1
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Yang YC, Serafini L, Gauquelin N, Verbeeck J, Jinschek JR. Improving the accuracy of temperature measurement on TEM samples using plasmon energy expansion thermometry (PEET): Addressing sample thickness effects. Ultramicroscopy 2025; 270:114102. [PMID: 39813741 DOI: 10.1016/j.ultramic.2025.114102] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/29/2024] [Revised: 12/20/2024] [Accepted: 01/02/2025] [Indexed: 01/18/2025]
Abstract
Advances in analytical scanning transmission electron microscopy (STEM) and in microelectronic mechanical systems (MEMS) based microheaters have enabled in-situ materials' characterization at the nanometer scale at elevated temperature. In addition to resolving the structural information at elevated temperatures, detailed knowledge of the local temperature distribution inside the sample is essential to reveal thermally induced phenomena and processes. Here, we investigate the accuracy of plasmon energy expansion thermometry (PEET) as a method to map the local temperature in a tungsten (W) lamella in a range between room temperature and 700 °C. In particular, we address the influence of sample thickness in the range of a typical electron-transparent TEM sample (from 30 nm to 70 nm) on the temperature-dependent plasmon energy. The shift in plasmon energy, used to determine the local sample temperature, is not only temperature-dependent, but in case of W also seems thickness-dependent in sample thicknesses below approximately 60 nm. It is believed that the underlying reason is the high susceptibility of the regions with thinner sample thickness to strain from residual load induced during FIB deposition, together with increased thermal expansion in these areas due to their higher surface-to-volume ratio. The results highlight the importance of considering sample thickness (and especially thickness variations) when analyzing the local bulk plasmon energy for temperature measurement using PEET. However, in case of W, an increasing beam broadening (FWHM) of the bulk plasmon peak with decreasing sample thickness can be used to improve the accuracy of PEET in TEM lamellae with varying sample thickness.
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Affiliation(s)
- Yi-Chieh Yang
- National Centre for Nano Fabrication and Characterization (DTU Nanolab), Technical University of Denmark (DTU), Kgs. Lyngby, Denmark
| | - Luca Serafini
- Electron Microscopy for Materials Science (EMAT), University of Antwerp, Antwerp, Belgium; NANOlab Center of Excellence, University of Antwerp, Antwerp, Belgium
| | - Nicolas Gauquelin
- Electron Microscopy for Materials Science (EMAT), University of Antwerp, Antwerp, Belgium; NANOlab Center of Excellence, University of Antwerp, Antwerp, Belgium
| | - Johan Verbeeck
- Electron Microscopy for Materials Science (EMAT), University of Antwerp, Antwerp, Belgium; NANOlab Center of Excellence, University of Antwerp, Antwerp, Belgium
| | - Joerg R Jinschek
- National Centre for Nano Fabrication and Characterization (DTU Nanolab), Technical University of Denmark (DTU), Kgs. Lyngby, Denmark.
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2
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Coffman DK, Hattar K, Luo J, Dillon S. Spectral Pyrometry for Practical Temperature Measurement in the TEM. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2024:ozae114. [PMID: 39589928 DOI: 10.1093/mam/ozae114] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/16/2024] [Revised: 10/07/2024] [Accepted: 10/29/2024] [Indexed: 11/28/2024]
Abstract
Recent work in ultra-high temperature in situ electron microscopy has presented the need for accurate, contact-free temperature determination at the microscale. Optical measurement based on thermal radiation (pyrometry) is an attractive solution but can be difficult to perform correctly due to effects, such as emissivity and optical transmission, that must be accounted for. Here, we present a practical guide to calibrating and using a spectral pyrometry system, including example code, using a Czerny-Turner spectrometer attached to a transmission electron microscope. Calibration can be accomplished using a thermocouple or commercial heated sample holder, after which arbitrary samples can be reliably measured for temperatures above ∼600∘C. An accuracy of 2% can be expected with the possibility of sub-second temporal resolution and sub-Kelvin temperature resolution. We then demonstrate this capability in conjunction with traditional microscopic techniques, such as diffraction-based strain measurement for thermal expansion coefficient, or live-video sintering evolution.
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Affiliation(s)
- D Keith Coffman
- Department of Materials Science & Engineering, University of Illinois Urbana-Champaign, Champaign, IL 61801, USA
| | - Khalid Hattar
- Department of Nuclear Engineering, University of Tennessee Knoxville, Knoxville, TN 37996, USA
| | - Jian Luo
- Department of Materials Science & Engineering, University of California San Diego, Sand Diego, CA 92093, USA
| | - Shen Dillon
- Department of Materials Science & Engineering, University of California Irvine, Irvine, CA 92697, USA
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3
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Kim W, Kim K, Kim J, Lee Z. In situ observation of catalyst nanoparticle sintering resistance on oxide supports via gas phase transmission electron microscopy. Appl Microsc 2024; 54:7. [PMID: 39284998 PMCID: PMC11405595 DOI: 10.1186/s42649-024-00100-4] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/30/2024] [Accepted: 09/05/2024] [Indexed: 09/22/2024] Open
Abstract
Oxide-supported metal catalysts are essential components in industrial processes for catalytic conversion. However, the performance of these catalysts is often compromised in high temperature reaction environments due to sintering effects. Currently, a number of studies are underway with the objective of improving the metal support interaction (MSI) effect in order to enhance sintering resistance by surface modification of the oxide support, including the formation of inhomogeneous defects on the oxide support, the addition of a rare earth element, the use of different facets, encapsulation, and other techniques. The recent developments in in situ gas phase transmission electron microscopy (TEM) have enabled direct observation of the sintering process of NPs in real time. This capability further allows to verify the efficacy of the methods used to tailor the support surface and contributes effectively to improving sintering resistance. Here, we review a few selected studies on how in situ gas phase TEM has been used to prevent the sintering of catalyst NPs on oxide supports.
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Affiliation(s)
- Wonjun Kim
- Center for Multidimensional Carbon Materials (CMCM), Institute for Basic Science (IBS), Ulsan, 44919, Republic of Korea
- Department of Materials Science and Engineering, Ulsan National Institute of Science and Technology (UNIST), Ulsan, 44919, Republic of Korea
| | - Kangsik Kim
- Center for Multidimensional Carbon Materials (CMCM), Institute for Basic Science (IBS), Ulsan, 44919, Republic of Korea
| | - Jaejin Kim
- Shell International Exploration & Production, Inc, Shell Technology Center Houston, 3333 Hwy 6 S, Houston, TX, 77082-3101, USA
| | - Zonghoon Lee
- Center for Multidimensional Carbon Materials (CMCM), Institute for Basic Science (IBS), Ulsan, 44919, Republic of Korea.
- Department of Materials Science and Engineering, Ulsan National Institute of Science and Technology (UNIST), Ulsan, 44919, Republic of Korea.
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4
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Fritsch B, Wu M, Hutzler A, Zhou D, Spruit R, Vogl L, Will J, Garza HHP, März M, Jank MP, Spiecker E. Sub-Kelvin thermometry for evaluating the local temperature stability within in situ TEM gas cells. Ultramicroscopy 2022; 235:113494. [DOI: 10.1016/j.ultramic.2022.113494] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/16/2021] [Revised: 12/14/2021] [Accepted: 02/15/2022] [Indexed: 11/25/2022]
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5
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Vijayan S, Wang R, Kong Z, Jinschek JR. Quantification of extreme thermal gradients during in situ transmission electron microscope heating experiments. Microsc Res Tech 2021; 85:1527-1537. [PMID: 34897877 DOI: 10.1002/jemt.24015] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/08/2021] [Revised: 10/13/2021] [Accepted: 11/28/2021] [Indexed: 11/07/2022]
Abstract
Studies on materials affected by large thermal gradients and rapid thermal cycling are an area of increasing interest, driving the need for real time observations of microstructural evoultion under transient thermal conditions. However, current in situ transmission electron microscope (TEM) heating stages introduce uniform temperature distributions across the material during heating experiments. Here, a methodology is described to generate thermal gradients across a TEM specimen by modifying a commercially available MEMS-based heating stage. It was found that a specimen placed next to the metallic heater, over a window, cut by FIB milling, does not disrupt the overall thermal stability of the device. Infrared thermal imaging (IRTI) experiments were performed on unmodified and modified heating devices, to measure thermal gradients across the device. The mean temperature measured within the central viewing area of the unmodified device was 3-5% lower than the setpoint temperature. Using IRTI data, at setpoint temperatures ranging from 900 to 1,300°C, thermal gradients at the edge of the modified window were calculated to be in the range of 0.6 × 106 to 7.0 × 106 °C/m. Additionally, the Ag nanocube sublimation approach was used, to measure the local temperature across a FIB-cut Si lamella at high spatial resolution inside the TEM, and demonstrate "proof of concept" of the modified MEMS device. The thermal gradient across the Si lamella, measured using the latter approach was found to be 6.3 × 106 °C/m, at a setpoint temperature of 1,000°C. Finally, the applicability of this approach and choice of experimental parameters are critically discussed.
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Affiliation(s)
- Sriram Vijayan
- Department of Materials Science & Engineering, The Ohio State University, Columbus, Ohio, USA
| | - Rongxuan Wang
- Grado Department of Industrial and Systems Engineering, Virginia Tech, Blacksburg, Virginia, USA
| | - Zhenyu Kong
- Grado Department of Industrial and Systems Engineering, Virginia Tech, Blacksburg, Virginia, USA
| | - Joerg R Jinschek
- Department of Materials Science & Engineering, The Ohio State University, Columbus, Ohio, USA
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6
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Li M, Xie DG, Zhang XX, Yang JC, Shan ZW. Quantifying Real-Time Sample Temperature Under the Gas Environment in the Transmission Electron Microscope Using a Novel MEMS Heater. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2021; 27:758-766. [PMID: 34018478 DOI: 10.1017/s1431927621000489] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/12/2023]
Abstract
Accurate control and measurement of real-time sample temperature are critical for the understanding and interpretation of the experimental results from in situ heating experiments inside environmental transmission electron microscope (ETEM). However, quantifying the real-time sample temperature remains a challenging task for commercial in situ TEM heating devices, especially under gas conditions. In this work, we developed a home-made micro-electrical-mechanical-system (MEMS) heater with unprecedented small temperature gradient and thermal drift, which not only enables the temperature evolution caused by gas injection to be measured in real-time but also makes the key heat dissipation path easier to model to theoretically understand and predict the temperature decrease. A new parameter termed as “gas cooling ability (H)”, determined purely by the physical properties of the gas, can be used to compare and predict the gas-induced temperature decrease by different gases. Our findings can act as a reference for predicting the real temperature for in situ heating experiments without closed-loop temperature sensing capabilities in the gas environment, as well as all gas-related heating systems.
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Affiliation(s)
- Meng Li
- Center for Advancing Materials Performance from the Nanoscale (CAMP-Nano), State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an 710049, China
- Department of Chemical and Petroleum Engineering, University of Pittsburgh, Pittsburgh, PA15260, USA
| | - De-Gang Xie
- Center for Advancing Materials Performance from the Nanoscale (CAMP-Nano), State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an 710049, China
| | - Xi-Xiang Zhang
- Division of Physical Science and Engineering, King Abdullah University of Science & Technology (KAUST), Thuwal23955-6900, Saudi Arabia
| | - Judith C Yang
- Department of Chemical and Petroleum Engineering, University of Pittsburgh, Pittsburgh, PA15260, USA
| | - Zhi-Wei Shan
- Center for Advancing Materials Performance from the Nanoscale (CAMP-Nano), State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an 710049, China
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7
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Hubbard WA, Mecklenburg M, Lodico JJ, Chen Y, Ling XY, Patil R, Kessel WA, Flatt GJK, Chan HL, Vareskic B, Bal G, Zutter B, Regan BC. Electron-Transparent Thermoelectric Coolers Demonstrated with Nanoparticle and Condensation Thermometry. ACS NANO 2020; 14:11510-11517. [PMID: 32790350 DOI: 10.1021/acsnano.0c03958] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
Abstract
More efficient thermoelectric devices would revolutionize refrigeration and energy production, and low-dimensional thermoelectric materials are predicted to be more efficient than their bulk counterparts. But nanoscale thermoelectric devices generate thermal gradients on length scales that are too small to resolve with traditional thermometry methods. Here we fabricate, using single-crystal bismuth telluride (Bi2Te3) and antimony/bismuth telluride (Sb2-xBixTe3) flakes exfoliated from commercially available bulk materials, functional thermoelectric coolers (TECs) that are only 100 nm thick. These devices are the smallest TECs ever demonstrated by a factor of 104. After depositing indium nanoparticles to serve as nanothermometers, we measure the heating and cooling produced by the devices with plasmon energy expansion thermometry (PEET), a high-spatial-resolution, transmission electron microscopy (TEM)-based thermometry technique, demonstrating a ΔT = -21 ± 4 K from room temperature. We also establish proof-of-concept for condensation thermometry, a quantitative temperature-change mapping technique with a spatial precision of ≲300 nm.
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Affiliation(s)
- William A Hubbard
- Department of Physics and Astronomy, University of California, Los Angeles, California 90095, United States
- California NanoSystems Institute, University of California, Los Angeles, California 90095, United States
| | - Matthew Mecklenburg
- Core Center of Excellence in Nano Imaging, University of Southern California, Los Angeles, California 90089, United States
| | - Jared J Lodico
- Department of Physics and Astronomy, University of California, Los Angeles, California 90095, United States
- California NanoSystems Institute, University of California, Los Angeles, California 90095, United States
| | - Yueyun Chen
- Department of Physics and Astronomy, University of California, Los Angeles, California 90095, United States
| | - Xin Yi Ling
- Department of Physics and Astronomy, University of California, Los Angeles, California 90095, United States
| | - Roshni Patil
- Department of Physics and Astronomy, University of California, Los Angeles, California 90095, United States
| | - W Andrew Kessel
- Department of Physics and Astronomy, University of California, Los Angeles, California 90095, United States
| | - Graydon J K Flatt
- Department of Physics and Astronomy, University of California, Los Angeles, California 90095, United States
| | - Ho Leung Chan
- Department of Physics and Astronomy, University of California, Los Angeles, California 90095, United States
- California NanoSystems Institute, University of California, Los Angeles, California 90095, United States
| | - Bozo Vareskic
- Department of Physics and Astronomy, University of California, Los Angeles, California 90095, United States
| | - Gurleen Bal
- Department of Physics and Astronomy, University of California, Los Angeles, California 90095, United States
| | - Brian Zutter
- Department of Physics and Astronomy, University of California, Los Angeles, California 90095, United States
- California NanoSystems Institute, University of California, Los Angeles, California 90095, United States
| | - B C Regan
- Department of Physics and Astronomy, University of California, Los Angeles, California 90095, United States
- California NanoSystems Institute, University of California, Los Angeles, California 90095, United States
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8
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Gaulandris F, Simonsen SB, Wagner JB, Mølhave K, Muto S, Kuhn LT. Methods for Calibration of Specimen Temperature During In Situ Transmission Electron Microscopy Experiments. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2020; 26:3-17. [PMID: 31957636 DOI: 10.1017/s1431927619015344] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/10/2023]
Abstract
One of the biggest challenges for in situ heating transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) is the ability to measure the local temperature of the specimen accurately. Despite technological improvements in the construction of TEM/STEM heating holders, the problem of being able to measure the real sample temperature is still the subject of considerable discussion. In this study, we review the present literature on methodologies for temperature calibration. We analyze calibration methods that require the use of a thermometric material in addition to the specimen under study, as well as methods that can be performed directly on the specimen of interest without the need for a previous calibration. Finally, an overview of the most important characteristics of all the treated techniques, including temperature ranges and uncertainties, is provided in order to provide an accessory database to consult before an in situ TEM/STEM temperature calibration experiment.
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Affiliation(s)
- Fabrizio Gaulandris
- Department of Energy Conversion and Storage, Technical University of Denmark, Fysikvej, DK-2800 Kgs. Lyngby, Denmak
| | - Søren B Simonsen
- Department of Energy Conversion and Storage, Technical University of Denmark, Fysikvej, DK-2800 Kgs. Lyngby, Denmak
| | - Jakob B Wagner
- DTU Nanolab, Technical University of Denmark, Fysikvej DK-2800 Kgs. Lyngby, Denmark
| | - Kristian Mølhave
- DTU Nanolab, Technical University of Denmark, Fysikvej DK-2800 Kgs. Lyngby, Denmark
| | - Shun Muto
- Institute of Materials and Systems for Sustainability, Nagoya University, 464-8601 Furocho, Chikusa-ku, Nagoya, Aichi, Japan
| | - Luise T Kuhn
- Department of Energy Conversion and Storage, Technical University of Denmark, Fysikvej, DK-2800 Kgs. Lyngby, Denmak
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9
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Chmielewski A, Ricolleau C, Alloyeau D, Wang G, Nelayah J. Nanoscale temperature measurement during temperature controlled in situ TEM using Al plasmon nanothermometry. Ultramicroscopy 2019; 209:112881. [PMID: 31739188 DOI: 10.1016/j.ultramic.2019.112881] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/26/2019] [Revised: 10/21/2019] [Accepted: 11/01/2019] [Indexed: 11/17/2022]
Abstract
Over recent years, the advent of microelectromechanical system (MEMS)-type microheaters has pushed the limits of temperature controlled in situ transmission electron microscopy (TEM). In particular, by enabling the observation of the structure of materials in their application environments, temperature controlled TEM provides unprecedented insights into the link between the properties of materials and their structure in real-world problems, a clear knowledge of which is necessary for rational development of functional materials with new or improved properties. While temperature is the key parameter in such experiments, accessing the precise temperature of the sample at the nanoscale during observations still remains challenging. In the present work, we have applied aluminium plasmon nanothermometry technique that monitors the temperature dependence of the volume plasmon of Al nanospheres using electron energy loss spectroscopy for in situ local temperature determination over MEMS-type microheaters. With access to local temperatures between room temperature to 550 ∘C, we have assessed the spatial and temporal stabilities of these microheaters when they operate at different setpoint temperatures both under vacuum and in the presence of a static H2 gas environment. Temperature comparisons performed under the two environments show discrepancies between local and setpoint temperatures.
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Affiliation(s)
- A Chmielewski
- Université de Paris, Laboratoire Matériaux et Phénomènes Quantiques, CNRS, F-75013, Paris, France
| | - C Ricolleau
- Université de Paris, Laboratoire Matériaux et Phénomènes Quantiques, CNRS, F-75013, Paris, France
| | - D Alloyeau
- Université de Paris, Laboratoire Matériaux et Phénomènes Quantiques, CNRS, F-75013, Paris, France
| | - G Wang
- Université de Paris, Laboratoire Matériaux et Phénomènes Quantiques, CNRS, F-75013, Paris, France
| | - J Nelayah
- Université de Paris, Laboratoire Matériaux et Phénomènes Quantiques, CNRS, F-75013, Paris, France.
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10
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Temperature calibration of TEM specimen heating holders by isothermal sublimation of silver nanocubes. Ultramicroscopy 2019; 196:142-153. [DOI: 10.1016/j.ultramic.2018.10.011] [Citation(s) in RCA: 11] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/26/2018] [Revised: 10/19/2018] [Accepted: 10/25/2018] [Indexed: 11/21/2022]
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11
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VandenBussche EJ, Flannigan DJ. Sources of error in Debye-Waller-effect measurements relevant to studies of photoinduced structural dynamics. Ultramicroscopy 2018; 196:111-120. [PMID: 30352384 DOI: 10.1016/j.ultramic.2018.10.002] [Citation(s) in RCA: 9] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/04/2018] [Revised: 09/23/2018] [Accepted: 10/04/2018] [Indexed: 10/28/2022]
Abstract
We identify and quantify several practical effects likely to be present in both static and ultrafast electron-scattering experiments that may interfere with the Debye-Waller (DW) effect. Using 120-nm thick, small-grained, polycrystalline aluminum foils as a test system, we illustrate the impact of specimen tilting, in-plane translation, and changes in z height on Debye-Scherrer-ring intensities. We find that tilting by less than one degree can result in statistically-significant changes in diffracted-beam intensities for large specimen regions containing > 105 nanocrystalline grains. We demonstrate that, in addition to effective changes in the field of view with tilting, slight texturing of the film can result in deviations from expected DW-effect behavior. Further, we find that in-plane translations of as little as 20 nm also produce statistically-significant intensity changes, while normalization to total image counts eliminates such effects arising from changes in z height. The results indicate that the use of polycrystalline films in ultrafast electron-scattering experiments can greatly reduce the negative impacts of these effects as compared to single-crystal specimens, though it does not entirely eliminate them. Thus, it is important to account for such effects when studying thin-foil specimens having relatively short reciprocal-lattice rods.
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Affiliation(s)
- Elisah J VandenBussche
- Department of Chemical Engineering and Materials Science, University of Minnesota, 421 Washington Ave. SE, Minneapolis, MN 55455, United States
| | - David J Flannigan
- Department of Chemical Engineering and Materials Science, University of Minnesota, 421 Washington Ave. SE, Minneapolis, MN 55455, United States.
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12
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Veghte DP, China S, Weis J, Lin P, Hinks ML, Kovarik L, Nizkorodov SA, Gilles MK, Laskin A. Heating-Induced Transformations of Atmospheric Particles: Environmental Transmission Electron Microscopy Study. Anal Chem 2018; 90:9761-9768. [PMID: 30008222 DOI: 10.1021/acs.analchem.8b01410] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/28/2022]
Abstract
Environmental transmission electron microscopy was employed to probe transformations in the size, morphology, and composition of individual atmospheric particles as a function of temperature. Two different heating devices were used and calibrated in this work: a furnace heater and a Micro Electro Mechanical System heater. The temperature calibration used sublimation temperatures of NaCl, glucose, and ammonium sulfate particles, and the melting temperature of tin. Volatilization of Suwanee River Fulvic Acid was further used to validate the calibration up to 800 °C. The calibrated furnace holder was used to examine both laboratory-generated secondary organic aerosol particles and field-collected atmospheric particles. Chemical analysis by scanning transmission X-ray microscopy and near-edge fine-structure spectroscopy of the organic particles at different heating steps showed that above 300 °C particle volatilization was accompanied by charring. These methods were then applied to ambient particles collected in the central Amazon region. Distinct categories of particles differed in their volatilization response to heating. Spherical, more-viscous particles lost less volume during heating than particles that spread on the imaging substrate during impaction, due to either being liquid upon impaction or lower viscosity. This methodology illustrates a new analytical approach to accurately measure the volume fraction remaining for individually tracked atmospheric particles at elevated temperatures.
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Affiliation(s)
- Daniel P Veghte
- William R. Wiley Environmental Molecular Sciences Laboratory , Pacific Northwest National Laboratory , Richland , Washington 99354 , United States
| | - Swarup China
- William R. Wiley Environmental Molecular Sciences Laboratory , Pacific Northwest National Laboratory , Richland , Washington 99354 , United States
| | - Johannes Weis
- Department of Chemistry , University of California , Berkeley , California 94720 , United States.,Chemical Sciences Division , Lawrence Berkeley National Laboratory , Berkeley , California 94720 , United States
| | - Peng Lin
- Department of Chemistry , University of California , Irvine , California 92697 , United States
| | - Mallory L Hinks
- Department of Chemistry , University of California , Irvine , California 92697 , United States
| | - Libor Kovarik
- William R. Wiley Environmental Molecular Sciences Laboratory , Pacific Northwest National Laboratory , Richland , Washington 99354 , United States
| | - Sergey A Nizkorodov
- Department of Chemistry , University of California , Irvine , California 92697 , United States
| | - Mary K Gilles
- Department of Chemistry , University of California , Berkeley , California 94720 , United States
| | - Alexander Laskin
- Department of Chemistry , Purdue University , West Lafayette , Indiana 47907-2084 United States
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13
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Hayashida M, Cui K, Malac M, Egerton R. Thermal expansion coefficient measurement from electron diffraction of amorphous films in a TEM. Ultramicroscopy 2018; 188:8-12. [DOI: 10.1016/j.ultramic.2018.02.003] [Citation(s) in RCA: 8] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/02/2017] [Revised: 01/31/2018] [Accepted: 02/15/2018] [Indexed: 11/30/2022]
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14
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Local temperature measurement in TEM by parallel beam electron diffraction. Ultramicroscopy 2017; 176:161-169. [DOI: 10.1016/j.ultramic.2016.11.028] [Citation(s) in RCA: 46] [Impact Index Per Article: 5.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/12/2016] [Revised: 11/06/2016] [Accepted: 11/25/2016] [Indexed: 11/23/2022]
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15
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Taheri ML, Stach EA, Arslan I, Crozier PA, Kabius BC, LaGrange T, Minor AM, Takeda S, Tanase M, Wagner JB, Sharma R. Current status and future directions for in situ transmission electron microscopy. Ultramicroscopy 2016; 170:86-95. [PMID: 27566048 DOI: 10.1016/j.ultramic.2016.08.007] [Citation(s) in RCA: 76] [Impact Index Per Article: 8.4] [Reference Citation Analysis] [Abstract] [Key Words] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/16/2016] [Revised: 06/11/2016] [Accepted: 08/05/2016] [Indexed: 11/25/2022]
Abstract
This review article discusses the current and future possibilities for the application of in situ transmission electron microscopy to reveal synthesis pathways and functional mechanisms in complex and nanoscale materials. The findings of a group of scientists, representing academia, government labs and private sector entities (predominantly commercial vendors) during a workshop, held at the Center for Nanoscale Science and Technology- National Institute of Science and Technology (CNST-NIST), are discussed. We provide a comprehensive review of the scientific needs and future instrument and technique developments required to meet them.
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Affiliation(s)
- Mitra L Taheri
- Department of Materials Science and Engineering, Drexel University, USA
| | - Eric A Stach
- Center for Functional Nanomaterials, National Laboratory, Brookhaven, USA
| | - Ilke Arslan
- Pacific Northwest National Laboratory, Physical and Computational Sciences Directorate, 902 Battelle Blvd, Richland, WA, USA
| | - P A Crozier
- School for Engineering of Matter, Transport and Energy, Arizona State University, Tempe, AZ 85281, USA
| | - Bernd C Kabius
- The Pennsylvania State University, University Park, PA 16802, USA
| | - Thomas LaGrange
- Lawrence Livermore National Laboratory, Physical and Life Science Directorate, Condensed Matter and Materials Division, 7000 East Avenue, P.O. 808 L-356, USA
| | - Andrew M Minor
- Department of Materials Science & Engineering, University of California, Berkeley and National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, One Cyclotron Road, MS 72, Berkeley, CA, USA
| | - Seiji Takeda
- Institute of Scientific and Industrial Research (ISIR), Osaka University, 8-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan
| | - Mihaela Tanase
- Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899-6203, USA
| | - Jakob B Wagner
- Center for Electron Nanoscopy, Technical University of Denmark, Kgs, Lyngby, Denmark
| | - Renu Sharma
- Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899-6203, USA.
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