1
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Frenzel K, Kayser Y, Hornemann A, Kästner B, Hoehl A, Mouratidis P, Rivens I, Ter Haar G, Beckhoff B. Complementary techniques for the reliable characterisation of tissue samples: A case study on pancreatic tumours analysed by means of X-ray fluorescence analysis and IR spectroscopy. PLoS One 2024; 19:e0306795. [PMID: 39231132 PMCID: PMC11373814 DOI: 10.1371/journal.pone.0306795] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/21/2023] [Accepted: 06/24/2024] [Indexed: 09/06/2024] Open
Abstract
An improvement in the reliability and comparability of tissue characterization results is crucial for enabling further progress in cancer detection and the assessment of therapeutic effects. This can only be achieved by integrating quantitative methods into well-established qualitative characterization routines. This case study presents a hybrid metrological approach for tissue characterisation including vibrational Fourier Transform InfraRed (FTIR) spectroscopy and traceable reference-free X-Ray Fluorescence analysis (XRF). Through the combination of spatially resolved qualitative molecular information with quantitative elemental concentrations an all-encompassing sample characterisation can be provided. The study was performed on tissue sections of syngeneic murine pancreatic ductal adenocarcinoma KPC (KrasG12D/+; Trp53R172H/+; Pdx-1-Cre) tumours ex-vivo. Sections from healthy pancreatic tissues, sham-exposed tumours and tumours subjected to low dose radiotherapy treatment (2 Gray and 6 Gray) were analysed using both methods. Additional sample integrity studies using Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy at the carbon and nitrogen K-edges were performed to assess the effect of sample aging and XRF investigations on the samples. Results showed an increase in the concentrations of elemental biomarkers, including S, K and amide I structures in malignant pancreatic tissue compared to healthy pancreatic tissue. The exposure of tumours to 6 Gy radiation decreases the levels of these elements towards a phenotype seen in the healthy pancreas. A protocol for hybrid investigations is presented, with emphasis on the sample preparation, minimizing the impact of consecutive applied methods on their measurands, and ensuring the compatibility and reliability of achieved results. The study demonstrates the cancer recognition capabilities, and the sensitivity for low dosage radiotherapy treatment monitoring for each method individually and assesses the potential of combining molecular fingerprinting with non-destructive quantitative elemental information for tissue sample characterization.
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Affiliation(s)
- Katja Frenzel
- Physikalisch-Technische Bundesanstalt, Berlin, Germany
| | - Yves Kayser
- Physikalisch-Technische Bundesanstalt, Berlin, Germany
| | - Andrea Hornemann
- Therapeutic Ultrasound, Division of Radiotherapy and Imaging, The Institute of Cancer Research, London, United Kingdom
| | - Bernd Kästner
- Physikalisch-Technische Bundesanstalt, Berlin, Germany
| | - Arne Hoehl
- Physikalisch-Technische Bundesanstalt, Berlin, Germany
| | - Petros Mouratidis
- Therapeutic Ultrasound, Division of Radiotherapy and Imaging, The Institute of Cancer Research, London, United Kingdom
| | - Ian Rivens
- Therapeutic Ultrasound, Division of Radiotherapy and Imaging, The Institute of Cancer Research, London, United Kingdom
| | - Gail Ter Haar
- Therapeutic Ultrasound, Division of Radiotherapy and Imaging, The Institute of Cancer Research, London, United Kingdom
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2
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Matysik J, Długosz O, Banach M. Development of Nanozymatic Characteristics in Metal-Doped Oxide Nanomaterials. J Phys Chem B 2024; 128:8007-8016. [PMID: 39120940 PMCID: PMC11345814 DOI: 10.1021/acs.jpcb.4c02526] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 08/11/2024]
Abstract
Nanozymes are nanoscale materials that exhibit enzymatic-like activity, combining the benefits of nanomaterials with biocatalytic effects. The addition of metals to nanomaterials can enhance their nanozyme activity by mimicking the active sites of enzymes, providing structural support and promoting redox activity. In this study, nanostructured oxide and silicate-phosphate nanomaterials with varying manganese and copper additions were characterized. The objective was to assess the influence of metal modifications (Mn and Cu) on the acquisition of the nanozymatic activity by selected nanomaterials. An increase in manganese content in each material enhanced proteolytic activity (from 20 to 40 mUnit/mg for BG-Mn), while higher copper addition in glassy materials increased activity by 40%. Glassy materials exhibited approximately twice the 2,2'-azino-bis(3-ethylbenzothiazoline-6-sulfonic acid radical activity (around 40 μmol/mL) compared to that of oxide materials. The proteolytic and antioxidant activities discussed in the study can be considered indicators for evaluating the enzymatic properties of the nanomaterials. Observations conducted on nanomaterials may aid in the development of materials with enhanced catalytic efficiency and a wide range of applications.
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Affiliation(s)
- Julia Matysik
- Faculty of Chemical Engineering and Technology, Institute of Chemistry and Inorganic Technology, Cracow University of Technology, Warszawska St. 24, Cracow 31-155, Poland
| | - Olga Długosz
- Faculty of Chemical Engineering and Technology, Institute of Chemistry and Inorganic Technology, Cracow University of Technology, Warszawska St. 24, Cracow 31-155, Poland
| | - Marcin Banach
- Faculty of Chemical Engineering and Technology, Institute of Chemistry and Inorganic Technology, Cracow University of Technology, Warszawska St. 24, Cracow 31-155, Poland
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3
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Bauer LJ, Wieder F, Truong V, Förste F, Wagener Y, Jonas A, Praetz S, Schlesiger C, Kupsch A, Müller BR, Kanngießer B, Zaslansky P, Mantouvalou I. Absorption Correction for 3D Elemental Distributions of Dental Composite Materials Using Laboratory Confocal Micro-X-ray Fluorescence Spectroscopy. Anal Chem 2024; 96:8441-8449. [PMID: 38757174 PMCID: PMC11140690 DOI: 10.1021/acs.analchem.4c00116] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/06/2024] [Revised: 05/02/2024] [Accepted: 05/08/2024] [Indexed: 05/18/2024]
Abstract
Confocal micro-X-ray fluorescence (micro-XRF) spectroscopy facilitates three-dimensional (3D) elemental imaging of heterogeneous samples in the micrometer range. Laboratory setups using X-ray tube excitation render the method accessible for diverse research fields but interpretation of results and quantification remain challenging. The attenuation of X-rays in composites depends on the photon energy as well as on the composition and density of the material. For confocal micro-XRF, attenuation severely impacts elemental distribution information, as the signal from deeper layers is distorted by superficial layers. Absorption correction and quantification of fluorescence measurements in heterogeneous composite samples have so far not been reported. Here, an absorption correction approach for confocal micro-XRF combining density information from microcomputed tomography (micro-CT) data with laboratory X-ray absorption spectroscopy (XAS) and synchrotron transmission measurements is presented. The energy dependency of the probing volume is considered during the correction. The methodology is demonstrated on a model composite sample consisting of a bovine tooth with a clinically used restoration material.
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Affiliation(s)
- Leona J. Bauer
- Institute
for Optics and Atomic Physics, Technical
University of Berlin, Hardenbergstr. 36, 10623 Berlin, Germany
- Berlin
Laboratory for innovative X-ray technologies—BLiX, Berlin 10623, Germany
- Helmholtz-Zentrum
Berlin, Albert-Einstein-Str.
15, 12489 Berlin, Germany
| | - Frank Wieder
- Bundesanstalt
für Materialforschung und -prüfung (BAM), Unter den Eichen 87, 12205 Berlin, Germany
| | - Vinh Truong
- Institute
for Optics and Atomic Physics, Technical
University of Berlin, Hardenbergstr. 36, 10623 Berlin, Germany
- Berlin
Laboratory for innovative X-ray technologies—BLiX, Berlin 10623, Germany
| | - Frank Förste
- Institute
for Optics and Atomic Physics, Technical
University of Berlin, Hardenbergstr. 36, 10623 Berlin, Germany
- Berlin
Laboratory for innovative X-ray technologies—BLiX, Berlin 10623, Germany
| | - Yannick Wagener
- Institute
for Optics and Atomic Physics, Technical
University of Berlin, Hardenbergstr. 36, 10623 Berlin, Germany
- Berlin
Laboratory for innovative X-ray technologies—BLiX, Berlin 10623, Germany
| | - Adrian Jonas
- Physikalisch-Technische
Bundesanstalt, Abbestraße 2-12, 10587 Berlin, Germany
| | - Sebastian Praetz
- Institute
for Optics and Atomic Physics, Technical
University of Berlin, Hardenbergstr. 36, 10623 Berlin, Germany
- Berlin
Laboratory for innovative X-ray technologies—BLiX, Berlin 10623, Germany
| | - Christopher Schlesiger
- Institute
for Optics and Atomic Physics, Technical
University of Berlin, Hardenbergstr. 36, 10623 Berlin, Germany
- Berlin
Laboratory for innovative X-ray technologies—BLiX, Berlin 10623, Germany
| | - Andreas Kupsch
- Bundesanstalt
für Materialforschung und -prüfung (BAM), Unter den Eichen 87, 12205 Berlin, Germany
| | - Bernd R. Müller
- Bundesanstalt
für Materialforschung und -prüfung (BAM), Unter den Eichen 87, 12205 Berlin, Germany
| | - Birgit Kanngießer
- Institute
for Optics and Atomic Physics, Technical
University of Berlin, Hardenbergstr. 36, 10623 Berlin, Germany
- Berlin
Laboratory for innovative X-ray technologies—BLiX, Berlin 10623, Germany
| | - Paul Zaslansky
- Department
for Operative, Preventive and Pediatric Dentistry, Charité—Universitätsmedizin Berlin, Aßmannshauser Str. 4-6, 14197 Berlin, Germany
| | - Ioanna Mantouvalou
- Helmholtz-Zentrum
Berlin, Albert-Einstein-Str.
15, 12489 Berlin, Germany
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4
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Hönicke P, Wählisch A, Unterumsberger R, Beckhoff B, Bogdanowicz J, Charley AL, Mertens H, Rochat N, Hartmann JM, Giambacorti N. Reference-free x-ray fluorescence analysis with a micrometer-sized incident beam. NANOTECHNOLOGY 2024; 35:285702. [PMID: 38579688 DOI: 10.1088/1361-6528/ad3aff] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/07/2023] [Accepted: 04/05/2024] [Indexed: 04/07/2024]
Abstract
Spatially resolved x-ray fluorescence (XRF) based analysis employing incident beam sizes in the low micrometer range (μXRF) is widely used to study lateral composition changes of various types of microstructured samples. However, up to now the quantitative analysis of such experimental datasets could only be realized employing adequate calibration or reference specimen. In this work, we extent the applicability of the so-called reference-free XRF approach to enable reference-freeμXRF analysis. Here, no calibration specimen are needed in order to derive a quantitative and position sensitive composition of the sample of interest. The necessary instrumental steps to realize reference-freeμXRF are explained and a validation of ref.-freeμXRF against ref.-free standard XRF is performed employing laterally homogeneous samples. Finally, an application example from semiconductor research is shown, where the lateral sample features require the usage of ref.-freeμXRF for quantitative analysis.
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Affiliation(s)
- Philipp Hönicke
- Physikalisch-Technische Bundesanstalt (PTB) Abbestr. 2-12 D-10587 Berlin, Germany
| | - André Wählisch
- Physikalisch-Technische Bundesanstalt (PTB) Abbestr. 2-12 D-10587 Berlin, Germany
| | | | - Burkhard Beckhoff
- Physikalisch-Technische Bundesanstalt (PTB) Abbestr. 2-12 D-10587 Berlin, Germany
| | | | | | | | - Névine Rochat
- Univ. Grenoble Alpes CEA, Leti F-38000 Grenoble, France
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5
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Murataj I, Angelini A, Cara E, Porro S, Beckhoff B, Kayser Y, Hönicke P, Ciesielski R, Gollwitzer C, Soltwisch V, Perez-Murano F, Fernandez-Regulez M, Carignano S, Boarino L, Castellino M, Ferrarese Lupi F. Hybrid Metrology for Nanostructured Optical Metasurfaces. ACS APPLIED MATERIALS & INTERFACES 2023; 15:57992-58002. [PMID: 37991460 PMCID: PMC10739581 DOI: 10.1021/acsami.3c13923] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/18/2023] [Revised: 10/23/2023] [Accepted: 11/07/2023] [Indexed: 11/23/2023]
Abstract
Metasurfaces have garnered increasing research interest in recent years due to their remarkable advantages, such as efficient miniaturization and novel functionalities compared to traditional optical elements such as lenses and filters. These advantages have facilitated their rapid commercial deployment. Recent advancements in nanofabrication have enabled the reduction of optical metasurface dimensions to the nanometer scale, expanding their capabilities to cover visible wavelengths. However, the pursuit of large-scale manufacturing of metasurfaces with customizable functions presents challenges in controlling the dimensions and composition of the constituent dielectric materials. To address these challenges, the combination of block copolymer (BCP) self-assembly and sequential infiltration synthesis (SIS), offers an alternative for fabrication of high-resolution dielectric nanostructures with tailored composition and optical functionalities. However, the absence of metrological techniques capable of providing precise and reliable characterization of the refractive index of dielectric nanostructures persists. This study introduces a hybrid metrology strategy that integrates complementary synchrotron-based traceable X-ray techniques to achieve comprehensive material characterization for the determination of the refractive index on the nanoscale. To establish correlations between material functionality and their underlying chemical, compositional and dimensional properties, TiO2 nanostructures model systems were fabricated by SIS of BCPs. The results from synchrotron-based analyses were integrated into physical models, serving as a validation scheme for laboratory-scale measurements to determine effective refractive indices of the nanoscale dielectric materials.
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Affiliation(s)
- Irdi Murataj
- Advanced
Materials and Life Science Division, Istituto
Nazionale Ricerca Metrologica (INRiM), Strada delle Cacce 91, 10135, Torino, Italy
- Dipartimento
di Scienza Applicata e Tecnologia, Politecnico
di Torino, Corso Duca degli Abruzzi, 24, 10129, Torino, Italy
| | - Angelo Angelini
- Advanced
Materials and Life Science Division, Istituto
Nazionale Ricerca Metrologica (INRiM), Strada delle Cacce 91, 10135, Torino, Italy
| | - Eleonora Cara
- Advanced
Materials and Life Science Division, Istituto
Nazionale Ricerca Metrologica (INRiM), Strada delle Cacce 91, 10135, Torino, Italy
| | - Samuele Porro
- Dipartimento
di Scienza Applicata e Tecnologia, Politecnico
di Torino, Corso Duca degli Abruzzi, 24, 10129, Torino, Italy
| | - Burkhard Beckhoff
- Physikalisch-Technische
Bundesanstalt (PTB), Abbestraße 2-12, 10587, Berlin, Germany
| | - Yves Kayser
- Physikalisch-Technische
Bundesanstalt (PTB), Abbestraße 2-12, 10587, Berlin, Germany
| | - Philipp Hönicke
- Physikalisch-Technische
Bundesanstalt (PTB), Abbestraße 2-12, 10587, Berlin, Germany
| | - Richard Ciesielski
- Physikalisch-Technische
Bundesanstalt (PTB), Abbestraße 2-12, 10587, Berlin, Germany
| | - Christian Gollwitzer
- Physikalisch-Technische
Bundesanstalt (PTB), Abbestraße 2-12, 10587, Berlin, Germany
| | - Victor Soltwisch
- Physikalisch-Technische
Bundesanstalt (PTB), Abbestraße 2-12, 10587, Berlin, Germany
| | | | | | - Stefano Carignano
- ICCUB, Universitat de Barcelona, Carrer Martí i Franquès,
1, 08028, Barcelona, Spain
| | - Luca Boarino
- Advanced
Materials and Life Science Division, Istituto
Nazionale Ricerca Metrologica (INRiM), Strada delle Cacce 91, 10135, Torino, Italy
| | - Micaela Castellino
- Dipartimento
di Scienza Applicata e Tecnologia, Politecnico
di Torino, Corso Duca degli Abruzzi, 24, 10129, Torino, Italy
| | - Federico Ferrarese Lupi
- Advanced
Materials and Life Science Division, Istituto
Nazionale Ricerca Metrologica (INRiM), Strada delle Cacce 91, 10135, Torino, Italy
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6
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Cara E, Hönicke P, Kayser Y, Lindner JK, Castellino M, Murataj I, Porro S, Angelini A, De Leo N, Pirri CF, Beckhoff B, Boarino L, Ferrarese Lupi F. Developing Quantitative Nondestructive Characterization of Nanomaterials: A Case Study on Sequential Infiltration Synthesis of Block Copolymers. ACS APPLIED POLYMER MATERIALS 2023; 5:2079-2087. [PMID: 37427013 PMCID: PMC10324101 DOI: 10.1021/acsapm.2c02094] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 12/05/2022] [Accepted: 01/31/2023] [Indexed: 07/11/2023]
Abstract
The sequential infiltration synthesis (SIS) of inorganic materials in nanostructured block copolymer templates has rapidly progressed in the last few years to develop functional nanomaterials with controllable properties. To assist this rapid evolution, expanding the capabilities of nondestructive methods for quantitative characterization of the materials properties is required. In this paper, we characterize the SIS process on three model polymers with different infiltration profiles through ex situ quantification by reference-free grazing incidence X-ray fluorescence. More qualitative depth distribution results were validated by means of X-ray photoelectron spectroscopy and scanning transmission electron microscopy combined with energy-dispersive X-ray spectroscopy.
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Affiliation(s)
- Eleonora Cara
- Advanced
Materials and Life Science Division, Istituto
Nazionale Ricerca Metrologica (INRiM), Strada delle Cacce 91, 10135 Torino, Italy
| | - Philipp Hönicke
- Physikalisch-Technische
Bundesanstalt (PTB), Abbestr. 2-12, 10587 Berlin, Germany
| | - Yves Kayser
- Physikalisch-Technische
Bundesanstalt (PTB), Abbestr. 2-12, 10587 Berlin, Germany
| | - Jörg K.
N. Lindner
- AG Nanostrukturierung,
Nanoanalyse und Photonische Materialien, Paderborn University, Warburger Str. 100, 33098 Paderborn, Germany
| | - Micaela Castellino
- Dipartimento
di Scienza Applicata e Tecnologia, Politecnico
di Torino, Corso Duca degli Abruzzi, 24, 10129 Torino, Italy
| | - Irdi Murataj
- Advanced
Materials and Life Science Division, Istituto
Nazionale Ricerca Metrologica (INRiM), Strada delle Cacce 91, 10135 Torino, Italy
- Physikalisch-Technische
Bundesanstalt (PTB), Abbestr. 2-12, 10587 Berlin, Germany
- AG Nanostrukturierung,
Nanoanalyse und Photonische Materialien, Paderborn University, Warburger Str. 100, 33098 Paderborn, Germany
- Dipartimento
di Scienza Applicata e Tecnologia, Politecnico
di Torino, Corso Duca degli Abruzzi, 24, 10129 Torino, Italy
| | - Samuele Porro
- Dipartimento
di Scienza Applicata e Tecnologia, Politecnico
di Torino, Corso Duca degli Abruzzi, 24, 10129 Torino, Italy
| | - Angelo Angelini
- Advanced
Materials and Life Science Division, Istituto
Nazionale Ricerca Metrologica (INRiM), Strada delle Cacce 91, 10135 Torino, Italy
| | - Natascia De Leo
- Advanced
Materials and Life Science Division, Istituto
Nazionale Ricerca Metrologica (INRiM), Strada delle Cacce 91, 10135 Torino, Italy
| | - Candido Fabrizio Pirri
- Dipartimento
di Scienza Applicata e Tecnologia, Politecnico
di Torino, Corso Duca degli Abruzzi, 24, 10129 Torino, Italy
| | - Burkhard Beckhoff
- Physikalisch-Technische
Bundesanstalt (PTB), Abbestr. 2-12, 10587 Berlin, Germany
| | - Luca Boarino
- Advanced
Materials and Life Science Division, Istituto
Nazionale Ricerca Metrologica (INRiM), Strada delle Cacce 91, 10135 Torino, Italy
| | - Federico Ferrarese Lupi
- Advanced
Materials and Life Science Division, Istituto
Nazionale Ricerca Metrologica (INRiM), Strada delle Cacce 91, 10135 Torino, Italy
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7
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Wählisch A, Unterumsberger R, Hönicke P, Lubeck J, Kayser Y, Weser J, Dai G, Hahm K, Weimann T, Seim C, Rehbein S, Beckhoff B. Quantitative Element-Sensitive Analysis of Individual Nanoobjects. SMALL (WEINHEIM AN DER BERGSTRASSE, GERMANY) 2023; 19:e2204943. [PMID: 36521935 DOI: 10.1002/smll.202204943] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/11/2022] [Revised: 11/22/2022] [Indexed: 06/17/2023]
Abstract
A reliable and quantitative material analysis is crucial for assessing new technological processes, especially to facilitate a quantitative understanding of advanced material properties at the nanoscale. To this end, X-ray fluorescence microscopy techniques can offer an element-sensitive and non-destructive tool for the investigation of a wide range of nanotechnological materials. Since X-ray radiation provides information depths of up to the microscale, even stratified or buried arrangements are easily accessible without invasive sample preparation. However, in terms of the quantification capabilities, these approaches are usually restricted to a qualitative or semi-quantitative analysis at the nanoscale. Relying on comparable reference nanomaterials is often not straightforward or impossible because the development of innovative nanomaterials has proven to be more fast-paced than any development process for appropriate reference materials. The present work corroborates that a traceable quantification of individual nanoobjects can be realized by means of an X-ray fluorescence microscope when utilizing rather conventional but well-calibrated instrumentation instead of reference materials. As a proof of concept, the total number of atoms forming a germanium nanoobject is quantified using soft X-ray radiation. Furthermore, complementary dimensional parameters of such objects are reconstructed.
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Affiliation(s)
- André Wählisch
- Physikalisch-Technische Bundesanstalt (PTB), Abbestr. 2-12, 10587, Berlin, Germany
| | | | - Philipp Hönicke
- Physikalisch-Technische Bundesanstalt (PTB), Abbestr. 2-12, 10587, Berlin, Germany
| | - Janin Lubeck
- Physikalisch-Technische Bundesanstalt (PTB), Abbestr. 2-12, 10587, Berlin, Germany
| | - Yves Kayser
- Physikalisch-Technische Bundesanstalt (PTB), Abbestr. 2-12, 10587, Berlin, Germany
| | - Jan Weser
- Physikalisch-Technische Bundesanstalt (PTB), Abbestr. 2-12, 10587, Berlin, Germany
| | - Gaoliang Dai
- Physikalisch-Technische Bundesanstalt (PTB), Bundesallee 100, 38116, Braunschweig, Germany
| | - Kai Hahm
- Physikalisch-Technische Bundesanstalt (PTB), Bundesallee 100, 38116, Braunschweig, Germany
| | - Thomas Weimann
- Physikalisch-Technische Bundesanstalt (PTB), Bundesallee 100, 38116, Braunschweig, Germany
| | - Christian Seim
- Technische Universität Berlin, Germany, Hardenbergstr. 36, 10623, Berlin, Germany
| | - Stefan Rehbein
- Helmholtz-Zentrum Berlin für Materialien und Energie, Albert-Einstein-Str. 15, 12489, Berlin, Germany
| | - Burkhard Beckhoff
- Physikalisch-Technische Bundesanstalt (PTB), Abbestr. 2-12, 10587, Berlin, Germany
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8
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Klapetek P. Nanometrology. NANOMATERIALS (BASEL, SWITZERLAND) 2022; 12:3755. [PMID: 36364536 PMCID: PMC9657443 DOI: 10.3390/nano12213755] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 10/05/2022] [Revised: 10/16/2022] [Accepted: 10/20/2022] [Indexed: 06/16/2023]
Abstract
Apart from being the subject of this Special Issue, what is nanometrology [...].
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Affiliation(s)
- Petr Klapetek
- Czech Metrology Institute, Okružní 31, 638 00 Brno, Czech Republic
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