York 10027, United States
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3
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Rahman R, Karmakar M, Samanta D, Pathak A, Datta PK, Nath TK. One order enhancement of charge carrier relaxation rate by tuning structural and optical properties in annealed cobalt doped MoS 2 nanosheets. NEW J CHEM 2022. [DOI: 10.1039/d1nj05446e] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
Abstract
The effective manipulation of excitons is crucial for the realization of exciton-based devices and circuits, and doping is considered a good strategy to achieve this.
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Affiliation(s)
- Rosy Rahman
- Department of Physics, Indian Institute of Technology Kharagpur, W.B., 721302, India
| | - Manobina Karmakar
- Department of Physics, Indian Institute of Technology Kharagpur, W.B., 721302, India
| | - Dipanjan Samanta
- Department of Chemistry, Indian Institute of Technology Kharagpur, W.B., 721302, India
| | - Amita Pathak
- Department of Chemistry, Indian Institute of Technology Kharagpur, W.B., 721302, India
| | - Prasanta Kumar Datta
- Department of Physics, Indian Institute of Technology Kharagpur, W.B., 721302, India
| | - Tapan Kumar Nath
- Department of Physics, Indian Institute of Technology Kharagpur, W.B., 721302, India
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4
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Abnavi A, Ahmadi R, Hasani A, Fawzy M, Mohammadzadeh MR, De Silva T, Yu N, Adachi MM. Free-Standing Multilayer Molybdenum Disulfide Memristor for Brain-Inspired Neuromorphic Applications. ACS APPLIED MATERIALS & INTERFACES 2021; 13:45843-45853. [PMID: 34542262 DOI: 10.1021/acsami.1c11359] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/13/2023]
Abstract
Recently, atomically thin two-dimensional (2D) transition-metal dichalcogenides (TMDs) have attracted great interest in electronic and opto-electronic devices for high-integration-density applications such as data storage due to their small vertical dimension and high data storage capability. Here, we report a memristor based on free-standing multilayer molybdenum disulfide (MoS2) with a high current on/off ratio of ∼103 and a stable retention for at least 3000 s. Through light modulation of the carrier density in the suspended MoS2 channel, the on/off ratio can be further increased to ∼105. Moreover, the essential photosynaptic functions with short- and long-term memory (STM and LTM) behaviors are successfully mimicked by such devices. These results also indicate that STM can be transferred to LTM by increasing the light stimuli power, pulse duration, and number of pulses. The electrical measurements performed under vacuum and ambient air conditions propose that the observed resistive switching is due to adsorbed oxygen and water molecules on both sides of the MoS2 channel. Thus, our free-standing 2D multilayer MoS2-based memristors propose a simple approach for fabrication of a low-power-consumption and reliable resistive switching device for neuromorphic applications.
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Affiliation(s)
- Amin Abnavi
- School of Engineering Science, Simon Fraser University, Burnaby V5A 1S6, British Columbia, Canada
| | - Ribwar Ahmadi
- School of Engineering Science, Simon Fraser University, Burnaby V5A 1S6, British Columbia, Canada
| | - Amirhossein Hasani
- School of Engineering Science, Simon Fraser University, Burnaby V5A 1S6, British Columbia, Canada
| | - Mirette Fawzy
- Department of Physics, Simon Fraser University, Burnaby V5A 1S6, British Columbia, Canada
| | | | - Thushani De Silva
- School of Engineering Science, Simon Fraser University, Burnaby V5A 1S6, British Columbia, Canada
| | - Niannian Yu
- School of Science, Wuhan University of Technology, Wuhan 430070, China
| | - Michael M Adachi
- School of Engineering Science, Simon Fraser University, Burnaby V5A 1S6, British Columbia, Canada
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5
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Li H, Liu C, Zhang Y, Qi C, Ma G, Wang T, Dong S, Huo M. Modulation of 1 MeV electron irradiation on ultraviolet response in MoS 2FET. NANOTECHNOLOGY 2021; 32:475205. [PMID: 34388741 DOI: 10.1088/1361-6528/ac1d79] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/31/2021] [Accepted: 08/12/2021] [Indexed: 06/13/2023]
Abstract
The material, electrical and ultraviolet optoelectronic properties of few layers bottom molybdenum disulfide (MoS2) field effect transistors (FETs) device was investigated before and after 1 MeV electron irradiation. Due to the participation of SiO2in conduction, we discovered novel photoelectric properties and a relatively long photogenerated carrier lifetime (several tens of seconds). Electron irradiation causes lattice distortion, the decrease of carrier mobility, and the increase of interface state. It leads to the degradation of output characteristics, transfer characteristics and photocurrent of the MoS2FET.
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Affiliation(s)
- Heyi Li
- Harbin Institute of Technology, Harbin, People's Republic of China
| | - Chaoming Liu
- Harbin Institute of Technology, Harbin, People's Republic of China
| | - Yanqing Zhang
- Harbin Institute of Technology, Harbin, People's Republic of China
| | - Chunhua Qi
- Harbin Institute of Technology, Harbin, People's Republic of China
| | - Guoliang Ma
- Harbin Institute of Technology, Harbin, People's Republic of China
| | - Tianqi Wang
- Harbin Institute of Technology, Harbin, People's Republic of China
| | - Shangli Dong
- Harbin Institute of Technology, Harbin, People's Republic of China
| | - Mingxue Huo
- Harbin Institute of Technology, Harbin, People's Republic of China
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6
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Islam MM, Dev D, Krishnaprasad A, Tetard L, Roy T. Optoelectronic synapse using monolayer MoS 2 field effect transistors. Sci Rep 2020; 10:21870. [PMID: 33318616 PMCID: PMC7736870 DOI: 10.1038/s41598-020-78767-4] [Citation(s) in RCA: 23] [Impact Index Per Article: 5.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/15/2020] [Accepted: 11/25/2020] [Indexed: 12/05/2022] Open
Abstract
Optical data sensing, processing and visual memory are fundamental requirements for artificial intelligence and robotics with autonomous navigation. Traditionally, imaging has been kept separate from the pattern recognition circuitry. Optoelectronic synapses hold the special potential of integrating these two fields into a single layer, where a single device can record optical data, convert it into a conductance state and store it for learning and pattern recognition, similar to the optic nerve in human eye. In this work, the trapping and de-trapping of photogenerated carriers in the MoS2/SiO2 interface of a n-channel MoS2 transistor was employed to emulate the optoelectronic synapse characteristics. The monolayer MoS2 field effect transistor (FET) exhibits photo-induced short-term and long-term potentiation, electrically driven long-term depression, paired pulse facilitation (PPF), spike time dependent plasticity, which are necessary synaptic characteristics. Moreover, the device’s ability to retain its conductance state can be modulated by the gate voltage, making the device behave as a photodetector for positive gate voltages and an optoelectronic synapse at negative gate voltages.
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Affiliation(s)
- Molla Manjurul Islam
- NanoScience Technology Center, University of Central Florida, Orlando, FL, 32826, USA.,Department of Physics, University of Central Florida, Orlando, FL, 32816, USA
| | - Durjoy Dev
- NanoScience Technology Center, University of Central Florida, Orlando, FL, 32826, USA.,Department of Electrical and Computer Engineering, University of Central Florida, Orlando, FL, 32816, USA
| | - Adithi Krishnaprasad
- NanoScience Technology Center, University of Central Florida, Orlando, FL, 32826, USA.,Department of Electrical and Computer Engineering, University of Central Florida, Orlando, FL, 32816, USA
| | - Laurene Tetard
- NanoScience Technology Center, University of Central Florida, Orlando, FL, 32826, USA.,Department of Physics, University of Central Florida, Orlando, FL, 32816, USA
| | - Tania Roy
- NanoScience Technology Center, University of Central Florida, Orlando, FL, 32826, USA. .,Department of Physics, University of Central Florida, Orlando, FL, 32816, USA. .,Department of Electrical and Computer Engineering, University of Central Florida, Orlando, FL, 32816, USA. .,Department of Materials Science and Engineering, University of Central Florida, Orlando, FL, 32816, USA.
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7
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Berweger S, Zhang H, Sahoo PK, Kupp BM, Blackburn JL, Miller EM, Wallis TM, Voronine DV, Kabos P, Nanayakkara SU. Spatially Resolved Persistent Photoconductivity in MoS 2-WS 2 Lateral Heterostructures. ACS NANO 2020; 14:14080-14090. [PMID: 33044054 DOI: 10.1021/acsnano.0c06745] [Citation(s) in RCA: 19] [Impact Index Per Article: 4.8] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
Abstract
The optical and electronic properties of 2D semiconductors are intrinsically linked via the strong interactions between optically excited bound species and free carriers. Here we use near-field scanning microwave microscopy (SMM) to image spatial variations in photoconductivity in MoS2-WS2 lateral multijunction heterostructures using photon energy-resolved narrowband illumination. We find that the onset of photoconductivity in individual domains corresponds to the optical absorption onset, confirming that the tightly bound excitons in transition metal dichalcogenides can nonetheless dissociate into free carriers. These photogenerated carriers are most likely n-type and are seen to persist for up to days. Informed by finite element modeling we reveal that they can increase the carrier density by up to 200 times. This persistent photoconductivity appears to be dominated by contributions from the multilayer MoS2 domains, and we attribute the flake-wide response in part to charge transfer across the heterointerface. Spatial correlation of our SMM imaging with photoluminescence (PL) mapping confirms the strong link between PL peak emission photon energy, PL intensity, and the local accumulated charge. This work reveals the spatially and temporally complex optoelectronic response of these systems and cautions that properties measured during or after illumination may not reflect the true dark state of these materials but rather a metastable charged state.
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Affiliation(s)
- Samuel Berweger
- Applied Physics Division, National Institute of Standards and Technology, Boulder, Colorado 80305, United States
| | - Hanyu Zhang
- Materials and Chemical Science and Technology Directorate, National Renewable Energy Laboratory, Golden, Colorado 80401, United States
| | - Prasana K Sahoo
- Department of Physics, University of South Florida, Tampa, Florida 33620, United States
- Materials Science Centre, Indian Institute of Technology Kharagpur, Kharagpur, 721302, India
| | - Benjamin M Kupp
- Applied Physics Division, National Institute of Standards and Technology, Boulder, Colorado 80305, United States
- The Pennsylvania State University, University Park, Pennsylvania 16802, United States
| | - Jeffrey L Blackburn
- Materials and Chemical Science and Technology Directorate, National Renewable Energy Laboratory, Golden, Colorado 80401, United States
| | - Elisa M Miller
- Materials and Chemical Science and Technology Directorate, National Renewable Energy Laboratory, Golden, Colorado 80401, United States
| | - Thomas M Wallis
- Applied Physics Division, National Institute of Standards and Technology, Boulder, Colorado 80305, United States
| | - Dmitri V Voronine
- Department of Physics, University of South Florida, Tampa, Florida 33620, United States
| | - Pavel Kabos
- Applied Physics Division, National Institute of Standards and Technology, Boulder, Colorado 80305, United States
| | - Sanjini U Nanayakkara
- Materials and Chemical Science and Technology Directorate, National Renewable Energy Laboratory, Golden, Colorado 80401, United States
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8
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Nanotip Contacts for Electric Transport and Field Emission Characterization of Ultrathin MoS 2 Flakes. NANOMATERIALS 2020; 10:nano10010106. [PMID: 31947985 PMCID: PMC7023401 DOI: 10.3390/nano10010106] [Citation(s) in RCA: 18] [Impact Index Per Article: 4.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 12/16/2019] [Revised: 12/31/2019] [Accepted: 01/02/2020] [Indexed: 11/21/2022]
Abstract
We report a facile approach based on piezoelectric-driven nanotips inside a scanning electron microscope to contact and electrically characterize ultrathin MoS2 (molybdenum disulfide) flakes on a SiO2/Si (silicon dioxide/silicon) substrate. We apply such a method to analyze the electric transport and field emission properties of chemical vapor deposition-synthesized monolayer MoS2, used as the channel of back-gate field effect transistors. We study the effects of the gate-voltage range and sweeping time on the channel current and on its hysteretic behavior. We observe that the conduction of the MoS2 channel is affected by trap states. Moreover, we report a gate-controlled field emission current from the edge part of the MoS2 flake, evidencing a field enhancement factor of approximately 200 and a turn-on field of approximately 40 V/μm at a cathode–anode separation distance of 900 nm.
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9
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Jain A, Szabó Á, Parzefall M, Bonvin E, Taniguchi T, Watanabe K, Bharadwaj P, Luisier M, Novotny L. One-Dimensional Edge Contacts to a Monolayer Semiconductor. NANO LETTERS 2019; 19:6914-6923. [PMID: 31513426 DOI: 10.1021/acs.nanolett.9b02166] [Citation(s) in RCA: 35] [Impact Index Per Article: 7.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/27/2023]
Abstract
Integration of electrical contacts into van der Waals (vdW) heterostructures is critical for realizing electronic and optoelectronic functionalities. However, to date no scalable methodology for gaining electrical access to buried monolayer two-dimensional (2D) semiconductors exists. Here we report viable edge contact formation to hexagonal boron nitride (hBN) encapsulated monolayer MoS2. By combining reactive ion etching, in situ Ar+ sputtering and annealing, we achieve a relatively low edge contact resistance, high mobility (up to ∼30 cm2 V-1 s-1) and high on-current density (>50 μA/μm at VDS = 3V), comparable to top contacts. Furthermore, the atomically smooth hBN environment also preserves the intrinsic MoS2 channel quality during fabrication, leading to a steep subthreshold swing of 116 mV/dec with a negligible hysteresis. Hence, edge contacts are highly promising for large-scale practical implementation of encapsulated heterostructure devices, especially those involving air sensitive materials, and can be arbitrarily narrow, which opens the door to further shrinkage of 2D device footprint.
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Affiliation(s)
- Achint Jain
- Photonics Laboratory , ETH Zürich , 8093 Zürich , Switzerland
| | - Áron Szabó
- Integrated Systems Laboratory , ETH Zürich , 8092 Zürich , Switzerland
| | | | - Eric Bonvin
- Photonics Laboratory , ETH Zürich , 8093 Zürich , Switzerland
| | - Takashi Taniguchi
- National Institute for Material Science , 1-1 Namiki , Tsukuba 305-0044 , Japan
| | - Kenji Watanabe
- National Institute for Material Science , 1-1 Namiki , Tsukuba 305-0044 , Japan
| | - Palash Bharadwaj
- Department of Electrical and Computer Engineering , Rice University , Houston , Texas 77005 , United States
| | - Mathieu Luisier
- Integrated Systems Laboratory , ETH Zürich , 8092 Zürich , Switzerland
| | - Lukas Novotny
- Photonics Laboratory , ETH Zürich , 8093 Zürich , Switzerland
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10
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Son SB, Kim Y, Kim A, Cho B, Hong WK. Ultraviolet Wavelength-Dependent Optoelectronic Properties in Two-Dimensional NbSe 2-WSe 2 van der Waals Heterojunction-Based Field-Effect Transistors. ACS APPLIED MATERIALS & INTERFACES 2017; 9:41537-41545. [PMID: 29110451 DOI: 10.1021/acsami.7b11983] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/07/2023]
Abstract
Atomically thin two-dimensional (2D) van der Waals (vdW) heterostructures are one of the very important research issues for stacked optoelectronic device applications. In this study, using the transferred and stacked NbSe2-WSe2 films as electrodes and a channel, we fabricated the field-effect transistor (FET) devices based on 2D-2D vdW metal-semiconductor heterojunctions (HJs) and systematically studied their ultraviolet (UV) wavelength-dependent electrical and photoresponse properties. Upon the exposure to UV light with a wavelength of 365 nm, the NbSe2-WSe2 vdW HJFET devices exhibited threshold voltage shift toward positive gate bias direction, a current increase, and a nonlinear photocurrent increase upon applying a gate bias due to the contribution of the photogenerated hole current. In contrast, for the 254 nm UV-irradiated FET devices, the drain current was decreased dramatically and the threshold voltage was negatively shifted. The time-resolved photoresponse properties showed that the device current after turning off the 254 nm UV light was completely and much more rapidly recovered compared with the case of the persistent photocurrent after turning off the 365 nm UV light. Interestingly, we found that the wettability of the WSe2 surface was changed with increasing irradiation time only after 254 nm UV irradiation. The measured wetting behavior on the WSe2 surface provided direct evidence that the experimentally observed UV-wavelength-dependent phenomena was attributed to the UV-induced dissociative adsorption of oxygen and water molecules, leading to the modulation of charge trap states on the photogenerated and intrinsic carriers in the p-type WSe2 channel. This study will help provide an understanding of the influence of environmental and electrical measurement conditions on the electrical and optical properties of 2D-2D vdW HJ devices for a variety of device applications through the stacking of 2D heterostructures.
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Affiliation(s)
- Seung Bae Son
- Jeonju Center, Korea Basic Science Institute , Jeonju 54907, Jeollabuk-do, Republic of Korea
| | - Yonghun Kim
- Department of Advanced Functional Thin Films, Surface Technology Division, Korea Institute of Materials Science (KIMS) , 797 Changwondaero, Sungsan-gu, Changwon 51508, Gyeongnam, Republic of Korea
| | - AhRa Kim
- Department of Advanced Functional Thin Films, Surface Technology Division, Korea Institute of Materials Science (KIMS) , 797 Changwondaero, Sungsan-gu, Changwon 51508, Gyeongnam, Republic of Korea
| | - Byungjin Cho
- Department of Advanced Material Engineering, Chungbuk National University , Seowon-gu, Cheongju 28644, Chungbuk, Republic of Korea
| | - Woong-Ki Hong
- Jeonju Center, Korea Basic Science Institute , Jeonju 54907, Jeollabuk-do, Republic of Korea
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11
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Environment-insensitive and gate-controllable photocurrent enabled by bandgap engineering of MoS 2 junctions. Sci Rep 2017; 7:44768. [PMID: 28322299 PMCID: PMC5359557 DOI: 10.1038/srep44768] [Citation(s) in RCA: 9] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/25/2016] [Accepted: 02/14/2017] [Indexed: 11/08/2022] Open
Abstract
Two-dimensional (2D) materials are composed of atomically thin crystals with an enormous surface-to-volume ratio, and their physical properties can be easily subjected to the change of the chemical environment. Encapsulation with other layered materials, such as hexagonal boron nitride, is a common practice; however, this approach often requires inextricable fabrication processes. Alternatively, it is intriguing to explore methods to control transport properties in the circumstance of no encapsulated layer. This is very challenging because of the ubiquitous presence of adsorbents, which can lead to charged-impurity scattering sites, charge traps, and recombination centers. Here, we show that the short-circuit photocurrent originated from the built-in electric field at the MoS2 junction is surprisingly insensitive to the gaseous environment over the range from a vacuum of 1 × 10−6 Torr to ambient condition. The environmental insensitivity of the short-circuit photocurrent is attributed to the characteristic of the diffusion current that is associated with the gradient of carrier density. Conversely, the photocurrent with bias exhibits typical persistent photoconductivity and greatly depends on the gaseous environment. The observation of environment-insensitive short-circuit photocurrent demonstrates an alternative method to design device structure for 2D-material-based optoelectronic applications.
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12
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Shu J, Wu G, Guo Y, Liu B, Wei X, Chen Q. The intrinsic origin of hysteresis in MoS2 field effect transistors. NANOSCALE 2016; 8:3049-3056. [PMID: 26782750 DOI: 10.1039/c5nr07336g] [Citation(s) in RCA: 56] [Impact Index Per Article: 7.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/05/2023]
Abstract
We investigate the hysteresis and gate voltage stress effect in MoS2 field effect transistors (FETs). We observe that both the suspended and the SiO2-supported FETs have large hysteresis in their transfer curves under vacuum which cannot be attributed to the traps at the interface between the MoS2 and the SiO2 or in the SiO2 substrate or the gas adsorption/desorption effect. Our findings indicate that the hysteresis we observe comes from the MoS2 itself, revealing an intrinsic origin of the hysteresis besides some extrinsic factors. The fact that the FETs based on thinner MoS2 have larger hysteresis than that with thicker MoS2 suggests that the surface of MoS2 plays a key role in the hysteresis. The gate voltage sweep range, sweep direction, sweep time and loading history all affect the hysteresis observed in the transfer curves.
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Affiliation(s)
- Jiapei Shu
- Key Laboratory for the Physics and Chemistry of Nanodevices, Department of Electronics, Peking University, Beijing 100871, People's Republic of China. and Academy for Advanced Interdisciplinary Studies, Peking University, Beijing, 100871, China
| | - Gongtao Wu
- Key Laboratory for the Physics and Chemistry of Nanodevices, Department of Electronics, Peking University, Beijing 100871, People's Republic of China.
| | - Yao Guo
- Key Laboratory for the Physics and Chemistry of Nanodevices, Department of Electronics, Peking University, Beijing 100871, People's Republic of China.
| | - Bo Liu
- Key Laboratory for the Physics and Chemistry of Nanodevices, Department of Electronics, Peking University, Beijing 100871, People's Republic of China.
| | - Xianlong Wei
- Key Laboratory for the Physics and Chemistry of Nanodevices, Department of Electronics, Peking University, Beijing 100871, People's Republic of China.
| | - Qing Chen
- Key Laboratory for the Physics and Chemistry of Nanodevices, Department of Electronics, Peking University, Beijing 100871, People's Republic of China.
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13
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Rathi N, Rathi S, Lee I, Wang J, Kang M, Lim D, Khan MA, Lee Y, Kim GH. Reduction of persistent photoconductivity in a few-layer MoS2 field-effect transistor by graphene oxide functionalization. RSC Adv 2016. [DOI: 10.1039/c6ra03436e] [Citation(s) in RCA: 10] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/13/2023] Open
Abstract
Reduction in persistent photoconductivity by functionalizing MoS2 FET with graphene oxide.
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Affiliation(s)
- Neha Rathi
- School of Electronic and Electrical Engineering
- Sungkyunkwan Advanced Institute of Nanotechnology (SAINT)
- Sungkyunkwan University
- Suwon 16419
- South Korea
| | - Servin Rathi
- School of Electronic and Electrical Engineering
- Sungkyunkwan Advanced Institute of Nanotechnology (SAINT)
- Sungkyunkwan University
- Suwon 16419
- South Korea
| | - Inyeal Lee
- School of Electronic and Electrical Engineering
- Sungkyunkwan Advanced Institute of Nanotechnology (SAINT)
- Sungkyunkwan University
- Suwon 16419
- South Korea
| | - Jianwei Wang
- School of Mechanical and Electrical Engineering
- Guizhou Normal University
- Guiyang
- China
| | - Moonshik Kang
- School of Electronic and Electrical Engineering
- Sungkyunkwan Advanced Institute of Nanotechnology (SAINT)
- Sungkyunkwan University
- Suwon 16419
- South Korea
| | - Dongsuk Lim
- School of Advanced Materials Science and Engineering
- Sungkyunkwan University
- Suwon 16419
- South Korea
| | - Muhammad Atif Khan
- School of Electronic and Electrical Engineering
- Sungkyunkwan Advanced Institute of Nanotechnology (SAINT)
- Sungkyunkwan University
- Suwon 16419
- South Korea
| | - Yoontae Lee
- School of Electronic and Electrical Engineering
- Sungkyunkwan Advanced Institute of Nanotechnology (SAINT)
- Sungkyunkwan University
- Suwon 16419
- South Korea
| | - Gil-Ho Kim
- School of Electronic and Electrical Engineering
- Sungkyunkwan Advanced Institute of Nanotechnology (SAINT)
- Sungkyunkwan University
- Suwon 16419
- South Korea
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14
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Wang H, Zhang C, Rana F. Surface Recombination Limited Lifetimes of Photoexcited Carriers in Few-Layer Transition Metal Dichalcogenide MoS₂. NANO LETTERS 2015; 15:8204-10. [PMID: 26535607 DOI: 10.1021/acs.nanolett.5b03708] [Citation(s) in RCA: 64] [Impact Index Per Article: 7.1] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/16/2023]
Abstract
We present results on photoexcited carrier lifetimes in few-layer transition metal dichalcogenide MoS2 using nondegenerate ultrafast optical pump-probe technique. Our results show a sharp increase of the carrier lifetimes with the number of layers in the sample. Carrier lifetimes increase from few tens of picoseconds in monolayer samples to more than a nanosecond in 10-layer samples. The inverse carrier lifetime was found to scale according to the probability of the carriers being present at the surface layers, as given by the carrier wave function in few layer samples, which can be treated as quantum wells. The carrier lifetimes were found to be largely independent of the temperature, and the inverse carrier lifetimes scaled linearly with the photoexcited carrier density. These observations are consistent with defect-assisted carrier recombination, in which the capture of electrons and holes by defects occurs via Auger scatterings. Our results suggest that carrier lifetimes in few-layer samples are surface recombination limited due to the much larger defect densities at surface layers compared with the inner layers.
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Affiliation(s)
- Haining Wang
- School of Electrical and Computer Engineering, Cornell University , Ithaca, New York 14853, United States
| | - Changjian Zhang
- School of Electrical and Computer Engineering, Cornell University , Ithaca, New York 14853, United States
| | - Farhan Rana
- School of Electrical and Computer Engineering, Cornell University , Ithaca, New York 14853, United States
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15
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Wu YC, Liu CH, Chen SY, Shih FY, Ho PH, Chen CW, Liang CT, Wang WH. Extrinsic Origin of Persistent Photoconductivity in Monolayer MoS2 Field Effect Transistors. Sci Rep 2015; 5:11472. [PMID: 26112341 PMCID: PMC4650635 DOI: 10.1038/srep11472] [Citation(s) in RCA: 46] [Impact Index Per Article: 5.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/25/2014] [Accepted: 05/18/2015] [Indexed: 12/03/2022] Open
Abstract
Recent discoveries of the photoresponse of molybdenum disulfide (MoS2) have shown the considerable potential of these two-dimensional transition metal dichalcogenides for optoelectronic applications. Among the various types of photoresponses of MoS2, persistent photoconductivity (PPC) at different levels has been reported. However, a detailed study of the PPC effect and its mechanism in MoS2 is still not available, despite the importance of this effect on the photoresponse of the material. Here, we present a systematic study of the PPC effect in monolayer MoS2 and conclude that the effect can be attributed to random localized potential fluctuations in the devices. Notably, the potential fluctuations originate from extrinsic sources based on the substrate effect of the PPC. Moreover, we point out a correlation between the PPC effect in MoS2 and the percolation transport behavior of MoS2. We demonstrate a unique and efficient means of controlling the PPC effect in monolayer MoS2, which may offer novel functionalities for MoS2-based optoelectronic applications in the future.
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Affiliation(s)
- Yueh-Chun Wu
- Institute of Atomic and Molecular Sciences, Academia Sinica, Taipei 106, Taiwan
| | - Cheng-Hua Liu
- 1] Institute of Atomic and Molecular Sciences, Academia Sinica, Taipei 106, Taiwan [2] Department of Physics, National Taiwan University, Taipei 106, Taiwan
| | - Shao-Yu Chen
- Institute of Atomic and Molecular Sciences, Academia Sinica, Taipei 106, Taiwan
| | - Fu-Yu Shih
- 1] Institute of Atomic and Molecular Sciences, Academia Sinica, Taipei 106, Taiwan [2] Department of Physics, National Taiwan University, Taipei 106, Taiwan
| | - Po-Hsun Ho
- Department of Materials Science and Engineering, National Taiwan University, Taipei 106, Taiwan
| | - Chun-Wei Chen
- Department of Materials Science and Engineering, National Taiwan University, Taipei 106, Taiwan
| | - Chi-Te Liang
- Department of Physics, National Taiwan University, Taipei 106, Taiwan
| | - Wei-Hua Wang
- Institute of Atomic and Molecular Sciences, Academia Sinica, Taipei 106, Taiwan
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16
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Tong X, Ashalley E, Lin F, Li H, Wang ZM. Advances in MoS 2-Based Field Effect Transistors (FETs). NANO-MICRO LETTERS 2015; 7:203-218. [PMID: 30464966 PMCID: PMC6223905 DOI: 10.1007/s40820-015-0034-8] [Citation(s) in RCA: 56] [Impact Index Per Article: 6.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 11/03/2014] [Accepted: 01/21/2015] [Indexed: 04/14/2023]
Abstract
This paper reviews the original achievements and advances regarding the field effect transistor (FET) fabricated from one of the most studied transition metal dichalcogenides: two-dimensional MoS2. Not like graphene, which is highlighted by a gapless Dirac cone band structure, Monolayer MoS2 is featured with a 1.9 eV gapped direct energy band thus facilitates convenient electronic and/or optoelectronic modulation of its physical properties in FET structure. Indeed, many MoS2 devices based on FET architecture such as phototransistors, memory devices, and sensors have been studied and extraordinary properties such as excellent mobility, ON/OFF ratio, and sensitivity of these devices have been exhibited. However, further developments in FET device applications depend a lot on if novel physics would be involved in them. In this review, an overview on advances and developments in the MoS2-based FETs are presented. Engineering of MoS2-based FETs will be discussed in details for understanding contact physics, formation of gate dielectric, and doping strategies. Also reported are demonstrations of device behaviors such as low-frequency noise and photoresponse in MoS2-based FETs, which is crucial for developing electronic and optoelectronic devices.
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Affiliation(s)
- Xin Tong
- Institute of Fundamental and Frontier Sciences, University of Electronic Science and Technology of China, Chengdu, 610054 People’s Republic of China
| | - Eric Ashalley
- Institute of Fundamental and Frontier Sciences, University of Electronic Science and Technology of China, Chengdu, 610054 People’s Republic of China
| | - Feng Lin
- Institute of Fundamental and Frontier Sciences, University of Electronic Science and Technology of China, Chengdu, 610054 People’s Republic of China
| | - Handong Li
- State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, 610054 People’s Republic of China
| | - Zhiming M. Wang
- Institute of Fundamental and Frontier Sciences, University of Electronic Science and Technology of China, Chengdu, 610054 People’s Republic of China
- State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, 610054 People’s Republic of China
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17
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Wang H, Zhang C, Rana F. Ultrafast dynamics of defect-assisted electron-hole recombination in monolayer MoS2. NANO LETTERS 2015; 15:339-45. [PMID: 25546602 DOI: 10.1021/nl503636c] [Citation(s) in RCA: 255] [Impact Index Per Article: 28.3] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/24/2023]
Abstract
In this Letter, we present nondegenerate ultrafast optical pump-probe studies of the carrier recombination dynamics in MoS2 monolayers. By tuning the probe to wavelengths much longer than the exciton line, we make the probe transmission sensitive to the total population of photoexcited electrons and holes. Our measurement reveals two distinct time scales over which the photoexcited electrons and holes recombine; a fast time scale that lasts ∼ 2 ps and a slow time scale that lasts longer than ∼ 100 ps. The temperature and the pump fluence dependence of the observed carrier dynamics are consistent with defect-assisted recombination as being the dominant mechanism for electron-hole recombination in which the electrons and holes are captured by defects via Auger processes. Strong Coulomb interactions in two-dimensional atomic materials, together with strong electron and hole correlations in two-dimensional metal dichalcogenides, make Auger processes particularly effective for carrier capture by defects. We present a model for carrier recombination dynamics that quantitatively explains all features of our data for different temperatures and pump fluences. The theoretical estimates for the rate constants for Auger carrier capture are in good agreement with the experimentally determined values. Our results underscore the important role played by Auger processes in two-dimensional atomic materials.
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Affiliation(s)
- Haining Wang
- School of Electrical and Computer Engineering, Cornell University , Ithaca, New York 14850, United States
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18
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Kim JS, Lee HS, Jeon PJ, Lee YT, Yoon W, Ju SY, Im S. Multifunctional Schottky-diode circuit comprising palladium/molybdenum disulfide nanosheet. SMALL (WEINHEIM AN DER BERGSTRASSE, GERMANY) 2014; 10:4845-4850. [PMID: 25048428 DOI: 10.1002/smll.201401046] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/15/2014] [Revised: 06/20/2014] [Indexed: 06/03/2023]
Abstract
Many electron devices using two-dimensional dichalcogenide MoS2 have been reported beyond graphene, but those were mostly field-effect transistors except few while P-N or Schottky diode form devices should be also important. In the present study, we have fabricated a Pd-driven MoS2 Schottky diode and its related circuits for multifunctional applications: dynamic electrical rectifier, visible light sensor, and hydrogen gas sensor.
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Affiliation(s)
- Jin Sung Kim
- Department of Physics and Institute of Physics and Applied Physics, Yonsei University, 50 Yonsei-ro, Seodaemun-gu, Seoul, 120-749, Korea
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