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Chen X, Godel B, Verrall M. Postprocessing Workflow for Laboratory Diffraction Contrast Tomography: A Case Study on Chromite Geomaterials. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2024; 30:440-455. [PMID: 38701200 DOI: 10.1093/mam/ozae036] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/05/2023] [Revised: 03/08/2024] [Accepted: 03/31/2024] [Indexed: 05/05/2024]
Abstract
Texture stands as a fundamental descriptor in the realms of geology and earth and planetary science. Beyond offering insights into the geological processes underlying mineral formation, its characterization plays a pivotal role in advancing engineering applications, notably in mining, mineral processing, and metal extraction, by providing quantitative data for predictive modeling. Laboratory diffraction contrast tomography (LabDCT), a recently developed 3D characterization technique, offers nondestructive measurement of grain phases including their morphology, distribution, and crystal orientation. It has recently shown its potential to assess 3D textures in complex natural rock samples. This study looks at improving on previous work by examining the artifacts and presents a novel postprocessing workflow designed to correct them. The workflow is developed to rectify inaccurate grain boundaries and interpolate partially reconstructed grains to provide more accurate results and is illustrated using multi-scan examples on chromite sands and natural chromitite from the Upper Group 2 Reef layer in South Africa. The postcorrected LabDCT results were validated through qualitative and quantitative assessment using 2D electron back-scattered diffraction on polished sample surfaces. The successful implementation of this postprocessing workflow underscores its substantial potential in achieving precise textural characterization and will provide valuable insights for both earth science and engineering applications.
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Affiliation(s)
- Xiao Chen
- CSIRO Mineral Resources, Australian Resources Research Centre, 26 Dick Perry Avenue, Kensington, WA 6151, Australia
| | - Belinda Godel
- CSIRO Mineral Resources, Australian Resources Research Centre, 26 Dick Perry Avenue, Kensington, WA 6151, Australia
| | - Michael Verrall
- CSIRO Mineral Resources, Australian Resources Research Centre, 26 Dick Perry Avenue, Kensington, WA 6151, Australia
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2
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Borgi S, Ræder TM, Carlsen MA, Detlefs C, Winther G, Poulsen HF. Simulations of dislocation contrast in dark-field X-ray microscopy. J Appl Crystallogr 2024; 57:358-368. [PMID: 38596724 PMCID: PMC11001414 DOI: 10.1107/s1600576724001183] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/01/2023] [Accepted: 02/03/2024] [Indexed: 04/11/2024] Open
Abstract
Dark-field X-ray microscopy (DFXM) is a full-field imaging technique that non-destructively maps the structure and local strain inside deeply embedded crystalline elements in three dimensions. In DFXM, an objective lens is placed along the diffracted beam to generate a magnified projection image of the local diffracted volume. This work explores contrast methods and optimizes the DFXM setup specifically for the case of mapping dislocations. Forward projections of detector images are generated using two complementary simulation tools based on geometrical optics and wavefront propagation, respectively. Weak and strong beam contrast and the mapping of strain components are studied. The feasibility of observing dislocations in a wall is elucidated as a function of the distance between neighbouring dislocations and the spatial resolution. Dislocation studies should be feasible with energy band widths of 10-2, of relevance for fourth-generation synchrotron and X-ray free-electron laser sources.
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Affiliation(s)
- Sina Borgi
- Department of Physics, Technical University of Denmark, 2800 Kongens Lyngby, Denmark
| | - Trygve Magnus Ræder
- Department of Physics, Technical University of Denmark, 2800 Kongens Lyngby, Denmark
| | - Mads Allerup Carlsen
- Department of Physics, Technical University of Denmark, 2800 Kongens Lyngby, Denmark
| | - Carsten Detlefs
- European Synchrotron Radiation Facility, 71 avenue des Martyrs, CS40220, 38043 Grenoble Cedex 9, France
| | - Grethe Winther
- Department of Civil and Mechanical Engineering, Technical University of Denmark, 2800 Kongens Lyngby, Denmark
| | - Henning Friis Poulsen
- Department of Physics, Technical University of Denmark, 2800 Kongens Lyngby, Denmark
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3
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Chen X, Godel B, Verrall M. Comparison of Laboratory Diffraction Contrast Tomography and Electron Backscatter Diffraction Results: Application to Naturally Occurring Chromites. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2023; 29:1901-1920. [PMID: 38064652 DOI: 10.1093/micmic/ozad130] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/02/2023] [Revised: 10/09/2023] [Accepted: 11/02/2023] [Indexed: 12/23/2023]
Abstract
Understanding how minerals are spatially distributed within natural materials and their textures is indispensable to understanding the fundamental processes of how these materials form and how they will behave from a mining engineering perspective. In the past few years, laboratory diffraction contrast tomography (LabDCT) has emerged as a nondestructive technique for 3D mapping of crystallographic orientations in polycrystalline samples. In this study, we demonstrate the application of LabDCT on both chromite sand and a complex chromitite sample from the Merensky Reef (Bushveld Complex, South Africa). Both samples were scanned using LabDCT and Electron Backscatter Diffraction (EBSD), and the obtained results were rigorously evaluated using a comprehensive set of qualitative and quantitative characterization techniques. The quality of LabDCT results was accessed by using the "completeness" value, while the inaccuracies were thoroughly discussed, along with proposed potential solutions. The results indicate that the grain orientations obtained from LabDCT are comparable to that of 2D EBSD but have the advantage of collecting true 3D size, shape, and textural information. This study highlights the significant contribution of LabDCT in the understanding of complex rock materials from an earth science perspective, particularly in characterizing mineral texture and crystallography in 3D.
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Affiliation(s)
- Xiao Chen
- CSIRO Mineral Resources, Australian Resources Research Centre, 26 Dick Perry Avenue, Kensington, WA 6151, Australia
| | - Belinda Godel
- CSIRO Mineral Resources, Australian Resources Research Centre, 26 Dick Perry Avenue, Kensington, WA 6151, Australia
| | - Michael Verrall
- CSIRO Mineral Resources, Australian Resources Research Centre, 26 Dick Perry Avenue, Kensington, WA 6151, Australia
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4
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Dresselhaus-Marais LE, Kozioziemski B, Holstad TS, Ræder TM, Seaberg M, Nam D, Kim S, Breckling S, Choi S, Chollet M, Cook PK, Folsom E, Galtier E, Gonzalez A, Gorkhover T, Guillet S, Haldrup K, Howard M, Katagiri K, Kim S, Kim S, Kim S, Kim H, Knudsen EB, Kuschel S, Lee HJ, Lin C, McWilliams RS, Nagler B, Nielsen MM, Ozaki N, Pal D, Pablo Pedro R, Saunders AM, Schoofs F, Sekine T, Simons H, van Driel T, Wang B, Yang W, Yildirim C, Poulsen HF, Eggert JH. Simultaneous bright- and dark-field X-ray microscopy at X-ray free electron lasers. Sci Rep 2023; 13:17573. [PMID: 37845245 PMCID: PMC10579415 DOI: 10.1038/s41598-023-35526-5] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/15/2022] [Accepted: 05/19/2023] [Indexed: 10/18/2023] Open
Abstract
The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and defects required to map lattice distortions or deformation, but are limited to studies of the (near) surface. Generally speaking, such tools cannot probe the structural dynamics in a way that is representative of bulk behavior. Synchrotron X-ray diffraction based imaging has long mapped the deeply embedded structural elements, and with enhanced resolution, dark field X-ray microscopy (DFXM) can now map those features with the requisite nm-resolution. However, these techniques still suffer from the required integration times due to limitations from the source and optics. This work extends DFXM to X-ray free electron lasers, showing how the [Formula: see text] photons per pulse available at these sources offer structural characterization down to 100 fs resolution (orders of magnitude faster than current synchrotron images). We introduce the XFEL DFXM setup with simultaneous bright field microscopy to probe density changes within the same volume. This work presents a comprehensive guide to the multi-modal ultrafast high-resolution X-ray microscope that we constructed and tested at two XFELs, and shows initial data demonstrating two timing strategies to study associated reversible or irreversible lattice dynamics.
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Affiliation(s)
- Leora E Dresselhaus-Marais
- Department of Materials Science & Engineering, Stanford University, Stanford, CA, USA.
- SLAC National Accelerator Laboratory, Menlo Park, CA, USA.
- Physics Division, Lawrence Livermore National Laboratory, Livermore, CA, USA.
| | | | - Theodor S Holstad
- Department of Physics, Technical University of Denmark, Lyngby, Denmark
| | | | | | - Daewoong Nam
- Photon Science Center, Pohang University and Science and Technology, Pohang, Korea
- XFEL Beamline Department, Pohang Accelerator Laboratory, Pohang University and Science and Technology, Pohang, Korea
| | - Sangsoo Kim
- XFEL Beamline Department, Pohang Accelerator Laboratory, Pohang University and Science and Technology, Pohang, Korea
| | | | - Sungwook Choi
- Department of Physics, Sogang University, Seoul, Korea
| | | | - Philip K Cook
- University of Natural Resources and Life Sciences, BOKU, Vienna, Austria
- European Synchrotron Radiation Facility, Grenoble, France
| | - Eric Folsom
- Physics Division, Lawrence Livermore National Laboratory, Livermore, CA, USA
| | - Eric Galtier
- SLAC National Accelerator Laboratory, Menlo Park, CA, USA
| | | | - Tais Gorkhover
- SLAC National Accelerator Laboratory, Menlo Park, CA, USA
- University of Hamburg, Hamburg, Germany
| | - Serge Guillet
- SLAC National Accelerator Laboratory, Menlo Park, CA, USA
| | | | | | - Kento Katagiri
- Department of Materials Science & Engineering, Stanford University, Stanford, CA, USA
- Graduate School of Engineering, Osaka University, Osaka, Japan
| | - Seonghan Kim
- XFEL Beamline Department, Pohang Accelerator Laboratory, Pohang University and Science and Technology, Pohang, Korea
| | - Sunam Kim
- XFEL Beamline Department, Pohang Accelerator Laboratory, Pohang University and Science and Technology, Pohang, Korea
| | - Sungwon Kim
- Department of Physics, Sogang University, Seoul, Korea
| | - Hyunjung Kim
- Department of Physics, Sogang University, Seoul, Korea
| | | | - Stephan Kuschel
- SLAC National Accelerator Laboratory, Menlo Park, CA, USA
- Institute of Nuclear Physics, Technical University of Darmstadt, Darmstadt, Germany
| | - Hae Ja Lee
- SLAC National Accelerator Laboratory, Menlo Park, CA, USA
| | - Chuanlong Lin
- Center for High Pressure Science & Technology Advanced Research, Shanghai, China
| | | | - Bob Nagler
- SLAC National Accelerator Laboratory, Menlo Park, CA, USA
| | | | - Norimasa Ozaki
- Graduate School of Engineering, Osaka University, Osaka, Japan
| | - Dayeeta Pal
- Department of Materials Science & Engineering, Stanford University, Stanford, CA, USA
- SLAC National Accelerator Laboratory, Menlo Park, CA, USA
| | - Ricardo Pablo Pedro
- Department of Nuclear Science & Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA
| | - Alison M Saunders
- Physics Division, Lawrence Livermore National Laboratory, Livermore, CA, USA
| | - Frank Schoofs
- UK Atomic Energy Authority, Culham Science Centre, Abingdon, UK
| | - Toshimori Sekine
- Center for High Pressure Science & Technology Advanced Research, Shanghai, China
| | - Hugh Simons
- Department of Physics, Technical University of Denmark, Lyngby, Denmark
| | - Tim van Driel
- SLAC National Accelerator Laboratory, Menlo Park, CA, USA
| | - Bihan Wang
- Center for High Pressure Science & Technology Advanced Research, Shanghai, China
| | - Wenge Yang
- Center for High Pressure Science & Technology Advanced Research, Shanghai, China
| | - Can Yildirim
- European Synchrotron Radiation Facility, Grenoble, France
- Université Grenoble Alpes, CEA, Grenoble, France
| | | | - Jon H Eggert
- Physics Division, Lawrence Livermore National Laboratory, Livermore, CA, USA
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5
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Yoneyama A, Ishiji K, Sakaki A, Kobayashi Y, Inaba M, Fukuda K, Konishi K, Shima A, Takamatsu D. Three-dimensional micro-X-ray topography using focused sheet-shaped X-ray beam. Sci Rep 2023; 13:12381. [PMID: 37524763 PMCID: PMC10390543 DOI: 10.1038/s41598-023-39347-4] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/27/2023] [Accepted: 07/24/2023] [Indexed: 08/02/2023] Open
Abstract
X-ray topography is a powerful method for analyzing crystal defects and strain in crystalline materials non-destructively. However, conventional X-ray topography uses simple X-ray diffraction images, which means depth information on defects and dislocations cannot be obtained. We have therefor developed a novel three-dimensional micro-X-ray topography technique (3D μ-XRT) that combines Bragg-case section topography with focused sheet-shaped X-rays. The depth resolution of the 3D μ-XRT depends mainly on the focused X-ray beam size and enables non-destructive observation of internal defects and dislocations with an accuracy on the order of 1 μm. The demonstrative observation of SiC power device chips showed that stacking faults, threading screw, threading edge, and basal plane dislocations were clearly visualized three-dimensionally with a depth accuracy of 1.3 μm. 3D μ-XRT is a promising new approach for highly sensitive and non-destructive analysis of material crystallinity in a three-dimensional manner.
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Affiliation(s)
- Akio Yoneyama
- Research and Development Group, Hitachi Ltd., 1-280 Higashi-Koigakubo, Kokubunji, 185-8601, Japan.
- SAGA Light Source, 8-7 Yayoigaoka, Tosu, 841-0005, Japan.
| | - Kotaro Ishiji
- SAGA Light Source, 8-7 Yayoigaoka, Tosu, 841-0005, Japan
| | - Atsushi Sakaki
- Phosphor R&D Center, Nichia Corporation, 1-19 Tatsumi, Anan, 774-0001, Japan
| | - Yutaka Kobayashi
- Chip Development Department, Nichia Corporation, 491 Oka, Kaminaka, Anan, 774-8601, Japan
| | - Masayuki Inaba
- Nissan ARC, Ltd. 1 Natsushima-Cho, Yokosuka, 237-0061, Japan
| | - Kazunori Fukuda
- Physical Analysis Center, Kobelco Research Institute, Inc., 1-5-5 Takatsukadai, Nishi-Ku, Kobe, 651-2271, Japan
| | - Kumiko Konishi
- Research and Development Group, Hitachi Ltd., 1-280 Higashi-Koigakubo, Kokubunji, 185-8601, Japan
| | - Akio Shima
- Research and Development Group, Hitachi Ltd., 1-280 Higashi-Koigakubo, Kokubunji, 185-8601, Japan
| | - Daiko Takamatsu
- Research and Development Group, Hitachi Ltd., 2520 Akanuma, Hatoyama, 350-0395, Japan
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6
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Wehbe M, Charles M, Baril K, Alloing B, Pino Munoz D, Labchir N, Zuniga-Perez J, Detlefs C, Yildirim C, Gergaud P. Study of GaN coalescence by dark-field X-ray microscopy at the nanoscale. J Appl Crystallogr 2023; 56:643-649. [PMID: 37284275 PMCID: PMC10241046 DOI: 10.1107/s160057672300287x] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/13/2023] [Accepted: 03/26/2023] [Indexed: 06/08/2023] Open
Abstract
This work illustrates the potential of dark-field X-ray microscopy (DFXM), a 3D imaging technique of nanostructures, in characterizing novel epitaxial structures of gallium nitride (GaN) on top of GaN/AlN/Si/SiO2 nano-pillars for optoelectronic applications. The nano-pillars are intended to allow independent GaN nanostructures to coalesce into a highly oriented film due to the SiO2 layer becoming soft at the GaN growth temperature. DFXM is demonstrated on different types of samples at the nanoscale and the results show that extremely well oriented lines of GaN (standard deviation of 0.04°) as well as highly oriented material for zones up to 10 × 10 µm2 in area are achieved with this growth approach. At a macroscale, high-intensity X-ray diffraction is used to show that the coalescence of GaN pyramids causes misorientation of the silicon in the nano-pillars, implying that the growth occurs as intended (i.e. that pillars rotate during coalescence). These two diffraction methods demonstrate the great promise of this growth approach for micro-displays and micro-LEDs, which require small islands of high-quality GaN material, and offer a new way to enrich the fundamental understanding of optoelectronically relevant materials at the highest spatial resolution.
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Affiliation(s)
- Maya Wehbe
- Univ. Grenoble Alpes, CEA-LETI, 38000 Grenoble, France
- MINES Paris, PSL Research University, CEMEF – Center for Material Forming, CNRS UMR 7635, BP 207, 1 rue Claude Daunesse, 06904 Sophia Antipolis Cedex, France
| | | | - Kilian Baril
- Univ. Côte d’Azur, CNRS, CRHEA, Rue Bernard Gregory, 06560 Valbonne, France
| | - Blandine Alloing
- Univ. Côte d’Azur, CNRS, CRHEA, Rue Bernard Gregory, 06560 Valbonne, France
| | - Daniel Pino Munoz
- MINES Paris, PSL Research University, CEMEF – Center for Material Forming, CNRS UMR 7635, BP 207, 1 rue Claude Daunesse, 06904 Sophia Antipolis Cedex, France
| | - Nabil Labchir
- Univ. Grenoble Alpes, CNRS, CEA/LETI-Minatec, Grenoble INP, LTM, F-38054 Grenoble, France
| | - Jesús Zuniga-Perez
- Univ. Côte d’Azur, CNRS, CRHEA, Rue Bernard Gregory, 06560 Valbonne, France
- MajuLab, International Research Laboratory IRL 3654, CNRS, Université Côte d’Azûr, Sorbonne Université, National University of Singapore, Nanyang Technological University, Singapore, Singapore
| | - Carsten Detlefs
- ESRF, The European Synchrotron, 71 Avenue des Martyrs, CS40220, 38043 Grenoble Cedex 9, France
| | - Can Yildirim
- ESRF, The European Synchrotron, 71 Avenue des Martyrs, CS40220, 38043 Grenoble Cedex 9, France
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Fang H, Ludwig W, Lhuissier P. Implementation of grain mapping by diffraction contrast tomography on a conventional laboratory tomography setup with various detectors. J Appl Crystallogr 2023; 56:810-824. [PMID: 37284253 PMCID: PMC10241044 DOI: 10.1107/s1600576723003874] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/13/2022] [Accepted: 05/01/2023] [Indexed: 06/08/2023] Open
Abstract
Laboratory-based diffraction contrast tomography (LabDCT) is a novel technique used to resolve grain orientations and shapes in three dimensions at the micrometre scale using laboratory X-ray sources, allowing the user to overcome the constraint of limited access to synchrotron facilities. To foster the development of this technique, the implementation of LabDCT is illustrated in detail using a conventional laboratory-based X-ray tomography setup, and it is shown that such implementation is possible with the two most common types of detectors: CCD and flat panel. As a benchmark, LabDCT projections were acquired on an AlCu alloy sample using the two types of detectors at different exposure times. Grain maps were subsequently reconstructed using the open-source grain reconstruction method reported in the authors' previous work. To characterize the detection limit and the spatial resolution for the current implementation, the reconstructed LabDCT grain maps were compared with the map obtained from a synchrotron measurement, which is considered as ground truth. The results show that the final grain maps from measurements by the CCD and flat panel detector are similar and show comparable quality, while the CCD gives a much better contrast-to-noise ratio than the flat panel. The analysis of the grain maps reconstructed from measurements with different exposure times suggests that a grain map of comparable quality could be obtained in less than 1 h total acquisition time without a significant loss of grain reconstruction quality and indicates a clear potential for time-lapse LabDCT experiments. The current implementation is suggested to promote the generic use of the LabDCT technique for grain mapping on conventional tomography setups.
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Affiliation(s)
- Haixing Fang
- Université Grenoble Alpes, Grenoble INP, CNRS SIMaP, 1130 Rue de la Piscine, 38402 Saint Martin d’Hères, France
- European Synchrotron Radiation Facility, 71 Avenue des Martyrs, 38000 Grenoble, France
- Université de Lyon, INSA Lyon, CNRS MATEIS, 69621 Villeurbanne, France
| | - Wolfgang Ludwig
- European Synchrotron Radiation Facility, 71 Avenue des Martyrs, 38000 Grenoble, France
- Université de Lyon, INSA Lyon, CNRS MATEIS, 69621 Villeurbanne, France
| | - Pierre Lhuissier
- Université Grenoble Alpes, Grenoble INP, CNRS SIMaP, 1130 Rue de la Piscine, 38402 Saint Martin d’Hères, France
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8
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Extensive 3D mapping of dislocation structures in bulk aluminum. Sci Rep 2023; 13:3834. [PMID: 36882517 PMCID: PMC9992398 DOI: 10.1038/s41598-023-30767-w] [Citation(s) in RCA: 3] [Impact Index Per Article: 3.0] [Reference Citation Analysis] [Abstract] [Key Words] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/13/2022] [Accepted: 02/28/2023] [Indexed: 03/09/2023] Open
Abstract
Thermomechanical processing such as annealing is one of the main methods to tailor the mechanical properties of materials, however, much is unknown about the reorganization of dislocation structures deep inside macroscopic crystals that give rise to those changes. Here, we demonstrate the self-organization of dislocation structures upon high-temperature annealing in a mm-sized single crystal of aluminum. We map a large embedded 3D volume ([Formula: see text] [Formula: see text]m[Formula: see text]) of dislocation structures using dark field X-ray microscopy (DFXM), a diffraction-based imaging technique. Over the wide field of view, DFXM's high angular resolution allows us to identify subgrains, separated by dislocation boundaries, which we identify and characterize down to the single-dislocation level using computer-vision methods. We demonstrate how even after long annealing times at high temperatures, the remaining low density of dislocations still pack into well-defined, straight dislocation boundaries (DBs) that lie on specific crystallographic planes. In contrast to conventional grain growth models, our results show that the dihedral angles at the triple junctions are not the predicted 120[Formula: see text], suggesting additional complexities in the boundary stabilization mechanisms. Mapping the local misorientation and lattice strain around these boundaries shows that the observed strain is shear, imparting an average misorientation around the DB of [Formula: see text] 0.003 to 0.006[Formula: see text].
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Carlsen M, Detlefs C, Yildirim C, Ræder T, Simons H. Simulating dark-field X-ray microscopy images with wavefront propagation techniques. ACTA CRYSTALLOGRAPHICA SECTION A FOUNDATIONS AND ADVANCES 2022; 78:482-490. [PMID: 36318069 PMCID: PMC9624181 DOI: 10.1107/s205327332200866x] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 03/01/2022] [Accepted: 08/30/2022] [Indexed: 11/07/2022]
Abstract
The simulation of a dark-field X-ray microscopy experiment using wavefront propagation techniques and numerical integration of the Takagi–Taupin equations is shown. The approach is validated by comparing with measurements of a near-perfect diamond crystal containing a single stacking-fault defect. Dark-field X-ray microscopy is a diffraction-based synchrotron imaging technique capable of imaging defects in the bulk of extended crystalline samples. Numerical simulations are presented of image formation in such a microscope using numerical integration of the dynamical Takagi–Taupin equations and wavefront propagation. The approach is validated by comparing simulated images with experimental data from a near-perfect single crystal of diamond containing a single stacking-fault defect in the illuminated volume.
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10
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Barannikov A, Troyan I, Snigireva I, Snigirev A. X-ray diffraction imaging of the diamond anvils based on the microfocus x-ray source with a liquid anode. THE REVIEW OF SCIENTIFIC INSTRUMENTS 2022; 93:083903. [PMID: 36050063 DOI: 10.1063/5.0080144] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 11/29/2021] [Accepted: 07/12/2022] [Indexed: 06/15/2023]
Abstract
This paper presents the results of using laboratory x-ray systems in the study of the crystal structure of anvil made from single-crystal diamond. The system is equipped with an Excillum MetalJet D2 + 70 kV high-brightness x-ray source with a liquid GaIn anode. The x-ray diffraction imaging (topography) technique with the use of a high-resolution x-ray Rigaku camera was applied to analyze crystal structure defects. Two-dimensional images were experimentally recorded using 400 and 111 reflections with a resolution of 1.5 and 5 μm, respectively. These topograms displayed various defects, such as growth striations and dislocations. Possible applications of the proposed laboratory-based optical scheme for high-pressure physics are discussed and future improvements to the setup are suggested.
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Affiliation(s)
- Aleksandr Barannikov
- International Research Center "Coherent X-ray Optics for Megascience Facilities," Immanuel Kant Baltic Federal University, 236041 Kaliningrad, Russian Federation
| | - Ivan Troyan
- Shubnikov Institute of Crystallography, FRSC "Crystallography and Photonics," Russian Academy of Science, 119333 Moscow, Russian Federation
| | - Irina Snigireva
- European Synchrotron Radiation Facility, 71 Avenue des Martyrs, 38043 Grenoble, France
| | - Anatoly Snigirev
- International Research Center "Coherent X-ray Optics for Megascience Facilities," Immanuel Kant Baltic Federal University, 236041 Kaliningrad, Russian Federation
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11
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Holstad TS, Ræder TM, Carlsen M, Bergbäck Knudsen E, Dresselhaus-Marais L, Haldrup K, Simons H, Nielsen MM, Poulsen HF. X-ray free-electron laser based dark-field X-ray microscopy: a simulation-based study. J Appl Crystallogr 2022. [DOI: 10.1107/s1600576721012760] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/10/2022] Open
Abstract
Dark-field X-ray microscopy (DFXM) is a nondestructive full-field imaging technique providing three-dimensional mapping of microstructure and local strain fields in deeply embedded crystalline elements. This is achieved by placing an objective lens in the diffracted beam, giving a magnified projection image. So far, the method has been applied with a time resolution of milliseconds to hours. In this work, the feasibility of DFXM at the picosecond time scale using an X-ray free-electron laser source and a pump–probe scheme is considered. Thermomechanical strain-wave simulations are combined with geometrical optics and wavefront propagation optics to simulate DFXM images of phonon dynamics in a diamond single crystal. Using the specifications of the XCS instrument at the Linac Coherent Light Source as an example results in simulated DFXM images clearly showing the propagation of a strain wave.
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12
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Poulsen HF, Dresselhaus-Marais LE, Carlsen MA, Detlefs C, Winther G. Geometrical-optics formalism to model contrast in dark-field X-ray microscopy. J Appl Crystallogr 2021. [DOI: 10.1107/s1600576721007287] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/11/2022] Open
Abstract
Dark-field X-ray microscopy, DFXM, is a new full-field imaging technique that non-destructively maps the structure and local strain inside deeply embedded crystalline elements in three dimensions. In DFXM an objective lens is placed along the diffracted beam to generate a magnified projection image of the local diffracted volume. In this work, a general formalism based on geometrical optics is provided for the diffraction imaging, valid for any crystallographic space group. This allows the simulation of DFXM images based on micro-mechanical models. Example simulations are presented with the formalism, demonstrating how this may be used to design new experiments or to interpret existing ones. In particular, it is shown how modifications to the experimental design may tailor the reciprocal-space resolution function to map specific components of the deformation-gradient tensor. The formalism supports multi-length-scale experiments, as it enables DFXM to be interfaced with 3D X-ray diffraction. To illustrate the use of the formalism, DFXM images are simulated from different contrast mechanisms on the basis of the strain field around a straight dislocation.
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13
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Dresselhaus-Marais LE, Winther G, Howard M, Gonzalez A, Breckling SR, Yildirim C, Cook PK, Kutsal M, Simons H, Detlefs C, Eggert JH, Poulsen HF. In situ visualization of long-range defect interactions at the edge of melting. SCIENCE ADVANCES 2021; 7:7/29/eabe8311. [PMID: 34261647 PMCID: PMC8279502 DOI: 10.1126/sciadv.abe8311] [Citation(s) in RCA: 10] [Impact Index Per Article: 3.3] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/16/2020] [Accepted: 06/02/2021] [Indexed: 06/12/2023]
Abstract
Connecting a bulk material's microscopic defects to its macroscopic properties is an age-old problem in materials science. Long-range interactions between dislocations (line defects) are known to play a key role in how materials deform or melt, but we lack the tools to connect these dynamics to the macroscopic properties. We introduce time-resolved dark-field x-ray microscopy to directly visualize how dislocations move and interact over hundreds of micrometers deep inside bulk aluminum. With real-time movies, we reveal the thermally activated motion and interactions of dislocations that comprise a boundary and show how weakened binding forces destabilize the structure at 99% of the melting temperature. Connecting dynamics of the microstructure to its stability, we provide important opportunities to guide and validate multiscale models that are yet untested.
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Affiliation(s)
| | - Grethe Winther
- Technical University of Denmark, Department of Mechanical Engineering, Bldg. 425, 2800 Kgs. Lyngby, Denmark
| | - Marylesa Howard
- Nevada National Security Site, 2621 Losee Road, North Las Vegas, NV 89030, USA
| | - Arnulfo Gonzalez
- Nevada National Security Site, 2621 Losee Road, North Las Vegas, NV 89030, USA
| | - Sean R Breckling
- Nevada National Security Site, 2621 Losee Road, North Las Vegas, NV 89030, USA
| | - Can Yildirim
- CEA Grenoble, 17 Avenue des Martyrs, 38000 Grenoble, France
| | - Philip K Cook
- Universität für Bodenkultur Wien, Gregor-Mendel-Straße 33, 1180 Vienna, Austria
| | - Mustafacan Kutsal
- European Synchrotron Radiation Facility, 71 Avenue des Martyrs, 38000 Grenoble, France
- Technical University of Denmark, Department of Physics, Bldg. 307, 2800 Kgs. Lyngby, Denmark
| | - Hugh Simons
- Technical University of Denmark, Department of Physics, Bldg. 307, 2800 Kgs. Lyngby, Denmark
| | - Carsten Detlefs
- European Synchrotron Radiation Facility, 71 Avenue des Martyrs, 38000 Grenoble, France
| | - Jon H Eggert
- Physics Division, Lawrence Livermore National Laboratory, 7000 East Ave., Livermore, CA 94550, USA
| | - Henning Friis Poulsen
- Technical University of Denmark, Department of Physics, Bldg. 307, 2800 Kgs. Lyngby, Denmark
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14
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Fang H, Juul Jensen D, Zhang Y. Improved grain mapping by laboratory X-ray diffraction contrast tomography. IUCRJ 2021; 8:559-573. [PMID: 34258005 PMCID: PMC8256707 DOI: 10.1107/s2052252521003730] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/21/2020] [Accepted: 04/07/2021] [Indexed: 06/08/2023]
Abstract
Laboratory diffraction contrast tomography (LabDCT) is a novel technique for non-destructive imaging of the grain structure within polycrystalline samples. To further broaden the use of this technique to a wider range of materials, both the spatial resolution and detection limit achieved in the commonly used Laue focusing geometry have to be improved. In this work, the possibility of improving both grain indexing and shape reconstruction was investigated by increasing the sample-to-detector distance to facilitate geometrical magnification of diffraction spots in the LabDCT projections. LabDCT grain reconstructions of a fully recrystallized iron sample, obtained in the conventional Laue focusing geometry and in a magnified geometry, are compared to one characterized by synchrotron X-ray diffraction contrast tomography, with the latter serving as the ground truth. It is shown that grain indexing can be significantly improved in the magnified geometry. It is also found that the magnified geometry improves the spatial resolution and the accuracy of the reconstructed grain shapes. The improvement is shown to be more evident for grains smaller than 40 µm than for larger grains. The underlying reasons are clarified by comparing spot features for different LabDCT datasets using a forward simulation tool.
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Affiliation(s)
- H. Fang
- Department of Mechanical Engineering, Technical University of Denmark, Kgs. Lyngby, 2800, Denmark
| | - D. Juul Jensen
- Department of Mechanical Engineering, Technical University of Denmark, Kgs. Lyngby, 2800, Denmark
| | - Y. Zhang
- Department of Mechanical Engineering, Technical University of Denmark, Kgs. Lyngby, 2800, Denmark
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15
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Porz L, Frömling T, Nakamura A, Li N, Maruyama R, Matsunaga K, Gao P, Simons H, Dietz C, Rohnke M, Janek J, Rödel J. Conceptual Framework for Dislocation-Modified Conductivity in Oxide Ceramics Deconvoluting Mesoscopic Structure, Core, and Space Charge Exemplified for SrTiO 3. ACS NANO 2021; 15:9355-9367. [PMID: 33169975 DOI: 10.1021/acsnano.0c04491] [Citation(s) in RCA: 8] [Impact Index Per Article: 2.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
Abstract
The introduction of dislocations is a recently proposed strategy to tailor the functional and especially the electrical properties of ceramics. While several works confirm a clear impact of dislocations on electrical conductivity, some studies raise concern in particular when expanding to dislocation arrangements beyond a geometrically tractable bicrystal interface. Moreover, the lack of a complete classification on pertinent dislocation characteristics complicates a systematic discussion and hampers the design of dislocation-modified electrical conductivity. We proceed by mechanically introducing dislocations with three different mesoscopic structures into the model material single-crystal SrTiO3 and extensively characterizing them from both a mechanical as well as an electrical perspective. As a final result, a deconvolution of mesoscopic structure, core structure, and space charge enables us to obtain the complete picture of the effect of dislocations on functional properties, focusing here on electric properties.
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Affiliation(s)
- Lukas Porz
- Department of Materials and Earth Science, Technical University of Darmstadt, Alarich-Weiss-Straße 2, 64287 Darmstadt, Germany
| | - Till Frömling
- Department of Materials and Earth Science, Technical University of Darmstadt, Alarich-Weiss-Straße 2, 64287 Darmstadt, Germany
| | - Atsutomo Nakamura
- Department of Materials Physics, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan
- PRESTO, Japan Science and Technology Agency (JST), 7, Gobancho, Chiyoda-ku, Tokyo 102-0076, Japan
| | - Ning Li
- School of Physics, Peking University, Haidian District, Beijing 100871, China
| | - Ryohei Maruyama
- Department of Materials Physics, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan
| | - Katsuyuki Matsunaga
- Department of Materials Physics, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan
| | - Peng Gao
- School of Physics, Peking University, Haidian District, Beijing 100871, China
| | - Hugh Simons
- Department of Physics, Technical University of Denmark, 2800 Kongens Lyngby, Denmark
| | - Christian Dietz
- Department of Materials and Earth Science, Technical University of Darmstadt, Alarich-Weiss-Straße 2, 64287 Darmstadt, Germany
| | - Marcus Rohnke
- Institute of Physical Chemistry and Center for Materials Research, Justus Liebig University Gießen, Heinrich-Buff-Ring 17, 35392 Giessen, Germany
| | - Jürgen Janek
- Institute of Physical Chemistry and Center for Materials Research, Justus Liebig University Gießen, Heinrich-Buff-Ring 17, 35392 Giessen, Germany
| | - Jürgen Rödel
- Department of Materials and Earth Science, Technical University of Darmstadt, Alarich-Weiss-Straße 2, 64287 Darmstadt, Germany
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16
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Porz L, Klomp AJ, Fang X, Li N, Yildirim C, Detlefs C, Bruder E, Höfling M, Rheinheimer W, Patterson EA, Gao P, Durst K, Nakamura A, Albe K, Simons H, Rödel J. Dislocation-toughened ceramics. MATERIALS HORIZONS 2021; 8:1528-1537. [PMID: 34846461 DOI: 10.1039/d0mh02033h] [Citation(s) in RCA: 16] [Impact Index Per Article: 5.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/13/2023]
Abstract
Functional and structural ceramics have become irreplaceable in countless high-tech applications. However, their inherent brittleness tremendously limits the application range and, despite extensive research efforts, particularly short cracks are hard to combat. While local plasticity carried by mobile dislocations allows desirable toughness in metals, high bond strength is widely believed to hinder dislocation-based toughening of ceramics. Here, we demonstrate the possibility to induce and engineer a dislocation microstructure in ceramics that improves the crack tip toughness even though such toughening does not occur naturally after conventional processing. With modern microscopy and simulation techniques, we reveal key ingredients for successful engineering of dislocation-based toughness at ambient temperature. For many ceramics a dislocation-based plastic zone is not impossible due to some intrinsic property (e.g. bond strength) but limited by an engineerable quantity, i.e. the dislocation density. The impact of dislocation density is demonstrated in a surface near region and suggested to be transferrable to bulk ceramics. Unexpected potential in improving mechanical performance of ceramics could be realized with novel synthesis strategies.
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Affiliation(s)
- Lukas Porz
- Technical University of Darmstadt, Department of Materials and Earth Science, Darmstadt, Germany.
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17
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Yildirim C, Ballet P, Santailler JL, Giotta D, Obrecht R, Tran Thi TN, Baruchel J, Brellier D. Role of threading dislocations on the growth of HgCdTe epilayers investigated using monochromatic X-ray Bragg diffraction imaging. JOURNAL OF SYNCHROTRON RADIATION 2021; 28:301-308. [PMID: 33399581 DOI: 10.1107/s1600577520014149] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/09/2020] [Accepted: 10/23/2020] [Indexed: 06/12/2023]
Abstract
High-quality Hg1-xCdxTe (MCT) single crystals are essential for two-dimensional infrared detector arrays. Crystal quality plays an important role on the performance of these devices. Here, the dislocations present at the interface of CdZnTe (CZT) substrates and liquid-phase epitaxy grown MCT epilayers are investigated using X-ray Bragg diffraction imaging (XBDI). The diffraction contributions coming from the threading dislocations (TDs) of the CZT substrate and the MCT epilayers are separated using weak-beam conditions in projection topographs. The results clearly suggest that the lattice parameter of the growing MCT epilayer is, at the growth inception, very close to that of the CZT substrate and gradually departs from the substrate's lattice parameter as the growth advances. Moreover, the relative growth velocity of the MCT epilayer around the TDs is found to be faster by a factor of two to four compared with the matrix. In addition, a fast alternative method to the conventional characterization methods for probing crystals with low dislocation density such as atomic force microscopy and optical interferometry is introduced. A 1.5 mm × 1.5 mm area map of the epilayer defects with sub-micrometre spatial resolution is generated, using section XBDI, by blocking the diffraction contribution of the substrate and scanning the sample spatially.
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Affiliation(s)
- Can Yildirim
- Universite Grenoble Alpes, CEA, 17 Avenue de Martyrs, 38000 Grenoble, France
| | - Philippe Ballet
- Universite Grenoble Alpes, CEA, 17 Avenue de Martyrs, 38000 Grenoble, France
| | | | - Dominique Giotta
- Universite Grenoble Alpes, CEA, 17 Avenue de Martyrs, 38000 Grenoble, France
| | - Rémy Obrecht
- Universite Grenoble Alpes, CEA, 17 Avenue de Martyrs, 38000 Grenoble, France
| | - Thu Nhi Tran Thi
- European Synchrotron Radiation Facility, 74 Avenue de Martyrs, 38000 Grenoble, France
| | - José Baruchel
- European Synchrotron Radiation Facility, 74 Avenue de Martyrs, 38000 Grenoble, France
| | - Delphine Brellier
- Universite Grenoble Alpes, CEA, 17 Avenue de Martyrs, 38000 Grenoble, France
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18
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Qiao Z, Shi X, Kenesei P, Last A, Assoufid L, Islam Z. A large field-of-view high-resolution hard x-ray microscope using polymer optics. THE REVIEW OF SCIENTIFIC INSTRUMENTS 2020; 91:113703. [PMID: 33261446 DOI: 10.1063/5.0011961] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/26/2020] [Accepted: 11/01/2020] [Indexed: 06/12/2023]
Abstract
We present an effective approach using a matched pair of polymer-based condenser-objective lenses to build a compact full-field x-ray microscope with a high spatial resolution. A unique condenser comprising arrays of high-aspect-ratio prisms with equilateral cross section is used for uniformly illuminating samples over a large field of view (FOV) from all angles, which match the acceptance of an objective made of interdigitated orthogonal rows of one-dimensional lenses. State-of-the-art Talbot grating interferometry used to characterize these lenses for the first time revealed excellent focusing properties and minimal wavefront distortions. Using a specific lens pair designed for 20 keV x rays, short-exposure times, and image registration with a cross-correlation technique, we circumvent vibrational instabilities to obtain distortion-free images with a uniform resolution of 240 nm (smallest resolvable line pair) over a large FOV, 80 × 80 µm2 in extent. The results were contrasted with those collected using commercial two-dimensional parabolic lenses with a smaller FOV. This approach implemented on a diffractometer would enable diffraction-contrast or dark-field microscopy for fast observations of "mesoscopic" phenomena in real space complementing reciprocal-space studies using diffraction on the same instrument.
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Affiliation(s)
- Zhi Qiao
- Argonne National Laboratory, 9700 South Cass Avenue, Lemont, Illinois 60439, USA
| | - Xianbo Shi
- Argonne National Laboratory, 9700 South Cass Avenue, Lemont, Illinois 60439, USA
| | - Peter Kenesei
- Argonne National Laboratory, 9700 South Cass Avenue, Lemont, Illinois 60439, USA
| | - Arndt Last
- Karlsruhe Institute of Technology, Institute of Microstructure Technology, Hermann-von-Helmholtz-Platz 1, Eggenstein-Leopoldshafen D-76344, Germany
| | - Lahsen Assoufid
- Argonne National Laboratory, 9700 South Cass Avenue, Lemont, Illinois 60439, USA
| | - Zahir Islam
- Argonne National Laboratory, 9700 South Cass Avenue, Lemont, Illinois 60439, USA
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19
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Fang H, Juul Jensen D, Zhang Y. A flexible and standalone forward simulation model for laboratory X-ray diffraction contrast tomography. Acta Crystallogr A Found Adv 2020; 76:652-663. [PMID: 33125349 PMCID: PMC7598096 DOI: 10.1107/s2053273320010852] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/23/2020] [Accepted: 08/06/2020] [Indexed: 11/25/2022] Open
Abstract
Laboratory X-ray diffraction contrast tomography (LabDCT) has recently been developed as a powerful technique for non-destructive mapping of grain microstructures in bulk materials. As the grain reconstruction relies on segmentation of diffraction spots, it is essential to understand the physics of the diffraction process and resolve all the spot features in detail. To this aim, a flexible and standalone forward simulation model has been developed to compute the diffraction projections from polycrystalline samples with any crystal structure. The accuracy of the forward simulation model is demonstrated by good agreements in grain orientations, boundary positions and shapes between a virtual input structure and that reconstructed based on the forward simulated diffraction projections of the input structure. Further experimental verification is made by comparisons of diffraction spots between simulations and experiments for a partially recrystallized Al sample, where a satisfactory agreement is found for the spot positions, sizes and intensities. Finally, applications of this model to analyze specific spot features are presented.
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Affiliation(s)
- H. Fang
- Department of Mechanical Engineering, Technical University of Denmark, Kgs. Lyngby, 2800, Denmark
| | - D. Juul Jensen
- Department of Mechanical Engineering, Technical University of Denmark, Kgs. Lyngby, 2800, Denmark
| | - Y. Zhang
- Department of Mechanical Engineering, Technical University of Denmark, Kgs. Lyngby, 2800, Denmark
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20
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Gorfman S, Choe H, Zhang G, Zhang N, Yokota H, Glazer AM, Xie Y, Dyadkin V, Chernyshov D, Ye ZG. New method to measure domain-wall motion contribution to piezoelectricity: the case of PbZr0.65Ti0.35O3 ferroelectric. J Appl Crystallogr 2020. [DOI: 10.1107/s1600576720008213] [Citation(s) in RCA: 6] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/10/2022] Open
Abstract
A new data analysis routine is introduced to reconstruct the change in lattice parameters in individual ferroelastic domains and the role of domain-wall motion in the piezoelectric effect. Using special electronics for the synchronization of a PILATUS X-ray area detector with a voltage signal generator, the X-ray diffraction intensity distribution was measured around seven split Bragg peaks as a function of external electric field. The new data analysis algorithm allows the calculation of `extrinsic' (related to domain-wall motion) and `intrinsic' (related to the change in lattice parameters) contributions to the electric-field-induced deformation. Compared with previously existing approaches, the new method benefits from the availability of a three-dimensional diffraction intensity distribution, which enables the separation of Bragg peaks diffracted from differently oriented domain sets. The new technique is applied to calculate the extrinsic and intrinsic contributions to the piezoelectricity in a single crystal of the ferroelectric PbZr1−x
Ti
x
O3 (x = 0.35). The root-mean-square value of the piezoelectric coefficient was obtained as 112 pC N−1. The contribution of the domain-wall motion is estimated as 99 pC N−1. The contribution of electric-field-induced changes to the lattice parameters averaged over all the domains is 71 pC N−1. The equivalent value corresponding to the change in lattice parameters in individual domains may reach up to 189 pC N−1.
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21
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Danilewsky AN. X‐Ray Topography—More than Nice Pictures. CRYSTAL RESEARCH AND TECHNOLOGY 2020. [DOI: 10.1002/crat.202000012] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/06/2022]
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22
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Hata S, Furukawa H, Gondo T, Hirakami D, Horii N, Ikeda KI, Kawamoto K, Kimura K, Matsumura S, Mitsuhara M, Miyazaki H, Miyazaki S, Murayama MM, Nakashima H, Saito H, Sakamoto M, Yamasaki S. Electron tomography imaging methods with diffraction contrast for materials research. Microscopy (Oxf) 2020; 69:141-155. [PMID: 32115659 PMCID: PMC7240780 DOI: 10.1093/jmicro/dfaa002] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/16/2019] [Revised: 01/08/2020] [Accepted: 02/04/2020] [Indexed: 11/14/2022] Open
Abstract
Transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) enable the visualization of three-dimensional (3D) microstructures ranging from atomic to micrometer scales using 3D reconstruction techniques based on computed tomography algorithms. This 3D microscopy method is called electron tomography (ET) and has been utilized in the fields of materials science and engineering for more than two decades. Although atomic resolution is one of the current topics in ET research, the development and deployment of intermediate-resolution (non-atomic-resolution) ET imaging methods have garnered considerable attention from researchers. This research trend is probably not irrelevant due to the fact that the spatial resolution and functionality of 3D imaging methods of scanning electron microscopy (SEM) and X-ray microscopy have come to overlap with those of ET. In other words, there may be multiple ways to carry out 3D visualization using different microscopy methods for nanometer-scale objects in materials. From the above standpoint, this review paper aims to (i) describe the current status and issues of intermediate-resolution ET with regard to enhancing the effectiveness of TEM/STEM imaging and (ii) discuss promising applications of state-of-the-art intermediate-resolution ET for materials research with a particular focus on diffraction contrast ET for crystalline microstructures (superlattice domains and dislocations) including a demonstration of in situ dislocation tomography.
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Affiliation(s)
- Satoshi Hata
- Department of Advanced Materials Science, Kyushu University, Fukuoka 816-8580, Japan
- The Ultramicroscopy Research Center, Kyushu University, Fukuoka 819-0395, Japan
| | - Hiromitsu Furukawa
- TEMography Division, System in Frontier Inc., Tachikawa-shi, Tokyo 190-0012, Japan
| | - Takashi Gondo
- Research Laboratory, Mel-Build Corporation, Fukuoka 819-0025, Japan
| | - Daisuke Hirakami
- Steel Research Laboratories, Nippon Steel Corporation, Chiba 293-8511, Japan
| | - Noritaka Horii
- TEMography Division, System in Frontier Inc., Tachikawa-shi, Tokyo 190-0012, Japan
| | - Ken-Ichi Ikeda
- Division of Materials Science and Engineering, Faculty of Engineering, Hokkaido University, Hokkaido 060-8628, Japan
| | - Katsumi Kawamoto
- TEMography Division, System in Frontier Inc., Tachikawa-shi, Tokyo 190-0012, Japan
| | - Kosuke Kimura
- Morphological Research Laboratory, Toray Research Center, Inc., Shiga 520-8567, Japan
| | - Syo Matsumura
- The Ultramicroscopy Research Center, Kyushu University, Fukuoka 819-0395, Japan
- Department of Applied Quantum Physics and Nuclear Engineering, Kyushu University, Fukuoka 819-0395, Japan
| | - Masatoshi Mitsuhara
- Department of Advanced Materials Science, Kyushu University, Fukuoka 816-8580, Japan
| | - Hiroya Miyazaki
- Research Laboratory, Mel-Build Corporation, Fukuoka 819-0025, Japan
| | - Shinsuke Miyazaki
- Research Laboratory, Mel-Build Corporation, Fukuoka 819-0025, Japan
- Analytical Instruments, Materials and Structural Analysis, Thermo Fisher Scientific, Shinagawa-ku, Tokyo 140-0002, Japan
| | - Mitsu Mitsuhiro Murayama
- Department of Materials Science and Engineering, Virginia Tech, Blacksburg, VA 24061, USA
- Energy and Environmental Directorate, Pacific Northwest National Laboratory, WA 99352, USA
- Institute for Materials Chemistry and Engineering, Kyushu University, Fukuoka 816-8580, Japan
| | - Hideharu Nakashima
- Department of Advanced Materials Science, Kyushu University, Fukuoka 816-8580, Japan
| | - Hikaru Saito
- Department of Advanced Materials Science, Kyushu University, Fukuoka 816-8580, Japan
| | - Masashi Sakamoto
- Steel Research Laboratories, Nippon Steel Corporation, Chiba 293-8511, Japan
| | - Shigeto Yamasaki
- Department of Advanced Materials Science, Kyushu University, Fukuoka 816-8580, Japan
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