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Zarrouk T, Ibragimova R, Bartók AP, Caro MA. Experiment-Driven Atomistic Materials Modeling: A Case Study Combining X-Ray Photoelectron Spectroscopy and Machine Learning Potentials to Infer the Structure of Oxygen-Rich Amorphous Carbon. J Am Chem Soc 2024; 146:14645-14659. [PMID: 38749497 PMCID: PMC11140750 DOI: 10.1021/jacs.4c01897] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/06/2024] [Revised: 05/02/2024] [Accepted: 05/03/2024] [Indexed: 05/30/2024]
Abstract
An important yet challenging aspect of atomistic materials modeling is reconciling experimental and computational results. Conventional approaches involve generating numerous configurations through molecular dynamics or Monte Carlo structure optimization and selecting the one with the closest match to experiment. However, this inefficient process is not guaranteed to succeed. We introduce a general method to combine atomistic machine learning (ML) with experimental observables that produces atomistic structures compatible with experiment by design. We use this approach in combination with grand-canonical Monte Carlo within a modified Hamiltonian formalism, to generate configurations that agree with experimental data and are chemically sound (low in energy). We apply our approach to understand the atomistic structure of oxygenated amorphous carbon (a-COx), an intriguing carbon-based material, to answer the question of how much oxygen can be added to carbon before it fully decomposes into CO and CO2. Utilizing an ML-based X-ray photoelectron spectroscopy (XPS) model trained from GW and density functional theory (DFT) data, in conjunction with an ML interatomic potential, we identify a-COx structures compliant with experimental XPS predictions that are also energetically favorable with respect to DFT. Employing a network analysis, we accurately deconvolve the XPS spectrum into motif contributions, both revealing the inaccuracies inherent to experimental XPS interpretation and granting us atomistic insight into the structure of a-COx. This method generalizes to multiple experimental observables and allows for the elucidation of the atomistic structure of materials directly from experimental data, thereby enabling experiment-driven materials modeling with a degree of realism previously out of reach.
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Affiliation(s)
- Tigany Zarrouk
- Department
of Chemistry and Materials Science, Aalto
University, Espoo 02150, Finland
| | - Rina Ibragimova
- Department
of Chemistry and Materials Science, Aalto
University, Espoo 02150, Finland
| | - Albert P. Bartók
- Department
of Physics, University of Warwick, Coventry CV4 7AL, U.K.
- Warwick
Centre for Predictive Modelling, School of Engineering, University of Warwick, Coventry CV4 7AL, U.K.
| | - Miguel A. Caro
- Department
of Chemistry and Materials Science, Aalto
University, Espoo 02150, Finland
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2
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Yu T, Wang D, Liu M, Lei W, Shafie S, Mohtar MN, Jindapetch N, van Paphavee D, Zhao Z. A carbon conductive filament-induced robust resistance switching behavior for brain-inspired computing. MATERIALS HORIZONS 2024; 11:1334-1343. [PMID: 38175571 DOI: 10.1039/d3mh01762a] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 01/05/2024]
Abstract
Memristors have revolutionized the path forward for brain-inspired computing. However, the instability of the nucleation process of conductive filaments based on active metal electrodes leads to the discrete distribution of switching parameters, which hinders the realization of high-performance and low-power devices for neuromorphic computing. In response, a carbon conductive filament-induced robust memristor is demonstrated with variation coefficients as low as 3.9%/-1.18%, a threshold power as low as 10-9 W, and 3 × 106 s retention and 107 cycle endurance behaviors can be maintained. The recognition accuracy for Modified National Institute of Standards and Technology (MNIST) handwriting is as high as 96.87%, attributed to the high linearity of the iterative updating of synaptic weights. The demodulation and storage functions of the American Standard Code for Information Interchange (ASCII) are demonstrated by programmable pulse modulation. Notably, the transmission electron microscopy (TEM) images allow the observation of carbon conductive filament paths formed in the low resistance state. First-principles calculations analyze the energetics of defects involved in the diffusion of carbon atoms into MoTe2 films. This work presents a novel guideline for studying memristor-based neuromorphic computing.
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Affiliation(s)
- Tianqi Yu
- Joint International Research Laboratory of Information Display and Visualization, School of Electronic Science and Engineering, Southeast University, Nanjing 210096, People's Republic of China.
| | - Dong Wang
- Joint International Research Laboratory of Information Display and Visualization, School of Electronic Science and Engineering, Southeast University, Nanjing 210096, People's Republic of China.
| | - Min Liu
- Joint International Research Laboratory of Information Display and Visualization, School of Electronic Science and Engineering, Southeast University, Nanjing 210096, People's Republic of China.
| | - Wei Lei
- Joint International Research Laboratory of Information Display and Visualization, School of Electronic Science and Engineering, Southeast University, Nanjing 210096, People's Republic of China.
| | - Suhaidi Shafie
- Institute of Nanoscience and Nanotechnology, University Putra Malaysia, Serdang, Selangor, Malaysia
| | - Mohd Nazim Mohtar
- Institute of Nanoscience and Nanotechnology, University Putra Malaysia, Serdang, Selangor, Malaysia
| | - Nattha Jindapetch
- Department of Electrical Engineering, Faculty of Engineering, Prince of Songkla University, Hat Yai, Songkhla, 90112, Thailand
| | - Dommelen van Paphavee
- Division of Physical Science, Faculty of Science, Prince of Songkla University, Hat Yai Campus 15 Karnjanavanich, Hat Yai, Kohong District Songkhla, 90110, Thailand
| | - Zhiwei Zhao
- Joint International Research Laboratory of Information Display and Visualization, School of Electronic Science and Engineering, Southeast University, Nanjing 210096, People's Republic of China.
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3
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Xie Z, Zhang D, Yang B, Qu T, Liang F. Regulation of high value-added carbon nanomaterials by DC arc plasma using graphite anodes from spent lithium-ion batteries. WASTE MANAGEMENT (NEW YORK, N.Y.) 2024; 174:88-95. [PMID: 38035661 DOI: 10.1016/j.wasman.2023.11.030] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/18/2023] [Revised: 11/16/2023] [Accepted: 11/23/2023] [Indexed: 12/02/2023]
Abstract
With the extensive use of lithium-ion batteries (LIBs), neglecting to recycle graphite anodes from LIBs leads to environmental pollution and the waste of graphite resources. Thus, developing an efficient and environment-protecting approach to reusing spent graphite anodes is necessary. Here, high value-added graphene sheets (GS), carbon nanohorns (CNHs), fluorine-doped CNHs (F-CNHs), and amorphous carbon nanoballs (ACNs) were prepared from spent graphite anodes of LIBs via DC arc plasma. In order to control the conversion of spent graphite anodes into various carbon nanomaterials, the growth mechanism of carbon nanomaterials is investigated by quenching rate. Benefiting from the extremely high quenching rates (>1.8 × 106 K/s) produced by DC arc plasma, the particle size of the prepared ACNs and CNHs is small and evenly distributed. The CNHs show a "dahlia-like" structure, and the number of graphene layers is only 3-8. Furthermore, the structural transformation mechanism of carbon nanomaterials is researched by deposition temperature. The ACNs, few-layer GS, and CNHs produced by the high quenching rates are unstable and prone to structural transformation. When these carbon nanomaterials are deposited on the cathode surface and cathode holder, the ACNs, "dahlia-like" CNHs, and GS undergo processes of fusing and overlaying at high temperatures, respectively, resulting in the agglomeration and increased particle size of ACNs and "seed-like" CNHs. Meanwhile, the GS is bent and converted into carbon nanocages (CBCs). Overall, the carbon nanomaterials prepared using spent anodes from LIBs by arc plasma are a facile, environment-friendly, and economical strategy to achieve high value-added utilization of the graphite.
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Affiliation(s)
- Zhipeng Xie
- The Faculty of Metallurgical and Energy Engineering, Kunming University of Science and Technology, Kunming 650093, China; The National Engineering Laboratory for Vacuum Metallurgy, Kunming University of Science and Technology, Kunming 650093, China; Key Laboratory for Nonferrous Vacuum Metallurgy of Yunnan Province, Kunming University of Science and Technology, Kunming 650093, China
| | - Da Zhang
- The Faculty of Metallurgical and Energy Engineering, Kunming University of Science and Technology, Kunming 650093, China; The National Engineering Laboratory for Vacuum Metallurgy, Kunming University of Science and Technology, Kunming 650093, China; Key Laboratory for Nonferrous Vacuum Metallurgy of Yunnan Province, Kunming University of Science and Technology, Kunming 650093, China
| | - Bin Yang
- The Faculty of Metallurgical and Energy Engineering, Kunming University of Science and Technology, Kunming 650093, China; The National Engineering Laboratory for Vacuum Metallurgy, Kunming University of Science and Technology, Kunming 650093, China; Key Laboratory for Nonferrous Vacuum Metallurgy of Yunnan Province, Kunming University of Science and Technology, Kunming 650093, China
| | - Tao Qu
- The Faculty of Metallurgical and Energy Engineering, Kunming University of Science and Technology, Kunming 650093, China; The National Engineering Laboratory for Vacuum Metallurgy, Kunming University of Science and Technology, Kunming 650093, China; Key Laboratory for Nonferrous Vacuum Metallurgy of Yunnan Province, Kunming University of Science and Technology, Kunming 650093, China
| | - Feng Liang
- The Faculty of Metallurgical and Energy Engineering, Kunming University of Science and Technology, Kunming 650093, China; The National Engineering Laboratory for Vacuum Metallurgy, Kunming University of Science and Technology, Kunming 650093, China; Key Laboratory for Nonferrous Vacuum Metallurgy of Yunnan Province, Kunming University of Science and Technology, Kunming 650093, China.
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4
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Singh AK, Thakurta B, Giri A, Pal M. Wafer-scale synthesis of two-dimensional ultrathin films. Chem Commun (Camb) 2024; 60:265-279. [PMID: 38087984 DOI: 10.1039/d3cc04610a] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/03/2024]
Abstract
Two-dimensional (2D) materials, consisting of atomically thin layered crystals, have attracted tremendous interest due to their outstanding intrinsic properties and diverse applications in electronics, optoelectronics, and catalysis. The large-scale growth of high-quality ultrathin 2D films and their utilization in the facile fabrication of devices, easily adoptable in industrial applications, have been extensively sought after during the last decade; however, it remains a challenge to achieve these goals. Herein, we introduce three key concepts: (i) the microwave assisted quick (∼1 min) synthesis of wafer-scale (6-inch) anisotropic conducting ultrathin (∼1 nm) amorphous carbon and 2D semiconducting metal chalcogenide atomically thin films, (ii) a polymer-assisted deposition process for the synthesis of wafer-scale (6-inch) 2D metal chalcogenide and pyrolyzed carbon thin films, and (iii) the surface diffusion and epitaxial self-planarization induced synthesis of wafer-scale (2-inch) single crystal 2D binary and large-grain 2D ferromagnetic ternary metal chalcogenide thin films. The proposed synthesis concepts can pave a new way for the manufacture of wafer-scale high quality 2D ultrathin films and their utilization in the facile fabrication of devices.
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Affiliation(s)
- Amresh Kumar Singh
- Department of Chemistry, Institute of Science, Banaras Hindu University, Varanasi, UP 221005, India.
| | - Baishali Thakurta
- Department of Chemistry, Institute of Science, Banaras Hindu University, Varanasi, UP 221005, India.
| | - Anupam Giri
- Department of Chemistry, Faculty of Science, University of Allahabad, Prayagraj, UP 211002, India.
| | - Monalisa Pal
- Department of Chemistry, Institute of Science, Banaras Hindu University, Varanasi, UP 221005, India.
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5
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Kim IS, Shim CE, Kim SW, Lee CS, Kwon J, Byun KE, Jeong U. Amorphous Carbon Films for Electronic Applications. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2023; 35:e2204912. [PMID: 36408886 DOI: 10.1002/adma.202204912] [Citation(s) in RCA: 1] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/31/2022] [Revised: 08/08/2022] [Indexed: 06/16/2023]
Abstract
While various crystalline carbon allotropes, including graphene, have been actively investigated, amorphous carbon (a-C) thin films have received relatively little attention. The a-C is a disordered form of carbon bonding with a broad range of the CC bond length and bond angle. Although accurate structural analysis and theoretical approaches are still insufficient, reproducible structure-property relationships have been accumulated. As the a-C thin film is now adapted as a hardmask in the semiconductor industry and new properties are reported continuously, expectations are growing that it can be practically used as active materials beyond as a simple sacrificial layer. In this perspective review article, after a brief introduction to the synthesis and properties of the a-C thin films, their potential practical applications are proposed, including hardmasks, extreme ultraviolet (EUV) pellicles, diffusion barriers, deformable electrodes and interconnects, sensors, active layers, electrodes for energy, micro-supercapacitors, batteries, nanogenerators, electromagnetic interference (EMI) shielding, and nanomembranes. The article ends with a discussion on the technological challenges in a-C thin films.
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Affiliation(s)
- Ik-Soo Kim
- Department of Materials Science and Engineering, Pohang University of Science and Technology (POSTECH), 77 Chengam-ro, Nam-gu, Pohang, 37673, Republic of Korea
| | - Chae-Eun Shim
- Department of Materials Science and Engineering, Pohang University of Science and Technology (POSTECH), 77 Chengam-ro, Nam-gu, Pohang, 37673, Republic of Korea
| | - Sang Won Kim
- New Material Laboratory, Samsung Advanced Institute of Technology, Suwon-si, Gyeonggido, 16678, Republic of Korea
| | - Chang-Seok Lee
- New Material Laboratory, Samsung Advanced Institute of Technology, Suwon-si, Gyeonggido, 16678, Republic of Korea
| | - Junyoung Kwon
- New Material Laboratory, Samsung Advanced Institute of Technology, Suwon-si, Gyeonggido, 16678, Republic of Korea
| | - Kyung-Eun Byun
- New Material Laboratory, Samsung Advanced Institute of Technology, Suwon-si, Gyeonggido, 16678, Republic of Korea
| | - Unyong Jeong
- Department of Materials Science and Engineering, Pohang University of Science and Technology (POSTECH), 77 Chengam-ro, Nam-gu, Pohang, 37673, Republic of Korea
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6
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Golze D, Hirvensalo M, Hernández-León P, Aarva A, Etula J, Susi T, Rinke P, Laurila T, Caro MA. Accurate Computational Prediction of Core-Electron Binding Energies in Carbon-Based Materials: A Machine-Learning Model Combining Density-Functional Theory and GW. CHEMISTRY OF MATERIALS : A PUBLICATION OF THE AMERICAN CHEMICAL SOCIETY 2022; 34:6240-6254. [PMID: 35910537 PMCID: PMC9330771 DOI: 10.1021/acs.chemmater.1c04279] [Citation(s) in RCA: 10] [Impact Index Per Article: 5.0] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 12/13/2021] [Revised: 06/30/2022] [Indexed: 06/15/2023]
Abstract
We present a quantitatively accurate machine-learning (ML) model for the computational prediction of core-electron binding energies, from which X-ray photoelectron spectroscopy (XPS) spectra can be readily obtained. Our model combines density functional theory (DFT) with GW and uses kernel ridge regression for the ML predictions. We apply the new approach to disordered materials and small molecules containing carbon, hydrogen, and oxygen and obtain qualitative and quantitative agreement with experiment, resolving spectral features within 0.1 eV of reference experimental spectra. The method only requires the user to provide a structural model for the material under study to obtain an XPS prediction within seconds. Our new tool is freely available online through the XPS Prediction Server.
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Affiliation(s)
- Dorothea Golze
- Faculty
of Chemistry and Food Chemistry, Technische
Universität Dresden, 01062 Dresden, Germany
- Department
of Applied Physics, Aalto University, 02150 Espoo, Finland
| | - Markus Hirvensalo
- Department
of Applied Physics, Aalto University, 02150 Espoo, Finland
| | | | - Anja Aarva
- Department
of Electrical Engineering and Automation, Aalto University, 02150 Espoo, Finland
| | - Jarkko Etula
- Department
of Chemistry and Materials Science, Aalto
University, 02150 Espoo, Finland
| | - Toma Susi
- University
of Vienna, Faculty of Physics, Boltzmanngasse 5, 1090 Vienna, Austria
| | - Patrick Rinke
- Department
of Applied Physics, Aalto University, 02150 Espoo, Finland
| | - Tomi Laurila
- Department
of Electrical Engineering and Automation, Aalto University, 02150 Espoo, Finland
- Department
of Chemistry and Materials Science, Aalto
University, 02150 Espoo, Finland
| | - Miguel A. Caro
- Department
of Electrical Engineering and Automation, Aalto University, 02150 Espoo, Finland
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7
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Dastgeer G, Afzal AM, Aziz J, Hussain S, Jaffery SHA, Kim DK, Imran M, Assiri MA. Flexible Memory Device Composed of Metal-Oxide and Two-Dimensional Material (SnO 2/WTe 2) Exhibiting Stable Resistive Switching. MATERIALS (BASEL, SWITZERLAND) 2021; 14:7535. [PMID: 34947133 PMCID: PMC8708916 DOI: 10.3390/ma14247535] [Citation(s) in RCA: 3] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 11/18/2021] [Revised: 12/02/2021] [Accepted: 12/07/2021] [Indexed: 11/17/2022]
Abstract
Two-terminal, non-volatile memory devices are the fundamental building blocks of memory-storage devices to store the required information, but their lack of flexibility limits their potential for biological applications. After the discovery of two-dimensional (2D) materials, flexible memory devices are easy to build, because of their flexible nature. Here, we report on our flexible resistive-switching devices, composed of a bilayer tin-oxide/tungsten-ditelluride (SnO2/WTe2) heterostructure sandwiched between Ag (top) and Au (bottom) metal electrodes over a flexible PET substrate. The Ag/SnO2/WTe2/Au flexible devices exhibited highly stable resistive switching along with an excellent retention time. Triggering the device from a high-resistance state (HRS) to a low-resistance state (LRS) is attributed to Ag filament formation because of its diffusion. The conductive filament begins its development from the anode to the cathode, contrary to the formal electrochemical metallization theory. The bilayer structure of SnO2/WTe2 improved the endurance of the devices and reduced the switching voltage by up to 0.2 V compared to the single SnO2 stacked devices. These flexible and low-power-consumption features may lead to the construction of a wearable memory device for data-storage purposes.
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Affiliation(s)
- Ghulam Dastgeer
- Department of Physics & Astronomy and Graphene Research Institute, Sejong University, Seoul 05006, Korea
| | - Amir Muhammad Afzal
- Department of Physics, Riphah International University, 13-km Raiwind Road, Lahore 54000, Pakistan;
| | - Jamal Aziz
- Department of Electrical Engineering, Sejong University, 209 Neungdong-ro, Gwangjin-gu, Seoul 05006, Korea; (J.A.); (D.-k.K.)
| | - Sajjad Hussain
- HMC (Hybrid Materials Center), Department of Nanotechnology & Advanced Materials Engineering and Graphene Research Institute, Sejong University, Seoul 05006, Korea; (S.H.); (S.H.A.J.)
| | - Syed Hassan Abbas Jaffery
- HMC (Hybrid Materials Center), Department of Nanotechnology & Advanced Materials Engineering and Graphene Research Institute, Sejong University, Seoul 05006, Korea; (S.H.); (S.H.A.J.)
| | - Deok-kee Kim
- Department of Electrical Engineering, Sejong University, 209 Neungdong-ro, Gwangjin-gu, Seoul 05006, Korea; (J.A.); (D.-k.K.)
| | - Muhammad Imran
- Department of Chemistry, Faculty of Science, King Khalid University, P.O. Box 9004, Abha 61413, Saudi Arabia; (M.I.); (M.A.A.)
| | - Mohammed Ali Assiri
- Department of Chemistry, Faculty of Science, King Khalid University, P.O. Box 9004, Abha 61413, Saudi Arabia; (M.I.); (M.A.A.)
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Lanza M, Waser R, Ielmini D, Yang JJ, Goux L, Suñe J, Kenyon AJ, Mehonic A, Spiga S, Rana V, Wiefels S, Menzel S, Valov I, Villena MA, Miranda E, Jing X, Campabadal F, Gonzalez MB, Aguirre F, Palumbo F, Zhu K, Roldan JB, Puglisi FM, Larcher L, Hou TH, Prodromakis T, Yang Y, Huang P, Wan T, Chai Y, Pey KL, Raghavan N, Dueñas S, Wang T, Xia Q, Pazos S. Standards for the Characterization of Endurance in Resistive Switching Devices. ACS NANO 2021; 15:17214-17231. [PMID: 34730935 DOI: 10.1021/acsnano.1c06980] [Citation(s) in RCA: 35] [Impact Index Per Article: 11.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/25/2023]
Abstract
Resistive switching (RS) devices are emerging electronic components that could have applications in multiple types of integrated circuits, including electronic memories, true random number generators, radiofrequency switches, neuromorphic vision sensors, and artificial neural networks. The main factor hindering the massive employment of RS devices in commercial circuits is related to variability and reliability issues, which are usually evaluated through switching endurance tests. However, we note that most studies that claimed high endurances >106 cycles were based on resistance versus cycle plots that contain very few data points (in many cases even <20), and which are collected in only one device. We recommend not to use such a characterization method because it is highly inaccurate and unreliable (i.e., it cannot reliably demonstrate that the device effectively switches in every cycle and it ignores cycle-to-cycle and device-to-device variability). This has created a blurry vision of the real performance of RS devices and in many cases has exaggerated their potential. This article proposes and describes a method for the correct characterization of switching endurance in RS devices; this method aims to construct endurance plots showing one data point per cycle and resistive state and combine data from multiple devices. Adopting this recommended method should result in more reliable literature in the field of RS technologies, which should accelerate their integration in commercial products.
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Affiliation(s)
- Mario Lanza
- Physical Science and Engineering Division, King Abdullah University of Science and Technology (KAUST), Thuwal 23955-6900, Saudi Arabia
| | - Rainer Waser
- Peter-Grünberg-Institut (PGI-7), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany
- Peter-Grünberg-Institut (PGI-10), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany
- Institut für Werkstoffe der Elektrotechnik 2 (IWE2), RWTH Aachen University, Aachen 52074, Germany
| | - Daniele Ielmini
- Dipartimento di Elettronica, Informazione e Bioingegneria, Politecnico di Milano and IU.NET, Piazza L. da Vinci 32, Milano, 20133, Italy
| | - J Joshua Yang
- Department of Electrical and Computer Engineering, University of Southern California, Los Angeles, California 90089, United States
| | | | - Jordi Suñe
- Departament d'Enginyeria Electrònica, Universitat Autònoma de Barcelona, Barcelona 08193, Spain
| | - Anthony Joseph Kenyon
- Department of Electronic and Electrical Engineering, University College London, Torrington Place, London WC1E 7JE, United Kingdom
| | - Adnan Mehonic
- Department of Electronic and Electrical Engineering, University College London, Torrington Place, London WC1E 7JE, United Kingdom
| | - Sabina Spiga
- CNR-IMM, Unit of Agrate Brianza, Via C. Olivetti 2, Agrate Brianza (MB) 20864, Italy
| | - Vikas Rana
- Peter-Grünberg-Institut (PGI-10), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany
| | - Stefan Wiefels
- Peter-Grünberg-Institut (PGI-7), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany
| | - Stephan Menzel
- Peter-Grünberg-Institut (PGI-7), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany
| | - Ilia Valov
- Peter-Grünberg-Institut (PGI-7), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany
| | - Marco A Villena
- Applied Materials Inc., Via Ruini, Reggio Emilia 74L 42122, Italy
| | - Enrique Miranda
- Departament d'Enginyeria Electrònica, Universitat Autònoma de Barcelona, Barcelona 08193, Spain
| | - Xu Jing
- School of Materials Science and Engineering, Jiangsu Key Laboratory of Advanced Metallic Materials, Southeast University, Nanjing 211189, China
| | - Francesca Campabadal
- Institut de Microelectrònica de Barcelona-Centre Nacional de Microelectrònica, Consejo Superior de Investigaciones Científicas, Bellaterra 08193, Spain
| | - Mireia B Gonzalez
- Institut de Microelectrònica de Barcelona-Centre Nacional de Microelectrònica, Consejo Superior de Investigaciones Científicas, Bellaterra 08193, Spain
| | - Fernando Aguirre
- Unidad de Investigación y Desarrollo de las Ingenierías-CONICET, Facultad Regional Buenos Aires, Universidad Tecnológica Nacional (UIDI-CONICET/FRBA-UTN), Buenos Aires, Medrano 951(C1179AAQ), Argentina
| | - Felix Palumbo
- Unidad de Investigación y Desarrollo de las Ingenierías-CONICET, Facultad Regional Buenos Aires, Universidad Tecnológica Nacional (UIDI-CONICET/FRBA-UTN), Buenos Aires, Medrano 951(C1179AAQ), Argentina
| | - Kaichen Zhu
- Physical Science and Engineering Division, King Abdullah University of Science and Technology (KAUST), Thuwal 23955-6900, Saudi Arabia
| | - Juan Bautista Roldan
- Departamento de Electrónica y Tecnología de Computadores, Facultad de Ciencias, Universidad de Granada, Avd. Fuentenueva s/n, Granada 18071, Spain
| | - Francesco Maria Puglisi
- Dipartimento di Ingegneria "Enzo Ferrari", Università di Modena e Reggio Emilia, Via P. Vivarelli 10/1, Modena 41125, Italy
| | - Luca Larcher
- Applied Materials Inc., Via Ruini, Reggio Emilia 74L 42122, Italy
| | - Tuo-Hung Hou
- Department of Electronics Engineering and Institute of Electronics, National Yang Ming Chiao Tung University, Hsinchu 300, Taiwan
| | - Themis Prodromakis
- Centre for Electronics Frontiers, University of Southampton, Southampton SO171BJ, United Kingdom
| | - Yuchao Yang
- Key Laboratory of Microelectronic Devices and Circuits (MOE), Department of Micro/nanoelectronics, Peking University, Beijing 100871, China
| | - Peng Huang
- Key Laboratory of Microelectronic Devices and Circuits (MOE), Department of Micro/nanoelectronics, Peking University, Beijing 100871, China
| | - Tianqing Wan
- Department of Applied Physics, The Hong Kong Polytechnic University, Kowloon, Hong Kong
| | - Yang Chai
- Department of Applied Physics, The Hong Kong Polytechnic University, Kowloon, Hong Kong
| | - Kin Leong Pey
- Engineering Product Development, Singapore University of Technology and Design (SUTD), 8 Somapah Road, 487372 Singapore
| | - Nagarajan Raghavan
- Engineering Product Development, Singapore University of Technology and Design (SUTD), 8 Somapah Road, 487372 Singapore
| | - Salvador Dueñas
- Department of Electronics, University of Valladolid, Paseo de Belén 15, Valladolid E-47011, Spain
| | - Tao Wang
- Institute of Functional Nano and Soft Materials (FUNSOM), Collaborative Innovation Center of Suzhou Nano Science and Technology, Soochow University 199 Ren-Ai Road, Suzhou 215123, China
| | - Qiangfei Xia
- Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, Massachusetts 01003-9292, United States
| | - Sebastian Pazos
- Physical Science and Engineering Division, King Abdullah University of Science and Technology (KAUST), Thuwal 23955-6900, Saudi Arabia
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Riley PR, Joshi P, Azizi Machekposhti S, Sachan R, Narayan J, Narayan RJ. Enhanced Vapor Transmission Barrier Properties via Silicon-Incorporated Diamond-Like Carbon Coating. Polymers (Basel) 2021; 13:polym13203543. [PMID: 34685307 PMCID: PMC8537770 DOI: 10.3390/polym13203543] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/10/2021] [Revised: 10/08/2021] [Accepted: 10/11/2021] [Indexed: 01/20/2023] Open
Abstract
In this study, we describe reducing the moisture vapor transmission through a commercial polymer bag material using a silicon-incorporated diamond-like carbon (Si-DLC) coating that was deposited using plasma-enhanced chemical vapor deposition. The structure of the Si-DLC coating was analyzed using scanning electron microscopy, Raman spectroscopy, X-ray photoelectron spectroscopy, energy-dispersive X-ray spectroscopy, selective area electron diffraction, and electron energy loss spectroscopy. Moisture vapor transmission rate (MVTR) testing was used to understand the moisture transmission barrier properties of Si-DLC-coated polymer bag material; the MVTR values decreased from 10.10 g/m2 24 h for the as-received polymer bag material to 6.31 g/m2 24 h for the Si-DLC-coated polymer bag material. Water stability tests were conducted to understand the resistance of the Si-DLC coatings toward moisture; the results confirmed the stability of Si-DLC coatings in contact with water up to 100 °C for 4 h. A peel-off adhesion test using scotch tape indicated that the good adhesion of the Si-DLC film to the substrate was preserved in contact with water up to 100 °C for 4 h.
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Affiliation(s)
- Parand R. Riley
- Department of Materials Science and Engineering, Centennial Campus, North Carolina State University, Raleigh, NC 27695-7907, USA; (P.R.R.); (P.J.); (J.N.)
| | - Pratik Joshi
- Department of Materials Science and Engineering, Centennial Campus, North Carolina State University, Raleigh, NC 27695-7907, USA; (P.R.R.); (P.J.); (J.N.)
| | - Sina Azizi Machekposhti
- Joint Department of Biomedical Engineering, Centennial Campus, North Carolina State University, Raleigh, NC 27695-7115, USA;
| | - Ritesh Sachan
- Department of Mechanical Engineering, Oklahoma State University, Stillwater, OK 74078, USA;
| | - Jagdish Narayan
- Department of Materials Science and Engineering, Centennial Campus, North Carolina State University, Raleigh, NC 27695-7907, USA; (P.R.R.); (P.J.); (J.N.)
| | - Roger J. Narayan
- Joint Department of Biomedical Engineering, Centennial Campus, North Carolina State University, Raleigh, NC 27695-7115, USA;
- Correspondence:
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10
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Guo T, Sun B, Ranjan S, Jiao Y, Wei L, Zhou YN, Wu YA. From Memristive Materials to Neural Networks. ACS APPLIED MATERIALS & INTERFACES 2020; 12:54243-54265. [PMID: 33232112 DOI: 10.1021/acsami.0c10796] [Citation(s) in RCA: 14] [Impact Index Per Article: 3.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
Abstract
The information technologies have been increasing exponentially following Moore's law over the past decades. This has fundamentally changed the ways of work and life. However, further improving data process efficiency is facing great challenges because of physical and architectural limitations. More powerful computational methodologies are crucial to fulfill the technology gap in the post-Moore's law period. The memristor exhibits promising prospects in information storage, high-performance computing, and artificial intelligence. Since the memristor was theoretically predicted by L. O. Chua in 1971 and experimentally confirmed by HP Laboratories in 2008, it has attracted great attention from worldwide researchers. The intrinsic properties of memristors, such as simple structure, low power consumption, compatibility with the complementary metal oxide-semiconductor (CMOS) process, and dual functionalities of the data storage and computation, demonstrate great prospects in many applications. In this review, we cover the memristor-relevant computing technologies, from basic materials to in-memory computing and future prospects. First, the materials and mechanisms in the memristor are discussed. Then, we present the development of the memristor in the domains of the synapse simulating, in-memory logic computing, deep neural networks (DNNs) and spiking neural networks (SNNs). Finally, the existent technology challenges and outlook of the state-of-art applications are proposed.
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Affiliation(s)
- Tao Guo
- Department of Mechanical and Mechatronics Engineering, Waterloo Institute of Nanotechnology, Centre for Advanced Materials Joining, University of Waterloo, Waterloo, Ontario N2L 3G1, Canada
| | - Bai Sun
- Department of Mechanical and Mechatronics Engineering, Waterloo Institute of Nanotechnology, Centre for Advanced Materials Joining, University of Waterloo, Waterloo, Ontario N2L 3G1, Canada
- School of Physical Science and Technology, Key Laboratory of Advanced Technology of Materials (Ministry of Education of China), Southwest Jiaotong University, Chengdu, Sichuan 610031, China
| | - Shubham Ranjan
- Department of Electrical and Computer Engineering, University of Waterloo, Waterloo, Ontario N2L 3G1, Canada
| | - Yixuan Jiao
- Department of Mechanical and Mechatronics Engineering, Waterloo Institute of Nanotechnology, Centre for Advanced Materials Joining, University of Waterloo, Waterloo, Ontario N2L 3G1, Canada
- Department of Chemical Engineering, University of Waterloo, Waterloo, Ontario N2L 3G1, Canada
| | - Lan Wei
- Department of Electrical and Computer Engineering, University of Waterloo, Waterloo, Ontario N2L 3G1, Canada
| | - Y Norman Zhou
- Department of Mechanical and Mechatronics Engineering, Waterloo Institute of Nanotechnology, Centre for Advanced Materials Joining, University of Waterloo, Waterloo, Ontario N2L 3G1, Canada
| | - Yimin A Wu
- Department of Mechanical and Mechatronics Engineering, Waterloo Institute of Nanotechnology, Centre for Advanced Materials Joining, University of Waterloo, Waterloo, Ontario N2L 3G1, Canada
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11
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Liu ZC, Wang L. Carbon resistive probe memory designed for ultra-high storage density. NANOTECHNOLOGY 2020; 31:385204. [PMID: 32503020 DOI: 10.1088/1361-6528/ab99f4] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
Abstract
Probe-based storage memories are considered one of the most promising solutions to address the mass storage issues in the near future. However, data size arising from conventional probe memories is usually larger than probe size due to the thermal diffusion effect. To eliminate such thermal interference and make data dimension fully dominated by probe dimension, we proposed a concept of carbon-based resistive probe memory and developed a comprehensive computational model to predict its write, rewrite and readout performances governed by electro-thermal and mass concentration processes. The physical reality of such a theoretical model was demonstrated through the good agreement between the calculated and experimental measured threshold voltages for different layered thickness. The data bit of carbon-based resistive probe memory, considered as the sp2 filament inside sp3 background, is formed completely underneath the tip edge due to the localized electric field induced here. This makes the bit size fully determined by the probe tip dimension and allows for the achievement of ultra-high density using an ultra-small probe tip with low energy consumption. Such a conductive filament can be also rewritten back to its pristine sp3 state at relatively high temperature (~250 °C) and detected by sensing the device reading contrast (~1). The designed carbon-based resistive probe memory can retain its bit completeness even if we reduce the bit pitch to 28 nm for a probe size of 25 nm, exhibiting a superior immunity to thermal cross-talk effect. It, however, induces strong readout cross-talk, which is revealed from the resistance image of the multiple bit pattern. This adversely reduces the achievable recording density due to the required large bit pitch, which can be alleviated using either a very sharp tip apex or the optical readout scheme.
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Affiliation(s)
- Zhi-Cheng Liu
- School of Information Engineering, Nanchang Hang Kong University, Nanchang 330069, People's Republic of China
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12
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Ginnaram S, Qiu JT, Maikap S. Controlling Cu Migration on Resistive Switching, Artificial Synapse, and Glucose/Saliva Detection by Using an Optimized AlO x Interfacial Layer in a-CO x -Based Conductive Bridge Random Access Memory. ACS OMEGA 2020; 5:7032-7043. [PMID: 32258939 PMCID: PMC7114759 DOI: 10.1021/acsomega.0c00795] [Citation(s) in RCA: 9] [Impact Index Per Article: 2.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/22/2020] [Accepted: 03/05/2020] [Indexed: 05/29/2023]
Abstract
The Cu migration is controlled by using an optimized AlO x interfacial layer, and effects on resistive switching performance, artificial synapse, and human saliva detection in an amorphous-oxygenated-carbon (a-CO x )-based CBRAM platform have been investigated for the first time. The 4 nm-thick AlO x layer in the Cu/AlO x /a-CO x /TiN x O y /TiN structure shows consecutive >2000 DC switching, tight distribution of SET/RESET voltages, a long program/erase (P/E) endurance of >109 cycles at a low operation current of 300 μA, and artificial synaptic characteristics under a small pulse width of 100 ns. After a P/E endurance of >108 cycles, the Cu migration is observed by both ex situ high-resolution transmission electron microscopy and energy-dispersive X-ray spectroscopy mapping images. Furthermore, the optimized Cu/AlO x /a-CO x /TiN x O y /TiN CBRAM detects glucose with a low concentration of 1 pM, and real-time measurement of human saliva with a small sample volume of 1 μL is also detected repeatedly in vitro. This is owing to oxidation-reduction of Cu electrode, and the switching mechanism is explored. Therefore, this CBRAM device is beneficial for future artificial intelligence application.
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Affiliation(s)
- Sreekanth Ginnaram
- Thin
Film Nano Tech. Lab., Department of Electronic Engineering, Chang Gung University (CGU), No. 259, Wen-Hwa 1st Rd., Guishan, Taoyuan 33302, Taiwan
| | - Jiantai Timothy Qiu
- Division
of Gynecology-Oncology, Department of Obstetrics/Gynecology, Chang Gung Memorial Hospital (CGMH), No. 5, Fu-Shing St., Taoyuan 333, Taiwan
- Department
of Biomedical Sciences, School of Medicine, Chang Gung University (CGU), No. 259, Wen-Hwa 1st Rd., Guishan, Taoyuan 33302, Taiwan
| | - Siddheswar Maikap
- Thin
Film Nano Tech. Lab., Department of Electronic Engineering, Chang Gung University (CGU), No. 259, Wen-Hwa 1st Rd., Guishan, Taoyuan 33302, Taiwan
- Division
of Gynecology-Oncology, Department of Obstetrics/Gynecology, Chang Gung Memorial Hospital (CGMH), No. 5, Fu-Shing St., Taoyuan 333, Taiwan
- Department
of Obstetrics and Gynecology, Keelung Chang
Gung Memorial Hospital (CGMH), No. 222, Maijin Rd., Anle, Keelung 204, Taiwan
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13
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Pal M, Giri A, Kim DW, Shin S, Kong M, Thiyagarajan K, Kwak J, Okello OFN, Choi SY, Jeong U. Fabrication of Foldable Metal Interconnections by Hybridizing with Amorphous Carbon Ultrathin Anisotropic Conductive Film. ACS NANO 2019; 13:7175-7184. [PMID: 31149801 DOI: 10.1021/acsnano.9b02649] [Citation(s) in RCA: 13] [Impact Index Per Article: 2.6] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/09/2023]
Abstract
With the advent of foldable electronics, it is necessary to develop a technology ensuring foldability when the circuit lines are placed on the topmost substrate rather than in the neutral plane used in the present industry. Considering the potential technological impacts, conversion of the conventional printed circuit boards to foldable ones is most desirable to achieve the topmost circuitry. This study realizes this unconventional conversion concept by coating an ultrathin anisotropic conductive film (UACF) on a printed metal circuit board. This study presents rapid large-area synthesis of hydrogenated amorphous carbon (a-C:H) thin films and their use as the UACF. Since the synthesized a-C:H thin film has electrical transparency, the metal/a-C:H hybrid board reflects the complexity of the underlying metal circuit board. The a-C:H thin film electrically connects the cracked area of the metal line; thus, the hybrid circuit board is foldable without resistance change during repeated folding cycles. The metal/UACF hybrid circuit board can be applied to the fabrication of various foldable electronic devices.
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Affiliation(s)
- Monalisa Pal
- Department of Materials Science and Engineering , Pohang University of Science and Technology , Cheongam-Ro 77, Nam-Gu , Pohang , Gyeongbuk 790-784 , Korea
| | - Anupam Giri
- Department of Materials Science and Engineering , Pohang University of Science and Technology , Cheongam-Ro 77, Nam-Gu , Pohang , Gyeongbuk 790-784 , Korea
| | - Dong Wook Kim
- Department of Materials Science and Engineering , Pohang University of Science and Technology , Cheongam-Ro 77, Nam-Gu , Pohang , Gyeongbuk 790-784 , Korea
| | - Sangbaie Shin
- Department of Materials Science and Engineering , Pohang University of Science and Technology , Cheongam-Ro 77, Nam-Gu , Pohang , Gyeongbuk 790-784 , Korea
| | - Minsik Kong
- Department of Materials Science and Engineering , Pohang University of Science and Technology , Cheongam-Ro 77, Nam-Gu , Pohang , Gyeongbuk 790-784 , Korea
| | - Kaliannan Thiyagarajan
- Department of Materials Science and Engineering , Pohang University of Science and Technology , Cheongam-Ro 77, Nam-Gu , Pohang , Gyeongbuk 790-784 , Korea
| | - Junghyeok Kwak
- Department of Materials Science and Engineering , Pohang University of Science and Technology , Cheongam-Ro 77, Nam-Gu , Pohang , Gyeongbuk 790-784 , Korea
| | - Odongo Francis Ngome Okello
- Department of Materials Science and Engineering , Pohang University of Science and Technology , Cheongam-Ro 77, Nam-Gu , Pohang , Gyeongbuk 790-784 , Korea
| | - Si-Young Choi
- Department of Materials Science and Engineering , Pohang University of Science and Technology , Cheongam-Ro 77, Nam-Gu , Pohang , Gyeongbuk 790-784 , Korea
| | - Unyong Jeong
- Department of Materials Science and Engineering , Pohang University of Science and Technology , Cheongam-Ro 77, Nam-Gu , Pohang , Gyeongbuk 790-784 , Korea
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14
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Russo P, Xiao M, Zhou NY. Electrochemical Oxidation Induced Multi-Level Memory in Carbon-Based Resistive Switching Devices. Sci Rep 2019; 9:1564. [PMID: 30733534 PMCID: PMC6367418 DOI: 10.1038/s41598-018-38249-0] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/03/2018] [Accepted: 12/18/2018] [Indexed: 12/03/2022] Open
Abstract
In this work, we report for the first time the electrochemical oxidation as a technique to improve the electrical performances of carbon-based resistive switching devices. The devices obtained through the anodic oxidation of carbon-structures possess superior electrical performances i.e. a 3-level memory behavior and an ON/OFF ratio two order of magnitude higher than the non-oxidized carbon-based devices. It is demonstrated that the chemical composition of the carbon structures (i.e. percentage of oxygen groups, sp2 and sp3 carbon atoms) plays a key role in the improvement of the carbon-based devices. The electrochemical oxidation allows the possibility to control the oxidation degree, and therefore, to tailor the devices electrical performances. We demonstrated that the resistive switching behavior in the electrochemically oxidized devices is originated from the formation of conductive filament paths, which are built from the oxygen vacancies and structural defects of the anodic oxidized carbon materials. The novelty of this work relies on the anodic oxidation as a time- and cost-effective technique that can be employed for the engineering and improvement of the electrical performances of next generation carbon-based resistive switching devices.
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Affiliation(s)
- Paola Russo
- Waterloo Institute for Nanotechnology, University of Waterloo, 200 University Avenue West Waterloo, Ontario, N2L 3G1, Canada.,Centre for Advanced Materials Joining, University of Waterloo, 200 University Avenue West Waterloo, Ontario, N2L 3G1, Canada.,Multi-Scale Additive Manufacturing Lab, University of Waterloo, 200 University Avenue West Waterloo, Ontario, N2L 3G1, Canada.,Department of Mechanical and Mechatronics Engineering, University of Waterloo, 200 University Avenue West Waterloo, Ontario, N2L 3G1, Canada
| | - Ming Xiao
- Waterloo Institute for Nanotechnology, University of Waterloo, 200 University Avenue West Waterloo, Ontario, N2L 3G1, Canada.,Centre for Advanced Materials Joining, University of Waterloo, 200 University Avenue West Waterloo, Ontario, N2L 3G1, Canada.,Department of Mechanical and Mechatronics Engineering, University of Waterloo, 200 University Avenue West Waterloo, Ontario, N2L 3G1, Canada
| | - Norman Y Zhou
- Waterloo Institute for Nanotechnology, University of Waterloo, 200 University Avenue West Waterloo, Ontario, N2L 3G1, Canada. .,Centre for Advanced Materials Joining, University of Waterloo, 200 University Avenue West Waterloo, Ontario, N2L 3G1, Canada. .,Department of Mechanical and Mechatronics Engineering, University of Waterloo, 200 University Avenue West Waterloo, Ontario, N2L 3G1, Canada.
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15
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Srivastava S, Dey P, Asapu S, Maiti T. Role of GO and r-GO in resistance switching behavior of bilayer TiO 2 based RRAM. NANOTECHNOLOGY 2018; 29:505702. [PMID: 30211700 DOI: 10.1088/1361-6528/aae135] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/08/2023]
Abstract
Graphene-based resistance random access memory devices (RRAMs) have shown promise as a suitable replacement for flash memories, owing to their fast switching speed, low programming voltage, better scalability and great reliability. Furthermore, recent research works have shown bi-layer RRAM devices exhibiting better performance along the same parameters, where titania is one of the most commonly used materials. In the present work, we have studied the resistance switching behavior in a bi-layer RRAM device structure of TiO2 with graphene oxide (GO) and reduced graphene oxide (rGO). Switching mechanism in these devices has been investigated by detailed experimental characterization in conjunction with a finite element modeling (FEM) simulation. A dual conical conductive filament has been used in the present work, based on the modeling of the electroforming process carried out by FEM. It has been demonstrated that for the GO/TiO2 based hybrid RRAM device structure, GO acts as an active filament formation layer, whereas in the rGO/TiO2 bi-layer structure, rGO acts as a mere electrode.
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Affiliation(s)
- Siddharth Srivastava
- Plasmonics and Perovskites Laboratory, Department of Materials Science and Engineering, Indian Institute of Technology Kanpur, Kanpur, UP 208016, India
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16
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Raeber TJ, Barlow AJ, Zhao ZC, McKenzie DR, Partridge JG, McCulloch DG, Murdoch BJ. Sensory gating in bilayer amorphous carbon memristors. NANOSCALE 2018; 10:20272-20278. [PMID: 30362489 DOI: 10.1039/c8nr05328f] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/16/2023]
Abstract
Multi-state amorphous carbon-based memory devices have been developed that exhibit both bipolar and unipolar resistive switching behaviour. These modes of operation were implemented independently to access multiple resistance states, enabling higher memory density than conventional binary non-volatile memory technologies. The switching characteristics have been further utilised to study synaptic computational functions that could be implemented in artificial neural networks. Notably, paired-pulse inhibition (PPI) is observed at bio-realistic timescales (<100 ms). Devices displaying this rich synaptic behaviour could function as robust stand-alone synapse-inspired memory or be applied as filters for specialised neuromorphic circuits and sensors.
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Affiliation(s)
- T J Raeber
- School of Science, RMIT University, VIC 3001, Melbourne, Australia.
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17
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Kim M, Ge R, Wu X, Lan X, Tice J, Lee JC, Akinwande D. Zero-static power radio-frequency switches based on MoS 2 atomristors. Nat Commun 2018; 9:2524. [PMID: 29955064 PMCID: PMC6023925 DOI: 10.1038/s41467-018-04934-x] [Citation(s) in RCA: 51] [Impact Index Per Article: 8.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/24/2018] [Accepted: 05/18/2018] [Indexed: 12/02/2022] Open
Abstract
Recently, non-volatile resistance switching or memristor (equivalently, atomristor in atomic layers) effect was discovered in transitional metal dichalcogenides (TMD) vertical devices. Owing to the monolayer-thin transport and high crystalline quality, ON-state resistances below 10 Ω are achievable, making MoS2 atomristors suitable as energy-efficient radio-frequency (RF) switches. MoS2 RF switches afford zero-hold voltage, hence, zero-static power dissipation, overcoming the limitation of transistor and mechanical switches. Furthermore, MoS2 switches are fully electronic and can be integrated on arbitrary substrates unlike phase-change RF switches. High-frequency results reveal that a key figure of merit, the cutoff frequency (fc), is about 10 THz for sub-μm2 switches with favorable scaling that can afford fc above 100 THz for nanoscale devices, exceeding the performance of contemporary switches that suffer from an area-invariant scaling. These results indicate a new electronic application of TMDs as non-volatile switches for communication platforms, including mobile systems, low-power internet-of-things, and THz beam steering. The wide application of wireless communications in various technologies calls for the development of robust yet compact radio-frequency switches. Here, Kim et al. utilize MoS2 based non-volatile memristors to switch up to THz frequencies in sub µm2 areas, whilst the switches consume zero-static energy.
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Affiliation(s)
- Myungsoo Kim
- Microelectronics Research Center, The University of Texas at Austin, Austin, TX, 78758, USA
| | - Ruijing Ge
- Microelectronics Research Center, The University of Texas at Austin, Austin, TX, 78758, USA
| | - Xiaohan Wu
- Microelectronics Research Center, The University of Texas at Austin, Austin, TX, 78758, USA
| | - Xing Lan
- NG Next, Northrop Grumman Corporation, One Space Park, Redondo Beach, Los Angeles, CA, 90278, USA
| | - Jesse Tice
- NG Next, Northrop Grumman Corporation, One Space Park, Redondo Beach, Los Angeles, CA, 90278, USA
| | - Jack C Lee
- Microelectronics Research Center, The University of Texas at Austin, Austin, TX, 78758, USA
| | - Deji Akinwande
- Microelectronics Research Center, The University of Texas at Austin, Austin, TX, 78758, USA.
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18
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Wang L, Yang C, Wen J, Xiong B. Amorphization Optimization of Ge₂Sb₂Te₅ Media for Electrical Probe Memory Applications. NANOMATERIALS 2018; 8:nano8060368. [PMID: 29799447 PMCID: PMC6027450 DOI: 10.3390/nano8060368] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 04/17/2018] [Revised: 05/04/2018] [Accepted: 05/15/2018] [Indexed: 11/28/2022]
Abstract
Electrical probe memory using Ge2Sb2Te5 media has been considered a promising candidate in the future archival storage market due to its potential for ultra-high density and long data retention time. However, most current research efforts have been devoted to the writing of crystalline bits using electrical probe memory while ignoring the viability of writing amorphous bits. Therefore, this paper proposes a physical, realistic, full three-dimensional model to optimize the practicable media stack by spatially and temporally calculating temperature distributions inside the active media during the writing of amorphous bits. It demonstrates the feasibility of using an optimized device that follows a Silicon/Titanium Nitride/Ge2Sb2Te5/Diamond-Like Carbon design with appropriate electro-thermal properties and thickness to achieve ultra-high density, low energy consumption, and a high data rate without inducing excessive temperature. The ability to realize multi-bit recording and rewritability using the designed device is also proven, making it attractive and suitable for practicable applications.
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Affiliation(s)
- Lei Wang
- School of Information Engineering, Nanchang Hang Kong University, Nanchang 330069, China.
| | - Cihui Yang
- School of Information Engineering, Nanchang Hang Kong University, Nanchang 330069, China.
| | - Jing Wen
- School of Information Engineering, Nanchang Hang Kong University, Nanchang 330069, China.
| | - Bangshu Xiong
- School of Information Engineering, Nanchang Hang Kong University, Nanchang 330069, China.
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19
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Saini P, Singh M, Thakur J, Patil R, Ma YR, Tandon RP, Singh SP, Mahapatro AK. Probing the Mechanism for Bipolar Resistive Switching in Annealed Graphene Oxide Thin Films. ACS APPLIED MATERIALS & INTERFACES 2018; 10:6521-6530. [PMID: 29363947 DOI: 10.1021/acsami.7b09447] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/07/2023]
Abstract
The bipolar resistive switching (BRS) between a metallic low resistance state (LRS) and an insulating high resistance state (HRS) is demonstrated for annealed graphene oxide (GO) thin film-based device structures with aluminum (Al) as one of the contact electrodes. An optimal switching of ∼104 order is recorded for Al/GO (200 °C)/indium tin oxide (ITO) among the device structures in metal (M2)/GO (T)/metal (M1) configurations (M1 = Al, Au, or ITO and M2 = Au or Al), fabricated using GO (T)/metal (M1), annealed at different temperatures, T = 100, 200, 300, and 400 °C. The initial Ohmic conduction for electronic transport and the presence of metal contents through GO thin films in the X-ray photoelectron spectroscopy support the physical evidence of Al filament formation between the two electrodes as imaged by the high-resolution transmission electron microscopy. The speculated mechanism for BRS in repeated voltage sweep cycles is attributed to the current triggered breaking of metal filaments because of the combined effect of Joule's heating and Peltier heat generation at LRS → HRS transition, and electric field induced migration of metal atoms, leading to the formation of metal filaments through the GO film at the HRS → LRS transition. The higher switching ratio exhibited in the current study could be translated to engineer simple and low-cost resistive memory devices.
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Affiliation(s)
- Pooja Saini
- Department of Physics and Astrophysics, University of Delhi , Delhi 110007, India
| | - Manjri Singh
- CSIR-National Physical Laboratory , Dr. K. S. Krishnan Marg, New Delhi 110012, India
| | - Jyoti Thakur
- Department of Physics and Astrophysics, University of Delhi , Delhi 110007, India
| | - Ranjit Patil
- CSIR-National Physical Laboratory , Dr. K. S. Krishnan Marg, New Delhi 110012, India
| | - Yuan Ron Ma
- Department of Physics, National Dong-Hwa University , Hualien 97401, Taiwan
| | - Ram P Tandon
- Department of Physics and Astrophysics, University of Delhi , Delhi 110007, India
| | - Surinder P Singh
- CSIR-National Physical Laboratory , Dr. K. S. Krishnan Marg, New Delhi 110012, India
| | - Ajit K Mahapatro
- Department of Physics and Astrophysics, University of Delhi , Delhi 110007, India
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20
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Bachmann TA, Koelmans WW, Jonnalagadda VP, Le Gallo M, Santini CA, Sebastian A, Eleftheriou E, Craciun MF, Wright CD. Memristive effects in oxygenated amorphous carbon nanodevices. NANOTECHNOLOGY 2018; 29:035201. [PMID: 29235441 DOI: 10.1088/1361-6528/aa9a18] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/16/2023]
Abstract
Computing with resistive-switching (memristive) memory devices has shown much recent progress and offers an attractive route to circumvent the von-Neumann bottleneck, i.e. the separation of processing and memory, which limits the performance of conventional computer architectures. Due to their good scalability and nanosecond switching speeds, carbon-based resistive-switching memory devices could play an important role in this respect. However, devices based on elemental carbon, such as tetrahedral amorphous carbon or ta-C, typically suffer from a low cycling endurance. A material that has proven to be capable of combining the advantages of elemental carbon-based memories with simple fabrication methods and good endurance performance for binary memory applications is oxygenated amorphous carbon, or a-CO x . Here, we examine the memristive capabilities of nanoscale a-CO x devices, in particular their ability to provide the multilevel and accumulation properties that underpin computing type applications. We show the successful operation of nanoscale a-CO x memory cells for both the storage of multilevel states (here 3-level) and for the provision of an arithmetic accumulator. We implement a base-16, or hexadecimal, accumulator and show how such a device can carry out hexadecimal arithmetic and simultaneously store the computed result in the self-same a-CO x cell, all using fast (sub-10 ns) and low-energy (sub-pJ) input pulses.
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Affiliation(s)
- T A Bachmann
- Centre for Graphene Science, CEMPS, University of Exeter, Exeter EX4 4QF, United Kingdom
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Ge R, Wu X, Kim M, Shi J, Sonde S, Tao L, Zhang Y, Lee JC, Akinwande D. Atomristor: Nonvolatile Resistance Switching in Atomic Sheets of Transition Metal Dichalcogenides. NANO LETTERS 2018; 18:434-441. [PMID: 29236504 DOI: 10.1021/acs.nanolett.7b04342] [Citation(s) in RCA: 150] [Impact Index Per Article: 25.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/23/2023]
Abstract
Recently, two-dimensional (2D) atomic sheets have inspired new ideas in nanoscience including topologically protected charge transport,1,2 spatially separated excitons,3 and strongly anisotropic heat transport.4 Here, we report the intriguing observation of stable nonvolatile resistance switching (NVRS) in single-layer atomic sheets sandwiched between metal electrodes. NVRS is observed in the prototypical semiconducting (MX2, M = Mo, W; and X = S, Se) transitional metal dichalcogenides (TMDs),5 which alludes to the universality of this phenomenon in TMD monolayers and offers forming-free switching. This observation of NVRS phenomenon, widely attributed to ionic diffusion, filament, and interfacial redox in bulk oxides and electrolytes,6-9 inspires new studies on defects, ion transport, and energetics at the sharp interfaces between atomically thin sheets and conducting electrodes. Our findings overturn the contemporary thinking that nonvolatile switching is not scalable to subnanometre owing to leakage currents.10 Emerging device concepts in nonvolatile flexible memory fabrics, and brain-inspired (neuromorphic) computing could benefit substantially from the wide 2D materials design space. A new major application, zero-static power radio frequency (RF) switching, is demonstrated with a monolayer switch operating to 50 GHz.
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Affiliation(s)
- Ruijing Ge
- Microelectronics Research Center, The University of Texas at Austin , Austin, Texas 78758, United States
| | - Xiaohan Wu
- Microelectronics Research Center, The University of Texas at Austin , Austin, Texas 78758, United States
| | - Myungsoo Kim
- Microelectronics Research Center, The University of Texas at Austin , Austin, Texas 78758, United States
| | - Jianping Shi
- Department of Materials Science and Engineering, College of Engineering, Peking University , Beijing 100871, China
| | - Sushant Sonde
- Institute for Molecular Engineering, University of Chicago , 5640 South Ellis Avenue, Chicago, Illinois 60637, United States
- Center for Nanoscale Materials, Argonne National Laboratory , 9700 Cass Avenue, Lemont, Illinois 60439, United States
| | - Li Tao
- Microelectronics Research Center, The University of Texas at Austin , Austin, Texas 78758, United States
- School of Materials Science and Engineering, Southeast University , 2 Southeast University Road, Nanjing 211189, China
| | - Yanfeng Zhang
- Department of Materials Science and Engineering, College of Engineering, Peking University , Beijing 100871, China
| | - Jack C Lee
- Microelectronics Research Center, The University of Texas at Austin , Austin, Texas 78758, United States
| | - Deji Akinwande
- Microelectronics Research Center, The University of Texas at Austin , Austin, Texas 78758, United States
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22
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Mojarad N, Tisserant JN, Beyer H, Dong H, Reissner PA, Fedoryshyn Y, Stemmer A. Monitoring the transformation of aliphatic and fullerene molecules by high-energy electrons using surface-enhanced Raman spectroscopy. NANOTECHNOLOGY 2017; 28:165701. [PMID: 28319037 DOI: 10.1088/1361-6528/aa655f] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/06/2023]
Abstract
We report on using 100 keV electrons to obtain amorphous carbon from aliphatic and fullerene molecules, and study this process by monitoring their Raman signal. In this regard, we use self-assembled monolayers of gold nanoparticles to provide high electromagnetic field enhancement, which allows the detection of the Raman signal from even nanometer-thick layers of analyte. Our results show different dynamics in the amorphization process of the two molecules, although both show suppression of their original vibrational resonances even at low exposure doses. We have also used atomic-force microscopy to evaluate the sensitivity of the C60 molecules to electron beams in forming networks of amorphized molecules that are less soluble in the development process. This method allows precise patterning possibilities as well as in situ functionalization of carbonaceous thin films in the perspective of using in electronic device applications.
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Affiliation(s)
- Nassir Mojarad
- ETH Zürich, Nanotechnology Group, Säumerstrasse 4, CH-8803 Rüschlikon, Switzerland
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Nagareddy VK, Barnes MD, Zipoli F, Lai KT, Alexeev AM, Craciun MF, Wright CD. Multilevel Ultrafast Flexible Nanoscale Nonvolatile Hybrid Graphene Oxide-Titanium Oxide Memories. ACS NANO 2017; 11:3010-3021. [PMID: 28221755 DOI: 10.1021/acsnano.6b08668] [Citation(s) in RCA: 9] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/06/2023]
Abstract
Graphene oxide (GO) resistive memories offer the promise of low-cost environmentally sustainable fabrication, high mechanical flexibility and high optical transparency, making them ideally suited to future flexible and transparent electronics applications. However, the dimensional and temporal scalability of GO memories, i.e., how small they can be made and how fast they can be switched, is an area that has received scant attention. Moreover, a plethora of GO resistive switching characteristics and mechanisms has been reported in the literature, sometimes leading to a confusing and conflicting picture. Consequently, the potential for graphene oxide to deliver high-performance memories operating on nanometer length and nanosecond time scales is currently unknown. Here we address such shortcomings, presenting not only the smallest (50 nm), fastest (sub-5 ns), thinnest (8 nm) GO-based memory devices produced to date, but also demonstrate that our approach provides easily accessible multilevel (4-level, 2-bit per cell) storage capabilities along with excellent endurance and retention performance-all on both rigid and flexible substrates. Via comprehensive experimental characterizations backed-up by detailed atomistic simulations, we also show that the resistive switching mechanism in our Pt/GO/Ti/Pt devices is driven by redox reactions in the interfacial region between the top (Ti) electrode and the GO layer.
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Affiliation(s)
- V Karthik Nagareddy
- Centre for Graphene Science, College of Engineering, Mathematics and Physical Sciences, University of Exeter , Harrison Building, North Park Road, Exeter EX4 4QF, U.K
| | - Matthew D Barnes
- Centre for Graphene Science, College of Engineering, Mathematics and Physical Sciences, University of Exeter , Harrison Building, North Park Road, Exeter EX4 4QF, U.K
| | - Federico Zipoli
- IBM Research-Zurich , Säumerstrasse 4, 8803 Rüuschlikon, Switzerland
| | - Khue T Lai
- Centre for Graphene Science, College of Engineering, Mathematics and Physical Sciences, University of Exeter , Harrison Building, North Park Road, Exeter EX4 4QF, U.K
| | - Arseny M Alexeev
- Centre for Graphene Science, College of Engineering, Mathematics and Physical Sciences, University of Exeter , Harrison Building, North Park Road, Exeter EX4 4QF, U.K
| | - Monica Felicia Craciun
- Centre for Graphene Science, College of Engineering, Mathematics and Physical Sciences, University of Exeter , Harrison Building, North Park Road, Exeter EX4 4QF, U.K
| | - C David Wright
- Centre for Graphene Science, College of Engineering, Mathematics and Physical Sciences, University of Exeter , Harrison Building, North Park Road, Exeter EX4 4QF, U.K
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Park Y, Lee JS. Flexible Multistate Data Storage Devices Fabricated Using Natural Lignin at Room Temperature. ACS APPLIED MATERIALS & INTERFACES 2017; 9:6207-6212. [PMID: 28078883 DOI: 10.1021/acsami.6b14566] [Citation(s) in RCA: 16] [Impact Index Per Article: 2.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/06/2023]
Abstract
The growing interest in bioinspired and sustainable electronics has induced research on biocompatible and biodegradable materials. However, conventional electronic devices have been restricted due to their nonbiodegradable and sometimes harmful and toxic materials, which can even cause environmental issues. Here, we report a resistive switching random access memory (ReRAM) device based on lignin, which is a biodegradable waste product of the paper industry. The active layer of the device can be easily formed using a simple solution process on a plastic substrate. The memory devices show stable bipolar resistive switching behavior with good endurance and retention. Appropriate control of the maximum reset voltage and compliance current can yield multibit data storage capability with at least four resistance states, which can be exploited to realize a high-density memory device. The resistive switching mechanism may be a result of formation and rupture of carbon-rich filaments. These results suggest that lignin is a promising candidate material for an inexpensive and environmentally benign ReRAM device. We believe that this study can initiate a new route toward development of biocompatible and flexible electronics.
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Affiliation(s)
- Youngjun Park
- Department of Materials Science and Engineering, Pohang University of Science and Technology (POSTECH) , Pohang 790-784, Republic of Korea
| | - Jang-Sik Lee
- Department of Materials Science and Engineering, Pohang University of Science and Technology (POSTECH) , Pohang 790-784, Republic of Korea
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Palomäki T, Wester N, Johansson LS, Laitinen M, Jiang H, Arstila K, Sajavaara T, Han JG, Koskinen J, Laurila T. Characterization and Electrochemical Properties of Oxygenated Amorphous Carbon (a-C) Films. Electrochim Acta 2016. [DOI: 10.1016/j.electacta.2016.10.063] [Citation(s) in RCA: 16] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/28/2022]
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26
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Reissner PA, Fedoryshyn Y, Tisserant JN, Stemmer A. Resistive switching of alkanethiolated nanoparticle monolayers patterned by electron-beam exposure. Phys Chem Chem Phys 2016; 18:22783-8. [DOI: 10.1039/c6cp03928f] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
Abstract
Nanoscale structures are fabricated by the direct electron-beam exposure of 10 nm gold nanoparticle monolayers and development in an emulsion. We observe resistive switching in these structures of up to five orders of magnitude.
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Affiliation(s)
| | - Yuriy Fedoryshyn
- ETH Zürich
- Institute of Electromagnetic Fields
- CH-8092 Zürich
- Switzerland
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